Having A Movable Contact Probe Patents (Class 33/556)
  • Patent number: 6925727
    Abstract: Since a dial face (3) and an area indicator (4) are formed separately to be independently turnable, the area indicator (4) is not rotated even when the dial face (3) is rotated. With this arrangement, the area indicator (4) can indicate a correct area regardless of the rotated position of the dial face (3), thereby preventing measurement errors. Further, since the area indicator (4) is not included in the dial face (3), the dial face (3) can be shared as a standard dial face.
    Type: Grant
    Filed: April 7, 2004
    Date of Patent: August 9, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Munenori Ishii, Toshiyuki Shinohara
  • Patent number: 6922904
    Abstract: A method and a system is for evaluating the transmitted signals of a probe system, which has a probe element that is deflectable out of a rest position and which generates transmitted signals, which include a switch-on signal during a deflection of the probe element out of its rest position and which, together with interference signals, are transmitted to a receiving unit, in which the received signals made up of the transmitted signals and the interference signals, are compared to a reference signal. In this context, the reference signal is formed by interlinking information signals generated from the received signals, and the interference signals, and/or the received signals are differentiated by time, prior to the comparison with the reference signal.
    Type: Grant
    Filed: January 29, 2004
    Date of Patent: August 2, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Klaus Groell, Christian Eisenberger
  • Patent number: 6909983
    Abstract: A method of calibrating a probe mounted on a machine in which the probe has a probe calibration matrix which relates the probe outputs in three orthogonal axes to the machine's X, Y and Z coordinate system. A datum ball mounted on the machine is bi-directionally scanned by the probe in one or more planes. For each plane, the mean direction of two approximate probe vectors in the plane is rotated about an axis orthogonal to that plane until the apparent material condition from the scan in each direction is the same. This process may be iterative. The mean values of the directions of the probe vectors for each plane are rotated, thus forming a corrected probe calibration matrix. The datum ball is preferably bi-directionally scanned in three orthogonal planes.
    Type: Grant
    Filed: March 13, 2002
    Date of Patent: June 21, 2005
    Assignee: Renishaw PLC
    Inventor: Alexander Tennant Sutherland
  • Patent number: 6904691
    Abstract: A portable coordinate measurement machine comprises an articulated arm having jointed arm segments. The articulated arm includes an integrated, internal counter-balance in one of its hinge joints. This counter-balance utilizes a coil spring having relatively wide end rings and narrower internal rings machined from a metal cylinder. The spring further includes at least two posts for locking into the hinge structure of the arm as well as a spring adjustment mechanism.
    Type: Grant
    Filed: February 13, 2003
    Date of Patent: June 14, 2005
    Assignee: Faro Technologies, Inc.
    Inventors: Simon Raab, Seyed Ali Sajedi, Kenneth J. Hasloecher, Marc Barber
  • Patent number: 6901677
    Abstract: An apparatus for profiling the surface of a workpiece, including a probe adapted to make contact with the surface of a workpiece, a sensor for determining or deriving the force between the probe and the workpiece surface, an actuator that adjusts the position of the probe along an axis, which is generally perpendicular to the surface of the workpiece, in order to maintain a constant force between the probe and the surface, and a closed control loop, including a controller that controls the operation of the actuator based on information from the sensor.
    Type: Grant
    Filed: May 5, 2004
    Date of Patent: June 7, 2005
    Assignee: University of North Carolina at Charlotte
    Inventors: Stuart T. Smith, Marcin B. Bauza, Pavan Jain, Shane C. Woody
  • Patent number: 6860026
    Abstract: A probe for position determining apparatus such as a machine tool transmits optical measurement signals to a receiver module. The probe is battery powered and the battery powers light emitting diodes which transmit the optical measurement signals. The optical measurement signals comprise serially transmitted codewords which are generated by a universal synchronous/asynchronous receiver transmitter (USART). The output of the USART is combined with a pulse width modulator which has an output having the same form as the output of the USART but with reduced duration of each pulse, thus enhancing the life of the battery powering the light emitting diodes. The pulse width modulator may also be used to set the timing of the USART.
    Type: Grant
    Filed: June 14, 2002
    Date of Patent: March 1, 2005
    Assignee: Renishaw PLC
    Inventor: Jonathan Paul Fuge
  • Patent number: 6854195
    Abstract: Touch-triggered probe comprising a fixed part, designed to be fastened onto a measuring machine or a machine tool, and a mobile contact feeler that can be oriented on two independent axes along a multiplicity of spatial directions. The two axes of the probe comprise each an actuator for unlocking and adjusting the axes.
    Type: Grant
    Filed: January 20, 2004
    Date of Patent: February 15, 2005
    Assignee: Tesa SA
    Inventors: Pascal Jordil, Adriano Zanier, Claude Rouge
  • Patent number: 6848315
    Abstract: A stylus structure (40) integrally incorporating a stylus (2), a vibrator (4), a detector (6), a first secondary magnetic circuit (12) and a second primary magnetic circuit (21), and a stylus support (30) integrally incorporating a first primary magnetic circuit (11) and a second secondary magnetic circuit (22) are mutually fittable, thereby achieving signal transmission by the respective magnetic circuits using no electrical contact.
    Type: Grant
    Filed: February 14, 2002
    Date of Patent: February 1, 2005
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Patent number: 6810597
    Abstract: A method of measuring an artefact 5 using a machine 2 on which a measuring probe 6 is mounted. The probe is brought into contact with the artefact and movement continued for a limited distance to deflect the stylus 7. The machine and probe outputs are recorded whilst the probe is free and when the stylus is deflected. A model of the probe and CMM outputs during both contact and non-contact between the probe and artefact is fitted to the data to allow the contact position when the stylus contacts the artefact with zero force to be determined. The probe outputs may be fitted to the model individually to determine a single contact position. By using data during movement of the probe towards and away from the artefact, errors due to time delays may be corrected.
    Type: Grant
    Filed: August 4, 2003
    Date of Patent: November 2, 2004
    Assignee: Renishaw PLC
    Inventors: Jean-Louis Grzesiak, Alexander Tennant Sutherland
  • Patent number: 6802133
    Abstract: Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured. Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.
    Type: Grant
    Filed: November 28, 2001
    Date of Patent: October 12, 2004
    Assignee: Tesa SA
    Inventors: Pascal Jordil, Charles-Henri Zufferey
  • Publication number: 20040194331
    Abstract: A multicoordinate sensing measuring device is proposed in which a sensing lever (5) that is resiliently spring-pretensioned in a resting position in a housing (3) can be displaced along a measuring axis (7) and can be pivoted transversely to the measuring axis (7). A connecting piece (25) is guided in a movable manner in the direction of the measuring axis (7) on a guide surface (23) of the housing (3). The sensing lever carries along the connecting piece (25) via a linkage (31, 33) when the sensing arm (5) is displaced in the direction of the measuring axis (7) as well as when the sensing am is deflected in the direction of the measuring axis (7). A measuing device (21) detects the position of the connecting piece (25) relative to the housing (3).
    Type: Application
    Filed: May 19, 2004
    Publication date: October 7, 2004
    Inventor: Franz Haimer
  • Patent number: 6799378
    Abstract: A stylus having a stem covered, at least partially, with a coating formed of an elastically or plastically deformable synthetic material.
    Type: Grant
    Filed: January 16, 2002
    Date of Patent: October 5, 2004
    Assignee: Johannes Heidenhein GmbH
    Inventors: Reinhold Schopf, Roland Fischer
  • Patent number: 6789327
    Abstract: A touch probe 9 for a coordinate measuring apparatus is proposed which includes a touch probe chassis 29 adapted to be attached to the coordinate measuring apparatus, a support for the sensing stylus 39 which is mounted on the touch probe chassis 29 so as to be deflectable from a rest position and on which a sensing stylus 47 is mountable for contacting a workpiece 17, a deflection measuring system 55, 57 for detecting a deflection of the support for the sensing stylus 39 with respect to the touch probe chassis 29 and an inspection optics 61 for inspecting a tip 49 of the sensing stylus 47. The touch probe 1 is characterized in that at least one of the components support for the sensing stylus 39 and touch probe chassis 29 comprises a transverse support 39 which extends transversely to a direction of extension of the sensing stylus 47 and which is transparent to light in at least a portion thereof and which is disposed in a beam path 69 of the inspection optics 61.
    Type: Grant
    Filed: August 22, 2003
    Date of Patent: September 14, 2004
    Assignee: Carl Zeiss Industrielle Messtechnik GmbH
    Inventors: Roland Roth, Karl Seitz, Kurt Brenner, Uwe Brand, Wolfgang Hoffmann, Thomas Kleine-Besten, Sebastian Bütefisch, Stephanus Büttgenbach
  • Publication number: 20040163268
    Abstract: A measurement probe (10) has a stylus part (12) connected to it by means of a ball and cup universal joint (24/25 FIGS. 2 and 3) The stylus part (12) is reorientable relative to the probe and during reorientation is held by means of magnetism or suction to an at tractor (50) whilst the probe (10) is moved. The stylus part (12) is held in static relation to the probe during measurement by means of magnetism or vacuum. The stylus part (12) may be exchanged for another, e.g. 12a or 12b′ at rack (100). During exchange the magnetism or vacuum holding (15) the probe and stylus part in static relation is reduced.
    Type: Application
    Filed: November 19, 2003
    Publication date: August 26, 2004
    Inventors: David Roberts McMurtry, Geoff McFarland
  • Publication number: 20040154177
    Abstract: Touch-triggered probe comprising a fixed part, designed to be fastened onto a measuring machine or a machine tool, and a mobile contact feeler that can be oriented on two independent axes along a multiplicity of spatial directions. The two axes of the probe comprise each an actuator for unlocking and adjusting the axes.
    Type: Application
    Filed: January 20, 2004
    Publication date: August 12, 2004
    Inventors: Pascal Jordil, Adriano Zanier, Claude Rouge
  • Patent number: 6772529
    Abstract: An automated contact gage system for gaging a workpiece or device has a left spindle, a right spindle and a stylus arm for contacting the workpiece or device in the same Y plane as the probe. A bearing arrangement is used to contact the stylus arm so as to guide and support the stylus arm during contact gaging of the device. The bearing arrangement comprises a spherical race, derived from three spherical elements, contacting a bearing so as to provide for multi-dimensional movement and measurement of movement of the stylus arm. First, and second sensors sense and measure movement of the stylus arm and/or workpiece in two dimensions, while a third sensor senses and measures rotation of the workpiece by the right spindle.
    Type: Grant
    Filed: July 18, 2001
    Date of Patent: August 10, 2004
    Assignee: The United States of America as represented by the Secretary of the Navy
    Inventor: Gerald J. McGrath
  • Publication number: 20040134085
    Abstract: A probe for position determining apparatus such as a machine tool transmits optical measurement signals to a receiver module. The probe is battery powered and the battery powers light emitting diodes which transmit the optical measurement signals. The optical measurement signals comprise serially transmitted codewords which are generated by a universal synchronous/asynchronous receiver transmitter (USART). The output of the USART is combined with a pulse width modulator which has an output having the same form as the output of the USART but with reduced duration of each pulse, thus enhancing the life of the battery powering the light emitting diodes. The pulse width modulator may also be used to set the timing of the USART.
    Type: Application
    Filed: November 19, 2003
    Publication date: July 15, 2004
    Inventor: Jonathan Paul Fuge
  • Patent number: 6760980
    Abstract: A linear gauging head, for example a “cartridge” head, includes a casing (1), a spindle (11), movable with respect to the casing along a longitudinal axis, a feeler (13′) coupled to a first end of the spindle, and a differential position transducer with windings (15, 16, 17), stationary with respect to the casing, and a core (18) coupled to a second end of the spindle. The spindle includes longitudinal grooves (12) and is guided by means of an axial bearing (22) with rolling elements (23) that cooperate with the grooves for allowing the spindle to translate with respect to the casing along the longitudinal axis, and concurrently prevent it from rotating about said axis.
    Type: Grant
    Filed: May 10, 2002
    Date of Patent: July 13, 2004
    Assignee: Marposs Societa per Azioni
    Inventor: Guido Golinelli
  • Patent number: 6758085
    Abstract: An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, a guide mechanism for supporting and guiding the measuring probe in an axial direction of the measuring probe, a tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle with respect to a horizontal direction so that the measuring probe contacts the surface of the object to be measured with a predetermined contact force, and a drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.
    Type: Grant
    Filed: June 17, 2003
    Date of Patent: July 6, 2004
    Assignee: Olympus Corporation
    Inventors: Yasunari Nagaike, Yasushi Nakamura, Yoshiaki Ito
  • Publication number: 20040118000
    Abstract: A touch probe 9 for a coordinate measuring apparatus is proposed which includes a touch probe chassis 29 adapted to be attached to the coordinate measuring apparatus, a support for the sensing stylus 39 which is mounted on the touch probe chassis 29 so as to be deflectable from a rest position and on which a sensing stylus 47 is mountable for contacting a workpiece 17, a deflection measuring system 55, 57 for detecting a deflection of the support for the sensing stylus 39 with respect to the touch probe chassis 29 and an inspection optics 61 for inspecting a tip 49 of the sensing stylus 47. The touch probe 1 is characterized in that at least one of the components support for the sensing stylus 39 and touch probe chassis 29 comprises a transverse support 39 which extends transversely to a direction of extension of the sensing stylus 47 and which is transparent to light in at least a portion thereof and which is disposed in a beam path 69 of the inspection optics 61.
    Type: Application
    Filed: August 22, 2003
    Publication date: June 24, 2004
    Inventors: Roland Roth, Karl Seitz, Kurt Brenner, Uwe Brand, Wolfgang Hoffmann, Thomas Kleine-Besten, Sebastian Butefisch, Stephanus Buttgenbach
  • Publication number: 20040068881
    Abstract: An optical inspection equipment of the type having an actuator arm for supporting on one end thereof a touch probe beneath an optical system of the equipment, comprises a housing secured to one end of the arm and having therethrough a vertical bore registering with said optical system; a micro interposer in the form of an elongate generally rigid wire strand having on one end thereof a bead of only slightly larger diameter than the strand; and means viscously supporting the strand adjacent the opposite end thereof in the bore in the housing with one end thereof extending out of the bore beneath the housing, the means being operative normally to maintain the strand coaxially of the bore.
    Type: Application
    Filed: October 15, 2002
    Publication date: April 15, 2004
    Applicant: Optical Gaging Products, Inc.
    Inventors: Timothy Moriarity, Karl J. Lenz
  • Patent number: 6708420
    Abstract: The instant invention is a dynamic piezoelectric touch probe for use with coordinate measurement machines. The touch probe is characterized by five subsystems; (1) piezoelectric vibrator controlled by a self-tuning drive circuit that adjusts operating frequency and amplitude, (2) a high sensitivity, resonant accelerometer unit coupled to the piezoelectric vibrator, (3) a flexible suspension/stylus with transverse resonant frequencies tuned to the operating frequency band of the piezoelectric vibrator, (4) a digital control circuit that automatically sweeps the operating band of the piezoelectric vibrator to (a) detect the resonant frequency of the stylus/suspension, (b) set the drive signal frequency at the resonance of the stylus/suspension and (c) control the drive signal amplitude, and (5) a triaxial load cell system that is useful for detecting excessive low frequency suspension/stylus vibration, and excessive impact force during a touch event.
    Type: Grant
    Filed: January 6, 1999
    Date of Patent: March 23, 2004
    Inventor: Patrick M. Flanagan
  • Patent number: 6681495
    Abstract: To provide a measuring apparatus of positions and postures of a machine for correcting positions and postures of an end effecter by means of an actuator, and an error correcting method for correcting errors thereof. At least three universal joint fixing members 2 are attached onto a base 1 that comprises a measuring reference; steel balls 3 are fixed to the respective universal joint fixing members 2 as universal joints; a steel ball 5 is fixed to a universal joint fixing member 9 as a universal joint; a universal joint fixing member 4 is attached to an object to be measured 7 that is supported by means of another member; and a measuring device 6 is attached to between the steel balls B3 and the steel ball 5. By using such a measuring apparatus, geometrical errors of a mechanism in a machine are estimated and corrected based on measured values on positions and postures of the end effecter.
    Type: Grant
    Filed: March 14, 2000
    Date of Patent: January 27, 2004
    Assignee: Okuma Corporation
    Inventors: Nashiki Masayuki, Matsushita Tetsuya, Watanabe Shigeharu, Nakagawa Masao
  • Patent number: 6668466
    Abstract: Disclosed is a highly accurate articulated coordinate measuring machine, comprising a revolute joint, comprising a circular encoder wheel, having an axis of rotation; a plurality of marks disposed around at least a portion of the circumference of the encoder wheel; bearing means for supporting the encoder wheel, while permitting free rotation of the encoder wheel about the wheel's axis of rotation; and a sensor, rigidly attached to the bearing means, for detecting the motion of at least some of the marks as the encoder wheel rotates; a probe arm, having a proximal end rigidly attached to the encoder wheel, and having a distal end with a probe tip attached thereto; and coordinate processing means, operatively connected to the sensor, for converting the output of the sensor into a set of cylindrical coordinates representing the position of the probe tip relative to a reference cylindrical coordinate system.
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: December 30, 2003
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Bernhard Jokiel, Jr., Mark T. Ensz, Robert D. Watson
  • Patent number: 6651351
    Abstract: A method for measuring structures of an object using a feeler element associated with a coordinate measuring instrument and extending from an elastic bendable feeler extension is disclosed, and wherein the feeler element is brought into contact with an object having structures to be measured and the position of the feeler is then determined by comparing the position of the feeler as determined by the coordinate measuring instrument with the position determined by the optical sensor.
    Type: Grant
    Filed: March 8, 2000
    Date of Patent: November 25, 2003
    Assignee: Werth Messtechnik GmbH
    Inventors: Ralf Christoph, Eugen Trapet, Heinrich Schwenke
  • Publication number: 20030177653
    Abstract: A sensor for a machine for measuring three-dimensional coordinates, the sensor comprising a portion enabling it to be fixed to the end of a moving arm, and an active portion remote from said fixing portion, including a connection element between the active portion and the connection portion, thereby forming a mechanical joint having at least one degree of freedom.
    Type: Application
    Filed: March 18, 2003
    Publication date: September 25, 2003
    Inventor: Romain Granger
  • Patent number: 6604295
    Abstract: A fine feed mechanism (50) and a coarse feed mechanism (60) respectively for minutely and greatly displacing a stylus (12) is provided to a microscopic geometry measuring device (1), so that the respective mechanisms (50, 60) are combinedly actuated for easily controlling the movement of the stylus (12) in a wide range at a short time. Further, a movable balancing portion (53) moving in a direction opposite to a movable driving portion (52) is provided to the fine feed mechanism (50). Since a reaction force caused by the movement of the movable driving portion (52) is cancelled by another reaction force caused by the movement of the movable balancing portion (53) at a fixed portion (51), no mechanical interference is caused between the respective mechanisms (50, 60), thus accurately controlling the movement of the stylus (12).
    Type: Grant
    Filed: March 13, 2001
    Date of Patent: August 12, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kunitoshi Nishimura, Kazuhiko Hidaka, Kiyokazu Okamoto
  • Patent number: 6601311
    Abstract: A method of calibrating a scanning system comprising a machine and a measuring probe, includes the steps of error mapping the system statically and qualifying the stylus tip so that the system will provide accurate measurements, determining the positions of a number of datum points on the surface of an artefact with the probe stylus in contact with the workpiece and at zero deflection normal to the surface, scanning the surface through the datum points at a nominal stylus deflection and at the maximum speed which provides repeatable position measurements to make a second determination of the positions of the datum points, determining the errors attributable to the scanning process by subtracting the positions obtained in the first and second determinations, and storing the error values for correction of subsequent measurements of similar artefacts.
    Type: Grant
    Filed: July 10, 2002
    Date of Patent: August 5, 2003
    Assignee: Renishaw PLC
    Inventors: David R McMurtry, Alexander T Sutherland, David A Wright
  • Patent number: 6594532
    Abstract: A measurement probe is carried by a carriage movable in a first direction to cause the measurement probe to traverse a measurement path across a surface of an object received by a support surface to provide measurement data representing variations in a second direction different from the first direction of surface features along the measurement path. The support surface is movable in a third direction different from the first and second directions. Measurement of a surface area is effected by controlling the carriage to cause the measurement probe to traverse a plurality of measurement paths across an area of the surface of an object mounted on the support surface and by controlling the support surface to move in the third direction after each measurement path traverse. Measurement data thus obtained for a reference sphere of previously known radius is used to determine the relative orientation of the first and third directions.
    Type: Grant
    Filed: November 26, 2001
    Date of Patent: July 15, 2003
    Assignee: Taylor Hobson Limited
    Inventor: Michael Mills
  • Patent number: 6546643
    Abstract: The invention is directed to an articulating device for a probe head (4) of a coordinate measuring apparatus with the articulating device having at least two rotation joints (14, 15) for angularly aligning the probe head (4). In this articulating device, corrective values are assigned to the device with which the errors caused by the elastic deformation of the articulating device are corrected when making measurements. To improve the measuring results, a mathematical model is used for correcting the deformation and this mathematical model includes at least one mathematical finite element (17, 18).
    Type: Grant
    Filed: February 14, 2001
    Date of Patent: April 15, 2003
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Werner Lotze, Tobias Held
  • Patent number: 6530156
    Abstract: A target lens shape measuring device for measuring a target lens shape of an eyeglass lens has a measuring section including: a template feeler contactable with a periphery of a template; a first supporting base to which the template feeler is attached; a first motor and a link mechanism that move the template feeler and the first supporting base between a measuring position and a retracted position, wherein the link mechanism located between the measuring position and the retracted position is engaged with the first supporting base, and the link mechanism located at the measuring position is disengaged with the first supporting base; a second motor that moves the template feeler and the first supporting base in a radius vector direction of the template; and a first encoder that detect an amount of movement of the template feeler and the first supporting base in the radius vector direction of the template.
    Type: Grant
    Filed: August 3, 2000
    Date of Patent: March 11, 2003
    Assignee: Nidek Co., Ltd.
    Inventor: Yoshinori Matsuyama
  • Patent number: 6526672
    Abstract: A head for the linear dimension checking of mechanical pieces, including a casing that defines a longitudinal geometric axis, an arm—set movable with respect to the casing, a feeler coupled to the movable arm—set for touching the piece to be checked, a biased device arranged between the casing and the movable arm—set for urging the movable arm—set into contact with the casing, a detecting device coupled to the casing, including a movable element and a transmission device between the movable arm—set and the movable element of the detecting device. In order to reduce the frictions and improve the repeatability of the head, the transmission device includes a wire substantially rigid in a longitudinal direction but flexible in the direction perpendicular to the longitudinal direction. The wire has a first end coupled to the movable arm—set and a second end for cooperating with the movable element of the detecting device.
    Type: Grant
    Filed: February 5, 2001
    Date of Patent: March 4, 2003
    Assignee: Marposs Societa′ per Azioni
    Inventors: Franco Danielli, Roberto Baruchello
  • Patent number: 6519860
    Abstract: Disclosed is a system and method for independently evaluating the spatial positional performance of a machine having a movable member, comprising an articulated coordinate measuring machine comprising: a first revolute joint; a probe arm, having a proximal end rigidly attached to the first joint, and having a distal end with a probe tip attached thereto, wherein the probe tip is pivotally mounted to the movable machine member; a second revolute joint; a first support arm serially connecting the first joint to the second joint; and coordinate processing means, operatively connected to the first and second revolute joints, for calculating the spatial coordinates of the probe tip; means for kinematically constraining the articulated coordinate measuring machine to a working surface; and comparator means, in operative association with the coordinate processing means and with the movable machine, for comparing the true position of the movable machine member, as measured by the true position of the probe tip, with
    Type: Grant
    Filed: October 19, 2000
    Date of Patent: February 18, 2003
    Assignee: Sandia Corporation
    Inventors: Lothar F. Bieg, Bernhard Jokiel, Jr., Mark T. Ensz, Robert D. Watson
  • Patent number: 6519863
    Abstract: A probe arm comprises a base member 10 securable to a surface of a machine tool, and a rotatable hub 12, carrying an arm member 16 with a tool-setting probe (18 FIG. 1). The hub has a portion 22 with three radial projections (26 FIG. 2) which rotates within an aperture 24 of the base which also has three inward radial projections 30. Together these projections form stops at the operative and non-operative positions of the probe. The aperture also has three axial raised areas 42 on an annular ledge 40 which support an annular should 44 on the hub. Thus there are six points of contact between the hub and base member in the operative and non-operative positions. A biasing arrangement comprises a detent plate 46 secured to the aperture and a planar spring 48 secured to the hub by its central region. Ball bearings 56 are loosely retained in two opposite lugs (54 FIG. 6) on the spring and run around the detent plate between two pairs of detent holes (58 FIG. 5).
    Type: Grant
    Filed: September 22, 2000
    Date of Patent: February 18, 2003
    Assignee: Renishaw PLC
    Inventors: David R. McMurtry, Stephen E. Lummes
  • Patent number: 6516529
    Abstract: A stylus has a detection element support part 1E for supporting and fixing piezoelectric elements 21 to 24 and a rod 1D placed on the detection element support part 1E. The detection element support part 1E has a plurality of flange parts 1F each being regular polygonal in cross section orthogonal to the axis of the rod 1D. The displacement detection elements are attached to the sides of the flange parts 1F in a state in which they are inclined at a predetermined angle &agr; relative to the axis of the rod 1D. If a measured force in a torsion direction Q or in a bend direction P occurs on the rod 1D through a contact ball 1A, the measured force is transmitted along substantially the length direction of the piezoelectric elements 21 to 24.
    Type: Grant
    Filed: June 22, 2001
    Date of Patent: February 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Hidaka, Akinori Saitoh, Kunitoshi Nishimura
  • Patent number: 6516669
    Abstract: A stylus 20 is mounted directly on detector 32 and the detector 32 is mounted directly on a holder 10. Thus, an vibration-type contact detection sensor 1 is formed in a state in which the holder 10 and the stylus 20 are placed out of contact with each other and the stylus 20 and the detector 32 are placed in contact with each other. Therefore, attenuation of vibration and status change of the stylus 20 by the holder 10 can be circumvented and vibration and status change of the stylus 20 can be propagated directly to the detector 32, so that the detector 32 can detect vibration and status change of the stylus 20 with high sensitivity, and contact with a workpiece can be detected with high sensitivity.
    Type: Grant
    Filed: May 15, 2001
    Date of Patent: February 11, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Kaoru Matsuki, Kazuhiko Hidaka, Masanori Arai
  • Patent number: 6513262
    Abstract: A comparator measures and compares linear or angular dimensions. The comparator includes a metallic casing (2), and two bearings (23,24) such that a sensing probe (3), going through said casing (2) and worked directly into the casing (2), can be accommodated. Two sockets (8,9) of the comparator are firmly attached to the casing (2). A measuring system of the comparator includes a mobile portion (33) driven by the sensing probe and a fixed portion (27) firmly attached to the casing (2). A housing (10) of the comparator completely covers the outer sides (25) of the casing (2) and is held by the two sockets (8,9).
    Type: Grant
    Filed: September 11, 2000
    Date of Patent: February 4, 2003
    Assignee: Brown & Sharpe TESA SA
    Inventors: Lucien Borgognon, Marco Cardillo, Roland Duteil
  • Patent number: 6499368
    Abstract: The novel sensor assembly is comprised of a threaded housing with pressure relief tracks through the threads that terminate at a hole through the housing and a displacement sensor. In the preferred embodiment, we have included an integral connector, a super-elastic core carrier and a Differential Variable Reluctance Transducer. Other sensor types could be used to construct a pressure equalized displacement sensor as described herein, these may include: capacitive, resistive, Hall effect, eddy current, and differential variable transformer. The sensor is attached to a keyed connector and the entire assembly is potted into the housing. A temperature probe can also be potted with this assembly to allow for multiple tasks t1o be performed by this one housing. The housing is threaded on one end to allow for easy mounting. A hole is drilled through the housing just in back of the sensor and two tracks run perpendicular to and slightly deeper than the threads. The tracks connect to the through hole.
    Type: Grant
    Filed: April 28, 1998
    Date of Patent: December 31, 2002
    Assignee: Microstrain, Inc.
    Inventors: Steven Willard Arms, Christopher Pruyn Townsend, Steven Ward Mundell
  • Patent number: 6487896
    Abstract: A checking head (T) includes a casing (1), an arm (2) with a feeler, movable with respect to the casing, and a sensor, such as an inductive position transducer (5). An electronic identifier (27) is fixed to a frame coupled to the head (T), for storing identifying data relevant to the head, information relating e.g. to the configuration and calibration features of the head, and/or compensation values obtained in the 41 course of the calibration phase carried out on a suitable testing equipment.
    Type: Grant
    Filed: August 9, 2000
    Date of Patent: December 3, 2002
    Assignee: Marposs Societa' Per Azioni
    Inventor: Carlo Dall'Aglio
  • Patent number: 6484571
    Abstract: A surface configuration measuring method is provided, the surface configuration measuring method being characterized in having the steps of: moving a touch signal probe by a command velocity vector to touch a surface of the workpiece to be measured; scanning the surface of the workpiece to be measured, the touch signal probe being moved along the surface to be measured while controlling the distance relative to the surface to be measured so that detected amplitude value of a detection signal outputted by the detecting circuit becomes a predetermined reference value, thus outputting the detected amplitude value and corresponding measuring position; and calculating an estimated surface position based on the detected amplitude value and the measuring position estimated to be obtained when surface is scanned to keep the detected amplitude value constant.
    Type: Grant
    Filed: July 24, 2000
    Date of Patent: November 26, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Hidaka, Akinori Saito, Kiyokazu Okamoto
  • Patent number: 6470584
    Abstract: A probe arm for locating a probe on a machine includes a signal conditioning circuit which produces probe status signals to be sent to the machine. The signal conditioning circuit includes two LEDs mounted on the arm and which are differently coloured to provide a visual indication of probe status e.g. probe ready or probe triggered. One of the LEDs has twice the efficiency of the other and therefore to maintain consistent illumination one is driven with twice the current of the other. Thus by monitoring the current through the LEDs in a sensing circuit at the output terminals of the signal conditioning circuit the status of the probe is communicated to the machine. Power to the probe and signal conditioning circuit is provided from the machine via the output terminals so that only two wires are required to connect the arm to the machine.
    Type: Grant
    Filed: July 10, 2000
    Date of Patent: October 29, 2002
    Assignee: Renishaw, PLC
    Inventor: Matthew A Stoodley
  • Patent number: 6449861
    Abstract: Head for checking linear dimensions of parts in machine tools or measuring machines, with a casing, a movable arm-set including an arm carrying a feeler for contacting the part to be checked, a biasing device arranged between the casing and the movable arm-set, a detecting device for providing a signal depending on the position of the movable arm-set, and two constraining systems—between the casing and the movable arm-set—both totally with force closure under the action of the biasing device, that eliminate, in a univocal way, the six degrees of freedom of the movable arm-set, one of the two constraining systems featuring a structure with rotational symmetry.
    Type: Grant
    Filed: March 4, 1999
    Date of Patent: September 17, 2002
    Assignee: Marposs Societa' per Azioni
    Inventors: Franco Danielli, Carlo Carli
  • Patent number: 6446351
    Abstract: A linear measuring machine is provided, the linear measuring machine having a base (11), a column (12) disposed on the base, a slider (14) elevatable along the column and an elevation driving mechanism (44) including a motor for lifting and lowering the slider. The linear measuring machine further includes a touch-and-back mechanism for driving the elevation driving mechanism in a direction for a probe (13) to move away from a measurement surface of the workpiece after fetching a detection value of a displacement sensor (45) when the probe touches the measurement surface of the workpiece and for stopping the elevation driving mechanism.
    Type: Grant
    Filed: April 11, 2000
    Date of Patent: September 10, 2002
    Assignee: Mitutoyo Corporation
    Inventors: Yuwu Zhang, Masaoki Yamagata, Hiroyuki Tokito, Yoichi Nomura, Bunji Aoyama
  • Patent number: 6434846
    Abstract: A method of calibrating a scanning system comprising a machine and a measuring probe, includes the steps of error mapping the system statically and qualifying the stylus tip so that the system will provide accurate measurements, determining the positions of a number of datum points on the surface of an artefact with the probe stylus in contact with the workpiece and at zero deflection normal to the surface, scanning the surface through the datum points at a nominal stylus deflection and at the maximum speed which provides repeatable position measurements to make a second determination of the positions of the datum points, determining the errors attributable to the scanning process by subtracting the positions obtained in the first and second determinations, and storing the error values for correction of subsequent measurements of similar artefacts.
    Type: Grant
    Filed: December 4, 2000
    Date of Patent: August 20, 2002
    Assignee: Erenishaw PLC
    Inventors: David R McMurtry, Alexander T Sutherland, David A Wright
  • Patent number: 6430833
    Abstract: A measuring probe includes a suspension module 112 in which a stylus holder 140 is suspended from a housing on a pair of diaphragms 142, 144. At least one of the diaphragms is formed with spiral cut-outs whereby the stylus, which is connected at the centre of the diaphragms, is able to move transversely of the axis of the housing as the stylus holder pivots when transverse forces are applied to the stylus tip. A transducer module 110 is releasably supported on the suspension module by a kinematic mounting 116, 118 and is retained in position by magnets 120. The transducer module contains optical transducers 200, 210, 220 for measuring the deflection of the stylus.
    Type: Grant
    Filed: November 27, 2000
    Date of Patent: August 13, 2002
    Assignee: Renishaw PLC
    Inventors: Andrew G Butter, David R McMurtry
  • Publication number: 20020092192
    Abstract: A stylus having a stem covered, at least partially, with a coating formed of an elastically or plastically deformable synthetic material.
    Type: Application
    Filed: January 16, 2002
    Publication date: July 18, 2002
    Inventors: Reinhold Schopf, Roland Fischer
  • Patent number: 6370788
    Abstract: Vibrations of the stylus (4) of a measuring probe (1) mounted on a machine, and which are transmitted to the probe stylus via the machine quill and probe body, are reduced or eliminated by a vibration damping means positioned within a cavity of the stylus. FIG. 2 illustrates a first embodiment in which the vibration damping means is a unconstrained rubber cylinder (16), in a hollow cartridge (12) connected to the stylus at its tip. Alternatively a dynamic vibration absorber can be used.
    Type: Grant
    Filed: January 27, 2000
    Date of Patent: April 16, 2002
    Assignee: Renishaw PLC
    Inventors: Peter K. Hellier, Graham R. Ferguson
  • Publication number: 20010029678
    Abstract: Gauging head and apparatus for linear dimension checking of mechanical pieces comprising an integral element that defines an arm carrying a feeler, a reference portion, and a fulcrum that enables rotations of the arm with respect to the reference portion, and a differential transformer position transducer with a cylindrical shaped casing, carrying windings, fixed to the reference portion, and a ferromagnetic core movable together with the arm. The integral element is locked in an adjustable way to a support by means of the cylindrical casing. The integral fulcrum is achieved by work hardening the material and subsequently grinding it.
    Type: Application
    Filed: March 14, 2001
    Publication date: October 18, 2001
    Inventor: Guido Golinelli
  • Patent number: 6301796
    Abstract: A programmable probe system for a machine includes a probe, an interface and a two-way optical communication link between them. The probe includes signal conditioning electronics, a power supply, a plurality of on/off switch circuits whereby the electronics may be connected to, and disconnected from, the power supply by a variety of means, for example, an optical signal, or a mechanical switch and a timing circuit. The probe also includes a microprocessor which can be externally programmed from the interface to select one or other of the on/off switch circuits. Where the probe includes a radio transmission for transmitting probe data to the interface, it is also provided with a synthesiser for generating different operating frequencies for the transmission system. The microprocessor can also be programmed from the interface to change the frequency of the system where required.
    Type: Grant
    Filed: April 6, 1998
    Date of Patent: October 16, 2001
    Assignee: Renishaw PLC
    Inventor: Serge Cresson
  • Publication number: 20010025427
    Abstract: The invention is directed to an articulating device for a probe head (4) of a coordinate measuring apparatus with the articulating device having at least two rotation joints (14, 15) for angularly aligning the probe head (4). In this articulating device, corrective values are assigned to the device with which the errors caused by the elastic deformation of the articulating device are corrected when making measurements. To improve the measuring results, a mathematical model is used for correcting the deformation and this mathematical model includes at least one mathematical finite element (17, 18).
    Type: Application
    Filed: February 14, 2001
    Publication date: October 4, 2001
    Inventors: Werner Lotze, Tobias Held