Abstract: In a successive approximation ADC, resolution is limited because a distortion occurs in an A/D conversion result due to a voltage dependence of a sampling capacitance. An A/D converter includes a sampling capacitor part in which capacitors equal in capacitance value to each other are connected inversely, a successive approximation A/D conversion part that conducts A/D conversion on the sampling charge, a digital correction part that corrects capacitance variation of internal DAC capacitors in the successive approximation A/D conversion part, and a digital correction part that digitally corrects a third-order or more factor of a voltage dependence of the sampling charge.

Abstract: The present invention provides a circuit for concurrent integration of multiple differential signals. The circuit comprises a plurality of Stage 1 integration circuit arranged in array and a plurality of Stage 2 integration circuit arrange in array. Each of said Stage 1 integration circuit is configured to concurrently integrate an input signal to send out a Stage 1 positive signal and a Stage 1 negative signal which is reverse to said Stage 1 positive signal. Each of said Stage 2 integration circuit is configured to integrate a differential signal from a Stage 1 positive signal sent from a corresponding Stage 1 integration circuit and a Stage 1 negative signal sent from another Stage 1 integration circuit next to said corresponding Stage 1 integration circuit to output a Stage 2 signal.

Abstract: An analog-to-digital converter comprises a first set of comparators configured for generating a coarse digital measurement of an analog input signal, and a second set of comparators for performing a fine digital measurement of the analog input signal. The second set comprises a plurality of dynamic comparators, wherein each dynamic comparator is configurable for being activated by a clock signal. An activation circuit processes the coarse measurement and an input clock signal for generating a set of activation signals, which activate a subset of the dynamic comparators to generate the fine digital measurement.

Abstract: There is disclosed current-mode time-interleaved sampling circuitry configured to be driven by substantially sinusoidal clock signals. Such circuitry may be incorporated in ADC circuitry, for example as integrated circuitry on an IC chip. The disclosed circuitry is capable of calibrating itself without being taken off-line.

Abstract: A method for converting a sampled analog signal into digital is provided. An input signal is sampled at a sampling instant to generate a sample voltage. A first current is then applied to a node to change a voltage on the node, and a first interval to change the voltage on the node to a reference voltage from the sample voltage using the first current is determined. A second current is then applied to the node to change a voltage on the node prior to a subsequent sampling instant, and a determination of a second interval to change the voltage on the node to the reference voltage from the sample voltage using the second current is made.

Abstract: A method and an apparatus for evaluating weighting of elements of a DAC and a SAR ADC using the same are provided. An equivalent weighting of each composed element is obtained by adding a reference element with a reference weighting, an auxiliary DAC, and a search circuit into the SAR ADC, and the equivalent weighting is represented by the reference weighting. The SAR ADC can calculate and then obtain a correct digital output by using the calibrated equivalent weighting and the successive approximation result of each input signal. The present disclosure prevents the necessity of matching each composed element of the DAC in the SAR ADC.

Abstract: The present disclosure includes systems and techniques relating to low power current-voltage mixed ADC architecture. In some implementations, an apparatus includes sample and hold circuitry, at least one ADC module configured to generate a first digital output based on a first analog input provided to the sample and hold circuitry, and current generation circuitry configured to modulate an analog output of the sample and hold circuitry to generate a residue output corresponding to the first analog input absent at least a portion corresponding to the first digital output, and to provide the residue output as a second analog input to further circuitry to generate a second digital output.

Abstract: There is disclosed current-mode time-interleaved sampling circuitry configured to be driven by substantially sinusoidal clock signals. Such circuitry may be incorporated in ADC circuitry, for example as integrated circuitry on an IC chip. The disclosed circuitry is capable of calibrating itself without being taken off-line.

Abstract: An analog-to-digital (ADC) controller is used in combination with a digital processor of a microcontroller to control the operation of capacitance measurements using the capacitive voltage division (CVD) method. The ADC controller handles the CVD measurement process instead of the digital processor having to run additional program steps for controlling charging and discharging of a capacitive touch sensor and sample and hold capacitor, then coupling these two capacitors together, and measuring the resulting voltage charge thereon in determining the capacitance thereof. The ADC controller may be programmable and its programmable parameters stored in registers.

Abstract: A guard ring is provided around each capacitive sensor plate and charged to substantially the same voltage as a voltage on the capacitive sensor plate. The guard ring reduces parasitic capacitances of the capacitive sensor plate caused by differences in voltage potentials between the capacitive sensor plate, and adjacent circuit conductors, ground planes and power planes. Two digital outputs and associated voltage divider resistors are used to drive the guard ring voltage to substantially the same voltage as the voltage on the capacitive sensor plate.

Abstract: A multi-channel analog digital conversion circuit includes a plurality of sampling circuits for sampling and buffering a plurality of analog input signals, a single output circuit coupled to the sampling circuits and shared by the sampling circuits and a single analog digital conversion core coupled to the output circuit and shared by the sampling circuits.

Abstract: A system for performing analog-to-digital conversion comprises a sampling unit that generates multiple digital samples from an analog input signal at each recurrence of a periodic interval, and a processing unit that combines the digital samples to produce a digital output signal. In certain embodiments, the sampling unit comprises multiple analog-to-digital converters arranged in parallel, and the processing unit comprises a digital signal processor that detects outliers in the digital samples and averages any non-outliers among the digital samples to generate the digital output signal.

Abstract: In combining an analog terminal of an A/D converter with a digital terminal, the effect of the noise from the digital terminal is reduced. A semiconductor integrated circuit includes a high-speed external terminal, a low-speed external terminal, a high-speed analog switch, a low-speed analog switch, and an A/D converter. The high-speed external terminal is coupled to an input of the A/D converter via the high-speed analog switch, and the low-speed external terminal is coupled to the input of the A/D converter via the low-speed analog switch. A plurality of inputs of a plurality of low-speed digital input buffer circuits and a plurality of outputs of a plurality of low-speed digital output buffer circuits are coupled to a plurality of low-speed external terminals.

Abstract: A track and hold circuit includes an input, a first output configured to produce a first output signal, and a second output configured to produce a second output signal while the track and hold circuit is in a first mode. While the track and hold circuit is in a second mode, the second output signal is combined with the first output signal and output on the first output.

Abstract: A control circuit connects a capacitor to an input terminal and an output terminal of an operational amplifier and applies a signal charge to charge the capacitor with a switch being turned off. Thus, a conversion voltage corresponding to the signal charge is outputted from the operational amplifier. The control circuit then sets charges, which correspond to the conversion voltage, in capacitors and reallocates the charges among the capacitors by connecting non-common electrodes of the capacitors to either one of a plurality of reference voltage lines in accordance with a conversion result of an A/D conversion circuit with the capacitor being connected to the input terminal and the output terminal of the operational amplifier. The control circuit thereafter performs, a number of times, charge setting, initialization and subsequent charge reallocation in accordance with a residual voltage outputted from the operational amplifier.

Abstract: A recording circuit is provided. The recording circuit includes a multiplexing circuit configured to receive a plurality of input signals and to produce a multiplexed output signal including the plurality of input signals, and a plurality of sampling circuits electrically coupled in parallel to each other, each sampling circuit being configured to sample a portion of the multiplexed output signal corresponding to an input signal of the plurality of input signals and the sampling circuits configured to alternately produce an output signal corresponding to the sampled portion.

Abstract: The present invention is related to a sample and hold circuit and an A/D converter, and prevents an output saturation for an input voltage over a power supply voltage range in the sample and hold circuit. A first switch which is turned on when an input voltage is to be sampled; a sampling capacitor configured to sample the input voltage input via the first switch when the first switch is turned on, and sample a predetermined reference voltage when the first switch is turned off; an adding/subtracting part configured to perform an addition or a subtraction between the input voltage sampled by the sampling capacitor and the predetermined reference voltage sampled by the sampling capacitor; and a hold part configured to hold and output a voltage obtained by the addition or the subtraction by the adding/subtracting part are provided.

Abstract: Systems and methods are provided for converting analog data to digital data that can include a discharge capacitor coupled to a voltage source. The voltage source supplies an initial data charge to the discharge capacitor; an amplifier coupled to the discharge capacitor; a divider circuit coupled to the amplifier; and a comparator coupled to the amplifier and the divider circuit. The divider circuit includes a first capacitor, a second capacitor, and a switch that is operated to alternately divide a remaining charge Q by 2N using the first and second capacitors until the remaining data charge Qin at the amplifier is below a threshold value in the process of converting analog data to digital data.

Abstract: A track-and-hold circuit is provided. This track-and-hold circuit is adapted to track an analog input signal and hold a sampled voltage of the analog input signal at a sampling instant for processing by other circuitry, in response to a track signal that alternates with a hold signal. Preferably, the track-and-hold circuit includes a bi-directional current source that sources and sinks current through a first output node and a second output node, a unity gain amplifier that is coupled to first and second output nodes of the bi-directional current source and that receives the analog input signal, a resistor coupled to an output of the unity gain amplifier, and a capacitor coupled between the resistor and ground. Of interest, however, is the bi-directional current source, which includes a differential input circuit that is adapted to receive the track signal and the hold signal and that is coupled to the first and second output nodes and an RC network that is coupled to the differential input circuit.

Abstract: Various embodiments of methods and devices for reducing capacitor mismatch errors in a pipeline analog-to-digital converter (ADC) are disclosed, where in a pipeline element circuit and during a first phase, an input voltage provided by a sample-and-hold circuit is presented to first and second capacitors arranged in parallel in the pipeline element circuit. During a second phase, a second voltage corresponding to a second charge associated with the second capacitance is amplified and stored in the pipeline element circuit. During a third phase, the same input voltage of the first phase is again presented to the first and second capacitors, which are arranged in parallel in the pipeline element circuit. During a fourth phase a first voltage corresponding to the first charge is amplified and stored in the pipeline element circuit.

Abstract: A method includes accepting an analog input signal including a sequence of pulses of a given pulse shape. The analog input signal is distributed to multiple processing channels (40) operating in parallel. The analog input signal is sampled by performing, in each of the multiple processing channels, the operations of: mixing the analog input signal with a different, respective modulating waveform to produce a mixed signal; filtering the mixed signal; and digitizing the filtered mixed signal to produce a respective digital channel output.

Abstract: An A/D conversion unit performs an A/D conversion operation twice during a hold period of an analog value. In a first conversion operation, the A/D conversion unit compares the analog value with a first reference voltage and outputs a comparison result as first converted data. In a second conversion operation, the A/D conversion unit compares the analog value with a second reference voltage and outputs a comparison result as second converted data. The second reference voltage is a voltage obtained by adding or subtracting a minimum resolution voltage to or from the first reference voltage. A digital processing unit averages errors of the first and second converted data by digital processing to detect an A/D conversion error, and feeds back a detection result to the A/D conversion unit as a control value to perform voltage control.

Abstract: Circuits and methods for sampling differential input signals having wide input swings including voltages below ground potential, and capable of operating on a single positive supply voltage are disclosed. In an embodiment, the circuit includes a first input switch circuit and a second input switch circuit, a sample and hold circuitry and an operational amplifier. Each of the first and second input switch circuits includes serially connected PMOS switch and NMOS switch for receiving a differential input signal. The sample and hold circuitry includes a first sampling capacitor, a second sampling capacitor and a plurality of switches. The switches are configured to provide the differential input signal to the sampling capacitors for the sampling in a sample phase, and are configured to provide the sampled differential input signal at an output of the operational amplifier in a hold phase.

Abstract: An input circuit for an analog-to-digital converter (ADC) includes at least one bootstrap circuit, including at least one first switch for connecting electrical power to a first terminal of at least one capacitor; at least one second switch for connecting a second terminal of the at least one capacitor to a signal to be sampled; at least one third switch for connecting the first terminal of the at least one capacitor to the control gate of at least one sampling network input switch; at least one fourth switch for connecting the at least one sampling network input switch to a substrate; and at least one fifth switch for connecting the second terminal of the at least one capacitor to the substrate.

Abstract: The A/D conversion circuit according to one aspect of the present invention includes: a first sampling capacitor; a first sampling switch; a buffer circuit; a second sampling capacitor; a second sampling switch; a first converter; a first reset switch; and a second reset switch. The first and second sampling switches are turned on to track voltage to the first sampling capacitor and to sample buffer voltage to the second sampling capacitor through the buffer circuit. The first sampling switch is turned off to hold voltage. The second sampling switch is turned off so that the first converter reads the voltage from the second sampling capacitor to perform A/D conversion thereon. After that, the first and second reset switches reset the first and second sampling capacitors.

Abstract: A system including a sample-and-hold circuit for receiving a plurality of analog input signals; an analog-to-digital converter for converting each of the analog inputs to a digital signal; and a processor configured for implementing fractional delay recovery for the analog-to-digital converter. In some embodiments, the fractional delay recovery includes converting each of the plurality of analog input signals to a digital version in the predetermined order; upsampling each digital version in the predetermined order; digitally filtering each upsampled value in the predetermined order; and downsampling each filtered value in the predetermined order.

Abstract: A sample and hold circuit and the method thereof are disclosed. The sample and hold circuit may be applied in voltage regulators or other circuits. The sample and hold circuit comprises: an input terminal configured to receive an input signal; an output terminal configured to provide an output signal; a control circuit configured to receive the input signal and the output signal, and wherein based on the input signal and the output signal, the control circuit generates a digital signal, and wherein the digital signal increases when the output signal is lower than the input signal, and maintains when the output signal is larger than or equal to the input signal; a digital-to-analog converter (DAC) configured to convert the digital signal to the output signal.

Abstract: An analog to digital converter includes a first sample circuit that samples an analog input during a first phase of a clock. A second sample circuit samples the analog input during a second phase of the clock. A comparator compares a reference to the output of the first sample circuit during a non-overlapping time between an end of the first phase and beginning of the second phase and compares the reference to the output of the second sample circuit during a non-overlapping time between an end of the second phase and beginning of the first phase.

Abstract: A controller controls first and second supply switches so that, during a sampling period, a ground voltage is supplied to n first up-capacitors and n second up-capacitors while a power supply voltage is supplied to n first down-capacitors and n second down-capacitors. The controller also controls the first and second supply switches based on the result of comparison by a comparator during each of n bit determination periods so that a first analog voltage at a first sampling node and a second analog voltage at a second sampling node gradually approach each other.

Abstract: Embodiments provide for dramatically improved interference resistance in advanced communications applications, where the frequency range can exceed 1 GHz. Such embodiments may be implemented using wideband technology to provide a wideband compressive sampling architecture that is capable of superior interference rejection through RF front end cancellation.

Abstract: Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.

Abstract: An electric signal digitizing device includes a line of propagation through which the signal travels and a plurality of samplers (141, . . . , 14N) connected at separate points on the line of propagation, such that each one samples the signal value at the connection point thereof. The device further includes an analog matrix memory including a line of which at least some elements are each connected to a sampler of the plurality of samplers to receive the value sampled by the sampler, and a means for the line-to-line shifting of stored values. An analog-digital conversion means is also provided for the analog-digital conversion of the stored values.

Abstract: A radio frequency (RF) receiver may comprise a first sampling module that is operable to sample in a first level at a particular main sampling rate; a plurality of second-level sampling modules, wherein each of the plurality of second-level sampling modules is operable to sample in a second level, an output of the first level, at a second sampling rate that is reduced compared to the main sampling rate; and a plurality of third-level modules, each comprising a plurality of third-stage sampling sub-modules that are operable to sample at a third sampling rate that is reduced compared to the second sampling rate, and a plurality of corresponding analog-to-digital conversion (ADC) sub-modules.

Abstract: A method and apparatus for analog-to-digital conversion. An Analog-to-Digital Converter (ADC) includes M ADCj, j=1, 2, . . . , M. Each ADCj comprises a number of cells each of which comprises a first switch, a second switch, a current sink and an inverter. An inverter of a cell in an ADCj changes state in response to a current associate with an input signal of the ADCj exceeding a threshold, thus switching on the next cell. Each ADCj is enabled to perform analog-to-digital conversion on a residual current of a previous ADCj-i after the previous ADCj-1 has completed its analog-to-digital conversion and has been disabled.

Abstract: A method for converting a sampled analog signal into digital is provided. An input signal is sampled at a sampling instant to generate a sample voltage. A first current is then applied to a node to change a voltage on the node, and a first interval to change the voltage on the node to a reference voltage from the sample voltage using the first current is determined. A second current is then applied to the node to change a voltage on the node prior to a subsequent sampling instant, and a determination of a second interval to change the voltage on the node to the reference voltage from the sample voltage using the second current is made.

Abstract: Compressive sensing is an emerging field that attempts to prevent the losses associated with data compression and improve efficiency overall, and compressive sensing looks to perform the compression before or during capture, before energy is wasted. Here, several analog-to-digital converter (ADC) architectures are provided to perform compressive sensing. Each of these new architectures selects resolutions for each sample substantially at random and adjusts the sampling rate as a function of these selected resolutions.

Abstract: A system and method are provided for operating first and second components in first and second domains. In one embodiment, the method includes: generating a plurality of clock signals shifted relative to one another; operating a first component in a first domain using a first one of the plurality of clock signals; operating a second component in a second domain using a second one of the plurality of clock signals selected using a selection component; and comparing a present output of the second component to a stored value, determining whether a variation between the present output and the stored value is greater than a threshold, and, if the variation is greater than the threshold, using a controller to cause the selection component to select a third clock signal from the plurality of clock signals that is shifted relative to the second clock signal to drive the second component.

Abstract: Some embodiments disclosed herein relate to a method. In the method, a duration of a first synchronization pulse is measured. A fixed, predetermined number of ticks are equally spaced at a first time interval over the first sync pulse, regardless of the duration of the first synchronization pulse. A duration of a first data pulse is then measured by periodically incrementing a tick count value at the first time interval during the entire duration of the first data pulse. The tick count value at an end of the first data pulse is then correlated to a first digital value encoded on the first data pulse.

Abstract: A computer-implemented method, device, and program product for detecting a phase shift between an I data clock and a Q data clock in processing an I data signal or a Q data signal used in quadrature modulation or quadrature demodulation. The method includes: receiving an input of the I data clock and the Q data clock; performing exclusive-ORing (XORing) on the I data clock and the Q data clock; latching a result of the performance of XORing on a phase sampling clock which is asynchronous with the I data clock and the Q data clock; incrementing a first number; incrementing a second number; comparing the incremented first number and the incremented second number and determining, based on a phase determination criterion, a phase shift between the I data clock and the Q data clock; and detecting a phase shift between the I data clock and the Q data clock.

Abstract: A burst mode receiver including a CDR circuit that does not perform bit synchronization determination at a wrong position even when a burst signal waveform containing a distortion is input is provided. The burst mode receiver includes a CDR circuit for reproducing clock and data from a received signal, a bit synchronization determination circuit for determining whether the CDR circuit is in an optimum phase, a waveform distortion determination circuit for determining from the received signal whether there is waveform distortion, and a CDR output enable determination circuit for determining whether an output of the CDR circuit is valid or invalid. The CDR output enable determination circuit performs CDR output enable determination based on a bit synchronization determination result and a waveform distortion determination result.

Abstract: A clock and data recovery device receives a serial data stream and produces recovered clock and data signals. The clock and data recovery device operates over a range of frequencies and without use an external reference clock. A first loop supplies a first clock signal to a second loop. The second loop modifies the first clock signal to produce the recovered clock signal and uses the recover clock signal to produce the recovered data signal. The first loop changes the frequency of the first clock signal based on frequency comparison and data transition density metrics.

Abstract: A switched-capacitor input circuit which receives an analog input signal, and samples and holds the analog input signal, comprising a differential amplifier, a first capacitor, one terminal of the first capacitor being connected to a non-inverting input terminal of the differential amplifier, a second capacitor, one terminal of the second capacitor being connected to an inverting input terminal of the differential amplifier, a first switch configured to connect the other terminal of the first capacitor to one of a first reference voltage and a second reference voltage, a second switch configured to connect the other terminal of the second capacitor to one of the first reference voltage and the second reference voltage, and a third switch configured to connect the other terminal of the first capacitor to the other terminal of the second capacitor.

Abstract: To provide a semiconductor device including an A/D converter circuit that is capable of performing A/D conversion with high accuracy and high resolution and that can be reduced in size. One loop resistance wiring is shared by a plurality of power supply switches and a plurality of output circuits, and a reference voltage having a triangular (step-like) wave generated using the resistance wiring and the plurality of power supply switches is utilized. Thus, high-accuracy digital signals can be obtained using such an A/D converter circuit that can be reduced in size as an output circuit, without using a complicated circuit structure. Further, the number of constituent elements of the A/D converter circuit is small, whereby in the case of providing A/D converter circuits in parallel, variation between the A/D converter circuits can be made small.

Abstract: High conversion rates are achieved in an analog to digital converter by tailoring the substrate type to specific operational elements of the converter. Embodiments place sample and hold processing circuitry on a substrate type having properties that allow for faster processing at high sampling/clock frequencies. Other operational elements of the converter are constructed on at least one other substrate type in keeping with the remainder of the circuitry for which the converter is being implemented. The sample and hold substrate may be implemented on any material which is capable of faster processing, such as silicon germanium, gallium arsenide, silicon bipolar, BiCMOS, and the like. Other portions may be implemented on a more CMOS substrate. Such systems and methods are able to implement analog-to digital conversion for broadband signals at high speeds without the need for extensive timing compensation, while also avoiding problems due to noise from further digital processing circuitry.

Abstract: Methods and apparatus are provided for pseudo asynchronous testing of receive paths in serializer/deserializer (SerDes) devices. A SerDes device is tested by applying a source of serial data to a receive path of the SerDes device during a test mode. The receive path substantially aligns to incoming data using a bit clock. A phase is adjusted during the test mode of the bit clock relative to the source of serial data to evaluate the SerDes device. The source of serial data may be, for example, a reference clock used by a phase locked loop to generate the bit clock. The phase of the bit clock can be directly controlled during the test mode, for example, by a test phase control signal, such as a plurality of interpolation codes that are applied to an interpolator that alters a phase of the bit clock.

Abstract: Apparatus and methods disclosed herein operate to compensate for skew between inverse phases (e.g., differential phases) of an analog signal appearing at the inputs of an analog signal capture circuit such as a track-and-hold or sample-and-hold circuit associated with an ADC or similar device. Each of two capture clocks is used to capture one of the inverse phases. One or more delay circuits are configured to create a differential delay between clock transitions associated with the two capture clocks. The differential delay is proportional to the input skew between the inverse phases. The phases are consequently sampled at substantially identical points on a phase domain axis. Embodiments operate to create phase sampling synchronicity and to thereby decrease the amplitude of a common-mode signal component that results from the skew. Increased linearity and decreased distortion may result.

Abstract: An apparatus and method for efficient and concurrent sampling of a sensor signal to create multiple output signals each at different sampling rates is provided. The apparatus and method determine an aperiodic sampling rate or sampling schedule such that only samples representing samples at the different sampling rates are taken. The aperiodic samples are taken then de-interleaved to filter wanted samples for a particular application or user. As a result, the aperiodic samples is just a combination of all of the subsets to each application. Such aperiodic sampling reduces a total number of samples taken and, as a direct result, reduces the number of samples needing to be processed and stored and also reduced the power otherwise consumed to sample, process and store unused samples.

Abstract: An integrated circuit includes a digital-to-analog converter (DAC) circuit including at least one first channel type DAC and at least one second channel type DAC. The integrated circuit includes a plurality of sample and hold (S/H) circuits. Each of the S/H circuits is coupled with the DAC circuit. The S/H circuits are capable of receiving signals from the DAC circuit and outputting the signals in parallel.

Abstract: To date, bandwidth mismatch within time-interleaved (TI) analog-to-digital converters (ADCs) has been largely ignored because compensation for bandwidth mismatch is performed by digital post-processing, namely finite impulse response filters. However, the lag from digital post-processing is prohibitive in high speed systems, indicating a need for blind mismatch compensation. Even with blind bandwidth mismatch estimation, though, adjustment of the filter characteristics of track-and-hold (T/H) circuits within the TI ADCs can be difficult. Here, a T/H circuit architecture is provided that uses variations of the gate voltage of a sampling switch (which varies the “on” resistance of the sampling switch) to change the bandwidth of the T/H circuits so as to precisely match the bandwidths.

Abstract: A method includes receiving digital audio data at an audio adjustment system. The method includes converting a portion of the digital audio data to an analog audio signal with a digital-to-analog converter of the audio adjustment system to form a sample analog audio signal. The method includes determining a dynamic range of the sample analog audio signal with the audio adjustment system. The method also includes modifying a metadata parameter of the digital audio data with the audio adjustment system when the dynamic range of the sample analog audio signal is below a threshold. The metadata parameter is a dialog normalization parameter.