Abstract: A method for digitizing at least a portion of a selected analog input signal of a plurality of analog input signals by using a multiplexer having a plurality of channels is provided. Each channel for the multiplexer is associated with at least one of the analog input signals and is associated with a pair of select signals, and wherein each channel includes a cell having an input terminal, an output terminal, and a boosted NMOS switch. According to the method, a first select signal from each pair of select signals is asserted to decouple the input and output terminals for each cell. A boost capacitor is also charged during the non-sampling or conversion phase while the first select signal from each pair of select signals is asserted.

Abstract: For high voltage applications, multi-channel successive approximation register (SAR) analog-to-digital converters (ADCs) are often plagued with numerous problems that are generally associated with parasitics (which are present in high voltage components). Here, a different architecture is provided where the sampling capacitors are separated from conversion capacitors so as to have low voltage components in the conversion path. Additionally, to improve the acquisition time and reduced total harmonic distortion (THD) multiple channels can use the same sampling capacitors.

Abstract: A redundant analog-to-digital conversion system can include at least one input multiplexer, first and second redundant analog-to-digital converters, a comparison circuit and an output multiplexer. The at least one input multiplexer can receive a plurality of analog input signals and output at lest one multiplexed analog input signal. The first and second redundant analog-to-digital converters can convert the at least one multiplexed analog input signal to respectively generate first and second digital output signals, the first digital output having a greater digital resolution than the second digital output. The comparison circuit can produce a comparison output signal as a function of a comparison of a plurality of most significant corresponding bit pairs of the first and second digital output signals. The output multiplexer can produce a multiplexed output including information from the comparison output signal and one of the digital output signals.

Abstract: A microcontroller includes a microcontroller core and an analog-to-digital converter (“ADC”) coupled to said microcontroller core. The ADC has multiple input channel multiplexers that are configured to receive multiple analog input channels. The microcontroller further includes a selection register and a data structure. The data structure comprises a plurality of associated field sets. Each bit position in the selection register indexes to one of the associated field sets in the data structure, and the value contained in each such bit position indicates whether or not to select the corresponding associated field set for selection of an analog input channel. Each associated field set comprises one or more values collectively specifying an analog input channel to select for conversion to digital form.

Abstract: An analog to digital converter (ADC) includes a clock control unit supplying a predetermined clock signal corresponding to luminance among a plurality of clock signals having different frequencies; and a signal conversion unit comparing a ramp signal with an inputted pixel signal to generate a comparison result signal. The ADC performs counting corresponding to the predetermined clock signal supplied by the clock control unit and stores a count value counted at a time of the generating of the comparison result signal.

Abstract: An analog-digital converter for converting an analog signal into a digital signal includes a first configuration register for configuring a first group of channels and a second configuration register for configuring a second group of channels. The conversion result of the channels of the first group is transferred to a memory via a direct memory access. Each channel of the second group of channels has an associated respective data register and the conversion results of the channels of the second group are stored in the respective data registers.

Abstract: A microcontroller includes a microcontroller core and an analog-to-digital converter (“ADC”) coupled to said microcontroller core. The ADC has multiple input channel multiplexers that are configured to receive multiple analog input channels. The microcontroller further includes a selection register and a data structure. The data structure comprises a plurality of associated field sets. Each bit position in the selection register indexes to one of the associated field sets in the data structure, and the value contained in each such bit position indicates whether or not to select the corresponding associated field set for selection of an analog input channel. Each associated field set comprises one or more values collectively specifying an analog input channel to select for conversion to digital form.

Abstract: An analog-to-digital converter (ADC) within an image sensor includes a comparator comparing a ramp signal with an image signal, and a counter generating a count result in response to the comparison by counting a clock during a counting interval. The ADC determines whether a first counting interval for the counter is less than a reference interval, and if the first counting interval is less than the reference interval the counting interval is a first counting interval, else the counting interval is a second counting interval.

Abstract: A method relates to a technique for reducing the readout time of switched capacitor array circuitries. An implementation is a SCA chip capable of sampling 12 differential input channels at a sampling speed of 10 MSPS to 5 GSPS. The analog waveform can be stored in 1024 sampling cells per channel, and can be read out after sampling via a shift register. The write signal for the sampling cells is generated by a chain of inverters. The domino wave runs continuously until stopped. A read shift register clocks the contents of the sampling cells to outputs, where it can be digitized. It is possible to read out only a part of the waveform for reducing the digitization time. The high channel density, high analog bandwidth of 450 MHz, and low noise of 0.35 mV makes this chip suited for low power, high speed, high precision waveform digitizing.

Abstract: A novel noise injection technique is presented to improve dynamic range with low resolution and low speed analog to digital converters. This technique combines incoming signal and noise signal with wave front de-multiplexer and split into several channels. Then low resolution and low speed analog to digital converters are used to sample each channels. All signals are recovered using wave front multiplexer. For advanced design, ground diagnostic signals with optimizing processor can be added to guarantee recovery quality.

Abstract: The electronic controller fetches an external signal and performs an input process such as A-D conversion. Upon receipt of processing results for executing operations according to a predetermined program, an output process is performed for sending a signal to the outside board on operation results, a timer outputs at least two of an input process start signal for starting the input process, an output process start signal for starting the output process, and an operation start signal for starting the operation.

Abstract: According to an embodiment, an analog-to-digital converter (ADC) including an ADC unit, a clock-phase control unit, a multiplexer, and a digital-output processing unit is provided. The digital-output processing unit inputs digital outputs of the ADC unit to either an averaging circuit or the multiplexer depending on the specified conversion speed and the specified conversion accuracy, or inputs the digital outputs of the ADC unit to the averaging circuit and the multiplexer in this order, and outputs ADC digital signals with the specified conversion speed and the specified conversion accuracy.

Abstract: Tri-level scrambling in a digital to analog converter system is achieved by, in response to a tri-level binary code input, disabling a negative data directed scrambler circuit when the input code is in the positive cycle portion, disabling a positive data directed scrambler circuit when the input code is in the negative cycle portion and disabling both scrambler circuits upon a zero input code for reducing low level distortion due to a reversal of current during crossover between those cycles.

Abstract: A read signal processor includes an output unit that serializes a plurality of bits of digital data for each of the colors to obtain a plurality of serial signals, converts the serial signals to a plurality of low-amplitude differential signals, and outputs the serial low-amplitude differential signals.

Abstract: Systems and apparatus are provided for interfacing a digital controller with an analog input means. The system comprises a digital controller with the input of the digital controller coupled to the output of the analog-to-digital converter. The system further comprises a digital-to-analog converter coupled to an analog interface circuit. The analog interface circuit comprises a reconfigurable RC network switchably coupled to a first amplifier or to a second amplifier. The analog interface circuit further comprises a third amplifier having an input being coupled to an output of the second amplifier and the output of the third amplifier being coupled to the one or more input signal paths to the first amplifier.

Abstract: The electronic controller fetches an external signal and performs an input process such as A-D conversion. Upon receipt of processing results for executing operations according to a predetermined program, an output process is performed for sending a signal to the outside board on operation results, a timer outputs at least two of an input process start signal for starting the input process, an output process start signal for starting the output process, and an operation start signal for starting the operation.

Abstract: An architecture for use in wireless receiver applications, particularly for ADC conversion of received in-phase I and quadrature Q signals. A single ADC is shared to convert both signals, and the ADC input is alternately switched between the i and q signals. In an embodiment, the ADC is clocked at an increased sample rate, and the digital output signals are aligned to compensate for the phase difference resulting from the implementation of the single ADC.

Abstract: A method and system for sampling values. Multiple values are sampled concurrently. One of the values is stored while another one of the values is converted to a corresponding digital value by an analog-to-digital converter (ADC). Subsequently, the stored value is made available to the ADC.

Abstract: A method and apparatus for sampling and converting analog input values. In response to an event, a value is transmitted from an input of a multiplexer to the output of the multiplexer. The output of the multiplexer is coupled to an input of an analog-to-digital converter (ADC). In response to a second event, a value is transmitted from the input of the multiplexer to a second ADC.

Abstract: An A/D conversion circuit includes a plurality of transmission paths that transmit signal voltages and reference voltages, and an A/D conversion unit that A/D converts voltages output from the transmission paths. Each of the plurality of transmission paths includes a first switch that selectively outputs one of the signal voltage and the reference voltage, an S/H circuit that holds output voltage from the first switch, and a second switch that selectively outputs one of the output voltage from the first switch and output voltage from the S/H circuit.

Abstract: Various implementations relating to analog-to-digital converters are provided. A comparator of such a circuit is used for converting different analog input signals, while analog-to-digital conversion circuitry for these conversions is implemented at least partially separately. In other implementations, a comparator is used both for analog-to-digital conversion and for comparing an input signal to a constant or non-constant value.

Abstract: A physical layer (PHY) device including a first encoder, a second encoder, and a selector. The first encoder is configured to receive a first data stream at a first data rate, encode the first data stream using a first type of encoding, and output a first encoded data via a plurality of outputs. The second encoder is configured to receive a second data stream at a second data rate, encode the second data stream using a second type of encoding, and output a second encoded data via an output. The selector includes a first set of inputs and a second set of inputs. The first set of inputs is configured to receive the plurality of outputs of the first encoder, and each input of the second set of inputs is configured to receive the output of the second encoder.

Abstract: A method for inspecting a settling time of a deflection amplifier includes setting a settling time, performing shooting a plurality of times alternately to project two patterns of different types which are shaped by making a charged particle beam pass through a first and a second apertures while deflecting the charged particle beam by a deflector controlled by an output of a deflection amplifier which is driven based on the settling time having been set, measuring beam currents of the shooting, calculating an integral current of the beam currents measured, and calculating a difference between the integral current calculated and a reference integral current to output the difference.

Abstract: Techniques are provided to serialize and delay parallel input data signals and are particularly useful for low power applications. In one example, a device includes a plurality of data input ports adapted to receive N parallel single-ended input data signals, and a clock input port adapted to receive a clock signal substantially synchronized with the parallel single-ended input data signals. The device also includes a cell adapted to serialize the parallel single-ended input data signals to provide N/2 first serial differential output data signals in response to the clock signal, delay the parallel single-ended input data signals, and serialize the delayed parallel single-ended input data signals to provide N/2 delayed second serial differential output data signals in response to the clock signal. The delayed second serial differential output data signals are delayed relative to the first serial differential output data signals. The device also includes a plurality of output ports.

Abstract: Apparatuses and methods related to time-to-digital converters (TDCs) are herein described. Generally, a time-to-digital converter is a device which measures a time period or time interval and outputs a digital value representing the measured time period. In an implementation, an apparatus is provided comprising a time-to-digital converter circuit, which further comprises a built-in self test (BIST). The built-in self test may be implemented using one or more oscillators coupled to the time-to-digital converter via one or more multiplexer devices.

Abstract: An A/D (analog-to-digital) conversion circuit includes an input signal selecting circuit configured to output voltage signals of different signal levels in response to control signals in an adjustment mode before A/D conversion of an analog signal in a practical mode; an A/D converter configured to perform A/D conversion on the voltage signals in response to an adjustment sampling clock signal in the adjustment mode to output adjustment conversion values; and a sampling timing adjusting circuit configured to delay a reference sampling clock signal based on a delay value selected in response to a selection signal in the adjustment mode to output the adjustment sampling clock signal to the A/D converter.

Abstract: A disconnection detecting method includes charging a capacitor by connecting a node of the capacitor to a first power source line supplied with a first power source potential, connecting the node of the capacitor to an input terminal, after the node of the capacitor is disconnected from the first power source line, and converting a first value on the node to a first digital data. The method further includes discharging the capacitor by connecting the node of the capacitor to a first power source line supplied with a second power source potential, after the node is disconnected from the input terminal, connecting the node of the capacitor to the input terminal, after the node of the capacitor is disconnected from the second power source line, and converting a second value on the node to a second digital data.

Abstract: A semiconductor device includes: input terminals identified by channel numbers and configured to receive analog signals; analog input pads identified by pad numbers and connected with whole or part of the input terminals; a data holding section configured to hold a data of the input terminals; a channel designating section configured to generate a channel designation signal to designate one of the channel numbers; and a channel translating section configured to translate the channel number indicated by the channel designation signal into a specific one of the pad numbers based on the held data. An A/D converting section is configured to convert the analog signal inputted from the analog input pad corresponding to the specific pad number into a digital signal.

Abstract: An analog to digital converter has an input for coupling to multiple channels having analog signals. The analog to digital converter converts the analog signals on such channels to provide a digital output. A memory device has an enable bit for each of the multiple channels and a current channel register. An interface coupled to the memory device and current channel register selects a next channel for converting by the analog to digital converter, skipping channels that are not enabled.

Abstract: A method and apparatus for sampling and converting analog input values. In response to an event, a value is transmitted from an input of a multiplexer to the output of the multiplexer. The output of the multiplexer is coupled to an input of an analog-to-digital converter (ADC). In response to a second event, a value is transmitted from the input of the multiplexer to a second ADC.

Abstract: Multiple digital signals from a single integrated circuit (IC) may be provided. The IC may receive an analog signal comprising a plurality of channels, convert the analog signal to a digital signal, and provide the digital signal to a plurality of digital channel tuners. The tuners may each select one of the plurality of channels and provide the selected channels as a plurality of digital output signals. A signal conditioner may be used to prepare the analog signal for digitization.

Abstract: A pipeline time-to-digital converter (TDC) is provided. The pipeline TDC includes a plurality of TDC cells. Each of the TDC cells includes a delay unit, an output unit and a determination unit. The delay unit receives a first clock signal and a first reference signal output from a previous stage TDC cell. The delay unit generates sampling phases in a period between a trigger edge of the first reference signal and a trigger edge of the first clock signal, and samples the first clock signal to obtain sampling values in accordance with the sampling phases. The output unit calculates the sampling values for outputting a conversion value. The determination unit uses and analyses the sampling values and the sampling phases for outputting time residue to a next stage TDC cell.

Abstract: Apparatus and methods are provided for performing a sampling sequence for a plurality of samples. An analog-to-digital conversion module comprises a sampling module, a register, and a sampling control module coupled to the sampling module and the register. The sampling module is configured to convert analog signals into corresponding digital values in response to sampling trigger signals and the register is configured to maintain scan mode criteria for a plurality of samples. The sampling control module is configured to identify a scan mode criterion for a respective sample of the plurality of samples, automatically generate a sampling trigger signal when the scan mode criterion for the respective sample is equal to a first value, and generate the sampling trigger signal in response to a timing trigger signal when the scan mode criterion for the respective sample is equal to a second value.

Abstract: A blending circuit is disclosed to be operable to combine plurality of digital outputs received from an analog to digital conversion system to create a composite digital signal. The analog to digital conversion system receives analog signals originated from multiple but substantially the same source signals, wherein the source signals being scaled to different degrees. A blending circuit deploys a blending factor to combine the digital outputs in a manner which blends and/or adjusts portion of each digital output being used to avoid over-flown portion of the digital outputs and to minimize phase and/or amplitude discontinuity of the composite digital signal.

Abstract: A method of converting a plurality of input signals on first and second converters, such that the first and second converters are both used when the plurality of signals comprises two signals, characterised in that said method comprises: selecting more than two input signals; determining the type of each selected signal; combining any signals having the same type to form a combined signal; converting one type of signal with the first converter; converting a second type of signal with the second converter wherein the first or second type signals is a combined signal.

Abstract: An angular velocity sensor has a stable output characteristic using a sigma-delta type analog-to-digital converter. The sigma-delta type analog-to-digital converter includes an integrator unit for integrating electric charges output from an input switching device and a digital-to-analog converter unit, and holding at least two integrated values, a comparator unit for comparing at least the two integrated values output from the integrator unit with a predetermined value. The sigma-delta-type analog-to-digital converter also includes an arithmetic operation unit for operating an output signal of the comparator unit, the arithmetic operation unit being provided with a differential operation unit for computing a difference between at least two comparison signals output from comparator unit.

Abstract: An analog-to-digital conversion system includes an analog-to-digital converter (ADC), a plurality of receivers, each for capturing input analog signals, a multiplexer having inputs coupled to each of the receivers and an output coupled to the ADC, the multiplexer establishing a signal path between a selected one of the inputs and the output in response to an index signal, and a mux controller to supply a random sequence of index signals to the multiplexer.

Abstract: An analog input signal obtained from an analog sensor group 104A and first and second calibration voltages obtained by high-precision voltage-dividing resistors are successively selected by a multiplexer, digitally converted through an AD converter and then input to a microprocessor. The microprocessor calculates a collinear approximate coefficient based on the first and second calibration voltages in cooperation with a program memory, and corrects the digital conversion value to the analog input signal by using the approximate coefficient, thereby correcting a linear error of the conversion characteristic of the AD converter. In the calculation of the approximate coefficient, upper and lower limit check is executed on measurement values and calculation coefficients, and also plural calculation results are averaged to enhance the precision.

Abstract: Disclosed herein is a semiconductor integrated circuit including: line buffers; an alpha channel first selector; an alpha channel digital-to-analog converter; a beta channel digital-to-analog converter; a redundant digital-to-analog converter; an alpha channel second selector; a beta channel second selector; an alpha channel amplifier; and a beta channel amplifier.

Abstract: According to an embodiment, an analog-to-digital converter (ADC) including an ADC unit, a clock-phase control unit, a multiplexer, and a digital-output processing unit is provided. The digital-output processing unit inputs digital outputs of the ADC unit to either an averaging circuit or the multiplexer depending on the specified conversion speed and the specified conversion accuracy, or inputs the digital outputs of the ADC unit to the averaging circuit and the multiplexer in this order, and outputs ADC digital signals with the specified conversion speed and the specified conversion accuracy.

Abstract: Techniques for the reception and processing of wireless signals are disclosed. For instance, an apparatus may include a first hardware module (e.g., a mixed signal module) and a second hardware module (e.g., a digital signal module). The first hardware module may convert an analog signal corresponding to a received wireless signal into a digital signal having a first sampling rate. In turn, channel filtering may be performed on this digital signal. Following this, the filtered digital signal may be resampled from the first sampling rate to a second sampling rate. At this point, the resampled signal may be transferred across an interface from the first hardware module to the second hardware module. Upon receipt, the second hardware module may correct a sampling rate error in the second sampling rate, and demodulate the digital signal into one or more symbols.

Abstract: In a scanning mode: a conversion sequence setting register sets the sequence in which analogue signals are to be converted; a multiplexer selects a single analogue signal sequentially from a plurality of analogue signals, in accordance with the order that is set in this conversion sequence setting register; an A/D converter converts the analogue signal selected by this multiplexer to a digital signal; a conversion result register having a plurality of result registers stores the digital signal obtained by conversion by the A/D converter in these storage regions in the order in which conversion was effected; and a back-up register includes result registers respectively corresponding to this plurality of result registers.

Abstract: A method and apparatus for converting an analog input voltage signal to a discrete signal, the method including generating at least one reference voltage and at least one secondary voltage. The method further including selecting at least one voltage between the at least one reference voltage and the at least one secondary voltage and generating at least one intermediate voltage based on the at least one voltage and at least one digital code. The at least one intermediate voltage and the analog input voltage further being used to generate at least one comparison signal and the discrete signal being generated based on the at least one comparison signal and the at least one digital code.

Abstract: A method and an apparatus for an ultrasound system provide compression of ultrasound signal samples after analog to digital conversion and before beamforming. The analog ultrasound signals received from an array of ultrasound transducer elements are digitally sampled by a plurality of analog to digital converters (ADCs) to produce a plurality of sequences of signal samples. Each sequence of signal samples is compressed to form a corresponding sequence of compressed samples. The resulting sequences of compressed samples are transferred via a digital interface to an ultrasound signal processor. At the ultrasound signal processor, the received sequences of compressed samples are decompressed. The typical processing operations, such as beamforming, downconversion and detection, are applied to decompressed samples. This abstract does not limit the scope of the invention as described in the claims.

Abstract: An AD converter includes an input circuit, an operation circuit and a bus interface. The input circuit is provided with a pull-down circuit, which is capable of pulling down an analog signal input side of a sample-hold circuit whether an analog signal is inputted or not. The operation circuit is provided with a reference voltage conversion result storing register, which is capable of storing a conversion result of an analog reference voltage inputted periodically separately from a conversion result of the analog signal inputted through the sample-hold circuit. The operation circuit is further provided with a check register, which is capable of writing in and reading out data for checking operation of a signal transfer system including a bus interface through the bus interface. Thus, it is made possible to confirm normality of an external part and an internal part of the AD converter.

Abstract: A signal monitoring circuit includes a plurality of sensors, a meter chip, a micro control unit (MCU), and a multiplexer. The sensors are adapted for collecting electrical signals of an electrical system, and each of the sensors correspondingly generates an output signal. The multiplexer is adapted for receiving the output signal of each of the sensors. The MCU controls the multiplexer to selectively output one of the output signals. The meter chip receives the selected one of output signals from the multiplexer and generates corresponding meter signals to the MCU.

Abstract: An analog to digital converter includes: a reference circuit adapted to generate reference voltages; differential amplifiers; normal phase circuits each of which samples a normal phase analog input signal and transfers a comparison voltage, obtained by comparison with a reference voltage generated by the reference circuit, to a first input terminal of one of the differential amplifiers when the input is differential and single-ended; and reversed phase circuits each of which samples a reversed phase analog input signal and transfers a comparison voltage, obtained by comparison with a reference voltage generated by the reference circuit, to a second input terminal of one of the differential amplifiers when the input is differential and which samples a ground level as a reference voltage of the reference circuit and supplies the reference voltage and comparison voltage to the second input terminal of the differential amplifier when the input is single-ended.

Abstract: A multiple mode digitization system for a non-destructive inspection instrument which makes use of a multiplexing circuit and a single set of analog to digital converters to efficiently digitize analog test signals from a plurality of inputs. In the preferred embodiment, each of the analog to digital converters in the system is driven with an independent and separate clock signal, allowing for propagation delay compensation among the plurality of test signals as well as interleaved sampling such that custom sampling rates can be used for each input without the need for more than one clock frequency. In an alternate embodiment, phase adjustments on the sampling clocks are used only for interleave sampling, and digital filters are used to provide signal propagation delay compensation.

Abstract: Systems and methods for processing a plurality of input signals are provided. A plurality of selection signals are received. Each of the plurality of selection signals is representative of one of a plurality of input signal characteristics. Each of the input signal characteristics is associated with one of the plurality of input signals. The plurality of input signals are converted into at least one digital waveform. A plurality of signal values may be extracted from the at least one digital waveform based on the plurality of input signal characteristics. An output signal may be generated based on each of the plurality of signal values.

Abstract: Apparatus and methods are provided for performing a sampling sequence for a plurality of samples. An analog-to-digital conversion module comprises a sampling module, a register, and a sampling control module coupled to the sampling module and the register. The sampling module is configured to convert analog signals into corresponding digital values in response to sampling trigger signals and the register is configured to maintain scan mode criteria for a plurality of samples. The sampling control module is configured to identify a scan mode criterion for a respective sample of the plurality of samples, automatically generate a sampling trigger signal when the scan mode criterion for the respective sample is equal to a first value, and generate the sampling trigger signal in response to a timing trigger signal when the scan mode criterion for the respective sample is equal to a second value.