Abstract: An ophthalmic measuring device for obtaining three-dimensional information of an eye to be examined without time lag by projecting pulsed light chirped in such a manner that color is continuously changed from the leading end through the tail end of a pulsed light with time on the eye to be examined, cutting out the pulsed light reflected from the eye to be examined at a predetermined timing by a shutter, and obtaining spectroscopic distribution characteristic of the cut-out image by a spectroscopic unit.

Abstract: In order to optimize the image properties of several optical elements of which at least one is moved relative to at least one stationary optical element, the overall image defect resulting from the interaction of all optical elements is first of all measured. This is represented as a linear combination of the base functions of an orthogonal function set. The movable element is then moved to a new measurement position and the overall image defect is measured once again. After the linear combination representation of the new overall image defect, the image defects of the movable element and of the stationary element are calculated from the data thereby obtained. With only one movable optical element a target position in which the overall image defect is minimized can be directly calculated and adjusted there from. If several movable optical elements are available, methods are given for the efficient determination of the respective target position.

Abstract: An optical monitor includes a body having a first plurality of parallel, substantially opaque, spaced apart lines thereon, and the second plurality of parallel, substantially opaque, spaced apart lines thereon, with a relatively small angle between the first and second pluralities of lines. A an image of the lines of the first plurality thereof is provided on the semiconductor body, upon relative movement of the monitor toward and away from the semiconductor body, the line images move relative to the semiconductor body. The images of the lines of the second plurality thereof provided on the semiconductor body move in a different manner upon relative movement if the monitor toward and away from the semiconductor body: The moiré fringe formed on the semiconductor body from images of the first and second plurality of lines during such movement is analyzed in order to achieve proper focus of the image on the semiconductor body.

Abstract: A method for evaluating the quality of a lens has the steps of: illuminating imaging light on a screen through the lens to form a projected image, where the imaging light having a test-pattern image is generated using a test sheet on which a test pattern for measuring a resolution of the lens is formed to evaluate the resolution of the lens; detecting a brightness of the test-pattern image displayed on the screen by an image-capturing device using an imaging sensor; calculating an input level on the basis of the detected brightness of the test-pattern image; and calculating an evaluated value of resolution. In the method, furthermore, there is provided the step of adjusting a position of the test sheet to a position corresponding to a focus of the lens by detecting the test-pattern image while moving the test sheet back and forth in the direction along an optical axis of the lens is further comprised.

Abstract: A lens meter for measuring optical characteristics of a lens, which is capable of measuring a progressive lens easily and an aspherical lens accurately. The lens meter is provided with a lens rest having an aperture, for placing a lens thereon, a measurement optical system having a light source which projects a measurement light bundle onto the lens placed on the lens rest and a photodetector which receives the measurement light bundle transmitted through the lens, for forming a plurality of different measuring positions inside the aperture, calculation means for obtaining optical characteristics at each of the measuring positions based on an output from the photodetector, comparison means for comparing the optical characteristics obtained at the measuring positions, and guiding means for guiding a predetermined one of the measuring positions to at least one of a near viewing section and a far viewing section of a progressive lens based on a result of the comparison.

Abstract: The invention relates to a cell for an ophthalmic lens, for testing the latter with an optical inspection system, said cell comprising a hollow space (11, 31) which is filled with a liquid and has an axis (12, 32) coinciding, in the test position, with the optical axis of an inspection system and, in the test position of the cell, is delimited from above by a viewing glass (13, 33) for the optical test and has, underneath the viewing glass, a test trough (14, 34) for the ophthalmic lens. Between viewing glass (13, 33) and test trough (14, 34), at least one insertion channel (15, 35) opens into the hollow space (11, 31), the ophthalmic lens being able to be inserted into the hollow space (11, 31) through the outer insertion opening (16, 36) of said insertion channel (15, 35).

Abstract: An improved approach for correcting lens distortion in an imaging system is disclosed. The method is applicable to systems which include both an image system and a laser scanner. In the method, a comparison is made between the location of laser spots on a remote image as captured by the imaging system with calculated locations of the laser spots generated by the laser scanner. The difference between distorted imaged spots and undistorted computationally determined spot locations is utilized to generate a distortion map. The distortion map is then applied to correct a distorted image.

Abstract: A lens meter capable of easily measuring optical characteristics of far and near viewing sections of a multifocal lens to obtain optical characteristics of a multifocal lens. The lens meter comprises a first measurement optical system having a first measurement optical axis, for measuring optical characteristics of a far viewing section of a multifocal lens, and a second measurement optical system having a second measurement optical axis which is different from the first measurement optical axis, for measuring optical characteristics of a near viewing section of the multifocal lens.

Abstract: Methods and reticles for evaluating lenses are disclosed. In one instance, a reticle which permits light to pass therethrough is provided which includes a first surface with a grating profile formed thereon. The grating profile includes a plurality of grouped stepped portions. Each group of the stepped portions includes a first step which prevents light from propagating therethrough, a second step which propagates light therethrough and a third step which propagates light therethrough at an angle 60 degrees out of phase with the light propagated through the second step.

Abstract: An optical inspection apparatus and method for optical elements. The apparatus comprises a surface profiler in data communication with a computing platform, and utilizes an overlap integral between an expected output field based on the designed profile and the calculated output field based on the measured profile. The overlap integral is utilized in one embodiment to calculate the expected loss of the optical element. In another embodiment, the overlap integral is utilized to calculate the amount of undesired wave function. The method an apparatus are useful for both flat and curved dielectric materials and may be utilized with both reflecting and non-reflecting surfaces.

Abstract: Methods for determination of parameters in lithographic devices and applications by diffraction signature difference analysis, including determination of center of focus in lithography devices and applications. Latent image analysis may be employed with exposed but undeveloped lithographic substrates. Control methods are provided for process control of center of focus in lithography devices utilizing diffraction signature difference analysis.

Abstract: The invention provides an inspection cell for inspecting an ophthalmic lens. The inspection cell is a solid block that has a bottom planar surface, a top surface, and an indentation in the top surface. The indentation is adapted to receive an ophthalmic lens. which is to be inspected. The invention additionally provides an inspection unit for an ophthalmic lens, which holds one or more of the inspection cells.

Abstract: A device for calculating diffraction efficiencies of a diffraction lens divided into a plurality of regions, each region comprising at least one grating ring, comprises a first memory for storing information about diffraction efficiencies of the regions; a second memory for storing information about weights corresponding to the regions; and a first processor for retrieving information from the first and the second memory, and calculating diffraction efficiencies of the entire diffraction lens using the formula 1 E j = ∑ m = 1 M ⁢ W m ⁢ η mj ( 1 )

Abstract: An inspection system for performing a test selected from the group consisting of field of view, angle of view, distortion, image quality, depth of field, illumination system transmission efficiency, illumination profile, relative transmission of imaging system and centering error of a rigid, rod lens endoscope. The inspection system includes a testing station supporting a plurality of targets for measuring an optical performance of the endoscope, and a controller controllably displacing the testing station linearly toward and away from the endoscope and rotating the testing station at a nominal angle of view of the endoscope about a first axis and rotating the targets about a second axis parallel to the first axis to selectively displace each of the targets into the field of view of the endoscope.

Abstract: A target lens shape measuring device for measuring a target lens shape for processing an eyeglass lens includes: amount on which at least one of a template and a base of a fixing cup to which a dummy lens is attached is to be mounted; a fixing portion for pressing and fixing the template or the dummy lens mounted on the mount during measurement; a moving mechanism for moving the fixing portion between a pressing position, at which the fixing portion presses the template or the dummy lens, and a non-pressing position; a measuring pin to be brought into contact with a periphery of the template or the dummy lens mounted on the mount; a movement detecting mechanism for detecting an amount of movement of the measuring pin to obtain a target lens shape; and a linking mechanism for moving the measuring pin from a retracted position to a measuring position in linking with movement of the fixing portion to the pressing position by the moving mechanism.

Abstract: Described is a device which enables toolsetting on a machine tool. The device includes a light emitting unit (10) and a light detecting unit (14). A light source (30) causes a light beam (12) to propagate from the emitting unit (10) to the detecting unit (14). A light detector (40) detects the presence or absence of the beam. A trigger signal is produced when occlusion occurs and so the position of an object can be determined by reference to the machine's coordinate readings. The beam (12) may be uncollimated and thus provide a device with an easier set-up and a greater resistance to vibration in use. The light detector (40) and/or light source may be protected from contamination by windows (34,44) or a protector having an aperture therein. The light emitting and detecting units each have an aperture for the light beam.

Abstract: Automatic non-contact measuring optical properties of an optical object is performed by a system comprising a light source, a reference pattern, and an imaging and detecting means and an image processing means for producing a measurement output. At least the reference pattern and the imaging and detecting means are disposed on an optical axis of the system. The system further comprises a support for the optical object located between the reference pattern and the imaging and detecting means for disposing thereon the optical object coaxially with the pattern and the imaging and detecting means. The light source is capable of directing to the pattern an illuminating light in such a manner as to produce a plurality of illuminating light beams outcoming from each point of the pattern at different angles.

Abstract: A system for measuring properties of an optical component, such as a progressive, multifocal ophthalmic spectacle lens comprises a design having a set of concentric circles, means for recording images of the design directly and through the optical component in a computer memory, means for superimposing the images to form a moiré-effect pattern and a method for analyzing the pattern to measure a property (e.g., powers) of the optical component that includes a comparison of a portion of the pattern generated with the component with a portion of a pattern generated by a master component.

Abstract: A hub structure for use in an optical network, the optical network comprising a ring structure carrying a bidirectional optical data signal and a plurality of hub structures arranged in-line within the ring structure, the optical data signal comprising primary and secondary path transmission signals having opposing transmission directions on the ring structure, the hub structure comprising a drop unit arranged, in a normal state, to drop and through-connect a primary receive path signal for further processing at the hub structure, and, in a protection state, to drop and through-connect a secondary receive path signal for further processing at the hub structure.

Abstract: Scattered light is detected radiometrically in a photolithography system. A photodetector makes direct measurements of scatter at points in the line or plane of illumination, and a generalized scatter function is derived from these measured data.

Abstract: A method and system are provided for measuring a characteristic of a lens. By directing light to a lens, and receiving reflected light from a opposite end faces of the lens on an image plane, a determination from the focused spots on the image plane can be made as to a characteristic of the lens, such as its focal length.

Abstract: The invention relates to methods and apparatus for determining a characteristic of an optical element. The apparatus includes a spatial light pattern generator adapted to generate a beam of light at a predetermined spatial position, at least one lenslet disposed in an array of lenslets adapted to receive the beam of light from the spatial light pattern generator, and to direct the beam of light to the optical element. The apparatus further includes a detector positioned to receive the beam of light subsequent to the beam of light encountering the optical element. The detector is adapted to detect a received spatial position at which the detector receives the beam of light. The apparatus also includes a processor adapted to compare the predetermined spatial position with the received spatial position to determine the characteristic of the optical element. The invention further relates to methods and apparatus for generating a diffraction limited image.

Abstract: A process for measuring at least one parameter of an optical element having first and second surfaces on opposed sides thereof uses a reflection-reducing member, which is solid and has substantial mechanical integrity, but which is resilient and elastically deformable so as to conform to a surface with which it is placed in contact. This reflection-reducing member is contacted with the second surface of the optical element so that a surface of the reflection-reducing member conforms to this second surface, the parameter is measured, and the reflection-reducing member is removed from the second surface leaving this surface substantially free from any residue. The presence of the reflection-reducing member reduces or eliminates unwanted reflections from the second or “back” surface of the optical element, thus simplifying the measurement of any parameter which depends upon detecting reflection from the first or “front” surface of the optical element.

Abstract: A wavefront sensor includes a plurality of lenses disposed in the same plane, and an area sensor that receives a bundle of rays of light collected through each of the lenses as a luminous point. Each of the lenses comprises a plurality of concentric areas with different focal lengths, and the area sensor is located substantially halfway between a first position in which a plane wave forms an image after passing through one of the concentric areas with a minimum focal length, and a second position in which the plane wave fronts an image after passing through another area with a medium focal length. With the wavefront sensor thus arranged, the measurement can be always achieved with high accuracy without involving noticeable blurring of luminous points on the area sensor regardless of the wavefront shape of a light beam indent to the lenses.

Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.

Abstract: The invention provides an automatic lens meter comprising an optical system forming a pattern image by projecting a pattern created by a pattern creating member and measuring optical properties of a lens based on the displacement of the pattern image from a baseline position wherein the examined lens is not in the path of rays in the optical system to a measuring position wherein the examined lens is in the path of the rays. The lens meter includes an image sensor for detecting the position of the pattern image using four line sensors 10a, 10b, 10c and 10d disposed on a pattern image forming plane and arranged in a cross shape, and the pattern creating member forms a pattern image having a quadrangular shape on the pattern image forming plane so that each line sensor intersects a side of the quadrangle, thereby facilitating accurate measurement of desired optical properties.

Abstract: In a method of measuring a radial gradient index distribution of a rod lens by calculating higher-order index distribution coefficients indicating the gradient index distribution, (1) the rod lens is processed so that the optic-axial length of the rod lens is approximately equal to P/2 (in which P represents a paraxial period length (pitch)) or approximately equal to an integer multiple of P/2 and so that opposite end surfaces of the rod lens are shaped like parallel planes, (2) a patterned surface is set as an object surface in the proximity of one end surface of the rod lens, and an image surface is formed in the proximity of the other end surface of the rod lens by irradiating the patterned surface with condensed monochromatic light, (3) the positions of paraxial focal points and the curves of curvature of field are obtained by observing the image surface, and

Abstract: The present invention provides a method for measuring lens aberration of light on a wafer. The method includes printing a pattern on the wafer by projecting the pattern through a lens in a plurality of pitches and directions; measuring a plurality of critical dimension (CD) differences between two locations on the printed pattern for each of the plurality of pitches and directions; and determining at least one Zernike coma aberration coefficient based on the measured plurality of CD differences. The method in accordance with the present invention measures the CD difference between two locations on the printed pattern on a wafer. This CD difference is then used to calculate the Zernike coma aberration coefficients. No projected reference pattern is required to measure the CD difference, and thus an absolute coma aberration can be calculated.

Abstract: The present invention provides an inexpensive and convenient method and apparatus for measuring light transmittance of an optical lens having refractive power. The method comprises obtaining the light transmittance of an examined lens from a value corresponding to a ratio between the intensity of measured light detected by a light detector when the examined lens is placed in the path of the measured light emitted from a light source and an intensity of measured light detected by the light detector when there is no lens undergoing examination placed in the path of the measured light so that the measured light does not pass through an examined lens and provides a baseline value. Specifically, the present invention focuses (converges) the measured light at or in a vicinity of a position where the examined lens is disposed when the examined lens is placed in the path of the measured light.

Abstract: A method and system for inspecting ophthalmic lenses using absorption where an ophthalmic lens is illuminated with light comprising wavelengths that are substantially absorptive to said lens, the image subsequently detected being created using only light at said absorptive wavelengths. Variations in transmitted light intensity translate into thickness changes in the lens caused by cosmetic flaws. The invention is also directed to imaging lens assemblies employing highly positive-powered field flattening lens elements to image a curved object, such as an ophthalmic lens, onto a flat image plane.

Abstract: A variable field angle and test patern spatial frequency optical assemblage for testing a lens having a plurality of field angles employs an improved modulation transfer function (MTF) design system for evaluating image quality produced by the lens being tested. A reflecting surface capable of translational and rotational movements is arranged along a predetermined optical path for receiving a collimated array of light rays and then directing the collimated array of light rays to the lens being tested.

Abstract: A plurality of bars-in-bars marks are formed. Each mark has four small patterns and four large patterns arranged in a direction of a straight line and a direction perpendicular thereto. The straight lines of the respective bars-in-bars marks are disposed at angles of 0°, 30° and 60°.

Abstract: A lens distortion factor calculating apparatus for subjecting an image picked up by image pick-up means having a lens to lens distortion correction comprises first means for finding, on the basis of two images picked up by the image pick-up means, the coordinates of a plurality of corresponding points between the images, second means for calculating, on the basis of the coordinates of the corresponding points found by the first means, geometric transform factors between the two images and third means for calculating, on the basis of the coordinates of the corresponding points found by the first means and the geometric transform factors found by the second means, a lens distortion factor.

Abstract: The present invention provides methods for determination of parameters in lithographic devices and applications by diffraction signature difference analysis, including determination of center of focus in lithography devices and applications.

Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.

Abstract: A method and apparatus enabling the placement of a mark on a lens at a desired position, easily and rapidly, without damaging the lens. The method comprising (1) the step of measuring a lens in which the optical properties and the reference position of the spectacle lens are measured and (2) the step of processing in which the lens is processed based on the optical information obtained in the step of measuring a lens. In the step of measuring a lens, the optical properties of the lens, such as the prism value, are measured using a desirable position selected as on the uncut lens as the position of measurement. An an optical reference position, such as the optical center, is calculated, a guiding mark is placed at the calculated position the relationship between the mark and the optical reference position is used in subsequent cut processing.

Abstract: A laser system is disclosed wherein a tunable laser signal has encoded within it information related to its wavelength at any instant in time. This encoding in one example is performed by modulating the signal to contain its wavelength information. This is particularly useful in a distributed system for testing optical components, wherein at a test site, the test station must determine the wavelength of light at which a component was tested.

Abstract: A lens meter according, including: a unit body provided with eyeglasses support means for supporting eyeglasses; a left measurement optical system provided in the unit body and provided with a left light-emitting optical system that emits measurement light to a left eyeglass lens of the eyeglasses and a left light-receiving optical system that receives the measurement light passing through the left eyeglass lens with a CCD (light-receiving element); a right measurement optical system provided in the unit body and provided with a right light-emitting optical system that emits measurement light to a right eyeglass lens of the eyeglasses and a right light-receiving optical system that receives the measurement light passing through the right eyeglass lens with the CCD (light-receiving element); and an arithmetic control circuit that performs operation to the optical characteristics of a pair of the eyeglass lenses based on an output of the CCD (light-receiving element).

Abstract: A projection lens distortion error map is created using standard overlay targets and a special numerical algorithm. A reticle including a 2-dimensional array of standard overlay targets is exposed several times onto a photoresist coated silicon wafer using a photolithographic stepper. After exposure, the overlay targets are measured for placement error using a conventional overlay metrology tool. The resulting overlay error data is then supplied to a software program that generates a lens distortion error map for the photolithographic projection system.

Abstract: A system for measuring properties of an optical component, such as a progressive, multifocal ophthalmic spectacle lens comprises a design having a set of concentric circles, means for recording images of the design directly and through the optical component in a computer memory, means for superimposing the images to form a moiré-effect pattern and a method for analyzing the pattern to measure a property (e.g., powers) of the optical component that includes a comparison of a portion of the pattern generated with the component with a portion of a pattern generated by a master component.

Abstract: A method of correcting aberrations in an optical system by applying a light adjustable aberration conjugator layer to a component of the system, determining the nature of the aberration, applying radiation to the conjugator layer such as to change the refraction and/or shape of the conjugator layer to compensate for the aberration, and locking in the desired optical property.

Abstract: The present invention provides a method and apparatus for simulating an aerial image projected from an optical system, wherein the optical system includes a pupil and a mask. In general, the method comprises the steps of obtaining parameters for the optical system, calculating a kernel based on an orthogonal pupil projection of the parameters of the optical system onto a basis set, obtaining parameters of the mask, calculating a vector based on an orthogonal mask projection of the parameters of the mask onto a basis set, calculating a field intensity distribution using the kernel and the vector, and obtaining aerial image data from the field intensity distribution.

Abstract: The proposed invention calculates the circumference of an optical lens taking into consideration external variations in lens size and shape. The invention, utilizing a uniquely designed optical lens tracing pen in conjunction with a specifically designed tracing template provides for a consistent method of measure with respect to the outermost ridge of a traced lens. The lens is traced utilizing the specifically designed invention pen, and scanned into a software system which receives the traced image and plots a lens shape based upon a calculated distance between first color template axis indicators and a second color pen tracing. The system further provides for a number of options to allow specification a prescription to be utilized in conjunction with the lens sizing information as well as the automated and transparent downloading of computer software and additional lens shape offerings reflected in updated versions of the invention.

Abstract: A coma aberration measuring method which takes the following steps. An object is exposed to light with a mask which bears a plurality of evaluation patterns each having at least two line patterns, wherein the width of lines in each of the plural evaluation patterns is different from that in any of the other evaluation patterns. Alternatively, a plurality of exposures are made on an object with a mask bearing evaluation patterns each having at least two line patterns, while varying the amount of light exposure for each exposure. As a result, a plurality of transfer patterns are created on the object. A detection is made as to in which one or ones among these plural transfer patterns either of the two line patterns is missing. Depending on the magnitude of coma aberration in the optical system used to make exposures, a line pattern with a certain line width among the line patterns to be transferred is not actually transferred.

Abstract: A lens evaluation method for calculating resolution evaluation value based on a detected luminance value in order to evaluate resolution of lens has a background luminance value acquiring step for acquiring a luminance value at a background part having no test pattern formed thereon, a maximum luminance value acquiring step for acquiring maximum luminance value in the test pattern image, a minimum luminance value acquiring step for acquiring minimum luminance value and an evaluation value calculating step for calculating a resolution evaluation value based on the luminance values obtained in the respective steps.

Abstract: The present invention provides methods for determination of parameters in lithographic devices and applications by diffraction signature difference analysis, including determination of center of focus in lithography devices and applications, such as for photoresist lithographic wafer processing.

Abstract: An alignment system for an imaging apparatus is disclosed. The alignment system aligns the image beam associated with the imaging apparatus relative to predetermined reference points, such as the vertex and base of a right triangle. The base of the right triangle may be normal to the image beam and the vertex of the right triangle may be located at a fixed and predetermined location relative to the imaging apparatus. The image beam may intersect a hypotenuse point on the hypotenuse of the right triangle and the image beam may intersect a base point on the base of the right triangle. The alignment system measures the distance between the base point and the hypotenuse point. The distance between the base point and the hypotenuse point corresponds to a single location on the base relative to the vertex. The alignment systems, thus, references the transverse position of the image beam relative to the vertex.

Abstract: A lens specifying apparatus comprising a light source (21) for projecting a measuring light beam on a lens (30) under examination, an area CCD (35) image receiving element for receiving the measuring light beam transmitted by the lens (30) under examination, a filter disc (64) disposed, as means for providing spectral transmittances, at a midpoint of an optical path extending from the light source (21) to the area CCD (35), and a processing circuit (37) for calculating the refractive characteristics and spectral transmittances of the lens (30) under examination on the basis of an output of the area CCD (35) and displaying the refractive characteristics and spectral transmittances on a monitor (3).

Abstract: A laser system is disclosed wherein a tunable laser signal has encoded within it information related to its wavelength at any instant in time. This encoding in one example is performed by modulating the signal to contain its wavelength information. This is particularly useful in a distributed system for testing optical components, wherein at a test site, the test station must determine the wavelength of light at which a component was tested.

Abstract: An optical member inspection apparatus includes an inspection optical system having a light source, and a diffusing means for diffusing the light emitted from the light source. The diffusing means has a central portion and a peripheral portion. The diffusion transmittance of the peripheral portion is higher than the diffusion transmittance of the central portion. The inspection optical system is also provided with an image pick-up means to pick-up an image of the optical member to be inspected, and is positioned so as to receive that light emitted from the light source and transmitted through the diffusing means and the optical member. A judging means is also provided, for judging whether or not the optical member has a defect, in accordance with image signals output from the image pick-up means.