Abstract: A self-monitoring method of a display and a display are disclosed. The self-monitoring method of a display includes: inputting a first image test signal; acquiring a display parameter of the first image test signal; acquiring a first display parameter of at least one frame of image outputted, based on the first image test signal, by the display, in which each frame of image of the at least one frame of image corresponds to a corresponding first display parameter; comparing the display parameter of the first image test signal with the first display parameter, determining whether or not an image displayed by the display is matched with the first image test signal so as to acquire a first match result; and determining whether or not display abnormality presents in the display based on the first match result. The method can determine whether or not display abnormality presents in the display.

Abstract: A lensless Fourier transform holography high accuracy reconstruction method using a charged particle beam apparatus which holds a sample on a diffraction surface of a diffraction grating provided on the downstream side of a traveling direction of the charged particle beam and which is formed of a material having permeability. The charged particle beam passed through the diffraction surface is image-formed, and the formed image is detected. An opening region of the diffraction grating is smaller than an irradiation region of the charged particle beam on the diffraction grating. Image data is obtained in a state where the irradiation region of the charged particle beam diffracted with the diffraction grating is within the irradiation region of the charged particle beam transmitted through the diffraction grating. Plural holograms obtained based on the image data are Fourier transformed and an intensity distribution image is displayed and stored.

Abstract: The system includes a modulatable illumination source configured to illuminate a surface of a sample disposed on a sample stage, a detector configured to detect illumination emanating from a surface of the sample, illumination optics configured to direct illumination from the modulatable illumination source to the surface of the sample, collection optics configured to direct illumination from the surface of the sample to the detector, and a modulation control system communicatively coupled to the modulatable illumination source, wherein the modulation control system is configured to modulate a drive current of the modulatable illumination source at a selected modulation frequency suitable for generating illumination having a selected coherence feature length. In addition, the present invention includes the time-sequential interleaving of outputs of multiple light sources to generate periodic pulse trains for use in multi-wavelength time-sequential optical metrology.

Abstract: A system for detecting defects in a contact lens material comprising: a camera having a lens and a digital image output for inspecting said lens suspended in saline solution, wherein said camera's digital image output includes only the image produced by light in a color spectrum corresponding to a portion of the spectrum of light produced by fluorescent emission of said lens material; a first Ultra violet light source to illuminate said lens and excite fluorescent emission therein; a first filter to filter the emitted light from the lens which is illuminated by Ultra violet light; and a computer having an associated memory, an input for accepting the digital image output from said camera, and an output representative of an analyzed digital image wherein said analyzed digital image includes visible indications of any imperfections detected in said lens material.

Abstract: An inspection system for inspecting a semiconductor substrate, the inspection system may include an inspection unit that comprises a partially blocking bright field unit and a non-blocking bright field unit; wherein the partially blocking bright field unit is configured to block any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along a first axis, of an area of the wafer, (b) the specular reflection propagates along a second axis, (c) the first axis and the second axis are symmetrical about a normal to the area of the wafer, and (d) the normal is parallel to an optical axis of the partially blocking bright field unit; and wherein the non-blocking bright field unit is configured to pass to the image plane any specular reflection that fulfills the following: (a) the specular reflection is caused by illuminating, along the first axis, of an area of the wafer, (b) the specular reflection propagates along the second axis, (c) the first axis and the second a

Abstract: Methods and apparatus are disclosed for contamination prevention of vehicle cameras and sensors. An example vehicle includes an exterior, a camera along the exterior and including a lens, and a controller. The controller is to determine, based upon images captured by the camera, whether a contaminant is approaching the lens and identify a contaminant state upon determining the contaminant is approaching the lens. The example vehicle also includes a nozzle to spray washer fluid to prevent contamination of the lens responsive to the controller identifying that the contaminant is a liquid.

Abstract: In various implementations, a condition of one or more screens of a device may be determined. A user may select a return application that facilitates capturing image(s) of device screen(s). A user may capture images of a screen of using a camera of the same device or another device. In some implementations, the user may position the device proximate a mirror such that the device can capture an image of one or more screens of the device. The captured image(s) may be processed and/or analyzed to determine if the screen of the device is damaged. In some implementations, notifications based on the condition of the device screen(s) may be transmitted. A price for the device may be determined, in some implementations based on the condition of the screen.

Abstract: A method for determining information about a transparent optical element including a lens portion and a plane parallel portion, the lens portion having at least one curved surface and the plane parallel portion having opposing first and second surfaces, includes: directing measurement light to the transparent optical element; detecting measurement light reflected from at least one location on the first surface of the plane parallel portion; detecting measurement light reflected from the second surface of the plane parallel portion at a location corresponding to the at least one location on the first surface; determining, based on the detected light, information about the plane parallel portion; and evaluating the transparent optical element based on the information about the plane parallel portion.

Abstract: In various embodiments of the invention, a unique construction for Light Emitting Diodes (LEDs) with at least one luminescent rod and extracting optical elements used to generate a variety of high brightness light sources with different emission spectra. In an embodiment of the invention, forced air cooling is used to cool the luminescent rod. In an embodiment of the invention, totally internal reflected light can be redirected outward and refocused. In another embodiment of the invention, light emitted by the luminescent rod is out-coupled for use in a variety of applications.

Abstract: In an optical inspection tool, an illumination aperture is opened at each of a plurality of aperture positions of an illumination pupil area one at a time across the illumination pupil area. For each aperture opening position, an incident beam is directed towards the illumination pupil area so as to selectively pass a corresponding ray bundle of the illumination beam at a corresponding set of one or more incident angles towards the sample and an output beam, which is emitted from the sample in response to the corresponding ray bundle of the incident beam impinging on the sample at the corresponding set of one or more incident angles, is detected. A defect detection characteristic for each aperture position is determined based on the output beam detected for each aperture position. An optimum aperture configuration is determined based on the determined defect detection characteristic for each aperture position.

Abstract: The present invention relates to a backlight inspection equipment comprising a carrying platform configured to dispose a backlight to be inspected and an inspection plate movably disposed relative to the carrying platform. The inspection plate moves from a first position to a second position. When the inspection plate is disposed at the first position, a first light emitting region of the backlight to be inspected is exposed and a second light emitting region which is a region other than the first light emitting region is blocked. When the inspection plate is disposed at the second position, a third light emitting region of the backlight to be inspected, which is different from the first light emitting region, is exposed, and a fourth light emitting region which is a region other than third light emitting region is blocked.

Abstract: The present invention provides a light engine having four light sources. A combination of collimators, bandpass filters, dichroic mirrors, and other elements is operative to direct light from the light sources onto a main optical axis from where it may be focused into a light guide for transport to an instrument or device. Particular embodiments of the invention provide for computer control, intensity control, color control, and light source modulation. Additional embodiments include particular light sources including light pipes and lasers. The light engine provides white light having a high color rendering index and suitable for applications in microscopy, endoscopy, and/or bioanalytical instrumentation.

Abstract: The invention relates to a dark-field semiconductor wafer inspection device including, in the following order, a light source for emitting an incident beam to a wafer along a first axis, a concentrator that is symmetrical in relation to a plane passing through the first and second axes and is provided with a mirror that is elliptically cut along a plane perpendicular to an axis perpendicular to the first axis and has a generator parallel to the first axis, parallel first and second slits being set up sideways in first and second portions of the concentrator at the points for concentrating the light that is scattered by the wafer and reflected by the second and first portions of the concentrator, respectively, and a photomultiplier using a slit.

Abstract: A method of manufacturing a curved display apparatus is disclosed. In one aspect, the method includes forming a curved display panel including a plurality of pixels and a controller configured to respectively apply a plurality of electrical signals to the pixels. The method also includes arranging the curved display panel, a lens, and a camera such that the lens is interposed between the curved display panel and the camera and respectively applying, by the controller, the electrical signals to the pixels. The method further includes obtaining optical information with the camera while the electrical signals are applied to the pixels and setting the controller based at least in part on the obtained optical information.

Abstract: In an optical inspection tool, an illumination aperture is opened at each of a plurality of aperture positions of an illumination pupil area one at a time across the illumination pupil area. For each aperture opening position, an incident beam is directed towards the illumination pupil area so as to selectively pass a corresponding ray bundle of the illumination beam at a corresponding set of one or more incident angles towards the sample and an output beam, which is emitted from the sample in response to the corresponding ray bundle of the incident beam impinging on the sample at the corresponding set of one or more incident angles, is detected. A defect detection characteristic for each aperture position is determined based on the output beam detected for each aperture position. An optimum aperture configuration is determined based on the determined defect detection characteristic for each aperture position.

Abstract: In a single or multiple stage lithography apparatus, a table provides a confining surface to a liquid supply system during, for example, substrate table exchange and/or substrate loading and unloading. In an embodiment, the table has a sensor to make a measurement of the projection beam during, for example, substrate table exchange and/or substrate loading and unloading.

Abstract: An exposure apparatus is provided with a projection optical system, and the projection optical system includes a first optical element disposed most closely to an image plane of the projection optical system. The exposure apparatus includes a first liquid immersion mechanism which forms a first liquid immersion area of a first liquid between the first optical element and an upper surface of a transparent member provided on a side of the image plane of the projection optical system, and an observation unit which observes a state of the first liquid immersion area. It is possible to grasp the state of the liquid immersion area of the liquid, thereby executing optimum liquid immersion exposure.

Abstract: A device and method for subaperture stray light detection and diagnosis. A test light beam is generated. Stray light is detected. Based on the detected stray light, potential paths that light may have taken to arrive at the detection surface are determined. A testing device comprises a test light beam source whereby the cross sectional area of the test light beam is made less than the cross sectional area of the system aperture. A relative lateral positioning stage and an angular beam directing stage launch the test light beam into the aperture. A detector and a data processing system produce a data set relating the stray light to the location and directional angles of the test light beam to identify the sources of stray light. A light trap and test light beam delivery system are provided.

Abstract: The present invention provides a glass panel stocking system and a stocking method. The stocking system includes a loading and unloading port and a crane. The loading and unloading port functions to receive a cassette that contains glass panels to position thereon. The crane functions to move a cassette that contains glass panels. The crane includes a chassis, a carrying fork mounted on the chassis and movable for extension and retraction with respect to the chassis, and a mapping bar mounted on the chassis and located above the carrying fork. The carrying fork functions to carry the cassette that contains the glass panels and move the cassette that contains the glass panels to the mapping bar so that the mapping bar is allowed to carry out inspection and counting of the glass panels received in the cassette that contains the glass panels.

Abstract: A detection method and a detection system for detecting surface abnormalities of a first lens and a second lens of an optical-electrical lens unit are provided. The first lens and the second lens are respectively protruded from two adjacent surfaces of the optical-electrical lens unit. The detection system includes a first detecting element configured to capture the image of the first lens, a second detecting element configured to capture the image of the second lens, a processing device configured to calculate whether the second lens is not oriented toward the second detecting element, and send moving instructions to a control device to control the optical-electrical lens unit to move to a predetermined position, and detect the surface abnormalities of the optical-electrical lens unit based on the captured images.

Abstract: The invention relates to a method for compensating at least one defect of an optical system which comprises introducing an arrangement of local persistent modifications in at least one optical element of the optical system, which does not have pattern elements on one of its optical surfaces, so that the at least one defect is at least partially compensated.

Abstract: An eyeglass support is adapted for pinch-holding the eyeglass (5) between three first contact portions (41-43) and three second contact portions (61-63). The first contact portions form a height reference for positioning the eyeglass whereas the second contact portions ensure application of the eyeglass against the first contact portions while conforming to any possible shape for the eyeglass. The support suits for being incorporated in a reflection measurement apparatus. In particular, it is useful for measuring reflection of eyeglasses provided with antireflecting coatings or for rating a protection against UV hazards which is provided by an eyeglass to a wearer of the eyeglass.

Abstract: A system for measuring properties of a thin film coated glass having a light source, a spectrometer, at least one pair of probes, a first optical fiber switch and a second optical fiber switch. The pair of probes includes a first probe located on one side of a glass sheet and a second probe located on the opposite side of the glass sheet, directly across from the first probe. The first and second optical fiber switches are adapted to couple either probe to the light source and/or the spectrometer. Because the design of the system is optically symmetrical, calibration may be performed without the use of a reference material such as a tile or mirror. Each of the first and second probes has a first leg and a second leg that are separated from each other by a distance n so that angled reflections may be detected.

Abstract: One embodiment relates to an apparatus that includes an illumination source (102) for illuminating a target substrate (106), objective optics (108) for projecting the EUV light which is reflected from the target substrate, and a sensor (110) for detecting the projected EUV light. The objective optics includes a first mirror (202,302, or 402) which is arranged to receive and reflect the EUV light which is reflected from the target substrate, a second mirror (204, 304, or 404) which is arranged to receive and reflect the EUV light which is reflected by the first mirror, a third mirror (206, 306, or 406) which is arranged to receive and reflect the EUV light which is reflected by the second mirror, and a fourth mirror (208, 308, or 408) which is arranged to receive and reflect the EUV light which is reflected by the third mirror.

Abstract: A method of bright spot defect detection for a polarizer is to be performed by an inspection device and includes the steps of: a) obtaining gray values for pixels of an image of a detected region, that contains a target spot, on the polarizer; b) obtaining a gray value variation score from the gray values obtained for the detected region, the gray value variation score being indicative of gray value variation among the pixels of the image of the detected region; and c) comparing the gray value variation score obtained for the detected region with a threshold value to obtain a comparison result, and determining whether the target spot is a bright spot according to the comparison result.

Abstract: A device is provided for demonstrating and testing the cosmetic qualities of an ophthalmic lens by viewing, the device comprising both a bearing wall (2) for bearing against a fixed surface and provided on its face opposite from its bearing face with a viewing target (3), and also a support wall (4) for supporting said lens and placed at a distance lying in the range 20 mm to 50 mm from said face of said bearing wall (2) that is provided with the target. According to the invention, the device is constituted by a support part (1) constituted by a channel-section member having its flanges forming said bearing surface (2) and said support wall (4), the support wall being provided with at least one orifice (5) of dimensions smaller than the dimensions of said lens, and said bearing surface and said support surface being inclined relative to each other by an angle lying in the range 0° to 25°.

Abstract: A biological optical measurement instrument has a gain adjustment unit (40) configured to set the gain value according to the intensity of the passing light in the measurement data detected by the optical measurement unit (12), a gain storage unit (44) configured to store the damage gain value set by the gain adjustment unit (40) when a damaged incident optical fiber (6a) or a damaged detection optical fiber (8a) is used, a gain comparison unit (42) configured to compare the gain value set by the gain adjustment unit (40) and the damage gain value stored in the gain storage unit (44), and a damage determination unit (46) configured to determine whether or not the incident optical fiber (6a) or the detection optical fiber (8a) is damaged on the basis of the comparison result by the gain comparison unit (42). The display unit (36) displays the damage condition.

Abstract: A method of monitoring combustion properties in an interior of a boiler of the type having walls comprising a plurality of parallel steam tubes separated by a metal membrane. First and second penetrations are provided in the metal membrane between adjacent tubes on opposite sides of the boiler. A beam of light is projected through a pitch optic comprising a pitch collimating lens and a pitch relay lens, both residing outside the boiler interior. The pitch relay lens projects the beam through a penetration into the boiler interior. The beam of light is received with a catch optic substantially identical to the pitch optic residing outside the boiler interior. The strength of the collimated received beam of light is determined. At least one of the pitch collimating lens and the catch collimating lens may then be aligned to maximize the strength of the collimated received beam.

Abstract: Disclosed is an apparatus for characterizing attributes of a moving glass sheet comprising complementary mechanical material handling technologies that progressively stabilize, position, capture, flatten, and release the lower portion of glass sheets traveling past the apparatus while posing minimal constraint on the top section of the sheet. The apparatus includes a pressure-vacuum (PV)-type device comprising distinct regions such that the glass sheets experience a non-contact but gradual increase in constraining force until the point where measurements can be performed, then a gradual decrease in constraining force until the glass sheets are released from the inspection station. This graduated force technique is applied along the direction of travel of the sheets and may also be applied vertically upwards along the height of the sheet to restrict the motion of the sheet without constraining it at pinch points near the conveyor.

Abstract: An embodiment of a system and a method for inspecting a contact lens is provided. The illumination system illuminates the center zone and the peripheral zone of the contact lens when it is inside a cavity between a male mold and a female mold. The imaging optical system has two channels to capture two images or a composite single image to inspect the entire contact lens. The imaging optical system of the first channel has its entrance pupil far away from the mold tool. The camera of the first channel is used to capture the image of the center zone of the contact lens. The image optical system of the second channel is located outside the mold tool but its entrance pupil is located inside the mold tool or outside but substantially close to it. This enables the camera of the second channel to capture the image of the peripheral zone of the contact lens.

Abstract: A system for measuring properties of a thin film coated glass having a light source, a spectrometer, at least one pair of probes, a first optical fiber switch and a second optical fiber switch. The pair of probes includes a first probe located on one side of a glass sheet and a second probe located on the opposite side of the glass sheet, directly across from the first probe. The first and second optical fiber switches are adapted to couple either probe to the light source and/or the spectrometer. Because the design of the system is optically symmetrical, calibration may be performed without the use of a reference material such as a tile or mirror.

Abstract: Disclosed are an ambient light reflection determination apparatus and an ambient light reflection determination method enabling to determine reflection without using an edge and even in a case where luminance of a reflection generating part in eyeglasses is low. In a reflection determination apparatus (100), a luminance histogram calculation section (102) calculates a luminance histogram representing a luminance distribution of an eye area image, a difference calculation section (104) calculates a difference histogram by finding a difference between the two luminance histograms calculated from the two eye area images having different photographing timings, an evaluation value calculation section (105) calculates an evaluation value regarding reflection of ambient light based on the difference histogram and a weight in accordance with luminance, and a reflection determination section (107) determines the reflection of ambient light based on the calculated evaluation value.

Abstract: Light sensors (1) are used in lighting applications, especially in combination with LEDs, to control and/or adapt the color point of light sources. Costs and/or performance of the light sensor (1) are essential in order to guarantee cost-effective light sources with reproducible color points. This aim is achieved by a light sensor (1) comprising a light diffuser (10), an optical non-transparent housing (11) having at least one window (12), at least one interference filter (13) and at least two photo sensors (14). The light diffuser (10) is arranged in such a way that light from outside the optical non-transparent housing (11) has to pass the light diffuser (10) so as to enter the interior of the optical non-transparent housing (11) via the window (12). The interference filter (13) and the at least two photo sensors (14) are arranged in the interior of the optical non-transparent housing (11), which interference filter (13) is arranged between the window (12) and the at least two photo sensors (14).

Abstract: A method for estimating a degree of contamination of a front screen of an optical detection apparatus is provided comprising the steps: Transmitting a plurality (p) of transmission radiation pulses into a detection zone; generating a reception signal for each transmission radiation pulse including a plurality (q) of sampled values, a sampled value indicating the intensity of the received back radiation of the transmission pulse after a predefined time interval from the transmission of the transmission radiation pulse; generating an averaged reception signal having a plurality (q) of sampled values from the plurality of reception signals, with those respective sampled values of the reception signals being added which were determined at mutually corresponding points in time to determine a sampled value of the averaged reception signal; generating at least one front screen contamination value by evaluating an amplitude value and/or a measured peak shape value of the averaged signal.

Abstract: An ophthalmic lens scanner includes an inspection platform configured to receive an ophthalmic lens thereon. A camera is spaced apart from the inspection platform and is arranged to, in response to an activation signal, capture an image of the ophthalmic lens. A light source is spaced apart from the inspection platform and is configured to emit light when the camera is activated to capture an image of the ophthalmic lens. The inspection platform is located between the camera and the light source. A first Fresnel lens is located between the inspection platform and the camera. A second Fresnel lens is located between the inspection platform and the light source. The ophthalmic lens scanner may be incorporated in an ophthalmic lens scanner system that includes a computing device and a display device.

Abstract: A surface layer formed of a composite material is stacked on the surface of a core layer formed of a foam synthetic resin material, and an arrester portion is provided in an interface region between the surface layer and the core layer to prevent the progression of delamination between the surface layer and the core layer. Optical fibers with grating portions are embedded inside the arrester and along the surface layer, and the spectra of reflected light from the optical fibers are compared to detect the occurrence position of a crack between the surface layer and the core layer.

Abstract: An inspection system and a method. The method may include: illuminating the object with impinging light of a first polarization; performing a polarization based filtering of (a) multiple-reflected light signals, each multiple-reflected light signal being reflected from at least two different bevel side surfaces of the object, and (b) additional light signals, each additional light signal being reflected from a single element of the object, such as to suppress the multiple-reflected light signals, and to provide polarization based filtered light signals; and detecting the polarization based filtered light signals.

Abstract: Methods and apparatus for lock and key security, the lock including a light receptacle, a scatter pattern detecting module, and a locking mechanism, the key including a light source and a prism, the lock and key security including receiving, in the light receptacle of the lock, light transmitted by the light source in the key through the prism; identifying, by the scatter pattern detecting module, a scatter pattern of the received light; comparing, by the scatter pattern detecting module, the scatter pattern to a unique preauthorized pattern for operating the lock; if the scatter pattern matches the unique preauthorized pattern, switching, by the scatter pattern detecting module, the current locking state of the locking mechanism; and if the scatter pattern does not match the unique preauthorized pattern, maintaining the current locking state of the locking mechanism.

Abstract: A system and method for monitoring a physiological parameter includes a garment that includes a fabric that exhibits both a light transmission property and a light reflection property. The amount of light transmitted through the fabric relative to the amount of light reflected by the fabric changes when the fabric stretches in response to motion, such as the motion induced by physiological activity (e.g., heart rate). The system includes at least one source of radiation having wavelength(s) in the range of 400 to 2200 nanometers and at least one detector responsive to such incident radiation. The source and detector are associated with the fabric such that the reception of incident radiation by the detector is directly affected by a change in the amount of light transmitted through the fabric relative to the amount of light reflected by the fabric when the fabric stretches.

Abstract: Methods and systems for indicating the displacement of a flexible web are described. An elongated, flexible web includes an integral scale having scale features configured to modulate energy directed towards the web. A transport mechanism provides relative movement between the web relative to a transducer. The transducer detects energy modulated by the scale features and generates a signal indicting a continuous web displacement based on the modulated energy.

Abstract: A fire alarm consists of a housing in which sensors, a radiation source, and an optical window are disposed. A reflector protection basket or ring is disposed above the optical window. The basket or ring is suitable for protecting the optical window against mechanical influences, allows UV and IR radiation to pass through to a sufficient degree, and reflects UV and IR radiation from the housing interior, on its inside. Monitoring of the contamination of the window, function monitoring of the sensors and of the signal processing electronics, as well as easy replaceability of the components in the fire alarm are provided.

Abstract: A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method.

Abstract: Disclosed herein are systems, methods, and non-transitory computer-readable storage media for radio phase retrieval. A system practicing the method gathers first data from radio waves associated with an object observed via a first aperture, gathers second data from radio waves associated with the object observed via an introduced second aperture associated with the first aperture, generates reduced noise data by incoherently subtracting the second data from the first data, and performs phase retrieval for the radio waves by modeling the reduced noise data using a single Fourier transform. The first and second apertures are at different positions, such as side by side. This approach can include determining a value Q which represents a ratio of wavelength times a focal ratio divided by pixel spacing. This information can be used to accurately measure and correct alignment errors or other optical system flaws in the apertures.

Abstract: Systems for producing images of the edges of silicone hydrogel ophthalmic lenses are disclosed.

Abstract: A lithography system with a stray light feedback system is disclosed. The stray light feedback helps control critical dimension (CD) within a stray light specification limit. A stray light dose control factor is calculated as a function of the stray light measured in the exposure tool and the sensitivity of the resist. The stray light dose control factor is used to adjust the exposure dose to achieve the desired CD. The stray light may be monitored, and if a threshold level of stray light is reached or exceeded, the use of the exposure tool may be discontinued for a particular type of semiconductor product, resist, or mask level, until the lens system is cleaned.

Abstract: A system for analyzing smoke has a plurality of units, wherein each unit includes an optical emitter for alternately directing horizontally and vertically polarized light along a beam path, and into a smoke cloud, to generate scattered light. A horizontally polarized detector and a vertically polarized detector are positioned at different locations, but at a same distance and scattering angle relative to the beam path. Each unit has a different wavelength. A computer receives signals from the detectors of all units, in response to each emitter, for analysis of the smoke.

Abstract: A photomask inspection method that identifies a foreign particle such as dirt on a photomask with high sensitivity by suppressing erroneous identification due to an influence of noise is provided. The photomask inspection method includes acquiring image data of a photomask having regions with different layer structures on a surface thereof, creating inverted image data by subtracting the image data from pixel value data of the regions, creating offset inverted image data by raising pixel values of the inverted image data by a fixed amount, creating normalized correlation image data by computing a normalized correlation of the offset inverted image data and an offset Gaussian distribution-type kernel, and identifying foreign particles by comparing the normalized correlation image data and a predetermined threshold.

Abstract: This invention describes a means to monitor the deposition of a rugate filter such that the deposited filter will have the specified bandwidth, angular shift properties, and the correct wavelength of the reflectance peak.

Abstract: One embodiment of the invention provides a lens-testing apparatus being used for testing a lens device. The lens-testing apparatus comprises a light module, at least one first and second image sensors, and at least one image sensor module. The light module generates a patterned light beam passing the lens device. The first and second image sensors receive first and second portions of the patterned light beam; the first image sensor is disposed between the second image sensor and the lens device. The image sensor module receives a substantially parallel third portion of the patterned light beam, and comprises a third image sensor and a collimator. The third portion of the patterned light beam is focused onto the third image sensor by the collimator; the distance between the first image sensor and the lens device is smaller than the distance between the second image sensor and the lens device.

Abstract: A garment and system includes a monitoring fabric that exhibits a light reflection property and substantially no light transmission property when the fabric is illuminated with light having wavelength(s) in the range of 400 to 2200 nanometers. The amount of useful light reflected by the fabric into an aperture of acceptance defined with respect to an imaginary axis extending from the fabric relative to the amount of light lost to the aperture of acceptance detectably changes when the fabric stretches in response to motion, as the motion induced by physiological activity (e.g., heart rate). The system includes at least one radiation source and at least one radiation detector, with the detector disposed in the aperture of acceptance.