Abstract: A phase retrieval optical metrology system that can be used for evaluating a variety of optical surface errors is provided. The optical metrology system can comprise an optical element defining an optical axis and a focal plane, a fiber coupler coupled to the laser, a fiber connected to the fiber coupler for transmitting light received from the fiber coupler, a collimator for receiving the light received from the fiber and substantially collimating the light to generate a narrowed input light beam, and a defocus element disposed between the optical element and the focal plane.

Abstract: A drying nozzle (1) for drying a peripheral portion of an ophthalmic lens (CL), in particular a contact lens, comprises an inlet (30) for the supply of a pressurized gas and a continuous annular outlet gap (11) having a predetermined width (W) through which the pressurized air is capable of being supplied to the peripheral portion of the ophthalmic lens (CL).

Abstract: An optical keyless entry sensor system and method includes an optical sensor in association with a mirror that reflects light transmitted from the optical sensor, wherein reflected light is detectable by the optical sensor. An attenuation filter can be located between the mirror and the optical sensor, wherein the attenuation filter is configured to simulate a contamination of the optical sensor in order to determine an exact level of attenuation representative of contamination that causes a performance failure of the optical sensor, thereby providing data which is indicative of a dynamic range of the optical sensor, such that the dynamic range is utilized to enhance the performance of the optical keyless entry sensor system.

Abstract: An apparatus and associated method for measuring transmitted optical distortion in a glass sheet includes a glass stand which receives a glass sheet for mounting between a background screen which includes a matrix of spaced apart dots, and a digital camera which captures (1) an image of the glass sheet surface, and (2) an image of the dot matrix transmitted through the glass sheet. The captured images are downloaded to a computer that is suitably programmed to analyze the image data to (1) determine the presence of any markings or elements on the surface of the glass sheet that should be isolated from the dot matrix image, (2) modify the background image to eliminate the image data corresponding to any such surface markings or elements from the image, and (3) determine characteristics indicative of optical distortion in the modified image of the dot matrix background transmitted through the glass sheet.

Abstract: Systems, methods and apparatus relate to handling and processing glass, such as glass for use in liquid crystal displays, involving a measurement device, such as a distortion gauge, residing in an environmentally controlled measurement room, and a cassette loading device for storage and conveyance of glass between the measurement device and other components of a glass handling and processing system residing with the cassette loading device in a preparation room. A mail-slot opening may be present in a wall separating the measurement room from the preparation room. A gauge conveyor may convey glass between the cassette loading device and the measurement device. A distortion gauge may measure a reference value of the product glass with respect to reference marks on a glass reference plate of the distortion gauge. Other examples of a measurement device include a warp gauge, a stress gauge, a thickness gauge, and a compaction gauge.

Abstract: A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided.

Abstract: A bubble removal system includes an inspection cell configured to receive an ophthalmic device and a volume of working fluid. The system also includes a vacuum device configured to form a substantially fluid-tight seal with the inspection cell and to direct a negative pressure to the volume of working fluid and the ophthalmic device within the inspection cell.

Abstract: A garment and system includes a monitoring fabric comprising a first plurality of reflective yarns knitted or woven with a second plurality of stretchable yarns. The fabric exhibits both a light transmission property and a light reflection property. The amount of light transmitted through the fabric relative to the amount of light reflected by the fabric changes when the fabric stretches in response to motion, such as the motion induced by physiological activity (e.g., heart rate). The system includes at least one source of radiation having wavelength(s) in the range of 400 to 2200 nanometers and at least one detector responsive to such incident radiation. The source and detector are associated with the fabric such that the reception of incident radiation by the detector is directly affected by a change in the amount of light transmitted through the fabric relative to the amount of light reflected by the fabric when the fabric stretches.

Abstract: Disclosed are methods and apparatus for inspecting a sub-resolution assist features (SRAF) on a reticle. A test flux measurement for a boundary area that encompasses a width and a length portion of a test SRAF is determined, and at least one reference flux measurement for one or more boundary areas of one or more reference SRAF's is determined. The test flux measurement is compared with the reference flux measurements. The comparison is used to then determine whether the test SRAF is undersized or oversized. If the test SRAF is determined to be oversized, it may then be determined whether the test SRAF is defective based on the comparison using a first threshold.

Abstract: A method for inspecting lenses, especially wet contact lenses provided in a volume of liquid inside a container is described. A first image of the lens at a first position in the container is obtained, the lens then being moved to a second position within the container where a second image is obtained. A computer algorithm processes the first and second images to compare features that have moved with the lens to those features that have not moved with the lens whereby lenses are rejected if a feature has moved with the lens but is not a normal feature of the lens.

Abstract: The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid imposed on the substrate wherein when the pattern is viewed through the lens, the series of lines having thickness of between approximately 10 and approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center, the pattern is distorted around an area where a defect is present in the lens. With the device, the lens is identifiable as being defective if the pattern appears as a moiré distortion in the area when viewed through the lens.

Abstract: The method of evaluating an optical defect in a transparent material includes irradiating the material with light to produce scattered light from the defect, rotating the material about a rotation axis passing through the defect, measuring scattered light intensity at a scattering angle (?s) to the rotation axis by means of a detector, determining the dependence of the measured scattered light intensity on rotation angle (?s) around the rotation axis and characterizing size and/or shape of the defect from that dependence. The apparatus for performing the method has a light source, a rotatable holder for the transparent material, a light sensitive receiving device and an imaging optical system for imaging scattered light from the material within a certain angular range on a detector surface of the receiving device.

Abstract: A defect testing apparatus for testing defects of optical film sheet-shaped product of an optical displaying apparatus, which includes a defect detecting means for detecting defects of a monolayer body and/or a laminate body constituting the sheet-shaped product in a state in which a protective layer on a surface of the sheet-shaped product is not disposed and defect information preparing means for preparing defect information which is information related to the defects detected by the defect detecting means, and the defect information is used for producing the sheet-shaped product provided in a roll form or in separate sheets.

Abstract: The invention is directed to a method for illuminating an object and projecting its image on a ground glass screen. Optical comparators conventionally use incandescent illumination, either mercury arc or halogen. The use of an array of high intensity LED devices, provides many options for packaging the required optical components used in comparators.

Abstract: A defect detection method of a layered film having a polarizing plate and an optical compensation layer includes steps of: applying light from a light source arranged at the polarizing plate layer side of the film surface of the layered film; a step of imaging a transmitting light image of the layered film by an imaging unit arranged at the optical compensation layer side of the film surface; and a defect detection step for detecting a defect existing on the layered film according to the transmitting light image captured by the imaging unit. The imaging unit performs imaging via an inspection polarizing filter arranged on the optical path between the light source and the imaging unit and adjacent to the imaging unit; and an inspection phase difference filter arranged on the optical path between the light source and the imaging unit and between the inspection polarizing filter and the layered film.

Abstract: A light beam (L) from a light source is reflected by a half mirror (35), converted into a collimated light beam (L1) by a collimator lens (36), and transmitted through a test lens (1). Corner cube prisms (49) included in a rotary reflector (43) retroreflect the light beam (L1) transmitted through the test lens (1). When a reflected light beam (L2) is transmitted through only a non-mark portion on the test lens (1), it diffuses only slightly and therefore becomes a retroreflected light beam with a small diameter. Thus, the retroreflected light beam (L2) forms a bright image upon being focused on CCDs (40A) without any loss due to factors associated with an aperture stop (37). In contrast, a light beam (L3) transmitted through a mark (3C) on the test lens (1) largely diffuses and therefore becomes a diverging reflected light beam with a large diameter, which suffers a considerable loss due to factors associated with the aperture stop (37).

Abstract: A system for testing a liquid crystal display (LCD) device includes a testing device photographing and capturing an image of a defect generated on a substrate having a thin film array formed thereon, the testing device providing testing information on the defect, a ARPC automatically determining defectiveness of the substrate by an automatic determination method using a defect determining automation program designed based on a testing worker's determination method and behavior aspect, the captured image and the testing information on the defect, a PRPC determining defectiveness of the substrate based on the captured image and the testing information on the defect, if the defectiveness of the substrate is undeterminable by the ARPC, and a main server connecting the ARPC with the PRPC and storing the captured image and the testing information on the defect.

Abstract: A method for correcting the measuring errors caused by the lens distortion of an objective in a coordinate measuring machine is disclosed. For a plurality of different types of structures, the lens distortion caused by an objective is determined in an image field of the objective. The position of a type of structure is determined in the image field of the objective by a measuring window. The correction of the lens distortion required for the type of structure to be measured is retrieved from the database as a function of the type of structure to be measured.

Abstract: A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided.

Abstract: The present invention relates to an inspection system for the automatic inspection of ophthalmic lenses, preferably in an automated lens manufacturing line. The inspection system provides a phase contrast imaging unit and an inspection method using said phase contrast imaging unit designed to recognize defective lenses with an improved degree of reliability but that does not falsely sort out perfect lenses.

Abstract: A garment and system includes a monitoring fabric comprising a first plurality of reflective yarns knitted or woven with a second plurality of stretchable yarns. The fabric exhibits both a light transmission property and a light reflection property. The amount of light transmitted through the fabric relative to the amount of light reflected by the fabric changes when the fabric stretches in response to motion, such as the motion induced by physiological activity (e.g., heart rate). The system includes at least one source of radiation having wavelength(s) in the range of 400 to 2200 nanometers and at least one detector responsive to such incident radiation. The source and detector are associated with the fabric such that the reception of incident radiation by the detector is directly affected by a change in the amount of light transmitted through the fabric relative to the amount of light reflected by the fabric when the fabric stretches.

Abstract: A garment and system includes a monitoring fabric that exhibits a light reflection property and substantially no light transmission property when the fabric is illuminated with light having wavelength(s) in the range of 400 to 2200 nanometers. The amount of useful light reflected by the fabric into an aperture of acceptance defined with respect to an axis extending from the fabric relative to the amount of light lost to the aperture of acceptance detectably changes when the fabric stretches in response to motion, as the motion induced by physiological activity (e.g., heart rate). The system includes at least one radiation source and at least one radiation detector, with the detector disposed in the aperture of acceptance.

Abstract: A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display device. In another embodiment, the method comprises an automated method of comparing the measured data from the light meter with an ideal image. In another embodiment, the method comprises obtaining a digital image of the test pattern displayed on the display device, and the digital image is compared with an ideal image.

Abstract: Methods and apparatus for lock and key security, the lock including a light receptacle, a scatter pattern detecting module, and a locking mechanism, the key including a light source and a prism, the lock and key security including receiving, in the light receptacle of the lock, light transmitted by the light source in the key through the prism; identifying, by the scatter pattern detecting module, a scatter pattern of the received light; comparing, by the scatter pattern detecting module, the scatter pattern to a unique preauthorized pattern for operating the lock; if the scatter pattern matches the unique preauthorized pattern, switching, by the scatter pattern detecting module, the current locking state of the locking mechanism; and if the scatter pattern does not match the unique preauthorized pattern, maintaining the current locking state of the locking mechanism.

Abstract: In a chromatography quantitative measuring apparatus according to the present invention, a beam applied from a light source to a chromatography test strip is formed into an elliptical shape by an optical means such as a cylindrical lens, a variation in absorbance that accompanies elution of a marker regent is detected while the elliptical beam is applied between a marker reagent hold part and a detection part, and a measurement is automatically started in a prescribed period of time since the detection of variation. According to the chromatography quantitative measuring apparatus so configured, non-uniform coloration is reduced by shaping the beam elliptically with the optical means, whereby the accuracy of quantitative analysis is enhanced, and the apparatus can be operated easily.

Abstract: Systems and methods that facilitate the detection of a broken or damaged screen in a laser PTV due to impact or shock through the measure or monitoring of continuity or resistivity of a conductive trace applied to the screen. In one embodiment, a screen damage detection system comprises a clear conductive trace applied to the display screen preferably in a serpentine configuration. Damage to the screen is detected when the hole or crack in the screen is sufficiently large to open the conductive trace. In another embodiment, a damage detection system comprises a clear resistive film applied to the screen. The resistance is measured in the X and Y axis to detect changes in the resistance of the coating due to a crack or hole in the screen and disable the laser through a laser enable output signal when a change in resistance greater than a predetermined value is detected.

Abstract: Systems (50) and methods are disclosed for detecting defects (DEF1-DEF5) in a ceramic filter body (10) having a honeycomb structure (12) that defined multiple channels (20). Plugs (30) are used to seal select channel ends (22, 24). The methods include using a first light source unit (52) and a first detector unit (62) operably arranged at respective first and second ends (16, 18) of the honeycomb structure so as to be capable of being in optical communication. Light beams (LB) are transmitted from the first light source unit to the first detector unit through multiple channels. Defects in a given plug allow a detectable portion (LBD) of the corresponding light beam to be detected. Multiple detector elements (64) are used to detect the detectable light beam portion to provide location and intensity variation information, which helps deduce the precise location and nature of the defect.

Abstract: The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid imposed on the substrate wherein when the pattern is viewed through the lens, the series of lines having thickness of between approximately 10 and approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center, the pattern is distorted around an area where a defect is present in the lens. With the device, the lens is identifiable as being defective if the pattern appears as a moiré distortion in the area when viewed through the lens.

Abstract: A technique is provided for monitoring and controlling surface contaminants on optical elements contained within the optical path (or sub-path) of an optical metrology instrument. The technique may be utilized in one embodiment in such a manner as to not require that additional components and/or instrumentation be coupled to, or integrated into, existing metrology equipment. Surface contaminants on optical elements within an optical metrology instrument are monitored so that cleaning procedures can be performed as deemed necessary. The cleaning procedures may include the use of exposing the optical elements to optical radiation. The optical metrology instrument may be an instrument which operates at wavelengths that include vacuum ultra-violet (VUV) wavelengths.

Abstract: The present invention relates to an inspection system for the automatic inspection of ophthalmic lenses, preferably in an automated lens manufacturing line. The inspection system provides a phase contrast imaging unit and an inspection method using said phase contrast imaging unit designed to recognize defective lenses with an improved degree of reliability but that does not falsely sort out perfect lenses.

Abstract: Described is an examination system (1) for locating contamination (2) on an optical element (4) installed in an optical system (5), which examination system (1) comprises: a spatially resolving detector (6); imaging optics (7) that magnify in particular at a magnification of between 2 times and 100 times, for magnified imaging of a surface sub-region (3a) of the optical element (4) on the spatially resolving detector (6); as well as a movement mechanism (12), in particular a motorized movement mechanism (12), for displacing the imaging optics (7) together with the detector (6) relative to the surface (3) of the optical element (4) such that any desired surface sub-region of the surface (3) can be imaged at magnification.

Abstract: A glass sheet defect detection device includes a light source and a light reception device which are placed at opposed positions so as to sandwich a glass sheet. The glass sheet has light-transparent surfaces opposed to each other in a thickness direction. The glass sheet is placed between the light source and the light reception device so that the light-transparent surfaces are inclined with respect to a light axis of an optical system of the glass sheet defect detection device at a predetermined angle. Moreover, the light reception device and the glass sheet are placed in such a positional, relationship that a focal length of a lens system of the light reception device is smaller than a distance from a light reception element of the light reception device and the glass sheet.

Abstract: The invention provides a luminescent based sensor having a luminescent material optically coupled to a substrate, and adapted to be used in a medium or environment such as water or air. A detector is provided to detect light that is emitted into the substrate by the material. The substrate is adapted to redirect light that is emitted into the substrate at angles with the range ?esc ? ? ? ?lsc where ?esc is the critical angle of the environment/substrate interface and ?lsc is the critical angle of the luminescent layer/substrate interface. Examples of possible configurations are described.

Abstract: A technique is provided for monitoring and controlling surface contaminants on optical elements contained within the optical path (or sub-path) of an optical metrology instrument. The technique may be utilized in one embodiment in such a manner as to not require that additional components and/or instrumentation be coupled to, or integrated into, existing metrology equipment. Surface contaminants on optical elements within an optical metrology instrument are monitored so that cleaning procedures can be performed as deemed necessary. The cleaning procedures may include the use of exposing the optical elements to optical radiation. The optical metrology instrument may be an instrument which operates at wavelengths that include vacuum ultra-violet (VUV) wavelengths.

Abstract: A method for inspecting a color filter includes a first step of disposing the color filter so that the color filter is opposed to a light source, a second step of outputting, from the light source, monochromatic light of a color corresponding to one of the colors of color layers of the color filter and entering the light into the plurality of color layers, and a third step of inspecting for display unevenness in each of the color layers with light transmitted through the color layers.

Abstract: The invention relates to a system, method and device for evaluating imperfections in a lens for a display for an electronic device. For the device, it comprises: a substrate; and a pattern imposed on the substrate. For the pattern, when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens. For the system, it comprises: an evaluation table for the lens, the table having a mounting area; and a substrate for mounting on the mounting area, the substrate having a pattern imposed thereon wherein when the pattern is viewed through the lens, the pattern is noticeably distorted around an area where a defect is present in the lens.

Abstract: A device for detecting the condition of an optical filter which is arranged in the optical path of a light source so as to cut light of a specific wavelength from the light emitted by the light source. A detection light source outputs a detection light beam which passes through the optical filter so that the detection light beam crosses the optical path. A photoreceptor element receives the detection light beam which has passed through the optical filter. A detection processor detects the condition of the optical filter in accordance with the intensity of the detection light beam received by the photoreceptor element.

Abstract: A drying nozzle (1) for drying a peripheral portion of an ophthalmic lens (CL), in particular a contact lens, comprises an inlet (30) for the supply of a pressurized gas and a continuous annular outlet gap (11) having a predetermined width (W) through which the pressurized air is capable of being supplied to the peripheral portion of the ophthalmic lens (CL).

Abstract: The present invention relates to a method and a device for determining spherical aberration occurring during reading from and/or writing to optical recording media. According to the invention, a method for determining spherical aberration includes the steps of: splitting the light beam into at least two partial light beams with a volume hologram having stored wavefront patterns with various degrees of spherical aberration; focusing the partial light beams onto respective detectors, whereby at least one signal generated by the detectors depends on the positions of the respective partial light beam; and determining the spherical aberration using the signals generated by the detectors.

Abstract: The present invention relates to an apparatus (1) for examining documents (2), in particular banknotes. Therein the apparatus (1) comprises at least one light source (3), at least one spectral device (8) and at least two detection devices (9, 10, 11, 24). By means of the light source (3) the document (2) is irradiated and the light emitted and/or reflected and/or transmitted by the document (2) is subsequently divided into spectral components by means of the spectral device (8). The spectral components are separately detected by the detection devices. The spectral division of the light (4) emanating from the light source (3) can also be carried out before the light impinges on the document (2). The apparatus (1) is designed so as to individually weight the spectral components to be detected respectively by the detection devices (9, 10, 11, 24).

Abstract: A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display device. In another embodiment, the method comprises an automated method of comparing the measured data from the light meter with an ideal image. In another embodiment, the method comprises obtaining a digital image of the test pattern displayed on the display device, and the digital image is compared with an ideal image.

Abstract: An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individually measuring an image defect of each optical component, and first computing means for computing first target positions for the plurality of optical components such that an overall image defect of the at least one of the optical elements is below a predetermined threshold value. Second measuring means are provided for measuring an overall image defect of the optical system, and second computing means represent the measured overall image defect as a linear combination of base functions of an orthogonal function set. The second computing means calculate second target position for the at least two optical elements so as to reduce the overall image defect.

Abstract: An optical window contamination detecting device capable of detecting even microscopic contamination on an optical window with a limited number of contamination detecting sensors. The optical window contamination detecting device is used for a scanning type distance measuring apparatus that includes a casing, formed with an optical window, which accommodates a light transmitting unit, a scanning mechanism for deflection scanning measurement light output from the light transmitting unit into a measuring space through the optical window, and a light receiving unit for detecting reflected light from an object through the optical window.

Abstract: An optical system has at least two optical elements whose spatial relation with respect to each other can be changed. At least one of the optical elements comprises a plurality of optical components. The optical system comprises first measuring means for individually measuring an image defect of each optical component, and first computing means for computing first target positions for the plurality of optical components such that an overall image defect of the at least one of the optical elements is below a predetermined threshold value. Second measuring means are provided for measuring an overall image defect of the optical system, and second computing means represent the measured overall image defect as a linear combination of base functions of an orthogonal function set. The second computing means calculate second target position for the at least two optical elements so as to reduce the overall image defect.

Abstract: An inspection apparatus and inspection method for liquid crystal display devices are disclosed, wherein a final inspection for completely manufactured liquid crystal display devices is performed using a visual-light inspection apparatus, whereby high productivity due to improved inspection accuracy and reduced inspection time can be accomplished. With the inspection apparatus and inspection method, defects of a plurality of glass panels can be automatically inspected based on analyzed information of an entire screen of each glass panel using a plurality of vision cameras, whereby improved inspection accuracy and improved product quality can be accomplished and reduced inspection time can result in improved productivity of liquid crystal display devices. Further, by quantifying screen defects of the plurality of glass panels, defects of glass panels due to failures of manufacturing processes or design failures and other problems attendant on the defects can be prevented.

Abstract: An inspection method of transparent articles wherein presence or absence of optical inhomogeneities within the transparent articles can be accurately inspected is provided. In an inspection method of transparent articles used in photolithography, for inspecting whether or not there are inhomogeneities within transparent articles (4) formed of transparent material wherein optical properties regionally or locally change with regard to exposure light (specifically, interior defects 16), inspection light having a wavelength of 200 nm or shorter is introduced to the transparent article, and light (15) having a longer wavelength than the inspection light which is regionally or locally emitted is sensed on the optical path over which the inspection light is propagated within the transparent article, thereby detecting presence or absence of optical inhomogeneities within the transparent article.

Abstract: A lens inspection device and method are provided. The lens inspection method includes the steps of providing a collimating light beam, polarizing the collimating light beam by a polarizer to produce a polarized light beam, deflecting the polarized light beam by a lens to be measured to produce a deflected light beam, providing a phase retardation plate through which a polarized compensation image is generated, and comparing the polarized compensation image with a lookup table having standard color values of a plurality of standard polarization compensated images recorded therein, so as to determine whether a deformation is presented on the lens.

Abstract: The present invention relates to a method and a device for determining spherical aberration occurring during reading from and/or writing to optical recording media. According to the invention, a method for determining spherical aberration includes the steps of: splitting the light beam into at least two partial light beams with a volume hologram having stored wavefront patterns with various degrees of spherical aberration; focusing the partial light beams onto respective detectors whereby at least one signal generated by the detectors depends on the positions of the respective partial light beam; and determining the spherical aberration using the signals generated by the detectors.

Abstract: The present disclosure provides a method for measuring lens contamination in a lithography apparatus. The method includes imaging an asymmetric pattern utilizing a lens system and measuring an alignment offset of the asymmetric pattern associated with the lens system. A contamination of the lens system is determined by comparing the alignment offset to a reference value.

Abstract: The invention relates to an apparatus for forming or working optical elements and/or optical forming elements (1) comprising a working apparatus (18) for forming surfaces of form parts by machining or an abrasive technique, wherein at least one measuring device (17) is provided for measuring changes in form and/or surface roughness of said surface when said surface is being worked and, on the basis thereof controlling said working apparatus (18).