Inspection Of Flaws Or Impurities Patents (Class 356/237.1)
  • Patent number: 10352856
    Abstract: Ultra-thin conductors are employed to generate plasmon fields near the surface of the conductors. Emitters, such as atoms, molecules, quantum dots, or quantum wells, in the plasmon fields can emit and absorb light via transitions that are otherwise forbidden in the absence of the plasmon fields. Applications using these forbidden transitions include spectroscopy, organic light sources, and broadband light generation. For example, in a spectroscopic platform, an emitter is disposed in the plasmon fields to excite electronic transitions that are otherwise unexcitable. In organic light sources, plasmon fields quench excited triplet states, allowing fast singlet decay with the emission of light. In broadband light generation, strong two-plasmon spontaneous emission of emitters near ultrathin conductors is employed to produce a broad spectrum of light.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: July 16, 2019
    Assignee: Massachusetts Institute of Technology
    Inventors: Nicholas Rivera, Ido Kaminer, Bo Zhen, Marin Soljacic, John Joannopoulos
  • Patent number: 10346764
    Abstract: This invention discloses a novel system and method for distributing electronic ticketing such that the ticket is verified at the entrance to venues by means of an animation or other human perceptible verifying visual object that is selected by the venue for the specific event. This removes the need to use a bar-code scanner on an LCD display of a cell phone or other device and speeds up the rate at which human ticket takers can verify ticket holders. The system also can permit ticket purchase verification in the absence of a network connection during verification.
    Type: Grant
    Filed: August 11, 2015
    Date of Patent: July 9, 2019
    Assignee: BYTEMARK, INC.
    Inventors: Micah Bergdale, Matthew Grasser, Nicholas Ihm, Samuel Krueckeberg, Gregory Valyer
  • Patent number: 10345247
    Abstract: An apparatus for detecting a degree of particulate contamination on a flat panel is disclosed, including: an illuminator for producing a radiation beam which results in scattered radiation from its scattering by contaminants on a surface of the flat panel under test and reflected radiation from its reflection by the surface of the flat panel under test; a detector for collecting the scattered radiation, the detector having a radiation collection surface perpendicular to a normal of the surface of the flat panel under test; and a beam trimmer for separating the reflected radiation from the scattered radiation, the beam trimmer including a first optical member, disposed in correspondence with the scattered radiation and configured for directing the scattered radiation to be collected by the detector, and a second optical member disposed in correspondence with the reflected radiation and configured for directing the reflected radiation not to be collected by the detector.
    Type: Grant
    Filed: February 28, 2018
    Date of Patent: July 9, 2019
    Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
    Inventors: Yongqiang Shen, Xiaoqing Yang, Xueshan Han
  • Patent number: 10330465
    Abstract: The present invention regards a method for measuring displacement of a surface at a region of interest when the region of interest is exposed to a load.
    Type: Grant
    Filed: August 7, 2015
    Date of Patent: June 25, 2019
    Inventor: Richard Baxter Byrne
  • Patent number: 10324064
    Abstract: A method and apparatus are disclosed for assessment of a sealed package. Light is emitted from a narrow-band laser source towards said package from outside of said package. An absorption signal of said light scattered in said package is measured, wherein said absorption is caused by said at least one gas when said light is scattered and travels in said sealed package. Measuring is made outside of said package, whereby said assessment is non-intrusive with regard to said package. It is determined if a deviation exists from a predetermined, expected gas composition and/or concentration of said at least one gas within said sealed package based on said measured absorption signal. Thus sealing of said package for said gas is detected.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: June 18, 2019
    Assignee: GasPorOx AG
    Inventors: Sune Svanberg, Anders Johnsson, Märta Lewander, Annika Olsson
  • Patent number: 10299982
    Abstract: A method, performed by a mobile device, for assisting blind or visually impaired users navigate a room or a new and unfamiliar environment. The method includes blind user acquiring one or more images using a mobile device and invoking processing algorithms. Processing algorithms include one of Multi View Stereo and Structure from Motion, whereby algorithms construct a 3D representation of the environment being imaged. Further algorithms are applied to identify and assign attributes to objects in the imaged environment. The 3D representation is responsive to mobile device orientation. The environment is presented to the user via a touch screen, enabling the user to virtually explore the environment using touch, whereby objects being touched are identified, and associated with dimensional and other attributes.
    Type: Grant
    Filed: July 21, 2017
    Date of Patent: May 28, 2019
    Inventor: David M Frankel
  • Patent number: 10295334
    Abstract: A 3D measuring system having a projector, a camera and a chassis that connects the projector and the camera, characterized by a heating device for heating one or more components of the 3D measuring system.
    Type: Grant
    Filed: January 18, 2017
    Date of Patent: May 21, 2019
    Assignee: CARL ZEISS OPTOTECHNIK GMBH
    Inventors: Ernst Semmelmann, Thomas Roth
  • Patent number: 10295655
    Abstract: Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.
    Type: Grant
    Filed: July 13, 2018
    Date of Patent: May 21, 2019
    Assignee: COGNEX CORPORATION
    Inventors: Benjamin Braker, Aaron Wegner, Ronald Zimmerman, Eric Moore, Trevor McDonald
  • Patent number: 10295565
    Abstract: A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: May 21, 2019
    Assignee: CELADON SYSTEMS, INC.
    Inventors: John L. Dunklee, William A. Funk
  • Patent number: 10295477
    Abstract: A photomask blank having a thin film on a transparent substrate is inspected for defects by irradiating inspection light to a surface region of the blank, collecting the reflected light from the irradiated region via an inspection optical system to form a magnified image of the region, extracting a feature parameter of light intensity distribution from the magnified image, and identifying the bump/pit shape of the defect based on the feature parameter combined with the structure of the thin film. The defect inspection method is effective for discriminating defects of bump or pit shape in a highly reliable manner. On application of the defect inspection method, photomask blanks having no pinhole defects are available at lower costs and higher yields.
    Type: Grant
    Filed: January 25, 2018
    Date of Patent: May 21, 2019
    Assignee: SHIN-ETSU CHEMICAL CO., LTD.
    Inventors: Tsuneo Terasawa, Hiroshi Fukuda, Atsushi Yokohata, Takahiro Kishita, Daisuke Iwai
  • Patent number: 10254311
    Abstract: A probe card assembly is disclosed. The probe card assembly includes a probe card plate, a probe core, and an expansion gap defined in the probe card plate. The probe core includes a bonding portion for fixing the probe core to the probe plate. The expansion gap surrounds the probe core. Another probe card assembly is disclosed. The another probe card assembly includes a probe card plate, a tube, and a probe core. The tube is configured to be inserted into an opening of the probe card plate and configured to be securely fixed to the probe card plate. The probe core includes a bonding portion for fixing the probe core to the tube.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: April 9, 2019
    Assignee: CELADON SYSTEMS, INC.
    Inventors: John L. Dunklee, William A. Funk
  • Patent number: 10255521
    Abstract: A portable computing device equipped with at least one image capture device and/or a light source captures an image (or a video) of a portion of a surface of interest having the damage that is exposed to a light from the light source. The portable computing device converts the image to an output image that highlights the damage. If the damage is a dent, the image is converted to a false color image using a saliency algorithm. If the damage is a scratch, the image is converted to a colorspace stretched image using color stretching algorithms. The size of the damage is determined by capturing an image of a ruler placed adjacent to the damage and the portion of surface of interest having the damage. The ruler is then removed from the image. The resulting image is converted to the output image. The ruler is added to the output image.
    Type: Grant
    Filed: December 12, 2016
    Date of Patent: April 9, 2019
    Assignee: Jack Cooper Logistics, LLC
    Inventors: Andrea Amico, Mohit Prabhushankar
  • Patent number: 10249038
    Abstract: A DNA flow cell processing method including positioning the flow cell on a stage at a predetermined location relative to a camera, illuminating the flow cell from a side with a first light source to reflect light off the DNA fragment bead locations, obtaining a first image of the flow cell and identifying a first reference pattern of bead locations in the first image, moving at least one of the flow cell and the stage relative to the camera, attempting to reposition the stage at the predetermined location, obtaining a second image of the flow cell, identifying the first reference pattern in the second image, and evaluating a first offset, relative to the camera, between the first reference pattern in the first image and the first reference pattern in the second image.
    Type: Grant
    Filed: January 23, 2017
    Date of Patent: April 2, 2019
    Assignee: Qiagen Sciences, LLC
    Inventors: David Ray Stoops, Phillip Alan Veatch, Steven Jeffrey Gordon
  • Patent number: 10247679
    Abstract: Medical syringe barrels having the inner surface coated with cured silicone oil are used for calibration and detection of silicone oil in medical syringe barrels. Calibration standards as provided in this invention allow for quick determination how well a lubrication system for lubricating medical syringe barrels with silicone oil is working.
    Type: Grant
    Filed: October 14, 2016
    Date of Patent: April 2, 2019
    Assignee: ZebraSci, Inc
    Inventors: Frederick Talley Gertz, Robert James Schultheis, Jaan Noolandi
  • Patent number: 10220640
    Abstract: According to one embodiment, a tablet printing apparatus includes: a conveyor belt including a suction hole to suck a tablet; and an ink jet print head configured to perform printing on the tablet; wherein the conveyor belt further includes a plurality of protrusions formed around the suction hole and configured to support the tablet in contact with the tablet, and a recess formed between the protrusions and communicated with the suction hole, each of the protrusions has a bottom surface, an upper surface, area of which is smaller than that of the bottom surface, and a side surface having an inclined surface, the protrusions support the tablet such that a gap is formed between a surface of the tablet on conveyor belt side and the suction hole, and a suction force is applied to the gap and space of the recess through the suction hole to suck the tablet.
    Type: Grant
    Filed: April 26, 2018
    Date of Patent: March 5, 2019
    Assignee: SHIBAURA MECHATRONICS CORPORATION
    Inventors: Yasutsugu Tsuruoka, Hironori Haijima, Toru Kuribayashi, Yuki Umemura
  • Patent number: 10225483
    Abstract: A method for creating a projected image including capturing an image of an item or data relating to an image of an item with an image capture device having a plurality of light sensing units, at a first exposure time. The method further includes receiving as an input or determining a second exposure time, and creating a projected image of the item at the second exposure time based upon the captured image or the captured data relating to the image.
    Type: Grant
    Filed: April 29, 2014
    Date of Patent: March 5, 2019
    Assignee: PIERCE BIOTECHNOLOGY, INC.
    Inventors: Suk J. Hong, Nikki L. Jarrett, Eric Leigh Hommema, Jason Aravich
  • Patent number: 10223567
    Abstract: The disclosure features dendritic tags, and methods and systems for fabricating and using such tags. The methods can include obtaining at least one image of a dendritic tag attached to an article, analyzing the at least one image to identify a set of features associated with the dendritic tag, and comparing the set of features to stored information to identify the article.
    Type: Grant
    Filed: September 17, 2015
    Date of Patent: March 5, 2019
    Assignee: ARIZONA BOARD OF REGENTS, A BODY CORPORATE OF THE STATE OF ARIZONA ACTING FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY
    Inventor: Michael N. Kozicki
  • Patent number: 10217205
    Abstract: Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.
    Type: Grant
    Filed: March 10, 2016
    Date of Patent: February 26, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Min Chul Park, Dae Sin Kim, Sat Byul Kim, Sae Jin Kim, Zhiliang Xia, Je Hyun Lee
  • Patent number: 10197507
    Abstract: An inspection apparatus comprising, an optical system emitting light having a predetermined wavelength, illuminating a sample while the light is converted into light having a polarization plane not in the range of ?5 degrees to 5 degrees and 85 degrees to 95 degrees with respect to a direction of a repetitive pattern on the sample, an optical system for acquiring an image and forming said image on an image sensor using a lens, a half-wave plate, a first image sensor, a second image sensor, an inspection analyzer, wherein these differ in a transmission axis direction, a processor that obtains an average gray level and a standard deviation in each predetermined unit region of the image, and a defect detector, wherein a resolution limit defined by a wavelength of the light source and a numerical aperture of the lens is a value in which the pattern is not resolved.
    Type: Grant
    Filed: January 13, 2014
    Date of Patent: February 5, 2019
    Assignee: NuFlare Technology, Inc.
    Inventors: Riki Ogawa, Hiromu Inoue, Masatoshi Hirono
  • Patent number: 10197387
    Abstract: Thread parameters for a threaded object are determined. Spatial reference systems (X, Y, Z) and (X?, Y?, Z?) are respectively identified for a position sensor and the threaded object. A transformation matrix describing a quadratic form representing the threaded object in (X, Y, Z) may be determined to relate the reference systems. For example, a sensor trajectory on the threaded object may be determined, along with measurement points on the threaded object. The measurement points may be selected so the matrix, evaluated on these values, has maximum rank. Position data at measurement points in the second reference system may be transformed into the first reference system, yielding first results. After coating the threaded object, position data at the measurement points may be acquired again and transformed into the first reference system, yielding second results. Comparisons between the first and second results may provide thickness of the coating and quality verification.
    Type: Grant
    Filed: October 3, 2014
    Date of Patent: February 5, 2019
    Assignee: TENARIS CONNECTIONS B.V.
    Inventors: Nicolas Hernan Bonadeo, Sebastian Berra, Javier Ignacio Etcheverry
  • Patent number: 10191194
    Abstract: A spectrally selective (e.g., color) target has been designed and fabricated for reflectance micro- and/or macro-imaging that utilizes microlens arrays and color mirrors. The color mirrors are optical interference coatings. The microlenses are designed and fabricated such that the light reflected from the color mirror is incident onto the detector. This system of microlenses and color mirrors allows the user to image different colored specular highlights. An infinite number of spectral reflectance profiles can be created with these color targets and used for spectral and colorimetric imaging applications. The targets are not limited to the visible region; they can also be designed to work in the ultraviolet and infrared wavelength regions.
    Type: Grant
    Filed: November 5, 2015
    Date of Patent: January 29, 2019
    Assignee: Rochester Institute of Technology
    Inventors: Jennifer D. T. Kruschwitz, Roy S. Berns
  • Patent number: 10192298
    Abstract: A device for identifying an end of a fiber tape rolling over a composite structure is presented. The device includes a light source disposed proximate to the composite structure and configured to project a line of light at a first angle on the fiber tape rolling over the composite structure. Also, the device includes an image capturing unit disposed proximate to the composite structure and configured to capture an image of the line of light on the fiber tape at a second angle. Further, the device includes a controller coupled to the image capturing unit and configured to process the captured image to detect a discontinuity in the line of light on the fiber tape and identify the end of the fiber tape based on the detected discontinuity in the line of light on the fiber tape.
    Type: Grant
    Filed: April 20, 2015
    Date of Patent: January 29, 2019
    Assignee: GENERAL ELECTRIC COMPANY
    Inventors: Kevin George Harding, Christopher Allen Nafis, Robert William Tait
  • Patent number: 10169857
    Abstract: An image inspection apparatus includes: a parameter setting unit that automatically sets a value of a first parameter among a plurality of image processing parameters; an image generation unit that generates a processed image with each of a plurality of second parameter candidate values obtained by changing a value of a second parameter; a display unit that displays a second parameter candidate list image group in which a plurality of processed images are listed; an image selection unit that receives a selection of any one of the processed images included in the second parameter candidate list image group displayed on the display unit; and a determination unit that outputs a determination result of the visual inspection. The parameter setting unit sets a second parameter candidate value corresponding to the processed image selected by the image selection unit as the second parameter.
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: January 1, 2019
    Assignee: Keyence Corporation
    Inventor: Kenta Imakoga
  • Patent number: 10163219
    Abstract: A cargo position tracking routine implemented in an electronic control unit of an automotive vehicle uses machine vision to monitor the position of cargo in a cargo area of an automotive vehicle and determine whether the cargo has shifted. Upon determining that the cargo has shifted, the cargo position tracking routine causes a driver of the vehicle to be alerted.
    Type: Grant
    Filed: June 24, 2016
    Date of Patent: December 25, 2018
    Assignee: FCA US LLC
    Inventors: Justin W Carlson, Philip Mallinger
  • Patent number: 10151005
    Abstract: Methods and systems for sorting hides are provided. In particular, one or more embodiments comprise a tanning control system that enhances the traceability of hides by capturing and utilizing data related to the unloading, tanning, sorting, and packaging of hides. Furthermore, one or more embodiments enable the tanning control system to improve efficiency by sorting hides based, at least in part, on data generated during prior tanning processes. Additionally, one or more embodiments facilitate the tanning control system in customizing the sorting and packaging of hides based, at least in part, on one or more hide characteristics and/or customer specifications.
    Type: Grant
    Filed: December 26, 2016
    Date of Patent: December 11, 2018
    Assignee: National Beef Packing Company, LLC
    Inventors: Robert Horst Hein, Kenneth Graham Press
  • Patent number: 10132615
    Abstract: Data acquisition devices for analyzing reference objects and systems for monitoring turbine component deformation are provided. A data acquisition device has a longitudinal axis and includes a lens assembly and an image capture device in communication with the lens assembly for receiving and processing light from the lens assembly to generate images. The data acquisition device further includes a light source and a light tube coupled at a rear end to the light source. The light tube extends along the longitudinal axis between a front end and the rear end, and is operable to transport light from the light source therethrough and emit the light from the front end. The data acquisition device further includes an actuator operable to activate the image capture device and the light source.
    Type: Grant
    Filed: January 16, 2018
    Date of Patent: November 20, 2018
    Assignee: General Electric Company
    Inventors: Jason Lee Burnside, Gregory Lee Hovis, William Farris Ranson
  • Patent number: 10118448
    Abstract: In order to provide a tire inspection apparatus which is capable of identifying, when performing an appearance inspection of a tire, a location of a rubber burr from a captured image of a tire side and avoiding detection of the rubber burr as a defect in a subsequent inspection step using image processing, the tire inspection apparatus is provided with a storage unit for storing a model pattern of a molded object to be molded on the tire side to be inspected and a master image of the tire side, the master image being prepared when the molded object(s) and an unnecessary molded object(s) are molded together as a conforming article, a model pattern locating unit for locating the model pattern on the captured image of the tire side to be inspected in a position of the captured image showing a highest degree of agreement, and an unnecessary molded object location identifying unit for identifying a location of the unnecessary molded object from the captured image by comparing the position of the model pattern loca
    Type: Grant
    Filed: October 16, 2014
    Date of Patent: November 6, 2018
    Assignee: BRIDGESTONE CORPORATION
    Inventor: Akinobu Mizutani
  • Patent number: 10107765
    Abstract: In one embodiment, apparatus and methods for determining a parameter of a target are disclosed. A target having an imaging structure and a scatterometry structure is provided. An image of the imaging structure is obtained with an imaging channel of a metrology tool. A scatterometry signal is also obtained from the scatterometry structure with a scatterometry channel of the metrology tool. At least one parameter, such as overlay error, of the target is determined based on both the image and the scatterometry signal.
    Type: Grant
    Filed: August 8, 2017
    Date of Patent: October 23, 2018
    Assignee: KLA—Tencor Corporation
    Inventors: Noam Sapiens, Andrei V. Shchegrov, Stilian Ivanov Pandev
  • Patent number: 10108671
    Abstract: An information processing device includes: a memory configured to store data concerning a write access; and a processor coupled to the memory, the processor being configured to: record, for each data, time of a write access of the data to management information, when writing out data from the memory to a storage, determine a plurality of data as a group of overall compression based on the management information, the plurality of data having a difference of time of write accesses being equal to or less than a threshold value, and compress the plurality of data corresponding to the determined group by an overall compression, and write compressed data obtained through the overall compression to the storage.
    Type: Grant
    Filed: October 26, 2017
    Date of Patent: October 23, 2018
    Assignee: FUJITSU LIMITED
    Inventor: Hiroki Ohtsuji
  • Patent number: 10097743
    Abstract: In some aspects, camera systems can include a camera enclosure, a lens disposed in or along the camera enclosure along an optical axis of the camera system, and an optical accessory attached to camera enclosure, where the optical accessory is attached using a magnetic retention force that is provided by at least one magnetic element.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: October 9, 2018
    Assignee: Cognex Corporation
    Inventors: Saul Sanz Rodriguez, Laurens Nunnink
  • Patent number: 10088556
    Abstract: Methods, systems, and devices involving patterned radiation are provided in accordance with various embodiments. Some embodiments include a device for projecting pattern radiation. Some embodiments include a method for estimating coordinates of a location on an object in a 3D scene. Some embodiments include a system for estimating the coordinates of a location on an object in a 3D scene. A variety of radiation patterns are provided in accordance with various embodiments. Some embodiments may relate to the use of patterned illumination to identify the angular information that may be utilized to measure depth by triangulation.
    Type: Grant
    Filed: December 23, 2016
    Date of Patent: October 2, 2018
    Assignee: Cognex Corporation
    Inventors: Benjamin Braker, Aaron Wegner, Ronald Zimmerman, Eric Moore, Trevor McDonald
  • Patent number: 10082469
    Abstract: A method of and an apparatus for providing an indicator for a diamond as to whether it is natural by testing for the presence or absence of one or more specific markers in the luminescence properties of the diamond. These markers are characterized by luminescence decay time and luminescence wavelength.
    Type: Grant
    Filed: June 28, 2016
    Date of Patent: September 25, 2018
    Assignee: DE BEERS UK LTD
    Inventors: James Gordon Charters Smith, Colin McGuinness, David Fisher
  • Patent number: 10060859
    Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.
    Type: Grant
    Filed: April 1, 2014
    Date of Patent: August 28, 2018
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventors: Hyun-Seok Lee, Jae-Sik Yang, Ja-Geun Kim, Hee-Tae Kim, Hee-Wook You
  • Patent number: 10054763
    Abstract: In some embodiments, an apparatus for performing temperature-compensated measurement of a position of a lens assembly is attached to an autofocus actuator. In some embodiments, the apparatus includes a light source for emitting light in a first direction. In some embodiments, a measurement sensor is affixed for receiving light reflected from a reflector. In some embodiments, a lateral shield is affixed in a position blocking detection by the measurement sensor of light having been emitted from light source but having not been reflected from the reflector. In some embodiments, a monitoring sensor is affixed in a position relative to the light source to receive light having been emitted from light source but having not been reflected from the reflector. In some embodiments, a transverse shield is affixed in a position blocking detection by the monitoring sensor of light reflected from the reflector.
    Type: Grant
    Filed: August 17, 2015
    Date of Patent: August 21, 2018
    Assignee: Apple Inc.
    Inventors: Calvin K. Wong, Ho Seop Jeong
  • Patent number: 10041786
    Abstract: This invention provides a system for measuring displacement of an object surface having a displacement sensor that projects a line on the object surface and receives light from the projected line at an imager in a manner defines a plurality of displacement values in a height direction. A vision system processor operates on rows of imager pixels to determine a laser line center in columns of imager pixels in each of a plurality of regions of interest. Each region of interest defines a plurality of rows that correspond with expected locations of the projected line on the object surface. A GUI can be used to establish the regions. In further embodiments, the system generates grayscale images with the imager. These grayscale images can be compared to a generated height image to compensate for contrast-induced false height readings. Imager pixels can be compared to a reference voltage to locate the line.
    Type: Grant
    Filed: March 13, 2017
    Date of Patent: August 7, 2018
    Assignee: Cognex Corporation
    Inventors: Robert A. Wolff, Michael C. Moed, Mikhail Akopyan, Robert Tremblay, Willard Foster, Aaron S. Wallack
  • Patent number: 10041829
    Abstract: The invention relates to a UV light sensor produced in a CMOS method, comprising a substrate that has a surface, one or more sensor elements that detect radiation and are designed in said substrate, at least one passivation layer arranged over said substrate surface, and a functional layer that is arranged over said passivation layer and designed in the form of at least one filter. The problem addressed by the invention of providing a UV light sensor which is sensitive exclusively within the UV wavelength range is solved, in terms of arrangement, by means of filters designed directly on a planar passivation layer, and stray light suppressing means around said at least one sensor element and/or around the UV light sensor. In terms of the method, the problem is solved by measuring two output signal from at least two photo diodes fitted with different filters, and by determining a mathematical relationship between the two output signals.
    Type: Grant
    Filed: May 19, 2015
    Date of Patent: August 7, 2018
    Assignee: IDT Europe GmbH
    Inventors: Thomas Reichel, Lutz Schiffner, Matthias Garzarolli, Matthias Sandig, Lars Gopfert
  • Patent number: 10024652
    Abstract: A measuring machine (10), in particular a coordinate measuring machine, has at least one optical sensor (34) for recording an image in an image capturing region (80) during an image recording time period (86), a control signal transducer (89) which provides a control signal that represents the image recording time period (86), a measurement illumination arrangement (96) for illuminating the image capturing region (80), and a control device (19). The control device (19) is configured to switch on the measurement illumination arrangement (96) during the image recording time period (86) in a manner dependent on the control signal. The control device is further configured to switch on at least one further illumination arrangement (97, 98, 100, 102) temporally outside of the image recording time period (86) in a manner dependent on the control signal. A corresponding measurement system and method for controlling the illumination are also discussed.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: July 17, 2018
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Dominik Seitz, David Hoecherl
  • Patent number: 10025963
    Abstract: A printed code associated with a product is illuminated with light having a first lighting characteristic, and is readable in a default mode of an imaging reader. An electronic code displayed on a mobile communication device is readable in another mode of the reader, with a different second lighting characteristic that is designed to minimize specular reflection from a screen of the device. When the presence of the device in close proximity to the reader is detected, the reader is automatically configured to switch from the default mode to the other mode to enable the electronic code to be read.
    Type: Grant
    Filed: June 30, 2014
    Date of Patent: July 17, 2018
    Assignee: Symbol Technologies, LLC
    Inventors: Joseph S Slowik, Charles C Torzilli
  • Patent number: 10018574
    Abstract: An inspection system and method are presented for inspecting structures having a pattern formed by an array of elongated grooves having high aspect-ratio geometry, such as semiconductor wafers formed with vias. The inspection system comprises an imaging system and a control unit. The imaging system is configured and operable for imaging the structure with a dark-field imaging scheme and generating a dark-field image. The control unit comprises an analyzer module for analyzing pixels brightness in the dark-field image for identifying a defective groove, being a groove characterized by pixels brightness in the dark-field image lower than nominal brightness by a predetermined factor.
    Type: Grant
    Filed: July 14, 2015
    Date of Patent: July 10, 2018
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Gilad Barak, Elad Dotan, Alon Belleli
  • Patent number: 10015418
    Abstract: The present invention provides a TDI line image sensor. The TDI line image sensor according to the present invention is characterized by comprising: a pixel unit, which has N line sensors having M CCDs arranged in a line and being arranged horizontally to a scan direction, horizontally moves charges accumulated in the respective columns of the line sensors, and accumulates same; and an output unit for parallelly receiving as inputs the charges accumulated in the pixel unit from the respective columns, performing analog-to-digital conversion on and storing the charges, and then sequentially outputting same.
    Type: Grant
    Filed: May 14, 2015
    Date of Patent: July 3, 2018
    Assignee: VIEWORKS CO., LTD.
    Inventors: Jung Hyun Nam, Kyoung Ryoul Seo
  • Patent number: 10010250
    Abstract: A dental apparatus is provided. The dental apparatus include a handle. A controller operably couples to the housing. A subsystem is in operable communication with the controller and configured to generate an excitation signal causing an emitted fluorescence light to be reflected back to the subsystem and to the controller for analyzing one or more properties of the emitted fluorescence light. The one or more properties corresponding to a decay time of the emitted fluorescence light, wherein plaque emitted florescence light decays faster than tooth emitted florescence light. The controller is programmed to analyze detected emitted fluorescence light to determine if the emitted fluorescence light is indicative of a plaque emitted fluorescence decay time or tooth emitted florescence light decay time to detect the presence of one of dental plaque and tooth demineralization.
    Type: Grant
    Filed: December 17, 2013
    Date of Patent: July 3, 2018
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Olaf Thomas Johan Antonie Vermeulen, Steven Charles Deane
  • Patent number: 9996920
    Abstract: Methods are provided for the automated detection of micro-objects in a microfluidic device. In addition, methods are provided for repositioning micro-objects in a microfluidic device. In addition, methods are provided for separating micro-objects in a spatial region of the microfluidic device.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: June 12, 2018
    Assignee: Berkeley Lights, Inc.
    Inventors: Fenglei Du, Paul M. Lundquist, John A. Tenney, Troy A. Lionberger
  • Patent number: 9991176
    Abstract: Advanced interconnect technologies such as Through Silicon Vias (TSVs) have become an integral part of 3-D integration. Methods and systems and provided for laser-based acoustic techniques in which a short laser pulse generates broadband acoustic waves that propagate in the TSV structure. An optical interferometer detects the surface displacement caused by the acoustic waves reflecting within the structure as well as other acoustic waves traveling near the surface that has information about the structure dimensions and irregularities, such as voids. Features of voids, such as their location, are also identified based on the characteristics of the acoustic wave as it propagates through the via. Measurements typically take few seconds per site and can be easily adopted for in-line process monitoring.
    Type: Grant
    Filed: September 29, 2015
    Date of Patent: June 5, 2018
    Assignees: Rudolph Technologies, Inc., The Regents of the University of Colorado
    Inventors: Manjusha Mehendale, Michael Kotelyanskii, Todd W. Murray, Robin Mair, Priya Mukundhan, Jacob D. Dove, Xueping Ru, Jonathan Cohen, Timothy Kryman
  • Patent number: 9984454
    Abstract: A system, method, and computer program product are provided for correcting a difference image generated from a comparison of target and reference dies. In use, an intra-die inspection of a target die image is performed to generate, for each pattern of interest, a first representative image. An intra-die inspection of a reference die image is performed to generate, for each of the patterns of interest, a second representative image. Further, the target die image and the reference die image are compared to generate at least one difference image, and the at least one difference image is corrected using each of the generated first representative images and each of the generated second representative images. Detection is then performed using the corrected difference image.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: May 29, 2018
    Assignee: KLA-Tencor Corporation
    Inventor: Martin Plihal
  • Patent number: 9960089
    Abstract: An apparatus to control processing conditions for a substrate. The apparatus may include a current measurement component to perform a plurality of extraction current measurements for extraction current in a processing apparatus housing the substrate, the extraction current comprising ions extracted from a plasma and directed to the substrate; and an endpoint detection component comprising logic to generate an endpoint detection signal based upon a change in extraction current during the plurality of extraction current measurements.
    Type: Grant
    Filed: April 3, 2015
    Date of Patent: May 1, 2018
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Morgan Evans, Ross Bandy
  • Patent number: 9951408
    Abstract: The disclosure relates to a method and apparatus for preventing oxidation or contamination during a circuit printing operation. The circuit printing operation can be directed to OLED-type printing. In an exemplary embodiment, the printing process is conducted at a load-locked printer housing having one or more of chambers. Each chamber is partitioned from the other chambers by physical gates or fluidic curtains. A controller coordinates transportation of a substrate through the system and purges the system by timely opening appropriate gates. The controller may also control the printing operation by energizing the print-head at a time when the substrate is positioned substantially thereunder.
    Type: Grant
    Filed: January 19, 2017
    Date of Patent: April 24, 2018
    Assignee: Kateeva, Inc.
    Inventors: Sass Somekh, Eliyahu Vronsky, Conor F. Madigan
  • Patent number: 9940074
    Abstract: A print management method implemented in a system including a client computer, a server, and a plurality of printers is disclosed, which includes by the server: (a) receiving, from a client computer, a request relating to a print job; (b) determining whether a predetermined print quality is required for the print job; (c) filtering at least two printers each of which has an in-line spectrophotometer from the plurality of printers; (d) instructing the each filtered at least two printers to conduct a color validation process by using the in-line spectrophotometer; (e) receiving, from the each filtered at least two printers, a result corresponding to the color validation process by the in-line spectrophotometer; and (f) determining at least one candidate of a destination printer for the print job based on whether the each filtered at least two printers meets predetermined print quality, using the result corresponding to the color validation process.
    Type: Grant
    Filed: March 31, 2017
    Date of Patent: April 10, 2018
    Assignee: KONICA MINOLTA LABORATORY U.S.A., INC.
    Inventors: Randy Cruz Soriano, Kenneth Huang Young, Kazuto Yamamoto
  • Patent number: 9931675
    Abstract: A substrate mark detection apparatus includes: a detecting module, configured to detect a depth at which a mark is embedded in a substrate to be detected and determine whether the substrate is valid or not according to the depth at which the mark is embedded in the substrate; an information extracting module, configured to parse the mark to obtain parsed information in a case where the substrate is valid, query pre-stored information corresponding to the mark, determine whether the parsed information conforms to the pre-stored information or not, and if yes, to extract the pre-stored information and output the pre-stored information; a sorting module, configured to remove the substrate in a case where the substrate is invalid or the parsed information does not conform to the pre-stored information.
    Type: Grant
    Filed: June 1, 2016
    Date of Patent: April 3, 2018
    Assignees: BOE Technology Group Co., Ltd., Hefei BOE Optoelectronics Technology Co., Ltd.
    Inventor: Yangkun Jing
  • Patent number: 9927376
    Abstract: A template defect inspection method using an optical system includes emitting linearly polarized light to a template having a metal film formed on at least part of a concave-convex structure that is formed on a substrate and that has a line-and-space pattern, acquiring information on a polarization-rotated component, which is different from linearly polarized light incident on the template, of light reflected by the template in accordance with the emission thereto, converting the acquired information on the polarization-rotated component into an electrical signal, and processing the electrical signal.
    Type: Grant
    Filed: September 14, 2016
    Date of Patent: March 27, 2018
    Assignee: Toshiba Memory Corporation
    Inventors: Tomoaki Sawabe, Shinobu Sugimura, Ryosuke Yamamoto, Seiji Morita
  • Patent number: 9927375
    Abstract: According to an embodiment of the invention there may be provided a system for assigning lithographic mask inspection process parameters. The system may include a search module, a decision module and a memory module. The memory module may be configured to store an expected image expected to be formed on a photoresist during a lithographic process that involves illuminating the lithographic mask. The search module may be configured to search in the expected image for printable features. The decision module may be configured to assign a first lithographic mask inspection process parameter to lithographic mask areas related to printable features and assign a second lithographic mask inspection process parameter to at least some lithographic mask areas that are not associated with printable features. The second lithographic mask inspection process parameter may differ from the first lithographic mask inspection process parameter.
    Type: Grant
    Filed: December 21, 2015
    Date of Patent: March 27, 2018
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Shay Attal, Ori Petel, Sergey Latinsky, Sergey Khristo, Boaz Cohen