Abstract: A system and method of use thereof that enables determining and setting sample alignment based on the location of, and geometric attributes of a monitored image formed by reflection of an electromagnetic beam from a sample and into an image monitor, which beam is directed to be incident onto the sample along a locus which is substantially normal to the surface of the sample.

Abstract: An optical sensor that provides lateral viewing while maintaining light polarization is disclosed according to one embodiment of the invention. The sensor includes a sensor body, at least one waveguide and at least one refractive optical element. The sensor body may includes proximal end and a distal end. The waveguide includes a proximal end coincident near the proximal end of the sensor body and a distal end coincident at a point near the distal end of the sensor body. The waveguide may include one or more fiber optic. The waveguide may be positioned within the sensor body. The refractive optical element may be positioned within the sensor near the distal end of the waveguide and may be configured to refract light received from the distal end of the waveguide outward from the sensor. The refractive optical element may include one or more prisms.

Abstract: A system and method for automatically removing polarized light in an environment having polarized light and unpolarized light. Light is processed by a polarizer and measured by a sensor. Multiple measurements of a light characteristic are taken, each measurement corresponding to a polarity setting of the polarizer. The polarizer is automatically adjusted to enable the multiple measurements. The measurements may be of average light intensity, contrast, saturation, or another characteristic. Based on the multiple measurements and the corresponding polarity settings, an optimal polarity setting is determined, such that the amount of polarized light is minimized. A curve fitting calculation may be used to make the determination. The polarizer is adjusted to the determined polarity setting.

Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.

Abstract: An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.

Abstract: Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system for inspection of a layer of a wafer are provided. One method includes detecting a population of defects on the layer of the wafer using results of each of two or more scans of the wafer performed with different combinations of polarization settings of the inspection system for illumination and collection of light scattered from the wafer. The method also includes identifying a subpopulation of the defects for each of the different combinations, each of which includes the defects that are common to at least two of the different combinations, and determining a characteristic of a measure of signal-to-noise for each of the subpopulations. The method further includes selecting the polarization settings for the illumination and the collection to be used for the inspection corresponding to the subpopulation having the best value for the characteristic.

Abstract: The present invention relates to methods for manufacturing polarization sensitive respectively polarizing filters and to their application to polarizing photosensors used to measure the polarization of incident light, further to designs of polarization sensors measuring angles of rotation and strong electric or magnetic fields as well as to reproducing polarization equipment reproducing polarized signals or to reproduce independent signals.

Abstract: A treatment pattern (such as a focused spot, an image, or an interferogram) projected on a treatment target may lose precision if the treatment beam must pass through a birefringent layer before reaching the target. In the general case, the birefringent layer splits the treatment beam into ordinary and extraordinary components, which propagate in different directions and form two patterns, displaced from each other, at the target layer. The degree of birefringence and the orientation of the optic axis, which influence the amount of displacement, often vary between workpieces or between loci on the same workpiece. This invention measures the orientation of the optic axis and uses the data to adjust the treatment beam incidence direction, the treatment beam polarization, or both to superpose the ordinary and extraordinary components into a single treatment pattern at the target, preventing the birefringent layer from causing the pattern to be blurred or doubled.

Abstract: The invention relates to a method for measuring structures on masks (1) for photolithography, wherein firstly the mask (1) is mounted on a spatially movable platform (2). The position of the platform (2) is controlled in this case. The structure on the mask (1) is illuminated with illumination light from an illumination light source which emits coherent light. The light coming from the mask (1) is imaged onto a detection device (6) by an imaging optical unit (4) and detected. The detected signals are evaluated in an evaluation device (7) and the positions and dimensions of the structures are determined. The invention also relates to an apparatus by which these method steps, in particular, can be carried out. In this case, the accuracy of the position and dimension determination is increased by the properties of the illumination light being coordinated with the structure to be measured.

Abstract: Provided is a method of controlling multiple beams directed to a structure in a workpiece, the method comprising generating a first illumination beam with a first light source and a second illumination beam with a second light source, projecting the first and second illumination beams onto a separate illumination secondary mirror, reflecting the first and second illumination beams onto an illumination primary mirror, the reflected first and second illumination beams projected onto the structure at a first and second angle of incidence respectively, the reflected first and second illumination beams generating a first and second detection beams respectively. The separate illumination secondary mirror is positioned relative to the illumination primary mirror so as make the first angle of incidence substantially the same or close to a calculated optimum first angle of incidence and make the second angle of incidence substantially the same or close to a calculated optimum second angle of incidence.

Abstract: Provided is an apparatus for projecting multiple beams to a structure on a workpiece comprising a first light source generating a first illumination beam and a second light source generating a second illumination beam, an illumination primary mirror configured to reflect the first illumination beam onto the structure of the workpiece at a first angle of incidence, generating a first detection beam, and configured to reflect the second illumination beam onto the workpiece at a second angle of incidence, generating a second detection beam, a separate illumination secondary mirror positioned relative to the illumination primary mirror so as make the first angle of incidence substantially the same or close to a calculated optimum first angle of incidence and make the second angle of incidence substantially the same or close to a calculated optimum second angle of incidence.

Abstract: An image processing apparatus captures an object's image and separates the object's image into multiple components. The apparatus includes: a light projecting section 101 for projecting light emitted from a light source toward the object; a color and polarization obtaining section 102 for getting a color polarized image of the object; a polarization information processing section 104 for generating color and polarization information based on an association between the intensity of the light that has been transmitted through a polarizer with three or more polarization principal axis directions and the polarization principal axis directions for each of unit pixels that form the color polarized image; a light source color information collecting section 105 for collecting color information of the light source; and an image component separating section 106 for separating the color image into multiple components based on the polarization information and the color information of the light source.

Abstract: An apparatus for information extraction from electromagnetic energy via multi-characteristic spatial geometry processing to determine three-dimensional aspects of an object from which the electromagnetic energy is proceeding. The apparatus receives the electromagnetic energy. The received electromagnetic energy has a plurality of spatial phase characteristics. The apparatus separates the plurality of spatial phase characteristics of the received electromagnetic energy. The apparatus r identifies spatially segregated portions of each spatial phase characteristic, with each spatially segregated portion of each spatial phase characteristic corresponding to a spatially segregated portion of each of the other spatial phase characteristics in a group. The apparatus quantifies each segregated portion to provide a spatial phase metric of each segregated portion for providing a data map of the spatial phase metric of each separated spatial phase characteristic.

Abstract: A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N?n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.

Abstract: A device and a method for high-speed linear polarization imaging of a scene are disclosed. The device comprises a polarization modulator for modulating the polarization of light emitted from the scene in order to obtain at least three linear polarization states of the light. The polarization modulator comprises a polarizer, a first polarization rotation block comprising a fixed quarter-wave plate and a first liquid crystal operating as a quarter-wave plate, and a second polarization rotation block comprising a second liquid crystal operating as a half-wave plate. Each of the first and second liquid crystals are switchable between two states, thereby providing the at least three polarization states to the polarization modulator. The device further comprises a sensor adapted to capture image frames of the light from the scene at each polarization state of the polarization modulator.

Abstract: Apparatus and methods are disclosed for viewing low-birefringence structures within samples directly, with the eye, in real-time. The sample is placed between an entrance polarizer and analyzer polarizer, the transmission state of one of which is changed dynamically to create a modulated view of the scene; against this background, birefringent structures are visible because of their different appearance when modulated. Modulation rates of 4 or more states per second; use of 4 or more states, or even a continuum of states, which lie substantially on a latitude line on the Poincare sphere; and orientation of the polarization components to produce a uniform background; produce a clear view that does not produce operator fatigue. Broad-band wavelength operation spanning 50 nm or more, or the whole visible range, is achieved, and it is compatible with integration into other microscopy modes such as Hoffman relief contrast.

Abstract: An improved procedure for calibrating the azimuth angle in a metrology module for use in a metrology system that is used for measuring a target on a wafer, and the metrology modules can include oblique Spectroscopic Ellipsometry (SE) and unpolarized or polarized spectroscopic reflectometer devices.

Abstract: A polarization switching lidar device is arranged for remote detection and characterization of airborne aggregations of particulates. It includes a pulsed laser, a mirror, a polarizing beam splitter, an actively controlled retarder arranged to be controllably alternated between a zero retardation state and a quarter-wave retardation state such that the transmitted portion of the exiting laser light beam is linearly polarized in a predetermined direction when the actively controlled retarder is in the zero retardation state, while being circularly polarized in a predetermined rotational sense when the actively controlled retarder is in the quarter-wave retardation state. A directable telescoping assembly is arranged to collect photons backscattered by the airborne aggregations of particulates and to redirect the collected portion of depolarized backscattered photons onto the polarizing beam splitter.

Abstract: An apparatus and method for determining the concentration of chiral molecules in a fluid includes a first polarizer configure to polarize light in substantially a first plane to provide initially polarized light. A second polarizer is capable of polarizing the initially polarized light in a plurality of planes, at least one of the plurality of planes being different from the first plane, to provide subsequently polarized light. One or more receivers are included for measuring an intensity of the subsequently polarized light in one or more of the plurality of planes.

Abstract: A device and method for three-dimensional (3-D) imaging using a defocusing technique is disclosed. The device comprises a lens, at least one polarization-coded aperture obstructing the lens, a polarization-sensitive sensor operable for capturing electromagnetic radiation transmitted from an object through the lens and the at least one polarization-coded aperture, and a processor communicatively connected with the sensor for processing the sensor information and producing a 3-D image of the object.

Abstract: An imaging apparatus, imaging system, and imaging method enabling restoration of image according to a plurality of optical systems by one apparatus, having a plurality of imaging apparatuses 100A to 100C each having an optical system 110, phase plate (optical wavefront modulation element) 120, imaging element 130 able to capture an object aberration image passing through the optical system 110 and phase plate 120, imaging apparatus side storage portion 140 storing coefficient specifying information for specifying a convolution coefficient, and transmission device 150 transmitting object aberration image data obtained from the imaging element 130 and the coefficient specifying information stored in the storage portion 140; and a processing device 200 acquiring one coefficient from among a plurality of convolution coefficients stored in advance based on coefficient specifying information in accordance with a zoom position or zoom amount transmitted from the imaging apparatus 100, and generating dispersion-free

Abstract: In a method and an optical switch by which a signal light is accurately switched even if a polarization state of a signal light inputted has a fluctuation, power of an output light of a polarizer which receives a signal light extracted from an output light of a nonlinear optical medium is monitored and a polarization state of an input signal light to the nonlinear optical medium is controlled so that the power becomes minimum (or maximum). The polarization state of the input signal light is monitored, a calculation of performing a predetermined conversion is executed to the polarization state of the input signal light, and a calculated polarization state is recorded (or recorded without conversion). A polarization state of a control light with respect to the input signal light is monitored and the polarization state of the control light is controlled so as to coincide with the polarization state of the input signal light recorded.

Abstract: Methods and apparatus for concentration determination using polarized light. The apparatus includes a first polarized light source having a first light source polarization axis and a second polarized light source having a second light source polarization axis generally perpendicular to the first light source polarization axis. Also, a first polarized light receiver having a first polarized light receiver polarization axis and configured to measure an intensity of light transmitted from the first light receiver polarizer and a second polarized light receiver having a second polarized light receiver polarization axis substantially perpendicular to the first light receiver polarization axis and configured to measure an intensity of light transmitted from the second light receiver polarizer, wherein the first and second light receiver polarization axes are generally +/?45 degrees relative to the first and second light source polarization axes.

Abstract: A physical quantity measuring apparatus utilizing optical frequency domain reflectometry includes a tunable laser; a first polarization maintaining fiber; a polarization maintaining coupler; a second polarization maintaining fiber; a third polarization maintaining fiber; a sensor consists of a fiber Bragg grating formed in a core of the third polarization maintaining fiber; a fourth polarization maintaining fiber; a photodiode detects Bragg reflected light from the sensor and reference light from the referential reflecting end; a controller that detects modulation of an interference intensity between the Bragg reflected light and the reference light; and an incidence part that inputs the measuring light, wherein the incidence part being provided on the first polarization maintaining fiber or on both the second polarization maintaining fiber and the third polarization maintaining fiber.

Abstract: A spectroscopic ellipsometer can compare data different in a measurement condition and facilitate setting an initial value of fitting data even for an inexperienced operator such as a beginner. The spectroscopic ellipsometer includes a reference data storage part storing therein reference data to be compared with measurement data, a conversion operation part converting the measurement data or the reference data into comparable data, so that the measurement data can be compared with the reference data, and a comparison and determination part comparing the measurement data with the reference data made comparable by the conversion operation part with each other and determining a coincidence between the measurement data and the reference data.

Abstract: Disclosed is a method and apparatus for determining the birefringence autocorrelation length of a fiber in a non-destructive manner. The PMD of an optical fiber is measured over a first optical spectrum. A Faraday rotation angle is measured over a second optical spectrum. The birefringence autocorrelation length is determined from the measuring of the PMD and the Faraday rotation angle.

Abstract: A polarimeter and polarimetry method are disclosed of the type in which light polarization rotating properties of a sample are measured by interposing the sample in the path of a light beam having base plane polarization in a plane of known orientation; along the beam path, compensating or nulling the rotation introduced by the sample, and determining the optical rotational properties of the sample based on the amount of compensation introduced to the light beam. In accordance with one aspect of the present invention, the light beam is subjected to plural compensations along its path the compensations being of at least two different types. Preferably, one of the types of compensation is mechanical, introduced through a device in which polarization rotation is adjusted mechanically, and the second type of compensation is provided through a device in which polarization rotation is controlled electrically.

Abstract: Multi-layer articles are disclosed which include, a polypropylene-based film, and a layer on at least one surface of the polypropylene-based film including an ethylene-based material containing a copolymer of ethylene and at least one alpha-olefin comomoner with a density of no greater than 0.90 g/cm3 and a polydispersity index of between 1 and 4, wherein the multi-layer article is biaxially stretched. In some embodiments the multi-layer article exhibits desirable optical properties.

Abstract: A system which automatically reduces change in effective angle and plane of incidence of a reflected focused beam of electromagnetic radiation entering a detector, via use of a detector with dimensions less than is the spatial spread of a reflected focused beam at a location distal to the location on said sample from which it is caused to reflect, preferably after passing through a collimating lens. The basis of operation is that the portion of a reflected focused beam intercepted by the detector changes with change in sample position and/or orientation.

Abstract: Enhancement of fluorescence emission from fluorophores bound to a sample and present on the surface of two-dimensional photonic crystals is described. The enhancement of fluorescence is achieved by the combination of high intensity near-fields and strong coherent scattering effects, attributed to leaky photonic crystal eigenmodes (resonance modes). The photonic crystal simultaneously exhibits resonance modes which overlap both the absorption and emission wavelengths of the fluorophore. A significant enhancement in fluorescence intensity from the fluorophores on the photonic crystal surface is demonstrated.

Abstract: A system and method for detection and measurement of circular birefringences in materials that exhibit the Faraday effect. The method and apparatus permit detection of optical activities via the difference in the directions of propagation the left- and the right-circularly polarized light (components). A beam of light is directed at an interface formed by the optically active medium and another medium such that a difference in the angles of refraction and/or reflection and/or diffraction between the left- and the right-circularly polarized components of the light beam can be detected. The difference in the propagation directions between the two circularly polarized light components is measured on a position sensitive detector and/or is detected as an intensity difference.

Abstract: The present invention is a birefringence measuring device that requires only three types of light intensity information and thus, can measure birefringence characteristics of an object to be measured with relatively inexpensive device configuration and comprises a light source 1 for emitting a light flux having a specific polarization state to the object to be measured, an optical system for extracting each of light fluxes in predetermined three polarization directions from the light flux having passed the object to be measured, light-amount detecting means 9 for detecting a light amount of each of the light fluxes in the predetermined three polarization directions extracted by the optical system, and birefringence amount calculating means 20 for calculating a size of the birefringence of the object to be measured and an azimuth thereof by assigning each of the light amounts of the light fluxes detected by the light-amount detecting means to a predetermined function expression.

Abstract: The monitoring apparatus for uniformity and residual thickness of nano-transfer printing process is installed at a specific location in the surrounding of a transfer printing unit, and, during any stage of the transfer printing process, performs monitoring or measuring the forming rate and forming profile of the forming material inside the transfer printing unit. The monitoring apparatus includes a detection unit, a measuring unit and an analysis unit. The detection unit emits a detection ray to the transfer printing unit. The measuring unit receives a reaction signal of the detection ray passing through the transfer printing unit. The analysis unit analyzes the reaction signal to determine transfer uniformity and the material residual thickness in the transfer print unit.

Abstract: An object is to efficiently measure the resistivity of a transparent conductive film with high accuracy in a non-destructive and non-contact manner.

Abstract: A method for polarmetric analysis of scattering media. A first step involves directing stimulus from a linearly polarized stimulus source at a sample. A second step involves directing the stimulus coming from the sample through a collimating system into a polarization segregation unit which causes the stimulus to be segregated into a linearly polarized unscattered component and a depolarized scattered component. A third step involves quantification of scattering processes through computationally comparing the unscattered component and the scattered component.

Abstract: Systems, apparatus and methods for characterizing linear retarders using a waveplate analyzer constructed by polarization rotators. In one implementation of such an analyzer, both the retardation of the waveplate sample and the orientation of optical axis of the waveplate sample can be simultaneously measured.

Abstract: According to the present invention, a polarized image is captured, a variation in its light intensity is approximated with a sinusoidal function, and then the object is spatially divided into a specular reflection area (S-area) and a diffuse reflection area (D-area) in Step S402 of dividing a reflection area. Information about the object's refractive index is entered in Step S405, thereby obtaining surface normals by mutually different techniques in Steps S406 and S407, respectively. Finally, in Steps S410 and S411, the two normals are matched to each other in the vicinity of the boundary between the S- and D-areas.

Abstract: A variety of toy polariscopes are simpler in design and less costly than precision instruments used in scientific research and stress analysis of materials and structures. The toy polariscopes are designed for a variety of objects that may exhibit photoelastic properties such as glass, plastic, Plexiglas, gel candle material and other gels, and even edible photoelastic objects. They are specially designed for objects of various sizes with a variety of purposes such as objects to enhance learning in a variety of conditions and experiences. Special objects are designed to go with the toy polariscopes such as edible and inedible photoelastic objects, photoelastic candle material, a variety of photoelastic/photoplastic stands capable of a variety of displays in interaction with other designed photoelastic objects capable of a variety of interaction and displays. Other optical phenomena may also be observed.

Abstract: An adaptive optics apparatus includes a first light modulating unit configured to perform modulation in a polarization direction of one of two polarized light components in light emitted from a light source, a changing unit configured to rotate the light modulated by the first light modulating unit by 90 degrees, a second light modulating unit configured to modulate the light changed by the changing unit in the polarization direction, and an irradiating unit configured to irradiate a measurement object with the light modulated by the second light modulating unit.

Abstract: A method of determining polarization dependent characteristic of an optical device under test (10) having at least one input and at least one output, comprises the steps of generating and inputting a stimulus signal (4) to each of a plurality of polarization units (27a, 29b, 127c, 129d), setting each of said input stimulus signals into a unique state of polarization, attaching a characteristic identification portion (27, 29, 127, 129) to each of said input and/or polarized stimulus signals, applying said stimulus signal to said device under test (10) for effecting a response signal of said device under test, receiving and identifying (44, 52) each of said characteristic identification portions from said response signal for tracing each of said polarized stimulus signals within said response signal, deriving a polarization dependent characteristic of said device under test from said traced polarized stimulus signals.

Abstract: An apparatus for detecting an array substrate, comprising: a transparent carrier for supporting an array substrate to be detected thereon; a light source disposed on one side of the transparent carrier; a modulator disposed on the other side of the transparent carrier in parallel with the transparent carrier, and comprising a liquid crystal layer and two transparent substrate layers disposed on both sides of the liquid crystal layers, wherein one transparent substrate layer away from the transparent carrier is a first transparent conductive substrate layer, and a second polarizer is disposed on the first transparent conductive substrate layer; a first polarizer, disposed between the light source and the transparent carrier, so that the light emitted from the light source is transmitted through the first polarizer to radiate on the transparent carrier; and a light receiver receiving the light emitted from the light source and then transmitted through the transparent carrier, the array substrate to be detected

Abstract: A unit for measuring a power of randomly polarized light beam is configured with spaced first and second beam splitters having respective reflective surfaces which face one another and configured to sequentially reflect a fraction of randomly polarized beam which is incident upon the first splitter. The beam splitters are dimensioned and shaped so that an output beam, reflected from the second beam splitter, has a power independent from the state of polarization of the randomly polarized beam.

Abstract: The resolution obtained by an imaging system utilizing separable photons can be achieved by an imaging system making use of entangled photons. Since resolution is not being increased from the separable-photon system, the imaging system utilizing entangled photons can take advantage of a smaller aperture. This results in a smaller and lighter system, which can be especially valuable in satellite imaging where weight and size play a vital role.

Abstract: A method of measuring a relative phase of a bio-cell using a digital image sensor, comprising the steps of firstly filtering a light emitted from a light source, using a first polarizer and a first wave plate, which are arranged in order in a optical path, exposing a bio-cell to the firstly filtered light, secondly filtering the light passing through the bio-cell, using a second wave plate and a second polarizer, which are arranged in order in the optical path, and sensing an intensity of the secondly filtered light, by each of pixels of the image sensor, wherein, as conditions of the second filtering are varied, optical properties of the bio-cell are calculated using the intensity of the light in a pixel-wise manner.

Abstract: In a method of measuring cumulative polarization mode dispersion (PMD) along the length of a fiber-under-test (FUT), a polarization-sensitive optical time domain reflectometer (POTDR) is used to inject into the FUT plural series of light pulses arranged in several groups. Each group comprises at least two series having closely-spaced wavelengths and the same state of polarization (SOP). At least two of such groups are injected and corresponding OTDR traces obtained for each series by averaging the impulse-response signals of the several series in the group. The process is repeated for a number of groups. The PMD is obtained by normalizing the OTDR traces of all of the groups, then computing the difference between each normalized OTDR trace in one group and the corresponding normalized OTDR trace in another group, followed by the mean-square value of the differences. Finally, the PMD is computed as a predetermined function of the mean-square difference.

Abstract: Methods and apparatus to measure visual appearance of randomly arranged birefringent fibers are disclosed. One method comprises emitting light, creating Ni polarization states of the emitted light, illuminating the birefringent fibers with the emitted light so polarized, thereby generating IRi internal reflection components, ERi external reflection components, and Di diffusion components of the light in the birefringent fibers, observing the light from the illuminated birefringent fibers, creating Oi polarization states of the observed light, forming Xi images of the observed polarized light, each image comprising an information (Ni, Oi, IRi, ERi, Di), wherein i=1, 2, . . . n and n?4, measuring the intensity Ii in each pixel in the X, images, and separating the i-th internal reflection component, the i-th external reflection component, and the i-th diffusion component from the i-th image for the Xi images.

Abstract: A line scanning measurement system includes an illumination apparatus, a support, a telecentric optical element and a processor. The illumination apparatus is utilized for providing an extended polarized light beam. The support is utilized for mounting a sample, and the extended polarized light beam is directed at the sample. The telecentric optical element is utilized for directing a measurement light beam that has interacted with the sample toward a line scanning detector. The processor is utilized for obtaining the characteristic information of the sample in accordance with the signal measured by the line scanning detector.

Abstract: A portable electronic device includes a casing, a liquid crystal, a controlling module, and a button. The liquid crystal display is capable of emitting polarized light. The controlling module is received in the casing, the controlling module is configured for controlling the liquid crystal display to display a white screen when receiving a control signal. The button is configured for generating the control signal when triggered by a user.

Abstract: A method and device capable of evaluating the specific values of the polarization state of the signal transmitted in a photonic transmission system for a number of frequencies of one or more of the pulses extracted from the optical signal by means of the translation of the frequential components of polarization state of one or more pulses to the time domain by means of the use of an optical Fourier transformer, and their sampling, quantification and subsequent analysis. From the analysis the variation in the polarization state versus frequency is calculated, as well as its associate PMD vector and the DGD present in the signal transmitted. This information may be used as a control signal for a PMD compensator device in order to upgrade the quality of communication in the system.

Abstract: Ellipsometry using two waveplates of complementary retardation in a dual rotating compensator configuration is disclosed. Two waveplates of complementary retardation may be used to increase the useful spectral range of a rotating compensator ellipsometer, in particular towards the deep Ultraviolet (UV) spectrum. The improved rotating compensating ellipsometer disclosed herein enables a user to select specific and different waveplate retardations for the purpose of increasing the operating wavelength range of the rotating compensating ellipsometer.