Shape Or Surface Configuration Patents (Class 356/601)
  • Patent number: 10520305
    Abstract: A computer and a method executable by the computer. The computer may include a processor and memory storing instructions executable by the processor. The instructions may include, to: receive sensor data from a sensor in a vehicle operating in a fully autonomous mode; using the data, determine a misalignment value; and based on the value, perform one of a plurality of vehicle driving functions that include stopping the vehicle.
    Type: Grant
    Filed: August 24, 2017
    Date of Patent: December 31, 2019
    Assignee: Ford Global Technologies, PLC
    Inventors: Thomas G. Leone, Kenneth James Miller
  • Patent number: 10515258
    Abstract: A method of processing data from a sensor, the method comprising: receiving first data; identifying an object by comparing the received first data with stored second data for a plurality of objects; determining a first processing strategy for one or more portions of the object in third data using the identification of the object, the third data being received from a sensor; and processing the determined one or more portions of the object in the third data using the determined first processing strategy.
    Type: Grant
    Filed: August 10, 2017
    Date of Patent: December 24, 2019
    Assignee: ROLLS-ROYCE PLC
    Inventors: Giles E. Harvey, Adriano Pulisciano
  • Patent number: 10516841
    Abstract: A pixel includes a photoelectric device, a current readout unit configured to detect an electric current flowing in the photoelectric device to generate an input voltage, an event determination unit configured to determine an event occurrence and an event type responsive to the input voltage, and configured to output an event detection signal, and an event output unit configured to store the event detection signal for an event-storage period and configured to output the stored event detection signal responsive to an expiration of the event-storage period.
    Type: Grant
    Filed: January 10, 2018
    Date of Patent: December 24, 2019
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Jun Seok Kim, Hyun Surk Ryu, Bong Ki Son, Yun Jae Suh, Hee Jae Jung, Keun Joo Park, Seol Namgung
  • Patent number: 10509113
    Abstract: In some embodiments, a measurement system may include a time to digital converter (TDC) configured to determine a first digitized time at which it receives a command signal and a second digitized time at which it receives an alert signal. The first digitized time and the second digitized time may be determined for N number of iterations. The command signal may be delayed by a delay time, and the delay time may be varied for each of the N number of iterations. The measurement system may include a first dynamic photodiode (DPD) configured to switch from a reverse bias mode to an active mode based on the command signal. The TDC may calculate a difference between the first digitized time and the second digitized time for each of the N number of iterations, and the difference may vary as the delay time is varied.
    Type: Grant
    Filed: April 7, 2017
    Date of Patent: December 17, 2019
    Assignee: ACTLIGHT SA
    Inventors: Denis Sallin, Maxim Gureev, Alexander Kvasov, Serguei Okhonin
  • Patent number: 10507088
    Abstract: Embodiments are directed to an imaging apparatus, which in an embodiment includes a light source to provide light, optics, a translation mechanism and a detector. The optics include focusing optics to perform focusing of the light onto a non-flat focal surface and to direct the light toward a three dimensional object. The translation mechanism adjusts a location of at least one lens of the focusing optics to displace the non-flat focal surface. The detector measures intensities of returning light that is reflected off of the three dimensional object, wherein the intensities of the returning light are measured for a plurality of locations of the at least one lens for determination of positions of a plurality of points of the three dimensional object. Detected positions of one or more of the plurality of points are adjusted to compensate for the non-flat focal surface.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: December 17, 2019
    Assignee: Align Technology, Inc.
    Inventors: Tal Verker, Adi Levin, Ofer Saphier, Maayan Moshe
  • Patent number: 10502549
    Abstract: Methods and systems for building and using a parameter isolation model to isolate measurement signal information associated with a parameter of interest from measurement signal information associated with incidental model parameters are presented herein. The parameter isolation model is trained by mapping measurement signals associated with a first set of instances of a metrology target having known values of a plurality of incidental model parameters and known values of a parameter of interest to measurement signals associated with a second set of instances of the metrology target having nominal values of the plurality of incidental model parameters and the known values of the parameter of interest. The trained parameter isolation model receives raw measurement signals and isolates measurement signal information associated with a specific parameter of interest for model-based parameter estimation.
    Type: Grant
    Filed: March 21, 2016
    Date of Patent: December 10, 2019
    Assignee: KLA-Tencor Corporation
    Inventor: Stilian Ivanov Pandev
  • Patent number: 10499793
    Abstract: Processing logic makes a comparison between first image data and second image data of a dental arch and determines a plurality of spatial differences between a first representation of the dental arch in the first image data and a second representation of the dental arch in the second image data. The processing logic determines that a first spatial difference is attributable to scanner inaccuracy and that a second spatial difference is attributable to a clinical change to the dental arch. The processing logic generates a third representation of the dental arch that is a modified version of the second representation, wherein the first spatial difference is removed in the third representation, and wherein the third representation comprises a visual enhancement that accentuates the second spatial difference.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: December 10, 2019
    Assignee: Align Technology, Inc.
    Inventors: Sergei Ozerov, Ofer Saphier, Avi Kopelman, Adi Levin, Pavel Razumovskiy, Michael Sabina, Mikhail Dyachenko, Rene M. Sterental, Partha Dey, Roman A. Roschin, Anton Gavrilov, Leonid Vyacheslavovich Grechishnikov
  • Patent number: 10502694
    Abstract: Disclosed are apparatus and methods for characterizing a plurality of structures of interest on a semiconductor wafer. A plurality of spectra signals are measured from a particular structure of interest at a plurality of azimuth angles from one or more sensors of a metrology system. A difference spectrum is determined based on the spectra signals obtained for the azimuth angles. A quality indication of the particular structure of interest is determined and reported based on analyzing the difference spectrum.
    Type: Grant
    Filed: August 1, 2014
    Date of Patent: December 10, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Thaddeus Gerard Dziura, Stilian Ivanov Pandev, Alexander Kuznetsov, Andrei V. Shchegrov
  • Patent number: 10500692
    Abstract: A lens edging system, including: a spectacle frame measurement device and an order-side terminal device disposed at a spectacle lens order side; and an order-receiving side controller disposed at a spectacle lens order-receiving side, wherein the order-side terminal device and the order-receiving side controller are connected to each other via a communication line, the system further including: an information memory part for storing and holding information regarding a shape of a probe in the spectacle frame measurement device as probe information; and an edging shape calculation part for performing data correction reflecting an abutting mode of the probe indicated by the probe information when lens edging shape data is created at the spectacle lens order-receiving side, wherein a suitable size correction can be performed even when a frame shape of any kind of a spectacle frame is measured by the spectacle frame measurement device by performing the data correction.
    Type: Grant
    Filed: December 17, 2013
    Date of Patent: December 10, 2019
    Assignee: HOYA CORPORATION
    Inventors: Takahiro Suzue, Takashi Daimaru, Hiroshi Yoshizaki
  • Patent number: 10475201
    Abstract: A vehicle inspection or measurement method and system configured to utilize non-contact optical sensors to acquire images and measurement data associated with at least one vehicle wheel assembly as a vehicle moves through a field of view, and to evaluate the acquired image and/or measurement data to determine at least one dimension associated with an observed feature of the vehicle wheel assembly.
    Type: Grant
    Filed: February 2, 2017
    Date of Patent: November 12, 2019
    Assignee: Hunter Engineering Company
    Inventors: Aaron C. Hall, Mark S. Shylanski, Timothy A. Strege
  • Patent number: 10456137
    Abstract: A medical instrument has an elongated channel configured to support a staple cartridge, the staple cartridge comprising a plurality of staples. The medical instrument also has an anvil mechanically coupled to the elongated channel, wherein the anvil comprises an exterior surface extending between a proximal end and a distal end. In addition, the medical instrument has at least one electrical circuit at least partially positioned on the exterior surface of the anvil, an indicator system comprising at least one indicator, and a logic circuit electrically in electrical communication with the at least one electrical circuit and the indicator system, wherein the logic circuit is configured to activate the at least one indicator when an electrical continuity of the at least one electrical circuit is interrupted.
    Type: Grant
    Filed: April 15, 2016
    Date of Patent: October 29, 2019
    Assignee: Ethicon LLC
    Inventors: Michael J. Vendely, Charles J. Scheib, Frederick E. Shelton, IV, Jason L. Harris, Robert S. Moir, Sofia Maria Consonni, Stephen Sams, Ismail Akram, Howell T. Goldrein
  • Patent number: 10444917
    Abstract: A flexible display device and a method of driving a flexible display device are provided. The method of driving the flexible display device includes detecting a capacitance change with respect to at least some coordinates of a display area, determining whether bending is occurring through the detected capacitance change, and setting a driving mode in response to a result of the step of determining whether bending is occurring, wherein the driving mode is converted into a bending mode when it is determined that bending is occurring, and the driving mode is set into a force touch mode when it is determined that bending is not occurring.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: October 15, 2019
    Assignee: Samsung Display Co., Ltd.
    Inventors: Young Seok Seo, Won-Ki Hong, Jung Hyun Kim, Hyoung Wook Jang
  • Patent number: 10445595
    Abstract: Driver assistance systems for detecting a structural barrier extending along a road. The driver assistance system may be mountable in a host vehicle. The camera may capture multiple image frames in the forward field of view of the camera. A processor may process motion of images of the barrier in the image frames. The camera may be a single camera. The motion of the images may be responsive to forward motion of the host vehicle and/or the motion of the images may be responsive to lateral motion of the host vehicle.
    Type: Grant
    Filed: August 23, 2018
    Date of Patent: October 15, 2019
    Assignee: Mobileye Vision Technologies Ltd.
    Inventor: Gideon Stein
  • Patent number: 10430962
    Abstract: A control apparatus acquires a group of images, including an image acquired by capturing an image of an object irradiated with first pattern light, an amount of the first pattern light changing periodically, in a predetermined direction, and an image acquired by capturing images of the object irradiated with second pattern light, an amount of the second pattern light changing periodically, in the predetermined direction, and having a phase difference from the first pattern light. The control apparatus also acquires one image by capturing an image of the object irradiated with third pattern light, that provides for identification of a position of at least one period, of a plurality of periods, included in one of the first pattern light and the second pattern light, and calculates a three-dimensional shape of the object based on the group of images and the one image, for each of a plurality of directions.
    Type: Grant
    Filed: March 27, 2017
    Date of Patent: October 1, 2019
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takamasa Seto
  • Patent number: 10410366
    Abstract: An imaging system includes an optical unit that captures, from a scene, sets of first images as well as sets of second images. The scene is illuminated with non-structured light when the sets of first images are captured and illuminated with structured light when the sets of second images are captured. A pattern processing unit generates, from the second images, a recovered shadow pattern from a shadow pattern projected onto the scene during illumination with structured light, wherein at least one motion-compensated reference image is used. A depth processing unit obtains depth information on the basis of the recovered shadow pattern.
    Type: Grant
    Filed: March 23, 2016
    Date of Patent: September 10, 2019
    Assignee: SONY CORPORATION
    Inventors: Francesco Michielin, Paul Springer, Thimo Emmerich, Zoltan Facius, Piergiorgio Sartor
  • Patent number: 10397535
    Abstract: An optical micro-projection system comprising the following components: at least one laser light source (200, 400, 402, 600); at least one movable mirror (102, 103, 203) for deviating light from said light source to allow generation of images on a projection surface (104, 301, 303, 306, 603); a self mixing module for measurement of the distance (604) between the projection source and a projection surface, said self mixing module comprising: —at least one photodiode (401, 601) for monitoring the light emission power of the laser light source; —an optical power variation counter for counting optical power variations (605); successive displacements of said mirror allowing the self mixing module providing successive projection distance measurements of a plurality of points of said projection surface. A projection method for optical micro-projection system and a distance measurement method are also provided.
    Type: Grant
    Filed: March 5, 2018
    Date of Patent: August 27, 2019
    Assignee: North Inc.
    Inventors: Lucio Kilcher, Faouzi Khechana
  • Patent number: 10393508
    Abstract: A system and method for obtaining a dimension measurement that conforms to a conformance criteria is disclosed. The dimensioning system provides either (i) feedback to confirm that the measurement complies with the criteria or (ii) information on how the measurement geometry could be adjusted in order to provide a compliant measurement in a subsequent dimension measurement.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: August 27, 2019
    Assignee: Hand Held Products, Inc.
    Inventors: H. Sprague Ackley, Franck Laffargue
  • Patent number: 10372845
    Abstract: A method and system are presented for use in scatterometry analysis for a patterned structure. According to this technique, a model of a patterned structure is provided comprising a selected number of virtual segment data pieces indicative of a respective number of segments of the patterned structure along Z-axis through the structure. Each of the segment data pieces is processed for determining a matrix [?n] comprising Z-axis derivatives of electromagnetic fields' response of the segment to incident field based on Maxwell's equations' solution, and transforming this matrix [?n] into an approximated response matrix [?n] corresponding to the electromagnetic field interaction between two different points spaced along the Z-axis. The transformation is preferably carried out by a GPU, and comprises embedding said matrix [?n] in a series expansion of said matrix exponential term [?n].
    Type: Grant
    Filed: October 30, 2015
    Date of Patent: August 6, 2019
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Ruslan Berdichevsky, Eyal Grubner, Shai Segev
  • Patent number: 10365099
    Abstract: A method for exploring an installation space of an article includes acquiring a point cloud of an indoor space including a number of point data with three-dimensional scanning. The method also includes acquiring obstacle data and passage data from the point cloud. The method further includes exploring an installation space of the article to determine a space where an obstacle is placed in the obstacle data and a space where a passage is present, as a space where the article is allowed to be installed.
    Type: Grant
    Filed: October 27, 2016
    Date of Patent: July 30, 2019
    Assignee: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY
    Inventors: Kyoung-Seok Noh, Yong-Gu Lee
  • Patent number: 10365163
    Abstract: A metrology system is presented for measuring parameters of a structure. The system comprises: an optical system and a control unit. The optical system is configured for detecting light reflection of incident radiation from the structure and generating measured data indicative of angular phase of the detected light components corresponding to reflections of illuminating light components having different angles of incidence. The control unit is configured for receiving and processing the measured data and generating a corresponding phase map indicative of the phase variation along at least two dimensions, and analyzing the phase map using modeled data for determining one or more parameters of the structure.
    Type: Grant
    Filed: August 2, 2018
    Date of Patent: July 30, 2019
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Gilad Barak, Dror Shafir, Danny Grossman
  • Patent number: 10363118
    Abstract: Systems for generating in-focus color images are provided. Related methods and devices are also provided.
    Type: Grant
    Filed: March 19, 2018
    Date of Patent: July 30, 2019
    Assignee: Align Technology, Inc.
    Inventor: Yosi Moalem
  • Patent number: 10359273
    Abstract: A system and method for obtaining a dimension measurement that conforms to a conformance criteria is disclosed. The dimensioning system provides either (i) feedback to confirm that the measurement complies with the criteria or (ii) information on how the measurement geometry could be adjusted in order to provide a compliant measurement in a subsequent dimension measurement.
    Type: Grant
    Filed: December 7, 2017
    Date of Patent: July 23, 2019
    Assignee: Hand Held Products, Inc.
    Inventors: H. Sprague Ackley, Franck Laffargue
  • Patent number: 10352693
    Abstract: A method and system determining texture data at least by performing fiducial point registration with a triggerable texture source and generating virtual objects and texture data based at least in part upon a fiducial point. Fiducial point registration textures a desired point with one or more projectors in response to the identification of a desired point in space, generates data with one or more projected patterns, determines a final location or depth of a point using the generated data, and registers the point as a fiducial point by groom a data structure based on a registration requirement pertaining to a distribution of fiduciary points and a requirement pertaining to machine recognition of physical objects. Virtual objects are generated relative to a real-world scene and the generated texture data-based at least in part upon the final location or depth of a fiducial point.
    Type: Grant
    Filed: May 8, 2015
    Date of Patent: July 16, 2019
    Assignee: Magic Leap, Inc.
    Inventors: Rony Abovitz, Brian T. Schowengerdt, Mathew D. Watson
  • Patent number: 10331958
    Abstract: The present disclosure discloses a method and apparatus for acquiring information. A specific embodiment of the method includes: collecting characteristic information of a road object, the characteristic information comprising: a position, in a world coordinate system, of laser points corresponding to the road object in a laser point cloud collected in an area where the road object is located, and a position in a reflectance map corresponding to a position of a control point of the road object in the world coordinate system; and determining whether a preset accuracy is acceptable based on a match between the characteristic information of the road object and a preset characteristic information of the road object, the preset accuracy comprising: a splicing accuracy of the spliced laser point cloud, an accuracy of the reflectance map, and an accuracy of the high-precision map.
    Type: Grant
    Filed: February 7, 2018
    Date of Patent: June 25, 2019
    Assignee: BAIDU ONLINE NETWORK TECHNOLOGY (BEIJING) CO., LTD.
    Inventors: Li Yu, Cheng Wang, Shiyu Song, Fangfang Dong
  • Patent number: 10321081
    Abstract: A solid-state imaging device includes n first photoelectric conversion elements configured to photoelectrically convert incident light, n first reading circuits configured to output corresponding first pixel signals, m second photoelectric conversion elements configured to photoelectrically convert incident light, m second reading circuits configured to sequentially output corresponding second pixel signals, and a reading control circuit, wherein each of the second reading circuits includes a detection circuit configured to output an event signal when a change in a second charge signal is detected and a pixel signal generation circuit configured to add address information to an event signal, and the reading control circuit causes the first pixel signal to be output by determining a reading region corresponding to address information, and n and m are natural numbers greater than or equal to 2.
    Type: Grant
    Filed: January 17, 2018
    Date of Patent: June 11, 2019
    Assignee: OLYMPUS CORPORATION
    Inventors: Nobuyuki Watanabe, Toru Kondo, Kosei Tamiya
  • Patent number: 10302423
    Abstract: A three-dimensional shape measurement apparatus includes main pattern illumination parts, main image-capturing parts and a control part. The main pattern illumination parts obliquely illuminate grating pattern light in different directions toward a measurement target. The main image-capturing parts obtain a grating pattern image of the measurement target by receiving reflection light of the grating pattern light illuminated from the main pattern illumination parts and obliquely reflected by the measurement target. The control part produces height data of the measurement target using grating pattern images of the measurement target, or produces height data of the measurement target using image positions of plane images for the measurement target and texture information of the measurement target. The control part employs a grating pattern illuminated on the measurement target as the texture information to produce height data of the measurement target.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: May 28, 2019
    Assignee: KOH YOUNG TECHNOLOGY INC.
    Inventor: Moon Young Jeon
  • Patent number: 10295335
    Abstract: [Object] To provide a shape measurement apparatus that, in measuring the unevenness shape of a measurement object by a light-section method, enables the shape of the measurement object to be measured precisely even when the distance between the measurement object and an image capturing apparatus fluctuates.
    Type: Grant
    Filed: April 22, 2016
    Date of Patent: May 21, 2019
    Assignee: NIPPON STEEL & SUMITOMO METAL CORPORATION
    Inventors: Jun Umemura, Hironao Yamaji
  • Patent number: 10260988
    Abstract: The present disclosure illustrates a non-contact measurement device for a radius of curvature and a thickness of a lens and a measurement method thereof. The non-contact measurement device utilizes a non-contact probe to integrate a motor, an optical scale and an electronic control module, so as to achieve measurement for the radius of curvature and the thickness of the lens. The present disclosure adopts astigmatism to achieve fast and precise focusing. To overcome the spherical aberration problem, thickness measurement can be implemented by the non-contact measurement device through a formula calculation and utilization of a correction plate, wherein single one probe is used for the measurement herein. For the thicker lens, the non-contact measurement device can be extended to use dual probes, so as to detect the top and bottom sides of the lens.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: April 16, 2019
    Assignee: NATIONAL APPLIED RESEARCH LABORATORIES
    Inventors: Wei-Yao Hsu, Wei-Jei Peng, Zong-Ru Yu, Jung-Hsin Wang, Po-Jui Chen, Cheng-Fang Ho, Chi-Hung Huang, Chun-Cheng Chen, Hua-Lin Chen, Yi-Hao Lin, Ming-Fu Chen
  • Patent number: 10241426
    Abstract: An initialization method including estimating a characteristic of a property of an object based on a plurality of measurements by the sensor of the property using a respective plurality of different measurement parameters, different ones of the measurements using different measurement parameters, the characteristic including a combination of respective outcomes of respective ones of the measurements weighted by a respective weighting coefficient; performing, for each of a plurality of models of the object, each model configured to enable respective simulation of the performing of the measurements, a respective simulation, the respective simulation including simulating the measurements under control of a respective plurality of different simulation parameters to obtain a respective plurality of simulated characteristics of the property, the different simulation parameters being indicative of the different measurement parameters; determining, for each of the models, a respective bias representative of a respect
    Type: Grant
    Filed: July 27, 2016
    Date of Patent: March 26, 2019
    Assignee: ASML Netherlands B.V.
    Inventor: Patricius Aloysius Jacobus Tinnemans
  • Patent number: 10238472
    Abstract: Embodiments for estimating a surface texture of a tooth are described herein. One method embodiment includes collecting a sequence of images utilizing multiple light conditions using an intra-oral imaging device and estimating the surface texture of the tooth based on the sequence of images.
    Type: Grant
    Filed: October 30, 2017
    Date of Patent: March 26, 2019
    Assignee: Align Technology, Inc.
    Inventor: Adi Levin
  • Patent number: 10229539
    Abstract: The system includes imaging unit which images a work space at a viewpoint position in a visual line direction of a worker together with an other component to which one component is to be installed, a position attitude information obtaining unit which obtains position attitude information which indicates relative position attitude relation between viewpoint of the worker and other component in the work space, a virtual image generating unit which generates virtual image of an actual shape of the one component at the viewpoint position in the visual line direction of the worker based on position attitude information, an image composing unit which generates composite image by superimposing virtual image on a real image in the work space imaged by the imaging unit, and display unit which displays composite image. According to the system, efficiency of component assembly work can be considerably improved by using mixed reality technology.
    Type: Grant
    Filed: April 23, 2014
    Date of Patent: March 12, 2019
    Assignee: KAWASAKI JUKOGYO KABUSHIKI KAISHA
    Inventors: Shigekazu Shikoda, Naohiro Nakamura, Shinichi Nakano, Masahiko Akamatsu, Shingo Yonemoto, Daisuke Tokai, Takashi Koumoto
  • Patent number: 10217208
    Abstract: An apparatus for inspecting a turbomachine includes a plurality of boroscopes, a device to rotate the rotor of the turbomachine and a processor having reference measurements of the rotor blades and/or reference measurements between the rotor blades and the boroscopes. A boroscope is inserted in a casing aperture upstream of the blades to view the leading edge and a portion of one of the surfaces of each blade as the rotor is rotated. A boroscope is inserted in a casing aperture downstream of the blades to view the trailing edge and a portion of one of the surfaces of each blade as the rotor is rotated. The boroscopes supply the images of each of the blades to the processor. The processor analyses the images of the blades and uses the reference measurements to determine the position and size of any defect on any of the rotor blades.
    Type: Grant
    Filed: July 26, 2016
    Date of Patent: February 26, 2019
    Assignee: ROLLS-ROYCE PLC
    Inventors: James Kell, Adriano Pulisciano, Thomas Frederick Danvers, Graeme Eric Rigg
  • Patent number: 10203413
    Abstract: A method for measuring and registering 3D coordinates has a 3D scanner measure a first collection of 3D coordinates of points from a first registration position. A 2D scanner collects horizontal 2D scan sets as 3D measuring device moves from first to second registration positions. A processor determines first and second translation values and a first rotation value based on collected 2D scan sets. 3D scanner measures a second collection of 3D coordinates of points from second registration position. Processor adjusts second collection of points relative to first collection of points based at least in part on first and second translation values and first rotation value. Processor identifies a correspondence among registration targets in first and second collection of 3D coordinates, and uses this correspondence to further adjust the relative position and orientation of first and second collection of 3D coordinates.
    Type: Grant
    Filed: August 21, 2017
    Date of Patent: February 12, 2019
    Assignee: FARO TECHNOLOGIES, INC.
    Inventors: Oliver Zweigle, Bernd-Dietmar Becker, Reinhard Becker
  • Patent number: 10197506
    Abstract: A method and system are presented for use in controlling a process applied to a patterned structure having regions of different layered stacks. The method comprises: sequentially receiving measured data indicative of optical response of the structure being processed during a predetermined processing time, and generating a corresponding sequence of data pieces measured over time; and analyzing and processing the sequence of the data pieces and determining at least one main parameter of the structure.
    Type: Grant
    Filed: March 8, 2018
    Date of Patent: February 5, 2019
    Assignee: NOVA MEASURING INSTRUMENTS LTD.
    Inventors: Igor Turovets, Cornel Bozdog, Dario Elyasi
  • Patent number: 10190861
    Abstract: A measuring device and related methods include, in at least one aspect, a method for controlling a measuring device: including processing data providing information on a shape of the part to determine a set of suitable surface touch positions, the set of suitable surface touch positions being used to generate a first queue; instructing the measuring device to move at least one of one or more probes to each position listed in the first queue, and to take a surface touch measurement at each position; calculating a set of suitable edge touch positions based on the surface touch measurements, the set of suitable edge touch positions being used to generate a second queue of measurements; and instructing the measuring device to move the at least one of the one or more probes to each position listed in the second queue, and to take an edge measurement at each position.
    Type: Grant
    Filed: December 21, 2017
    Date of Patent: January 29, 2019
    Assignee: Delcam Limited
    Inventor: Dmitriy Dolgikh
  • Patent number: 10184789
    Abstract: An image inspection apparatus includes a pattern light illuminating section configured to generate pattern light having a periodic illuminance distribution and irradiate the pattern light on an inspection target object, an imaging section including a plurality of image receiving elements arrayed in a line shape, a trigger signal transmitting section configured to transmit an illumination trigger signal to the pattern light illuminating section, and an imaging control section configured to control, on the basis of the illumination trigger signal, values of electric currents fed to light emitting diodes to thereby cause the pattern light illuminating section to generate a plurality of pattern lights, phases of illuminance distributions of which are shifted.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: January 22, 2019
    Assignee: Keyence Corporation
    Inventor: Yuta Sasaki
  • Patent number: 10152802
    Abstract: A method of determining a silhouette of a remote object is disclosed herein. The method can include directing an array of telescopes at a star to sense an intensity of EM radiation over time and transmit signals corresponding to the intensity. The signals can be received at a computing device. Each signal can be indicative of a portion of an intensity diffraction pattern generated by an occlusion of the star by an occluding object. The signals can be combined to form a two-dimensional, intensity diffraction pattern. Each point on the intensity diffraction pattern associated with a time, a position of each telescope in the array, and an intensity of the sensed EM radiation. A silhouette of the occluding object can be determined based on the intensity diffraction pattern. A system for performing the method is also disclosed herein.
    Type: Grant
    Filed: April 17, 2017
    Date of Patent: December 11, 2018
    Assignee: Radiant Geospatial Solutions LLC
    Inventor: Richard G. Paxman
  • Patent number: 10122997
    Abstract: Described herein are a system and methods for generating 3D models using imaging data obtained from an array of camera devices. In embodiments, the system may determine a depth or range between an object and the array of camera device. Based on this depth information, the system may automatically identify appropriate framing information for that array of camera devices based on operational constraints. One or more properties of the camera devices in the array of camera devices may then be adjusted in order to obtain image information in accordance with the identified framing information. The object may then be rotated in accordance with the operational constraints and the process may be repeated until a full set of images has been obtained.
    Type: Grant
    Filed: May 3, 2017
    Date of Patent: November 6, 2018
    Assignee: LOWE'S COMPANIES, INC.
    Inventors: Mason E. Sheffield, Oleg Alexander
  • Patent number: 10118005
    Abstract: Provided herein is a delivery system, including: (a) an optical sensor configured to detect data to create a map of a patient bodily surface; and (b) a dispenser operatively associated with the optical sensor and configured to deliver compositions (optionally including cells) to the patient bodily surface based upon the data or map. Methods of forming a tissue on a patient bodily surface of a patient in need thereof are also provided, as are methods, systems and computer program products useful for processing patient bodily surface data.
    Type: Grant
    Filed: September 6, 2013
    Date of Patent: November 6, 2018
    Assignee: WAKE FOREST UNIVERSITY HEALTH SCIENCES
    Inventors: James J. Yoo, Anthony Atala, Kyle W. Binder, Mohammad Z. Albanna, Weixin Zhao, Dennis Dice, Tao Xu
  • Patent number: 10105199
    Abstract: An optical system comprises a detector to determine one or more intensities of light impinging on one or more locations of the detector and an optical element to redirect light towards the detector along a detection axis. The detector and optical element are coupled together by three or more substantially flat flexures respectively defining three or more flexure planes parallel to the detection axis. The three or more substantially flat flexures prevent rotational movement of the optical element with respect to the detector with changes in temperature.
    Type: Grant
    Filed: October 6, 2016
    Date of Patent: October 23, 2018
    Assignee: Align Technology, Inc.
    Inventor: Rami Boltanski
  • Patent number: 10101153
    Abstract: The invention relates to a method for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data. A surface description, at least portions of which are parametric, is generated as a target surface model using the specified reference data, and the comparison is carried out using the target surface model and the measured data. The invention likewise relates to a device for detecting deviations of an object surface using a comparison between measured data of the surface and specified reference data.
    Type: Grant
    Filed: July 25, 2013
    Date of Patent: October 16, 2018
    Assignee: INB Vision AG
    Inventors: Bernd Michaelis, Tilo Lilienblum, Sebastian Von Enzberg
  • Patent number: 10094656
    Abstract: Provided is a chromatic confocal sensor including: a first light source that emits measurement light including a plurality of light beams having different wavelengths; a second light source that emits a visible light beam having a predetermined wavelength; an optical head that causes incident light to be converged at a focal position corresponding to a wavelength of the incident light and outputs reflection light reflected by an object to be measured at the focal position; a position calculation section that calculates a position of the object to be measured on the basis of the reflection light output by the optical head; and a switching section that selectively switches between a first operation in which only the measurement light enters the optical head and a second operation in which at least the visible light beam enters the optical head.
    Type: Grant
    Filed: January 27, 2017
    Date of Patent: October 9, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Norihiko Masuda, Koji Kubo
  • Patent number: 10068350
    Abstract: The present invention provides a measurement apparatus for measuring at least one of a position and an attitude of a work using an image obtained by capturing the work onto which pattern light having periodically arrayed lines is projected, including a determination unit configured to determine, based on luminance information about a period direction of luminance unevenness generated, due to periodic shape unevenness of the work, in the image obtained by an image capturing unit, a base-line direction defined by a relative tilt direction between an optical axis of a projection unit and an optical axis of the image capturing unit with respect to the work so that a period direction of the pattern light is different from a period direction of the shape unevenness of the work.
    Type: Grant
    Filed: December 7, 2016
    Date of Patent: September 4, 2018
    Assignee: CANON KABUSHIKI KAISHA
    Inventor: Akihiro Yamada
  • Patent number: 10048201
    Abstract: A microscope is disclosed, the microscope having a light source defining an optical axis along a Z direction and a detector disposed in X-Y direction, orthogonal to the optical axis, the detector configured to capture images of an object. The microscope includes a fluid channel having an inlet and an outlet configured with a fluid flow to transport the object from the inlet to the outlet. The detector is configured to capture a plurality of images of the object as the object moves from the inlet to the outlet. The plurality of images of the object may have different heights of the sample with respect to the detector as the sample flows through the channel. The channel may be tilted with respect to the optical axis. The detector may be tilted with respect to the optical axis.
    Type: Grant
    Filed: September 10, 2013
    Date of Patent: August 14, 2018
    Assignee: THE TRUSTEES OF PRINCETON UNIVERSITY
    Inventors: Jason W. Fleischer, Nicolas C. Pegard
  • Patent number: 10041927
    Abstract: An optical sensor including an abutment part configured to abut one edge of an object to be measured, a wall extending along a side of the object to be measured and having a first opening to pass light emitted to the object to be measured, and a first concave portion formed between the first opening and the abutment part on a side of the wall to position the object to be measured. A paper-type discrimination device including the optical sensor, and a controller configured to discriminate a paper type of the object using the reflection light from the object measured by the optical sensor. An image forming apparatus including the optical sensor or the paper-type discrimination device.
    Type: Grant
    Filed: September 15, 2016
    Date of Patent: August 7, 2018
    Assignee: Ricoh Company, Ltd.
    Inventors: Kazuma Goto, Fumikazu Hoshi, Yoshihiro Oba
  • Patent number: 10043321
    Abstract: An apparatus and method for editing three-dimensional (3D) building data. The apparatus for editing the 3D building data includes an input unit configured to obtain 3D scan data of a building, and a processor configured to divide the obtained 3D scan data of the building in units of construction components.
    Type: Grant
    Filed: August 15, 2016
    Date of Patent: August 7, 2018
    Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
    Inventors: Ji Hyung Lee, Jae Woo Kim, Man Hee Lee, Kyung Kyu Kang, Chang Joon Park
  • Patent number: 10036631
    Abstract: In some embodiments, a system for measuring surface features may include a patter projector, at least one digital imaging device, and an image processing device. The pattern projector may project, during use, a pattern of light on a surface of an object. In some embodiments, the pattern projector moves, during use, the pattern of light along the surface of the object. In some embodiments, the pattern projector moves the pattern of light in response to electronic control signals. At least one of the digital imaging devices may record, during use, at least one image of the projected patter of light. The image processing device which, during use, converts projected patterns of light recorded on at least one of the images to three-dimensional data points representing a surface geometry of the object using relative positions and relative angles between the at least one imaging device and the pattern projector.
    Type: Grant
    Filed: May 1, 2013
    Date of Patent: July 31, 2018
    Assignee: Texas Department of Transportation
    Inventor: Yaxiong Huang
  • Patent number: 9983663
    Abstract: A vision sensor includes a sensor assembly and a dedicated microprocessor. The sensor assembly includes a pixel array and a lens assembly that is optically coupled with the pixel array. The lens assembly has an F#<2, a total track length less than 4 mm, and a field of view of at least +/?20 degrees. The dedicated microprocessor is configured to perform computer vision processing computations based on image data received from the sensor assembly and includes an interface for a second processor.
    Type: Grant
    Filed: May 15, 2015
    Date of Patent: May 29, 2018
    Assignee: QUALCOMM Incorporated
    Inventors: Ying Zhou, Li-Ping Wang
  • Patent number: 9984212
    Abstract: Methods, apparatus, application specific integrated circuits (ASIC)s and other embodiments associated with analyzing a cancerous prostate using group-sparse non-negative canonical correlation analysis (GNCCA) with a variable importance in the projections (VIP) score are described. One example apparatus includes a set of logics that acquires a set of features from a plurality of feature views of a region of tissue demonstrating cancerous pathology, produces a ranked set of discriminative features using GNCCA with the VIP score, optimizes computation of the GNCCA using a vector-block coordinate descent (BCD) approach, and provides a prostate cancer (CaP) grade or a biochemical recurrence (BcR) score based on the set of discriminative features. Embodiments of example apparatus may generate and display the CaP grade, BcR score, or set of discriminative features.
    Type: Grant
    Filed: February 3, 2015
    Date of Patent: May 29, 2018
    Assignee: Case Western Reserve University
    Inventors: Anant Madabhushi, Haibo Wang
  • Patent number: 9947600
    Abstract: In an embodiment, a semiconductor structure includes a support substrate comprising a surface adapted to support epitaxial growth of a Group III nitride, one or more epitaxial Group III nitride layers arranged on the surface and supporting a plurality of transistor devices assembled upon the support substrate, and a test structure formed in a Group III nitride layer. The test structure includes a plurality of trenches configured to provide an optical diffraction grating when illuminated by UV light. The trenches have a parameter corresponding to a parameter of a feature of the transistor devices.
    Type: Grant
    Filed: June 14, 2017
    Date of Patent: April 17, 2018
    Assignee: Infineon Technologies Austria AG
    Inventors: Franz Heider, Bernhard Brunner, Clemens Ostermaier