Abstract: In an embodiment, a distortion-measuring apparatus for measuring a distortion distribution of an entire vitreous silica crucible in a non-destructive way includes: a light source 11; a first polarizer 12 and a first quarter-wave plate 13 disposed between the light source 11 and an outer surface of a vitreous silica crucible wall; a camera 14 disposed inside of a vitreous silica crucible 1; a camera control mechanism 15 configured to control a photographing direction of the camera 14; a second polarizer 16 and a second quarter-wave plate 17 disposed between the camera 14 and an inner surface of the vitreous silica crucible wall. An optical axis of the second quarter-wave plate 17 inclines 90 degrees with respect to the first quarter-wave plate 13.

Abstract: Disclosed are a mobile terminal and controlling method thereof. The mobile terminal including components capable of executing a first function, executing a second function and displaying an execution screen associated with the second function on a touchscreen. The mobile terminal components are further capable of determining whether the mobile terminal has been tilted by an amount that exceeds a first threshold, and when it is determined that the mobile terminal has been tilted by an amount that exceeds the first threshold, displaying the execution screen associated with the second function and an execution screen associated with the first function, determining whether a touch input to the touchscreen occurs while the execution screen associated with the second function and the execution screen associated with the first function are displayed, and displaying the execution screen associated with the first function when it is determined that the touch input has occurred.

Abstract: Embodiments for estimating a surface texture of a tooth are described herein. One method embodiment includes collecting a sequence of images utilizing multiple light conditions using an intra-oral imaging device and estimating the surface texture of the tooth based on the sequence of images.

Abstract: Methods, apparatus, and systems for automated reflector tuning include combining high precision automated photogrammetric measurement with high precision servo actuator positioning control of a reflector surface using custom optimizing control software to produce a novel, fully automated satellite reflector alignment tuning system. Precise adjustment to the shape of the reflecting surface of an antenna reflector (reflector tuning) can be essential for a satellite reflector antenna to meet electrical performance requirements, usually requiring a shape accurate to within 0.004 inches RMS. The automated reflector tuning may include determining a set of characterization coefficients by precisely measuring the response of the reflector shape to actuator movements, and using the characterization coefficients in a mathematical analysis to determine optimal actuator movements to achieve a required shape of the reflector surface.

Abstract: A pattern of symbols is generated and sent to a projector, wherein the pattern includes an array of symbols having a given number of symbol columns and symbol rows, and an image is obtained from a camera. Next the image is decoded in order to generate a decoded pattern of symbols and the depth map is generated as a function of the pattern and the decoded pattern. The image is decoded by placing an array of classification windows on the image and determining the displacement of each classification window in order to optimize a given cost function. Finally, the decoded pattern is generated by determining a respective symbol for each classification window.

Abstract: An endoscope apparatus includes an endoscope that includes an imaging section that captures an object, and an illumination section that includes an irradiation port that illuminates the object, the imaging section and the illumination section being provided in an end section of the endoscope, a distance information acquisition section that acquires distance information about a distance from the end section of the endoscope to the object, a light distribution pattern determination section that determines a light distribution pattern of illumination light applied from the illumination section based on the acquired distance information, and a gradation correction section that performs a gradation correction process on a captured image acquired by the imaging section.

Abstract: A method for measuring and registering 3D coordinates has a 3D scanner measure a first collection of 3D coordinates of points from a first registration position and a second collection of 3D coordinates of points from a second registration position. In between these positions, the 3D scanner collects 2D camera images. A processor determines first and second translation values and a first rotation value based on the 2D camera images. The processor adjusts the second collection of points relative to the first collection of points based at least in part on the first and second translation values and the first rotation value. The processor identifies a correspondence among registration targets in the first and second collection of 3D coordinates, and uses this correspondence to further adjust the relative position and orientation of the first and second collection of 3D coordinates.

Abstract: In a desktop three-dimensional scanner for dental use of the related art, a two-axis rotation motion unit, on which a target object can be placed and rotated in order to image the entire shape of the target object, is coupled to the scanner, and thus, when a subject is placed on the imaging stage and is rotated along the horizontal axis of rotation of the stage, the subject is dropped from the stage by gravity after being inclined, and accordingly, additional fixing means or a receiving jig should be placed on the stage together with the subject to prevent same. In such a case, inconvenience is caused because the target objects to be scanned have various shapes and the fixing means or receiving jigs should fit the shapes thereof.

Abstract: A method for measuring and registering 3D coordinates has a 3D scanner measure a first collection of 3D coordinates of points from a first registration position. A 2D scanner collects horizontal 2D scan sets as 3D measuring device moves from first to second registration positions. A processor determines first and second translation values and a first rotation value based on collected 2D scan sets. 3D scanner measures a second collection of 3D coordinates of points from second registration position. Processor adjusts second collection of points relative to first collection of points based at least in part on first and second translation values and first rotation value. Processor identifies a correspondence among registration targets in first and second collection of 3D coordinates, and uses this correspondence to further adjust the relative position and orientation of first and second collection of 3D coordinates.

Abstract: Provided is a shape measuring apparatus that is capable of suppressing adverse effects on measurement accuracy. A probe is provided with an illumination optical system that irradiates an object with light and an image capturing device that detects light reflected by the object. A rotation mechanism that rotates the probe is disposed at a position distanced from a rotation axis line. Attitude of the probe) relative to the object can be changed in accordance with the rotation of the probe. Signals detected by the image capturing device are calculated by a shape information acquisition unit.

Abstract: In an embodiment, a method for evaluating a surface of a semiconductor substrate includes directing an incident light beam having multiple wavelengths at a position of a layer having a surface profile configured to form an optical diffraction grating, the layer including a Group III nitride, detecting a reflected beam, reflected from the position, and obtaining a spectrum of reflected intensity as a function of wavelength, the spectrum being representative of the surface profile of the position of the layer from which the beam is reflected, comparing the spectrum obtained from the detected beam with one or more reference spectra stored in memory, and estimating at least one parameter of the surface profile.

Abstract: An inspection apparatus for simultaneous dark field (DF) and differential interference contrast (DIC) inspection includes an illumination source and a sample stage configured to secure a sample. The inspection apparatus includes a first sensor, a second sensor and an optical sub-system. The optical sub-system includes an objective, one or more optical elements arranged to direct, through the objective, illumination from the one or more illumination sources to a surface of the sample. The objective is configured to collect a signal from the surface of the sample, wherein the collected signal includes a scattering-based signal and/or a phase-based signal from the sample. The inspection apparatus includes one or more separation optical elements arranged to spatially separate the collected signal into a DF signal and a DIC signal by directing the DF signal and the DIC signal along a DF path and DIC path respectively.

Abstract: A substrate processing apparatus has a process chamber, a long-shaped window on a wall surface of the process chamber, an irradiator configured to irradiate a first laser beam and a second laser beam to a substrate in the process chamber via the long-shaped window so that incident points of the first and second laser beams are aligned substantially along a long side direction of the window, a detector configured to have a light reception surface receiving the first and second laser beams reflected by the substrate and passing through the window, the detector being configured to detect incident positions of the first and second laser beams on the light reception surface, and a calculator configured to calculate a curvature of the substrate by using a relative position of the first laser beam and the second laser beam which are detected by the detector.

Abstract: An apparatus for determining surface topology of a portion of a three-dimensional structure is provided, that includes a probing member, an illumination unit, a light focusing optics, a translation mechanism, a detector and a processor.

Abstract: A method for estimating values for a set of parameters of an imaging system is presented. At least two pictures having an overlapping area are taken with the imaging system from different positions. Pulses are sent out to the area, the reflected pulses are detected and distances between a sender of the pulses and the respective point where the pulses were reflected are calculated based on the travel time of the pulses. First information about the area is calculated based on the pictures. Second information related to the calculated distances to the area is also calculated. Values for quantities contained in the first and second information are compared. If the value for a quantity obtained from the first information differs from the value obtained from the second information, values and/or an error estimate for the set of parameters of the imaging system is calculated based on the difference.

Abstract: An ellipsometer includes a stage, a light source, a polarizer, a detector, and a processor. The stage is configured to support a substrate including a pattern. The light source is configured to emit illumination toward the substrate. The polarizer is configured to polarize the illumination. The detector is configured to generate, in association with a plurality of azimuthal angles, data corresponding to polarized illumination reflected from the substrate. The processor is configured to: control rotation of the stage in association with sequential inspection of the pattern at the plurality of azimuthal angles, and determine asymmetry of the pattern based on the data. Each azimuthal angle of the plurality of azimuthal angles corresponds to a different rotational state of the stage.

Abstract: A system and method for calibrating a barcode scanning tunnel comprises providing a scanning tunnel having a moveable surface, a camera, and a dimensioning device. Orientations of the dimensioning device and camera are estimated. Instances of a calibration object on the moveable surface are acquired by the dimensioning device and the camera, and a relationship is defined between the two devices. A calibration object is moved along the moveable surface through the devices' fields of view, controlling the camera's focal distance according to the relationship, so that the dimensioning device and the camera acquire instances of the calibration object, and the relationship is revised.

Abstract: Provided are methods and inspection systems for evaluating height deviations on surfaces of composite structures. The method is based on obtaining multiple linear height profiles of a surface and generating a three-dimensional representation of that surface. This representation is then analyzed to determine various height deviations, such as wrinkles. The three-dimensional surface representation is generated based on position of each linear height profile on the surface. The analysis may be performed along any direction, which may be different than the inspection directions of to the linear height profiles. As such, height information from multiple height profiles is analyzed at the same time. This approach increases the quality of inspection and ensures that different types of height variations can be identified, which may be missed with individual analysis of each linear height profile. Furthermore, this approach allows using high precision linear height detectors, such as laser profilers.

Abstract: A method and system are presented for use in controlling a process applied to a patterned structure having regions of different layered stacks. The method comprises: sequentially receiving measured data indicative of optical response of the structure being processed during a predetermined processing time, and generating a corresponding sequence of data pieces measured over time; and analyzing and processing the sequence of the data pieces and determining at least one main parameter of the structure.

Abstract: A method for improving computation efficiency for diffraction signals in optical metrology is described. The method includes simulating a set of spatial harmonics orders for a grating structure. The set of spatial harmonics orders is truncated to provide a first truncated set of spatial harmonics orders based on a first pattern. The first truncated set of spatial harmonics orders is modified by an iterative process to provide a second truncated set of spatial harmonics orders based on a second pattern, the second pattern different from the first pattern. Finally, a simulated spectrum is provided based on the second truncated set of spatial harmonics orders.

Abstract: In some methods, a number of input data sets is provided for an integrated circuit (IC) model. A number of scores for the number of input data sets, respectively, are then determined based on probabilities of the respective input data sets resulting in a failure condition, which exists when the IC model fails to meet a predetermined yield criteria. A simulation order for the number of input data sets is then assigned according to the determined number of scores.

Abstract: A binarization processing unit generates a binary image by comparing the visual feature of each pixel of an input image with a predetermined binarization threshold and binarizing the value of each pixel of the input image based on the comparison result. The binarization processing unit performs this process while changing the binarization threshold, thereby generating a plurality of binary images. A contour detecting unit calculates the area of a closed region having an overlap between the plurality of binary images, and determines the binarization threshold to be used for detecting a boundary of the corresponding closed region as a contour of an object, based on the area change rate of the corresponding closed region caused by changing the binarization threshold.

Abstract: A machine vision system including a digital camera can be employed to inspect an object in a field of view. This includes projecting digitally-generated light patterns including first and second boundary patterns and first and second spatial patterns onto the object in the field of view. Images associated with the projected light patterns including the object are captured. Spatial cells are found in the field of view by matching codes in the first and second spatial patterns to boundaries determined based upon one of the first and second boundary patterns. The spatial cells are found in the field of view by matching codes in the spatial patterns to boundaries determined based upon the boundary patterns. The spatial cells are decoded and matched to the boundaries. Three-dimensional (3D) point cloud data of the object is generated based upon the decoded spatial cells matched to the boundaries.

Abstract: A system for performing object identification combines pose determination, EO/IR sensor data, and novel computer graphics rendering techniques. A first module extracts the orientation and distance of a target in a truth chip given that the target type is known. A second is a module identifies the vehicle within a truth chip given the known distance and elevation angle from camera to target. Image matching is based on synthetic image and truth chip image comparison, where the synthetic image is rotated and moved through a 3-Dimensional space. To limit the search space, it is assumed that the object is positioned on relatively flat ground and that the camera roll angle stays near zero. This leaves three dimensions of motion (distance, heading, and pitch angle) to define the space in which the synthetic target is moved. A graphical user interface (GUI) front end allows the user to manually adjust the orientation of the target within the synthetic images.

Abstract: Aspects of the present disclosure relate generally to non-contact coordinate measuring systems, apparatuses, and methods. An apparatus according to the present disclosure can include a laser assembly slidably coupled to a track and configured to emit a first laser beam onto an exterior surface of a component, wherein the track is coupled to a machine for manufacturing the component; a laser encoder configured to detect the first laser beam emitted from the laser assembly and reflected from the exterior surface of the component; and a computer system coupled to the laser encoder and configured to render a geometric profile of the exterior surface of the component based on the first laser beam detected with the laser encoder.

Abstract: A digitizing projector system is configured in a single housing and comprises a digitizer and a projector. The position of the scanner and projector relative to each other are known by a software function. A scanner projector system has a digitizer configured to scan any shaped object or scene to produce a digitized scaled 3D digital image or digitized file. The software will identify surfaces including planar and non-planar surfaces, geometric surfaces and shapes, irregular surfaces, edges and noisy surfaces. A projected image may comprise one or more image files that are projected onto one or more identified surfaces of the object. A user may edit an image file in shape, color, orientation, and may input motion effects or dynamic functions of the image. The digitizing projector system may be self-calibrated for are offset in position from a first location to a second location.

Abstract: An information processing apparatus configured to estimate a position and orientation of a measuring object using an imaging apparatus includes an approximate position and orientation input unit configured to input a relative approximate position and orientation between the imaging apparatus and the measuring object, a first position and orientation updating unit configured to update the approximate position and orientation by matching a three-dimensional shape model to a captured image, a position and orientation difference information input unit configured to calculate and acquire a position and orientation difference amount of the imaging apparatus relative to the measuring object having moved after the imaging apparatus has captured an image of the measuring object or after last position and orientation difference information has been acquired, and a second position and orientation updating unit configured to update the approximate position and orientation based on the position and orientation difference

Abstract: A wavefront sensor is integrated with a surgical microscope for allowing a doctor to make repeated wavefront measurements of a patient's eye while the patient remains on an operating table in the surgical position. The device includes a wavefront sensor optically aligned with a surgical microscope such that their fields of view at least partially overlap. The inclusion of lightweight, compact diffractive optical components in the wavefront sensor allows the integrated device to be supported on a balancing mechanism above a patient's head during a surgical procedure. As a result, the need to reposition the device and/or the patient between measuring optical properties of the eye and performing surgical procedures on the eye is eliminated. Many surgical procedures may be improved or enhanced using the integrated device, including but not limited to cataract surgery, Conductive Keratoplasty, Lasik surgery, and corneal corrective surgery.

Abstract: A lithographic method of determining a sensitivity of a property of a pattern feature to change in optical aberrations of a lithographic apparatus used to provide that pattern feature. The method includes controlling a configuration of the lithographic apparatus to establish a first aberration state, forming a first image of the pattern feature with that lithographic apparatus when the lithographic apparatus is in that first aberration state, measuring a property of the image, controlling a configuration of the lithographic apparatus to establish a second, different, aberration state, forming an image of the same pattern feature with that lithographic apparatus when the lithographic apparatus is in that second aberration state, measuring a same property of the image, and using the measurements to determine the sensitivity of the property of the pattern feature to changes in the aberration state.

Abstract: A system and method for scanning items for purchase in a retail environment is provided that has the ability to scan multiple items within its scan field of view simultaneously or nearly simultaneously in a multi-scanning type of configuration. In addition to the simultaneous scanning, the identity of each scanned item is discovered and then added to a running tally of items to be later purchased in a point of sale terminal.

Abstract: A device for determining the surface topology and associated color of a structure, such as a teeth segment, includes a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associate color of a structure is also provided.

Abstract: A method of determining wear of a worn surface of a machine component includes providing a scanning device at a distance from the worn surface. The method also includes moving at least one of the scanning device and the worn surface relative to the other and generating a set of data points via the scanning device. Each data point of the set of data points is indicative of a depth of a corresponding point on the worn surface relative to a reference plane. The method further includes determining a maximum depth of the worn surface based on the set of data points and comparing the maximum depth to a reference value to determine a next step in a remanufacturing process of the machine component.

Abstract: Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.

Abstract: There is provided a light detection system which is capable of determining in light embedded codes by detecting light in a scene which is illuminated by an illumination system (110) comprising one or more light sources (111,112,113) each providing a light contribution (I111, I112, I113) comprising an embedded code (ID#1, ID#2, ID#3) emitted as a temporal sequence of modulations in a characteristics of the light emitted. The light detection system comprises light detection means (220), which are arranged for acquiring at least one image of the scene, where the image is acquired a plurality of temporal shifted line instances. Each line of the acquired image comprises an instance of the temporal sequence of modulations of the first embedded code. The light detection system further comprises means (230) for determining embedded codes from the spatial pattern of modulations.

Abstract: A method for obtaining a refined pose for a 3D sensor for online 3D modeling of a surface geometry of an object, the pose encompassing six degrees of freedom (DOF) including three translation parameters and three orientation parameters, the method comprising: providing the 3D sensor, the 3D sensor being adapted to capture 3D point measurements of the surface of the object from a viewpoint; providing a geometry model of at least part of the surface; observing a portion of the surface of the object with the 3D sensor; measuring an initialization pose for the 3D sensor by at least one of positioning device pose measurement, predicted pose tracking and target observation; finding a best fit arrangement of the 3D point measurements in the geometry model using the initialization pose; generating the refined pose for the 3D sensor using the best fit arrangement.

Abstract: An apparatus for inspecting a turbomachine includes a plurality of horoscopes, a device to rotate the rotor of the turbomachine and a processor having reference measurements of the rotor blades and/or reference measurements between the rotor blades and the horoscopes. A boroscope is inserted in a casing aperture upstream of the blades to view the leading edge and a portion of one of the surfaces of each blade as the rotor is rotated. A boroscope is inserted in a casing aperture downstream of the blades to view the trailing edge and a portion of one of the surfaces of each blade as the rotor is rotated. The boroscopes supply the images of each of the blades to the processor. The processor analyzes the images of the blades and uses the reference measurements to determine the position and size of any defect on any of the rotor blades.

Abstract: The invention relates to a solvent-based separation method for the total material recycling of materials used in nonwoven, woven, and tufted wares into the individual material components thereof sorted by type. At least one of the materials contains a polyolefin wax. As a solvent and/or swelling agent, halogen-free, aliphatic hydrocarbons or aromatic hydrocarbons or a mixture of one or several of said solvents are used.

Abstract: Optical system for reading structurally distinct microbeads. The microbeads are encoded and provide output light signals onto a Fourier plane when illuminated by an incident light. The system includes an input light source configured to illuminate the structurally distinct microbeads thereby providing the output light signals. The output light signals are configured to be projected onto the Fourier plane in a readable manner. The system also includes a reading device that is positioned to detect the output light signals from the Fourier plane. The input light source and the reading device are configured to automatically illuminate the microbeads and detect the output light signals in a predetermined manner. The system also includes a processor configured to perform Fourier plane analysis of the output light signals to determine corresponding codes of the microbeads.

Abstract: A system for measuring a deflection has a base, a first laser directed downwardly toward an underlying surface at an acute angle, a second laser in spaced relation to the first laser and directed downwardly toward the underlying surface at an approximately vertical angle, a third laser affixed to the base in spaced relation to the second laser and directed downwardly toward the underlying surface at an acute angle in a direction toward the second laser, a camera directed toward the points of reflectance of the lasers with the underlying surface, and a processor cooperative with the camera so as to measure a distance between the points of reflectance of the first and second lasers and measuring the distance between the points of reflectance of the second and third lasers. The processor compares the measured distances so as to produce an angle of deflection of the underlying surface.

Abstract: A method of projecting a template on a workpiece provides a measurement system for determining a location of a workpiece and a laser projector for projecting a laser template. A feature on the workpiece having geometric significance is identified. A physical location of the feature in a three dimensional coordinate system is determined and compared to a theoretical location of the feature on computer model of the workpiece. A template correlated to the feature is selected. The projection of the template onto the workpiece relative to the feature is optimized by correlating alignment of the physical location of the feature with the computer model of the feature. The template is projected onto the workpiece based upon the optimized projection for directing work to be performed on the workpiece.

Abstract: A LiDAR system and method are disclosed, comprising a housing, a light source, a receiver, and a light deflection system comprising a light deflection element, rotatable and balanced about an axis, the element having at least three sides, at least two of the three sides having reflective surfaces, wherein at least a first side of the three sides is at a first angle in relation to the axis, and at least a second side of the three sides is at a second angle in relation to the axis, with the first angle being different from the second angle, such that light is deflectable from the reflective surface of the first and second sides out of the housing, whereby upon actuation of the light source and rotation of the light deflection element, the LiDAR system forms at least a first scan path and a second scan path.

Abstract: Described is an apparatus, including computer program products, for adjusting the focus of an image capturing device. An apparatus for capturing a focused digital image of a scene includes a lens having an optical surface including a deformation that is asymmetric with respect to an optical axis of the lens, and an aperture component configured to adjust a position of the aperture stop of the lens on a plane that is substantially perpendicular to the optical axis of the lens. The apparatus includes an image sensor configured to capture a digital image of an optical image formed by the lens, the digital image being defocused based on the position of the aperture stop. The apparatus includes a digital image processor configured to generate a focused digital image based on the digital image captured by the image sensor.

Abstract: A system and method for auto-calibrating a barcode scanning tunnel to determine the orientation of one or more cameras with respect to a range finder and a conveyor belt comprises providing a scanning tunnel having a moveable surface, at least one range finder having an orientation, at least one camera having an orientation and at least one calibration object having at least one indicia disposed in a predetermined relationship to one or more features of the at least one calibration object, capturing at least one image of the at least one calibration object by the at least one camera, electronically detecting the at least one calibration object at least one indicia and the one or more object features and electronically calculating at least one component of the at least one camera orientation with respect to the moveable surface in response to information obtained from the image and the at least one calibration object at least one indicia.

Abstract: Systems and methods for conducting autonomous underwater inspections of subsea and other underwater structures using a 3D laser mounted on an underwater platform such as AUV, an ROV or a tripod. The systems and methods described herein can be used for scanning underwater structures to gain a better understanding of the underwater structures, such as for example, for the purpose of generating a 3D virtual model of the underwater structure. The 3D virtual model can be used for many purposes including, but not limited to, directing inspection, repair, and manipulation of the underwater structure, navigating around the underwater structure, and other purposes.

Abstract: Apparatus and methods for performing wavefront-based and profile-based measurements of an aspheric surface are disclosed. The apparatus includes an interferometric wavefront measurement system that collects wavefront-based measurement data of the aspheric surface. The apparatus also includes a profile measurement system that performs at least one non-contact profile-based measurement of the aspheric surface to collect profile-based measurement data of the aspheric surface. The measurements are performed without removing the aspheric element from a rotatable base. The two measurements are then used to form a combined measurement of the aspheric surface.

Abstract: A test device and a rotation module thereof are provided. The rotation module includes a rotation body and a sleeve. The rotation body includes a shaft, a first tube element, and a second tube element. The shaft is pivoted in the housing, and has an annular protrusion. The first tube element and the second tube element are sleeved on the shaft respectively, and the second tube element is located between the first tube element and the annular protrusion. The sleeve is slidably disposed on the rotation body. When the sleeve moves between a first position and a second position back and forth, the second tube element is driven to rotate back and forth relative to the first tube element. The annular protrusion is respectively driven by second tube element and the sleeve drive the annular protrusion so that the shaft rotates relative to the first tube element.

Abstract: An apparatus comprises: extraction means for extracting an occluded region in which illumination irradiated onto the target object is occluded in an obtained two-dimensional image; projection means for projecting a line segment that constitutes a three-dimensional model onto the two-dimensional image based on approximate values of position/orientation of the target object; association means for associating a point that constitutes the projected line segment with a point that constitutes an edge in the two-dimensional image; determination means for determining whether the associated point that constitutes an edge in the two-dimensional image is present within the occluded region; and measurement means for measuring the position/orientation of the target object based on a distance on the two-dimensional image between the point that constitutes the projected line segment and the point that constitutes the edge, the points being associated as the pair, and a determination result.

Abstract: A wavefront aberration measuring method forms a plurality of spot images by causing light, which is transmitted through a test optical system, to be incident on a lenslet array, and measures positions of the spot images. Optical paths from the positions of the measured spot images toward a light source are calculated, parameters of the test optical system when light rays from the positions of the spot images converge at the light source are specified, and a wavefront aberration of the test optical system corresponding to the parameters of the test optical system is calculated.

Abstract: An apparatus and method for optical coherence tomography are provided. The apparatus includes a light source configured to generate a plurality of beams, a light coupler configured to split the plurality of beams into measurement beams and reference beams, transmit the measurement beams to a target object via a probe, and receive response beams from the probe, a detector configured to detect interference signals based on interference between the response beams and the reference beams, and an image processor configured to generate a first image of the target object based on any one of the interference signals and generate a second image of the target object having image characteristics different from those of the first image based on an other one of the interference signals.

Abstract: A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples.