Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

Abstract: Systems and methods herein provide improved, high-throughput multiphoton imaging of thick samples with reduced emission scattering. The systems and methods use structured illumination to modify the excitation light. A reconstruction process can be applied to the resulting images to recover image information free of scattering. The disclosed systems and methods provide high throughput, high signal-to-noise ratio, and high resolution images that are depth selective.

Abstract: This disclosure includes an imaging system that is configured to image in parallel multiple focal planes in a sample uniquely onto its corresponding detector while simultaneously reducing blur on adjacent image planes. For example, the focal planes can be staggered such that fluorescence detected by a detector for one of the focal planes is not detected, or is detected with significantly reduced intensity, by a detector for another focal plane. This enables the imaging system to increase the volumetric image acquisition rate without requiring a stronger fluorescence signal. Additionally or alternatively, the imaging system may be operated at a slower volumetric image acquisition rate (e.g., that of a conventional microscope) while providing longer exposure times with lower excitation power. This may reduce or delay photo-bleaching (e.g., a photochemical alteration of the dye that causes it to no longer be able to fluoresce), thereby extending the useful life of the sample.

Abstract: Light Sheet Theta (LS-0) Microscopy achieves large sample imaging capabilities without affecting the imaging depth or the image quality. An optical layout places a detection objective normal to the sample surface, while placing the illumination objectives that generate light sheets at an angle (theta) significantly smaller than 90 degrees. In this configuration, the light sheets enter from same side of the sample as the detection objective. The intersection of the light-sheet and the detection focal plane results in a line illumination-detection profile that is discriminated by a camera.

Abstract: An optical microscope device includes: a first illumination optical system including a light source that emits illumination light for illuminating a specimen an LCOS spatial light modulation element that controls a polarization state of the illumination light, a first illumination optical member that uniformly illuminates the LCOS spatial light modulation element, and a polarization optical element that controls a transmission state of the illumination light directed to the specimen from the LCOS spatial light modulation element in response to the polarization state of the illumination light; a second illumination optical system including a second illumination optical member that images a light flux from the first illumination optical system on a specimen surface; and an imaging optical system for imaging the specimen surface.

Abstract: Provided are methods, devices, assemblies, and systems for dispensing into the wells of a multi-well device and imaging such wells from multiple Z-planes. Multi-Z imaging of the present methods and systems may allow for the detection of wells of a multi-well device that contain a desired number of cells. Also provided are methods, devices, assemblies, and systems for processing cell-containing wells of a multi-well device identified through the use of multi-Z imaging.

Abstract: Systems and methods for simulating animation of an object are provided. Such systems and methods include capturing a first sequence of images of the object with a camera while in an activated lighting apparatus, importing the first sequence of images into a first stage video file having a preconfigured size and masked off such that the first surface appears over a first background, and incorporating the first stage video file into a template of a three-dimensional (3D) model by aligning the first surface with a video mask of the template such that the video mask obscures the first background of the first stage video file and superimposes a location of the first surface in the first stage video file onto a virtual surface of the 3D model.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to modulate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

Abstract: A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that includes artifacts or empty space. The imaging process may include a higher resolution process to output higher resolution portions of the computational image for sample regions including valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions including valid sample material.

Abstract: A STED super-resolution microscope capable of quick beam combination is disclosed, which includes a STED imaging unit and a beam combination test unit. The excitation light and the depletion light are accurately combined by the beam combination test unit, so that the imaging light spots of the two light beams passing through the STED imaging unit can accurately coincide with each other, thereby obtaining a better super-resolution imaging effect.

Abstract: Finger grip and connector for portable electronics, in particular cell phones. The grip includes a metallic ring. The ring adheres to the back of a cell phone, or case. The grip includes a corresponding ring of magnets for a grip assembly to magnetically attach to the metal ring adhered to the cell phone. The grip design provides infinite rotation of the grip assembly relative to the phone for holding the phone in various positions. The grip provides a support for viewing content on the electronic device at different angles and orientations. The grip provides a means of magnetically attaching a cell phone to metallic surfaces, chargers, mounts, and other devices. The grip can allow for wireless charging, which is optimized and enabled by a relatively large open inner diameter of the metallic ring and corresponding magnets. The grip can retract to be less than 3 millimeters in total thickness.

Abstract: A method is useful for generating an overview image using a high-aperture objective. An optical detection beam path with the objective is provided. The path is transferred into a second operating state via a first depth of field increased to a second depth of field. Detection radiation is captured in the second operating state. Detection radiation coming from the sample space is collected by the objective, guided along the path, and captured by a detector sensitive to detection radiation as an image with a lateral image field, which is the same in the first and second operating states.

Abstract: A sample is imaged using light-sheet imaging. The light-sheet imaging includes generating light, forming one or more light sheets from the light at one or more positions within the sample along respective illumination directions that are parallel with an illumination axis, and recording images of fluorescence emitted along a detection direction from the sample due to the optical interaction between the one or more light sheets and the sample. One or more properties relating to the light-sheet imaging are measured; the one or more measured properties are analyzed; and one or more operating parameters associated with the light-sheet imaging are adjusted based on the analysis of the one or more measured properties.

Abstract: A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

Abstract: A pseudo speckle pattern generation apparatus includes a first spatial light modulator, a first lens, a second spatial light modulator, a second lens and the like. The first spatial light modulator has a first intensity modulation distribution based on a pseudo random number pattern, and spatially modulates intensity of light output from a light source and increased in beam diameter by a beam expander. The second spatial light modulator has a second intensity modulation distribution based on a filter function, is provided on a plane where a Fourier transformed pattern is generated by the first lens, and spatially modulates intensity of the light reached through the first lens. The second lens optically Fourier transforms a pattern of the light output from the second spatial light modulator to generate a Fourier transformed pattern as a pseudo speckle pattern.

Abstract: An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.

Abstract: A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Abstract: An optical system includes a scanning unit, a first lens-element group including at least a first lens element, and a focusing unit which is designed to focus beams onto a focus, wherein the focusing unit includes a second lens-element group including at least a second lens element and an imaging lens. The imaging lens further includes a pupil plane and a wavefront manipulator. The wavefront manipulator is arranged in the pupil plane of the imaging lens or in a plane that is conjugate to the pupil plane, or the scanning unit of the optical system is arranged in a plane that is conjugate to the pupil plane and the wavefront manipulator is arranged upstream of the scanning unit in the light direction. The focus of the second lens-element group lies in the pupil plane of the imaging lens in all focal positions of the focusing unit.

Abstract: A microscope for imaging a sample includes an illumination unit for emitting illumination light to the sample; a detector for capturing a detection light originating from the sample; an optical system for focusing the illumination light onto the sample and focusing the detection light onto the detector; and a scanning unit for scanning the sample using the illumination light. The illumination unit emits the illumination light as separate illumination light beams which can be focused on spatially mutually separated, strip-like sample regions simultaneously. The detector captures the detection light in the form of separate detection light beams originating from the sample regions simultaneously and in a spatially mutually separated manner. The sample regions are in sample planes, and the detector having sub-detectors, which are each assigned to a sample plane and capture a detection light beam that originates from a respective sample plane.

Abstract: A method for high-resolution scanning microscopy of a sample in which a sample is illuminated at a point in or on the sample by means of illumination radiation. The point is imaged along an optical axis and according to a point spread function into a diffraction image on a spatially resolving surface detector that comprises detector pixels in which a diffraction structure of the diffraction image is resolved. The point is displaced relative to the sample in at least two scanning directions and pixel signals are read from the detector pixels in various scanning posi- tions, wherein the pixel signals are respectively assigned to that scanning position at which they were read out and adjacent scanning positions overlap one another and are disposed according to a scanning increment. An image of the sample having a resolution that is increased beyond a resolution limit of the imaging is generated from the read pixel signals and the assigned scanning positions, wherein a deconvolution is carried out.

Abstract: A microscope having three-dimensional imaging capability and a three-dimensional microscopic imaging method are provided, the microscope including: at least one excitation device configured to generate a detectable contrast in a detection target region of a sample which is to be detected, in an excitation principal axis direction; at least one detection device, configured to detect the contrast as generated from the detection target region of the sample in a detection principal axis; and at least one movement mechanism, configured to generate a relative movement of the sample relative to the excitation device and the detection device; the relative movement is in a direction neither parallel to nor perpendicular to the excitation principal axis direction or the detection principal axis direction.

Abstract: Systems for allowing adjustable imaging of specimens of various sizes in solutions of various refractive indices, such as those with a refractive index of at least 1.45, for use in microscopes such as fluorescent light sheet microscopes. The systems allow for imaging large specimens in various refractive indices while maintaining the highest optical sectioning provided by the objectives used across the full range of microscope stage travel. The systems also allow the use of a wider range of optics, such as low magnification 2.5× detection objectives, allowing for increased imaging speed and field of view.

Abstract: A light-scanning microscope including a scan optics for generating a pupil plane conjugate to the pupil plane of the microscope objective, and a variably adjustable beam deflection unit in the conjugate pupil plane. An intermediate image lies between the microscope objective and the scan optics. The scan optics image a second intermediate image (Zb2) into the first intermediate image via the beam deflection unit, wherein the second intermediate image is spatially curved. The deflection unit is not arranged in a collimated section of the beam path, but is instead arranged in a convergent section. Then, in terms of the optical properties and quality thereof, the scan optics needs rather to correspond merely to an eyepiece instead of a conventional scanner objective.

Abstract: Systems and methods are disclosed for preparing and evolving atomic defects in diamond. Silicon vacancy spins may be cooled to temperatures equal to or below 500 mK to reduce the influence of phonons. The cooling, manipulation, and observation systems may be designed to minimize added heat into the system. A CPMG sequence may be applied to extend coherence times. Coherence times may be extended, for example, to 13 ms.

Abstract: Optical coherence tomography (herein “OCT”) based analyte monitoring systems are disclosed. In one aspect, techniques are disclosed that can identify fluid flow in vivo (e.g., blood flow), which can act as a metric for gauging the extent of blood perfusion in tissue. For instance, if OCT is to be used to estimate the level of an analyte (e.g., glucose) in tissue, a measure of the extent of blood flow can potentially indicate the presence of an analyte correlating region, which would be suitable for analyte level estimation with OCT. Another aspect is related to systems and methods for scanning multiple regions. An optical beam is moved across the surface of the tissue in two distinct manners. The first can be a coarse scan, moving the beam to provide distinct scanning positions on the skin. The second can be a fine scan where the beam is applied for more detailed analysis.

Abstract: A scanning microscope multiplexes illumination light beams at different optical wavelengths (e.g., from different light sources) by placing illumination light beams non-coaxially to create separate focuses at specimen. Reflected or fluorescent light generated by the different illumination light beams is recorded simultaneously while scanning the specimen.

Abstract: Methods and apparatus for analysis of nano-objects using wide-field bright field transmission techniques are described. Such methods may comprise acquiring a plurality of images of a sample comprising a plurality of nano-objects using bright field illumination via a continuously variable spectral filter, and identifying a nano-object within the sample in the plurality of images, wherein the position of the nano-object changes between images. Using data extracted from the plurality of images, an extinction cross-section of the identified nano-object may be quantitatively determined.

Abstract: The disclosure provides for structured illumination microscopy (SIM) imaging systems. In one set of implementations, a SIM imaging system may be implemented as a multi-arm SIM imaging system, whereby each arm of the system includes a light emitter and a beam splitter (e.g., a transmissive diffraction grating) having a specific, fixed orientation with respect to the system's optical axis. In a second set of implementations, a SIM imaging system may be implemented as a multiple beam splitter slide SIM imaging system, where one linear motion stage is mounted with multiple beam splitters having a corresponding, fixed orientation with respect to the system's optical axis. In a third set of implementations, a SIM imaging system may be implemented as a pattern angle spatial selection SIM imaging system, whereby a fixed two-dimensional diffraction grating is used in combination with a spatial filter wheel to project one-dimensional fringe patterns on a sample.

Abstract: Presented are a structured illumination microscopy system using a digital micromirror device and a time-complex structured illumination, and an operation method therefor. A structured illumination microscopy system using a digital micromirror device and a time-complex structured illumination according to an embodiment may comprise: a light source; a digital micromirror device (DMD) for receiving light irradiated from the light source, implementing a time-complex structured illumination, and causing a controlled structured illumination to enter a sample; and a fluorescence image measurement unit for extracting a high-resolution 3D fluorescence image of the sample.

Abstract: In a first SCAPE imaging system, a Powell lens (105) is used to expand light from a light source (100) into a sheet of illumination light. An optical system (125,131,132,140) sweeps the sheet of illumination light through a sample (145), and forms an image at a tilted intermediate image plane (170) from detected return light. A camera (190) captures images of the intermediate image plane. In a second SCAPE imaging system, an optical system (125,131,132,140) sweeps the sheet of illumination light through a sample (145), and forms an image at a tilted intermediate image plane (170) from detected return light. A camera (190) captures images of the intermediate image plane. The detection optics are deliberately misaligned with respect to a true alignment position so that a significant portion of light that would be lost at the true alignment position will arrive at the camera.

Abstract: A method of imaging a sample containing a target mineral species is provided. The method includes probing the sample with a pump beam and a Stokes beam having a tunable frequency difference, and detecting an optical response of the sample resulting from a transfer of said modulation between the pump beam and the Stokes beam. The probing is scanned spatially and spectrally, thereby obtaining hyperspectral data. Correlation with a known Raman resonance of the mineral species and with anon Raman-resonant contribution to said optical response allows building an image of the sample mapping different species within the sample.

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: Various embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are herein disclosed.

Abstract: Disclosed herein are an apparatus and method for forming a 3D holographic image using non-periodically structured optical elements. The 3D holographic image apparatus includes a light source configured to radiate light, a spatial light modulator configured to modulate the light projected by the light source, and a non-periodic optical element configured to modulate incident light by refracting, diffracting or reflecting the direction of the incident light in a plurality of directions when the light modulated by the spatial light modulator is incident. A 3D holographic image may be formed based on the light modulated by the non-periodic optical element.

Abstract: The invention relates to an illumination system (10) for a fluorescence microscope (3) for observation of an object (17) containing at least one fluorophore (19), to a microscope (1) and to a microscope method for illumination of an object (17) comprising at least one fluorophore (19). Solutions of the art have the disadvantage that orientation within an object (17) is difficult and visibility of fluorescing regions of the object (17) is non satisfying.

Abstract: An electronic prepared slide includes: an image sensor that has a light receiving surface and receives, on the light receiving surface, light that has passed through a specimen disposed above the light receiving surface; and a removable nonvolatile transparent film that is disposed on the light receiving surface and seals the light receiving surface.

Abstract: A microscope having an imaging beam path, an illumination beam path, a detection device, and a control device for controlling the detection device and the illumination device. The control device divides the light sources of the detection device in an array into at least a first and a second group, wherein each group is composed of light sources adjacent to each other in the array and covers part of the array. The control device switches on only one light source of the first group at a point in time and connects the light sources of the first group in a sequence with a clocking in such a way that two light sources switched on one after the other are adjacent to each other in the array and switches the light sources of the second group with the same clocking as the light sources of the first group. The control device reads out the detection device with the same clocking as the connecting of the light sources.

Abstract: A microscope for imaging an object, comprising a lens for imaging the object through an imaging beam path, a light source for generating illumination radiation, at least one optical element for coupling the illumination radiation into the imaging beam path such that a common beam path is formed between the optical element and the lens, wherein the imaging radiation path runs through the common beam path, and the illumination radiation is guided through the common beam path. The microscope also comprises a monitoring device for measuring an energy parameter of the illumination radiation, said monitoring device determining an energy parameter of radiation which is incident on the monitoring device, and a beam splitter device which is arranged in the common beam path upstream of the lens in the illuminating direction and couples measurement radiation out of the illumination radiation onto the monitoring device.

Abstract: A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.

Abstract: A microscope including an illumination optical system having an objective lens and a fly-eye lens, where: the fly-eye lens having a plurality of lens elements; in the illumination optical system, images of the plurality of lens elements are projected on a pupil of the objective lens; and the number (n1) of the images of the lens elements projected inside the pupil of the objective lens is more than the number (n2) of the images of the lens elements projected on an outer perimeter of the pupil of the objective lens. In the above observation optical system, a first objective lens having a first pupil diameter and a second objective lens having a pupil diameter larger than the first pupil diameter are switchable, and a number n1 may be greater than a number n2 with respect to the first objective lens.

Abstract: A scanning microscope includes an objective arranged in an illuminating beam path to focus an illuminating light bundle onto a sample. A scanning unit is arranged upstream of the objective to deflect the illuminating light bundle such that it is focused by the objective executes a scanning movement on the sample. A detection unit is arranged in a detection beam path to receive a detection light bundle not deflected by the scanning unit. For spectral influencing of the detection light bundle, the detection unit contains a spectrally selective component which has an active surface with a spectral edge which varies with the location of incidence of the detection light bundle on the active surface. The active surface is arranged in the detection beam path at the location of an image of an objective pupil, or in a position at which a variation of the spectral edge is compensated for.

Abstract: Exemplary method, computer-accessible medium and system can be provided for determining the presence or absence of a local and/or global property of a biological tissue sample. Thus, it is possible to obtain at least one image of the sample, search the image(s) for a presence of at least one particular feature that is contained in a pre-defined set of features, and assign, to the particular feature(s). It is possible to compute, with a computer processor, at least one discriminant value that is a function of the pronunciation index that is weighted with a particular weight. The weight of each pronunciation index is a measure for a relevance of the corresponding feature with respect to the property. It is possible to determine whether the property is present in at least one part of the biological tissue sample depending on whether the discriminant value exceeds a pre-defined threshold and/or and optimized threshold.

Abstract: There is provided a device allowing a sample to be observed in a first mode, by lensless imaging using a first sensor. The first mode allows a first image to be obtained, on the basis of which a region of interest of the sample may be identified. The device then allows, via a relative movement, the region of interest to be analyzed using a more precise second mode and in particular using an optical system coupled to a second sensor.

Abstract: A microscope includes: a sample placement part having a placement surface on which to place a sample and a bottom face opposite to the placement surface; an observation lens; and an optical unit for generating sheet light and use of the microscope. The microscope of an embodiment is arranged such that the sheet light enters the sample placement part from the bottom face and passing through the sample placement part to irradiate the sample, and fluorescence from the sample passes through the sample placement part toward the bottom face to be received by the observation lens. The microscope can, with this arrangement, utilize the advantages of a SPIM, and allows observation of a sample which observation is free from a restriction of the size of a sample.

Abstract: A microscope, in particular according to any of the preceding claims, consisting of an illuminating device, comprising an illumination light source and an illumination beam path for illuminating the specimen with a light sheet, a detection device for detecting light emitted by the specimen, and an imaging optical unit, which images the specimen via an imaging objective in an imaging beam path at least partly onto the detection device, wherein the light sheet is essentially planar at the focus of the imaging objective or in a defined plane in proximity of the geometrical focus of the imaging objective, and wherein the imaging objective has an optical axis, which intersects the plane of the light sheet at an angle that is different from zero, preferably perpendicularly, wherein an amplitude and/or phase filter is provided in the illumination beam path, said filter acting as a sine spatial filter in that it limits the illumination light in at least one spatial direction by filtering the spatial frequencies that

Abstract: A scanning apparatus having a stage adapted to hold a specimen to be imaged and to move the specimen in a first direction, and a light source that includes a tunable laser that generates a light beam having an illumination wavelength that varies as a function of an input signal is disclosed. The apparatus includes an imaging system having a scanning assembly that includes a focusing lens that focuses the light beam to a measurement point on the specimen, a first mirror that moves in a second direction relative to the stage such that the focusing lens maintains a fixed distance between the focusing lens and the stage, and a displacement sensor that measures a distance between the scanning assembly at a mapping point on the specimen, and a light detector that measures an intensity of light leaving the measurement point on the specimen.

Abstract: A phase contrast transmission electron microscope apparatus has a long-life phase modulator, enabling changes in quantity of phase modulation, barely absorbing the electron beams, and not being influenced by irradiation of the electron beams. An electron microscope comprises an electron gun, a first laser beam irradiating process, being positioned between the electron source and an object lens, for irradiating laser beams onto the electron beams radiated from the electron gun, a second laser beam irradiating process, being positioned on a focal plane behind the object lens, for focusing and irradiating the laser beams upon the focus of the electron beams penetrating through a specimen, and a screen or a 2D electron sensor for detecting a specimen image in the form of distribution of intensity of the electron beams by an optical system.

Abstract: A microscope module (300) for imaging a sample (270) includes at least one illumination objective (210) for producing an illumination beam along an illumination beam path (215) arranged to illuminate lower surfaces of the sample (270) and at least one detection objective (220) having a detection path (225). The detection path (225) is at an angle to the illumination beam path (215).

Abstract: Techniques are described for inspecting optical devices, such as eyepieces, to determine whether they exhibit light leakage through an edge sealant that has been applied to the device. Embodiments provide an inspection apparatus that can be employed to detect the leakage of light through an edge sealant of an optical device, where the edge sealant is applied to prevent, or at least reduce, the leakage of light from the optical device. Light from a light source is projected into the optical device. The light can travel along one or more wave guides within the device, until reaching an edge of the device. Light that is able to leak through an edge sealant can be reflected, using mirror(s) in the apparatus, and detected by a camera. Image(s) captured by the camera can be analyzed to determine the performance of the optical device with respect to edge leakage.

Abstract: At least one of a stage on which a cultivation container 50 that contains a plurality of wells 52 is placed or an imaging optical system that includes an objective lens for forming an image of the observation target in each well 52 is moved to scan an observation position in the stage, to thereby observe the observation target. In a case where the objective lens is moved in an optical axis direction to perform an auto-focus control at each observation position, a start timing of the auto-focus control at each observation position D is changed on the basis of a boundary portion between respective wells 52 that are adjacent to each other in a scanning direction of the observation positions.