Abstract: A control device includes a processor. The processor acquires positional information indicating a position of an observation target. The processor sets, from among a plurality of irradiation positions, a required irradiation position, which is an irradiation position corresponding to the position of the observation target indicated by the positional information and is an irradiation position required for obtaining a plurality of the interference fringe images that are sources of a super-resolution interference fringe image having a resolution exceeding a resolution of an imaging element. The processor causes a light source to emit an illumination light from the required irradiation position by controlling an operation of the light source, and causes the imaging element to outputs the interference fringe image at each required irradiation position.

Abstract: Systems, devices, and methods of Fourier ptychographic imaging by computationally reconstructing a high-resolution image by iteratively updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Abstract: A super resolution technique, intended mainly for fluorescence microscopy, acquires the three-dimensional position of an emitter, through a hybrid method, including a number of steps. In a first step the two-dimensional position of an emitter is acquired, using a technique, named in this application as an Abbe's loophole technique. In this technique a doughnut, or a combination of distributions, having a zero intensity at the combined center of the distributions, is projected onto the sample containing the emitter, under conditions wherein the doughnut null is moved towards the emitter to reach a position in which the emitter does not emit light. In a second step, an axial measurement is obtained using a 3D shaping method, characterized by the fact that the emitted light is shaped by an additional optical module creating a shape of the light emitted by the emitter, this shape being dependent of the axial position and means to retrieve the axial position from the shape.

Abstract: A parameterization of a control algorithm of a surgical microscope is carried out on the basis of one or more context parameters of an operation. On the basis of the parameterization, the control algorithm then is applied to one or more state indicators associated with a first setting of the surgical microscope in order thus to obtain a second setting of the surgical microscope. By way of example, the parameterization can comprise one or more prioritization operations.

Abstract: A system directs an imaging device to continuously capture visible light and fluorescence illumination from a surgical area. The system generates a visible light image stream based on the captured visible light and a fluorescence image stream based on the captured fluorescence illumination. The system operates in a first display mode by directing a display device to display a first video stream based on a first set of at least one of the visible light image stream and the fluorescence image stream. In response to detecting an event that occurs within the surgical area, the system switches from operating in the first display mode to operating in a second display mode by directing the display device to display a second video stream based on a second set of at least one of the visible light image stream and the fluorescence image stream, the first Instructions set being different than the second set.

Abstract: A method of contrast enhancement of a three-dimensional light sheet microscopy image formed from N individual images each corresponding to a light sheet plane and spaced apart from each other in the z-direction by at least a distance d, the x/y-plane being the light sheet plane and the x-direction being the propagation direction of the light sheet of the light sheet plane, comprising: Deconvolution of the three-dimensional image in the z-direction, comprising: For each intensity vector of N intensities (Ix,y,1, . . . , Ix,y,N) having the same x/y value, performing a multiplication with a tridiagonal N×N deconvolution matrix, which assigns to each voxel (x, y, n) a correction parameter f1, with which, by the multiplication of the deconvolution matrix with the intensity vector, for a component I(x, y, n) of the intensity vector the intensities Ix, y, n+1 and Ix, y, n?1 of the corresponding voxels of the neighboring image plane are multiplied, before they are subtracted from the intensity value I(x, y, n).

Abstract: An apparatus for detecting movements of a sample with respect to an objective includes imaging optics which include the objective, which have an image plane and which are configured to image light from at least one reference object that is connected to the sample arranged in front of the objective into reference object images in the image plane. The apparatus further includes a camera which is arranged in the image plane of the imaging optics and which is configured to record the reference object images at consecutive points in time, and an optical device arranged between the objective and the camera in a plane that is Fourier-conjugated with respect to the image plane. The optical device is configured to mask out low spatial frequencies of reference object images which the imaging optics image into the image plane.

Abstract: In certain embodiments, this application discloses methods for the diagnosis and prognosis of prostate cancer. In some embodiments, the invention takes advantage of the combinatorial utility of certain biomarkers to prognose and diagnose prostate cancer at an early stage. In certain embodiments, the methods described herein do not require the selection of cells from a particular tissue compartment, and are therefore suitable for analysis of cancer tissue in which compartmentalization is lost.

Abstract: A method for characterising a sample located within an imaging region, the method comprising the steps of: generating one or more evanescent fields, each associated with a direction, within the imaging region; capturing an image of the imaging region; determining 5 one or more sample characteristics of the sample according to a spatial intensity pattern resulting from an interaction between the, or each, evanescent field and the sample within the image, and associated apparatus and system.

Abstract: An electrokinetic device is configured as a dynamic lens cover and/or filter for an imaging assembly, e.g., of a mobile device, to selectively allow electromagnetic radiation to pass through a lens of the imaging assembly when the dynamic lens cover is in a first operating state or to prevent electromagnetic radiation from reaching the lens of the imaging assembly when the dynamic lens cover is in a second operating state. The electrokinetic device includes transparent first and second substrates, and a compaction trench surrounding the lens of the imaging assembly. The compaction trench stores pigment when the dynamic lens cover is in the first operating state. In the second operating state pigment is dispersed within a carrier fluid between the first and second substrates.

Abstract: Herein are described data acquisition systems and methods applying such systems to determine three-dimensional (3D) diffusion tensors, and simultaneously, to perform 3D structure imaging. Example data acquisition systems can include computing systems in communication with modified light sheet microscopes that are configured for high-speed volumetric imaging to record 3D diffusion processes and high-resolution 3D structural imaging.

Abstract: A method of excitation microscopy, in particular STimulated Emission Depletion (STED) microscopy, ins provided which comprises: providing a sample; trapping an object in the sample at a trapping position, in particular by applying a position dependent trapping force to the object; positioning, in particular focusing, a depletion beam at an interaction position in the sample for illumination of a portion of the sample associated with the trapped object.

Abstract: A microscope system includes: at least one microscope component with electrically adjustable component parameters; a controller for generating electrical signals and transmitting the electrical signals to the at least one microscope component to set the electrically adjustable component parameters; and a computer having at least one display unit, the computer generating an input unit having a graphical user interface on the at least one display unit, at least three setting parameters being adjustable by the graphical user interface. The input unit has an input pointer that is positionable in an input area so as to set a respective value for the at least three setting parameters. A coordinate axis is defined in the input area for each of the at least three setting parameters, with at least one coordinate axis not being perpendicular to another coordinate axis. Values of the at least three setting parameters are determined by the coordinates.

Abstract: A multi-mode illumination system, including: a first illumination module; a second illumination module; and a third illumination module, as disclosed herein.

Abstract: An orientation characteristic measurement system (1) includes an irradiation optical system (5), a detection optical system (11), a light detector (13), a rotation mechanism (9) changing an angle (?) between a surface of the sample and an optical axis (L2) of the detection optical system (11), and a computer (15), and the computer (15) includes a rotation mechanism control unit (32) controlling the rotation mechanism (9), a distribution acquisition unit (34) normalizing an angle-dependent distribution of light intensity to acquire an angle-dependent distribution of light intensity, an area specifying unit (35) specifying light intensity in a maximum area on the basis of the angle-dependent distribution of the light intensity, and a parameter calculation unit (36) calculating the orientation parameter (S) on the basis of a linear relationship determined using the film thickness and refractive index of the sample and the light intensity in the maximum area.

Abstract: Provided is an image pickup apparatus including a multi-band pass filter that selectively transmits band light in a specific band, a color filter that transmits the band light in the specific band per pixel of an image pickup device, the image pickup device that receives light transmitted by the multi-band pass filter and the color filter, and a signal processing section to which a pixel value of the image pickup device is input and which executes a signal process on the pixel value. The multi-band pass filter is configured to selectively transmit band light corresponding to a plurality of color filter elements, and the signal processing section generates a pixel value corresponding to a band, of a pixel to be processed using a raw image base pixel value signal per pixel and a spectral characteristic parameter of the image pickup apparatus.

Abstract: A single-shot differential phase contrast quantitative phase imaging method based on color multiplexing illumination. A color multiplexing illumination solution is used to realize single-shot differential phase contrast quantitative phase imaging. In the single-shot color multiplexing illumination solution, three illumination wavelengths of red, green, and blue are used to simultaneously illuminate a sample, and the information of the sample in multiple directions is converted into intensity information on different channels of a color image. By performing channel separation on this color image, the information about the sample at different spatial frequencies can be obtained.

Abstract: A light source module for a microscope, including a light source configured to emit illumination light along an illumination light path, at least one light blocking shutter configured to be moved into and out of the illumination light path, and at least one light sensor configured to detect an intensity of the illumination light propagating along the illumination light path. The at least one light sensor is integrated with the at least one light blocking shutter to be moved therewith into and out of the illumination light path.

Abstract: Disclosed is a module for efficiently exciting and detecting fluorescence. In a disclosed preferred embodiment, excitation lamp modules with multiple solid-state light sources shone at different oblique angles, such that multiple-beams converge in a single plane, are combined with appropriate emission filters that block the excitation light wavelengths while passing the emission wavelengths. A multitude of such modules can be combined on a slider with precise registration via a mating structure, and can be accurately positioned in front of an observation point, such as a microscope's objective lens, external to the microscope, via a novel magnetic detent system, allowing for the rapid switching between the analysis of different fluorophores.

Abstract: A microscope, which includes a color splitter that is reflective to excitation radiation, can switch between a first and a second operating mode. A first apparatus can introduce a first cylindrical optical element into the excitation beam path between a light source and the color splitter, when the microscope is in the first operating mode, and a second apparatus can introduce a second cylindrical optical element into the excitation beam path between the color splitter and a scanning apparatus.

Abstract: Examples relate to an illumination system for a microscope system, and to a system, method and computer program for a microscope system. The illumination system includes an illumination module for providing a spatially modulated illumination of a sample. The illumination system further includes one or more processors configured to determine a depth characteristic of the sample. The one or more processors is configured to control the illumination module based on the depth characteristic of the sample.

Abstract: A Raman analysing apparatus comprises an imaging optical system for imaging an object along an optical path to an optical detector, an irradiation optical system for illuminating the object, and a scanning device comprising a spinning pinhole disk. The irradiation optical system directs light onto the scanning device to illuminate the object at a plurality of illumination points. The imaging optical system images Raman scattered light emitted from the object at the illumination points to an intermediate image plane at which the scanning device is located. The imaging optical system may include a spectral filter and/or at least one optical spectral analyser. The apparatus enables high speed confocal Raman imaging and/or high speed confocal Raman spectography to be performed.

Abstract: A method for regulating a light source of a microscope that illuminates an object, said method including specifying an intended value of an energy parameter of illumination radiation on the object; producing illumination radiation; providing an objective for focusing illumination radiation onto the object; ascertaining a transmission property of the objective for the illumination radiation; output coupling a component of the illumination radiation upstream of the objective as measurement radiation and measuring an actual value of the energy parameter of the measurement radiation; providing a relationship between energy parameters of the measurement radiation and energy parameters of the illumination radiation on the object, and setting the light source in such a way that the actual value of the energy parameter measured for the measurement radiation corresponds to the intended value of the energy parameter according to the relationship.

Abstract: A light sheet fluorescence microscope includes a light source configured to emit excitation light suitable for inducing fluorescent light emitted from a specimen, a detector configured to detect the fluorescent light from the specimen, and an optical system configured to illuminate the specimen with a light sheet formed from the excitation light, and to guide the fluorescent light from the illuminated specimen to the detector. The optical system includes an objective facing the specimen, the objective being configured to collect the fluorescent light emitted from the specimen. The light source is further configured to emit manipulation light suitable for photomanipulating the specimen. The optical system is further configured to direct the manipulation light through a spatially limited sub-area of an entrance pupil of the objective onto the specimen along a light propagation direction which is different from a light propagation direction of the light sheet.

Abstract: An optical assembly in a laser scanning microscope, having an optical scanning unit providing a first pupil plane, a first beam deflecting device, made of a first scanner arranged on the first pupil plane, for scanning excitation radiation in a first coordinate direction, a first focusing device generating a second pupil plane, optically conjugated to the first pupil plane, and a second beam deflecting device for deflecting the excitation radiation. The second deflecting device is arranged on the second pupil plane. A second focusing device to generate a third pupil plane, is optically conjugated to the first pupil plane and the second pupil plane. A third beam deflecting device is arranged on the third pupil plane, and a variable beam deflecting device is provided to switch an optical beam path between a first beam path and a second beam path.

Abstract: In an image acquisition device, when capturing an optical image of a sample S through lane scanning, the number of tile images T included in a tile image row R acquired in one lane is counted, and a determination is made as to whether or not the number of images reaches a planned acquisition count that is set in advance. In a case where it is determined that the number of images does not reach the planned acquisition count, lane scanning with respect to the lane is re-executed. Accordingly, even when a loss of the tile images T occurs due to an environment load, the tile images T are complemented by re-execution of the lane scanning, and thus it is possible to prevent the loss of the tile images T in an observation image.

Abstract: The invention relates to a beam manipulation device for a scanning microscope, comprising a main colour splitter for coupling excitation light into an illumination beam path and for separating excitation light from detection light of a detection beam path, said device comprising a scanner, preferably positioned on a pupil plane, for scanning the excitation light. The device is characterised in that: an additional optical section is provided comprising optical elements which influence a beam path; at least one pupil plane and/or at least one intermediate image plane is formed in the additional optical section by the optical elements which influence the beam path; and an adjustable selection device is provided for activating either a first beam segment of the illumination and/or detection beam path, or the additional optical section, wherein the first beam segment of the illumination and/or detection beam path does not contain a pupil plane of the illumination and/or detection beam path.

Abstract: An inspection apparatus includes a specimen stage, one or more imaging devices and a set of lights, all controllable by a control system. By translating or rotating the one or more imaging devices or specimen stage, the inspection apparatus can capture a first image of the specimen that includes a first imaging artifact to a first side of a reference point and then capture a second image of the specimen that includes a second imaging artifact to a second side of the reference point. The first and second imaging artifacts can be cropped from the first image and the second image respectively, and the first image and the second image can be digitally stitched together to generate a composite image of the specimen that lacks the first and second imaging artifacts.

Abstract: A laser beam delivery apparatus for a microscope comprises first and second optical diffusers that are configured to move in a periodic manner with a respective different frequency. Each optical diffuser may comprise a spinning disk. The laser light is spatially randomized by the first spinning diffuser and its spatial pattern is further randomized by the second diffuser. The second diffuser prevents any spatial pattern from repeating after one revolution of the first diffuser, which prevents beating patterns from forming when the light is imaged through a spinning confocal disk and increases the uniformity in other cases.

Abstract: A system comprising a beam source (110) and an optical system (304) comprising first and second portions. The system further comprises first and second torque motors integrated into respective ones of the first and second portions, The first torque motor (420) is configured to rotate first portion (416) around a first axis (434). The second torque motor (426) is configured to rotate second portion (418) around a second axis (436). The first axis is perpendicular to the second axis.

Abstract: Methods and apparatuses are disclosed whereby structured illumination microscopy (SIM) is applied to a scanning microscope, such as a confocal laser scanning microscope or sample scanning microscope, in order to improve spatial resolution. Particular aspects of the disclosure relate to the discovery of important advances in the ability to (i) increase light throughput to the sample, thereby increasing the signal/noise ratio and/or decreasing exposure time, as well as (ii) decrease the number of raw images to be processed, thereby decreasing image acquisition time. Both effects give rise to significant improvements in overall performance, to the benefit of users of scanning microscopy.

Abstract: Systems and methods herein provide improved, high-throughput multiphoton imaging of thick samples with reduced emission scattering. The systems and methods use structured illumination to modify the excitation light. A reconstruction process can be applied to the resulting images to recover image information free of scattering. The disclosed systems and methods provide high throughput, high signal-to-noise ratio, and high resolution images that are depth selective.

Abstract: This disclosure includes an imaging system that is configured to image in parallel multiple focal planes in a sample uniquely onto its corresponding detector while simultaneously reducing blur on adjacent image planes. For example, the focal planes can be staggered such that fluorescence detected by a detector for one of the focal planes is not detected, or is detected with significantly reduced intensity, by a detector for another focal plane. This enables the imaging system to increase the volumetric image acquisition rate without requiring a stronger fluorescence signal. Additionally or alternatively, the imaging system may be operated at a slower volumetric image acquisition rate (e.g., that of a conventional microscope) while providing longer exposure times with lower excitation power. This may reduce or delay photo-bleaching (e.g., a photochemical alteration of the dye that causes it to no longer be able to fluoresce), thereby extending the useful life of the sample.

Abstract: Light Sheet Theta (LS-0) Microscopy achieves large sample imaging capabilities without affecting the imaging depth or the image quality. An optical layout places a detection objective normal to the sample surface, while placing the illumination objectives that generate light sheets at an angle (theta) significantly smaller than 90 degrees. In this configuration, the light sheets enter from same side of the sample as the detection objective. The intersection of the light-sheet and the detection focal plane results in a line illumination-detection profile that is discriminated by a camera.

Abstract: An optical microscope device includes: a first illumination optical system including a light source that emits illumination light for illuminating a specimen an LCOS spatial light modulation element that controls a polarization state of the illumination light, a first illumination optical member that uniformly illuminates the LCOS spatial light modulation element, and a polarization optical element that controls a transmission state of the illumination light directed to the specimen from the LCOS spatial light modulation element in response to the polarization state of the illumination light; a second illumination optical system including a second illumination optical member that images a light flux from the first illumination optical system on a specimen surface; and an imaging optical system for imaging the specimen surface.

Abstract: Provided are methods, devices, assemblies, and systems for dispensing into the wells of a multi-well device and imaging such wells from multiple Z-planes. Multi-Z imaging of the present methods and systems may allow for the detection of wells of a multi-well device that contain a desired number of cells. Also provided are methods, devices, assemblies, and systems for processing cell-containing wells of a multi-well device identified through the use of multi-Z imaging.

Abstract: Systems and methods for simulating animation of an object are provided. Such systems and methods include capturing a first sequence of images of the object with a camera while in an activated lighting apparatus, importing the first sequence of images into a first stage video file having a preconfigured size and masked off such that the first surface appears over a first background, and incorporating the first stage video file into a template of a three-dimensional (3D) model by aligning the first surface with a video mask of the template such that the video mask obscures the first background of the first stage video file and superimposes a location of the first surface in the first stage video file onto a virtual surface of the 3D model.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illumination beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-like illumination light distribution illuminating the sample in a partial area from the illumination beam. A detection unit has a detector which is designed to capture detection light originating from the partial area of the sample illuminated with the illumination light distribution. The illuminator comprises a beam modulator adapted to modulate the illumination beam along the illumination axis in such a way that light exposure of the partial area of the sample illuminated by the illumination light distribution varies along the illumination axis.

Abstract: A microscope including an illumination assembly, an image capture device and a processor can be configured to selectively identify regions of a sample including artifacts or empty space. By selectively identifying regions of the sample that have artifacts or empty space, the amount of time to generate an image of the sample and resources used to generate the image can be decreased substantially while providing high resolution for appropriate regions of the computational image. The processor can be configured to change the imaging process in response to regions of the sample that includes artifacts or empty space. The imaging process may include a higher resolution process to output higher resolution portions of the computational image for sample regions including valid sample material, and a lower resolution process to output lower resolution portions of the computational image for sample regions including valid sample material.

Abstract: A STED super-resolution microscope capable of quick beam combination is disclosed, which includes a STED imaging unit and a beam combination test unit. The excitation light and the depletion light are accurately combined by the beam combination test unit, so that the imaging light spots of the two light beams passing through the STED imaging unit can accurately coincide with each other, thereby obtaining a better super-resolution imaging effect.

Abstract: A method is useful for generating an overview image using a high-aperture objective. An optical detection beam path with the objective is provided. The path is transferred into a second operating state via a first depth of field increased to a second depth of field. Detection radiation is captured in the second operating state. Detection radiation coming from the sample space is collected by the objective, guided along the path, and captured by a detector sensitive to detection radiation as an image with a lateral image field, which is the same in the first and second operating states.

Abstract: Finger grip and connector for portable electronics, in particular cell phones. The grip includes a metallic ring. The ring adheres to the back of a cell phone, or case. The grip includes a corresponding ring of magnets for a grip assembly to magnetically attach to the metal ring adhered to the cell phone. The grip design provides infinite rotation of the grip assembly relative to the phone for holding the phone in various positions. The grip provides a support for viewing content on the electronic device at different angles and orientations. The grip provides a means of magnetically attaching a cell phone to metallic surfaces, chargers, mounts, and other devices. The grip can allow for wireless charging, which is optimized and enabled by a relatively large open inner diameter of the metallic ring and corresponding magnets. The grip can retract to be less than 3 millimeters in total thickness.

Abstract: A sample is imaged using light-sheet imaging. The light-sheet imaging includes generating light, forming one or more light sheets from the light at one or more positions within the sample along respective illumination directions that are parallel with an illumination axis, and recording images of fluorescence emitted along a detection direction from the sample due to the optical interaction between the one or more light sheets and the sample. One or more properties relating to the light-sheet imaging are measured; the one or more measured properties are analyzed; and one or more operating parameters associated with the light-sheet imaging are adjusted based on the analysis of the one or more measured properties.

Abstract: A method for the high-resolution scanning microscopy of a specimen where the specimen is illuminated with illuminating radiation such that the illuminating radiation is focused to a diffraction-limited illuminating spot at a point in or on the specimen. The point is projected in a diffraction-limited manner in a diffraction image onto a flat panel detector having pixels. The flat panel detector, owing to the pixels thereof, have a spatial resolution which resolves a diffraction structure of the diffraction image. The point is shifted relative to the specimen into different scanning positions by an increment which is smaller than the diameter of the illuminating spot and a 3D image is generated. The pixels of the flat panel detector are divided into groups. A pre-calculated raw image is calculated for each group and are unfolded three-dimensionally to generate the image of the specimen.

Abstract: A pseudo speckle pattern generation apparatus includes a first spatial light modulator, a first lens, a second spatial light modulator, a second lens and the like. The first spatial light modulator has a first intensity modulation distribution based on a pseudo random number pattern, and spatially modulates intensity of light output from a light source and increased in beam diameter by a beam expander. The second spatial light modulator has a second intensity modulation distribution based on a filter function, is provided on a plane where a Fourier transformed pattern is generated by the first lens, and spatially modulates intensity of the light reached through the first lens. The second lens optically Fourier transforms a pattern of the light output from the second spatial light modulator to generate a Fourier transformed pattern as a pseudo speckle pattern.

Abstract: A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Abstract: An optical inspection apparatus includes: a first filter having a plurality of passbands; a first beam splitter to reflect a first light that exits from the first filter to transfer the first light to an inspection target; a second beam splitter to split a second light, which is provided by reflecting the first light by the inspection target, into a first split light and a second split light; a second filter to receive the first split light, and having a passband different from the passbands of the first filter; a fluorescence microscope to generate a fluorescence image from a third light that exits from the second filter; and a first imaging module to generate a first image from the second split light.

Abstract: An optical system includes a scanning unit, a first lens-element group including at least a first lens element, and a focusing unit which is designed to focus beams onto a focus, wherein the focusing unit includes a second lens-element group including at least a second lens element and an imaging lens. The imaging lens further includes a pupil plane and a wavefront manipulator. The wavefront manipulator is arranged in the pupil plane of the imaging lens or in a plane that is conjugate to the pupil plane, or the scanning unit of the optical system is arranged in a plane that is conjugate to the pupil plane and the wavefront manipulator is arranged upstream of the scanning unit in the light direction. The focus of the second lens-element group lies in the pupil plane of the imaging lens in all focal positions of the focusing unit.

Abstract: A microscope for imaging a sample includes an illumination unit for emitting illumination light to the sample; a detector for capturing a detection light originating from the sample; an optical system for focusing the illumination light onto the sample and focusing the detection light onto the detector; and a scanning unit for scanning the sample using the illumination light. The illumination unit emits the illumination light as separate illumination light beams which can be focused on spatially mutually separated, strip-like sample regions simultaneously. The detector captures the detection light in the form of separate detection light beams originating from the sample regions simultaneously and in a spatially mutually separated manner. The sample regions are in sample planes, and the detector having sub-detectors, which are each assigned to a sample plane and capture a detection light beam that originates from a respective sample plane.

Abstract: A method for high-resolution scanning microscopy of a sample in which a sample is illuminated at a point in or on the sample by means of illumination radiation. The point is imaged along an optical axis and according to a point spread function into a diffraction image on a spatially resolving surface detector that comprises detector pixels in which a diffraction structure of the diffraction image is resolved. The point is displaced relative to the sample in at least two scanning directions and pixel signals are read from the detector pixels in various scanning posi- tions, wherein the pixel signals are respectively assigned to that scanning position at which they were read out and adjacent scanning positions overlap one another and are disposed according to a scanning increment. An image of the sample having a resolution that is increased beyond a resolution limit of the imaging is generated from the read pixel signals and the assigned scanning positions, wherein a deconvolution is carried out.