Abstract: A measuring device includes a projector, a camera and a calculation device. The projector projects, on a target object, first stripe pattern light having a first period, second stripe pattern light having a second period, and third stripe pattern light having a third period. A relation of the periods is the first period<the second period<the third period. The camera captures an image of the first stripe pattern light, an image of the second stripe pattern light, and an image of the third stripe pattern light. The calculation device performs a phase analysis of luminance with a phase shifting method for the image of the first stripe pattern light, the image of the second stripe pattern light, and the image of the third stripe pattern light, and calculates a height of the target object based on obtained phase analysis results.

Abstract: An afterimage compensator and a display device having the same are disclosed, and the afterimage compensator includes an image analyzer configured to determine an amount of image variation based on a change of image data, and an image shifter configured to adjust a shift interval, which is an interval between time points at which an image is shifted, according to the amount of image variation.

Abstract: An optical measurement unit for a scanning device, a scanning device, and a method for operating a scanning device, for high throughput sample analysis of biological samples are disclosed. An illumination system is used to emit light of at least two different illumination wavelength ranges, and an imaging system is used to detect light of at least two different detection wavelength ranges, in order to detect electromagnetic radiation within a field of view for determining the positioning of a sample within the field of view.

Abstract: Disclosed is a technology for illuminating a specimen in a desired uniform illumination pattern and capturing an image of a wide field of view in a low background illumination environment. Provided, for example, is a fluorescence microscope apparatus including a first illumination optics, a second illumination optics, and an imaging optics. The first illumination optics includes a first light source for exciting fluorescence in a specimen, a spatial light modulation element, and a first illumination optical member for uniformly illuminating the spatial light modulation element. The second illumination optics includes a second illumination optical member for forming an image of a light beam from the spatial light modulation element on a specimen surface. The imaging optics includes an imaging optical member and an imaging element. The imaging optical member captures an image of the specimen surface.

Abstract: An illumination apparatus for a microscope, for producing a de-excitation or switching light distribution, includes a light source configured to produce a primary illumination light beam and a beam splitter configured to divide the primary illumination light beam into two partial illumination light beams. An illumination objective is configured to focus the partial illumination light beams onto and/or into a sample such that the partial illumination light beams extend, spatially separated from one another, through an entry pupil of the illumination objective and are spatially superposed on and/or in the sample after passing through the illumination objective. A phase influencer is configured to cause a relative phase offset of the partial illumination light beams with respect to one another in such a way that the partial illumination light beams in the entry pupil of the illumination objective have a phase offset of ?.

Abstract: A light sheet microscope includes an illuminator having a beam source which is designed to direct an illuminating beam propagating along an illumination axis onto a sample. A light-sheet generator is designed to generate a light-sheet-type illuminating light distribution illuminating the sample in one partial region. A detection unit has a detector that is designed to capture detection light originating from the section of the sample that is illuminated by the illuminating light distribution. An objective is provided for both the illuminator and the detection unit such that the objective is to be penetrated by the illuminating beam and the detection light. The illuminator has a beam modulator designed to modulate the illuminating beam perpendicular to the illumination axis.

Abstract: A polarization conversion system separates light from an unpolarized image source into a first state of polarization (SOP) and an orthogonal second SOP, and directs the polarized light on first and second light paths. The SOP of light on only one of the light paths is transformed to an orthogonal state such that both light paths have the same SOP. A polarization modulator temporally modulates the light on the first and second light paths to first and second output states of polarization. First and second projection lenses direct light on the first and second light paths toward a projection screen to form substantially overlapping polarization encoded images. The polarization modulator may be located before or after the projection lenses. The polarization-encoded images may be viewed using eyewear with appropriate polarization filters.

Abstract: An imaging system includes: an image forming device that obtains image information of an object with the focal length to the object being changed by a variable focal length lens in an optical system, so as to form an all-focused image of the object; a sensor device that detects variations in the surface level of the object in a focus direction; and a position adjustment device that adjusts the position of the object in the focus direction in accordance with the surface level variations of the object detected by the sensor device. The position adjustment device adjusts the position of the object in the focus direction in such a manner that the surface level of the object becomes closer to the center of a variable focal length range of the variable focal length lens.

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

Abstract: A high resolution laser scanning microscope has beam shaping elements configured to shape a beam of fluorescence inhibiting light which is directed into a back aperture of an objective connected to form an intensity minimum delimited by intensity maxima of the fluorescence inhibiting light in a focus of the objective. A plurality of optical elements including the objective and the beam shaping elements are arranged in a beam path of the beam to the focus. Using the microscope includes removing or exchanging or altering or adding at least one of the optical elements arranged in the beam path of the beam of fluorescence inhibiting light, and compensating a variation of polarization varying properties of the plurality of the optical elements, that is caused by removing or exchanging or altering or adding the at least one optical element, by adapting the beam shaping elements to the variation.

Abstract: A microscope (10) for detecting images of an object (14) located in an object plane (12) is described, comprising a microscope stand (18); a microscope objective (20); a light source (22) integrated into the microscope stand (18); and a beam splitter (24), integrated into the microscope objective (20), for coupling in a coaxial incident illumination.

Abstract: An apparatus for inspecting a surface of an object has a first light source operative to illuminate the object without producing a patterned image onto the object. A second light source projects a patterned image produced from a first polarized light from the second light source onto the object, wherein the first polarized light is polarized in a first polarization direction. A third light source projects the patterned image produced from a second polarized light from the third light source onto the object, wherein the second polarized light is polarized in a second polarization direction different from the first polarization direction. An imaging device views the surface of the object when the object is illuminated separately by the first, second and third light sources respectively for determining a profile of the surface of the object.

Abstract: A sample image data generating apparatus includes a modulated image imager that picks up a modulated image that is a sample image modulated by structured illumination forming an illumination pattern having a periodic structure in an optical axis direction of an objective and an orthogonal direction orthogonal to the optical axis direction. The sample image data generating apparatus further includes a demodulated image data generator that generates demodulated image data by calculating a demodulated image according to a plurality of modulated images each picked up by the modulated image imager when the illumination pattern is located at a different position on sample with respect to the optical axis direction and the orthogonal direction and according to a defocusing amount of the structured illumination with reference to a focal plane of the objective, the demodulated image being a sample image obtained by demodulating the modulated image.

Abstract: A microscope and imaging method in which a layer of the sample is illuminated by a thin strip of light and the sample is viewed perpendicular to the plane of the strip of light. The depth of the strip of light thus essentially determines the depth of focus of the system. To record the image, the object is displaced through the strip of light, which remains fixed in relation to the detector, and fluorescent and/or diffused light is captured by a planar detector. Objects that absorb or diffuse a large amount of light are viewed from several spatial directions. The three-dimensional images, which are captured from each direction can be combined retrospectively to form one image, in which the data is weighted according to its resolution. The resolution of the combined image is then dominated by the lateral resolution of the individual images.

Abstract: An optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous object on a sample. A sequence of at least two compact luminous distributions of different topological families is projected onto the sample, and light re-emitted by the luminous object is detected. At least one optical image is generated for each luminous distribution on the basis of the light detected. The optical images are analyzed to obtain spatiotemporal information regarding the light re-emitted by the luminous object, or location of the luminous object.

Abstract: The invention relates to an optical measurement method and to an optical measurement device for determining the spatial or spatiotemporal distribution of a sample, the sample comprising at least one retransmission source, said at least one retransmission source retransmitting light depending on the projected light, according to a predetermined law, onto the sample, the method comprising: the projection onto the sample of at least two compact light distributions belonging to different topological families, which propagate along the same optical path, the detection of the light retransmitted by said at least one retransmission source of the sample; the generation of at least one optical image from the detected light; and the algorithmic analysis of the optical images for obtaining location data on said at least one retransmission source.

Abstract: An image generation system includes a light detector configured to detect light from a sample; a super-resolution image component transmitter including an objective, configured to transmit the light from the sample including a super-resolution image component that exceeds a cut-off frequency of the objective to the light detector; and an image processor configured to enhance the super-resolution image component of an image of the sample in accordance with an output signal from the light detector. The super-resolution image component transmitter includes a light polarization converter that is placed in an optical path of illumination light for illuminating the sample and that is configured to convert a polarization state of the illumination light to make a polarization direction distribution in the light flux of the illumination light symmetric with respect to an optical axis of the illumination light.

Abstract: A sample analyzer has a support for an assay sample vessel, a detector, and a shutter assembly. The assay sample vessel contains an assay sample within an assay sample reservoir. The detector has an optical axis aligned with the assay sample reservoir, so as to detect luminescence from the assay sample. The shutter assembly includes an illuminator and is positioned between the detector and the support, intersecting the optical axis, such that the illuminator causes luminescence of the assay sample. Thus both illumination and detection occur on the same side of the assay sample vessel.

Abstract: The present disclosure relates to a system for examining an eye. The system comprises a microscopy system for generating an image plane image of an object region. An OCT system of the system is configured to acquire OCT data from the object region which reproduce the object region in different stress states. A data processing unit of the system is configured to determine at least one value of a stress-dependent parameter, depending on the OCT data. The system generates an output image that is dependent on the image plane image and is furthermore dependent on the stress-dependent parameter.

Abstract: A sample analyzer has an illuminator for illuminating an assay sample to cause luminescence, and a support for a sample vessel containing the assay sample. The support is adapted to position the assay sample proximate the illuminator. A detector is positioned along an optical axis extending from the illuminator, through the positioned assay sample, to the detector, so as to detect the luminescence from the assay sample. A reflector is removably disposed between the illuminator and the assay sample so as to reflect a portion of the luminescence back through the positioned assay sample toward the detector.

Abstract: A multi-foci laser scanning microscope generates a set of time-multiplexed beams that are simultaneously scanned over multiple scan areas of the sample to be observed. A photodetector array associated with the beams detect fluorescence signals from the sample. A processor processes output signals from the photodetector array based on the time-multiplexing of the beams to provide a much wider field of view and reduced crosstalk between neighboring scan areas for more accurate imaging.

Abstract: The invention proposes an optical method of measurement and an optical apparatus for determining the spatial position of at least one luminous nanoemitter of a sample, the method comprising: the projection of a sequence of at least two compact luminous distributions of different topological families onto the sample, the detection of the light reemitted by said at least one luminous nanoemitter of the sample; the generation of at least one optical image for each luminous distribution, on the basis of the light detected; and the algorithmic analysis of the optical images to obtain information regarding the location of said at least one luminous nanoemitter.

Abstract: An embodiment of the present invention is an imaging arrangement that includes imaging optics, a fiducial light source, and a control system. In operation, the imaging optics separate light into first and second tight by wavelength and project the first and second light onto first and second areas within first and second detector regions, respectively. The imaging optics separate fiducial light from the fiducial light source into first and second fiducial light and project the first and second fiducial light onto third and fourth areas within the first and second detector regions, respectively. The control system adjusts alignment of the imaging optics so that the first and second fiducial light projected onto the first and second detector regions maintain relatively constant positions within the first and second detector regions, respectively. Another embodiment of the present invention is a microscope that includes the imaging arrangement.

Abstract: A dual-configuration microscope is provided. The microscope may be converted into an upright configuration or an inverted configuration. The microscope includes a base having a lower portion and an upper portion, the lower portion configured to support the microscope. The microscope further includes a body having a first portion, a second portion, and an intermediate portion extending between the first and second portions. The intermediate portion of the body is rotatably coupled to the upper portion of the base at a rotational coupling. The rotational coupling defines a rotating axis that extends in a longitudinal direction with respect to the microscope. The microscope further includes an objective disposed proximal to the first portion and a light source disposed proximal to the second portion.

Abstract: A illumination apparatus for microscope comprises a light source, a spatial modulation section, a first illumination optical system, a second illumination optical system, and the spatial modulation section includes a spatial modulation element which is of reflecting type, and a polarizing element, and the first illumination optical system is disposed in an optical path from the light source up to the spatial modulation element, and the second illumination optical system is disposed in an optical path from the spatial modulation element up to a specimen position, and a position of the spatial modulation element is conjugate with the specimen position. Moreover, a microscope comprises a illumination apparatus, a main-body section, an observation unit, and a control unit, and the illumination apparatus for microscope is to be used as the illumination apparatus.

Abstract: A microscope, preferably a laser scanning microscope, with at least one illuminating beam, which in a partial area along the cross-section thereof, is phase-modulated with a modulation frequency. A microscope objective is provided for focusing the illumination beam onto a sample. The microscope further has a detection beam path and at least one demodulation means, wherein a pulsed illumination beam is present. In the illumination beam path upstream of the microscope objective, a first polarization beam splitter is provided, which generates at least first and second partial beam paths that have differing, preferably adjustable, optical paths. A combination element, such as a second pole splitter, for rejoining the partial beams is provided. In one partial beam path, a phase element is provided, which has at least two areas having differing phase interferences.

Abstract: A system including a microscope and an inspection apparatus in which an objective lens having a large numerical aperture is used for detecting a defect existing inside a sample. A light source apparatus produces linearly polarized light. The polarization maintaining fibers optically coupled to the light source apparatus project the linearly polarized light onto the sample surface as an illumination beam of P-polarized light at an incidence angle substantially equal to the Brewster's angle of the sample. The scattered light generated by the defect existing in the sample is emitted from the sample and is collected by the objective lens whose optical axis is perpendicular to the sample surface. Since the illumination beam of P-polarized light is projected at the incidence angle equal to the Brewster's angle of the sample, no surface reflection occurs and it is possible to use the objective lens having a large numerical aperture.

Abstract: The invention relates to a device for microscopy, with at least one light source for providing illumination light, with a detection unit for detecting light radiated back from a sample, with a microscopy optical unit for guiding illumination light onto the sample and for guiding light radiated back from the sample in the direction of the detection unit and with, arranged in an illumination beam path, an excitation mask (40) for providing structured illumination. The device is characterized in that the excitation mask is a spatially structured filter, which is transparent to light with a first physical property and which impresses spatial structure onto light with a second physical property that is different from the first physical property. The invention moreover relates to a method for microscopy.

Abstract: During mask inspection it is necessary to identify defects which also occur during wafer exposure. Therefore, the aerial images generated in the resist and on the detector have to be as far as possible identical. In order to achieve an equivalent image generation, during mask inspection the illumination and, on the object side, the numerical aperture are adapted to the scanner used. The invention relates to a mask inspection microscope for variably setting the illumination. It serves for generating an image of the structure (150) of a reticle (145) arranged in an object plane in a field plane of the mask inspection microscope. It comprises a light source (5) that emits projection light, at least one illumination beam path (3, 87, 88), and a diaphragm for generating a resultant intensity distribution of the projection light in a pupil plane (135) of the illumination beam path (3, 87, 88) that is optically conjugate with respect to the object plane.

Abstract: The invention relates to a light microscope comprising a polychromatic light source for emitting illumination light in the direction of a sample, focussing means for focussing illumination light onto the sample, wherein the focussing means, for generating a depth resolution, have a longitudinal chromatic aberration, and a detection device, which comprises a two-dimensional array of detector elements, for detecting sample light coming from the sample. According to the invention, the light microscope is characterized in that, for detecting both confocal portions and non-confocal portions of the sample light, a beam path from the sample to the detection device is free of elements for completely masking out non-confocal portions. In addition, the invention relates to a method for image recording using a light microscope.

Abstract: A differential filtering chromatic confocal microscopic system comprises a chromatic dispersion objective for receiving and axially dispersing a broadband light from a light source and projecting dispersed lights onto an object thereby forming an object light reflected therefrom; an optical modulation module for dividing the object light into a first and a second object lights; a pair of optical intensity sensing module, respectively having a spatial filter with a different pinhole diameter or a slit width from each other, for detecting the first and second object lights, thereby obtaining a plurality of first and second optical intensity signals; and a signal processor for respectively processing the plurality of first and second optical intensity signals thereby obtaining a plurality of differential rational values of optical intensity and determining a corresponding object depth associated with each differential rational value according to a relation between signal intensity ratio and object surface depth.

Abstract: A system for a laser-scanning microscope includes an optical element configured to transmit light in a first direction onto a first beam path and to reflect light in a second direction to a second beam path that is different from the first beam path; a reflector on the first beam path; and a lens including a variable focal length, the lens positioned on the first beam path. The lens and reflector are positioned relative to each other to cause light transmitted by the optical element to pass through the lens a plurality of times and in a different direction each time. In some implementations, the system also can include a feedback system that receives a signal that represents an amount of focusing of the lens, and changes the focal length of the lens based on the received signal.

Abstract: A super-resolution microscope includes a modulation optical element (10) that is disposed in an illumination optical system along a light path traveled by first illumination light and second illumination light and spatially modulates the second illumination light. In the modulation optical element (10), a plurality of optical substrates exhibiting anisotropy in a refractive index distribution are joined in a coplanar manner, and at least two of the optical substrates have a different refractive index with respect to a polarization direction of the second illumination light.

Abstract: A system and method for obtaining super-resolution image of an object. An illumination beam is directed through an optical axis onto the object to be imaged. Paraxial rays of the illumination beam are deflected away from the optical axis and into a beam dump. The non-paraxial rays are collected after being reflected by the object so as to generate an image only from the non-paraxial rays.

Abstract: A super-resolution microscope comprises: an illumination optical system that condenses a first illumination light beam for exciting the molecule from a stable state to a first quantum state and a second illumination light beam for further transitioning the molecule onto a sample in a manner that the first and the second illumination light beams are partially overlapped; a scanning section that scans the sample by relatively displacing the first and the second illumination light beams and the sample; a detection section that detects an optical response signal emitted from the sample; and a phase plate that is arranged in the illumination optical system and has M surface areas for modulating the phase of the second illumination light beam, wherein the phase plate comprises a monolayer optical thin film with M surface areas formed on an optical substrate with a thickness that satisfies the predetermined conditional expression.

Abstract: A 4-Pi microscope for imaging a sample, comprising a first objective for focusing a first light beam on the sample at a spatial point one or more Digital Optical Phase Conjugation (DOPC) devices, wherein the DOPC devices include a sensor for detecting the first light beam that has been transmitted through the sample and inputted on the sensor; and a spatial light modulator (SLM) for outputting, in response to the first light beam detected by the sensor, a second light beam that is an optical phase conjugate of the first light beam; and a second objective positioned to transmit the first light beam to the sensor and focus the second light beam on the sample at the spatial point, so that the first light beam and the second light beam are counter-propagating and both focused to the spatial point.

Abstract: Embodied is a two-color, fiber-delivered picosecond source for coherent Raman scattering (CRS) imaging. A wavelength tunable picosecond pump is generated by nonlinear spectral compression of a prechirped femtosecond pulse from a mode-locked titanium:sapphire (Ti:S) laser. A 1064-nm picosecond Stokes pulse is generated by an all-fiber time-lens source (or suitable alternative source) that is synchronized to the Ti:S laser. The pump and Stokes beams are combined in an optical fiber coupler, which serves not only as the delivery fiber but also as the nonlinear medium for spectral compression of the femtosecond pulse. CRS imaging of mouse skin is performed to demonstrate the practicality of this source.

Abstract: There is provided a method for generating a 3D representation of an object, comprising: acquiring 3D topographic data representative of at least one portion of the object having a macroscopic form and microscopic features; separating the 3D topographic data into microscopic data representative of the microscopic features and macroscopic data representative of the macroscopic form; independently scaling one of the microscopic data and the macroscopic data in order to enhance the microscopic features with respect to the macroscopic form, thereby obtaining scaled topographic data; and generating a 3D image using the scaled topographic data, thereby obtaining a modified representation having enhanced microscopic features for the at least one portion of the object.

Abstract: A method of microscopy and an illumination optical device with a hollow cone for a microscope, the illumination device includes a first conical lens (1) able to receive a collimated incident light beam (10) and form a conical light beam (20), a second conical lens (5) arranged in such a way as to receive the conical light beam (20, 40) and to form a cylindrical light beam with a black background (50) and an optical lens (6) having an image focal plane (12) arranged in such a way as to receive the cylindrical light beam with a black background (50), to form a hollow cone light beam (60) and to focus the hollow cone light beam (60) into a point (18) in the image focal plane (12).

Abstract: An optical microscope system and method having a birefringent material for decomposing light from a light source into ordinary and extraordinary waves, a first prism for directing the decomposed light sequentially through a specimen and an objective along a light path and a second prism positioned in the light path of the decomposed light, said second prism positioned subsequent the objective and prior to an ocular assembly.

Abstract: A illumination apparatus for microscope comprises a light source, a spatial modulation section, a first illumination optical system, a second illumination optical system, and the spatial modulation section includes a spatial modulation element which is of reflecting type, and a polarizing element, and the first illumination optical system is disposed in an optical path from the light source up to the spatial modulation element, and the second illumination optical system is disposed in an optical path from the spatial modulation element up to a specimen position, and a position of the spatial modulation element is conjugate with the specimen position. Moreover, a microscope comprises a illumination apparatus, a main-body section, an observation unit, and a control unit, and the illumination apparatus for microscope is to be used as the illumination apparatus.

Abstract: A microscope includes a light source, a condenser lens, an objective lens, a polarizer, a compensator which is disposed on an optical path XA of the light source between the condenser lens and the polarizer and is rotatable about the optical path XA and is configured to adjust variation of retardation with respect to a specimen S by transmitting only a component of light in a specified vibration direction transmitted through the polarizer depending on an angle of rotation from a reference position, a driving unit configured to rotate the compensator, and a control unit configured to cause the compensator to increase or decrease the retardation within a range including a position where the retardation is zero as a reference.

Abstract: A hand-held microscope includes a rigid tripod stand with adjustable legs, a visual display component, an imaging detector and an optical assembly comprising an imaging lens and an objective lens housed within an imaging tube. Multiple illumination sources can be used in the microscope, including LED or laser diode sources. The microscope can also include interchangeable imaging tubes that enable bright field, dark field, fluorescence and other imaging modalities.

Abstract: Variable orientation illumination-pattern rotators (“IPRs”) that can be incorporated into structured illumination microscopy instruments to rapidly rotate an interference pattern are disclosed. An IPR includes a rotation selector and at least one mirror cluster. The rotation selector directs beams of light into each one of the mirror clusters for a brief period of time. Each mirror cluster imparts a particular predetermined angle of rotation on the beams. As a result, the beams output from the IPR are rotated through each of the rotation angles imparted by each of the mirror clusters. The rotation selector enables the IPR to rotate the beams through each predetermined rotation angle on the order of 5 milliseconds or faster.

Abstract: An embodiment of the present invention provide for an optical microscope apparatus including a light source, a base unit, a rotary monochromatic dispersion unit, a condenser, a stage, an objective, a tubular assembly and an ocular assembly. In a preferred embodiment, light travels from the light source sequentially through each of these seven components, producing an image of the contents of a slide on the stage to a user looking through the ocular assembly. In the base unit, in place of a standard mirror which would direct the light vertically up into the scope along the z-axis, a right angle piece of single crystal Calcite, known as Iceland Spar is used, which has a birefringent affect upon the light as it passes up through the scope.

Abstract: A system including a microscope and an inspection apparatus in which an objective lens having a large numerical aperture is used for detecting a defect existing inside a sample. A light source apparatus produces linearly polarized light. The polarization maintaining fibers optically coupled to the light source apparatus project the linearly polarized light onto the sample surface as an illumination beam of P-polarized light at an incidence angle substantially equal to the Brewster's angle of the sample. The scattered light generated by the defect existing in the sample is emitted from the sample and is collected by the objective lens whose optical axis is perpendicular to the sample surface. Since the illumination beam of P-polarized light is projected at the incidence angle equal to the Brewster's angle of the sample, no surface reflection occurs and it is possible to use the objective lens having a large numerical aperture.

Abstract: A laser scanning microscope, which is switchable between different operating modes, wherein it contains, for switching in the illumination beam path, an electro-optical modulator (EOM) in a first beam path, which electro-optical modulator has arranged, upstream and downstream of it, adjustable first and second polarization-rotating elements and, downstream of it, at least one first polarization splitter for producing a second beam path, in which light-influencing means are located, wherein one or more of the following operating modes of the LSM can be set:—Single spot LSM—multispot LSM—single spot FMM—multispot FMM—FRAP system.

Abstract: A microscope system includes: an illumination unit; a light control direction unit specifying quantity of light output from the illumination unit; a storage unit storing voltage-related information in which a direction value specified by the light control direction unit and a voltage value to be applied to the illumination unit are associated with each other and are set, the direction value being in an entire range that can be specified by the light control direction unit under each observation condition, the voltage value corresponding to the direction value; a light quantity control unit controlling the quantity of the emitted light; and a control unit acquiring the voltage value corresponding to the specified direction value from the voltage-related information corresponding to the observation condition, and allowing the light quantity control unit to control the quantity of light based on the acquired voltage value.

Abstract: An extended depth of field microscope system for phase object detection includes an imaging optical module and a phase/intensity converting module. The imaging optical module has an object lens group, in which an axial symmetric phase coding is added, to produce an axial symmetric spherical aberration. A point spread function (PSF) and an image with extended depth of field can be obtained with a predetermined level of similarity. The phase/intensity converting module converts the phase change of the light passing the phase object, into an image light with change of light intensity.

Abstract: A measurement apparatus includes a lamp mount including a first mount and a second mount. The first mount has a first cavity to mount an observation module. The second mount has a second cavity to mount an image capture module. The measurement apparatus further includes a plurality of light modules mounted on an undersurface of the lamp mount. The second mount is disposed with an included angle relative to a first axis of the first cavity so that a second axis of the second cavity and the first axis converge on a point. The undersurface of the lamp mount is concave so that light from the light modules tilts toward the first axis, and the light and the first axis also converge on the point.