Abstract: An endoscope includes: a first illumination optical system which emits illuminating light in a first linear polarization direction to an object from a distal end face of an insertion portion; and a first objective optical system which allows return light from the object to enter through an objective window provided in the distal end face; wherein the first illumination optical system and the first objective optical system are placed in a positional relationship such that on the distal end face, a line segment connecting an optical axis of the first illumination optical system and an optical axis of the first objective optical system is parallel or perpendicular to a polarization direction which results when the illuminating light emitted from the first illumination optical system is projected to the distal end face, and no polarizing element is provided between the object and the objective window.

Abstract: The automatic adjustment method of a microscopic image for automatically adjusting an image on the basis of the lightness of the microscopic image includes distinguishing an observation pixel being an observation target in the image from a non-observation pixel not being an observation target on the basis of the lightness of each pixel of the image, determining a representative value for representing the lightness of the image on the basis of the lightness of a selection pixel identified as the observation pixel and adjusting the lightness of the image on the basis of the representative value.

Abstract: The present application discloses various implementations of a laser scanning module. In one implementation, such a laser scanning module comprising an optical isolator including first and second linear polarizers, a collimating optics configured to receive light produced by a laser light source and to pass a substantially collimated light beam to the first linear polarizer, and a scanning unit situated to receive light passed by the second linear polarizer. The first linear polarizer is separated from the collimating optics by a first distance less than a second distance separating the second linear polarizer from the scanning unit.

Abstract: The present invention provides a scatterfield microscopical measuring method and apparatus, which combine scatterfield detecting technology into microscopical device so that the microscopical device is capable of measuring the sample whose dimension is under the limit of optical diffraction. The scatterfield microscopical measuring apparatus is capable of being controlled to focus uniform and collimated light beam on back focal plane of an objective lens disposed above the sample. By changing the position of the focus position on the back focal plane, it is capable of being adjusted to change the incident angle with respect to the sample.

Abstract: A microscope with at least one illumination beam that is phase modulated in a section along its cross-section with a modulation frequency and a microscope lens for focusing the illumination beam into a test as well as a detection beam path and at least one means of demodulation, wherein at least one polarization altering item is scheduled in the illuminating beam path, for which a phase plate is subordinated that exhibits at least two areas with different phase influence.

Abstract: A microscope, which moves an objective lens along an observation optical axis with respect to a specimen, includes an imaging unit and a supporting unit. The imaging unit has an imaging lens, which is arranged on the observation optical axis and forms an observation image of the specimen, and an imaging element, which is arranged on the observation optical axis and takes the observation image, and is optically connected to the objective lens by a parallel light flux. The supporting unit fixedly supports the imaging unit, and movably supports the objective lens.

Abstract: The present invention is low cost, does not exert a negative influence on the surroundings, has a small group-velocity delay dispersion, efficiently blocks reflected return light such that the laser light does not return to the laser light source, and allows properly polarized laser light to enter a polarization-dependent element in a subsequent stage. An optical device is provided which includes a laser light source, an optical system that transmits laser light emitted from the laser light source, and a polarization-dependent element into which the laser light transmitted by the optical system enters. The characteristics of outgoing light are changed according to a polarization state of the incident light. The optical system includes a reflected-light generator that reflects a part of the transmitted laser light, and ?/4 wave plates are disposed such that the reflected-light generator is disposed therebetween.

Abstract: The present invention relates to a fluorescent microscope and a remote control system thereof. The present invention reduces the size of the fluorescent microscope to facilitate transportation and management and be disposed in a narrow place such as the inside of the incubator or the clean bench, etc. and observes the samples through a remote control, thereby making it possible to improve the user convenience.

Abstract: A multi-mode optical fiber delivers light from a radiation source to a multi-focal confocal microscope with reasonable efficiency. A core diameter of the multi-mode fiber is selected such that an etendue of light emitted from the fiber is not substantially greater than a total etendue of light passing through a plurality of pinholes in a pinhole array of the multi-focal confocal microscope. The core diameter may be selected taking into account a specific optical geometry of the multi-focal confocal microscope, including pinhole diameter and focal lengths of relevant optical elements. For coherent radiation sources, phase randomization may be included. A multi-mode fiber enables the use of a variety of radiation sources and wavelengths in a multi-focal confocal microscope, since the coupling of the radiation source to the multi-mode fiber is less sensitive to mechanical and temperature influences than coupling the radiation source to a single mode fiber.

Abstract: A microscope includes a condenser lens that is provided in an illumination light path and in which at least one optical device is insertable into and removable from an illumination light axis for switching an observation method. The microscope also includes a first polarizing plate that is provided in a same light axis as the optical device and is insertable into and removable from the illumination light axis integrally with the optical device, and a second polarizing plate that is provided in the illumination light axis independently from insertion and removal of the optical device into and from the illumination light axis.

Abstract: Apparatus for imaging a surface, including an acousto-optic (AO) system. The AO system includes an AO element having a radiation input surface and a radiation output surface. The element is configured to receive radio-frequency (RF) pulses and a radiation input at the radiation input surface and to generate traveling beams from the radiation output surface. The AO system also includes an inhomogeneous polarization generator, positioned relative to the AO element so that the AO system outputs traveling inhomogeneously polarized beams. The apparatus includes objective optics which are configured to focus the inhomogeneously polarized beams onto the surface so as to form respective traveling spots thereon; collection optics, which are configured to collect scattered radiation from the traveling spots and to focus the scattered radiation to form respective image spots; and a detector which is arranged to receive the respective image spots and to generate a signal in response thereto.

Abstract: Various superimposing beam controls that can superimpose beams of light with different optical properties are described. In one aspect, a beam control receives a beam of light and outputs one or more beams. Each beam is output in a different polarization state and with different optical properties. Superimposing beam controls can be incorporated in fluorescence microscopy instruments to split a beam of excitation light into one or more beams of excitation light. Each beam of excitation light has a different polarization and is output with different optical properties so that each excitation beam can be used to execute a different microscopy technique.

Abstract: A microscope image processing method includes applying a computing operation to at least one part of a microscope image, having the following steps: (a) providing the image in the mass storage device, (b) breaking down the microscope image into at least two image segments that can be loaded into the working memory and that have a dimension m, where m?n, (c) for one image segment, determining all pixels that are located in the image segment and in at least one of the partial images, so that a filled image segment results, (d) providing the filled image segment in the working memory, (e) applying the computing operation to the pixels located in the filled image segment so that an image segment result is created, (f) repeating steps (c), (d), and (e) for all image segments, and (g) combining all image segment results to create an overall result.

Abstract: During mask inspection it is necessary to identify defects which also occur during wafer exposure. Therefore, the aerial images generated in the resist and on the detector have to be as far as possible identical. In order to achieve an equivalent image generation, during mask inspection the illumination and, on the object side, the numerical aperture are adapted to the scanner used. The invention relates to a mask inspection microscope for variably setting the illumination. It serves for generating an image of the structure (150) of a reticle (145) arranged in an object plane in a field plane of the mask inspection microscope. It comprises a light source (5) that emits projection light, at least one illumination beam path (3, 87, 88), and a diaphragm for generating a resultant intensity distribution of the projection light in a pupil plane (135) of the illumination beam path (3, 87, 88) that is optically conjugate with respect to the object plane.

Abstract: A microscope includes a condenser lens that is provided in an illumination light path and in which at least one optical device is insertable into and removable from an illumination light axis for switching observation method. The microscope also includes a first polarizing plate that is provided in the same light axis as the optical device and is insertable into and removable from the illumination light axis integrally with the optical device; and a second polarizing plate that is provided in the illumination light axis independently from insertion and removal of the optical device into and from the illumination light axis.

Abstract: An endoscope includes: a first illumination optical system which emits illuminating light in a first linear polarization direction to an object from a distal end face of an insertion portion; and a first objective optical system which allows return light from the object to enter through an objective window provided in the distal end face; wherein the first illumination optical system and the first objective optical system are placed in a positional relationship such that on the distal end face, a line segment connecting an optical axis of the first illumination optical system and an optical axis of the first objective optical system is parallel or perpendicular to a polarization direction which results when the illuminating light emitted from the first illumination optical system is projected to the distal end face, and no polarizing element is provided between the object and the objective window.

Abstract: The microscopic imaging apparatus includes a system controlling unit for obtaining a VD time setting value, and for obtaining the number of electric charge subtracting pulses, a synchronization signal generating unit for generating a vertical synchronization signal on the basis of the VD time setting value output from the system controlling unit and the horizontal synchronization signal, and a timing generating unit for extracting the electric charge of the imaging device by supplying the horizontal synchronization signal by the number of electric charge subtracting pulses to the imaging device as the electric charge subtracting pulses, and for generating a read pulse synchronous with the vertical synchronization signal in order to stop the accumulation of the electric charge of the imaging device after exposure is started.

Abstract: An unit for switchable arranging an arbitrary optical element on an optical path of fluorescence from among a plurality of types of the optical elements that transmit an excitation beam for exciting a sample and fluorescence emitted from the sample; an unit for picking up the observation image via the optical element arranged; and an unit for determining a type of the optical element arranged on the basis of the observation image picked up are prepared in order to provide a microscope image processing device, a program product, a program transmission medium and a method are provided, by which an optical element such as a fluorescence cube set on a fluorescence microscope can be identified on the basis of a detection result of an image pick up device that picks up an image of a sample to be observed by using the fluorescence microscope.

Abstract: A digital microscope is disclosed including: an image sensing circuit having an image sensing area thereon; a first object lens aligned with the image sensing area along an axis; a luminance device positioned outside the axis for emitting light toward a direction that is not coaxial with the axis; a light redirector positioned outside the axis for redirecting the light emitted from the luminance device; and a beam splitter positioned on the axis for changing the direction of light from the light redirector to provide an output light that is outputted substantially along the axis and coaxial with the axis; wherein the first object lens is positioned between the image sensing area and the beam splitter.

Abstract: Polarized light which is emitted from an optical fiber becomes circular polarized light bypassing through a first quarter wave plate. The circular polarized light which has entered a second quarter wave plate is converted into nearly linear polarized light which has S polarization. P polarization components are removed from the nearly linear polarized light by a polarizer, but the polarizer is not always necessary. The optical axis of the polarizer is set to be a direction which allows transmitting of S polarized light. The light that has passed through the polarizer is separated into diffracted lights by a diffraction grating, and is used as the structured illumination light.

Abstract: A Polarization Fluorescence Photoactivation Localization Microscopy (P-FPALM) system and method are provided to simultaneously image the localizations and fluorescence anisotropics of large numbers of single molecules within a sample. The system modifies known FPALM systems by adding a polarizing beam splitter. The beam splitter polarizes emissions perpendicular and parallel to an axis in the sample to allow spatially separate imaging of fluorescence emitted from a sample. The system includes lenses and mirrors so that the separate, polarized beams are detected simultaneously. The present invention includes methods of using the system to image localizations and fluorescence anisotropics of single molecules, and methods of using data obtained with the system to predict 3-D orientation of the molecules. The system and method achieve substantially improved lateral resolution within even dense samples over known microscopic imaging techniques, and does not compromise speed or sensitivity.

Abstract: Example embodiments relate to a circular dichroism fluorescent microscope having a confocal section. In the circular dichroism fluorescent microscope, a circularly polarizing/modulating section converts, into right and left circularly polarized lights, a light beam emitted from a light source. As such, the obtained right and left circularly polarized lights are focused on a sample so that the sample is irradiated with the right and left circularly polarized lights. Then, an optical lens focuses fluorescence emitted from the sample. Further, a wavelength selecting section transmits only fluorescence having a predetermined wavelength. Subsequently, the fluorescence having passed through the wavelength selecting section is detected.

Abstract: The invention relates to a microscope, more particularly to a fluorescence microscope, for the structured illumination microscopy, comprising a microscope light path having an optical axis, including a beam splitter for coupling illumination light into the microscope light path, including an illumination pattern unit disposed, in particular, in the microscope light path for the purpose of generating an illuminated pattern on, or in, a sample to be examined, comprising a rotary device for the purpose of effecting relative rotation about the optical axis between the illumination pattern and the sample to be examined.

Abstract: Provided is a scanning near-field optical microscope capable of obtaining in a highly sensitive manner, optical information having a spatial frequency higher than a spatial frequency corresponding to a wavelength of irradiation light. A scanning near-field optical microscope 100 according to the present invention includes: a light irradiating part 102 for emitting illumination light toward a sample 107; a light receiving part 112 for receiving light; a microstructure for generating or selectively transmitting near-field light, the microstructure being disposed on at least one of an emission side of the light irradiating part 102 and an incident side of the light receiving part 112; and an ultrahigh-wavenumber transmitting medium 108 for transmitting near-field light, the ultrahigh-wavenumber transmitting medium exhibiting anisotropy in permittivity or permeability.

Abstract: An apparatus in a simultaneous fluorescence excitation microscope is described, allowing simultaneous fluorescence excitation by light of at least two different wavelengths. The apparatus has a laser light source generating a light beam. A first beam splitter splits the light beam into a first partial light beam and a second partial light beam. A wavelength converter converts the wavelength of the first partial light beam. A microscope optical system into which the first partial light beam and the second partial light beam are coupled directs the two partial light beams onto an object to be examined.

Abstract: Embodiments of the present invention are directed to providing and controlling illumination for three-dimensional structured illumination microscopy. Three phase-coherent beams, referred to as a “beam triplet,” are produced with planar beamsplitters. The relative phases of the beams are controlled by piezo-coupled mirrors or other means. The beams pass through the microscope objective and interfere to produce the 3D structured illumination pattern. The spatial orientation and location of the pattern is manipulated by adjusting the relative phases of the beams.

Abstract: Non-rigidly coupled, overlapping, non-feedback optical systems for spatial filtering of Fourier transform optical patterns and image shape characterization comprises a first optical subsystem that includes a lens for focusing a polarized, coherent beam to a focal point, an image input device that spatially modulates phase positioned between the lens and the focal point, and a spatial filter at the Fourier transform pattern, and a second optical subsystem overlapping the first optical subsystem includes a projection lens and a detector. The second optical subsystem is optically coupled to the first optical subsystem.

Abstract: During mask inspection predominantly defects of interest which also occur during wafer exposure. Therefore, the aerial images generated in the resist and on the detector have to be as far as possible identical. In order to achieve an equivalent image generation, during mask inspection the illumination and, on the object side, the numerical aperture are adapted to the scanner used. A further form of mask inspection microscopes serves for measuring the reticles and is also referred to as a registration tool. The illumination is used by the stated conventional and abaxial illumination settings for optimizing the contrast. The accuracy of the registration measurement is thus increased. The invention relates to a mask inspection microscope for variably setting the illumination. It serves for generating an image of the structure (150) of a reticle (145) arranged in an object plane in a field plane of the mask inspection microscope.

Abstract: According to one embodiment, an optical isolation module comprises first and second linear polarizers, a Faraday rotator situated between the first and second linear polarizers and a transmissive element including a half-wave plate also situated between the first and second linear polarizers. In one embodiment, a method for performing optical isolation comprises rotating an axis of polarization of a linearly polarized light beam by a first rotation in a first direction, and selectively rotating a portion of the linearly polarized light beam by a second rotation in the first direction to produce first and second linearly polarized light beam portions. As a result, the first linearly polarized light beam portion undergoes the first rotation, and the second linearly polarized light beam portion undergoes the first and second rotations. The method further comprises filtering one of the first and second linearly polarized light beam portions to produce a light annulus.

Abstract: An embodiment of the present invention provide for an optical microscope apparatus including a light source, a base unit, a rotary monochromatic dispersion unit, a condenser, a stage, an objective, a tubular assembly and an ocular assembly. In a preferred embodiment, light travels from the light source sequentially through each of these seven components, producing an image of the contents of a slide on the stage to a user looking through the ocular assembly. In the base unit, in place of a standard mirror which would direct the light vertically up into the scope along the z-axis, a right angle piece of single crystal Calcite, known as Iceland Spar is used, which has a birefringent affect upon the light as it passes up through the scope.

Abstract: In order to furnish an optical component and a phase contrast microscope which can indicate difference of phases of a specimen including information of frequency and color, at least two optical mediums are arranged side by side so that a constant difference of the phases is generated.

Abstract: Device for controlling light radiation, which is excited in a specimen and/or which is backscattered and/or reflected and which contains one or more wavelengths, at a plurality of light outlets, wherein a separation of the light radiation into differently polarized components is carried out; and the components of the excitation radiation and/or detection radiation are affected in their polarization by means of a preferably birefringent, preferably acousto-optic or electro-optic medium, which changes the ordinary and extraordinary refractive index.

Abstract: Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material.

Abstract: A method and system for three-dimensional polarization-based confocal microscopy are provided in the present disclosure for analyzing the surface profile of an object. In the present disclosure, a linear-polarizing structured light formed by an optical grating is projected on the object underlying profile measurement. By means of a set of polarizers and steps of shifting the structured light, a series of images with respect to the different image-acquired location associated with the object are obtained using confocal principle. Following this, a plurality of focus indexes respectively corresponding to a plurality of inspected pixels of each image are obtained for forming a focus curve with respect to the measuring depth and obtaining a peak value associated with each depth response curve. Finally, a depth location with respect to the peak value for each depth response curve is obtained for reconstructing the surface profile of the object.

Abstract: A microscope includes a wire grid polarizing beam splitter that reflects a light emitted from a light source to a direction of an observation optical axis to cause the light to enter an objective lens, and transmits a reflected light from a specimen to cause the reflected light to enter an imaging lens; and a quarter wavelength plate that is placed between the objective lens and the specimen.

Abstract: The present invention relates to an imaging device (1) for imaging microscopic or macroscopic objects (5). The imaging device (1) comprises a light source (2), an illumination beam path (6), an imaging beam path (7) and an imaging optical means (4), in particular in the form of an objective. The illumination beam path (6) extends from the light source (2) to the object (5). The imaging beam path (7) extends from the object (5) to a detector or a tube (3). At least one polarization means (9) is provided in the illumination beam path (6), which polarization means (9) can be used to convert the light of the light source to a prescribable polarization state. An analyzer means (10) is provided in the imaging beam path (7), with the analyzer means (10) and the polarization means (9) being able to be adjusted in relation to one another in such a manner that the light entering the imaging beam path (7) cannot pass through the analyzer means (10).

Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Abstract: A microscope is provided for space-resolved measurement of a predetermined structure (12), said microscope comprising a source of radiation (2), which emits electromagnetic radiation (3) of a predetermined wavelength, an optical system (13), which irradiates the electromagnetic radiation (3) onto the structure (12) to be measured and images the structure (12), irradiated with the electromagnetic radiation, onto a detector (9), wherein the optical system (13) has two eigen polarization conditions (Z1, Z2), and the apparatus includes a polarization module (4) by which a polarization condition can be set for the electromagnetic radiation (3) of the source of radiation (2), which condition includes only components of a known quantity which correspond to the eigen polarization conditions (Z1, Z2).

Abstract: A microscope for introducing light from a light source via an objective lens to a sample so that a user observes the sample via the objective lens includes: a minute opening arranged in an optical path between the light source and the objective lens and on a focal plane of the image side of the objective lens or at a position conjugate with its conjugate plane; position adjusting means for adjusting the position of the minute opening so that the light from the light source via the minute opening is incident to the sample at the Brewster's angle; an polarizing element arranged in the optical path between the light source and the objective lens for extracting rectilinear polarized light from the light from the light source and applying the rectilinear polarized light to the sample.

Abstract: Methods and systems for improving high resolution imaging using a polarization-modulated tip enhanced optical microscope. A polarizer is configured to alternately create and remove a region of enhanced optical intensity adjacent the tip of the microscope probe at the focus of a light source. The sample being studied emits photons at specific rates relative to a background rate depending on the existence or nonexistence of the region of enhanced optical intensity. Comparing the rate of emissions when the region of enhanced optical intensity exists to when it does not creates a detailed image of the sample. By not requiring the probe to oscillate, this system enhances the resolution of the microscope without potentially causing damage to the sample.

Abstract: Provided is an optical microscope system for detecting nanowires to allow for use of an existing optical microscope in fabricating an electronic device having the nanowires and including: a light source for emitting light to provide the light to a nanowire sample; a rotational polarizer provided on a path of the light emitted from the light source for polarizing the light; an optical microscope for detecting a nanowire image using light that is polarized by the rotational polarizer and incident on the nanowire sample; a CCD camera provided in a region of the optical microscope for photographing and storing the nanowire image detected by the optical microscope; and a data processor for performing Fast Fourier Transform (FFT) on the nanowire image stored in the CCD camera. Intensity of reflected light varies, due to optical anisotropy of the nanowires, along a polarizing orientation of light incident on the nanowires.

Abstract: Method and arrangement for changing the spectral composition and/or intensity of illumination light and/or specimen light in an adjustable manner, wherein a spatial separation into radiation components of different polarization is carried out with a first polarizing device, a spectral, spatial splitting of at least one radiation component is carried out with first dispersion device, the polarization state of at least one part of the spectrally spatially split radiation component is changed, and a spatial separation and/or combination of radiation components of different polarization are/is carried out by a second polarizing device, wherein a spatial combination of radiation components which are changed and not changed with respect to their polarization state is advantageously carried out by a second dispersion device.

Abstract: A differential interference contrast microscope (DIC microscope) suitable for inspecting a specimen inside a measurement area comprises a light source, a beam splitter, a first and second polarizer, a first and second DIC prism, a wave plate, and an image sensor, wherein the beam splitter reflects the beam generated from the light source to the measurement area, and the beam be reflected from the measurement area passes through the beam splitter to the image sensor. The first polarizer is located between the light source and the beam splitter, and the second polarizer is located between the beam splitter and the image sensor. The first DIC prism, the wave-plate and the second DIC prism are located between the beam splitter and the measurement area in order. The included angle between the principal axis of the first DIC prism and the principal axis of the second DIC prism is 90 degree.

Abstract: An objective of the present invention is to provide a circular dichroism thermal lens microscope apparatus capable of identifying and quantifying optically active samples in ultra-trace amounts, and which has a higher sensitivity than conventional apparatuses. The objective is achieved by a circular dichroism thermal lens microscope apparatus which beams excitation light and detection light into an optical microscope, where the detection light enters a thermal lens formed by irradiating a sample with the excitation light, and a substance in a sample is detected by determining the diffusion of the detection light by the thermal lens, and where the excitation light is modulated by a phase-modulation element, so as to identify or quantify an optical isomer.

Abstract: A particle analysis system has an optical imaging device, e.g., a reflecting light stereomicroscope, that images a particle accumulation onto a substantially planar substrate. An illuminating device that includes a ring light on a lens barrel of the stereomicroscope illuminates at least part of the particle accumulation. The system includes a polarization device with an optical polarizer and an optical analyzer, and a positioning device displacing an illuminated measurement area of the particle accumulation grid by grid. An evaluating device with an electrical adjusting device obtains and evaluates imaging data on each measurement area. The optical polarizer and the optical analyzer are adjustable using the electrical adjusting device relative to each other in two polarizer positions. The imaging device generates imaging data of the particle accumulation with the polarizer positions in a software-controlled manner on each measurement area.

Abstract: The present invention provides a scatterfield microscopical measuring method and apparatus, which combine scatterfield detecting technology into microscopical device so that the microscopical device is capable of measuring the sample whose dimension is under the limit of optical diffraction. The scatterfield microscopical measuring apparatus is capable of being controlled to focus uniform and collimated light beam on back focal plane of an objective lens disposed above the sample. By changing the position of the focus position on the back focal plane, it is capable of being adjusted to change the incident angle with respect to the sample.

Abstract: Method and device for changing the illumination light and/or specimen light with respect to its spectral composition and/or intensity in an adjustable manner, wherein a spatial separation into the radiation components of different polarization is carried out with the first polarization means (Pol 1), a spectral spatial splitting of at least one radiation component is carried out with the first dispersion means (Disp1), and the polarization state of at least one part of the spectrally spatially split radiation component is changed, wherein a reflection of the illumination light and/or the detection light is carried out.

Abstract: Device for controlling light radiation, which is excited in a specimen and/or which is backscattered and/or reflected and which contains one or more wavelengths, at a plurality of light outlets, wherein a separation of the light radiation into differently polarized components is carried out; and the components of the excitation radiation and/or detection radiation are affected in their polarization by means of a preferably birefringent, preferably acousto-optic or electro-optic medium, which changes the ordinary and extraordinary refractive index.

Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.

Abstract: The present invention provides a method and an apparatus for fast finding the best resolution of an optical scanning device during assembling steps. The present invention improves the graphics of the calibration device. Accompanying with calculation of an adjustment device, the present invention generates a referencing parameters. The parameters represent the resolution of the optical scanning device; and further is able to show the balance of horizontal resolution and the balance of vertical resolution. In this case, technicians can optimize the best position of the lens in order to build an optical scanning with precision and narrow the misalignment during assembly.