Using Polarized Light Patents (Class 359/386)
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Patent number: 6449088Abstract: A variable dark-field illumination method and apparatus to produce microscopic and macroscopic images with a variable dark-field effect thereby making best use of various detector response characteristics. The variable dark-field of the invention is particularly characterized by an adjustable object contrast which optimizes the use of the various detectors dynamic range. The invention is particularly useful when coupled with a video camera and for macroscopic systems having a large depth object field. The dark-fields of the art have geometries which are objectionable because those geometries have very limited depths of field. The invention is particularly distinguished from the art as the dark-field methods and apparatuses of the art are generally geometrically restrictive and they do not provide variable contrast control for input images.Type: GrantFiled: November 5, 1993Date of Patent: September 10, 2002Assignee: EmCalInventors: James T. Pettingell, James T. Snyder
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Publication number: 20020089741Abstract: A differential interference contrast (DIC) microscope system is provided comprising: (a) an illumination source for illuminating a sample ; (b) a lens system for viewing the illuminated sample, including an objective, defining an optical axis; (c) at least one detector system for receiving a sample image; (d) mechanisms for wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the resultant DIC images on the detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, wavelength multiplexed DIC images to differ in either or both shear direction or magnitude.Type: ApplicationFiled: March 5, 2002Publication date: July 11, 2002Inventor: William P. Kuhn
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Patent number: 6414791Abstract: An optical system is provided with a pair of forward optical components each having a shutter for controlling the amount of transmission of a light from an object, an optical member for laying the optical axes of the pair of forward optical components one upon the other, and a rearward optical component disposed so that the optical axis thereof may coincide with the optical axes laid one upon the other. The optical system alternately varies the amounts of transmission of the light transmitted through the shutters of the pair of forward optical components to thereby time-serially form a parallax image.Type: GrantFiled: June 29, 1999Date of Patent: July 2, 2002Assignee: Canon Kabushiki KaishaInventor: Saburo Sugawara
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Patent number: 6404545Abstract: An optical apparatus and a microscope are designed so that high resolution and a high sectioning effect are provided; a time for obtaining an output image can be reduced; it is possible to observe the interior of an object in which light is strongly scattered, without using the fluorescent pigment; resistance to vibration is strong and observations can be carried out with high resolution; and a lamination structure of an IC pattern configured on a semiconductor wafer can also be observed.Type: GrantFiled: September 6, 2000Date of Patent: June 11, 2002Assignee: Olympus Optical Co., Ltd.Inventor: Hiroshi Ishiwata
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Patent number: 6404544Abstract: A differential interference contrast (DIC) microscope system is provided comprising: (a) an illumination source for illuminating a sample; (b) a lens system for viewing the illuminated sample, including an objective, defining an optical axis; (c) at least one detector system for receiving a sample image; (d) mechanisms for wavelength multiplexing the shear direction or shear magnitude or both on the sample and demultiplexing the resultant DIC images on the detector; and (e) a mechanism for modulating the phase of the interference image. Various approaches are disclosed to accomplish wavelength multiplexing of shear direction and demultiplexing the two DIC images that result. It is possible for the two, wavelength multiplexed DIC images to differ in either or both shear direction or magnitude.Type: GrantFiled: May 26, 2000Date of Patent: June 11, 2002Assignee: Optical Perspectives Group, LLCInventor: William P. Kuhn
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Publication number: 20020030884Abstract: The present invention concerns an optical arrangement for the illumination of specimens (1) for confocal scanning microscopes, having an illuminating beam path (2) and at least one light source (4), and is intended to make possible an efficient illumination of specimens in a confocal scanning microscope while decoupling mechanical vibrations from the confocal scanning microscope, the optical arrangement being intended to be economical and low-maintenance. The optical arrangement according to the present invention is characterized in that the light of the light source (3) is coupled into a fiber (4) in which laser transitions can be induced; and that at least the laser light induced in the fiber (4) serves for specimen illumination.Type: ApplicationFiled: September 6, 2001Publication date: March 14, 2002Inventors: Johann Engelhardt, Juergen Hoffmann
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Publication number: 20020030885Abstract: An optical arrangement, in particular a microscope, having a light source (1) for illuminating an object, and a glass fiber (3), arranged between the light source (1) and the object, for transporting light along a prescribable distance between the light source (1) and the object, is configured with regard to the avoidance of fluctuations in the illuminating light power without a handicap in the optical adjustment of the arrangement in such a way that the glass fiber (3) is a polarizing glass fiber (3).Type: ApplicationFiled: July 16, 2001Publication date: March 14, 2002Inventors: Johann Engelhardt, Juergen Hoffmann
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Patent number: 6320697Abstract: A microscope having a device for selectable illumination for observation of a specimen by ultraviolet light, DUV light, or by visible light, and which can keep ultraviolet light and visible light separate. The microscope includes a visible light illuminating system to illuminate a specimen with visible light, an ultraviolet light illuminating system to illuminate the specimen with ultraviolet light, a visible light observation system to observe the specimen illuminated by the visible light illuminating system, and an ultraviolet light observation system to observe the specimen by the ultraviolet light illuminating system.Type: GrantFiled: February 28, 2001Date of Patent: November 20, 2001Assignee: Nikon CorporationInventor: Atsushi Takeuchi
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Patent number: 6319598Abstract: An electromagnetic wave attenuating transparent member includes; a transparent base material, and a plurality of structural layers including at least one transparent conductive layer. Sheet resistivity of the electromagnetic wave attenuating transparent member is 100 &OHgr;/cm2 or less, and the plurality of structural layers include a first layer and a second layer which is provided to be farther than the first layer from the transparent base material, and has density which is higher than that of the first layer.Type: GrantFiled: July 22, 1999Date of Patent: November 20, 2001Assignee: Konica CorporationInventors: Satoshi Nakano, Setsuo Tokuhiro, Shingo Nakamura, Tatsuo Ohta
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Patent number: 6317259Abstract: An interference microscope includes an illumination optical system for making two light beams fall on a subject, an observation optical system for forming an interference image by causing interference between the two light beams from the subject, a detection unit for detecting the interference image, and a calculation unit for calculating a phase difference between the two light beams from a result of the detection by the detection unit. The two light beams contain light having a plurality of wavelengths. The detection unit detects light intensities with respect to the light having the plurality of wavelengths that is contained in the interference image. The calculation unit obtains such a wavelength as to minimize the light intensity from the light intensities of the light having the plurality of wavelengths which are detected by the detection unit, and sets, as the phase difference, a magnitude of the obtained wavelength.Type: GrantFiled: July 6, 2000Date of Patent: November 13, 2001Assignee: Nikon CorporationInventor: Kumiko Matsui
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Patent number: 6317261Abstract: A phase contrast observation device for observing a phase object (O), and phase apertures for same. The device comprises, in order along an optical axis (AX), a light source (LS) capable of providing light (L), an illumination optical system (G2 and G3) for condensing the light and illuminating the object, an aperture stop (AP) having an aperture (AO) therein, arranged in the illumination optical system, an objective lens system (G2 and G3) for converging light from the illuminated object and forming an image of the object. The device also includes one of a number of novel phase apertures (Ph1-Ph4) arranged at a position inside said objective lens conjugate to the aperture stop. The phase apertures of the present invention allow for high-contrast and low-contrast imaging regardless of the phase content of the object.Type: GrantFiled: June 30, 1999Date of Patent: November 13, 2001Assignee: Nikon CorporationInventor: Tatsuro Otaki
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Publication number: 20010021063Abstract: A microscope, in particular for confocal scanning microscopy, having a light source (1) for illuminating an object (6) to be investigated. An optical device (9, 12) is provided for splitting transmitted light (15) passing through the object (6) and fluorescent light (10, 13) produced in the object (6). A segmenting device (17) acting on the transmitted light (15) is configured with regard to a detection-light path which is as short as possible in such a way that the segmenting device (17) is arranged between the object (6) and the light-splitting device (9, 12).Type: ApplicationFiled: January 24, 2001Publication date: September 13, 2001Applicant: Leica Microsystems Heidelberg GmbHInventor: Werner Knebel
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Differential interference contrast microscope and microscopic image processing system using the same
Publication number: 20010010591Abstract: A differential interference contrast microscope including an illuminating light source 61, a polarizer 62 for converting an illumination light ray into a linearly polarized light, a polarized light separating means 63 for dividing the linearly polarized light ray into two linearly polarized light rays having mutually orthogonal vibrating directions, an illuminating optical system 64, 65 for projecting the two linearly polarized light rays onto an object 66 under inspection, a polarized light combining means 69 for combining the two linearly polarized light rays on a same optical path via an inspecting optical system 67, 68, an analyzer 70 for forming a differential interference contrast image on an imaging plane 71.Type: ApplicationFiled: March 19, 2001Publication date: August 2, 2001Inventor: Kenichi Kusaka -
Differential interference contrast microscope and microscopic image processing system using the same
Patent number: 6229644Abstract: A differential interference contrast microscope including an illuminating light source, a polarizer for converting an illumination light ray into a linearly polarized light, a polarized light separating means for dividing the linearly polarized light ray into two linearly polarized light rays having mutually orthogonal vibrating directions, an illuminating optical system for projecting the two linearly polarized light rays onto an object under inspection, a polarized light combining unit for combining the two linearly polarized light rays on a same optical path via an inspecting optical system, an analyzer for forming a differential interference contrast image on an imaging plane.Type: GrantFiled: May 16, 2000Date of Patent: May 8, 2001Assignee: Olympus Optical Co., Ltd.Inventor: Kenichi Kusaka -
Patent number: 6219179Abstract: The method for splitting and reflecting beams in a laser scanning microscope which produces a laser beam (1) comprises the steps of: reflecting a beam from a partially reflecting mirror (2); splitting the laser beam (1) with a splitting device into partial beams (5); causing the partial beams to travel in a plane; directing the partial beams to a sample under investigation; providing the partially reflecting mirror (2) with a constant transmission; placing the partially reflecting mirror between two high reflectivity mirrors (3,4); transmitting the laser beam (1) to one of the high reflectivity mirrors (3); reflecting said beam (1) to the other one of the high reflectivity mirrors (4) with basically equal attenuation; repeatedly transmitting the beam to one of the mirrors; and repeatedly reflecting the beam to the other one of said mirrors (4); arranging the partially reflecting mirror and the high reflectivity mirrors (3,4) relative to each other to cause beams (5) reflected by the partially reflecting mirroType: GrantFiled: January 27, 2000Date of Patent: April 17, 2001Assignee: Lavision GmbHInventors: Tim Nielsen, Peter Andresen
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Patent number: 6208460Abstract: A removable head for an ophthalmic slit lamp assembly that replaces the conventional slit lamp microscope with a laser and binocular microscope combination. The optic axis of the laser is aligned to the optic axis of the binocular microscope so the optical head can be removed and used with another slit lamp assembly. An adaptor provides adjustable connection between the optical head and a microscope support arm of the slit lamp assembly. The adaptor consists of a base member and a frame member. The frame member is rotated and translated relative to the base member to align the optic axis of the optical head to the slit lamp optic axis.Type: GrantFiled: August 4, 1999Date of Patent: March 27, 2001Assignee: Taracan Pty Ltd.Inventors: Keith Raymond Degenhardt, Victor Konrad Previn
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Patent number: 6185035Abstract: An optical microscope that can observe the image of a sample by scanning the sample, wherein are provided a beam splitter to branch a linearly polarized incident light beam and a light beam reflected from the sample; an objective lens to illuminate the sample by focusing the incident light beam on the sample; and a quarter wavelength plate disposed between the objective lens and sample, whereby the placement of the quarter wavelength plate on the sample side of the objective lens improves the S/N ratio and allows low reflectivity samples to be measured.Type: GrantFiled: February 24, 1999Date of Patent: February 6, 2001Assignee: Yokogawa Electric CorporationInventors: Shinya Otsuki, Takeo Tanaami
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Patent number: 6144489Abstract: A confocal microscope comprises a light source, a focusing arrangement, a detector and an encoded mask (17). The light source illuminates the mast (17) and the encoded light is then focused on a specimen. Light from the specimen is then decoded, by either the same or a separate complementary mask, before being detected, for example by a camera. The mask (17) is encoded with a pattern which generates a combined confocal and non-confocal image and the confocal image is subsequently extracted from the combined image. This means that confocal images of different regions of the specimen can be produced simultaneously, which in turn enables real-time confocal imaging of the specimen. In addition, as the microscope is no longer restricted to delta correlated images, an improvement in the light budget can also be achieved.Type: GrantFiled: August 21, 1998Date of Patent: November 7, 2000Assignee: Isis Innovation LimitedInventors: Tony Wilson, Mark Andrew Aquilla Neil, Rimvydas Juskaitis
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Patent number: 6137626Abstract: An optical system having a polarization compensating optical system capable of compensating for retardation with high accuracy. The polarization compensating optical system includes a half-wave plate (22), a first optical system (23a) having at least one uncoated refracting surface (26, 27), and a second optical system (23b) having at least one coated refracting surface (24, 25). The total rotation of the polarization plane introduced in rays passing through the entire optical system is reduced to approximately zero by rotation of the polarization plane produced by the first optical system (23a), and the total retardation introduced in the rays is reduced to approximately zero by retardation produced by the second optical system (23b).Type: GrantFiled: June 23, 1998Date of Patent: October 24, 2000Assignee: Olympus Optical Co., Ltd.Inventor: Hideyuki Takaoka
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Patent number: 6130776Abstract: For observing transparent phase objects and the like, an optical microscope is provided with an aperture element 13 and an optical modulation element 14 that creates an image having the detecting sensitivity of the phase contrast imaging technique while simultaneously realizing an image having the three-dimensional sense provided by the modulation contrast imaging technique. In the present invention, the aperture is shaped as an angular segment of a circular ring that is centered on the optical axis and the corresponding optical modulation element includes either a light attenuating phase plate in the shape of a circular ring, or a light attenuating region in the shape of a circular ring with all other regions of the optical modulation element adding a phase retardation to the light passing therethrough.Type: GrantFiled: April 28, 1999Date of Patent: October 10, 2000Assignee: Olympus Optical Co., Ltd.Inventor: Hideyuki Takaoka
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Differential interference contrast microscope and microscopic image processing system using the same
Patent number: 6128127Abstract: A differential interference contrast microscope including an illuminating light source, a polarizer for converting an illumination light ray into a linearly polarized light, a polarized light separating unit for dividing the linearly polarized light ray into two linearly polarized light rays having mutually orthogonal vibrating directions, an illuminating optical system, for projecting the two linearly polarized light rays onto an object under inspection, a polarized light combining unit for combining the two linearly polarized light rays on a same optical path via an inspecting optical system, an analyzer for forming a differential interference contrast image on an imaging plane.Type: GrantFiled: December 5, 1997Date of Patent: October 3, 2000Assignee: Olympus Optical Company, Ltd.Inventor: Kenichi Kusaka -
Patent number: 6111690Abstract: A confocal microscopic equipment for measuring the solid shape of a sample at high speeds, and which does not require scanning of an irradiating light beam, wherein are provided a light source, apertures on which the output beam from the light source is irradited, an objective lens that forms stationary images of the apertures on the sample and collects the reflected or fluorescent light from the sample, a photo detector, and a beam splitter that makes the beam that has passed through the apertures incident to the objective lens by means of transmission or reflection and focuses the output beam from the objective lens on the photo detector by reflection or transmission.Type: GrantFiled: November 5, 1999Date of Patent: August 29, 2000Assignee: Yokogawa Electric CorporationInventor: Takeo Tanaami
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Patent number: 6055097Abstract: In an improved optical microscope for observing a luminescent specimen, the specimen is excited by a single, on axis standing wavefield or multiple superposed series of standing wave fields. Then an image of the specimen is recorded and displayed. This specimen can be incrementally moved and additional images can be recorded and processed. Images of the specimen recorded when there are nodes or antinodes at the focal plane of the microscope can be combined by image processing to produce an improved image or set of images of the specimen. Also disclosed are improved standing wave microscopes having a phase conjugator, a transmitted light source, feedback stabilization, an extended light source for field synthesis or a beam contractor. A multiple wavelength light source can be used to view a specimen marked with multiple luminescent dyes.Type: GrantFiled: April 8, 1998Date of Patent: April 25, 2000Assignee: Carnegie Mellon UniversityInventors: Frederick Lanni, D. Lansing Taylor, Brent Bailey
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Patent number: 6025917Abstract: Provided is a polarization characteristic measuring method and apparatus for accurately measuring a polarization characteristic of fluorescence or Raman-scattered light emitted when a sample is exposed to light. The sample is exposed to excitation light radiated from a pulsed excitation light source and converted to p-polarized light by polarizer and half-wave plate, and photodetectors measure an intensity I.sub.pp of a p-polarized component and an intensity I.sub.ps of an s-polarized component of fluorescence emitted from the sample under irradiation with the excitation light. In similar fashion, the sample is exposed to the excitation light of s-polarized light and the detectors measure an intensity I.sub.sp of a p-polarized component and an intensity I.sub.ss of an s-polarized component of fluorescence emitted from the sample under irradiation. From these measured values, G factor is calculated according to the following equation:G=[(I.sub.pp .multidot.I.sub.sp)/(I.sub.ps .multidot.I.sub.ss)].sup.Type: GrantFiled: May 1, 1998Date of Patent: February 15, 2000Assignee: Laboratory of Molecular BiophotonicsInventors: Shuji Toyonaga, Masahisa Shiroshita, Takayuki Suga, Yoshitaro Nakano
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Patent number: 6025956Abstract: An incident-light fluorescence microscope including: (i) a transmission illuminating optical system which has a first optical member for receiving light emitted from a light source and extracting transmitted light and which irradiates the transmitted light onto a sample, and (ii) an observation optical system which has an objective lens and a second optical member and which is positioned closer to the objective lens than the sample. An incident-light fluorescence illuminating optical system is provided in the observation optical system, wherein the first optical member has a peak of transmittance at a wavelength longer than the fluorescent wavelength, and the second optical member selectively modulates only a wavelength transmitted through the first optical member.Type: GrantFiled: December 16, 1996Date of Patent: February 15, 2000Assignee: Olympus Optical Co., Ltd.Inventors: Takashi Nagano, Keiji Shimizu, Kenji Kawasaki, Kiyonobu Kurata, Masakazu Shimada
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Patent number: 6005709Abstract: Microscope systems invention provide ability to image specimens, including specimens within living bodies, by imaging with transmitted light rather than solely with reflected light. The microscope systems may be general purpose instruments, or can be custom designed for a particular specimen.Type: GrantFiled: June 5, 1996Date of Patent: December 21, 1999Assignee: Marine Biological LaboratoryInventor: Robert B. Silver
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Patent number: 5969853Abstract: An optical microscope is provided with an aperture element 13 and an optical modulation element 14 that creates an image having the detecting sensitivity of the phase contrast imaging technique while simultaneously realizing an image having the three-dimensional sense provided by the modulation contrast imaging technique. There are four regions (two of which may have the same transmittance value and be contiguous in portions of the optical modulation element), are provided on a single optical modulation element 14, these regions including a first light absorbing region 14a having transmittance Ta, a second light absorbing region 14b having transmittance Tb and positioned adjacent to the first light absorbing region, a first light transmitting region 14c having a transmittance Tc and positioned adjacent to the first light absorbing region 14a, and a second light transmitting region 14d having a transmittance Td, wherein Ta is greater than Tb and less than Tc, Ta is less than Td, Tc is greater than 0.Type: GrantFiled: September 19, 1997Date of Patent: October 19, 1999Assignee: Olympus Optical Co., Ltd.Inventor: Hideyuki Takaoka
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Patent number: 5969855Abstract: A microscope apparatus that has an electronic image pickup device arranged on an image surface of an imaging optical system, a component for separating light from a light source into two portions, a device for changing a phase difference between the two portions of light, a device for storing information on the images picked up by the image pickup device, and information processor for processing the information of images. The images are picked up by the electronic image pickup device as the phase difference is changed, and the information on the images is multiplied by a periodic function, as a weight function, which is given the phase difference as variable, and a resultant product is integrated so that a differential interference microscope apparatus capable of accurately obtaining a phase distribution of the object or a phase-contrast microscope apparatus capable of effectively enhancing a resolving power without lowering an image contrast is obtained.Type: GrantFiled: October 11, 1996Date of Patent: October 19, 1999Assignee: Olympus Optical Co., Ltd.Inventors: Hiroshi Ishiwata, Toyohiko Yatagai, Masahide Itoh
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Patent number: 5926311Abstract: Method and apparatus for illuminating a transparent material for identifying individual features in the material having similar refractive indices, without using a phase-contrast microscope, by illuminating the material by light directed at an angle to a reflective surface which directs the light through the material to a viewing device such as a microscope.Type: GrantFiled: February 28, 1997Date of Patent: July 20, 1999Assignee: International Business Machines CorporationInventors: Joshua Monroe Cobb, Robert Francis Florence, Jr., Franz X. Topolovec, Uldis Artis Ziemins
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Patent number: 5841577Abstract: A light microscope comprises a light source and a first acousto-optic tunable filter responsive to the light source for producing two light streams of different polarization. A control circuit is provided for tuning the first filter to a plurality of frequencies. A mechanism, such as steering optics, is provided for combining the two light streams into a combined light stream. Input optics focus the combined light stream. A condenser, such as a darkfield condenser, receives the focused, combined, light stream and projects it onto a sample. A second acousto-optic tunable filter is responsive to light from the sample. A second control circuit is provided for tuning the second acousto-optic filter to a plurality of frequencies. The light from the second acousto-optic tunable filter may be captured and stored for future processing.Type: GrantFiled: February 16, 1996Date of Patent: November 24, 1998Assignee: Carnegie Mellon UniversityInventors: Elliot S. Wachman, Daniel L. Farkas, Wen-Hua Niu
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Patent number: 5835262Abstract: A high-accuracy multi-wavelength optical microscope for providing a satisfactory contrast of image and much information about a sample. The microscope includes a plurality of light sources, a wavelength varietor independently varying the wavelength of the individual light sources, and polarization plane rotators on the optical path for each light source.Type: GrantFiled: December 28, 1995Date of Patent: November 10, 1998Assignees: Research Development Corporation of Japan, Olympus Optical Co., Ltd.Inventors: Yoshinori Iketaki, Masaaki Fujii
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Patent number: 5801881Abstract: In an improved optical microscope for observing a luminescent specimen, the specimen is excited by a single, on axis or multiple superposed series of standing wave fields. Then an image of the specimen is recorded and displayed. This specimen can be incrementally moved and additional images can be recorded and processed. Images of the specimen recorded when there are nodes or antinodes at the focal plane of the microscope can be combined by image processing to produce an improved image or set of images of the specimen. Also disclosed are improved standing wave microscopes having a phase conjugator, a transmitted light source, feedback stabilization, an extended light source for field synthesis or a beam contractor. A multiple wavelength light source can be used to view a specimen marked with multiple luminescent dyes.Type: GrantFiled: February 23, 1995Date of Patent: September 1, 1998Assignee: Carnegie Mellon UniversityInventors: Frederick Lanni, D. Lansing Taylor, Brent Bailey
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Patent number: 5764407Abstract: An display apparatus has an image displaying device for modulating light by a spatial light modulation element and displaying an image, a relay optical system for forming the image on an imaging plane at a location differing from the image displaying device, an eyepiece optical system for directing the light from the imaging plane to an observer's pupil, and light beam controlling device provided in a portion of the relay optical system for controlling the amount of transmission of a light beam from the image displaying device correspondingly to the inclination of the contrast distribution of the light beam.Type: GrantFiled: May 4, 1995Date of Patent: June 9, 1998Assignee: Canon Kabushiki KaishaInventor: Norihiro Nanba
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Patent number: 5764363Abstract: An observation apparatus of the present comprises (i) a light source for generating light; (ii) a separating optical system which splits the light from the light source into two different polarized light beams; (iii) a condenser optical system which converges the two polarized light beams from the separating optical system so as to respectively form light spots on two different positions on a sample object; (iv) a polarization selecting means which has a predetermined analyzer angle and selects a specific polarized light component from composite light made of the two polarized light beams by way of the sample object; (v) light detecting means which detects the polarized light component selected by the polarization selecting means; and (vi) phase difference adjustment means which adjusts a phase difference between the two polarized light beams by way of the sample object and guides composite light composed of the two polarized light beams as circularly polarized light to the polarization selecting means, whenType: GrantFiled: June 28, 1996Date of Patent: June 9, 1998Assignee: Nikon CorporationInventors: Hiroshi Ooki, Yutaka Iwasaki, Jun Iwasaki, Tsuneyuki Hagiwara
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Patent number: 5760950Abstract: A scanning confocal microscope optical system overcomes the difficulties of previous devices and can be used in diagnostic applications that are inaccessible to previous devices. The optical system for forming an image of a subject illuminated by light from an illumination system includes a Nipkow disk that is perpendicular to a light propagation path and that has a surface upon which a plurality of pinholes are distributed substantially symmetrically about an axis perpendicular to the surface of the disk. The system further includes components for projecting an image of a first set of the pinholes onto a second set of the pinholes, the image being formed of light transmitted by the first set of the pinholes when the first set is illuminated by light that impinges on a first side of the disk. The system further includes a collective lens and a first objective lens for focussing light transmitted by the second set of the pinholes onto the subject and for collecting light reflected by the subject.Type: GrantFiled: July 25, 1996Date of Patent: June 2, 1998Assignee: Advanced Scanning, Ltd.Inventors: Miroslav Maly, Pavel Vesely
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Patent number: 5757542Abstract: A polarizing accessory system for use with a microscope. The microscope comprises an optical tube having a eye-piece lens and an objective lens, a stage having an aperture therein, and a light conveying rod arranged to covey light through the aperture to the objective lens and the eye-piece lens. The accessory system comprises a first, tray-like polarizing unit arranged to be disposed on the microscope stage over the aperture, and a second, cup-shaped polarizing unit arranged to be releasably mounted over the eye-piece lens. Each polarizing unit includes a planar polarizing filter or film mounted therein. The tray-like unit comprises a peripheral planar frame defining a central window in which a first polarizing filter element is located. The central window forms a support surface for two, conventional specimen-holding slides disposed in a side-by-side array. The width of the window is equal to the width of the slides to hold them securely in place thereon.Type: GrantFiled: September 25, 1996Date of Patent: May 26, 1998Inventor: Dennis Brock
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Patent number: 5751475Abstract: A phase contrast microscope including an illuminating optical system, a ring slit arranged at a pupil of the illuminating optical system, an imaging optical system, and a phase plate arranged at a pupil of the imaging optical system which is conjugate with the pupil of the illuminating optical system with respect to a specimen plane on which a specimen under inspection is placed. The phase plate is formed by a liquid crystal and a pair of transparent ring-shaped electrodes arranged on both sides of the liquid crystal. A voltage applied across the liquid crystal via the electrodes is changed such that a phase difference introduced by the phase plate is set to .+-..pi./2 to obtain a dark contrast image and a bright contrast image. A difference between these dark and bright contrast images is derived to obtain a phase contrast image having high contrast and resolution.Type: GrantFiled: December 16, 1994Date of Patent: May 12, 1998Assignee: Olympus Optical Co., Ltd.Inventors: Hiroshi Ishiwata, Chikara Nagano
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Patent number: 5731894Abstract: A multi-purpose objective for use in a compound microscope wherein the microscope has an eyepiece and a multi-purpose processing element in the back focal plane or Fourier plane of the objective and an aperture or slit for the light source situated in the front focal plane or conjugate Fourier plane of the condenser. An aperture specimen stage is disposed between the condenser and objective lenses. The multi-purpose light processing element has a plurality of light processing regions upon a selected region of which the image of the aperture slit is formed. The aperture element is moveable relative to the multi-purpose light processing element so as to direct light onto the selected region of the multi-purpose processing element.Type: GrantFiled: December 19, 1995Date of Patent: March 24, 1998Inventor: Leo Gross
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Patent number: 5708526Abstract: A contrasting process and device allows a relief contrast to be obtained for microscopic amplitude and/or phase objects. The input aperture (L') of the condenser (2) is partially and asymmetrically masked at the same time as an image (S') of a sector diaphragm (S) is generated in the output aperture (L") of the objective lens (3), a phase segment (8) of a phase plate (7) covering the image (S') at least partially. The size of the phase segment (8) may be adapted to the size of the image (S') cutout; it may however also be substantially smaller. In the latter case, the sector diaphragm (5) may have additional attenuating sectors (D) made of semi-transparent material with a defined attenuating factor, for example 15%. The process and device are suitable for transmitted light and/or reflected light microscopy in a normal or inverted beam path.Type: GrantFiled: April 28, 1995Date of Patent: January 13, 1998Assignee: Leica Mikroskopie und Systeme GmbHInventor: Hans-Werner Stankewitz
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Patent number: 5701198Abstract: The invention is directed to a confocal incident light microscope for viewing an object. The microscope includes: an illuminating device for transmitting an illuminating beam along an illuminating beam path; a viewing optical assembly for defining a viewing beam path; an optical unit for joining the illuminating beam path and the viewing beam path to form a common beam path; a perforated mask arranged in the common beam path at an angle .delta. to a plane perpendicular to the common beam path; an imaging optic arranged between the perforated mask and the object; a first prism having a first wedge-shaped section arranged in the common beam path between the optical unit and the perforated mask; the first wedge-shaped section defining a wedge angle .alpha.Type: GrantFiled: April 1, 1996Date of Patent: December 23, 1997Assignee: Carl Zeiss JENA GmbHInventor: Gunter Schoppe
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Patent number: 5691840Abstract: Described in this invention is a microscope that can examine a specimen of an anisotropic property regardless of the specimen being thin or thick, i.e., opaque or transparent. The video microscope includes a first light guide for a transmission method; a first polarizer for partially polarizing the light from the first light source, arranged beneath a stage on which a specimen is placed; a second light guide for reflection method; a second polarizer for partially polarizing the light from the second light source, provided in the second light guide; a lens assembly admitting the polarized light from the first or second polarizer and including an objective, an analyzer, and a compensating plate; a beam splitter for reflecting the polarized light from the second polarizer to an object provided in the lens assembly; a CCD mount in which CCD is provided, mounted on the lens assembly; and height and focus adjustment.Type: GrantFiled: November 8, 1995Date of Patent: November 25, 1997Assignee: Samsung Aerospace Industries, Ltd.Inventors: Jaewoo Bae, Haenam Jeon
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Patent number: 5673103Abstract: An exposure apparatus for reducing/projecting a plurality of patterns of a photomask, which are elongated in at least two different directions, onto a substrate through the photomask includes a polarized light source for illuminating the photomask, a polarization control unit for changing the direction of polarization of polarized light from the polarized light source, a slit filter arranged at a position where the polarized light is focused and having a slit-like opening portion elongated in a direction perpendicular to the direction of polarization of the polarized light, the slit filter transmitting polarized light, of the polarized light passing through the photomask, which has the direction of polarization, a unit for changing the direction of the opening portion of the slit filter in synchronism with a change in direction of polarization of polarized light which is made by the polarization control unit, and a unit for illuminating the photomask with the polarized light at each position where the directiType: GrantFiled: August 23, 1996Date of Patent: September 30, 1997Assignee: Kabushiki Kaisha ToshibaInventors: Soichi Inoue, Satoshi Tanaka, Tadahito Fujisawa
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Patent number: 5659420Abstract: A confocal optical apparatus comprising a light source, a first aperture portion for passing light emitted from the light source and obtaining a point source, an objective lens for causing the light that has passed through the first aperture portion to converge on a measurement object, a second aperture portion located on a plane conjugate with the convergence surface on the measurement object, and light detectors for detecting light that has passed through the second aperture portion, wherein placing the first and second aperture portions in the same position and using them as the same aperture portion, as well as positioning the detection surfaces of the light detectors substantially on the same surfaces as the conjointly used identical aperture portions make it possible to reduce the size and weight of the apparatus, to perform three-dimensional shape measurements rapidly and accurately, and to facilitate the alignment of each portion.Type: GrantFiled: May 26, 1995Date of Patent: August 19, 1997Assignee: Kabushiki Kaisha Komatsu SEisakushoInventors: Hideyuki Wakai, Kiyokazu Mizoguchi, Toru Suzuki, Keiji Terada, Masato Moriya, Manabu Ando, Koji Shio
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Patent number: 5612818Abstract: A confocal microscope is adapted to prevent a shading phenomenon of an observation image due to axial chromatic aberration and chromatic aberration of magnification of an objective optical system. A backward light from a specimen illuminated by an excitation light through the objective optical system is condensed through the objective optical system and a deflecting optical system at a position conjugate to the condensing point on the specimen. Formed in a light shielding member aligned with the condensing point position of the backward light is a pinhole having an opening which substantially covers a range of movements of the condensing point of the backward light caused as a result of the movement of the optical path by the deflecting optical system.Type: GrantFiled: September 7, 1994Date of Patent: March 18, 1997Assignee: Nikon CorporationInventors: Satoru Kumagai, Hiroshi Ohki
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Patent number: 5572359Abstract: A differential interference microscope which includes a light source, a condenser optical system for condensing beams of light from the light source and illuminating an object with the beams of light, an objective optical system for converging the beams of light from the illuminated object and forming an image of the object, a pick-up device for photoelectrically detecting the image of the object, and a contrast enhancement circuit for enhancing a contrast of the image on the basis of an output signal of the pick-up device. A first polarizing element and a first birefringent element are disposed sequentially in an optical path between the light source and the object. The first polarizing element changes the beams of light from the light source into predetermined beams of polarized light. The first birefringent element separates the polarized light into an ordinary ray and an extraordinary ray.Type: GrantFiled: June 30, 1994Date of Patent: November 5, 1996Assignee: Nikon CorporationInventors: Tatsuro Otaki, Takashi Kawahito
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Patent number: 5559630Abstract: In the establishment of interference colors in weakly birefringent materials within living organisms, in fixed tissues or in preparations of liquid crystals, a compensating birefringent plate is positioned in series with the object in the direction of the light path between a crossed polarizer and analyzer in a polarizing microscope, and is aligned with the vibrational direction of its slow wave at a small angle of horizontal rotation from the vibrational direction of the polarizer or of the analyzer. The small angle of rotation is between 2.degree. and 15.degree., more especially 4.degree. and 7.5.degree.. The chromatic response (color intensity) is enhanced and increased color contrast is obtained for all live organisms, freshly fixed sections, and liquid crystal preparations.Type: GrantFiled: February 17, 1995Date of Patent: September 24, 1996Assignee: The Open UniversityInventors: Mae-Wan Ho, Michael J. Lawrence
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Patent number: 5521755Abstract: An epi-illumination system for microscopes is described, which contains an epi-illumination module (18) that consists of a Smith-splitter with an integrated telescope system (14). The telescope system (14) corrects in the sense of "Shift-Optics" differences in length that appear when switching from a modularly-designed 45 degree neutral splitter (20) to a Smith-splitter containing module (18). The arrangement of the two lenses in the telescope system (14) is such that the positive member (15) is directed towards the mirror (4) of the Smith-splitter and the negative member (16) is directed towards the light source (6). Alternatively it is also possible to install a telescope system with an opposite lens arrangement in a module (19), containing a 45-degree neutral splitter, if this is exchanged for a Smith-splitter containing module, so that the negative member (16) is directed towards the 45-degree neutral splitter (20) and the positive member (15) is directed towards the light source (6).Type: GrantFiled: June 27, 1994Date of Patent: May 28, 1996Assignee: Leica Mikroskopie und Systeme GmbHInventor: Hans-Werner Stankewitz
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Patent number: 5420717Abstract: An interference microscope includes a light source, a member for splitting up light from the light source into two components, a member for recombining the two components emerging from a sample, a polarizing plate whose transmission axis is oriented at a predetermined angle with directions of polarization of the two components, and an imaging element for detecting the light transmitted through the polarizing plate. This interference microscope is provided with a member for changing the state of polarization on an optical path from the light source to the splitting member, or an optical path from the recombining member to the imaging element. Thus, the interference microscope allows the setting and adjustment of contrast to be easily performed without affecting an imaging relationship.Type: GrantFiled: February 17, 1993Date of Patent: May 30, 1995Assignee: Olympus Optical Co., Ltd.Inventor: Seiichiro Tabata
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Patent number: 5394268Abstract: In an improved optical microscope for observing a luminescent specimen, the specimen is excited by a time-multiplexed series of standing wave fields. Then an image of the specimen is recorded and displayed. This specimen can be incrementally moved and additional images can be created and combined. Images of the specimen can also be created when there are nodes or antinodes at the focal plane of the microscope. These images can also be combined to produce an improved image of the specimen.Type: GrantFiled: February 5, 1993Date of Patent: February 28, 1995Assignee: Carnegie Mellon UniversityInventors: Frederick Lanni, D. Lansing Taylor, Brent Bailey
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Patent number: 5386317Abstract: A method and apparatus for imaging a substrate (such as silicon or silicon dioxide) beneath and between a dense array of strips (such as photoresist strips composed of dielectric or other material) using a polarizing optical microscope. In preferred embodiments, the apparatus of the invention includes a polarizer for polarizing optical illuminating radiation, an analyzer for receiving polarized radiation reflected from the sample, and a variable retarder whose retardation characteristic can be controlled to enhance the light signal transmitted through the analyzer from the substrate in a region of interest of the sample. The variable retarder can be a fixedly mounted retarder whose birefringence is variable in response to a control signal, or a rotatably mounted retarder plate having fixed birefringence which is mechanically rotatable to control the orientation of its optical axis.Type: GrantFiled: May 13, 1992Date of Patent: January 31, 1995Assignee: Prometrix CorporationInventors: Timothy R. Corle, Younus Vora, Kamran Sarmadi