With Illumination And Viewing Paths Coaxial At The Image Field Patents (Class 359/389)
  • Patent number: 6239904
    Abstract: A forensic microscope, particularly for examination of writing, comprising a single-channel microscope with stereo viewing by synchronized interchange of the illumination angle in front of the microscope objective and/or of the angle of observation following the microscope objective and, further, by fluorescence excitation in a range of approximately 340 to 360 nm and/or between 400 nm and approximately 590 nm.
    Type: Grant
    Filed: June 10, 1999
    Date of Patent: May 29, 2001
    Assignees: Carl Zeiss Jena GmbH
    Inventors: Thomas Serfling, Volker Heerich
  • Patent number: 6236502
    Abstract: In an operation microscope, target light flux that is parallel light flux is projected at eyes of an operator, light reflected thereon is used to obtain an image of the pupil of the eye, and the position of a Purkinje image is detected to calculate the direction of the visual line of the operator's eyes. Observation magnification of an observation optical system is also calculated from the output of a potentiometer. The resultant direction of the visual line and observation magnification are used to calculate the position of the visual line of the operator. A liquid crystal display is arranged behind a half mirror when viewed from eyepiece side of a branch observation optical system, and displays as a spot image the position information indicating the calculated position of the visual line of the operator's eye.
    Type: Grant
    Filed: January 5, 2000
    Date of Patent: May 22, 2001
    Assignee: Kabushiki Kaisha Topcon
    Inventor: Nobuaki Kitajima
  • Patent number: 6222671
    Abstract: An optical element switching device capable of quickly and reliably switching among optical elements. The optical element switching device includes a fixed guide section mounted on a housing, and a movable guide section mounted movably relative to the fixed guide section and provided with more than three optical elements. By moving the movable guide section, one of the optical elements is selectively inserted into the optical path. The optical element switching device further includes a restricting mechanism for limiting the number of optical elements which can be inserted into the optical path by restricting the movement of the movable guide section.
    Type: Grant
    Filed: November 12, 1997
    Date of Patent: April 24, 2001
    Assignee: Nikon Corporation
    Inventor: Yasushi Ogihara
  • Patent number: 6219181
    Abstract: A microscope includes a stage on which a specimen is placed, a light source for illuminating the specimen, an objective lens for passing an illumination light from the specimen, an image formation system for forming an optical image of the specimen, a monitor for displaying as a visible picture the optical image of the specimen obtained from the image formation system, and an observation condition switch for switching the observation condition for the specimen from one to another. In particular, the optical axis extending from the light source to the image formation system is horizontal over the floor and various controls constituting the observation condition switch are mounted intensively on one side of a main body of the microscope.
    Type: Grant
    Filed: June 4, 1998
    Date of Patent: April 17, 2001
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Takashi Yoneyama, Takashi Nagano, Hideaki Endo, Atsuhiro Tsuchiya
  • Patent number: 6215586
    Abstract: An active optical image enhancer for a microscope, and a method of enhancing an image for a microscope, are provided. The image enhancer has a tube for attachment to a microscope. Photo-detector elements are disposed on an end of the tube remote from an end thereof that is attachable to the microscope. Lens elements are disposed in or on the tube between the photo-detector elements and the end of the tube that is attachable to the microscope. The optical path length of the tube is adjustable via an appropriate device.
    Type: Grant
    Filed: May 25, 1999
    Date of Patent: April 10, 2001
    Assignee: R.K.C. Technologies Inc.
    Inventor: Natalie Clark
  • Patent number: 6208460
    Abstract: A removable head for an ophthalmic slit lamp assembly that replaces the conventional slit lamp microscope with a laser and binocular microscope combination. The optic axis of the laser is aligned to the optic axis of the binocular microscope so the optical head can be removed and used with another slit lamp assembly. An adaptor provides adjustable connection between the optical head and a microscope support arm of the slit lamp assembly. The adaptor consists of a base member and a frame member. The frame member is rotated and translated relative to the base member to align the optic axis of the optical head to the slit lamp optic axis.
    Type: Grant
    Filed: August 4, 1999
    Date of Patent: March 27, 2001
    Assignee: Taracan Pty Ltd.
    Inventors: Keith Raymond Degenhardt, Victor Konrad Previn
  • Patent number: 6204962
    Abstract: A confocal microscope is provided that can perform automatic focussing. A beam splitter (9) is additionally disposed along an optical path of light split from reflected light from the surface of an object of a confocal microscope, whereby when light is focussed on the surface of a light detector (7), a difference between a quantity of light detected by a second light detector (11) and a quantity of light detected by a third light detector (13) is constructed so as to become a predetermined quantity, while when light is not focussed on the surface of the light detector (7), the difference between the quantity of light detected by the second light detector and the quantity of light detected by the third light detector is a quantity of light that is different from the predetermined quantity, and the object is automatically controlled such that the difference in quantity of light between the light detectors becomes the predetermined quantity.
    Type: Grant
    Filed: September 14, 1999
    Date of Patent: March 20, 2001
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Ichiro Kawamura
  • Patent number: 6201254
    Abstract: The present invention relates to a system for determining the alignment of an object, whose image is to be recorded, with a coupling eyepiece and an image capture apparatus that defines an image plane (Pi), comprising: an image capture apparatus (2) equipped with the ability for adjusting its own position; a light source (1) that emits at least two non-focused luminous dots (1a, 1b); eyepiece coupling lens(es) or element(s) (3) that focus on an object plane (Po); an opaque mask (4) that is perforated with at least two holes (5a, 5b) and that is positioned in front of light source (1) such that it transmits at least part of the light emitted by the light source; and calculating mechanism for determining whether alignment exists and, in the case of non-alignment, for quantifying the non-alignment.
    Type: Grant
    Filed: March 3, 1999
    Date of Patent: March 13, 2001
    Assignee: Commissariat a l'Energie Atomique
    Inventor: RĂ©gis Guillemaud
  • Patent number: 6188514
    Abstract: The invention relates to a confocal microscope which has high resolving power and a great focal depth and is capable of observing a sample in real time, so that a fine stereoscopic structure of a highly integrated IC or the like can be inspected, and provides a confocal microscope in which a pinhole substrate 2 having a plurality of pinholes, located at a position of an image formed by an objective 4, is illuminated by light coming from a light source 1 to focus light passing through pinhole substrate 2 onto a sample 6 by objective 4 so that an image is formed thereon, light reflected at sample 6 is again focused onto pinhole substrate 2 through objective 4 to form an image thereon, light passing through pinhole substrate 2 is focused by a relay lens 7 or the like to re-form an image in the form of a sample image, and sample 6 is scanned with light by high-speed rotation of pinhole substrate 2 to obtain a reconstructed image of sample 6, wherein a longitudinal chromatic aberration-producing optical element 5
    Type: Grant
    Filed: February 4, 1998
    Date of Patent: February 13, 2001
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yoshiharu Saito, Hiroyuki Nishida
  • Patent number: 6185036
    Abstract: A confocal system comprising a laser light source; a confocal scanner that emits an output light beam from the light source after passing through apertures; an optical microscope that focuses light passed through the apertures onto a sample; a detector that obtains cross sectional images of the sample by photographing the return light reflected from the sample; and a controller that determines focal positions of the sample using light intensity at cross sectional images based on a focal position light intensity characteristic, whereby focal postions and three dimensional shape of the sample is obtained without scanning in the direction of the optical axis.
    Type: Grant
    Filed: March 6, 1999
    Date of Patent: February 6, 2001
    Assignee: Yokogawa Electric Corporation
    Inventor: Takeo Tanaami
  • Patent number: 6147800
    Abstract: A reflective light fluorescence system that functions on a stereo microscope with two distinct optical paths to illuminate samples that have been stained with a fluorochrome or that may exhibit autofluorescence. The stereo microscope includes a source of illumination and a filter module with two dichroic mirrors, for sending an excited wavelength of the illumination equally down both optical axes to excite the sample uniformly. A portion of the illumination light passes through the first dichroic mirror, which is preferably about 50% dichroic, to the second dichroic mirror, while the remaining light is reflected down one optical path of the microscope. The second dichroic mirror, which is preferably about 100% dichroic, reflects 100% of the remaining portion of the illumination light down the second optical path. Thus, the sample is uniformly excited by the illumination light reflected down both optical paths. The resulting emitted signal is transmitted from the sample up through the optical paths equally.
    Type: Grant
    Filed: September 25, 1997
    Date of Patent: November 14, 2000
    Assignee: Kramer Scientific Corporation
    Inventor: Lothar K. Faber
  • Patent number: 6147798
    Abstract: A novel attachment for a microscope to be coupled to an optical coupling tube of a microscope. The attachment for a microscope includes a light source generating a quasi-collimated light output. Elements are provided for reflecting the light output from the light source towards a specimen in the microscope. Further, elements are provided for propagating a reflection of the light output from the light source from the specimen to a viewing point. The elements for achieving the reflecting and the elements for achieving the propagating may each include a spinning Nipkow disk and a dichroic mirror. The quasi-collimated light output from the light source directly impinges on the Nipkow disk, i.e., without being focused on the Nipkow disk and without passing through a lens. A right angle mirror can also be positioned as one of the elements for achieving the reflecting and the propagating.
    Type: Grant
    Filed: October 24, 1997
    Date of Patent: November 14, 2000
    Assignee: Atto Instruments, LLC.
    Inventors: Gary Brooker, Scott McDonald, Gregory Adams, Jeff Brooker
  • Patent number: 6124967
    Abstract: An apparatus for observing an object comprises an illumination optical system for illuminating an object to be observed with visible light, an observing optical system for observing the object positioned within a visual field illuminated by the illumination optical system, an index projecting optical system for projecting index for focus, the optical system having projecting luminous flux of wavelength at least a part of which is common with the wavelength of illumination luminous flux of the illuminating optical system, device for restricting luminous flux of index by intermittently projecting index light from the index projecting optical system, each projecting time being set so that no photogene occur in an examiner's eye, device for restricting luminous flux of illumination by intermittently conducting illumination by the illuminating optical system when index projection is not conducted, and by restricting the time of not conducting illumination to a time not recognized by the examiner, and device for de
    Type: Grant
    Filed: February 22, 1995
    Date of Patent: September 26, 2000
    Assignee: Nidek Co., Ltd.
    Inventor: Minoru Toh
  • Patent number: 6108127
    Abstract: A confocal scanning microscope includes a light source which provides a light beam and scanning optics which sweep the light beam across the surface of a sample. Light from the surface or interior of the sample passes through a pinhole lens which focuses the light on a pinhole for detection by an optical detector. An image of the surface may be scanned using the optical detector. An optical element is inserted in a detection arm of the confocal microscope. The optical element provides angular magnification and natural divergence to the beam from the surface of the sample.
    Type: Grant
    Filed: May 15, 1997
    Date of Patent: August 22, 2000
    Assignee: 3M Innovative Properties Company
    Inventor: Matthew R. C. Atkinson
  • Patent number: 6094300
    Abstract: A laser scanning microscope having a first scanning optical system that causes coherent light projected from a first laser light source to scan a specimen, and a second scanning optical system that projects coherent light output from a second laser light source at a given position on the specimen. Fluorescence from the specimen is measured by a photoelectric conversion element.
    Type: Grant
    Filed: November 18, 1997
    Date of Patent: July 25, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Shingo Kashima, Yosuke Kishi
  • Patent number: 6094274
    Abstract: The present invention provides a fluorescence detecting device comprising a light source, an excitation filter set, a dichroic mirror, an objective, an absorption filter set and an observation optical system, whereinthe excitation filter set includes two interference films with a transmittance of 25% or more at a wavelength by 20 nm shorter than the cross-over wavelength when the wavelength at the crossing point between the transmittance spectrum at a longer wavelength side of the excitation filter set and the transmittance spectrum at a shorter wavelength side of the absorption filter set is defined as a cross-over wavelength, thereby enabling to obtain a bright fluorescent image with a very high S/N ratio without requiring a filter with higher precision.
    Type: Grant
    Filed: June 4, 1999
    Date of Patent: July 25, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Eiji Yokoi
  • Patent number: 6075643
    Abstract: Caged reagent release experiments are carried out by introducing laser light of a laser light source for the Caged reagent release of a first reflected illumination optical system light path into a sample side through a first dichroic mirror on a cube turret and also introducing excitation light of a mercury lamp for the excitation light irradiation of a third reflected illumination optical system light path into the sample side through a first dichroic mirror on a slider. Laser trap experiments are carried out by introducing excitation light of a mercury lamp for the excitation light irradiation of a second reflected illumination optical system light path into the sample side through a second dichroic mirror on the cube turret and also introducing laser light from the laser light source for the laser trap of the third reflected illumination optical system light path into the sample side through a second dichroic mirror on the slider.
    Type: Grant
    Filed: October 20, 1998
    Date of Patent: June 13, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yukio Nonoda, Yasushi Aono, Katsuyuki Abe
  • Patent number: 6069733
    Abstract: A stereomicroscope has a left and a right stereo radiation path and an adjusting device for selecting a stereo base. A main lens is arranged between an object to be observed and the adjusting device, which may be designed as an opto-mechanical switching device. The arrangement allows an integrated structure with low light losses.
    Type: Grant
    Filed: January 27, 1999
    Date of Patent: May 30, 2000
    Assignee: Leica Microsystems AG
    Inventors: Roger Spink, Bernhard Braunecker, John Rice Rogers, Klaus-Peter Zimmer
  • Patent number: 6064518
    Abstract: A beam deflecting unit for multiple-axis examination of specimens in a microscope is disclosed which, on the one hand, enables the illumination and/or observation of the specimen from several sides and, on the other hand, allows observation of the specimen at an angle to the illumination axis. The examination of the specimen is carried out with an available microscope and with the beam deflecting unit according to the invention which is located between the microscope objective and the focal plane.
    Type: Grant
    Filed: July 28, 1998
    Date of Patent: May 16, 2000
    Assignee: Carl Zeiss Jena GmbH
    Inventors: Ernst H. K. Stelzer, Steffen Lindek
  • Patent number: 6050693
    Abstract: An improved laser projector collimator includes a plurality of specifically designed and arranged mirrors and lenses such that reflected light from a housing window for the laser projector is not directed onto a reflected light source sensor. In this way, the sensor only sees light reflected from a reference reflector. In addition, the specific arrangement of the lenses and mirrors is such that the overall length of the collimator housing is greatly reduced.
    Type: Grant
    Filed: March 11, 1997
    Date of Patent: April 18, 2000
    Assignee: Virtek Vision Corporation
    Inventors: Kurt D. Rueb, John P. Wieczorek
  • Patent number: 6052223
    Abstract: A microscope includes a light source for emitting light, a light condenser lens for condensing the light from the light source onto an object, a wavelength selection unit arranged between the light source and the light condenser lens for selecting the wavelength of the light entering the light condenser lens from the light source, a detector for detecting light from the object through the light condenser lens, and an optical path length adjusting unit arranged between the light source and the detector for adjusting the optical path length between the light condenser lens and the detector in order to correct the chromatic aberration of the light condenser lens appearing depending on the wavelength of the light selected by the wavelength selection unit.
    Type: Grant
    Filed: November 25, 1998
    Date of Patent: April 18, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Takashi Yoneyama, Kenji Karaki, Kazuo Kajitani
  • Patent number: 6042934
    Abstract: A substrate having the following layers in the following order thereon; first dielectric layer, first layer with infrared reflection properties, second dielectric layer, second layer having infrared reflection properties, and third dielectric layer. The thickness of the first layer with infrared reflection properties is 50% to 64% of that of the second layer having infrared reaction properties. The optical thickness of the first dielectric layer is greater than the thickness of the third dielectric layer by at least 100%. The substrate and the layers together exhibit an external reflection color in the range of blue to blue-green at both 0.degree. and 60.degree. incidence angles.
    Type: Grant
    Filed: July 31, 1997
    Date of Patent: March 28, 2000
    Assignee: Saint-Gobain Vitrage
    Inventors: Olivier Guiselin, Jean-Pierre Brochot, Pascal Petit
  • Patent number: 6043932
    Abstract: A laser microscope for picking up an image of a specimen at a high speed and a pattern checking apparatus for checking a pattern at a high speed with a high sensitivity can be provided. A plurality of light beams aligned in a first direction are produced from a light source device (1, 10), and these light beams are projected onto a specimen (7, 30) by an objective lens (6, 29) to form a light spot array on the specimen. The specimen is moved in a direction perpendicular to the light spot array or the light beams are moved by a beam deflecting device in said direction to scan the specimen two-dimensionally. Light beams emanating from the light spots on the specimen are made incident upon corresponding light receiving elements of a linear image sensor (11, 33). In case of checking periodic patterns such as memory cell patterns, a pitch of the light spots is corresponded to a pitch of the patterns, and defects in the patterns can be detected by comparing output signals from respective light receiving elements.
    Type: Grant
    Filed: April 2, 1998
    Date of Patent: March 28, 2000
    Assignee: Lasertec Corporation
    Inventor: Haruhiko Kusunose
  • Patent number: 6040940
    Abstract: A reflecting fluorescence microscope has a reflecting fluorescence illumination optical system, an observation optical system, and a specimen supporting means for mounting a specimen. In this case, an optical member for attenuating excited light supplied from the reflecting fluorescence illumination optical system is interposed between the specimen and the specimen supporting means. Thus, an observation in which little auto-fluorescent light is produced and a contrast is good can be carried out.
    Type: Grant
    Filed: February 1, 1999
    Date of Patent: March 21, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Kenji Kawasaki
  • Patent number: 6034815
    Abstract: A laser scan microscope comprises a laser scanning observation optical system for irradiating a sample with a laser beam while scanning the beam over the sample, and detecting the beam transmitted through the sample by means of a detector after the beam passes through a condenser lens, an ordinary observation optical system for irradiating the sample through the condenser lens by means of an illumination lamp, so that a transmitted image of the sample is allowed to be observed, and an optical transmission fiber array having a two-pronged structure having a first optical path extending from a condenser lens-side to the detector and a second optical path extending from the condenser lens-side to the illumination lump.
    Type: Grant
    Filed: March 12, 1999
    Date of Patent: March 7, 2000
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Masakazu Shimada
  • Patent number: 6031661
    Abstract: A confocal microscopic equipment for measuring the solid shape of a sample at high speeds, and which does not require scanning of an irradiating light beam, wherein are provided a light source, apertures on which the output beam from the light source is irradited, an objective lens that forms stationary images of the apertures on the sample and collects the reflected or fluorescent light from the sample, a photo detector, and a beam splitter that makes the beam that has passed through the apertures incident to the objective lens by transmission or reflection and focuses the output beam from the objective lens on the photo detector by reflection or transmission.
    Type: Grant
    Filed: January 5, 1998
    Date of Patent: February 29, 2000
    Assignee: Yokogawa Electric Corporation
    Inventor: Takeo Tanaami
  • Patent number: 6011647
    Abstract: A switchable illumination system for a surgical microscope in eye surgery, which is provided with a light source, a collector lens system, a radiant field stop, optical deflecting elements, further lenses and a main objective. The radiant field stop is projected via the deflecting elements and the further lenses through the main objective onto the patient's eye to be viewed in the object plane. In the illumination beam there is provided a switching mechanism whereby the lamp filament of the light source is projected via the optical deflecting elements and the main objective onto the patient's eye to be viewed in the object planes.
    Type: Grant
    Filed: December 28, 1994
    Date of Patent: January 4, 2000
    Assignee: Leica Mikroskopie Systeme AG
    Inventor: Otto Geschwentner
  • Patent number: 5973829
    Abstract: The invention is directed to an illuminating arrangement (5) for a surgical microscope (1) having an illuminating beam path (7) which runs essentially coaxially to the optical axis (9) of the surgical microscope. The illuminating arrangement (5) includes an optical ancillary element (15) having a positive refractive power. The ancillary element (15) can be selectively pivoted into and out of the illuminating beam path. The illuminating aperture in the region of the optical axis (9) of the surgical microscope (1) is increased by pivoting the optical ancillary element (15) into the illuminating beam path (7). This is done without changing the viewing focal intercept of the surgical microscope (1).
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: October 26, 1999
    Assignee: Carl-Zeiss-Stiftung
    Inventors: Gerhard Moller, Joachim Steffen, Christian Lucke
  • Patent number: 5963366
    Abstract: A focus detection unit including an optical system employing an image sandwiching method is disclosed. In the focus detection unit, a double slit mask (12) forming double sight lines is disposed on the optical axis of a lamp 10 while a single slit mask (16) forming an single sight line is disposed on the optical axis of a lamp (14). A triangular pole prism 18 is provided, consisting of first and second side surfaces, which together constitutes an edge, and a plane opposing the edge. The prism (18) is disposed such that the double and single sight line are able to irradiate the first and second side surfaces. The prism reflects the incoming lines toward a plane before the right-angle edge. Before the edge of the prism (18), a projection lens (20) is provided for forming images of the double and single sight lines which have been reflected by the prism (18) and separated by a mask (22), at a both aiming line imaging position 100. The images are projected onto a workpiece.
    Type: Grant
    Filed: November 6, 1997
    Date of Patent: October 5, 1999
    Assignee: Mitutoyo Corporation
    Inventors: Taizo Nakamura, Yasushi Fukumoto, Yuwu Zhang
  • Patent number: 5932871
    Abstract: A microscope includes a light source, an objective lens for converging light emitted from the light source onto a sample, and an optical detector for detecting either light from the sample via a confocal point diaphragm or light from the sample which does not pass through the confocal point diaphragm. A range of a focusing point is detected in accordance with the light which does not pass through the confocal diaphragm, and the focusing point is then detected in accordance with the light detected via the confocal point diaphragm in the detected range of the focusing point.
    Type: Grant
    Filed: November 6, 1996
    Date of Patent: August 3, 1999
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Shuji Nakagawa, Akihiro Kitahara, Asao Uenodai
  • Patent number: 5923466
    Abstract: The confocal imaging system and method involve the imaging of a specimen under observation by projecting a light pattern of illumination spots simultaneously on the specimen. This is accomplished by a pattern array unit which transforms light from a light source into a desired pattern of illumination spots, and reflects or rejects light outside the pattern. Light detected from the specimen is confined to a pattern conforming to the pattern of the illumination spots by the same pattern array unit which rejects light beyond the pattern, and rejected light from the pattern array unit is transmitted back to the light source. Image signals are created from the received light and stored, and the stored image signals are combined to form a complete image frame.
    Type: Grant
    Filed: December 20, 1996
    Date of Patent: July 13, 1999
    Assignee: Biophysica Technologies, Inc.
    Inventors: Andrew W. Krause, Minhua Liang, Robert L. Stehr
  • Patent number: 5896224
    Abstract: The invention relates to a confocal microscope with a perforated disc arranged in an intermediate plane (perforated disc microscope). A confocal diaphragm is arranged in an intermediate tube which is to be installed on a conventional microscope between the microscope stand and the eyepiece tube. In addition to the movable diaphragm disc, the intermediate tube has an illumination system for confocal microscopy. The reflection of the additional illumination preferably takes place at a dichroic beam splitter. The intermediate tube is thus particularly suitable for confocal fluorescence microscopy. The entering and leaving beam paths of the intermediate tube are telecentric, so that the intermediate tube can also be used in microscopes with objects corrected to infinity focal intercept. The fluorescence wavelength can be varied by means of different dichroic beam splitters in a reflector turret.
    Type: Grant
    Filed: August 30, 1995
    Date of Patent: April 20, 1999
    Assignee: Carl-Zeiss-Stiftung
    Inventor: Hans-G. Kapitza
  • Patent number: 5867312
    Abstract: An illumination system and method for 3-D viewing and increasing resolution, sharpness, depth of field, and perception of depth for a light microscope including an objective lens having an optical axis, wherein one or more illuminating light beams are focused onto the specimen via paths that include the objective lens and are not coincident with the objective lens optical axis, and reflection beams follow paths that include the objective lens.
    Type: Grant
    Filed: May 15, 1996
    Date of Patent: February 2, 1999
    Assignee: Edge Scientific Instrument Company LLC
    Inventor: Gary Greenberg
  • Patent number: 5867311
    Abstract: In a microscope having one or more separate lenses 11a to 11d arranged in side-by-side relationship within an area equal to or smaller than that of an objective lens for guiding separate beams of viewing light L respectively, the separate lenses 11a to 11d are located off the optical axis S which extends across the center of the objective lens, and a single illumination input 13 is provided across the optical axis S for directing an illumination light R along the optical axis S through the objective lens to a target area to be viewed.
    Type: Grant
    Filed: February 25, 1997
    Date of Patent: February 2, 1999
    Assignee: Mitaka Kohki Co., Ltd.
    Inventor: Katsushige Nakamura
  • Patent number: 5856883
    Abstract: For optimizing the perception of the red reflex in eye operations, deflecting elements are arranged in the illuminating beam path in the illuminating device of an operation microscope with optically-mechanically coupled observer and co-observer tubes. The deflected illuminating beam pencils overlap, at least partially, the main observer observation beam paths and at least one of the co-observer observation beam paths.
    Type: Grant
    Filed: December 20, 1993
    Date of Patent: January 5, 1999
    Assignee: Carl-Zeiss Stifting
    Inventor: Ulrich Sander
  • Patent number: 5831736
    Abstract: A method and apparatus for generating an image of a specimen comprises dividing the in-focus plane of an objective of an optical apparatus into a plurality of grid regions. Incident light is directed to the grid regions to illuminate surface portions of the specimen that are within the grid regions. Light reflected from the surface portions is sensed to determine approximate spatial slopes of each surface portion associated with each grid region. The spatial slopes are integrated to generate a topographical map representative of surface portions of the specimen that are within the depth of focus of the objective. Consecutive planes can be obtained to generate topographical maps thicker than the depth of focus of the objective.
    Type: Grant
    Filed: August 29, 1996
    Date of Patent: November 3, 1998
    Assignee: Washington University
    Inventors: Jeff W. Lichtman, Jose-Angel Conchello
  • Patent number: 5825535
    Abstract: A pancratic magnification system for at least two observation beam paths within a stereo microscope consists of a first and a second optical component that are displaceable in a defined manner along a common optical axis, following which a third, stationary, optical component is arranged. Variation of magnification is achieved by means of defined displacement of the first two optical components. A focusing on a desired object plane can be effected by displacement of only the first optical component. The pancratic magnification system is arranged after a common main objective for said at least two observation beam paths within the stereo microscope.
    Type: Grant
    Filed: November 13, 1995
    Date of Patent: October 20, 1998
    Assignee: Carl Zeiss Stiftung
    Inventors: Klaus Biber, Fritz Strahle
  • Patent number: 5825533
    Abstract: A structure that changes from a confocal observation mode to a normal observation mode is made possible while keeping a Nipkow disk in a fixed position. A main optical system includes a confocal illumination light source, a first half mirror, a Nipkow disk, an objective lens, a relay lens and an ocular lens for conducting confocal observation. A bypass optical system includes a normal illumination light source, a second half mirror and first, second and third fully reflective mirrors. The bypass optical system is appended to the main optical system to form the tandem scanning confocal microscope. The first and third fully reflective mirrors can be moved out of and separated from the light path of the main optical system. As a result, with the position of the Nipkow disk fixed, it is possible to change between confocal and normal observation modes.
    Type: Grant
    Filed: June 4, 1997
    Date of Patent: October 20, 1998
    Assignee: Nikon Corporation
    Inventor: Yasuo Yonezawa
  • Patent number: 5804813
    Abstract: The linear slope range of the axial response curve of confocal imaging is utilized to obtain nanometer depth resolution, a sample which is at the top of a piezo-electric translator (PZT) 6, using a highly spatial-coherent light source, high numerical aperture focusing devices, a pinhole, and an optical detector to produce the axial response of confocal imaging Before the measurement, the calibration of height and resolution must be done by fitting the linear slope range of the axial response curve to a straight fitting line. While measuring surface profiles, the sample height is first finely adjusted to the linear slope range, and a two-dimensional scanning is then performed on the plane vertical to the detecting light beam. The signal of optical detector which represents the variation of the surface height, is then recorded. In this way, a three-dimensional image of the sample surface profile can be obtained with nanometer depth resolution.
    Type: Grant
    Filed: June 6, 1996
    Date of Patent: September 8, 1998
    Assignee: National Science Council of Republic of China
    Inventors: Jyh Pyng Wang, Chau-Hwang Lee
  • Patent number: 5760952
    Abstract: An illuminating device for a surgical microscope, which device has a light source arranged outside the observing beam path, a first deflector for light arranged between the light source and the observing beam path of the microscope, and a second deflector for light arranged closer to the observing beam path than the first deflector, is distinguished in that the first deflector comprises two deflecting elements of which one is fixed and the other is movable, and of which the deflecting element arranged closer to the observed object is also provided with a deflecting device on its side averted from the light source for directing light from the other deflecting element to the second deflector.
    Type: Grant
    Filed: January 17, 1997
    Date of Patent: June 2, 1998
    Assignee: J.D. Moller Optische Werke GmbH
    Inventor: Jochen Koetke
  • Patent number: 5760950
    Abstract: A scanning confocal microscope optical system overcomes the difficulties of previous devices and can be used in diagnostic applications that are inaccessible to previous devices. The optical system for forming an image of a subject illuminated by light from an illumination system includes a Nipkow disk that is perpendicular to a light propagation path and that has a surface upon which a plurality of pinholes are distributed substantially symmetrically about an axis perpendicular to the surface of the disk. The system further includes components for projecting an image of a first set of the pinholes onto a second set of the pinholes, the image being formed of light transmitted by the first set of the pinholes when the first set is illuminated by light that impinges on a first side of the disk. The system further includes a collective lens and a first objective lens for focussing light transmitted by the second set of the pinholes onto the subject and for collecting light reflected by the subject.
    Type: Grant
    Filed: July 25, 1996
    Date of Patent: June 2, 1998
    Assignee: Advanced Scanning, Ltd.
    Inventors: Miroslav Maly, Pavel Vesely
  • Patent number: 5748366
    Abstract: To provide a surgical microscope comprising a microscope collimator for enabling the operator to easily recognize the swivel center of the microscope body regardless of what position the microscope body moves for easy setting of the swivel center point of the microscope body, a surgical microscope pivotally supporting a microscope body having, an observation optical system with one point on an observation optical axis of the microscope body as the swivel center. The surgical microscope comprises index projectors as swivel center visible indicators being capable of recognizing the swivel center. This configuration enables the operator to easily recognize the swivel center of the microscope body for easy setting of the swivel center point of the microscope body.
    Type: Grant
    Filed: December 26, 1995
    Date of Patent: May 5, 1998
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Koji Yasunaga, Hiroshi Fujiwara, Masami Hamada, Takashi Fukaya, Masahiko Kinukawa, Tomonori Ishikawa, Masanori Kaneda, Takeshi Okada
  • Patent number: 5714967
    Abstract: An image display apparatus designed so that the observer can view the image of an image display device without the need of manually adjusting the positional relationship between the observer's eyeball and a bundle of rays from the image display device which is to be projected into the eyeball. A positional relationship detecting section (46) observes the pupil of an observer's eyeball (44) and its vicinities, and detects where a bundle of rays from an LCD (42) is being projected. If it is detected that the ray bundle is not coincident with the pupil, motors (52a and 52b) are driven to move a first support (50a) and a second support (50b), which support the LCD (42), a backlight (43), and an ocular lens (45), so that the ray bundle passes through the pupil.
    Type: Grant
    Filed: May 9, 1995
    Date of Patent: February 3, 1998
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Toshiro Okamura, Masato Yasugaki
  • Patent number: 5710663
    Abstract: A reflecting fluorescence microscope includes an excitation filter for converting a beam of light projected from a reflecting illumination light source into light having a plurality of wavelength regions of narrow-band excitation light, a dichroic mirror for irradiating a specimen with the light having a plurality of wavelength regions of narrow-band excitation light converted by the excitation filter to transmit various kinds of fluorescent light emitted from the specimen, and an absorption filter for absorbing an unwanted wavelength region from the light transmitted through the dichroic mirror to transmit the wavelength of a fluorescent image. In this reflecting fluorescence microscope, at least one band-stop filter having at least one absorption band is disposed in a reflecting illumination optical path before the dichroic mirror so as to absorb the wavelengths of a transmission band and change the amount of the light having a plurality of wavelength regions of narrow-band excitation light.
    Type: Grant
    Filed: May 24, 1996
    Date of Patent: January 20, 1998
    Assignee: Olympus Optical Co., Ltd.
    Inventor: Kenji Kawasaki
  • Patent number: 5701197
    Abstract: A slit lamp microscope, which includes an illumination optical system for slit illumination onto an eye to be examined and an observing optical system containing an objective lens for observation of the eye exposed to the slit illumination, comprises a confocal scanning microscope unit containing an illumination optical system for illuminating a rotating circular disc provided with a plurality of pinholes and illuminating an observation plane of the eye to be examined by illumination light transmitted through the pinholes of the rotating circular disc, and a light delivery optical system for focusing the luminous flux reflected from the observation plane of the eye on the rotating circular disc and delivering it to the objective lens, and a setting device to set the confocal scanning microscope unit in the front of the objective lens.
    Type: Grant
    Filed: October 20, 1995
    Date of Patent: December 23, 1997
    Assignee: Nidek Co., Ltd.
    Inventor: Nobuyuki Yano
  • Patent number: 5699197
    Abstract: A condenser lens system collects light from a light source to illuminate a sample, which comprises in the named order from the light source side a front group of positive refracting power having at least one lens and a rear group of positive refracting power at least having a positive lens for liquid immersion located closest to the sample and having a flat surface on the sample side.
    Type: Grant
    Filed: July 12, 1995
    Date of Patent: December 16, 1997
    Assignee: Nikon Corporation
    Inventor: Tatsuro Otaki
  • Patent number: 5691840
    Abstract: Described in this invention is a microscope that can examine a specimen of an anisotropic property regardless of the specimen being thin or thick, i.e., opaque or transparent. The video microscope includes a first light guide for a transmission method; a first polarizer for partially polarizing the light from the first light source, arranged beneath a stage on which a specimen is placed; a second light guide for reflection method; a second polarizer for partially polarizing the light from the second light source, provided in the second light guide; a lens assembly admitting the polarized light from the first or second polarizer and including an objective, an analyzer, and a compensating plate; a beam splitter for reflecting the polarized light from the second polarizer to an object provided in the lens assembly; a CCD mount in which CCD is provided, mounted on the lens assembly; and height and focus adjustment.
    Type: Grant
    Filed: November 8, 1995
    Date of Patent: November 25, 1997
    Assignee: Samsung Aerospace Industries, Ltd.
    Inventors: Jaewoo Bae, Haenam Jeon
  • Patent number: 5684625
    Abstract: The invention provides a switchable bright-field transmitted-light illumination device for microscopes which provides for in each case two objectives of different apertures in both switch positions a simple automatic illumination arrangement without adjustment of the position and of the opening of the diaphragms. For this purpose, in an illumination device, comprising light source 1, collector 2, field diaphragm 3, aperture diaphragm 4 and basic condenser 7 with removable condenser head 8 or condenser lens element 11, which can be switched in alternatively to the condenser head 8 between the aperture diaphragm 4 and the basic condenser 7, the aperture diaphragm 4 is arranged between the collector 2 and the field diaphragm 3 and is imaged by an intermediate imaging by at least two auxiliary lenses 5 and 6 into a plane 12 conjugate with the aperture diaphragm 4.
    Type: Grant
    Filed: August 5, 1996
    Date of Patent: November 4, 1997
    Assignee: Leica Mikroskopie und Systeme GmbH
    Inventors: Hans Werner Stankewitz, Peter Karbe
  • Patent number: 5640284
    Abstract: An optical illumination system according to the present invention is provided with an optical reflector for illuminating a surface to be illuminated in the shape of arc or annulus. A reflective plane of the optical reflector is shaped in a special curved surface. Specifically, an arbitrary parabola with a first axis passing through the vertex and the focus of the parabola is rotated about a second axis passing through a point located on the opposite side of the directrix of the parabola with respect to the focus and being parallel to the directrix. The rotation of the parabola yields a parabolic toric surface. The reflective plane of the optical reflector has the curved surface constituting at least a part of the parabolic toric surface. The reflective plane so shaped reflects a light source image emitted from a light source system to illuminate the surface to be illuminated in the shape of arc or annulus.
    Type: Grant
    Filed: October 27, 1994
    Date of Patent: June 17, 1997
    Assignee: Nikon Corporation
    Inventors: Osamu Tanitsu, Takashi Mori, Hideo Hirose
  • Patent number: 5633752
    Abstract: An optical system switching apparatus for a reflected fluorescence microscope including a first turret having a plurality of first windows which are formed at an equal distance from a rotation center axis and on which absorption filters are mounted, a second turret having a plurality of second windows which are formed at an equal distance from the rotation center axis and on which excitation filters are mounted, a third turret having a plurality of mounting portions which are formed at an equal distance from the third rotation center axis and on which dichroic mirrors are mounted. The first to third turrets are assembled to be rotatable independently of each other, for optically aligning an arbitrary one of the excitation filters an arbitrary one of the dichroic mirrors, and an arbitrary one of the absorption filters at respective rotational positions.
    Type: Grant
    Filed: July 19, 1995
    Date of Patent: May 27, 1997
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Atsuhiro Tsuchiya, Itaru Endo