Having One Film Pinned (e.g., Spin Valve) Patents (Class 360/324.1)
  • Patent number: 7132175
    Abstract: The present invention provides a CPP-type spin-valve magnetic detecting element permitting a decrease in an effective element area even with a large optical element area. A current limiting layer having an insulating portion and a conductive portion is formed in a free magnetic layer to narrow a sensing current and decrease diffusion of the sensing current. Also, the current density of the sensing current flowing through the free magnetic layer can be securely locally increased. Therefore, even when the optical element area of the free magnetic layer in parallel to the film plane is 0.01 ?m2 or more, the effective element area can be securely decreased, and a CPP-type magnetic detecting element producing large ?R and high reproduction output can easily be formed.
    Type: Grant
    Filed: June 25, 2003
    Date of Patent: November 7, 2006
    Assignee: Alps Electric Co., Ltd.
    Inventors: Naoya Hasegawa, Masamichi Saito
  • Patent number: 7133264
    Abstract: A current-perpendicular-to-plane (CPP) spin valve (SV) sensor and fabrication method with a contiguous junction type geometry that increases sensor resistance by up to two orders of magnitude over conventional CPP GMR geometry for a particular track read-width. The superior CPP GMR coefficient (?r/R) is implemented at an increased sensor resistance by using two small self-aligned SV stacks disposed with the sense current flowing perpendicular thereto when also flowing parallel to the free layer deposition plane. With the CPP geometry of this invention, thicker conductive spacer layers may be used without unacceptable sense current shunting, so the two self-aligned SV stacks may be completed following the free-layer track-mill step. The two SV stacks may be connected in parallel or back-to-back in series to provide different sense voltages.
    Type: Grant
    Filed: September 13, 2002
    Date of Patent: November 7, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventors: Daniele Mauri, Tsann Lin
  • Patent number: 7130163
    Abstract: There are provided a magnetoresistance effect element, a magnetic head, a magnetic head assembly and a magnetic recording system, which have high sensitivity and high reliability. The magnetoresistance effect element has two ferromagnetic layers, a non-magnetic layer provided between the ferromagnetic layers, and a layer containing an oxide or nitride as a principal component, wherein the layer containing the oxide or nitride as the principal component contains a magnetic transition metal element which does not bond to oxygen and nitrogen and which is at least one of Co, Fe and Ni.
    Type: Grant
    Filed: October 6, 2004
    Date of Patent: October 31, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hideaki Fukuzawa, Katsuhiko Koi, Hiromi Fuke, Hiroshi Tomita, Hitoshi Iwasaki, Masashi Sahashi
  • Patent number: 7130164
    Abstract: A magnetoresistance effect element comprises a magnetoresistance effect film including a magnetically pinned layer whose direction of magnetization is pinned substantially in one direction, a magnetically free layer whose direction of magnetization changes in response to an external magnetic field, and a nonmagnetic intermediate layer located between the pinned layer and the free layer; and a pair of electrodes electrically connected to said magnetoresistance effect film to supply a sense current perpendicularly to a film plane of said magnetoresistance effect film. The intermediate layer has a first layer including a first region whose resistance is relatively high and second regions whose resistance is relatively low. The sense current preferentially flows through the second regions when the current passes the first layer.
    Type: Grant
    Filed: February 22, 2005
    Date of Patent: October 31, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Katsuhiko Koui, Masatoshi Yoshikawa, Masayuki Takagishi, Masashi Sahashi, Takeo Sakakubo, Hitoshi Iwasaki
  • Patent number: 7126797
    Abstract: A magnetic sensor includes a pinned magnetic layer having first and second magnetic sublayers sandwiching a nonmagnetic metal layer. The nonmagnetic metal layer contains at least one of Ru, Re, Os, Ti, Rh, Ir, Pd, Pt, and Al. The atoms in the first magnetic sublayer and the atoms in the nonmagnetic metal layer overlap with each other, while each of the crystal structures is deformed. The deformations in the crystal structure of the first magnetic sublayer increase the magnetostriction constant, thereby increasing the magnetoelastic effect of the magnetic sensor.
    Type: Grant
    Filed: February 20, 2004
    Date of Patent: October 24, 2006
    Assignee: Alps Electric Co., Ltd.
    Inventors: Naoya Hasegawa, Eiji Umetsu, Masamichi Saito, Yosuke Ide
  • Patent number: 7123453
    Abstract: A PtMn alloy film known as an antiferromagnetic material having excellent corrosion resistance is used for an antiferromagnetic layer. However, an exchange coupling magnetic field is decreased depending upon the conditions of crystal grain boundaries. Therefore, in the present invention, the crystal grain boundaries formed in an antiferromagnetic layer (PtMn alloy film) and the crystal grain boundaries formed in a ferromagnetic layer are made discontinuous in at least a portion of the interface between both layers. As a result, the antiferromagnetic layer can be appropriately transformed to an ordered lattice by heat treatment to obtain a larger exchange coupling magnetic field than a conventional element.
    Type: Grant
    Filed: March 28, 2005
    Date of Patent: October 17, 2006
    Assignee: Alps Electric Co., Ltd.
    Inventors: Naoya Hasegawa, Masamichi Saito
  • Patent number: 7116530
    Abstract: A dual/differential spin valve sensor of a magnetic head includes a first spin valve having an antiparallel (AP) “pinned” layer structure and a second spin valve having an AP “self-pinned” layer structure. The AP pinned layer structure has a magnetization direction which is fixed by an adjacent antiferromagnetic (AFM) layer, whereas the AP self-pinned layer structure has a magnetization direction which is fixed by magnetostriction as well as air bearing surface (ABS) stress. The magnetization direction of the AP pinned layer structure is fixed in a direction antiparallel to the magnetization direction of the AP self-pinned layer structure. The dual/differential spin valve sensor may be configured to have either a top AP pinned layer structure and a bottom AP self-pinned layer structure, or a top AP self-pinned layer structure and a bottom AP pinned layer structure.
    Type: Grant
    Filed: September 30, 2003
    Date of Patent: October 3, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventor: Hardayal Singh Gill
  • Patent number: 7116531
    Abstract: In bottom spin valves of the lead overlay type the longitudinal bias field that stabilizes the device tends to fall off well before the gap is reached. This problem has been overcome by inserting an additional antiferromagnetic layer between the hard bias plugs and the overlaid leads. This additional antiferromagnetic layer and the lead layer are etched in the same operation to define the read gap, eliminating the possibility of misalignment between them. The extra antiferromagnetic layer is also longitudinally biased so there is no falloff in bias strength before the edge of the gap is reached. A process for manufacturing the device is also described.
    Type: Grant
    Filed: August 10, 2004
    Date of Patent: October 3, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Moris M. Dovek, Tai Min
  • Patent number: 7116529
    Abstract: A magnetoresistive element has a magnetoresistive film and a pair of electrodes adapted to flow a sense current in a direction substantially perpendicular to a plane of the magnetoresistive film. The magnetoresistive film includes first and second magnetization free layers and first to fourth magnetization pinned layers with nonmagnetic intermediate layers interposed therebetween. The second magnetization pinned layer and the third magnetization pinned layer are formed between the second nonmagnetic intermediate layer and the third nonmagnetic intermediate layer. The directions of magnetization of the first and second magnetization pinned layers are substantially parallel to each other. The directions of magnetization of the third and fourth magnetization pinned layers are substantially parallel to each other. Further, the direction of magnetization of the second magnetization pinned layer is substantially antiparallel to the direction of magnetization of the third magnetization pinned layer.
    Type: Grant
    Filed: September 5, 2003
    Date of Patent: October 3, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Masatoshi Yoshikawa, Masayuki Takagishi, Masashi Sahashi
  • Patent number: 7099122
    Abstract: A spin polarization enhancement artificial (SPEA) magnet comprises combinations of positive spin asymmetry interfaces and inverse spin asymmetry interfaces arranged antiferromagnetically such that current passed through the SPEA magnet has enhanced spin polarization. The SPEA magnet additionally may combine bulk material properties of electron scattering to either supplement or replace the interfacial spin differentiation. A basic functional unit of the SPEA magnet includes two ferromagnetic layers separated by two spacer layers. Each spacer forms an interface such that adjacent ferromagnetic layers produce different spin symmetry. Antiferromagnetic arrangement of adjacent ferromagnetic layers coordinates the different spin symmetries such that a single spin state is selected and also provides additional stabilization to the SPEA magnet.
    Type: Grant
    Filed: December 16, 2003
    Date of Patent: August 29, 2006
    Assignee: Seagate Technology LLC
    Inventors: Ge Yi, Robert W. Lamberton, Susan Jane Tara Murdoch, Thomas K. McLaughlin, William J. O'Kane
  • Patent number: 7089650
    Abstract: Currently, the shield-to-shield separation of a spin valve head cannot be below about 800 ?, mainly due to sensor-to-lead shorting problems. This problem has now been overcome by a manufacturing method that includes inserting a high permeability, high resistivity, thin film shield on the top or bottom (or both) sides of the spin valve sensor. A permeability greater than about 500 is required together with a resistivity about 5 times greater than that of the free layer and an MrT value for the thin film shield that is 4 times greater than that of the free layer.
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: August 15, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Kochan Ju, Cheng Horng, Youfeng Zheng, Simon Liao, Jei-Wei Chang
  • Patent number: 7092219
    Abstract: A magnetic head having a spin valve sensor that is fabricated utilizing an Al2O3, NiMnO, NiFeCr seed layer upon which a typical PtMn spin valve sensor layer structure is subsequently fabricated. The preferred embodiment fabrication process of the NiFeCr layer includes the overdeposition of the layer to a first thickness of from 15 ? to 45 ? followed by the etching back of the seed layer of approximately 5 ? to approximately 15 ? to its desired final thickness of approximately 10 ? to 40 ?. The Cr at. % composition in the NiFeCr layer is preferably from approximately 35 at. % to approximately 46 at. %. The crystal structure of the surface of the etched back NiFeCr layer results in an improved crystal structure to the subsequently fabricated spin valve sensor layers, such that the fabricated spin valve exhibits increased ?R/R and reduced coercivity.
    Type: Grant
    Filed: July 6, 2001
    Date of Patent: August 15, 2006
    Assignee: International Business Machines Corporation
    Inventor: Mustafa Pinarbasi
  • Patent number: 7085110
    Abstract: The magnetic head of the present invention includes a magnetoresistive read head element in which a magnetic bias layer is deposited across the surface of the wafer above the free magnetic layer. Central portions of the biasing layer that correspond to the read head track width are oxidized to essentially remove the magnetic moment of the bias layer material in those central locations. An oxygen diffusion barrier layer is then deposited upon the oxidized central portions of the biasing layer to prevent diffusion or migration of oxygen from the oxidized central regions of the biasing layer. An insulation layer, a second magnetic shield layer and further structures of the magnetic head are subsequently fabricated.
    Type: Grant
    Filed: July 7, 2003
    Date of Patent: August 1, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands, B.V.
    Inventors: Elizabeth Ann Dobisz, James Mac Freitag, Mustafa Michael Pinarbasi, Patrick Rush Webb
  • Patent number: 7084468
    Abstract: Disclosed are a spin injection device applicable as a memory and a logical device using a spin valve effect obtained by injecting a carrier spin-polarized from a ferromagnet into a semiconductor at an ordinary temperature, and a spin-polarized field effect transistor.
    Type: Grant
    Filed: March 15, 2004
    Date of Patent: August 1, 2006
    Assignee: Korea Institute of Science and Technology
    Inventors: Woo Young Lee, Suk Hee Han, Joon Yeon Chang, Hi Jung Kim, Han Joo Lee, Woong Jun Hwang, Moo Whan Shin, Young Keun Kim
  • Patent number: 7077936
    Abstract: A laminate structure includes an antiferromagnetic layer, a pinned magnetic layer, and a seed layer contacting the antiferromagnetic layer on a side opposite to pinned magnetic layer. The seed layer is constituted mainly by face-centered cubic crystals with (111) planes preferentially oriented. The seed layer is preferably non-magnetic. Layers including the antiferromagnetic layer, a free magnetic layer, and layers therebetween, have (111) planes preferentially oriented.
    Type: Grant
    Filed: October 15, 2002
    Date of Patent: July 18, 2006
    Assignee: Alps Electric Co., Ltd.
    Inventors: Masamichi Saito, Naoya Hasegawa, Yosuke Ide, Kenichi Tanaka
  • Patent number: 7072152
    Abstract: There is provided a magnetoresistance effect element capable of precisely defining the active region in a CPP type MR element and of effectively suppressing and eliminating the influence of a magnetic field due to current from an electrode, and a magnetic head and magnetic reproducing system using the same. The active region of the MR element is defined by the area of a portion through which a sense current flows. Moreover, the shape of the cross section of a pillar electrode or pillar non-magnetic material for defining the active region of the element is designed to extend along the flow of a magnetic flux so as to efficiently read only a signal from a track directly below the active region. When the magnetic field due to current from the pillar electrode can not be ignored, the magnetic flux from a recording medium asymmetrically enters yokes and the magnetization free layer of the MR element to some extent.
    Type: Grant
    Filed: March 14, 2005
    Date of Patent: July 4, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiromi Yuasa, Hiroaki Yoda, Yuzo Kamiguchi, Tomohiko Nagata
  • Patent number: 7072153
    Abstract: A magnetoresistance effect element comprises a magnetoresistance effect film including a magnetically pinned layer whose direction of magnetization is pinned substantially in one direction, a magnetically free layer whose direction of magnetization changes in response to an external magnetic field, and a nonmagnetic intermediate layer located between the pinned layer and the free layer; and a pair of electrodes electrically connected to said magnetoresistance effect film to supply a sense current perpendicularly to a film plane of said magnetoresistance effect film. The intermediate layer has a first layer including a first region whose resistance is relatively high and second regions whose resistance is relatively low. The sense current preferentially flows through the second regions when the current passes the first layer.
    Type: Grant
    Filed: March 28, 2003
    Date of Patent: July 4, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Katsuhiko Koui, Masatoshi Yoshikawa, Masayuki Takagishi, Masashi Sahashi, Takeo Sakakubo, Hitoshi Iwasaki
  • Patent number: 7068477
    Abstract: A soft magnetic layer is made of nickel iron alloy containing crystals of the face-centered cubic lattice and crystals of the body-centered cubic lattice. The face-centered cubic lattice serves to establish a soft magnetic property in the nickel iron alloy. The body-centered cubic lattice contributes to reduction in the electric resistance of the magnetoresistive film as well as to improvement of the magnetoresistive ratio of the magnetoresistive film. Even if the magnetoresistive film is further reduced in size, the magnetoresistive film can sufficiently be prevented from suffering from an increase in the temperature. Even if a sensing current of a larger current value is supplied to the magnetoresistive film, the magnetoresistive film is reliably prevented from deterioration in the characteristics as well as destruction.
    Type: Grant
    Filed: November 19, 2002
    Date of Patent: June 27, 2006
    Assignee: Fujitsu Limited
    Inventor: Kenji Noma
  • Patent number: 7068479
    Abstract: A magnetoresistance effect element is composed of a substrate, and a layer lamination structure disposed on the substrate and comprising a buffer layer, an anti-ferromagnetic layer, a pinned layer, an insulating layer including at least one nano-contact portion having a dimension of not more than Fermi length, a free layer composed of a ferromagnetic layer and a domain stability layer, which are laminated in the described order on the substrate. The pinned layer is composed of a first ferromagnetic layer, a non-magnetic layer and a second ferromagnetic layer disposed in this order on the side of the anti-ferromagnetic layer, and the domain stability control including a non-magnetic layer, a ferromagnetic layer and an anti-ferromagnetic layer disposed in this order from the side of the free layer.
    Type: Grant
    Filed: July 2, 2004
    Date of Patent: June 27, 2006
    Assignee: TDK Corporation
    Inventors: Isamu Sato, Rachid Sbiaa
  • Patent number: 7064937
    Abstract: A spin valve GMR sensor configured in a bridge configuration is provided. The bridge includes two spin valve element pairs. The spin valve elements include a free layer, a space layer, a pinned layer, and a bias layer. The bias layer includes a first bias layer and a second bias layer. The first and second spin valve element pairs are formed on separate metal layers and a current pulse is applied to the metal layers, which sets the direction of magnetization in the pinned layer of the first pair of spin valve elements to be antiparallel to the direction of magnetization in the pinned layer of the second pair of spin valve elements. The same effect can be accomplished by making the pinned layer substantially thicker than the second bias layer in the first spin valve element pair and the pinned layer is substantially thinner than the second bias layer in the second spin valve element pair and applying a magnetic field to the first and the second spin valve element pairs.
    Type: Grant
    Filed: October 21, 2005
    Date of Patent: June 20, 2006
    Assignee: Honeywell International Inc.
    Inventors: Hong Wan, Lakshman S. Withanawasam
  • Patent number: 7064936
    Abstract: A magnetoresistance effect device having a basic structure wherein a multi-layer film comprising a unit of magnetic layer/non-magnetic layer/magnetic layer/antiferromagnetic layer, or antiferromagnetic layer/magnetic layer/non-magnetic layer/magnetic layer is formed with a protective film on a surface of the magnetoresistance effect device employing one of a metal, oxide material, nitride material, a mixture of oxide and nitride material, a double-layer film of metal/oxide, a double-layer film of metal/nitride, or a double-layer film of metal/(mixture of oxide and nitride) of film thickness between 2 nm and 7 nm.
    Type: Grant
    Filed: June 6, 2003
    Date of Patent: June 20, 2006
    Assignee: TDK Corporation
    Inventor: Kazuhiko Hayashi
  • Patent number: 7061725
    Abstract: The present invention includes a magnetic sensing structure having a stripe height and a stripe width defining an area for a current flowing therethrough, and at least one electrode positioned adjacent an edge of the magnetic sensing structure for adjustably controlling the stripe width and/or stripe height, and therefore the area (SW×SH), of the magnetic sensing structure through which the current can flow.
    Type: Grant
    Filed: December 1, 2003
    Date of Patent: June 13, 2006
    Assignee: Seagate Technology LLC
    Inventor: Michael A. Seigler
  • Patent number: 7061730
    Abstract: A spin-valve magnetoresistive read element has a thin conductive lead layer of high sheet conductivity, high hardness, high melting point, high corrosion resistance and lacking the propensity for smearing, oozing, electromigration and nodule formation. Said lead layer is formed upon the hard magnetic longitudinal bias layer of an abutted junction spin-valve type magnetoresistive read head and said read head is therefore suitable for reading high density recorded disks at high RPM.
    Type: Grant
    Filed: August 27, 2003
    Date of Patent: June 13, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Cheng T. Horng, Mao-Min Chen, Chen-Jung Chien, Cherng-Chyi Han, Chyu-Jiuh Torng, Ru-Ying Tong
  • Patent number: 7061729
    Abstract: A lead overlay magnetic sensor for use in a disk drive is provided having a protective cap layer disposed between the electrical leads and the sensor. The protective cap layer is preferably formed from ruthenium, rhodium, or other suitable material. The sensors thus formed have low resistance between the electrical leads and the sensor and also have well defined magnetic trackwidths.
    Type: Grant
    Filed: May 16, 2002
    Date of Patent: June 13, 2006
    Assignee: International Business Machines Corporation
    Inventors: James Mac Freitag, Mustafa Pinarbasi, Patrick Rush Webb
  • Patent number: 7057863
    Abstract: A method for fabricating a sensor having anti-parallel tab regions. The method includes forming a free layer, and forming a first layer of a carbon composition above the active area of the free layer. A layer of resist is formed above the first layer of carbon composition. A bias layer is formed above the tab areas of the free layer, the bias layer being operative to substantially pin magnetic moments of the tab areas of the free layer. Leads are formed above the bias layer. A second layer of carbon composition is formed above the tab areas of the free layer. Any material above a plane extending parallel to portions of the second layer of carbon composition above the tab areas are removed using chemical-mechanical polishing. Any remaining carbon composition is removed.
    Type: Grant
    Filed: November 5, 2004
    Date of Patent: June 6, 2006
    Assignee: Hitachi Global Storage Technologies, Netherlands B.V.
    Inventors: Marie-Claire Cyrille, Hardayal Singh Gill, James Mac Freitag
  • Patent number: 7057859
    Abstract: A magneto-resistive device is improved in characteristics by removing a surface oxide film to reduce the resistance and reducing an ion beam damage. The magneto-resistive device has a magneto-resistive layer which comprises a tunnel barrier layer, an underlying pinned layer, and an overlying free layer. A non-magnetic layer is formed on the free layer for protection. A composite-layer film comprised of an insulating layer and a damage reducing layer is formed in contact with an effective region which is effectively involved in detection of magnetism in the magneto-resistive layer without overlapping with the effective region. The damage reducing layer is made of a material which includes at least one element, the atomic weight of which is larger than that of silicon. The insulating layer and damage reducing layer do not constitute a magnetic domain control layer for applying a biasing magnetic field to the free layer.
    Type: Grant
    Filed: June 23, 2003
    Date of Patent: June 6, 2006
    Assignee: TDK Corporation
    Inventors: Takeo Kagami, Kazuki Sato, Takayasu Kanaya, Shunji Saruki, Tetsuya Kuwashima
  • Patent number: 7054118
    Abstract: A ferromagnetic thin-film based magnetic field sensor having an electrically insulative intermediate layer with two major surfaces on opposite sides thereof with an initial film of an anisotropic ferromagnetic material on one of those intermediate layer major surfaces and a superparamagnetic thin-film on the remaining one of said intermediate layer major surfaces.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: May 30, 2006
    Assignee: NVE Corporation
    Inventors: James M. Daughton, Dexin Wang
  • Patent number: 7054114
    Abstract: A ferromagnetic thin-film based magnetic field sensor with first and second sensitive direction sensing structures each having a nonmagnetic intermediate layer with two major surfaces on opposite sides thereof having a magnetization reference layer on one and an anisotropic ferromagnetic material sensing layer on the other having a length in a selected length direction and a smaller width perpendicular thereto and parallel to the relatively fixed magnetization direction. The relatively fixed magnetization direction of said magnetization reference layer in each is oriented in substantially parallel to the substrate but substantially perpendicular to that of the other. An annealing process is used to form the desired magnetization directions.
    Type: Grant
    Filed: November 17, 2003
    Date of Patent: May 30, 2006
    Assignee: NVE Corporation
    Inventors: Albrecht Jander, Catherine A. Nordman, Zhenghong Qian, Carl H. Smith
  • Patent number: 7050273
    Abstract: A method for fabricating a longitudinally hard biased, bottom spin valve GMR sensor with a lead overlay (LOL) conducting lead configuration and a narrow effective trackwidth. The advantageous properties of the sensor are obtained by providing two novel barrier layers, one of which prevents oxidation of and Au diffusion into the free layer during annealing and etching and the other of which prevents oxidation of the capping layer during annealing so as to allow good electrical contact between the lead and the sensor stack.
    Type: Grant
    Filed: August 20, 2004
    Date of Patent: May 23, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Cheng T. Horng, Mao-Min Chen, Chen-Jung Chien, Cherng-Chyi Han, Ru-Ying Tong, Chyu-Jiuh Torng, Hui-Chuan Wang
  • Patent number: 7046489
    Abstract: There is provided a practical magnetoresistance effect element which has an appropriate value of resistance, which can be sensitized and which has a small number of magnetic layers to be controlled, and a magnetic head and magnetic recording and/or reproducing system using the same. In a magnetoresistance effect element wherein a sense current is caused to flow in a direction perpendicular to the plane of the film, a resistance regulating layer is provided in at least one of a pinned layer, a free layer and an non-magnetic intermediate layer. The resistance regulating layer contains, as a principal component, an oxide, a nitride, a fluoride, a carbide or a boride. The resistance regulating layer may be a continuous film or may have pin holes. Thus, it is possible to provide a practical magnetoresistance effect element which has an appropriate value of resistance, which can be sensitized and which has a small number of magnetic layers, while effectively utilizing the scattering effect depending on spin.
    Type: Grant
    Filed: March 16, 2005
    Date of Patent: May 16, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Yuuzo Kamiguchi, Hiromi Yuasa, Tomohiko Nagata, Hiroaki Yoda, Katsuhiko Koui, Masatoshi Yoshikawa, Hitoshi Iwasaki, Masashi Sahashi, Masayuki Takagishi
  • Patent number: 7042684
    Abstract: Two embodiments of a GMR sensor of the bottom spin valve (BSV) spin filter spin valve (SFSV) type are provided together with methods for their fabrication. In each embodiment the sensor includes an in-situ naturally oxidized specularly reflecting layer (NOL) which is a more uniform and dense layer than such layers formed by high temperature annealing or reactive-ion etching. In one embodiment, the sensor has an ultra thin composite free layer and a high-conductance layer (HCL), providing high output and low coercivity. In a second embodiment, along with the same NOL, the sensor has a laminated free layer which includes a non-magnetic conductive layer, which also provides high output and low coercivity. The sensors are capable of reading densities exceeding 60 Gb/in2.
    Type: Grant
    Filed: June 12, 2003
    Date of Patent: May 9, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Cheng T. Horng, Ru-Ying Tong
  • Patent number: 7040005
    Abstract: A method of fabricating a current-perpendicular-to-plane (CPP) giant magnetoresistive (GMR) sensor stack, wherein the parasitic resistance of the high-resistance antiferromagnetic (AFM) pinning layer is effectively reduced by enlarging its surface area and forming between it and the remainder of the sensor stack an equal area, contiguous, thin, highly conductive ferromagnetic layer, the current channeling (CCL) layer. The magnetic properties and increased current carrying capacity of the CCL allows the AFM pinning layer to effectively couple to the pinned layer while eliminating the effect of its high resistance on the sensor sensitivity as measured by the GMR ratio, ?R/R.
    Type: Grant
    Filed: March 19, 2003
    Date of Patent: May 9, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Youfeng Zheng, Kochan Ju, Otto Voegeli
  • Patent number: 7042685
    Abstract: A system and method of reducing noise due to thermally activated spin waves in a magnetoresistive (MR) element is disclosed. The MR element includes a free layer, a reference layer, and a spacer layer, the spacer layer being positioned between the free layer and the reference layer. To reduce noise, a magnetization of the reference layer is pinned in a fixed direction. A spin polarized current perpendicular to a plane of the free layer, reference layer, and spacer layer is subsequently produced such that the current exerts a spin momentum transfer torque on localized electron spins to reduce noise due to thermally activated spin waves. The spin momentum transfer torque opposes the intrinsic damping of the free layer, thereby reducing noise in the MR element.
    Type: Grant
    Filed: September 25, 2003
    Date of Patent: May 9, 2006
    Assignee: Seagate Technology LLC
    Inventor: Mark Covington
  • Patent number: 7038893
    Abstract: A magnetoresistance effect element comprises a magnetoresistance effect film including a magnetically pinned layer whose direction of magnetization is pinned substantially in one direction, a magnetically free layer whose direction of magnetization changes in response to an external magnetic field, and a nonmagnetic intermediate layer located between the pinned layer and the free layer; and a pair of electrodes electrically connected to said magnetoresistance effect film to supply a sense current perpendicularly to a film plane of said magnetoresistance effect film. The intermediate layer has a first layer including a first region whose resistance is relatively high and second regions whose resistance is relatively low. The sense current preferentially flows through the second regions when the current passes the first layer.
    Type: Grant
    Filed: January 31, 2005
    Date of Patent: May 2, 2006
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Katsuhiko Koui, Masatoshi Yoshikawa, Masayuki Takagishi, Masashi Sahashi, Takeo Sakakubo, Hitoshi Iwasaki
  • Patent number: 7038890
    Abstract: A magnetic read head has a current perpendicular to the planes (CPP) sensor with a top cap layer that is ruthenium (Ru) or rhodium (Rh) or a top cap layer structure which includes a first layer of tantulum (Ta) only, a second layer of ruthenium (Ru), rhodium (Rh) or gold (Au) with the first layer being located between a spacer layer and the second layer.
    Type: Grant
    Filed: July 29, 2003
    Date of Patent: May 2, 2006
    Assignee: Hitachi Global Storage Technologies Netherlands B.V.
    Inventor: Mustafa Michael Pinarbasi
  • Patent number: 7035058
    Abstract: A giant magneto-resistive effect element includes a lamination layer structure portion (10) in which at least a free layer (4) the magnetization of which is rotated in response to an external magnetic field, a fixed layer (2), an antiferromagnetic layer (1) for fixing the magnetization of the fixed layer (2) and a nonmagnetic layer (3) interposed between the free layer (4) and the fixed layer (2) are laminated with each other. A sense current flows to substantially a lamination layer direction of the lamination layer structure portion (10) and the lamination layer structure portion (10) has disposed thereon a high-resistance layer (R) which crosses a path of the sense current, whereby an element resistance can be increased and a magneto-resistance change amount can be increased. Thus, a magneto-resistive effect element, a magneto-resistive effect type magnetic sensor, a magneto-resistive effect type magnetic head and a magnetic memory become able to increase a magneto-resistive change amount.
    Type: Grant
    Filed: May 29, 2002
    Date of Patent: April 25, 2006
    Assignee: Sony Corporation
    Inventor: Masanori Hosomi
  • Patent number: 7026671
    Abstract: A magnetoresistive effect element (1) has an arrangement in which a pair of ferromagnetic material layers (magnetization fixed layer (5) and magnetization free layer (7)) is opposed to each other through an intermediate layer (6) to obtain a magnetoresistive change by causing a current to flow in the direction perpendicular to the layer surface and in which the ferromagnetic material layers are annealed by anneal including rotating field anneal and the following static field anneal. A magnetic memory device comprises this magnetoresistive effect element (1) and bit lines and word lines sandwiching the magnetoresistive effect element (1) in the thickness direction. When the magnetoresistive effect element (1) and the magnetic memory device are manufactured, the ferromagnetic material layers (5, 7) are annealed by rotating field anneal and the following static field anneal.
    Type: Grant
    Filed: June 9, 2003
    Date of Patent: April 11, 2006
    Assignee: Sony Corporation
    Inventors: Tetsuya Mizuguchi, Masanori Hosomi, Kazuhiro Ohba, Kazuhiro Bessho, Yutaka Higo, Tetsuya Yamamoto, Takeyuki Sone, Hiroshi Kano
  • Patent number: 7022383
    Abstract: Although it is known that exchange bias can be utilized in abutted junctions for longitudinal stabilization, a relatively large moment is needed to pin down the sensor edges effectively. Due to the inverse dependence of the exchange bias on the magnetic layer thickness, a large exchange bias has been difficult to achieve by the prior art. This problem has been solved by introducing a structure in which the magnetic moment of the bias layer has been approximately doubled by pinning it from both above and below through exchange with antiferromagnetic layers. Additionally, since the antiferromagnetic layer is in direct abutted contact with the free layer, it acts directly to help stabilize the sensor edge, which is an advantage over the traditional magnetostatic pinning that had been used.
    Type: Grant
    Filed: October 22, 2002
    Date of Patent: April 4, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Yun-Fei Li, Hui-Chuan Wang, Chyu-Jiuh Torng, Cherng-Chyi Han, Mao-Min Chen
  • Patent number: 7023310
    Abstract: A magnetic sensor includes eight SAF-type GMR elements. Four of the GMR elements detect a magnetic field in the direction of the X-axis and are bridge-connected to thereby constitute an X-axis magnetic sensor. The other four GMR elements detect a magnetic field in the direction of the Y-axis and are bridge-connected to thereby constitute a Y-axis magnetic sensor. The magnetization of a pinned layer of each of the GMR elements is pinned in a fixed direction by means of a magnetic field that a permanent bar magnet inserted into a square portion of a yoke of a magnet array generates in the vicinity of a rectangular portion of the yoke. A magnetic field generated in the vicinity of a certain rectangular portion of the yoke differs in direction by 90 degrees from a magnetic field generated in the vicinity of a rectangular portion adjacent to the former rectangular portion.
    Type: Grant
    Filed: March 10, 2005
    Date of Patent: April 4, 2006
    Assignee: Yamaha Corporation
    Inventors: Toshiyuki Oohashi, Kokichi Aiso
  • Patent number: 7016163
    Abstract: A spin valve GMR sensor configured in a bridge configuration is provided. The bridge includes two spin valve element pairs. The spin valve elements include a free layer, a space layer, a pinned layer, and a bias layer. The bias layer includes a first bias layer and a second bias layer. The first and second spin valve element pairs are formed on separate metal layers and a current pulse is applied to the metal layers, which sets the direction of magnetization in the pinned layer of the first pair of spin valve elements to be antiparallel to the direction of magnetization in the pinned layer of the second pair of spin valve elements. The same effect can be accomplished by making the pinned layer substantially thicker than the second bias layer in the first spin valve element pair and the pinned layer is substantially thinner than the second bias layer in the second spin valve element pair and applying a magnetic field to the first and the second spin valve element pairs.
    Type: Grant
    Filed: February 20, 2003
    Date of Patent: March 21, 2006
    Assignee: Honeywell International Inc.
    Inventors: Hong Wan, Lakshman S. Withanawasam
  • Patent number: 7016168
    Abstract: A current-perpendicular-to-plane (CPP) giant magnetoresistive (GMR) sensor of the synthetic spin valve type is provided, the sensor comprising a GMR stack having a substantially square lateral cross-section, a Cu spacer layer of smaller square cross-section formed centrally on the GMR stack and a capped ferromagnetic free layer of substantially square, but even smaller cross-sectional area, formed centrally on the spacer layer. The stepped, reduced area geometry of the sensor provides a significant improvement in its GMR ratio (DR/R), a reduced resistance, R, and elimination of Joule heating hot-spots in regions of high resistance such as the antiferromagnetic pinning layer and its seed layer.
    Type: Grant
    Filed: November 20, 2003
    Date of Patent: March 21, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Min Li, Kochan Ju, Youfeng Zheng, Simon Liao, Jeiwei Chang
  • Patent number: 7008704
    Abstract: The spin valve reproducing head has a narrow track width and high stability. The spin valve reproducing head comprises: a base layer; a magnetoresistance effect film having a magnetic sensing section; biasing sections formed on both sides of the magnetoresistance effect film; terminal sections; an insulating layer covering said members; and an upper shielding layer formed on the insulating layer. The magnetoresistance effect film includes a fixed magnetic layer, a non-magnetic layer and a free magnetic layer piled in that order. And a non-magnetic electric conductive layer, whose resistivity is lower than that of the free magnetic layer, and an etching stop layer, whose sputtering rate is higher than that of tantalum and lower than that of copper, are piled on the free magnetic layer in that order.
    Type: Grant
    Filed: February 18, 2003
    Date of Patent: March 7, 2006
    Assignee: Fujitsu Limited
    Inventor: Kenji Noma
  • Patent number: 6999286
    Abstract: Nano-oxide based current-perpendicular-to-plane (CPP) magnetoresistive (MR) sensor stacks are provided, together with methods for forming such stacks. Such stacks have increased resistance and enhanced magnetoresistive properties relative to CPP stacks made entirely of metallic layers. Said enhanced properties are provided by the insertion of magnetic nano-oxide layers between ferromagnetic layers and non-magnetic spacer layers, whereby said nano-oxide layers increase resistance and exhibit spin filtering properties. CPP sensor stacks of various types are provided, all having nano-oxide layers formed therein, including the spin-valve type and the synthetic antiferromagnetic pinned layer spin-valve type. Said stacks can also be formed upon each other to provide laminated stacks of different types.
    Type: Grant
    Filed: March 28, 2005
    Date of Patent: February 14, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Bernard Dieny, Cheng T. Horng, Kochan Ju, Min Li, Simon Liao
  • Patent number: 6995959
    Abstract: Currently, the shield-to-shield separation of a spin valve head cannot be below about 800 ?, mainly due to sensor-to-lead shorting problems. This problem has now been overcome by inserting a high permeability, high resistivity, thin film shield on the top or bottom (or both) sides of the spin valve sensor. A permeability greater than about 500 is required together with a resistivity about 5 times greater than that of the free layer and an MrT value for the thin film shield that is 4 times greater than that of the free layer. Five embodiments of the invention are described.
    Type: Grant
    Filed: December 14, 2004
    Date of Patent: February 7, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Kochan Ju, Cheng Horng, Youfeng Zheng, Simon Liao, Jei-Wei Chang
  • Patent number: 6993827
    Abstract: Two embodiments of a GMR sensor of the bottom spin valve (BSV) spin filter spin valve (SFSV) type are provided, together with methods for their fabrication. In one embodiment, the sensor has an ultra thin (<20 angstroms) single free layer and a composite high-conductance layer (HCL), providing high output, low coercivity and positive magnetostriction. In a second embodiment, the sensor has a composite free layer and a single HCL, also having high output, low coercivity and positive magnetostriction. The sensors are capable of reading densities exceeding 60 Gb/in2.
    Type: Grant
    Filed: June 12, 2003
    Date of Patent: February 7, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Cheng T. Horng, Ru-Ying Tong
  • Patent number: 6989974
    Abstract: A highly reliable magnetic recording/reproducing apparatus is provided. In the magnetic recording/reproducing apparatus, a spin-valve film is used as a magnetic sensor element for detecting magnetic signals. By defining the corrosion potential of this spin-valve film, and further by specifying the residual magnetization of a magnetic recording medium used as well as the product of the residual magnetization and the thickness of the magnetic layer to a range that is numerically optimal, the occurrence of corrosion on the surface of a magnetoresistive head that contacts the medium is prevented, and the occurrence of electromagnetic discharge is avoided. Further, by numerically specifying the surface resistivity of the metal magnetic thin film of the magnetic recording medium, as well as the roughness of the surface on which the metal magnetic thin film is formed, electrostatic discharge preventing effects and wear resistance are improved.
    Type: Grant
    Filed: December 12, 2003
    Date of Patent: January 24, 2006
    Assignee: Sony Corporation
    Inventors: Hiroki Tetsukawa, Yutaka Soda
  • Patent number: 6988308
    Abstract: Hard biasing of a magnetoresistive sensor or a spin valve sensor in a magnetic read head is initialized by repeatedly applying a magnetic field to the hard biasing at any level of fabrication of the magnetic read head or any combination of levels of fabrication of the read head such as at the wafer level, row bar level, single slider level, head gimbal assembly (HGA) level and/or head stack assembly (HSA) level.
    Type: Grant
    Filed: January 18, 2002
    Date of Patent: January 24, 2006
    Assignee: International Business Machines Corporation
    Inventors: Christopher William Bergevin, Carol Inouye Chiu, Robert Yuan-Shih Li, Albert Shou-Chi Su
  • Patent number: 6989973
    Abstract: A high performance specular free layer bottom spin valve is disclosed. This structure made up the following layers: NiCr/MnPt/CoFe/Ru/CoFe/Cu/free layer/Cu/Ta or TaO/Al2O3. A key feature is that the free layer is made of a very thin CoFe/NiFe composite layer. Experimental data confirming the effectiveness of this structure is provided, together with a method for manufacturing it and, additionally, its longitudinal bias leads.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: January 24, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Cheng T. Horng, Mao-Min Chen, Min Li, Ru-Ying Tong
  • Patent number: 6987651
    Abstract: Nano-oxide based current-perpendicular-to-plane (CPP) magnetoresistive (MR) sensor stacks are provided, together with methods for forming such stacks. Such stacks have increased resistance and enhanced magnetoresistive properties relative to CPP stacks made entirely of metallic layers. Said enhanced properties are provided by the insertion of magnetic nano-oxide layers between ferromagnetic layers and non-magnetic spacer layers, whereby said nano-oxide layers increase resistance and exhibit spin filtering properties. CPP sensor stacks of various types are provided, all having nano-oxide layers formed therein, including the spin-valve type and the synthetic antiferromagnetic pinned layer spin-valve type. Said stacks can also be formed upon each other to provide laminated stacks of different types.
    Type: Grant
    Filed: March 28, 2005
    Date of Patent: January 17, 2006
    Assignee: Headway Technologies, Inc.
    Inventors: Bernard Dieny, Cheng Horng, Kochan Ju, Min Li, Simon Liao
  • Patent number: 6987652
    Abstract: The present invention provides a magnetoresistive element in which a first magnetic layer and a second magnetic layer whose coercive forces are different, and a non-magnetic layer that is disposed between the magnetic layers, wherein edges of the magnetoresistive element are tapered, or a magnetoresistive element in which a first magnetic layer and a second magnetic layer, and a non-magnetic layer that is disposed between the magnetic layers, wherein the coercive force of the first magnetic layer is larger than the coercive force of the second magnetic layer, and wherein relation between a base area S1 of the first magnetic layer and a base area S2 of the second magnetic layer is S1>S2.
    Type: Grant
    Filed: October 1, 2002
    Date of Patent: January 17, 2006
    Assignee: Canon Kabushiki Kaisha
    Inventor: Akio Koganei