Abstract: A write masked latch bit cell of an SRAM includes a write mask circuit that is responsive to assertion of a first write mask signal to cause a value of a write data node to be a first value and is responsive to assertion of a second write mask signal to cause the value of the write data node to have a second value. A pass gate supplies the data on the write data node to an internal node of the bit cell responsive to write word line signals being asserted. A keeper circuit maintains the value of the first node independently of values of the write word line signals while the first write mask signal and the second write mask signal are deasserted.

Abstract: Provided are a memory device skipping a refresh operation and an operating method thereof. The memory device includes a memory cell array including N rows; a refresh controller configured to control a refresh operation for the N rows of the memory cell array based on a refresh command; and an access information storage circuit including a plurality of registers configured to store flag information corresponding to each of the N rows, wherein a first value indicates rows that have been accessed, and a second value indicates rows that have not been accessed. The refresh controller is further configured to control whether the refresh operation is performed for a first row of the N rows at a refresh timing for the first row based on the flag information corresponding to the first row.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for staggering the timing of skipped refresh operations on a memory. Memory cells of memories may need to periodically perform refresh operations. In some instances, auto-refresh operations may be periodically skipped when charge retention characteristics of the memory cells of the memory exceed the auto-refresh frequency. To reduce peak current draw during refresh operations, the skipped refresh operations may be staggered across different portions of the memory. In one example, the skipped refresh operation may be staggered in time among memory dies of the memory to limit a number of memory dies that are performing an auto-refresh operation to a maximum number. In another example, the skipped refresh operation may be staggered in time among memory banks of a single memory array to limit a number of memory banks that are performing an auto-refresh operation to a maximum number.

Abstract: The present description relates to a method and a circuit for powering a volatile memory in which power pulses are sent to the memory, the duration between two pulses being shorter than a remanence time of said volatile memory.

Abstract: A memory device includes: a memory cell array comprising a plurality of memory cells; a temperature sensor configured to detect a temperature of the memory cell array; a write circuit configured to write data into the plurality of memory cells; and a controller coupled to the temperature sensor and the write circuit, wherein the controller is configured to determine a target write pulse width used by the write circuit based on the detected temperature of the memory device.

Abstract: A method to perform an on demand refresh operation of a memory sub-system is disclosed. The method includes identifying a temporal attribute of user data stored in the memory component, upon determining that the identified temporal attribute satisfies a time condition, providing an indication whether a refresh operation of the user data improves performance of the memory component, receiving an indication to perform the refresh operation of the memory component, and responsive to a time between the refresh operation and a previously performed refresh operation not satisfying a threshold criterion, refraining from performing the refresh operation of the memory component.

Abstract: A method for performing a refresh operation based on system characteristics is provided. A The method includes determining that a current operation condition of a memory component is in a first state and detecting a change in the operation condition from the first state to a second state. The method further includes determining a range of the operation condition to which the second state belongs. The method further includes determining a refresh period associated with the range of the operation condition, the refresh period corresponding to a period of time between a first time when a write operation is performed on a segment of the memory component and a second time when a refresh operation is to be performed on the segment. The method further includes performing the refresh operation on the memory component according to the refresh period.

Abstract: A non-volatile storage system includes: a host and a storage device. The host includes a submission queue memory, a completion queue memory, and a read/write data memory, and the storage device includes: a controller configured to concurrently communicate with the read/write data memory and with at least one of the submission queue memory and the completion queue memory; and a memory device configured to communicate with the controller.

Abstract: A resistive element array circuit includes word lines, bit lines, resistive elements, a selector, a differential amplifier, and a ground terminal. The word lines are coupled to a power supply. The resistive elements are each disposed at an intersection of corresponding one of the word lines and corresponding one of the bit lines. The selector is configured to select one word line and one bit line. The differential amplifier includes a positive input terminal configured to be coupled to the selected one of the bit lines which is selected by the selector, a negative input terminal configured to be coupled to non-selected one of the bit lines which is not selected by the selector and to non-selected one of the word lines which is not selected by the selector, an output terminal being coupled to the negative input terminal. The ground terminal is coupled to the positive input terminal.

Abstract: An apparatus and method are provided for controlling memory accesses. The apparatus has memory access circuitry for performing a tag-guarded memory access operation in response to a target address, the tag-guarded memory access operation by default comprising: comparing an address tag associated with the target address with a guard tag stored in a memory system in association with a block of one or more memory locations comprising an addressed location identified by the target address; and generating an indication of whether a match is detected between the guard tag and the address tag. Further, the apparatus has control tag storage for storing, for each of a plurality of memory regions, configuration control information used to control how the tag-guarded memory access operation is performed by the memory access circuitry when the target address is within that memory region. Each memory region corresponds to multiple of the blocks.

Abstract: During system initialization, each data buffer device and/or memory device on a memory module is configured with a unique (at least to the module) device identification number. In order to access a single device (rather than multiple buffers and/or memory devices), a target identification number is written to all of the devices using a command bus connected to all of the data buffer devices or memory devices, respectively. The devices whose respective device identification numbers do not match the target identification number are configured to ignore future command bus transactions (at least until the debug mode is turned off.) The selected device that is configured with a device identification number matching the target identification number is configured to respond to command bus transactions.

Abstract: A semiconductor memory device and a memory system are provided. The semiconductor memory device includes a memory cell array, a normal refresh row address generator, a hammer refresh row address generator, a refresh selection signal generator, and a selector. The normal and hammer refresh row address generators generates a normal refresh row address and a hammer refresh row address, respectively, in response to a refresh counting control signal. The refresh selection signal generator sequentially generates normal and hammer refresh selection signals in response to the refresh counting control signal. The selector selects the normal refresh row address or the hammer refresh row address in response to the normal and hammer refresh selection signals. A normal refresh operation and a hammer refresh operation are sequentially performed on a memory cell array block among plural memory cell array blocks in response to the refresh row address.

Abstract: Methods, systems, and devices for memory device operation are described. A memory device may operate in different modes in response to various conditions and user constraints. Such modes may include a power-saving or low power mode. While in the low power mode, the memory device may refrain from operations, such as self-refresh operations, on one or more of the memory array(s) included in the memory device. The memory device may deactivate external interface components and components that may generate operating voltages for the memory array(s), while the memory device may continue to power circuits that store operating information for the memory device. The memory device may employ similar techniques in other operating modes to accommodate or react to different conditions or user constraints.

Abstract: An apparatus includes a first device having a clock signal and configured to communicate, via a data bus, with a second device configured to assert a data strobe signal and a plurality of data bit signals on the data bus. The first device may include a control circuit configured, during a training phase, to determine relative timing between the clock signal, the plurality of data bit signals, and the data strobe signal. The first device may determine, using a first set of sampling operations, a first timing relationship of the plurality of data bit signals relative to the data strobe signal, and determine, using a second set of sampling operations, a second timing relationship of the plurality of data bit signals and the data strobe signal relative to the clock signal. During an operational phase, the control circuit may be configured to use delays based on the first and second timing relationships to sample data from the second device on the data bus.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for controlling refresh operations. Responsive to a refresh command, or one or more pumps generated responsive to the refresh command, different banks of a memory array may perform different types of refresh operations for a pump. In some examples, the type of refresh operation performed by a bank may vary from pump to pump of a refresh operation.

Abstract: The present embodiments provide a system that supports self-refreshing operations in a memory device. During operation, the system transitions the memory device from an auto-refresh state, wherein a memory controller controls refreshing operations for the memory device, to a self-refresh state, wherein the memory device controls the refreshing operations. While the memory device is in the self-refresh state, the system sends progress information for the refreshing operations from the memory device to the memory controller. Next, upon returning from the self-refresh state to the auto-refresh state, the system uses the progress information received from the memory device to control the sequencing of subsequent operations by the memory controller.

Abstract: A semiconductor memory device is provided. The semiconductor memory device can suppress increases in power consumption. As a result, damage to the data normally caused by row hammer problem can be prevented. The semiconductor memory device includes a control unit. The control unit controls a refresh operation for a memory to be performed at any interval, wherein there are a plurality of possible intervals. When read/write access to the memory is required, the control unit controls the refresh operation for the memory to be performed with a shortest interval among the intervals, until a predetermined condition is met.

Abstract: Methods, systems, and devices for dirty write on power off are described. In an example, the described techniques may include writing memory cells of a device according to one or more parameters (e.g., reset current amplitude), where each memory cell is associated with a storage element storing a value based on a material property associated with the storage element. Additionally, the described techniques may include identifying, after writing the memory cells, an indication of power down for the device and refreshing, before the power down of the device, a portion of the memory cells based on identifying the indication of the power down for the device. In some cases, refreshing includes modifying at least one of the one or more parameters for a write operation for the portion of the memory cells.

Abstract: Methods and systems include memory devices with a memory array comprising a plurality of memory cells. The memory devices include a control circuit operatively coupled to the memory array and configured to receive a read request for data and to apply a first voltage to the memory array based on the read request. The control circuit is additionally configured to count a total number of the plurality of memory cells that have switched to an active read state based on the first voltage and to apply a second voltage to the memory array based on the total number. The control circuit is further configured to return the data based at least on bits stored in a first and a second set of the plurality of memory cells.

Abstract: Information associated with a user and a presentation made by the user is received. A presentation readiness of the user is dynamically detected. One or more of a presentation mode of a presentation software and a recording mode of the presentation software is initiated based on the received information and the dynamically detected presentation readiness.

Abstract: Systems, apparatuses, and methods related to host-based error correction are described. Error correction operations can be performed on a host computing system as opposed to on a memory system. For instance, data containing erroneous bits can be transferred from a memory system to a host computing system and error correction operations can be performed using circuitry resident on the host computing system. In an example, a method can include receiving, by a host computing system, data that comprises a plurality of uncorrected bits from a memory system coupleable to the host computing system, determining an acceptable error range for the data based at least in part on an application associated with the data, and performing, using error correction logic resident on the host computing system, an initial error correction operation on the data based at least in part on the acceptable error range.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for scheduling targeted refreshes in a memory device. Memory cells in a memory device may be volatile and may need to be periodically refreshed as part of an auto-refresh operation. In addition, certain rows may experience faster degradation, and may need to undergo targeted refresh operations, where a specific targeted refresh address is provided and refreshed. The rate at which targeted refresh operations need to occur may be based on the rate at which memory cells are accessed. The memory device may monitor accesses to a bank of the memory, and may use a count of the accesses to determine if an auto-refresh address or a targeted refresh address will be refreshed.

Abstract: A memory device includes a latch circuit suitable for storing an input address as a first latch address in response to a first latch signal, and storing an address, selected between the input address and the first latch address, as a second latch address in response to a second latch signal, a test determining circuit suitable for determining whether a memory cell fail occurs, based on test data, and generating a detection signal corresponding to the determination result, in response to a test mode signal, and a control signal generation circuit suitable for comparing the input address to the first and second latch addresses in response to the detection signal, and selectively enabling the first and second latch signals according to the comparison result.

Abstract: A nonvolatile memory device comprises a first semiconductor layer including, an upper substrate, and a memory cell array in which a plurality of word lines on the upper substrate extend in a first direction and a plurality of bit lines extend in a second direction. The nonvolatile memory device comprises a second semiconductor layer under the first semiconductor layer in a third direction perpendicular to the first and second directions, the second semiconductor layer including, a lower substrate, and a substrate control circuit on the lower substrate and configured to output a bias voltage to the upper substrate. The second semiconductor layer is divided into first through fourth regions, each of the first through fourth regions having an identical area, and the substrate control circuit overlaps at least a portion of the first through fourth regions in the third direction.

Abstract: A memory for an artificial neural network (ANN) accelerator is provided. The memory includes a first bank, a second bank and a bank selector. Each bank includes at least two word lines and a plurality of read word selectors. Each word line stores a plurality of words, and each word has a plurality of bytes. Each read word selector has a plurality of input ports and an output port, is coupled to a corresponding word in each word line, and is configured to select a byte of the corresponding word of a selected word line based on a byte select signal. The bank selector is coupled to the read word selectors of the first bank and the second bank, and configured to select a combination of read word selectors from at least one of the first bank and the second bank based on a bank select signal.

Abstract: A sense amplifier is biased to reduce leakage current equalize matched transistor bias during an idle state. A first read select transistor couples a true bit line and a sense amplifier true (SAT) signal line and a second read select transistor couples a complement bit line and a sense amplifier complement (SAC) signal line. The SAT and SAC signal lines are precharged during a precharge state. An equalization circuit shorts the SAT and SAC signal lines during the precharge state. A differential sense amplifier circuit for latching the memory cell value is coupled to the SAT signal line and the SAC signal line. The precharge circuit and the differential sense amplifier circuit are turned off during a sleep state to cause the SAT and SAC signal lines to float. A sleep circuit shorts the SAT and SAC signal lines during the sleep state.

Abstract: A memory system includes a memory controller and a memory device. The memory controller generates refresh commands periodically by an average refresh interval. The memory device performs a normal refresh operation and a hammer refresh operation during a refresh cycle time. The memory device includes a memory cell array including memory cells connected to a plurality of wordlines, a temperature sensor configured to provide temperature information by measuring an operation temperature of the memory cell array and a refresh controller configured to control the normal refresh operation and the hammer refresh operation. The refresh controller varies a hammer ratio of a unit hammer execution number of the hammer refresh operation executed during the refresh cycle time with respect to a unit normal execution number of the normal refresh operation executed during the refresh cycle time.

Abstract: Methods, systems, and devices for restoring memory cell threshold voltages are described. A memory device may perform a write operation on a memory cell during which a logic state is stored at the memory cell. Upon detecting satisfaction of a condition, the memory device may perform a read refresh operation on the memory cell during which the threshold voltage of the memory cell may be modified. In some cases, the duration of the read refresh operation may be longer than the duration of a read operation performed by the memory device on the memory cell or on a different memory cell.

Abstract: A reducing peak current consumption in a memory device when performing a word line voltage refresh operation or a read operation. When a word line voltage refresh operation or read operation is performed for the first time after a memory device powers up, the operation is performed with a power-saving technique such as reducing a ramp up rate of a voltage pulse, ramping up the voltage pulse in multiple steps, initiating the ramp up for different groups of word lines in a block at different times, initiating the ramp up for different blocks of word lines at different times, and reducing the number of blocks which are refreshed concurrently. When an additional word line voltage refresh operation or read operation is subsequently performed, the power-saving technique can be omitted.

Abstract: Methods, systems, and devices for self-refresh of memory cells are described. A controller coupled with a memory cell may be configured to apply a first voltage to a control gate of a first transistor, where the first voltage activates the first transistor to selectively couple terminals of the first transistor with each other based on a charge stored on the interstitial gate. The controller may be configured to apply a current to a bit line, where a second voltage of the bit line is based on the current and the charge stored on the interstitial gate. The controller may be configured to apply, based on applying the first voltage to the control gate of the first transistor and applying the current to the bit line, a third voltage to a gate of a second transistor to couple the bit line with the interstitial gate of the first transistor.

Abstract: A memory core including a memory core including memory cells that are arranged in a plurality of rows and a plurality of columns; and a refresh target selection circuit suitable for storing an address and a risk score of each of activated rows among the rows, wherein the refresh target selection circuit is further suitable for increasing the risk score of a corresponding row whenever the corresponding row is activated, whenever a row at a ‘+2’ position of the corresponding row is activated, and whenever a row at a ‘?2’ position of the corresponding row is activated.

Abstract: A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block.

Abstract: A memory apparatus may include a row hammer control circuit. The row hammer control circuit may generate a plurality of selection control signals by monitoring an interval at which a memory bank of a memory cell array is accessed. The row hammer apparatus may set a threshold value for performing a refresh operation, as one of a plurality of values, based on the plurality of selection control signals.

Abstract: A device includes a plurality of memory cells, an error detection circuit configured to detect at least one memory cell storing error data and a refresh control circuit including a register configured to store an error address corresponding to the at least one memory cell storing error data. The refresh control circuit is configured to control a refresh cycle of the error address.

Abstract: A multi-rank memory system in which calibration operations are performed between a memory controller and one rank of memory while data is transferred between the controller and other ranks of memory. A memory controller performs a calibration operation that calibrates parameters pertaining to transmission of data via a first data bus between the memory controller and a memory device in a first rank of memory. While the controller performs the calibration operation, the controller also transfers data with a memory device in a second rank of memory via a second data bus.

Abstract: Memory devices and systems with programmable refresh order and stagger times are disclosed herein. In one embodiment, a memory device includes a first memory bank group and a second memory bank group. The memory device is configured, in response to a refresh command, to perform a first refresh operation on the first memory bank group at a first time and a second refresh operation on the second memory bank group at a second time after the first time. The memory device is further configured to perform, in response to a read or write command, a read or write operation on the first memory bank group, the second memory bank group, or both the first and second memory bank groups after beginning the first refresh operation and before completing the second refresh operation.

Abstract: Apparatuses and methods for calculating targeted refresh addresses may include circuitry that may be used to calculate victim row addresses having a variety of spatial relationships to an aggressor row. The spatial relationship of the victim row addresses calculated by the circuitry may be based, at least in part, on states of control signals provided to the circuitry. That is, the circuitry may be used to calculate the different victim row addresses by changing the states of the control signals.

Abstract: Methods, apparatuses, and systems related to voltage management of memory apparatuses/systems are described. The memory device can include circuitry configured to determine an operating frequency of a clock signal for an ongoing or an upcoming memory operation. The memory device may generate a control indicator for increasing a system voltage for higher operating frequencies, for decreasing the system voltage for lower operating frequencies, or a combination thereof.

Abstract: A memory device including: a plurality of pins for receiving control signals from an external device; a first bank having first memory cells, wherein the first bank is activated in a first operation mode and a second operation mode; a second bank having second memory cells, wherein the second bank is deactivated in the first operation mode and activated in the second operation mode; a processing unit configured to perform an operation on first data, output from the first memory cells, and second data, output from the second memory cells, in the second operation mode; and a processing-in-memory (PIM) mode controller configured to select mode information, indicating one of the first operation mode and the second operation mode, in response to the control signals and to control at least one memory parameter, at least one mode register set (MRS) value, or a refresh mode according to the mode information.

Abstract: Methods, systems, and apparatuses related to determination of durations of memory device temperatures are described. For example, a controller can be coupled to a memory device to monitor an operating temperature of the memory device. The controller can determine the operating temperature exceeds a threshold temperature. The controller can determine a duration that the temperature exceeds the threshold temperature. The controller can provide data corresponding to the operating temperature and the duration to a requesting device.

Abstract: A method includes monitoring a temperature of a memory component of a memory sub-system to determine that the temperature of the memory component corresponds to a first monitored temperature value; writing data to the memory component of the memory sub-system while the temperature of the memory component corresponds to the first monitored temperature value; determining that the first monitored temperature value exceeds a threshold temperature range; monitoring the temperature of the memory component of the memory sub-system to determine that the temperature of the memory component corresponds to a second monitored temperature value that is within the threshold temperature range; and rewriting the data to the memory component of the memory sub-system while the temperature of the memory component corresponds to the second monitored temperature value.

Abstract: Techniques described herein are related to protecting at least a portion of data stored in a memory array. A method may include detecting an invalid memory access request based at least in part on the secret key and the identifier and preventing unauthorized access of a memory array by halting an internal refresh of one or more memory cells associated with the memory array in response to detecting the invalid memory access request.

Abstract: Various implementations described herein are related to a device having a sense amplifier that provides output data based on sensing a difference between input signals. The device may have a tracking circuit that tracks a resistive state of a bitcell and provides an input signal to the sense amplifier based on the tracked resistive state of the bitcell. The device may have a bitcell circuit that senses a data value associated with the resistive state of the bitcell and provides another input signal to the sense amplifier based on the sensed data value of the bitcell.

Abstract: Disclosed herein are mechanisms and methods for reducing power consumed by various DRAM technologies (e.g., high-capacity DRAM and/or 3D DRAM) which may impact battery life of the platform. These mechanisms and methods may opportunistically reduce the power consumed by DRAM by inhibiting periodic refresh commands to memory ranks that are not in-use. Since these mechanisms and methods may be based on enhancements to memory controllers, they may accordingly be operating system (OS) agnostic.

Abstract: Systems, apparatuses, and methods related to using memory device sensors are described. Some memory system or device types include sensors embedded in their circuitry. For instance, a device can be coupled to a memory device with an embedded sensor. The memory device can transmit the data generated by the embedded sensor using a sensor output coupled to the device. The memory device may generate, based at least in part on a characteristic of a memory device, a signal from a sensor embedded in the memory device and transmit the signal generated by the sensor from the memory device to another device coupled to the memory device.

Abstract: The present disclosure generally relates to methods of operating storage devices. The storage device is comprised of a controller, a random access memory (RAM) unit, and a NVM unit, wherein the NVM unit is comprised of a plurality of zones. The RAM unit comprises a first logical to physical address table and the NVM unit comprises a second logical to physical address table. The zones are partitioned into sections, and each partitioned section aligns with a change log table. Data is written to each zone sequentially, and only one partitioned section is updated at a time for each zone. Each time a zone is erased or written to in the NVM unit, the first logical to physical address table is updated and the second logical to physical address table is periodically updated to match the first logical to physical address table.

Abstract: Systems, apparatuses, and methods for performing efficient memory accesses for a computing system are disclosed. In various embodiments, a computing system includes a computing resource and a memory controller coupled to a memory device. The computing resource selectively generates a hint that includes a target address of a memory request generated by the processor. The hint is sent outside the primary communication fabric to the memory controller. The hint conditionally triggers a data access in the memory device. When no page in a bank targeted by the hint is open, the memory controller processes the hint by opening a target page of the hint without retrieving data. The memory controller drops the hint if there are other pending requests that target the same page or the target page is already open.

Abstract: Addresses of accessed word lines are stored. Data related to victim word lines associated with the accessed word line are also stored. The victim word lines may have data stored in relation to multiple accessed word lines. The data related to the victim word lines is adjusted when the victim word line is refreshed during a targeted refresh operation or an auto-refresh operation. The data related to the victim word lines is adjusted when the victim word line is accessed during a memory access operation.

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, and methods for dynamic refresh allocation. Memories may be subject to row hammer attacks, where one or more wordlines are repeatedly accessed to cause data degradation in victim rows nearby to the hammered wordlines. A memory may perform background auto-refresh operations, and targeted refresh operations where victim wordlines are refreshed. The memory may monitor access patterns to the memory in order to dynamically allocate the number of targeted refresh operations and auto-refresh operations in a set of refresh operations based on if a hammer attack is occurring and the type of hammer attack which is occurring.

Abstract: In some examples, a memory device may perform refresh operations responsive to internal and/or external commands. internal refresh commands may include auto-refresh commands and row hammer (e.g., targeted) refresh commands. External commands may include refresh management commands. In some examples, the external command may cause a refresh operation to occur after a number of activation commands. The memory device may monitor row addresses associated with the activation commands. In some examples, the memory device may skip a refresh operation indicated by a refresh management command if none of the row addresses associated with the activation commands occurs at a high frequency. In some examples, row addresses may be determined to be aggressor row addresses if a received row address matches a previously received row address.