Abstract: Apparatuses, systems, and methods for a memory-directed access pause. A controller may perform access operations on a memory by providing commands and addresses. The memory may monitor the addresses to determine if one or more forms of attack (deliberate or inadvertent) is occurring. If an attack is detected, the memory may issue an alert signal (e.g., along an alert bus) and also provide pause data (e.g., along a data bus). The pause data may specify a length of time, and responsive to the alert and the pause data, the controller may suspend access operations on the memory for the length of time specified in the pause data. The memory may use the time when access operations are paused to refresh itself, for example to heal the damage caused by the attack).

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, and methods for dynamic targeted refresh steals. A memory bank may receive access commands and then periodically enter a refresh mode, where auto-refresh operations and targeted refresh operations are performed. The memory bank may receive a refresh management command based on a count of access commands directed to the memory bank. Responsive to the refresh management signal, a panic targeted refresh operation may be performed on the memory bank. A number of times the refresh management signal was issued may be counted, and based on that count a next periodic targeted refresh operation may be skipped.

Abstract: An electronic device includes a memory controller and a memory device. The memory controller that controls the memory device includes a write buffer to temporarily store write data received from a host, a write timing controller to receive temperature information indicating a temperature of the memory device and generate write timing information based on the temperature information, the write timing information indicating a write timing at which the write data is transferred to and stored in the memory device, and a write operation controller to control the write buffer and the memory device based on the write timing information such that the write data stored in the write buffer is transferred to and stored in the memory device.

Abstract: An opening is formed in an accommodating case of a fuel cell stack. Flat cables are led out of the accommodating case through the opening. The flat cables pass through a grommet covering the opening. The grommet is positioned by a seal plate (positioning member) attached to the accommodating case.

Abstract: Memory devices, memory systems, and methods of operating memory devices and systems are disclosed in which a single command can trigger a memory device to perform multiple operations, such as a single refresh command that triggers the memory device to both perform a refresh command and to perform a mode register read. One such memory device comprises a memory, a mode register, and circuitry configured, in response to receiving a command to perform a refresh operation at the memory, to perform the refresh operation at the memory, and to perform a read of the mode register. The memory can be a first memory portion, the memory device can comprise a second memory portion, and the circuitry can be further configured, in response to the command, to provide on-die termination at the second memory portion of the memory system during at least a portion of the read of the mode register.

Abstract: A program operation on a subset of a plurality of memory cells is performed. A sense operation on the subset of the plurality of memory cells is performed to determine respective values stored in the subset of the plurality of memory cells. One or more patterns of pre-programmed memory cells of the memory device are identified. The one or more patterns comprise representations of values of the pre-programmed memory cells when at least one of a first temperature criterion or a second temperature criterion is satisfied. The respective values of the subset of the plurality of memory cells are compared to the values of the pre-programmed memory cells in the one or more patterns. Based on the comparison, a reading from a thermal sensor coupled to the memory device is determined to satisfy an accuracy criterion.

Abstract: Methods, systems, and devices for refresh-related activation in memory are described. A memory device may conduct a refresh operation to preserve the integrity of data. A refresh operation may be associated with a refresh time where the memory device is unable to execute or issue any commands (e.g., access commands). By posting (e.g., saving) one or more commands and/or row addresses during the refresh time, the memory device may be configured to execute the saved commands and/or re-open one or more rows associated with the saved row addresses at a later time (e.g., upon completion of the refresh operation). Accordingly, fewer commands may be issued to activate the memory cells after the refresh time.

Abstract: Memory devices and systems with partial array refresh control over memory regions in a memory array, and associated methods, are disclosed herein. In one embodiment, a memory device includes a memory array having a first memory region and a second memory region. The memory device is configured to write data to the memory array in accordance with a programming sequence by initially writing data to unutilized memory cells of the first memory region before initially writing data to unutilized memory cells of the second memory region. The memory device is further configured to determine that the data stored on the first and/or second memory regions is not consolidated, and to consolidate at least a portion of the data by rewriting the portion of the data to physically or logically contiguous memory cells of the first memory region and/or the second memory region.

Abstract: A computer-implemented method is provided for neuromorphic computing in a Dynamic Random Access Memory (DRAM). The method includes representing one or more neurons by memory rows in the DRAM. Each bit in any of the memory rows represents a single synapse. The method further includes responsive to activating a given one of the neurons, reinforcing an associated synaptic state of a corresponding one of the memory rows representing the given one of the neurons. The method also includes responsive to inhibiting the given one of the neurons, degrading the associated synaptic state of the corresponding one of the memory rows representing the given one of the neurons.

Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-di vision manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: Embodiments of the disclosure are drawn to apparatuses and methods for managing access counts of wordlines of a memory. Repeated access to an aggressor wordline may cause increased data degradation in nearby victim wordlines of the memory. The access count of a given wordline may be stored in counter memory cells positioned along that wordline. When the wordline is accessed, the counter memory cells may be read out to refresh circuit, which may determine the access count based on the values stored in the counter memory cells. If the access count is below a threshold, the access count may be incremented and written back to the counter memory cells. If the access count is above the threshold, the refresh circuit may signal that the accessed wordline is an aggressor, and may reset the value of the access count before writing it back to the counter memory cells.

Abstract: Disclosed herein is an apparatus that includes a first semiconductor chip including a memory cell array having a volatile memory cell and an access control circuit configured to perform a refresh operation on the volatile memory cell, and a second semiconductor chip including a power generator configured to supply a first power supply voltage to the first semiconductor chip. The access control circuit is configured to activate a first enable signal during the refresh operation. The second semiconductor chip is configured to change a capability of the power generator based on the first enable signal.

Abstract: An information handling system includes a processor that runs a maximum memory stress test of a memory module with a refresh rate of memory devices set to a first refresh rate. Then, the processor may receive a power consumption of the memory module. Also, the processor may receive the temperature of the memory devices, and may set the refresh rate to a second refresh rate. The processor may continuously receive both the power consumption of the memory module and the temperature of the memory devices. Based on the continuously received temperature, the processor may determine whether the temperature of the memory devices exceeds a second threshold temperature. If so, the processor may store a first setting as a refresh setting for the memory module. Otherwise, the processor may store a second setting as the refresh setting for the memory module.

Abstract: A memory device including a memory unit and a control circuit is provided. The memory unit includes a plurality of memory banks. The memory banks are at least divided into a first group and a second group. The control circuit is coupled to the memory unit. The control circuit is configured to perform a first refresh operation on the first group and the second group. When the control circuit performs the first refresh operation on one of the first group and the second group, the control circuit performs a second refresh operation on a victim row of the other one of the first group and the second group. In addition, a method for refreshing a memory device is also provided.

Abstract: Disclosed herein is an apparatus that includes a memory cell array including a plurality of word lines each coupled to a plurality of memory cells, and a control circuit configured to activate first and second internal signals in a time-di vision manner in response to a first external command. A first number of the word lines are selected in response to the first internal signal, and a second number of the word line is selected in response to the second internal signal, the second number is smaller than the first number.

Abstract: A memory system includes a nonvolatile memory including a plurality of blocks, in each of which a plurality of memory cells is arranged between bit lines and a source line, and a memory controller configured to control an operation of the nonvolatile memory. The memory controller is configured to issue a warming command to the nonvolatile memory when a temperature of the nonvolatile memory is lower than a first temperature, and the nonvolatile memory, in response to the warming command, causes current to flow through at least one bit line connected to memory cells of a first block.

Abstract: Refresh commands may be provided at random intervals from a memory controller to a memory device. In some examples, refresh requests may be provided at random intervals which may be used to provide refresh commands from the memory controller to the memory device at random intervals. In some examples, an average time interval between refresh requests may be equal to a refresh interval of the memory device. In some examples, a maximum number of times the memory controller may postpone providing a refresh command to the memory device may be a random number. In some examples, a maximum value of the random number may be based, at least in part, on a minimum number of refresh commands required within a time interval by the memory device.

Abstract: Memory devices and systems with per pin input/output termination and driver impedance calibration capabilities, and associated methods, are disclosed herein. In one embodiment, a device apparatus includes circuitry dedicated to an individual DQ pin of the device apparatus. The circuitry can be configured to (i) generate, at least in part, a voltage at the DQ pin based, at least in part, on an impedance internal to a host device electrically connected to the device apparatus and (ii) compare the voltage to a target voltage. Based, at least in part, on the comparison, the circuitry can be configured to adjust a resistance of an output driver and/or a termination circuit of the device apparatus that correspond to the DQ pin to adjust the impedance of the output driver and/or termination circuit to match an impedance associated with a corresponding input/output pin of the host device.

Abstract: A semiconductor storage device includes a plurality of memory cells connected to each other in series, a plurality of word lines respectively connected to gates of the plurality of memory cells, and a control circuit configured to perform a read operation by applying a first voltage higher than ground voltage to the plurality of word lines during a first time period at the beginning of which each word line is at ground voltage, applying a second voltage lower than the first voltage to a first word line during a second time period subsequent to the first time period, applying a third voltage higher than the second voltage to the first word line during a third time period subsequent to the second time period, and determining data of the memory cells connected to the first word line while all portions of the first word line are at the third voltage.

Abstract: Methods and systems for controlling refresh operations of a memory device. A method disclosed herein includes receiving, by a refresh controller of the memory device, a refresh command from a host for performing the refresh operation on a plurality of memory rows. The method further includes selecting, by the refresh controller, at least one memory row from the plurality of memory rows for the refresh operation using a refresh-row selection circuitry. The at least one memory row is selected by performing digital reading or analog reading of at least one row condition cell (RCC) and at least one supplemental cell that are connected to each memory row of the memory rows. The method further includes performing, by the refresh controller, the refresh operation on the selected at least one memory row.

Abstract: An indication of a programming temperature at which data is written at a first location of the memory component is received. If it is indicated that the programming temperature is outside of a temperature range associated with the memory component, the data written to the first location of the memory component is re-written to a second location of the memory component when an operating temperature of the memory component returns within the temperature range.

Abstract: A chip includes a level control circuit, an output circuit, a level supply circuit, and an output terminal. The level control circuit is configured to output a response signal in response to an operation mode of the chip. The output circuit has an output side, and the output side couples to the output terminal. When the operation mode of the chip is a working mode, the response signal is at a first level, and the output circuit is configured to output an output signal at the output terminal. When the operation mode of the chip is a power saving mode, the response signal is at a second level, the output side of the output circuit is in a floating state, and the level supply circuit is configured to provide a level voltage to the output terminal according to the response signal, so that the output terminal has a fixed level.

Abstract: A memory device includes a memory cell array including a plurality of banks each including a plurality of memory cells connected to a plurality of word lines, and a row decoder block connected to the plurality of banks. In a first operation mode, the row decoder block receives a first row address and a first bank address together with an activation command and activates a word line selected by the first row address from among the plurality of word lines of a bank selected by the first bank address from among the plurality of banks. In a second operation mode, the row decoder block receives a second row address and a second bank address together with the activation command and activates a word line selected by the second row address from among the plurality of word lines of each of at least two banks of the plurality of banks.

Abstract: Aspects of the present invention disclose a method for securely storing data. The method includes one or more computer processors receiving, by one or more computer processors, a request to store data, wherein the data includes a plurality of elements. The method further includes generating a plurality of elements of encoded data by on applying one or more encoding algorithms to the data, wherein a quantity of the plurality of elements of the encoded data is equal to a quantity of the plurality of elements of the data. The method further includes distributing the plurality of elements of the encoded data into two or more subsets of the encoded data, without duplication. The method further includes transmitting the two or more subsets of the encoded data to a corresponding quantity of two or more storage systems.

Abstract: Embodiments of the disclosure are drawn to apparatuses methods for checking redundancy information for row addresses prior to performing various refresh operations, such as auto refresh and targeted refresh operations. In some examples, refresh operations may be multi pump refresh operations. In some examples, a targeted refresh operation may be performed prior to an auto refresh operation responsive to a multi pump refresh operation. In some examples, redundancy information for the auto refresh operation may be performed, at least in part, during the targeted refresh operation. In some examples, refresh operations on word lines may be skipped when the redundancy information indicates the word line is defective or unused.

Abstract: A computation operator in memory and an operation method thereof are provided. The computation operator in memory includes a word line calculator, a decision-maker and a sense amplifier. The word line calculator calculates a number of enabled word lines of a memory. The decision-maker generates a plurality of reference signals according to at least one of the number of enabled word lines and a used size of the memory, the reference signals are configured to set a distribution range. The sense amplifier receives a readout signal of the memory, and obtains a computation result by converting the readout signal according to the reference signals.

Abstract: A semiconductor device includes an error check and scrub (ECS) command generation circuit and an ECS control circuit. The ECS command generation circuit is configured to generate an ECS command by controlling a speed of a first counting operation that is performed based on a refresh command or a bank refresh command, according to a temperature and a refresh mode of the semiconductor device, or is configured to generate the ECS command by performing a second counting operation based on a periodic signal. The ECS control circuit is configured to sequentially generate an ECS active command, an ECS read command, an ECS write command, an ECS pre-charge command, and an end signal based on the ECS command. The refresh mode includes a fine granularity refresh (FGR) mode, and the temperature includes a high temperature that is a temperature above a certain temperature.

Abstract: A memory device applies different refresh rates to target data (or objective data) according to data characteristics (i.e., required reliability levels). The memory device includes a memory cell array provided with a plurality of memory cells, a row decoder configured to selectively activate word lines of the memory cell array in response to a row address signal, and a refresh controller configured to output the row address signal in response to the row address signal. The refresh controller controls a refresh ratio of a first storage region and a second storage region contained in the memory cell array in response to a changeable refresh control value.

Abstract: A memory device may include a first wordline and a second wordline, each having multiple memory cells. The memory device may also include control circuitry to facilitate writing a data pattern to the memory cells of the first wordline and facilitate copying the data pattern from the first wordline to the second wordline. Copying the first wordline to the second wordline may include activating the second wordline such that the first wordline and the second wordline are simultaneously active. A memory cell of the first wordline may be written a data value of the data pattern, and the memory cell may drive, at least partially, a corresponding memory cell of the second wordline with the data value.

Abstract: Methods of operating a number of memory devices are disclosed. A method may include adjusting a count of a refresh address counter of at least one memory device of a number of memory devices such that the count of the refresh address counter of the at least one memory device is offset from a count of a refresh address counter of at least one other memory device of the number of memory devices. The method may also include receiving, at each of the number of memory devices, a refresh command. Further, the method may include refreshing, at each of the number of memory devices, a row of memory cells indicated by the count of an associated refresh address counter. Related systems and memory modules are also described.

Abstract: A semiconductor memory device includes: a plurality of banks each suitable for refreshing at least one word line corresponding to a refresh address according to a row active signal; a refresh control circuit suitable for controlling, in response to a refresh command, an activation timing of the row active signal according to mode signals and a counting signal; a refresh counter suitable for generating the counting signal by counting the number of times the row active signal is activated, and generating sequence signals which are sequentially activated; and a detection circuit suitable for generating flag signals by combining the sequence signals, and generating a detection signal according to a corresponding one of the flag signals when any of the mode signals is activated, wherein the refresh counter is initialized by the detection signal.

Abstract: Apparatuses and methods related to memory bank power coordination in a memory device are disclosed. A method for memory bank power coordination may include concurrently performing a memory operation by a threshold number of memory regions, such as banks or subarrays, and executing a command to cause a budget area, such as a register, to perform a power budget operation associated with the memory operation. The threshold number of memory regions may be set based at least in part on a threshold power consumption value, and the number of memory regions to concurrently perform an operation may be controlled by a bank arbiter. A counter having a value representing the threshold number of memory regions may be decremented while performing an operation or incremented upon completion of an operation associated with one of the memory regions. A number of the memory regions may be selected to perform a processing-in-memory operation.

Abstract: A memory system includes a memory circuit including a plurality of pages, including a particular page having a page activation time. The memory system also includes a memory controller circuit configured to receive a memory access request corresponding to data of the particular page. The memory controller circuit is also configured to transmit, in response to a determination that the particular page is inactive, an activation command to the memory circuit to activate the particular page, and to schedule a future transmission of an initial memory command for the particular page based on the page activation time.

Abstract: The semiconductor device includes a fin FA selectively protruded from an upper surface of a semiconductor substrate SB, a gate insulating film GF1 formed on an upper surface and a side surface of the fin FA and having an insulating film X1 and a charge storage layer CSL, and a memory gate electrode MG formed on the gate insulating film GF1. Here, the thickness of the charge storage layer CSL on the upper surface of the fin FA is larger than the thickness of the charge storage layer CSL on the side surface of the fin FA.

Abstract: A system includes first and second sets of memory banks that store data. The system also includes an address path coupled to the memory banks that provides a row address to the memory banks. The system further includes a command address input circuit coupled to the address path. The command address input circuit includes a counter that stores and increments the row address. The system also includes a flip-flop that stores the row address in response to receiving a command to refresh the first set of memory banks.

Abstract: A sensing circuit includes a current generating circuit and a sensing circuit. The current generating circuit includes a first portion configured to generate a first mirrored current corresponding to a first reference cell programmed to a low logical value, a second portion configured to generate a second mirrored current corresponding to a second reference cell programmed to a high logical value, and a transistor configured to generate a reference voltage by conducting a first reference current equal to a sum of the first mirrored current and the second mirrored current. The sensing circuit includes a sense amplifier configured to generate an output voltage having a logical value based on a second reference current and a cell current of a memory cell, the second reference current being generated from the reference voltage.

Abstract: A semiconductor memory device includes a cell array including a plurality of word lines; a plurality of address storing circuits, each of the plurality of address storing circuits suitable for storing a sampling address as a latch address, a valid bit indicating whether the latch address is valid, and a valid-lock bit indicating whether the latch address is accessed more than a certain number of times, each of the plurality of address storing circuits further suitable for outputting the latch address as a target address according to the valid bit and valid-lock bit; and a row control circuit suitable for refreshing one or more word lines based on the target address in response to a refresh command.

Abstract: A memory module includes a plurality of memory devices each including a memory cell array, and a register clock driver connected to the memory devices. The register clock driver detects a row hammer address among row addresses corresponding to word lines of the memory cell array, converts a refresh command, among a plurality of refresh commands received from a memory controller for refreshing the memory cell array, to a row hammer refresh command, and transmits the row hammer refresh command and the row hammer address to each of the memory devices.

Abstract: In a storage device having an improved data receiving rate, the storage device includes: a plurality of memory devices each including a plurality of select signal pads; and a memory controller for providing a plurality of select signals representing a selected memory device among the plurality of memory devices through the plurality of select signal pads, wherein some select signals among the plurality of select signals include stack information indicating a number of the plurality of memory devices controlled by the memory controller.

Abstract: A device, for example a memory system, is disclosed wherein two or more operational modes may be set. The clock toggle rate and ODT resistors are dynamically controlled based on one or more of a desired margin of signal integrity, performance, cooling rate, and power consumption.

Abstract: A power management integrated circuit (PMIC) includes a voltage regulator, a monitoring circuit, and a count register. The voltage regulator is configured to generate an output voltage. The monitoring circuit is configured to receive a feedback voltage of the output voltage, and to determine at each of periodic intervals whether the feedback voltage is outside a threshold voltage range. The count register is configured to store a count value indicative of a number of times the feedback voltage is determined by the monitoring circuit to be outside the threshold voltage range.

Abstract: Described herein are systems and methods in which more secure methods are provided for a connected device to conduct transactions. In accordance with embodiments of the disclosure, a transaction code is generated and provided to the connected device. The transaction code may be stored in association with the information for the transaction such that when the transaction code is received at a transaction processing server, the transaction processing server is configured to generate an authorization request that includes the transaction information. The authorization request may then be routed to an authorization server associated with an account maintained by the transaction processing server.

Abstract: Methods and systems are provided for improving memory control. A memory architecture includes a plurality of memory units and an interface. A respective memory unit of the plurality of memory units is configured with a Processing-In-Memory (PIM) architecture. The interface includes a plurality of lines. The interface is coupled between the plurality of memory units and a host. The interface is configured to receive one or more signals from a host via the plurality of lines. The respective memory unit of the plurality of memory units is coupled with a respective line of the plurality of lines, and the respective memory unit is further configured to receive a respective signal of the one or more signals via the interface so as to be individually selected by the host.

Abstract: A semiconductor memory apparatus may include a memory bank, a global buffer array, and an input and output circuit. The memory bank includes a local data circuit, and the global buffer array includes a global data circuit. The local data circuit is operably coupled to the global data circuit. The global buffer array may be operably coupled to the input and output circuit. The memory bank is disposed in a core region, and the global buffer array and the input and output circuit may be disposed in a peripheral region separated from the core region.

Abstract: A storage system and method are provided for early host command fetching in a low queue depth environment. In one embodiment, a storage system is provided comprising a memory and a controller. The controller is configured to: determine a host's behavior for updating a submission queue; begin executing at least one command based on the determined host's behavior before receiving notification from the host that the host has updated the submission queue; receive notification from the host that the host has updated the submission queue; determine whether the submission queue has been updated with the at least one command that the controller began executing; and in response to determining that the submission queue has been updated with the at least one command that the controller began executing, continue executing the at least one command.

Abstract: A storage cell includes a selection circuit, a first memory transistor, and a second memory transistor. The selection circuit is coupled to a source line and a common node. When the selection circuit is turned on, the selection circuit forms an electrical connection between the source line and the common node. The first memory transistor has a first terminal coupled to the common node, a second terminal coupled to a first bit line, and a control terminal coupled to a control line. The second memory transistor has a first terminal coupled to the common node, a second terminal coupled to a second bit line, and a control terminal coupled to the control line. The first memory transistor and the second memory transistor are 2-dimension charge-trapping devices or 3-dimension charge-trapping devices.

Abstract: Methods, systems, and devices for row hammer protection for a memory device are described. A memory device may identify a threshold of related row accesses (e.g., access commands or activates to a same row address or a row address space) for a memory array. In a first operation mode, the memory device may execute commands received from a host device on the memory array. The memory device may determine that a metric of the received row access commands satisfies the threshold of related row accesses. The memory device may switch the memory array from the first operation mode to a second operation mode based on satisfying the threshold. The second operation mode may restrict access to at least one row of the memory, while the first mode may be less restrictive. Additionally or alternatively, the memory device may notify the host device that the metric has satisfied the threshold.

Abstract: Disclosed herein is an apparatus that includes a memory cell array, a row hammer refresh circuit configured to generate a row hammer refresh address based on an access history of the memory cell array, a redundancy circuit configured to store a plurality of defective addresses of the memory cell array, and a row pre-decoder configured to skip a refresh operation on the row hammer refresh address when the row hammer refresh address matches any one of the plurality of defective addresses.

Abstract: Methods of operating a memory device are disclosed. A method may include determining a number of active commands associated with at least one memory bank of a memory device during a first time interval. The method may further include adjusting a row hammer refresh rate for the at least one memory bank for a second time interval based on the number of active commands associated with the at least one memory bank during the first time interval. A memory device and an electronic system are also described.

Abstract: A system and associated processes may perform a memory access operation that includes receiving a data packet comprising a command of a type of a plurality of types of commands. The processes may include initiating a decoding of a first portion of the command, and automatically speculating as to the type of the command. Based on the speculation as to the type of the command, a bank activate command may be generated before the data packet is entirely decoded or received.