Abstract: A system for analyzing a railroad track comprises a transport device, a camera coupled to the transport device, an electronic display device, a memory device, and one or more processors. The camera is disposed adjacent to a rail of the railroad track and generates image data reproducible as one or more images of at least a portion of a surface of the rail. The processors can produce an image of the rail surface, which includes a plurality of elongated portions. The image is analyzed to identify any defects that exist within each elongated portion of the rail surface. The processors determine a value of a metric for each elongated portion of the rail surface. The metric is associated with the identified defects. The electronic display device displays a graph indicative of the metric for each elongated portion, the image of the rail surface, or both.

Abstract: Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.

Abstract: Methods and systems for measuring structural and material characteristics of semiconductor structures based on wavelength resolved, soft x-ray reflectometry (WR-SXR) at multiple diffraction orders are presented. WR-SXR measurements are simultaneous, high throughput measurements over multiple diffraction orders with broad spectral width. The availability of wavelength resolved signal information at each of the multiple diffraction orders improves measurement accuracy and throughput. Each non-zero diffraction order includes multiple measurement points, each different measurement point associated with a different wavelength. In some embodiments, WR-SXR measurements are performed with x-ray radiation energy in a range of 10-5,000 electron volts at grazing angles of incidence in a range of 1-45 degrees. In some embodiments, the illumination beam is controlled to have relatively high divergence in one direction and relatively low divergence in a second direction, orthogonal to the first direction.

Abstract: A method and system are presented for use in X-ray based measurements on patterned structures. The method comprises: processing data indicative of measured signals corresponding to detected radiation response of a patterned structure to incident X-ray radiation, and subtracting from said data an effective measured signals substantially free of background noise, said effective measured signals being formed of radiation components of reflected diffraction orders such that model based interpretation of the effective measured signals enables determination of one or more parameters of the patterned structure, wherein said processing comprises: analyzing the measured signals and extracting therefrom a background signal corresponding to the background noise; and applying a filtering procedure to the measured signals to subtract therefrom signal corresponding to the background signal, resulting in the effective measured signal.

Abstract: The techniques and device provided herein relate to regulating a source generator in X-ray based measurement for downhole applications. A source stream of photons is produced, via a generator of an X-ray system of a logging tool. A direct channel allows for the passage of a stream of photons, where a high energy filter filters a low energy part of the stream of photons. The resultant stream is measured by a reference detector to identify a high energy peak in a spectrum measurement derived based upon the resultant photon stream. From there, a normalized difference between a plurality of windows of the high energy peak is determined and subsequent output of the generator is based upon the normalized difference.

Abstract: A method and apparatus for sorting objects is described, and which provides high-speed image data acquisition to fuse multiple data streams in real-time, while avoiding destructive interference when individual sensors or detectors are utilized in providing data regarding internal and external features and characteristics and qualities of products being inspected.

Abstract: According to one embodiment, a recording medium records a shape calculation program that causes a computer to calculate a shape of a periodic structure. The shape calculation program causes the computer to extract a second scattering profile from a first scattering profile obtained when the electromagnetic waves are incident and to extract a fourth scattering profile from a third scattering profile calculated using a second periodic structure that is virtually set. The shape calculation program causes the computer to perform fitting between the second scattering profile and the fourth scattering profile and to calculate the shape of the first periodic structure on the basis of the result of the fitting.

Abstract: Quantitative X-ray analysis is carried out by making X-ray fluorescence measurements to determine the elemental composition of a sample and a correction measurement by measuring the transmitted intensity of X-rays at an energy E transmitted directly through the sample without deviation. An X-ray diffraction measurement is made in transmission by directing X-rays from an X-ray source at the energy E onto a sample at an incident angle ?1 to the surface of the sample and measuring a measured intensity Id(?fl) of the diffracted X-rays at the energy E with an X-ray detector at an exit angle ?2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Abstract: A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.

Abstract: Provided is an apparatus and method for measuring a thickness of thin film using x-ray where a thickness of a thin film of nanometer_(nm) level can be accurately measured without destructing an target sample, through determination of thickness of thin film of the target sample, by determining a calibration curve by comparing a difference of intensities of signals scattered by a special component included in a base layer of the reference sample.

Abstract: Systems and methods for imaging an object using backscattered radiation are described. The imaging system comprises both a radiation source for irradiating an object that is rotationally movable about the object, and a detector for detecting backscattered radiation from the object that can be disposed on substantially the same side of the object as the source and which can be rotationally movable about the object. The detector can be separated into multiple detector segments with each segment having a single line of sight projection through the object and so detects radiation along that line of sight. Thus, each detector segment can isolate the desired component of the backscattered radiation. By moving independently of each other about the object, the source and detector can collect multiple images of the object at different angles of rotation and generate a three dimensional reconstruction of the object. Other embodiments are described.

Abstract: A detector has a 2-dimensional matrix of pixels that includes at least one group wherein there is coupled to each pixel in the group a respective electronic circuit being responsive to a discrete photon striking the pixel for generating and storing a corresponding analog pixel level signal fed to a processing circuit via a common analog databus common. A common signaling line informs the respective electronic circuit that the databus is available, and a respective logic circuit coupled to all of the electronic circuits in the group and responsive to the signaling line being available and to the signal level of any pixel in the group being commensurate with the pixel having been hit by a photon, passes the analog pixel level on to the databus and flags the signaling line as busy so that the other pixels in the group are notified that the databus is busy.

Abstract: Dual-energy backscatter x-ray shoe scanning including: pre-processing input image information received from a shoe scanning device and image calibration data received from a database to output an atomic number image; detecting at least one suspect region based off the atomic number image; identifying the at least one detected suspect region as an object class using a changeable list of attributes; and classifying the object class according to a changeable list of categories.

Abstract: A Compton radiation detection device for determining of Compton radiation of iron, includes a sensor and a filter arrangement. The filter arrangement is adapted such that the radiation emitted by a test object due to Compton scattering passes a nickel layer and an iron layer before being detected by the sensor. A dispersive ionization chamber includes an ionization chamber having a plurality off ionization volumes and a window. Each ionization volume includes an electrode. Radiation can enter through the window. The ionization volumes are arranged in a beam propagation direction behind each other. Radiation having lower energy is statistically absorbed in ionization volumes located more proximal to the window. Radiation having higher energy is statistically absorbed in the ionization volumes located more distal from the window.

Abstract: The miniaturized pipe inspection system for measuring corrosion and scale in small pipes utilizes scattered radiation, which is measured by high efficiency solid scintillation gamma detector/spectrometer inserted inside the tube and separated from its bulky photomultiplier tube (PMT) and associated electronics by light pipe or fiber optic cable whose diameter can be very small. The light signal produced in the scintillation material is transmitted through the light pipe to outside the pipe to be inspected, where a PMT and electronic components including gamma ray energy analyzers are located. Gamma spectroscopy combined with gamma counting allows for multiple gamma ray primary and multiple backscattered radiation, thereby yielding high accuracy and high reliability of obtained corrosion, erosion and deposits data.

Abstract: A method for measuring a density profile of a fluid in a process vessel is disclosed. The method includes emitting gamma rays into the fluid and acquiring a backscattered gamma ray counts distribution using at least one position sensitive gamma ray detector disposed proximate the vessel. The method further includes determining the density profile of the fluid contained in the process vessel based on the backscattered gamma ray counts distribution.

Abstract: A method and system are provided for non-destructively evaluating a workpiece hidden by an overlying structure. In the context of a method, a workpiece is interrogated with radiation, such as x-ray radiation, that also propagates through the overlying structure. The method further includes collecting data representative of radiation backscattered from the workpiece. Based upon a thickness and material of the overlying structure, the method compares the data that has been collected from the workpiece with reference data representative of radiation backscattered from a standard that includes different respective material loss indicators hidden by an overlying structure of the same thickness and material. Each material loss indicator is a physical representation of a different amount of material loss. As a result of the comparison, the method estimates the material loss of the workpiece.

Abstract: A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.

Abstract: The energy of an X-ray beam and critical depth are selected to detect structural discontinuities in a material having an atomic number Z of 57 or greater. The critical depth is selected by adjusting the geometry of a collimator that blocks backscattered radiation so that backscattered X-ray originating from a depth less than the critical depth is not detected. Structures of Lanthanides and Actinides, including nuclear fuel rod materials, can be inspected for structural discontinuities such as gaps, cracks, and chipping employing the backscattered X-ray.

Abstract: The present invention is a system and method for screening subjects at security locations while preserving the privacy of subjects and retaining the efficiency and thus, throughput, of the screening process. More specifically, the present invention is an improved X-ray detection system and method that allows for maximum threat detection performance with improved verbal and visual communication between the screening and imaging system operator and an image analyst, either proximally or remotely located, thus allowing for an accurate, directed physical search and minimal “pat-down” of subjects under inspection.

Abstract: Provided is an apparatus and method for measuring for measuring a thickness of thin film using x-ray where a thickness of a thin film of nanometer(nm)-level can be accurately measured without destructing an target sample, through determination of thickness of thin film of the target sample, by determining a calibration curve by comparing a difference of intensities of signals scattered by a special component included in a base layer of the reference sample having a base layer and a base layer formed with the thin film layer with a thickness of the thin film layer, and determining the thickness of thin film layer of the target sample by comparing a difference of intensities of signals scattered by the special component included in the base layer of the target sample having the base layer formed with the thin film layer with the reference sample having the base layer with the calibration curve.

Abstract: Several related inventions for estimating scattered radiation in radiographic projections are disclosed. Several of the inventions use scatter kernels of various forms, including symmetric and asymmetric forms. The inventions may be used alone or in various combinations with one another. The resulting estimates of scattered radiation may be used to correct the projections, which can improve the results of tomographic reconstructions. Still other inventions of the present application generate estimates of scattered radiation from shaded or partially shaded regions of a radiographic projection, which may be used to correct the projections or used to adjust the estimates of scattered radiation generated according to inventions of the present application that employ kernels.

Abstract: Systems, methods, and devices involving segmented radiation detectors are provided. For example, a segmented radiation detector may include a segmented scintillator and an optical-to-electrical converter. The segmented scintillator may have several segments that convert radiation to light, at least one of which may detect radiation arriving from an azimuthal angle around an axis of the segmented scintillator. The optical-to-electrical converter may be coupled to the segmented scintillator. The optical-to-electrical converter may receive the light from the segments of the segmented scintillator and output respective electrical signals corresponding to the amount of radiation detected by each segment.

Abstract: Apparatus for inspection of a sample includes an X-ray source, which is configured to irradiate a location on the sample with a beam of X-rays. An X-ray detector is configured to receive the X-rays that are scattered from the sample and to output a first signal indicative of the received X-rays. A VUV source is configured to irradiate the location on the sample with a beam of VUV radiation. A VUV detector is configured to receive the VUV radiation that is reflected from the sample and to output a second signal indicative of the received VUV radiation. A processor is configured to process the first and second signals in order to measure a property of the sample.

Abstract: A radiation detecting cassette houses therein a detector for detecting a load applied to the radiation detecting cassette when a patient has moved. It is determined whether or not the patient has moved in an image capturing process based on the load detected by the detector. If it is judged that the patient has moved, then a warning is displayed, and a radiation image of the subject is inhibited from being captured.

Abstract: A method and system for determining a property of a sample of fluid in a borehole. A fluid sample is collected in a downhole tool. While collecting, X-rays are transmitted proximate the fluid from an X-ray source in the tool and an X-ray flux that is a function of a property of the fluid is detected. The detected X-ray flux data is processed to determine the property of the fluid.

Abstract: A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to detect backscatter x-rays from the target. The detector may include a collimation slot that limits the field of view of the detector. The target may be a railway component and the system may inspect the internal structure of the component as it is moved along the railway by a vehicle. The system may detect a change in the density of a target based on a comparison of the detected backscatter x-rays. The use of a plurality of segmented backscatter x-ray detectors having a collimation slot may pixelate the internal image in the direction of the collimation slot.

Abstract: A method for measuring a density profile of a fluid in a process vessel is disclosed. The method includes emitting gamma rays into the fluid and acquiring a backscattered gamma ray counts distribution using at least one position sensitive gamma ray detector disposed proximate the vessel. The method further includes determining the density profile of the fluid contained in the process vessel based on the backscattered gamma ray counts distribution.

Abstract: A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.

Abstract: Several related inventions for estimating scattered radiation in radiographic projections are disclosed. Several of the inventions use scatter kernels of various forms, including symmetric and asymmetric forms. The inventions may be used alone or in various combinations with one another. The resulting estimates of scattered radiation may be used to correct the projections, which can improve the results of tomographic reconstructions. Still other inventions of the present application generate estimates of scattered radiation from shaded or partially shaded regions of a radiographic projection, which may be used to correct the projections or used to adjust the estimates of scattered radiation generated according to inventions of the present application that employ kernels.

Abstract: A method for determining the density of a fluid that includes disposing a gamma-ray source proximate to a vessel containing the fluid is provided. The optimal position of a gamma-ray detector with respect to the gamma-ray source is determined. A gamma-ray detector is position at the optimal position, and the density of the fluid is measured.

Abstract: According to one embodiment of a substrate measuring method, a shape of a unit structure is measured by making an electromagnetic wave incident on a periodical structure and detecting a scattered electromagnetic wave. Measurement conditions are determined through calculation of a scattering profile representing the distribution of scattering intensities of the electromagnetic wave and optimization corresponding to a comparison result obtained by comparing the scattering profile every time a value of a parameter of attention is changed.

Abstract: The present invention is a system and method for screening subjects at security locations while preserving the privacy of subjects and retaining the efficiency and thus, throughput, of the screening process. More specifically, the present invention is an improved X-ray detection system and method that allows for maximum threat detection performance with improved verbal and visual communication between the screening and imaging system operator and an image analyst, either proximally or remotely located, thus allowing for an accurate, directed physical search and minimal “pat-down” of subjects under inspection.

Abstract: A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance variations at those wavelengths for subtle variations in the properties of the standard sample. A second sample, a reference sample may have a relatively featureless reflectance spectrum over the same spectral region and is used in combination with the calibration sample to achieve the calibration. In one embodiment the spectral region may include the VUV spectral region.

Abstract: A method for determining the density of a fluid that includes disposing a gamma-ray source proximate to a vessel containing the fluid is provided. The optimal position of a gamma-ray detector with respect to the gamma-ray source is determined. A gamma-ray detector is position at the optimal position, and the density of the fluid is measured.

Abstract: A method of estimating the strength of a wooden support wherein gamma rays (4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays (4), as well as apparatus suitable for conducting both methods.

Abstract: A window arrangement on a pressure pipe, with a casing in the train or at the end of the pressure pipe, said casing featuring flanges on diametrically opposing sides having radially directed passages, whose axes are standing perpendicular to the longitudinal axis of the pressure pipe and are located in a measurement plane for an x-ray measurement device, an x-ray source being associated to the one passage on the outer side and a receiver sensitive to X-rays to the other passage, and with window plates that are transmissive for X-rays which are sealingly arranged in the associated passage and are fixed in the passage with the aid of a fastening member and which consist of a material which is resistant against high temperatures and process-due etchings by chemically aggressive substances.

Abstract: The different advantageous embodiments provide a system for identifying a likelihood of detecting objects with a backscatter x-ray system comprising a structure having a number of objects, a plurality of databases, and a processor unit configured to execute a detection analysis process. The processor unit executes the detection analysis process to identify the number of objects, identify a number of densities associated with each of the number of objects, determine a likelihood of detecting each of the number of objects with the backscatter x-ray system, and generate a three-dimensional diagram of the likelihood of detecting each of the number of objects.

Abstract: According to one embodiment of a substrate measuring method, a shape of a unit structure is measured by making an electromagnetic wave incident on a periodical structure and detecting a scattered electromagnetic wave. Measurement conditions are determined through calculation of a scattering profile representing the distribution of scattering intensities of the electromagnetic wave and optimization corresponding to a comparison result obtained by comparing the scattering profile every time a value of a parameter of attention is changed.

Abstract: A method of estimating the strength of a wooden support wherein gamma rays (4) are transmitted and detected parallel to a neutral axis (5) through a cross section of the support. It also includes a method of locating regions of unsound wood in a wooden support using detection of transmitted gamma rays (4), as well as apparatus suitable for conducting both methods.

Abstract: In a specimen collecting method according to the present invention, a specimen is collected from a surface (114a) of a blade. An ultrasonic cutter having a cylindrical cutting blade is fed from the surface (114a) of the blade to a surface (110a) of a base material (100), and thus, a cylindrical incision is formed. After performing cutting to expand the incision outwardly, a rotating cutter (220) having a disc-shaped cutting blade (222) performs cutting inwardly from the cylindrical incision. Thus, a part (20a) situated inside the incision is cut away. The part (20a) becomes the specimen.

Abstract: Provided is a thin film stack inspection method capable of accurately measuring and inspecting layer thicknesses of thin film stacks. An X-ray having a long coherence length is used as an incident X-ray and the X-ray specular-reflected from a sample placed on a goniometer is partially bent by a prism. The X-ray bent by the prism and the X-ray going straight are made to interfere with each other to obtain interference patterns. Though being thin film stacks, the sample has a portion having no thin film and thus an exposed substrate. The X-ray not bent by the prism includes an X-ray specular-reflected from the exposed substrate. By changing the incident angle from 0.01° to 1°, the interference patterns of the specular-reflected X-ray are measured. Thus, layer thicknesses are measured using a change in a phase of the X-ray reflected from a film stack interface.

Abstract: Systems and methods for detecting an image of an object using an X-ray beam having a polychromatic energy distribution are disclosed. According to one aspect, a method can include detecting an image of an object. The method can include generating a first X-ray beam having a polychromatic energy distribution. Further, the method can include positioning a single monochromator crystal in a predetermined position to directly intercept the first X-ray beam such that a second X-ray beam having a predetermined energy level is produced. Further, an object can be positioned in the path of the second X-ray beam for transmission of the second X-ray beam through the object and emission from the object as a transmitted X-ray beam. The transmitted X-ray beam can be directed at an angle of incidence upon a crystal analyzer. Further, an image of the object can be detected from a beam diffracted from the analyzer crystal.

Abstract: An X-ray reflectivity measuring method is provided to measure and inspect, with higher accuracy, film thickness of a thin film stack as a sample where a thick film is provided on the thin film stack. This X-ray reflectivity measuring method can measure X-ray reflectivity of the thin film stack embedded within a thick film by applying the X-ray focused to ? or less the thickness of a thick film on the thin film stack to an end surface of the thick film, transmitting the X-ray through the thick film, thereafter applying the X-ray to the thin film stack, transmitting again the reflected X-ray to the thick film, and then extracting the reflection X-ray from the end surface in the opposite side of the incident surface and also can inspect film thickness of the thin film stack embedded in the thick film with the Fourier transformation method and the minimum square analysis method with the theoretical curve.

Abstract: An apparatus and method for determining the density and other properties of a formation surrounding a borehole using a high voltage x-ray generator. One embodiment comprises a stable compact x-ray generator capable of providing radiation with energy of 250 keV and higher while operating at temperatures equal to or greater than 125° C. In another embodiment, radiation is passed from an x-ray generator into the formation; reflected radiation is detected by a short spaced radiation detector and a long spaced radiation detector. The output of these detectors is then used to determine the density of the formation. In one embodiment, a reference radiation detector monitors a filtered radiation signal. The output of this detector is used to control at least one of the acceleration voltage and beam current of the x-ray generator.

Abstract: The computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective location. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected location.

Abstract: An X-ray downhole imaging tool is provided and includes an X-ray tube capable of operating at least at 50 KeV and emitting at least one hundred micro-amperes of continuous electron current and a radiation detector axially displaced from the X-ray tube, at least partially shielded therefrom and radially directed. In certain embodiments, the radiation detector includes a microchannel plate and a resistive anode. In certain embodiments, a second detector which is axially directed is also provided.

Abstract: Nuclear gauges, their components and method for assembly and adjustment of the same are provided. The nuclear gauges are used in measuring the density and/or moisture of construction-related materials. The nuclear gauge can include a gauge housing having a vertical cavity therethrough and at least one radiation detector located within the housing. The nuclear gauge can include a vertically moveable source rod and a radiation source operatively positioned within a distal end of the source rod.

Abstract: An apparatus and method for determining the density and other properties of a formation surrounding a borehole using a high voltage x-ray generator. One embodiment comprises a stable compact x-ray generator capable of providing radiation with energy of 250 keV and higher while operating at temperatures equal to or greater than 125° C. In another embodiment, radiation is passed from an x-ray generator into the formation; reflected radiation is detected by a short spaced radiation detector and a long spaced radiation detector. The output of these detectors is then used to determine the density of the formation. In one embodiment, a reference radiation detector monitors a filtered radiation signal. The output of this detector is used to control at least one of the acceleration voltage and beam current of the x-ray generator.

Abstract: An apparatus and method for determining the density and other properties of a formation surrounding a borehole using a high voltage x-ray generator. One embodiment comprises a stable compact x-ray generator capable of providing radiation with energy of 250 keV and higher while operating at temperatures equal to or greater than 125° C. In another embodiment, radiation is passed from an x-ray generator into the formation; reflected radiation is detected by a short spaced radiation detector and a long spaced radiation detector. The output of these detectors is then used to determine the density of the formation. In one embodiment, a reference radiation detector monitors a filtered radiation signal. The output of this detector is used to control at least one of the acceleration voltage and beam current of the x-ray generator.