Scatter Analysis Patents (Class 378/86)
  • Patent number: 11039807
    Abstract: An image processing system (IPS) and a related method. The system comprises an input interface (IN) for receiving two or more input images that include respectively an attenuation signal of an imaged object and a dark-field signal of the object. A combiner (COM) is configured to combine the two or more input images in a linear combination operation to form a combined image. An output (OUT) port configured to output the combined image.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: June 22, 2021
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventor: Hanns-Ingo Maack
  • Patent number: 11029265
    Abstract: An X-ray scattering apparatus has a sample holder for aligning and orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction towards the sample holder, a proximal X-ray detector arranged downstream of the sample holder as to let the direct X-ray beam pass and detect X rays scattered from the sample, and a distal X-ray detector arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam in which the proximal X-ray detector is also movable essentially along the propagation direction of the direct X-ray beam.
    Type: Grant
    Filed: May 17, 2017
    Date of Patent: June 8, 2021
    Assignee: XENOCS SAS
    Inventor: Peter Hoghoj
  • Patent number: 10948476
    Abstract: A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.
    Type: Grant
    Filed: May 9, 2019
    Date of Patent: March 16, 2021
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventor: Robert Ernest Troxler
  • Patent number: 10809415
    Abstract: The present disclosure relates to an imaging device for use in vehicle security check and a method therefor, and belongs to the field of security check. The imaging device for use in vehicle security check includes: a radiation source device including a first ray unit configured to emit a first ray beam by a first predetermined spread angle to allow the first ray beam to penetrate a first part of a vehicle to be inspected passing through an inspection lane at a preset speed; and a detector device including a first detector unit arranged corresponding to the first ray unit, and configured to receive the first ray beam. The radiation source device is at least partially arranged on the road surface of the inspection lane, and the first detector unit is arranged at a first side of the inspection lane.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: October 20, 2020
    Assignee: Beijing Haulixing Technology Development Co., Ltd.
    Inventors: Haibo Qu, Jie Zhao
  • Patent number: 10810518
    Abstract: An interactive rapid response Internet accessed air travel management system. The system includes a web-based planning and reservation interface system and an interactive access device. The system responds to details of a member's desired travel, to thereafter act in real time to contact the domains of associated travel service providers to arrange for every aspect of the member's trip, from airline and hotel reservations, ticket issuance, and ground transportation, to restaurant and theater reservations, and any other travel related needs of the member. The system stores identification information to verify access device possession to prohibit unauthorized use of the system and to provide security pre-clearance to system members.
    Type: Grant
    Filed: January 8, 2019
    Date of Patent: October 20, 2020
    Assignee: AIRPORTAMERICA, LLC
    Inventors: David Block, Jaro Volny, Sharyn A. Brotz, Scott Allen Mueller
  • Patent number: 10636609
    Abstract: Described herein is a medical accelerator target including a target constructed of a material having an atomic number that is greater than or equal to 40 or having a thickness of less than 0.2 radiation lengths.
    Type: Grant
    Filed: October 7, 2016
    Date of Patent: April 28, 2020
    Assignee: ACCURAY INCORPORATED
    Inventors: Kirk Joseph Bertsche, Giorgio Asmerom, Miguel Gutierrez
  • Patent number: 10499876
    Abstract: A method includes forming a test key. The formation of the test key includes forming a first plurality of semiconductor strips, and cutting the first plurality of semiconductor strips into an array of a second plurality semiconductor strips, with each row of the array being formed from one strip in the first plurality of semiconductor strips, forming isolation regions in recesses between the second plurality of semiconductor strips, and recessing the isolation regions. The top portions of the second plurality of semiconductor strips protrude higher than the isolation regions form semiconductor fins, which form a fin array. An X-ray beam is projected on the test key. A diffraction pattern is obtained from scattered X-ray beam scattered from the test key.
    Type: Grant
    Filed: October 5, 2017
    Date of Patent: December 10, 2019
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Shyh-Shin Ferng, Chung-Li Huang, Yi-Hung Lin, Chungwei Wang
  • Patent number: 10481112
    Abstract: Methods and systems for measuring periodic structures using multi-angle X-ray reflectance scatterometry (XRS) are disclosed. For example, a method of measuring a sample by X-ray reflectance scatterometry involves impinging an incident X-ray beam on a sample having a periodic structure to generate a scattered X-ray beam, the incident X-ray beam simultaneously providing a plurality of incident angles and a plurality of azimuthal angles. The method also involves collecting at least a portion of the scattered X-ray beam.
    Type: Grant
    Filed: November 5, 2018
    Date of Patent: November 19, 2019
    Assignee: NOVA MEASURING INSTRUMENTS INC.
    Inventors: Heath A. Pois, David A. Reed, Bruno W. Schueler, Rodney Smedt, Jeffrey T. Fanton
  • Patent number: 10462887
    Abstract: Provided is a radiation irradiation device that can improve the degree of freedom of an arm part and can reduce the number of noise suppression components, such as a ferrite core. A radiation irradiation device includes a radiation generating part having a radiation source that generates radiation; an arm part having the radiation generating part attached to one end thereof; and a main body part having the other end of the arm part connected thereto. The main body part has a power source part including a three-phase inverter circuit. The power source part supplies a three-phase alternating current voltage to the radiation generating part via the arm part.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: October 29, 2019
    Assignee: FUJIFILM Corporation
    Inventor: Hideaki Kuranisi
  • Patent number: 10408966
    Abstract: The present disclosure discloses an inspection device, an inspection method and an inspection system. The device comprises a distributed ray source comprising multiple source points; a light source collimator configured to converge the rays generated by the distributed ray source to form an inverted fan-shaped ray beam; a scatter collimator configured to only allow rays scattered at one or more particular scattering angles which are generated by the rays from the light source collimator interacting with inspected objects to pass; at least one detector each comprising multiple detection units which have an energy resolution capability and are substantially arranged in a cylindrical surface to receive the scattered rays passing through the scatter collimator; and a processing apparatus configured to calculate energy spectrum information of the scattered rays from the inspected objects based on a signal output by the detectors.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: September 10, 2019
    Assignees: TSINGHUA UNIVERSITY, NUCTECH COMPANY LIMITED
    Inventors: Zhiqiang Chen, Li Zhang, Tianyi Yangdai, Qingping Huang
  • Patent number: 10365148
    Abstract: The invention relates to a method for ascertaining a net weight of a product in a product range, plurality of contiguous product ranges form a product chain and a total weight of the product chain is ascertained. The product chain is X-rayed to ascertain values that correspond to the radiation that penetrates a defined range of the product chain. The ascertained values are used to ascertain a total value for the entire product chain. A product range with a single product is selected by means of evaluation of the ascertained values. A value of the product range is formed from the ascertained values. A gross weight of the product range is ascertained therefrom. The net weight used for the single product is approximately the weight or the net weight is ascertained from the difference between the weight and a prescribed or ascertained weight of the product range without a product.
    Type: Grant
    Filed: April 30, 2015
    Date of Patent: July 30, 2019
    Assignee: Wipotec-Wiege- und Positioniersysteme GmbH
    Inventors: Peter Monz, Michael Siegrist, Bernd Zinke
  • Patent number: 10330612
    Abstract: An apparatus for integrating metrology and method for using the same are disclosed. The apparatus includes a multi-chamber system having a transfer chamber, a deposition chamber, an etch chamber and a metrology chamber, and a robot configured to transfer a substrate between the deposition chamber or etch chamber and the metrology chamber.
    Type: Grant
    Filed: October 22, 2014
    Date of Patent: June 25, 2019
    Assignee: Applied Materials, Inc.
    Inventors: Lin Zhang, Shuran Sheng, Andrew V. Le
  • Patent number: 10168445
    Abstract: The present specification describes a compact, hand-held probe or device that uses the principle of X-ray backscatter to provide immediate feedback to an operator about the presence of scattering and absorbing materials, items or objects behind concealing barriers irradiated by ionizing radiation, such as X-rays. Feedback is provided in the form of a changing audible tone whereby the pitch or frequency of the tone varies depending on the type of scattering material, item or object. Additionally or alternatively, the operator obtains a visual scan image on a screen by scanning the beam around a suspect area or anomaly.
    Type: Grant
    Filed: March 18, 2016
    Date of Patent: January 1, 2019
    Assignee: Rapiscan Systems, Inc.
    Inventor: Edward James Morton
  • Patent number: 10117628
    Abstract: According to one embodiment, the X-ray tube generates X-rays. The X-ray detector detects the X-rays transmitted through a subject. The data acquisition circuitry acquires count data concerning a count number of the detected X-rays for energy bands. The memory circuitry stores data of a response function that associates incident X-rays on the X-ray detector with a response characteristic of a system including the X-ray detector and the data acquisition circuitry. The processing circuitry calculates an X-ray absorption amount of each of a plurality of base substances based on the count data concerning the energy bands acquired by the data acquisition circuitry, an energy spectrum of the incident X-rays, and the response function.
    Type: Grant
    Filed: September 30, 2015
    Date of Patent: November 6, 2018
    Assignee: Toshiba Medical Systems Corporation
    Inventor: Emi Tamura
  • Patent number: 10121561
    Abstract: The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.
    Type: Grant
    Filed: October 28, 2016
    Date of Patent: November 6, 2018
    Assignee: Commissariat A L'Energie Atomique et aux Energies Alternatives
    Inventors: Fanny Marticke, Guillaume Montemont, Caroline Paulus
  • Patent number: 10107933
    Abstract: An individual access control portal includes two panels or columns that define a through corridor, which panels or columns are equipped with sensors designed to detect substances or materials liable to be carried by individuals travelling through the portal, wherein the portal is equipped with a plurality of detection barriers distributed along the direction of passage through the portal and logic means attached to the plurality of barriers, firstly to determine from the series of activations of the barriers, the place and movement of an individual and secondly to establish the correlations existing between the movement of an individual and the signals output by the substance or material detection sensors.
    Type: Grant
    Filed: August 13, 2015
    Date of Patent: October 23, 2018
    Assignee: Costruzioni Elettroniche Industriali Automatismi S.P.A. C.E.I.A. S.P.A.
    Inventor: Alessandro Manneschi
  • Patent number: 10067076
    Abstract: A scanning method, which is a method of identifying a change in the density of an object, includes arranging a source of ionizing radiation and an array of radiation detectors Dn, where n is an integer from 1 to N, capable of detecting the radiation in such a way that radiation counts are counted by the detectors as the source and detectors are rotated around the object. Detectors are arranged in conjugate pairs so that missing data due to a malfunctioning detector may be filled in from its conjugate.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: September 4, 2018
    Assignee: Johnson Matthey Public Limited Company
    Inventor: Emanuele Ronchi
  • Patent number: 10006873
    Abstract: A system and method for foreign object detection in meat processing is provided. The system and method combine microfocus X-ray tubes with dual energy X-rays to detect foreign objects in meat products. A dual energy image processing algorithm analyzes the dual energy X-rays passed through the meat product to identify the foreign object present therein. An alarm or other notification is then generated in response to the detection of a foreign object.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: June 26, 2018
    Assignee: BATTELLE MEMORIAL INSTITUTE
    Inventor: Richard J. Davis, III
  • Patent number: 9747704
    Abstract: An X-ray computed tomography apparatus according to embodiments includes image processing circuitry and decomposition circuitry. The image processing circuitry is configured to perform an image processing on each of a plurality of pieces of monochromatic X-ray image data of different energies, the plurality of pieces of monochromatic X-ray image data being generated from projection data. The decomposition circuitry is configured to decompose, for each of a plurality of basis materials specified in advance, the plurality of pieces of monochromatic X-ray image data after the image processing, to generate basis material image data of each of the plurality of basis materials.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: August 29, 2017
    Assignee: Toshiba Medical Systems Corporation
    Inventors: Hiroki Taguchi, Satoru Nakanishi
  • Patent number: 9733109
    Abstract: A position-measuring device includes: a first subassembly having a measuring standard on which at least one coded track is provided, and a scanning unit, which is able to generate position signals that may be used to generate an absolute digital position value by scanning the at least one coded track in a measuring direction; a second subassembly having at least one peripheral unit adapted to execute a supplementary or an auxiliary functionality of the position-measuring device; and a plurality of electrical lines, which connect the first subassembly and the second subassembly to each other for the transmission of electrical signals. The position-measuring device is able to be operated in an initialization mode and in a standard operating mode. All components of the first subassembly required for the operation in the standard operating mode are components that are suitable for use in a radiation region of a machine.
    Type: Grant
    Filed: September 23, 2014
    Date of Patent: August 15, 2017
    Assignee: DR. JOHANNES HEIDENHAIN GMBH
    Inventors: Ernst Thielicke, Daniel Auer, Erwin Bratzdrum
  • Patent number: 9689813
    Abstract: A method and apparatus are presented. X-rays are directed at a workpiece. The workpiece includes a fastener installed in an opening. Backscatter is received from the workpiece. It is determined if the fastener installed in the opening has an out of tolerance gap using the backscatter. An output is generated if the fastener installed in the opening has the out of tolerance gap.
    Type: Grant
    Filed: February 27, 2015
    Date of Patent: June 27, 2017
    Assignee: THE BOEING COMPANY
    Inventors: Taisia Tsukruk Lou, William Talion Edwards, Gregory Paul Saguto
  • Patent number: 9610055
    Abstract: The X-ray CT apparatus includes an X-ray tube, a high-voltage power supply, an X-ray detector and a processing circuitry. The processing circuitry reconstructs, as a first image, any of a monochromatic X-ray image and a polychromatic X-ray image on a basis of pre-reconstruction data acquired by scanning an object, the polychromatic X-ray image being taken in a first X-ray energy band. The processing circuitry reconstructs, as a second image, a polychromatic X-ray image taken in a second X-ray energy band wider than the first X-ray energy band on a basis of a pre-reconstruction data acquired by scanning the object. The processing circuitry identifies an area of a correction target in the first image as a correction area. The processing circuitry corrects the correction area in the second image on a basis of the first image.
    Type: Grant
    Filed: July 1, 2015
    Date of Patent: April 4, 2017
    Assignee: Toshiba Medical Systems Corporation
    Inventors: Hiroki Taguchi, John Gulik
  • Patent number: 9453936
    Abstract: The inventive body scanner is used to screen persons entering a security controlled area for the presence of security threats hidden under the clothing, such as guns, knifes, explosives and contraband. The Invention is an improvement on prior art body scanners that operate primarily by acquiring backscatter x-ray images, but only acquire transmission images over a limited part of the person's body. These prior art systems provide x-ray sources on the anterior and posterior sides of the person being screened, and x-ray sensitive detectors on the sides of these x-ray sources. While sufficient for backscatter imaging, the gaps between these detectors results in blind areas in the transmission images, resulting in lower ability to detect security threats hidden under the clothing. The present Invention overcomes these limitations of the prior art by providing x-ray sensitive detector on the outside of the x-ray sources.
    Type: Grant
    Filed: June 6, 2011
    Date of Patent: September 27, 2016
    Inventor: Steven Winn Smith
  • Patent number: 9360308
    Abstract: A method for analyzing an object includes measuring a first reflectivity of light from a surface and measuring a second reflectivity of light from the object, after the object is formed on the surface. A variation between the first and second reflectivities is calculated, and the variation is transformed by a predetermined transform. A thickness of the object is determined based on the transformed variation.
    Type: Grant
    Filed: April 9, 2014
    Date of Patent: June 7, 2016
    Assignee: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Byung Hyun Hwang, Kwang-Hoon Kim, Woongkyu Son, Chulgi Song, Choonshik Leem
  • Patent number: 9329143
    Abstract: The invention relates to a method and an apparatus for studying the X-ray properties of samples (3c), wherein X-ray radiation scattered by a sample (3c) is recorded by a detector (5) positioned at a distance from the sample (3c) and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source (1) and the detector (5) or between the starting point (2b) of the X-ray beam (10) directed at the sample (3c) and the detector (5), for a predetermined number of successive measurements the distance (S1, S2) between the sample (3c) and the detector (5) is changed and is set at a predetermined different value.
    Type: Grant
    Filed: March 12, 2012
    Date of Patent: May 3, 2016
    Assignee: Anton Paar GmbH
    Inventors: Heimo Schnablegger, Edith Pieber
  • Patent number: 9301727
    Abstract: A radiographic imaging system includes an imaging unit that detects radiation transmitted through a subject, an operation unit that controls the imaging unit, a signal sending and receiving device connects the imaging unit and the operation unit to each other by wired or wireless communication. A signal reception state display unit is disposed in the imaging unit or the signal sending and receiving device so as to display a signal reception state indicative of communication between the imaging unit and the signal sending and receiving device.
    Type: Grant
    Filed: December 1, 2010
    Date of Patent: April 5, 2016
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takaaki Gonda
  • Patent number: 9291581
    Abstract: The present invention provides a method for evaluating energy loss in a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy; a method for evaluating chipping resistance of a polymeric material, wherein the method provides evaluation in a short period of time and at low cost with excellent measurement accuracy; and a method for evaluating abrasion resistance of a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy. The present invention relates to methods for evaluating energy loss, chipping resistance, and abrasion resistance of a polymeric material, and the methods include irradiating the polymeric material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement.
    Type: Grant
    Filed: November 4, 2013
    Date of Patent: March 22, 2016
    Assignee: SUMITOMO RUBBER INDUSTRIES, LTD.
    Inventors: Ryo Mashita, Hiroyuki Kishimoto, Tomomi Masui
  • Patent number: 9277897
    Abstract: An X-ray examination station includes a first source of X-ray radiation for whole body scanning of a human body using a first fan beam of X-ray radiation; a first vertical linear radiation detector configured to detect the first fan beam; a second source of X-ray radiation installed at mid-height of a person being examined, for scanning a central portion of the human body using a second fan beam of X-ray radiation; a second vertical detector of X-ray radiation configured to detect the second fan beam; and a control unit configured to turn on each of the X-ray radiation sources. The first and the second radiation fan beams are emitted in parallel planes. The first X-ray radiation source is turned on for the whole body scanning. The second X-ray radiation source is turned on for scanning the central portion of the body.
    Type: Grant
    Filed: August 20, 2014
    Date of Patent: March 8, 2016
    Assignee: Adani Systems, Inc.
    Inventor: Vladimir N. Linev
  • Patent number: 9164048
    Abstract: The invention relates to a device for identifying a material of an object having a source of X-Ray photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume (?V) of the material and an energy of the X-Ray photons of the backscattered beam. The incident and backscattered beams forming a scattering angle (?). An adjusting device adjusts the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle. A processing device processes the two magnitudes in two positions and the energy in one position and calculates an attenuation coefficient (?material (E0, E1, ?)). An estimating device estimates the density (?) of the material.
    Type: Grant
    Filed: July 19, 2010
    Date of Patent: October 20, 2015
    Assignee: Commissariat a l'energie atomique et aux energies alternatives
    Inventors: Elisa Fabiani, Jean Rinkel, Joachim Tabary, Jean-Marc Dinten
  • Patent number: 9055886
    Abstract: Technologies pertaining to backscatter x-ray scanning systems are described herein. The backscatter x-ray scanning system includes an x-ray source, which directs collimated x-rays along a plurality of output vectors towards a target. A detector detects diffusely reflected x-rays subsequent to respective collimated x-rays impacting the target, and outputs signals indicative of parameters of the detected x-rays. An image processing system generates an x-ray image based upon parameters of the detected x-rays, wherein each pixel in the image corresponds to a respective output vector. A user selects a particular portion of the image, and a tool is positioned such that its directional axis is coincident with the output vector corresponding to at least one pixel in the portion of the image.
    Type: Grant
    Filed: December 23, 2011
    Date of Patent: June 16, 2015
    Assignee: Sandia Corporation
    Inventors: Justin Garretson, Clinton G. Hobart, Thomas S. Gladwell, Mark J. Monda
  • Patent number: 9036781
    Abstract: A method and apparatus for inspecting an object. A radiation generation system is configured to emit radiation. A detector system is configured to detect backscatter formed in response to the radiation encountering the object. A redirection system is positioned relative to the detector system and is configured to redirect the backscatter to the detector system.
    Type: Grant
    Filed: October 12, 2012
    Date of Patent: May 19, 2015
    Assignee: THE BOEING COMPANY
    Inventor: Morteza Safai
  • Patent number: 9031196
    Abstract: An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An attenuation of the beam caused by passing the beam through the object is determined, the attenuation is compared to a threshold attenuation. If the attenuation exceeds the threshold attenuation, a parameter of the imaging system is adjusted based on the determined attenuation.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: May 12, 2015
    Assignee: L-3 Communications Security and Detection Systems, Inc.
    Inventors: Ronald Steven McNabb, Jr., Nicholas Danvers Penrose Gillett
  • Patent number: 9031188
    Abstract: A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to detect backscatter x-rays from the target. The detector may include a collimation slot that limits the field of view of the detector. The target may be a railway component and the system may inspect the internal structure of the component as it is moved along the railway by a vehicle. The system may detect a change in the density of a target based on a comparison of the detected backscatter x-rays. The use of a plurality of segmented backscatter x-ray detectors having a collimation slot may pixelate the internal image in the direction of the collimation slot.
    Type: Grant
    Filed: February 7, 2013
    Date of Patent: May 12, 2015
    Assignee: Georgetown Rail Equipment Company
    Inventors: Jeb Belcher, Charles Wayne Aaron
  • Publication number: 20150117610
    Abstract: Disclosed are apparatus and methods for determining overlay error in a semiconductor target. For illumination x-rays having at least one angle of incidence (AOI), a correlation model is obtained, and the correlation model correlates overlay error of a target with a modulation intensity parameter for each of one or more diffraction orders (or a continuous diffraction intensity distribution) for x-rays scattered from the target in response to the illumination x-rays. A first target is illuminated with illumination x-rays having the at least one AOI and x-rays that are scattered from the first target in response to the illumination x-rays are collected. An overlay error of the first target is determined based on the modulation intensity parameter of the x-rays collected from the first target for each of the one or more diffraction orders (or the continuous diffraction intensity distribution) and the correlation model.
    Type: Application
    Filed: October 23, 2014
    Publication date: April 30, 2015
    Applicant: KLA-Tencor Corporation
    Inventors: Andrei Veldman, Michael S. Bakeman, Andrei V. Shchegrov, Walter D. Mieher
  • Patent number: 9001969
    Abstract: An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object H by performing imaging while moving the second absorption grating (32) in x direction relative to the first absorption grating (31). The following mathematical expression is satisfied where p1? denotes a period of a first pattern image at a position of the second absorption grating (32), and p2? denotes a substantial grating pitch of the second absorption grating (32), and DX denotes a dimension, in the x-direction, of an X-ray imaging area of each pixel of the FPD (30). Here, ā€œnā€ denotes a positive integer.
    Type: Grant
    Filed: February 2, 2011
    Date of Patent: April 7, 2015
    Assignee: Fujifilm Corporation
    Inventors: Dai Murakoshi, Takuji Tada, Toshitaka Agano, Kenji Takahashi
  • Patent number: 9001970
    Abstract: The present invention relates to a method and a device for identifying unknown substances in an object. According to the state of the art a collimated X-ray beam is directed onto the object and X-ray energy scattered from the object is detected and measured. The measurement values detected are compared to known measurement values corresponding to specific substances or classes of substances to identify unknown substances in the object.
    Type: Grant
    Filed: June 20, 2013
    Date of Patent: April 7, 2015
    Assignee: Entech Scientific B.V.
    Inventor: Johannes Bethke
  • Patent number: 8983034
    Abstract: A technique for use in security screening and detection contexts employs an X-ray explosive imager that acquires images from backscattered RF modulated X-ray signals on which a time series analysis is performed to detect image change across the time series of images that represent pixels changing at the rate of the difference frequency of the RF frequency and the a priori NQR signature frequencies.
    Type: Grant
    Filed: February 7, 2012
    Date of Patent: March 17, 2015
    Assignee: Lockheed Martin Corporation
    Inventor: James R. Wood
  • Patent number: 8976928
    Abstract: This invention has one object to provide radiographic apparatus with a compensating filter that allows simple and accurate estimation of direct radiation to acquire a radioscopic image or a sectional image of excellent contrast. This invention includes a direct-ray attenuation-rate acquiring section for acquiring a direct-ray attenuation rate from a dose of direct radiation entering into a subject and a dose of direct radiation emitted from the subject. In this invention, a direct-ray attenuation rate is acquired on an assumption that a primary indirect-ray attenuation rate is equal to the direct-ray attenuation rate, the primary indirect-ray attenuation rate being a rate of decreasing a primary indirect-ray generated with the compensating filter that transmits the subject. Such configuration may achieve provision of X-ray apparatus that allows more simple acquisition of a fluoroscopic X-ray image or a sectional image without performing complicated calculations conventionally.
    Type: Grant
    Filed: September 2, 2009
    Date of Patent: March 10, 2015
    Assignee: Shimadzu Corporation
    Inventor: Wataru Takahashi
  • Patent number: 8971492
    Abstract: Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.
    Type: Grant
    Filed: August 31, 2012
    Date of Patent: March 3, 2015
    Assignee: Rigaku Corporation
    Inventors: Akito Sasaki, Keiichi Morikawa, Akihiro Himeda, Hiroki Yoshida
  • Patent number: 8934607
    Abstract: In accordance with an embodiment, a measuring apparatus includes an electromagnetic wave applying unit, a detecting unit, a data processing unit, a film structure transforming unit, and a film structure measuring unit. The electromagnetic wave applying unit generates electromagnetic waves to apply it to a periodic structure of films on a substrate. The detecting unit detects the electromagnetic waves scattered or reflected by the substrate. The data processing unit calculates a surface shape of the periodic structure. The film structure transforming unit calculates a virtual film structure regarding the internal structure of the periodic structure. The film structure measuring unit calculates the thickness of each layer constituting the periodic structure by fitting a first reflectance profile by actual measurement regarding the periodic structure to a second reflectance profile obtained by a simulation using the virtual film structure to restructure the shape of the periodic structure.
    Type: Grant
    Filed: August 31, 2012
    Date of Patent: January 13, 2015
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Yasuhiko Ishibashi
  • Patent number: 8923481
    Abstract: Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver a scan head with at least three degrees of freedom, and some embodiments include arms that maneuver a scan head with at least seven degrees of freedom. Some embodiments include proximity detectors on a scan head or base, detect contact with an object being inspected, and to slow or stop the motion of the system accordingly. Some compact embodiments scan the interior of an object from within, and include a rotating, low-energy source of penetrating radiation, and at least one backscatter detector, which may be stationary, or may rotate with the source.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: December 30, 2014
    Assignee: American Science and Engineering, Inc.
    Inventors: Jeffrey R. Schubert, John P. Handy, Richard L. Schueller, Terry Lee McElroy, David C. Walazek, William J. Baukus
  • Publication number: 20140376694
    Abstract: In accordance with an embodiment, a substrate measurement apparatus circuit includes a light source, a detector, a data calculation unit, a mirror unit, a mirror drive unit, and a mirror drive calculation unit. The light source applies the electromagnetic waves to a measurement target substrate. The detector detects the electromagnetic waves diffracted or scattered by the application of the electromagnetic waves to the substrate. The data calculation unit processes a signal from the detector to acquire substrate information. The mirror unit includes a deflecting mirror which is adjusted to an optical condition where incident electromagnetic waves are totally reflected to control the track of the electromagnetic waves. The mirror drive unit drives the deflecting mirror in at least one of vertical, horizontal, and rotational directions. The mirror drive calculation unit calculates a drive amount to drive the deflecting mirror in at least one of the vertical, horizontal, and rotational directions.
    Type: Application
    Filed: September 9, 2013
    Publication date: December 25, 2014
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Hideaki ABE, Yasuhiko ISHIBASHI
  • Patent number: 8908830
    Abstract: There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity.
    Type: Grant
    Filed: April 12, 2010
    Date of Patent: December 9, 2014
    Assignee: Rigaku Corporation
    Inventors: Kazuhiko Omote, Yoshiyasu Ito
  • Patent number: 8908831
    Abstract: The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an object outside the vehicle. The system is configured to also simultaneously detect passive radiation. The systems preferably include at least one sensor for determining a distance from at least one of the detectors to points on the surface of the object being scanned, a processor for processing the obtained radiographic image by using the determined distance of the object to obtain an atomic number of each material contained in the object, and one or more sensors to obtain surveillance data from a predefined area surrounding the vehicle.
    Type: Grant
    Filed: June 14, 2012
    Date of Patent: December 9, 2014
    Assignee: Rapiscan Systems, Inc.
    Inventors: Joseph Bendahan, Edward James Morton
  • Publication number: 20140355741
    Abstract: The presently disclosed technique provides a method and apparatus for use in modulated X-ray harmonic detection and identification. More specifically, it specifies a X-ray backscatter imaging system using radio frequency modulation of the incident X-ray beam at two frequencies and detection patterns in the backscattered signal corresponding to harmonics of the modulation frequencies.
    Type: Application
    Filed: November 30, 2012
    Publication date: December 4, 2014
    Applicant: Lockheed Martin Corporation
    Inventor: James Richard Wood
  • Patent number: 8903045
    Abstract: A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: December 2, 2014
    Assignee: American Science and Engineering, Inc.
    Inventors: Jeffrey R. Schubert, William Randall Cason
  • Publication number: 20140348293
    Abstract: The invention provides a switchable photomultiplier switchable between a detecting state and a non-detecting state including a cathode upon which incident radiation is arranged to impinge. The photomultiplier also includes a series of dynodes arranged to amplify a current created at the cathode upon detection of photoradiation. The invention also provides a detection system arranged to detect radiation-emitting material in an object. The system includes a detector switchable between a detecting state in which the detector is arranged to detect radiation and a non-detecting state in which the detector is arranged to not detect radiation. The system further includes a controller arranged to control switching of the detector between the states such that the detector is switched to the non-detecting state whilst an external radiation source is irradiating the object.
    Type: Application
    Filed: November 18, 2013
    Publication date: November 27, 2014
    Applicant: Rapiscan Systems, Inc.
    Inventor: Edward James Morton
  • Publication number: 20140341354
    Abstract: The present invention provides a method of evaluating the neutron scattering length density, capable of accurately determining the neutron scattering length density. The present invention relates to a method of evaluating the neutron scattering length density of scatterers in a material, including determining the neutron scattering length density based on a scattering intensity curve obtained by neutron scattering measurement, with use of a scattering intensity curve obtained by X-ray scattering measurement.
    Type: Application
    Filed: May 2, 2014
    Publication date: November 20, 2014
    Applicant: SUMITOMO RUBBER INDUSTRIES, LTD.
    Inventor: Ryo MASHITA
  • Patent number: 8879688
    Abstract: A method and apparatus for inspecting an object using a backscatter inspection system. In one illustrative embodiment, an apparatus comprises a radiation source, a collimator, and a detector system. The radiation source is configured to emit radiation. The collimator is configured to form a beam using a portion of the radiation emitted by the radiation source. The beam is directed towards a surface of an object. The detector system is configured to detect backscatter formed in response to the beam encountering the object. A shape of the detector system is configured to be changed into a selected shape.
    Type: Grant
    Filed: May 22, 2012
    Date of Patent: November 4, 2014
    Assignee: The Boeing Company
    Inventor: Morteza Safai
  • Patent number: 8873711
    Abstract: A method and system for visualizing the effects of corrosion are provided. In the context of a method, a workpiece is interrogated with radiation, such as by interrogating the workpiece with x-ray radiation. By relying upon a radiographic technique, the workpiece may be hidden and may be interrogated without disassembly. The method generates a backscatter image of the workpiece based upon radiation backscattered from the workpiece. The method also compares one or more regions of the backscatter image of the workpiece with respect to backscatter images of different metal loss indicators. Each metal loss indicator is representative of a different amount of metal loss. As a result of the comparison, the method estimates the metal loss attributable to corrosion of the workpiece.
    Type: Grant
    Filed: June 19, 2012
    Date of Patent: October 28, 2014
    Assignee: The Boeing Company
    Inventors: Roger W. Engelbart, Taisia V. Tsukruk