Abstract: The method and apparatus for correcting the dynamic balance of a rotating body, whereby the correction of the dynamic balance of a rotating body is achieved by fixing a correcting agent on the rotating body after the position of the dynamic unbalance and the amount of the dynamic unbalance in the rotating body are measured, are so constructed as to detect whether or not the correcting agent fixed on the rotating body is protruding from a prescribed configuration of the rotating body. Therefore, the method and the apparatus are capable of not only correcting a dynamic unbalance of a rotating body, but also detecting the protrusion of the correcting agent fixed on the rotating body.

Abstract: Method and apparatus for non-destructively monitoring the thickness and uniformity of electrically conductive coatings (12) that have been deposited upon optical waveguide fibers (10). The monitoring may be performed while coated fiber (22) is at rest or while it is in motion. Physical contact with fiber (22) is not required. Monitoring is accomplished by feeding coated fibers (22) through an inductive coil (24) while simultaneously measuring an electrical value that is dependent upon the electrical resistance of conductive coating (10) then passing through inductive coil (24). The electrical value measured for a given section of coated fiber (22) becomes indicative of the coating thickness and uniformity of the coating about optical waveguide fiber (10) by correlating the electrical value measured with previously measured electrical values generated by coated fibers having coatings of known thicknesses and having no bald spots or other non-uniformities.

Abstract: Endpoint control of thickness of a film being deposited or etched is achieved by use of an ellipsometer that derives delta and psi coordinates of a polarized light beam reflected from the work piece during the course of processing. Measured film thickness is a function of the delta and psi coordinates and other parameters. Delta and psi coordinates of a selected end point (final film thickness) of the process are calculated, and an unbounded line through the endpoint perpendicular to the direction of a plot of delta and psi coordinates adjacent the endpoint is defined. As the processing continues, an ERROR is generated that becomes zero when measured delta and psi coordinates are on the line. When this error changes sign, in the appropriate cycle and within a reasonable range of the endpoint, the desired thickness has been attained, and the process is stopped. The improved film thickness endpoint control is used in a rapid thermal processing system wherein temperatures are changed at a rate of 100.degree. C.

Abstract: A method for detecting the completion of electrolessly depositing metal into a via. The method includes providing a non-autocatalytic detection mask with an opening over a via containing an autocatalytic material, electrolessly depositing a conductive metal into the via which fails to plate to the mask, and continuing the deposition until metal in the via contacts the mask, at which time the electrochemical potential of the mask changes and the metal plates to and covers the entire mask. The completion of the electroless via fill can be detected by changes in both the appearance and electrochemical potential of the mask.

Abstract: The thickness and rate of growth of a deposited film is monitored using a piezoelectric crystal sensor such as an AT-cut plano-convex crystal. The frequencies of the fundamental frequency and another resonance mode are measured prior to deposition, and the change of these two frequencies is monitored during deposition. The areal mass density of the deposited material is determined from these two resonance frequencies for the uncoated quartz crystal and for the crystal during deposition. A frequency generator provides accurate sweeps of frequency which are applied to the crystal, and the crystal response is supplied to a phase detector to identify the positions of the resonance frequencies. The acoustic impedance ratio Z of the deposited material relative to the fresh crystal is computed from the resonance frequencies for the coated and uncoated crystal, by applying the modal equations for AT-cut plano-convex quartz crystal and Lu-Lewis relation.

Abstract: A method and apparatus for sensing radiation 26 indicative of at least one process variable in a semiconductor process chamber 10 in which a reactant gas reacts to effect changes in a silicon wafer 12. The method comprises positioning a substantially transparent window 22 in a conduit 14 leading to the wafer 12 and then flowing the reactant gas in the conduit 14 past the window 22 and toward the wafer 12. The radiation 26 is then sensed through the window 22. In the preferred embodiment the window 22 is positioned with an optical path along the center axis of the conduit 14. Other systems and methods are also disclosed.

Abstract: A method for quantifying size encapsulation of yarn on a slasher comprising measuring the hairiness of yarn entering a slasher prior to the application of size to the yarn, measuring the hairiness of the yarn leaving the slasher and solving the equation: ##EQU1## Apparatus for quantifying the size encapsulation of yarn on a slasher comprises an entry hairiness sensor positioned at the entry side of a slasher, a delivery hairiness sensor positioned at the delivery side of the slasher, the entry and delivery sensors producing signals proportional to the hairiness of the yarn at the entry and delivery sides of the slasher respectively, and a computer for solving the above indicated equation and producing an output signal representative of size encapsulation.

Abstract: A method of for manufacturing a coated optical fiber includes depositing a conductive coating on the optical fiber and measuring a value of conductance of that coating. Featured within the manufacturing method is a method for measuring the thickness of the conductive coating on an insulator, e.g., carbon on an optical fiber, including the following steps. An electromagnetic field is established by an input signal. The conductively coated insulator is moved through the energized electromagnetic field. The conductive coating on the insulator is oriented with respect to the electric field so that their interaction increases transmission loss from input to output. An output signal is extracted from the electromagnetic field. From changes in the output signal with respect to a predetermined standard, or reference, the conductance and the thickness of the conductive coating are determined.

Abstract: An apparatus for the continuous manufacture of high temperature superconducting wires is disclosed. A core on which the superconductive ceramic substance is caused to directionally solidify from the melt is drawn through the melt in such a manner as to obtain an oriented microstructure conductive to high critical current carrying capacity. This also produces a macrostructure with appropriate mechanical strength and flexibility independently of the superconducting substance chosen.

Abstract: A system for monitoring and controlling the rate of growth of thin films in an atmosphere of reactant gases measures the UV absorbance of the atmosphere and calculates the partial pressure of the gases. The flow of reactant gases is controlled in response to the partial pressure.

Abstract: Method to control the thickness of an antireflection coating.According to the invention, the semi-conductive structure (14) is fed with a constant current (16) and the voltage (24) is measured at its terminals. This voltage passes through a maximum when the reflectivity of the antireflection coating passes through a minimum.Application for the embodiment of semi-conductive lasers.

Abstract: An error-compensated process for forming a multiple-notch optical filter which is characterized by a continually and accurately varying periodic profile. The optical medium if formed on a substrate so that the profile of the refractive index is multiply sinusoidally modulated to maintain Bragg's law for each component in the multiple-notch profile. In a preferred embodiment, as the optical medium is coated on the substrate, the depositing film is monitored by optical techniques, and feedback information is provided to a computer driven by a pre-programmed process control algorithm so that real time control of the manufacturing process may be accomplished.

Abstract: Precision multilayer optical interference coating of substrates having complex topology using complementary shaped electrodes and plasma enhanced chemical vapor deposition within a chamber. The materials for the optical quality thin films are obtained from starting reactants of the form M-R where M denotes a metal atom and R denotes an organic component. These vapor phase starting reactants are brought into a reactive atmosphere of the chamber through a plurality of orifices in one of the shaped electrodes. The resulting substances are deposited as thin films upon the substrates with inherently superior scatter loss performance because of the low temperature nature and simple direct vapor-to-solid phase transformation path of the process.

Abstract: In a process for determining the layer thickness of semiconductor layer structures, a sample of a multilayer semi-conductor (4) is placed in contact with an electrolyte (2) then subjected to anodic etching during which the depth of etching is determined by integration of the current. During etching, the sample (4) is also excited by an electric signal and the real component of the admittance and hence the conductance of the probe at the frequency of excitation is determined, the extreme values of this component are analyzed, and the values of the depth of etching corresponding to these extremes, which characterize the junctions between the layers of the sample (4) tested, are determined.

Abstract: A method for forming an electrostatic field deflector tube (50) for use in an electron beam machine (10) which comprises the use of a rigid boring bar (88) with a diamond scribe tip (90) and a rigid holder (92) for the metal coated tube. The scribe tip (90) is positioned within the bore of the tube and the boring bar (88) is stroked in a direction parallel to the tube axis while engagement with the inner coating to scribe very narrow lines (66) on the inner surface of the tube. These lines (66) are formed over a major portion of the length of the tube and of a width less than 0.001 in. After each scribing step, the tube (or the boring bar and scribe tip as the case may be) is incrementally rotated to form a number of separate electrically isolated areas. Dial position indicators with digital readouts (92) locate the scribe tip (90) within a few ten thousandths of an inch and optical and resiatance means are used to determine the integrity of each scribed line.

Abstract: A method and apparatus for process control in both the production of uniform material layers using vapor deposition, sputtering, chemical deposition, etc. and the treating of material layers. In particular, the process and apparatus are particularly useful in semiconductor fabrication where ion implantation or diffusion is used. A brief test signal of preset shape, frequency spectrum, or frequency sequence is applied at given time intervals to the material layer whose production characteristics need to be monitored. The measuring signal is applied to a digital evaluation circuit in a process control computer. The signal has various components whose time constants and/or conductivities are different from one another and which together are characteristics of the current flowing through the layer being monitored. In particular, the current flowing over the surface layer i.sub.1, the current flowing through particle houndary areas i.sub.3, and the current through homogeneous material ranges i.sub.

Abstract: The invention concerns a manufacturing process of a photocathode for an image intensifier tube.According to this process, the photocathode is made within the tube by depositing a photoelectric material on a conductive substrate by vacuum evaporation. During this operation, the optical transparency of the deposit is checked by illumination of this deposit by a light source. According to the invention, this light source is located within the tube and is protected from the vapors of the photoelectric material. In the prior art, this light source was located outside the tube and the illumination of the deposit was not sufficient.The invention has applications in the field of image intensifier tubes.

Abstract: The temperature of a surface undergoing a radiation assisted thermally driven process is sensed by observation of the thermal emission from that surface and used to control the process. In a preferred embodiment, the blue edge of the thermal emission spectral distribution is detected to determine the surface temperature of a workpiece during a process such as laser-assisted chemical vapor deposition, and used to control this temperature. The temperature measuring system has means for focusing workpiece thermal emission and defining the field of view, a spectrometer to separate shorter wavelength light from other spectral components of the thermal emission, and a photon-counting system to detect the shorter wavelength light and generate a surface temperature signal. Systems to determine surface temperature at a spot and along a line have an optical prism to disperse the thermal emission into component wavelengths, and a multichannel photon-counting detector comprised of an intensified photodetector array.

Abstract: In accordance with the invention, the functions of two TV cameras in the prior art for monitoring polymer coating concentricity and/or carbon coating thickness are accomplished by a single TV camera (48). Rather than being projected onto an opaque dispersive screen, the forward-scattered mode pattern of each of the orthogonal beams (57,58) is transmitted through a translucent screen (52,53) and reflected to an image combining device (67) which transmits both patterns to the single TV camera (48). The two beams are slightly vertically displaced to establish displaced images (72,73) of the two patterns. This allows the two patterns to be viewed simultaneously and distinguished by the TV camera. Modified electronics (FIG. 10) provide for alternate TV scanning of the two images so that a computer (22) can monitor and correct concentricity and/or carbon coating thickness in real time during fiber production.

Abstract: Thin film interference filters consisting of alternating layers of tantala and silica suitable for high temperature use on electric lamps have been made by heat treating at 550.degree.-675.degree. C. before using the filters at high temperature. Tungsten halogen lamps made with such heat treated filters have been thermally cycled for thousands of cycles at 900.degree. C. with no film loss and with satisfactory optical performance.

Abstract: A method of metallizing a substrate by applying a metallic film to the substrate and measuring the film at a plurality of different lateral positions of the substrate by inducing an eddy current in the film and detecting the magnitude of the film to provide an indication of film thickness.

Abstract: A method for checking and/or controlling a metallization process in a galvanizing or chemical is based on the measurement of light scattered off or reflected from a surface portion being metallized. A deviation from a predetermined nominal value of the scattered or reflected light intensity serves for controlling at least one process parameter to neutralize the deviation.

Abstract: A method for measuring the thickness of a multi-layer magnetic recording medium which provides a high accuracy and which can be used for continuous on-line monitoring of product thickness. First, first and second magnetic layers are simultaneously coated onto a running nonmagnetic support to form the recording medium. The first and second magnetic layers are made of materials having different responses to fluorescent X-rays. Then, the thickness of at least one of said first and second layers is measured by exposing the recording medium to fluorescent X-rays.

Abstract: A method of optically controlling the volume of adhesive extruded from an orifice. A camera continuously monitors the adhesive discharged from the orifice; this adhesive is not applied to the target area until its volume is within preestablished limits. When the volume of adhesive is visually determined to be acceptable it is then applied to the target area. The camera is used again, to confirm the proper amount of adhesive has been applied to the target area by measuring the volume of adhesive remaining on the orifice after contacting the target area.

Abstract: A surface acoustic wave (SAW) device is provided which includes a piezoelectric substrate, an input transducer formed on the substrate for launching acoustic surface waves along a propagation path on the substrate, an output transducer formed on the substrate across the propagation path from the input transducer for receiving acoustic surface waves generated by the input transducer, and at least one area of acoustic energy absorbing material, preferably polyimide, formed on the substrate between the edge of the substrate and a corresponding transducer. The acoustic absorber is patterned on the SAW device substrate while the device is still in wafer form using photolithographic processing techniques.

Abstract: A system for analyzing an aluminum deposition process to form a coating on a surface of a CRT faceplate panel disposed on an exhaust cart includes: an apparatus within the exhaust cart for controlling the distribution of the aluminum; a sensor disposed on the panel for determining whether aluminum was deposited thereon, and a plurality of thickness monitors disposed on the panel for generating a plurality of signals representative of the relative thickness of the aluminum coating at a plurality of locations on the surface thereof. The signals are converted into data values to indicate whether the aluminum coating achieves a predetermined thickness profile.A method of depositing the aluminum coating is also disclosed. The method provides an indication of the performance of each of the exhaust carts and permits the categorization of defects for the panels not meeting the predetermined thickness profile.

Abstract: A method of testing coating integrity of containers includes the steps of introducing a probe into an electrolytic solution into the container and applying a constantly-increasing voltage to the probe from a source and taking readings of the voltage when the current flow through the container reaches a predetermined level. The apparatus also includes a gripping mechanism for producing a positive contact between the metal in the container and the remainder of the circuit.

Abstract: The contrast of a photoresist layer used in a lithographic process for a given light source is optimized by determining the nonlinear relationship of the photoresist contrast with regard to the thickness thereof and then placing over a substrate a thickness of photoresist corresponding to a desired value of contrast indicated by the nonlinear relationship of contrast with photoresist thickness. The nonlinear contrast with regard to photoresist thickness function is a damped, sinusoidal like function with the difference between maxima and minima contrast values decreasing as the photoresist thickness increases and with higher absolute maxima values for contrast as photoresist thickness decreases.

Abstract: A composition comprising a chlorinated polyolefin and an optical brightener is disclosed. The compositions are useful as detectable adhesion promoters for polyolefin substrates. The compositions are applied as a coating to the polyolefin substrate and the coated substrate exposed to an ultraviolet light source to determine uniformity of the coating over the substrate. Uniform coverage is necessary to develop optimum adhesion between the substrate and a subsequently applied paint layer.

Abstract: In a process of depositing a thin film onto a surface of a substrate with the use of a plasma, wherein the plasma optical emission is monitored, analyzed, and the results used to automatically control the nature of the plasma in order to control the characteristics of the deposited thin film. One aspect of the emission that is detected is the intensity of each of two emission lines of different wavelength bands from the same plasma species, the intensities being ratioed and the ratio compared to a predetermined value known to provide a resulting film with uniform and repeatable characteristics. This ratio is also related to the average electron temperature of the plasma, which can be calculated from it. Additionally, the intensity of another emission line from another of the plasma species may be measured and ratioed to one of the foregoing line intensities if additional control is desired.

Abstract: Measurements made with an electrical resistance sensor that is used for monitoring electrolytic plating are isolated from adverse effects of the strong plating currents flowing in the bath by momentarily disconnecting the resistive sensing element from the plating power source for a very short time interval during which resistance of the test element is measured.

Abstract: Process for measuring the optical properties of thin layers while they are being built up in vacuum coating installations. For this purpose, at least one test object is passed through a stationary measuring light beam and the transmission behavior of the test object is evaluated by measurement. A reference point for the measurements is fixed in each case by reference measurements at intervals of time. In addition, at least one opaque measurement zone and at least one measuring zone, which does not attenuate the measuring light beam, are disposed in path of motion of the test object. The ratio of the measured value of the test object, decreased by the measured value of the opaque measuring zone, to the measured value of the nonattenuating measuring zone, decreased by the measured value of the opaque measuring zone, is formed by an arithmetic logic unit.

Abstract: A plasma processing apparatus and process endpoint detection method including a plasma chamber for processing an item that has a first portion of a first material and a second portion of a second material, with the first and second materials having different work functions, and a structure for generating a plasma in the plasma chamber, with the plasma generating structure including at least a pair of RF-power electrodes with one of them being excited by an RF excitation frequency. The apparatus further includes a structure for generating and ejecting electrons from the second material only when the second material is exposed to the plasma, and a structure for increasing the energies of these generated electrons and accelerating these electrons into the etching plasma with sufficient energy to generate secondary electrons in the plasma.

Abstract: For checking the workmanship of paint coating, light is shed on the portion of the surface of an object where a paint has been applied. The intensity of light reflected by this portion of the surface gives a clue to a judgment on the acceptability of the paint coating. The judgment is passed by checking whether or not the above-mentioned intensity of light falls within a preset level. The level to be preset is variable according to the intensity of light reflected by the surface, the intensity of light in this case being measured prior to the application of the paint. The light reflected by the portion of the surface where the paint has been applied is resolved into three colors. A checkup is carried out on whether or not the sum of the intensities of light representing these three colors corresponds to a level preset for the amount of this sum. A level to be preset is selected from among data stored in a memory.

Abstract: The mixed potential of a standard reference electrode and an electrically conductive article that is being electrolessly plated is compared to a DC reference voltage. A predetermined level of comparison indicates the start of electroless plating. This comparison starts a timer. After a predetermined time interval has expired, plating is terminated. The result is a plated coating that is uniform and of a closely controlled thickness. The article to be plated is a thin film magnetic recording disk upon which a thin cobalt containing layer, in the range of about 850 angstroms thick, is to be plated.

Abstract: At least one complete surface of at least one metallic part of a can is given a uniform coating of corrosion-preventing lacquer and this part is subsequently worked such that the metal of the part is exposed at regions at least immediately adjacent the coated surface. Dots of lacquer are sprayed by the ink-jet method substantially only on the exposed regions of the part after working thereof and so that the dots together form a continuous layer covering the exposed regions. According to the viscosity of the lacquer the surface coating can be achieved by partially overlapping adjacent dots of the applied lacquer or without overlapping by the running together of the adjacent dots of the liquid, with no excess material having to be applied to and subsequently removed from the regions to be coated.

Abstract: A high sensitivity electroplating or corrosion sensor and method for sensing, employing a relatively strong, self-supporting electrically conductive substrate of high resistivity and a test coating that is electroplated directly onto the substrate. For corrosion monitoring, a test element of the sensor is formed of a thick, high resistivity substrate, such as stainless steel, upon which is electroplated a thin test coating of material to be tested in a corrosive environment. For many applications, the ratio of resistivity of the substrate to resistivity of the test coating is substantially equal to the ratio of thickness of the substrate to thickness of the test coating, which ratio may be about 40 to 1. The sensor may be employed in the monitoring of electroplating by immersing the stainless steel substrate in the electrolytic bath with the object to be plated and measuring the decreasing parallel resistance of the substrate and coating that is plated upon the substrate during a plating of the object.

Abstract: A method for fabricating graded refractive index (rugate, optical filters as well as complex rugate filters having prespecified refractive index verses thickness profiles is disclosed. A plurality of at least two different compatable thin film deposition source components of different refractive index, which are stoichiometrically combinable in variable proportion, such as silicon nitride and silicon oxide, or zinc sulfide and zinc selenide, are used to form a thin film material with a refractive index which varies as a function of the proportions of the components. Each source component is separately laser flash evaporated and codeposited on a substrate to form a coating while monitoring the physical and optical thicknesses of the coating, to allow adjustment of the respective laser flash evaporation rates of the source components.

Abstract: A method and apparatus for measuring a quantity of particles deposited on a metal body to be coated with powder or the quantity of powder deposited per unit of time, especially on a moving body. The body is located in a space subjected to an electrostatic field and a quantity of powder deposited, possibly per unit of time, is measured by measuring a charge or current in a circuit connecting the field electrodes. An actual value deposited, indicated by a measurement, is used as a control parameter in a control circuit for adjusting an actual amount deposited to a set deposition amount which is adjustable.

Abstract: When controlling and/or determining the thicknesses of layers or surface coatings there is chosen a coating composition that incorporates a fluorescing indicator substance, the proportions of which in the coating composition can be measured by X-ray fluorescence. The coating composition is applied to a substrate surface in solution, slurry or molten form and the thickness of the coating, or layer, is controlled and/or monitored in accordance with the intensity of the light which fluoresces from the coating.

Abstract: A method for preparing and maintaining an electroless plating bath. Seeded surfaces include a palladium and tin coating which receives plating from an electroless plating bath. The plating bath conditions are maintained by measuring the open circuit potential of the bath with a potentiostat. The chemical constituent concentration levels are adjusted to a first open circuit potential for the bath. Air is removed from the bath and the open circuit potential increases to a second level representing a bath chemical activity which produces optimum electroless plating on the seeded surfaces. Parts having seeded surfaces are inserted in the bath and a flow of air is re-established in the bath, rendering less negative the open circuit voltage potential during plating of the parts.

Abstract: Method and apparatus for diagnosing degree of degradation of a coating film of a painted metal material by dividing the surface of the painted metal material into a number of small area zones, measuring impedance of the coating film at each of the zones through an AC impedance measuring technique, determining a statistic distribution and/or a two-dimensional distribution of impedance values measured at the individual zones to thereby determine the degree of degradation of the coating film of the painted metal material on the basis of the aforementioned distribution(s).

Abstract: A method of inspecting the inner and/or outer circumferential surface of a tubular member includes the steps of moving an inspection apparatus along the tubular member and during movement along the member sequentially cleaning the inner and/or outer circumferential surface and optically scanning the entire 360.degree. of the inner and/or outer circumferential surface of the elongate member. The foregoing steps are performed in a single forward pass of the inspection apparatus along the tubular member and in a return pass the tubular member is applied with a corrosion preventing material which in the return pass is dried. An apparatus for performing the method is disclosed and the apparatus is capable of determining dimensional faults and inspecting for, inter alia, cavitation, reeding and scale inclusion.

Abstract: In a semiconductor vapor phase growing apparatus of the type disclosed in U.S. Pat. No. 4,430,959 dated Feb. 14, 1984, the thickness and resistivity of the semiconductor grown on a substrate by vapor phase growing technique are controlled by a sequence program. The content of the sequence program is corrected to approach a target thickness and a target resistivity at each batch operation. In a modification, an auxiliary mass flow valve is provided for each main mass flow valve and when the main mass flow valve becomes faulty, it is substituted by the auxiliary mass flow valve so as to continue the normal operation of the vapor phase growing apparatus.

Abstract: A method and apparatus for the control of growth of epitaxial alloy films onto a substrate. A uniformity measurement probe (5-6) scans the growing film and controls a corrector gun (9) directing a corrector beam (8) to the film. The probe (5-6) and gun (9) are correlated to determine the relevant characteristics of a point on the growing film and to apply a particular correction. Possible deposition alloys are cadmium, mercury and tellurium with the corrector beam being selected from one or more of these specie.

Abstract: An arrangement for sorting vehicle bodies by the colors of coating expected thereon in a vehicle body coating line, comprises vehicle body conveying equipment including a plurality of branch conveyers disposed in parallel with one another for transporting and storing temporarily thereon vehicle bodies carried into the arrangement through a bringing-in conveyer and supplying the vehicle stored temporarily to a coating process through a bringing-out conveyer, and a control device for storing therein data indicative of color of coating expected on each of the vehicle bodies on said branch conveyers, with reference to a position of each of the vehicle bodies on the branch conveyers, and driving each of the branch conveyers selectively in accordance with the data stored therein so as to transport the vehicle bodies on the branch conveyers to the bringing-out conveyer in such a manner that the vehicle bodies from the branch conveyers are sorted in dependence on the colors of coating expected on the vehicle bodies.

Abstract: A sintered powder electrode has a biochemically active layer embedded in pores of the electrode. Molecules bind to or are displaced from the biochemically active layer, which drastically changes electrical properties of the electrode. The electrode can be used in an affinity chromotography column or in a capacitive affinity sensor.

Abstract: The frequency of a piezoelectric resonator is precisely adjusted using monomolecular layer(s) of a thermally stable, low stress, uniform insulating film deposited on the active area of the resonator. The method is particularly suitable for precisely adjusting the frequencies of high frequency (i.e., very thin) resonators, and the frequencies of lateral field resonators, without degrading stability.

Abstract: A method for checking the degree of plasma treatment of an article. The method comprises depositing a substance able to change color as a result of plasma treatment on a carrier, the carrier having pores having an average pore size of 0.2-3 .mu.m, placing the carrier having said substance deposited thereon near the surface of the article, subjecting the substance carrying carrier and the article to plasma treatment, and evaluating the color change that has occurred in the substance.

Abstract: An apparatus and a method for controlling the thickness of coatings on webs at a plurality of cross-directional positions while a coating procedure is taking place. The deflection of the metering element is controlled automatically in response to measurements of the uncoated and coated web that determine the thickness of the coating being applied at a plurality of cross-directional positions. In one preferred embodiment, a bimetallic member having a plurality of separated tongue-like extensions corresponding to cross-directional positions along the blade is used, the tongue-like extensions pressing on the back of the blade at their ends in response to heat applied dependent upon the determined thickness of the coating being applied. In another embodiment, pneumatic actuators whose pressure may be varied in response to the determined thickness are used to adjust the position of the metering element at a plurality of cross-directional positions to locally vary the thickness of the applied coating.