Contains An Exterior Ethylenic Substituent Bonded Directly Or Indirectly To A Single Carbon Atom Of The Fused Ring System Patents (Class 526/284)
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Patent number: 7604918Abstract: A photosensitive polymer for a photoresist and a photoresist composition having the same are provided. The photosensitive polymer for a photoresist includes the repeating unit represented by the formula below: wherein R1 is a C1-C20 hydrocarbon group or a C1-C20 hetero hydrocarbon group including at least one hetero atom selected from the group consisting of nitrogen, fluorine and sulfur.Type: GrantFiled: January 22, 2007Date of Patent: October 20, 2009Assignee: Samsung Electronics Co., Ltd.Inventors: Sang-jun Choi, Han-ku Cho
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Publication number: 20090253872Abstract: An acetylene-based polymer, comprising n recurring units represented by the following Formula (1): ?CH?CA?n??(1) wherein, n is an integer of 10 to 10,000; each A represents a group selected from a naphthyl group, a phenanthryl group, a pyrenyl group and an anthryl group, which is mono- or di-substituted with a group selected from alkyl groups, alkyl groups substituted with aromatic hydrocarbon groups, R1—O— groups, —S—R2 groups, —NR3R4 groups, a cyano group, a carboxyl group, R5SO2— groups, —COOR6 groups, —CON(R7)(R8) groups and —COR9 groups (each of R1, R5, R6 and R9 is an alkyl group, each of R2, R3, R4, R7 and R8 is a hydrogen atom or an alkyl group); and the recurring units may be the same as or different from each other.Type: ApplicationFiled: November 24, 2006Publication date: October 8, 2009Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGYInventor: Kenji Tsuchihara
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Publication number: 20090226843Abstract: A pattern is formed by applying a positive resist composition comprising a polymer comprising hydroxyalkylnaphthalene-bearing recurring units and acid labile group-bearing recurring units onto a substrate to form a resist film, heat treating and exposing the resist film to radiation, heat treating and developing the resist film with a developer to form a first pattern, and causing the resist film to crosslink and cure with the aid of heat or of acid and heat. A second pattern is then formed in the space area of the first pattern. The double patterning process reduces the pitch between patterns to one half.Type: ApplicationFiled: March 5, 2009Publication date: September 10, 2009Applicant: SHIN-ETSU CHEMICAL CO., LTD.Inventors: Jun HATAKEYAMA, Takeshi KINSHO, Masaki OHASHI, Kazuhiro KATAYAMA
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Publication number: 20090221778Abstract: A file is formed by coating a substrate with a film-forming composition including a compound having an alicyclic hydrocarbon structure and irradiating the coated composition with microwaves having a frequency of 5.8 GHz. An insulating film is formed by irradiating a film including a compound having a siloxane structure with microwave having a frequency of 5.8 GHz. These films possess excellent film properties such as dielectric constant and mechanical strength.Type: ApplicationFiled: February 25, 2009Publication date: September 3, 2009Applicant: FUJIFILM CoporationInventors: Makoto MURAMATSU, Akira ASANO, Kensuke MORITA
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Patent number: 7569323Abstract: A resist protective coating material is provided comprising an ?-trifluoromethylacrylic acid/norbornene copolymer having cyclic perfluoroalkyl groups as pendant. In a pattern-forming process, the material forms on a resist film a protective coating which is water-insoluble, dissolvable in alkaline developer and immiscible with the resist film, allowing for effective implementation of immersion lithography.Type: GrantFiled: July 26, 2006Date of Patent: August 4, 2009Assignees: Shin-Etsu Chemical Co., Ltd., Panasonic Corporation, Central Glass Co., Ltd.Inventors: Jun Hatakeyama, Yuji Harada, Yoshio Kawai, Masayuki Endo, Masaru Sasago, Haruhiko Komoriya, Michitaka Ootani, Satoru Miyazawa, Kazuhiko Maeda
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Patent number: 7537880Abstract: To a resist composition, an alkali-soluble polymer having fluorinated ester-containing lactone units incorporated therein is included as an additive. The resist composition forms a resist film having a reduced contact angle after development. The resist film prevents water penetration during immersion lithography.Type: GrantFiled: October 3, 2007Date of Patent: May 26, 2009Assignee: Shin-Etsu Chemical Co., Ltd.Inventors: Yuji Harada, Jun Hatakeyama, Takao Yoshihara, Wataru Kusaki, Tomohiro Kobayashi, Koji Hasegawa
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Publication number: 20090124773Abstract: The invention relates to a polymer composition that includes a branched alkene which is cationically polymerizable as well as a glass-forming comonomer and/or a vinyl comonomer containing benzocyclobutene as the pendant group. The structure of the polymer composition can take various forms: linear random copolymer, linear block copolymer, star random copolymer, star block copolymer, and other hyperbranched polymers. The copolymer composition can undergoes crosslinking at elevated temperatures (preferably above 180° C.).Type: ApplicationFiled: June 25, 2008Publication date: May 14, 2009Inventors: Yonghua Zhou, Leonard Pinchuk
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Patent number: 7510820Abstract: In the lithographic multilayer resist process, a material comprising a copolymer of a hydroxy-containing vinylnaphthalene with hydroxy-free olefins is useful in forming a resist undercoat. The undercoat-forming material has a high transparency and optimum values of n and k so that it functions as an antireflective coating during short-wavelength exposure, and has etching resistance during substrate processing by etching.Type: GrantFiled: November 27, 2006Date of Patent: March 31, 2009Assignee: Shin-Etsu Chemical Co., Ltd.Inventors: Jun Hatakeyama, Toshihiko Fujii
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Patent number: 7501222Abstract: A polymer including a monomer represented by the following Formula and a photoresist composition including the same are disclosed. The polymer and photoresist composition can improve the resolution and the process margin due to the low activation energy of the deprotection reaction of the alcohol ester group including saturated cyclic hydrocarbyl group, and also can produce fine photoresist patterns because they have a stable PEB(Post Exposure Baking) temperature sensitivity, and further, can improve the focus depth margin and the line edge roughness of the resist layer. In the above Formula, R* is a hydrogen or methyl group, R1 is saturated hydrocarbyl group of 1 to 5 carbon atoms, R is mono-cyclic or multi-cyclic homo or hetero saturated hydrocarbyl group of 3 to 50 carbon atoms, and n is an integer of at least 2.Type: GrantFiled: June 21, 2006Date of Patent: March 10, 2009Assignee: Dongjin Semichem Co., Ltd.Inventors: Jung-Youl Lee, Jae-Woo Lee, Jae-Hyun Kim
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Patent number: 7491483Abstract: A polymer is composed of recurring units of hydroxyvinylnaphthalene, (meth)acrylic units having a lactone ring fused to a bridged ring, and (meth)acrylic units having acid labile groups. A positive resist composition comprising the polymer as a base resin, when exposed to high-energy radiation and developed, exhibits a high sensitivity, a high resolution, and a minimal line edge roughness due to controlled swell during development.Type: GrantFiled: March 5, 2007Date of Patent: February 17, 2009Assignee: Shin-Etsu Chemical Co., Ltd.Inventors: Jun Hatakeyama, Takeshi Kinsho, Takanobu Takeda
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Patent number: 7488567Abstract: A polymer comprising recurring units of formula (1) wherein R1 is F or fluoroalkyl, R2 is alkylene or fluoroalkylene, and R3 is an acid labile group and having a Mw of 1,000-500,000 is used to formulate a resist composition, which is processed by the lithography involving ArF exposure and offers many advantages including resolution, minimal line edge roughness, etch resistance, and minimal surface roughness after etching. The composition performs well when processed by the ArF immersion lithography with liquid interposed between the projection lens and the wafer.Type: GrantFiled: May 25, 2006Date of Patent: February 10, 2009Assignees: Panasonic Corporation, Central Glass Co., Ltd., Shin-Etsu Chemical Co., Ltd.Inventors: Yuji Harada, Jun Hatakeyama, Yoshio Kawai, Masaru Sasago, Masayuki Endo, Kazuhiko Maeda, Haruhiko Komoriya, Michitaka Ootani
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Patent number: 7446159Abstract: A resin composition having a viscosity suitable for encapsulating optical devices such as light-emitting devices is provided. Specifically, the cured product of the resin composition has a refractive index greater than or equal to that of epoxy resins, exhibits excellent heat resistance and light resistance, and has thermal stress relaxation properties. The curable resin composition contains a fluorene group-containing acrylate or methacrylate represented by the following formula and a specific monofunctional acrylate or methacrylate: wherein X is —(CH2CH2O)n— or —(CH2CH2O)—CH2CH(OH)CH2O— with n being 1 to 5 and R is an acrylic or methacrylic group.Type: GrantFiled: September 20, 2007Date of Patent: November 4, 2008Assignees: Sony Corporation, Sony Chemical & Information Device CorporationInventors: Hiroshi Samukawa, Kouki Hatsuda, Yoshito Ikeda, Hisashi Ando, Norikazu Yamamoto
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Patent number: 7446157Abstract: The present invention relates to novel materials particularly useful for ophthalmic applications and methods for making and using the same. More particularly, the present invention relates to relatively soft, optically transparent, foldable, high refractive index materials particularly suited for use in the production of intraocular lenses, contact lenses, and other ocular implants and to methods for manufacturing and using the same.Type: GrantFiled: December 7, 2004Date of Patent: November 4, 2008Assignee: Key Medical Technologies, Inc.Inventors: Khalid Mentak, Anthony Keslinke, Kevin Phan
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Patent number: 7439302Abstract: A new underlayer composition that exhibits high etch resistance and improved optical properties is disclosed. The underlayer composition comprises a vinyl or acrylate polymer, such as a methacrylate polymer, the polymer comprising at least one substituted or unsubstituted naphthalene or naphthol moiety, including mixtures thereof. Examples of the polymer of this invention include: where each R1 is independently selected from an organic moiety or a halogen; each A is independently a single bond or an organic moiety; R2 is hydrogen or a methyl group; and each X, Y and Z is an integer of 0 to 7, and Y+Z is 7 or less. The organic moiety mentioned above may be a substituted or unsubstituted hydrocarbon selected from the group consisting of a linear or branched alkyl, halogenated linear or branched alkyl, aryl, halogenated aryl, cyclic alkyl, and halogenated cyclic alkyl, and any combination thereof.Type: GrantFiled: August 2, 2005Date of Patent: October 21, 2008Assignee: International Business Machines CorporationInventors: Wu-Song Huang, Sean D. Burns, Mahmoud Khojasteh
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Patent number: 7423102Abstract: The present invention provides a star polymer which comprises a central core and three or more branches bonded to the central core, and has a weight average molecular weight of from 1,000 to 100,000, wherein at least one of the branches containing at least one repeating unit selected from the group consisting of the following repeating units (1), (2), (3), (4) and (9); and a process for producing the star polymer. The present invention also provides a chemically amplified positive resist composition comprising the star polymer and an acid generator.Type: GrantFiled: June 30, 2005Date of Patent: September 9, 2008Assignee: Sumitomo Chemical Company, LimitedInventors: Youngjoon Lee, Yasuhiro Watanabe, Takayuki Miyagawa
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Patent number: 7419761Abstract: A photoresist polymer having a spiro cyclic ketal group, and a photoresist composition including the same is disclosed. The photoresist polymer and the photoresist composition can improve the resolution and the process margin due to its low activation energy of the deprotection reaction of the spiro cyclic ketal group, and can produce fine photoresist patterns due to its low PEB (Post Exposure Baking) temperature sensitivity.Type: GrantFiled: September 15, 2005Date of Patent: September 2, 2008Assignee: Dongjin Semichem Co., Ltd.Inventors: Jae-Woo Lee, Jung-Youl Lee, Deog-Bae Kim, Jae-Hyun Kim, Eun-Kyung Son
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Publication number: 20080199215Abstract: In an electrophotographic photoreceptor including a conductive substrate and a single layer type photosensitive layer, the aromatic polycarbonate is contained to a single layer type photosensitive layer, which aromatic polycarbonate includes a constituent unit represented by the following general formula (1) derived from a compound having a basic asymmetric bishydroxy enamine skeleton represented by the general formula: Accordingly, the electrophotographic photoreceptor is obtained which is excellent in charge transportability, mechanical strength, electric property, durability, etc. and can form good images for a long time.Type: ApplicationFiled: January 29, 2008Publication date: August 21, 2008Inventors: Akiko KIHARA, Akihiro Kondoh, Hiroshi Sugimura, Takatsugu Obata
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Publication number: 20080193797Abstract: The present invention relates to compounds of the formula (1) and to the use thereof in organic electroluminescent devices. The compounds of the formula (1) are used as host material or dopant in the emitting layer and/or as hole-transport material and/or as electron-transport material.Type: ApplicationFiled: July 26, 2006Publication date: August 14, 2008Applicant: Merck Patent GmbHInventors: Holger Heil, Arne Buesing, Philipp Stoessel, Horst Vestweber, Amir Hossain Parham
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Patent number: 7402645Abstract: The present invention relates to a soluble polyfunctional vinylaromatic copolymer improved in heat resistance, resistance to thermal decomposition, solvent solubility, and processability. The soluble polyfunctional vinylaromatic polymer is obtained by cationically polymerizing, at a temperature of 20 to 120° C., one or more monomer ingredients including 20 to 100 mol % divinylaromatic compound (a) in the presence of a donor ingredient, e.g., a quaternary ammonium salt, with the aid of a Lewis acid catalyst and an initiator represented by the following general formula (1) wherein R1 represents hydrogen or a monovalent C1-6 hydrocarbon group; R2 represents an aromatic or aliphatic hydrocarbon group having a valence of p; Z represents halogen or C1-6 alkoxy or acyloxy; and p is an integer of 1 to 6; provided that when two or more R1's and Z's are present per molecule, they may be identical to different from each other.Type: GrantFiled: January 26, 2005Date of Patent: July 22, 2008Assignee: Nippon Steel Chemical Co., Ltd.Inventor: Masanao Kawabe
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Patent number: 7399811Abstract: The present invention relates to novel materials particularly useful for ophthalmic applications and methods for making and using the same. More particularly, the present invention relates to relatively soft, optically transparent, foldable, high refractive index materials particularly suited for use in the production of intraocular lenses, contact lenses, and other ocular implants and to methods for manufacturing and using the same.Type: GrantFiled: November 19, 2007Date of Patent: July 15, 2008Assignee: Key Medical Technologies, Inc.Inventors: Khalid Mentak, Anthony Keslinke, Kevin Phan
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Publication number: 20080103275Abstract: The present invention relates to a negative photosensitive polyimide polymer having a repeating unit of formula (1) as a polymerized unit: wherein G, Q and P* are as defined in the specification. The polyimide polymer of the present invention is developable in an aqueous alkaline solution, and has the properties associated with an insulating layer and photoresist.Type: ApplicationFiled: October 30, 2007Publication date: May 1, 2008Inventor: Chung-Jen Wu
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Patent number: 7357973Abstract: A flat plate made of a cycloolefin polymer comprising at least 30% by weight, based on the cycloolefin polymer, of repeating units (A) having an alicyclic structure. The repeating units (A) comprises at least 30% by weight, based on the repeating units (A), of repeating units (A-i) having no norbornane structure. The cycloolefin polymer has a weight average molecular weight of 5,000 to 50,000. The flat plate is especially useful as a light guide plate.Type: GrantFiled: October 25, 2004Date of Patent: April 15, 2008Assignee: Nippon Zeon Co., Ltd.Inventors: Kazuyuki Obuchi, Teruhiko Suzuki, Kenji Otoi
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Patent number: 7339014Abstract: A (meth)acrylate represented by the following formula (1): wherein each of R1, R2, R3 and R4 represents a hydrogen atom, a methyl group or an ethyl group; either one of X1 or X2 represents a (meth)acryloyloxy group and the other represents a hydrogen atom; both A1 and A2 represent hydrogen atoms, or A1 and A2 form —O—, —CH2— or —CH2CH2—, which can be produced by first producing a lactone by reducing an addition product obtained by the Diels-Alder reaction between 1,3-diene and maleic anhydride, and then hydrating the lactone to produce an alcohol followed by (meth)acrylation of the alcohol; a polymer produced by (co)polymerizing a monomer composition comprising the (meth)acrylate of the present invention is excellent in transparency, dry etching resistance, and solubility in organic solvents, and so it is preferably used as a resin for a chemically amplified resist composition.Type: GrantFiled: October 28, 2004Date of Patent: March 4, 2008Assignee: Mitsubishi Rayon Co., Ltd.Inventors: Yoshihiro Kamon, Tadayuki Fujiwara, Hideaki Kuwano, Hikaru Momose, Atsushi Koizumi
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Patent number: 7312291Abstract: A new family of concrete admixture additives can be derived from reacting a mixture of olefins/cyclic olefins-maleic anhydride copolymers and methoxy polyethylene glycol amines and/or polyethylene glycol monoalkyl ethers, or a mixture of styrene-maleic anhydride copolymers and methoxy polyethylene glycol amines and/or polyethylene glycol monoalkyl ethers, or a mixture of styrene-olefins/cyclic olefins-maleic anhydride terpolymers and methoxy polyethylene glycol amines and/or polyethylene glycol monoalkyl ethers. These reactions lead to formation of a kind of carboxylic salt containing polymer, which can be used alone in concrete. Only a small amount of this substance is needed to provide excellent water reduction, high concrete flowability and high early strength.Type: GrantFiled: September 4, 2003Date of Patent: December 25, 2007Assignee: Taiwan Gwan Chian Industrial Co., Ltd.Inventor: Theresa Tsai
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Patent number: 7285370Abstract: Disclosed are a light absorbent agent polymer for organic anti-reflective coating which can prevent diffused light reflection of bottom film layer or substrate and reduce standing waves caused by a variation of thickness of the photoresist itself, thereby, increasing uniformity of the photoresist pattern, in a process for forming ultra-fine patterns of photoresist for photolithography by using 193 nm ArF among processes for manufacturing semiconductor devices, and its preparation method. Also, the present invention discloses an organic anti-reflective coating composition comprising a light absorbent agent polymer for the organic anti-reflective coating and a pattern formation process using the coating composition.Type: GrantFiled: October 12, 2004Date of Patent: October 23, 2007Assignee: Hynix Semiconductor Inc.Inventors: Jae Chang Jung, Keun Kyu Kong, Jin-soo Kim
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Patent number: 7279539Abstract: A polymer, which contains a structural unit having a carboxyl group represented by the following formula (1) at a side chain of the structural unit, wherein node position is formed, when the polymer is dissolved in an alkali aqueous solution having a pH of 10 or more and kept at 25° C. for 60 days: wherein R1 represents a hydrogen atom or a methyl group; R2 represents an (n+1)-valent organic linking group containing an ester group represented by —O(C?O)—; A represents an oxygen atom or NR3—; R3 represents a hydrogen atom, or an monovalent hydrocarbon group having from 1 to 10 carbon atoms; and n indicates an integer of from 1 to 5.Type: GrantFiled: June 29, 2006Date of Patent: October 9, 2007Assignee: Fujifilm CorporationInventors: Atsushi Sugasaki, Kazuto Kunita
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Patent number: 7230059Abstract: A process for producing an olefin-based copolymer, which comprises copolymerizing at least one olefin selected from the group consisting of ethylene and straight chain ?-olefins, and a vinyl compound (I) and a polyene (II) described below: Vinyl compound (I); a vinyl compound represented by the general formula CH2?CH—R, wherein the substituent R is a saturated hydrocarbon group and steric parameters Es and B1 of the substituent R are respectively ?1.64 or less and 1.53 or more; and Polyene (II); a compound having two or more of ethylene bonds and at least one combination of two ethylene bonds in which those are bonded to each other through at least three carbon atoms.Type: GrantFiled: December 18, 2003Date of Patent: June 12, 2007Assignee: Sumitomo Chemical Company, LimitedInventors: Nobuo Oi, Hitoshi Tsukui
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Patent number: 7090962Abstract: An alkali-soluble resin having a polyaromatic group and a photosensitive composition comprising the alkali-soluble resin. The alkali-soluble resin comprises the following recurring units: wherein each of R1, R2, and R3, independently, is H or CH3; R4 is a substituted or unsubstituted polyaromatic derivative containing carbon and optionally containing one or more heteroatoms of oxygen, nitrogen and sulfur; X is alkyl, benzyl, or hydroxyl; each of n1 and n2, independently, is an integer of 0–8; and a, b, and c are integers when a and c respectively are not zero.Type: GrantFiled: December 3, 2004Date of Patent: August 15, 2006Assignee: Industrial Technology Research InstituteInventors: Kuo-Tung Huang, Shi-Deh Chao, I-Jein Cheng, Mon-Haw Chang
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Patent number: 7037995Abstract: Novel tertiary (meth)acrylate compounds having a lactone structure are polymerizable into polymers having improved transparency, especially at the exposure wavelength of an excimer laser and dry etching resistance. Resist compositions comprising the polymers are sensitive to high-energy radiation, have a high resolution, and lend themselves to micropatterning with electron beams or deep-UV rays.Type: GrantFiled: September 29, 2003Date of Patent: May 2, 2006Assignee: Shin-Etsu Chemical Co., Ltd.Inventors: Takeru Watanabe, Takeshi Kinsho, Koji Hasegawa
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Patent number: 7037994Abstract: Novel compounds acetoxymethylacenaphthylene and hydroxymethylacenaphthyleneare disclosed. A polymer prepared from these novel compounds containing a structural unit of the formula (3), wherein R1 is a hydrogen atom and R2and R3 individually represent a monovalent atom or a monovalent organic group is also disclosed. The polymer is suitable as a component for an antireflection film-forming composition exhibiting a high antireflection effect and not causing intermixing with a resist film.Type: GrantFiled: July 23, 2003Date of Patent: May 2, 2006Assignee: JSR CorporationInventors: Hikaru Sugita, Keiji Konno, Masato Tanaka, Tsutomu Shimokawa
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Patent number: 7012123Abstract: An acrylic polymer suitable for use as a charge transport material, the acrylic polymer containing pendant ?-conjugated groups represented by the following general formula (1) and having a triad syndiotacticity or triad isotacticity of at least 60%: wherein in the formula (1), Ar represents an aromatic group, R1 represents hydrogen or a methyl group, R2 represents an organic group or none, R3 and R4 both represent hydrogen or at least one of them represents an electron-donating or electron-withdrawing group, and n denotes an integer of 2 or larger.Type: GrantFiled: April 24, 2003Date of Patent: March 14, 2006Assignee: Sekisvi Chemical Co., Ltd.Inventors: Hideaki Ishizawa, Tamaki Nakano
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Patent number: 6946523Abstract: In accordance with the present invention, there are provided novel heterobifunctional monomers and users for the same. Invention compounds have many of the properties required by the microelectronics industry, such as, for example, hydrophobicity, high Tg values, low dielectric constant, ionic purity, low coefficient of thermal expansion (CTE), and the like. These properties result in a thermoset that is particularly well suited to high performance applications where typical operating temperatures are often significantly higher than those at which prior art materials were suitable. Invention compounds are particularly ideal for use in the manufacture of electronic components, such as, for example, printed circuit boards, and the like.Type: GrantFiled: July 1, 2003Date of Patent: September 20, 2005Assignee: Henkel CorporationInventors: Stephen M. Dershem, Kevin J. Forrestal, Puwei Liu
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Patent number: 6936402Abstract: Disclosed herein is a novel norbornene, acrylate or methacrylate monomer as a photoresist monomer containing an oxepan-2-one group. Further disclosed are photoresist compositions comprising a polymer prepared from the monomer, methods for preparing the photoresist compositions, and methods for forming photoresist patterns using the photoresist compositions.Type: GrantFiled: February 24, 2004Date of Patent: August 30, 2005Assignee: Korea Advanced Institute Science & TechnologyInventors: Jin-Baek Kim, Tae-Hwan Oh, Jae-Hak Choi, Jae-Jun Lee
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Patent number: 6903171Abstract: Methods for the addition polymerization of cycloolefins using a cationic Group 10 metal complex and a weakly coordinating anion of the formula: [(R?)zM(L?)x(L?)y]b[WCA]d wherein [(R?)zM(L?)x(L?)y] is a cation complex where M represents a Group 10 transition metal; R? represents an anionic hydrocarbyl containing ligand; L? represents a Group 15 neutral electron donor ligand; L? represents a labile neutral electron donor ligand; x is 1 or 2; and y is 0, 1, 2, or 3; and z is 0 or 1, wherein the sum of x, y, and z is 4; and [WCA] represents a weakly coordinating counteranion complex; and b and d are numbers representing the number of times the cation complex and weakly coordinating counteranion complex are taken to balance the electronic charge on the overall catalyst complex.Type: GrantFiled: October 15, 2002Date of Patent: June 7, 2005Assignee: Promerus, LLCInventors: Larry Funderburk Rhodes, Andrew Bell, Ramakrishna Ravikiran, John C. Fondran, Saikumar Jayaraman, Brian Leslie Goodall, Richard A. Mimna, John-Henry Lipian
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Patent number: 6828007Abstract: A flat plate made of a cycloolefin polymer comprising at least 30% by weight, based on the cyclopolefin polymer, of repeating units (A) having an alicyclic structure. The repeating units (A) comprises at least 30% by weight, based on the repeating units (A), of repeating units (A-i) having no norbornane structure. The cycloolefin polymer has a weight average molecular weight of 5,000 to 50,000. The flat plate is especially useful as a light guide plate.Type: GrantFiled: September 24, 2002Date of Patent: December 7, 2004Assignee: Nippon Zeon Co., Ltd.Inventors: Kazuyuki Obuchi, Teruhiko Suzuki, Kenji Otoi
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Patent number: 6824955Abstract: A resist composition comprising a copolymer of an acrylic ester monomer containing fluorine at &agr;-position with a norbornene derivative containing oxygen or sulfur within the norbornene ring as a base resin is sensitive to high-nergy radiation below 200 nm, has excellent sensitivity, transparency and dry etching resistance, and is suited for lithographic microprocessing.Type: GrantFiled: December 26, 2002Date of Patent: November 30, 2004Assignees: Shin-Etsu Chemical Co., Ltd., Matsushita Electric Industrial Co., Ltd., Central Glass Co., Ltd.Inventors: Yuji Harada, Jun Hatakeyama, Yoshio Kawai, Masaru Sasago, Masayuki Endo, Shinji Kishimura, Kazuhiko Maeda, Michitaka Ootani, Haruhiko Komoriya
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Patent number: 6812309Abstract: A method for encoding a polymer. The method comprises incorporating, into a polymer formed by polymerizing at least one bulk monomer, from 0.1 ppm to 1% each of at least two additional monomer residues.Type: GrantFiled: December 16, 2002Date of Patent: November 2, 2004Assignee: Rohm and Haas CompanyInventor: Patrick Albert Clark
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Patent number: 6808869Abstract: A composition for a bottom anti-reflective coating material and a method for forming a resist pattern using the composition, which are high in the dry etching rate, high in the resolution, excellent in the resist film thickness dependency and high in the effect of preventing reflective light against exposure light, and provide no intermixing with the photoresist layer, are disclosed, wherein the composition for a bottom anti-reflective coating material comprises a naphthalene group-containing polymer compound having a specific structure.Type: GrantFiled: July 13, 2000Date of Patent: October 26, 2004Assignee: Fuji Photo Film Co., Ltd.Inventors: Kazuyoshi Mizutani, Makoto Momota
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Patent number: 6806335Abstract: A photoresist polymeric compound includes a monomer unit represented by following Formula (I): The polymeric compound may further include at least one of monomer units represented by Formulae (IIa) to (IIg) as described in the specification. The photoresist polymeric compound can exhibit high adhesion to substrates and can highly precisely form fine patterns.Type: GrantFiled: February 28, 2003Date of Patent: October 19, 2004Assignee: Daicel Chemical Industries, Ltd.Inventors: Yoshinori Funaki, Kiyoharu Tsutsumi, Akira Takaragi
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Patent number: 6806336Abstract: This invention relates to olefin polymerization processes for polymerizing ethylene, higher alpha-olefin comonomer and dienes, especially vinyl norbornene, and especially process for producing amorphous or semi-crystalline polymers such as EPDM. The invention also relates to the novel polymers produced by such processes. The invention furthermore relates to articles of manufacture with an improved balance of toughness and curing properties.Type: GrantFiled: June 18, 2003Date of Patent: October 19, 2004Assignee: ExxonMobil Chemical Patents Inc.Inventor: Periagaram S. Ravishankar
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Patent number: 6777070Abstract: An anti-reflection material and a polarization film which exhibit superior anti-reflection properties by preventing external light such as sunlight, fluorescent light, etc., from being reflected on a display, which yield a clear image without sparkling and reduces image contrast, and which exhibit superior wear resistance, chemical resistance, and contamination resistance, as well as exhibit optical stability. A hard coat layer is provided on one surface or two surfaces of a transparent substrate directly or via another layer, and an anti-reflection film having a lower refraction index than the hard coat layer is further provide on the hard coat layer.Type: GrantFiled: June 21, 2000Date of Patent: August 17, 2004Assignee: Tomoegawa Paper Co., Ltd.Inventors: Chikara Murata, Kazuya Ohishi, Yasuhiro Matsunaga, Tomohisa Yamamoto
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Patent number: 6770421Abstract: This invention relates to a photo- or heat-curable resin composition which yields a cured product with minimal cracking and high reliability. The resin composition of this invention comprises 100 parts by weight of (A) photo- or heat-polymerizable unsaturated compound composed of a polycarboxylic acid adduct of bisphenol-epoxy (meth)acrylate, 10-100 parts by weight of (B) alkylene oxide-modified product of (meth)acrylate or oligomers thereof, 0-50 parts by weight of (C) compound containing epoxy group and 0-50 parts by weight of (D) photopolymerization initiator or sensitizer. The composition exhibits high heat resistance and good microfabrication quality and is useful as a peripheral material of electronic parts such as semiconductor devices by the build-up process, for example, as a material for forming insulation layers in multilayer printed wiring boards.Type: GrantFiled: November 30, 2001Date of Patent: August 3, 2004Assignee: Nippon Steel Chemical, Co., LtdInventors: Masahiko Takeuchi, Kazuhiko Mizuuchi, Hironobu Kawasato
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Patent number: 6710148Abstract: A copolymer of an acrylate monomer containing fluorine at &agr;-position with a norbornene derivative is highly transparent to VUV radiation and resistant to dry etching. A resist composition using the resin as a base polymer is sensitive to high-energy radiation below 200 nm, has excellent sensitivity, and is suited for lithographic microprocessing.Type: GrantFiled: February 8, 2002Date of Patent: March 23, 2004Assignees: Shin Etsu Chemical Co., Ltd., Matsushita Electric Industrial Co., Ltd., Central Glass Co., Ltd.Inventors: Yuji Harada, Jun Hatakeyama, Jun Watanabe, Yoshio Kawai, Masaru Sasago, Masayuki Endo, Shinji Kishimura, Michitaka Ootani, Satoru Miyazawa, Kentaro Tsutsumi, Kazuhiko Maeda
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Patent number: 6699954Abstract: The invention concerns a monomer of general formula A—(Q—S)p wherein: A=an aromatic or heteroaromatic ring; Q=a carbonaceous or siliceous divalent radical, respectively corresponding to general formulae: (CR1R2)n wherein: R1, R2=H, alkyl, alkenyl comprising between 1 to 4 carbon atoms and n ranges between 4 and 24; and [O—Si(R1R2)]n wherein R1, R2=H, alkyl, alkenyl comprising between 1 and 4 carbon atoms and n ranges between 3 and 24; S=a solvating segment consisting of at least an aliphatic chain comprising at least a polar heteroatom. 1≦p≦6. The invention also concerns the polymer (homopolymer or copolymer) incorporating said monomer, and their use in organic electroluminescent devices.Type: GrantFiled: March 14, 2002Date of Patent: March 2, 2004Assignee: Universite Joseph FourierInventors: Olivier Stephan, Michel Armand, Jean-Claude Vial
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Patent number: 6699950Abstract: A process for producing a copolymer of an isoolefin and at least one other comonomer comprising the step of polymerizing a reaction mixture comprising an isoolefin, a catalyst and at least one of a cycloconjugated muitiolefin and an unconjugated cyclic olefin in the presence of an activator comprising a carbo cation producing species, a silica cation producing species and mixtures thereof. The process can be practiced using a slurry polymerization approach. One of the main benefits achieved with the present invention is the conversion of the monomers over a shorter period of time and higher percent conversion than when the activator is not used.Type: GrantFiled: August 30, 2001Date of Patent: March 2, 2004Assignee: Bayer AktiengesellschaftInventors: Juergen Ismeier, Carsten Kreuder, Oskar Nuyken
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Patent number: 6677418Abstract: Process for the catalytic copolymerisation (ROMP) of strained activated cyclic olefins comprising contacting an activated strained mono (poly)cyclic olefin monomer of formula with at least 1 wt % of an activated strained di (poly)cyclic olefin monomer of formula in the presence of a catalyst or an initiating agent wherein the group represents a strained (poly)cyclic olefin, tail Y and spacer X comprise preferably electron withdrawing and property modulating groups whereby the monomers form a copolymer comprising the repeating unit and at least 1 wt % of the unit which is adapted for subsequent cross linking of respective copolymer chains in the presence of heat and catalyst to form an amount of a cross linked copolymer comprising the unit, and polymeric products obtained thereby, novel monomers and intermediates, a method for selecting monomers for reaction a method for the preparation of shaped producType: GrantFiled: January 9, 2002Date of Patent: January 13, 2004Assignee: University of DurhamInventors: William James Feast, Ezat Khosravi, Thanawadee Leejarkpai
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Patent number: 6677419Abstract: A scaleable and high-yielding method of preparing copolymers that is useful as a component of a radiation sensitive resin composition is provided. The method includes the step of reacting at least one monomer A which is an unsaturated alicyclic monomer and forms a polymer main chain by dissociation of the unsaturated bond, and at least one unsaturated monomer B, which also forms a polymer chain by dissociation of an unsaturated bond, wherein less than two electron-withdrawing groups are directly appended to said unsaturation, and where said monomer B is other than the unsaturated alicyclic monomer and forms a polymer main chain, in the presence of a free radical initiator. The reacting step is carried out in a stoichiometric excess of monomer A as compared to monomer B. By carrying out the reacting step in an excess of monomer A as compared to monomer B, the resultant copolymer will have a greater molar concentration of monomer A than is obtainable using other methods.Type: GrantFiled: November 13, 2002Date of Patent: January 13, 2004Assignees: International Business Machines Corporation, JSR CorporationInventors: Phillip J. Brock, Eiichi Kobayashi, Isao Nishimura, Yukio Nishimura, Thomas I. Wallow, Masafumi Yamamoto
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Publication number: 20040006189Abstract: A photoresist polymeric compound includes a monomer unit represented by following Formula (I): 1Type: ApplicationFiled: February 28, 2003Publication date: January 8, 2004Applicant: Daicel Chemical Industries, Ltd.Inventors: Yoshinori Funaki, Kiyoharu Tsutsumi, Akira Takaragi
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Publication number: 20030208016Abstract: In accordance with the present invention, there are provided free-radical polymerizable compositions comprising polycyclic olefins, wherein the polycyclic olefins contain little, if any, cyclopentenyl unsaturation. As a result, these olefins are sufficiently reactive with the propagating free-radicals during cure to provide a highly crosslinked thermoset resin. Moreover, invention compositions comprise high molecular weight polycyclic olefins having low volatility. Accordingly, the observed undesirable weight loss upon cure of prior art thermosetting compositions is considerably reduced. Further provided by the present invention are compositions comprising functionalized polycyclic olefin monomers. These functionalized olefin monomers provide additional benefits such as increased adhesion to a variety of surfaces and greater control over glass transition temperatures.Type: ApplicationFiled: January 27, 2003Publication date: November 6, 2003Applicant: Henkel Loctite CorporationInventors: Stephen M. Dershem, Kevin J. Forrestal, Puwei Liu
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Patent number: RE40728Abstract: The invention is a curable cyclobutarene based polymer comprising acid functional pendant groups. The cured polymer displays excellent qualities of toughness, adhesion, dielectric constant, and low stress. The preferred system is soluble in an aqueous base and can be used to generate patterned films with excellent resolution without the need to handle organic developer solvents.Type: GrantFiled: March 24, 2004Date of Patent: June 9, 2009Inventors: Ying H. So, Robert A. DeVries, Mitchell G. Dibbs, Robert L. McGee, Edward O. Shaffer, II, Michael J. Radler, Richard P. DeCaire