Defect Analysis Or Recognition Patents (Class 700/110)
  • Patent number: 10430269
    Abstract: Methods and systems for performing root cause analysis for an assembly line including a plurality of nodes using path tracking. One method includes receiving tracking data identifying a subset of the plurality of nodes processing a product produced by the assembly line and receiving approval data associated with the assembly line identifying whether each product produced by the assembly line fails an approval metric. The method also includes enumerating a plurality of paths through the assembly line based on the tracking data and determining a failure rate for each of the plurality of paths based on the approval data. In addition, the method includes identifying a malfunctioning path included in the plurality of paths based on the failure rate for each of the plurality of paths, identifying a malfunctioning node based on the malfunctioning path, and performing an automatic action to address the malfunctioning node.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: October 1, 2019
    Assignee: Robert Bosch GmbH
    Inventors: Jeffrey Keating Thompson, Michael Frankmann, Goktug Tankut Cinar, Carlos Eduardo Cunha, Prasanth Lade
  • Patent number: 10423075
    Abstract: The present invention relates to methods and systems for designing gauge patterns that are extremely sensitive to parameter variation, and thus robust against random and repetitive measurement errors in calibration of a lithographic process utilized to image a target design having a plurality of features. The method may include identifying most sensitive line width/pitch combination with optimal assist feature placement which leads to most sensitive CD (or other lithography response parameter) changes against lithography process parameter variations, such as wavefront aberration parameter variation. The method may also include designing gauges which have more than one test patterns, such that a combined response of the gauge can be tailored to generate a certain response to wavefront-related or other lithographic process parameters. The sensitivity against parameter variation leads to robust performance against random measurement error and/or any other measurement error.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: September 24, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Hanying Feng, Yu Cao, Jun Ye, Youping Zhang
  • Patent number: 10416658
    Abstract: An operation management system according to the present invention stores manufacture facility information in which identification information capable of uniquely specifying a manufacture facility is associated with position information of the manufacture facility in a manufacture facility information storage unit, a management device acquires the manufacture facility information from the manufacture facility information storage unit, arranges the manufacture facility on an arrangement map based on the manufacture facility information, and conducts communication setting for acquiring operation information, and the management device acquires the operation information of the manufacture facility via communication based on the communication setting, and displays the acquired operation information on the arrangement map.
    Type: Grant
    Filed: June 17, 2016
    Date of Patent: September 17, 2019
    Assignee: FANUC CORPORATION
    Inventor: Arito Hashimoto
  • Patent number: 10406754
    Abstract: Apparatuses, systems and methods provide at least a controller for a print server which executes at least one additive manufacturing print process on an additive manufacturing printer. The disclosed embodiments may include a plurality of sensors capable of monitoring at least one of a build perimeter, a build height, and a build volume for an additive print build resultant from the additive manufacturing print; at least one processor associated with the print server and capable of receiving sensor data regarding the monitoring from the plurality of sensors, and comprising non-transitory computing code for applying to the sensor data a print process plan indicative of the additive print build; a comparator embedded in the non-transitory computing code for assessing a lack of compliance by the additive print build to the print process plan; and at least one modified output of the additive manufacturing print suitable to revise the compliance of the additive print build to the print process plan.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: September 10, 2019
    Assignee: JABIL INC.
    Inventors: William MacNeish, Erik Gjovik
  • Patent number: 10394231
    Abstract: A plant-monitoring system includes: at least three detection elements, the detection elements being at least one type of detection element for monitoring a subject being monitored; a detection network configured by disposing the at least three detection elements in a plant; a storage unit that receives detection data from each of the detection elements to record the detection data as recorded data; and a processing computing unit. The processing computing unit receives the detection data from each of the detection elements, determines presence or absence of a fault by comparing the detection data with the recorded data, and in a case where occurrence of a fault is recognized, identifies a place of occurrence of the fault based on the detection data, and transmits the result of the place of occurrence of the fault to a predetermined incident response team.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: August 27, 2019
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Wataru Matsubara, Naohiko Ishibashi, Ryo Kamito, Susumu Okino, Takeo Shinoda
  • Patent number: 10386818
    Abstract: Additive Manufacturing Quality Management (AMQM) systems and methods are provided, which enhance quality control across Additive Manufacturing (AM) supply chains from which AM components are obtained. In various embodiments, the AMQM system includes an AM machine utilized to produce AM components in accordance with AM design data. A first sensor is coupled to the AM machine and, during fabrication of AM components by the AM machine, captures sensor readings pertaining to the AM fabrication process. When executed by a processor, computer-executable code causes the AMQM system to: (i) compile part-specific sensor profiles from sensor readings captured by the first sensor during fabrication of the AM components, and (ii) generate user notifications indicating whether remedial action should be performed for any of the AM components based, at least in part, on conformance of the part-specific sensor profiles with a baseline sensor profile corresponding to the AM design data.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: August 20, 2019
    Assignee: HONEYWELL INTERNATIONAL INC.
    Inventors: Donald G Godfrey, Brian G Baughman, Soeren Wiener, Niranjan Kalyandurg
  • Patent number: 10377092
    Abstract: Systems and methods are provided for verifying the placement of tows by a robot. One embodiment includes a robot that includes an end effector that lays up tows, actuators that reposition the end effector, a memory storing a Numerical Control (NC) program, and a robot controller that directs the actuators to reposition the end effector based on the NC program, and instructs the end effector to lay up tows based on the NC program. The system also includes a sensor system comprising an imaging device that acquires images of the tows as the tows are laid-up, a measuring device that generates input as tows are laid-up by the end effector, and a sensor controller that receives images from the imaging device and the input from the measuring device, and updates stored data to correlate the images with instructions in the NC program, based on the input.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: August 13, 2019
    Assignee: The Boeing Company
    Inventors: Anthony W Baker, Steven A Dorris, Christopher P Bellavia, Hugh L Taylor, Luke C Ingram, Kenny P Bowers
  • Patent number: 10372114
    Abstract: A process control technique uses production data from multiple manufacturing tools and multiple inspection or metrology tools. Total measurement uncertainty (TMU) can be calculated on the production data, which can include measurements of one or more devices manufactured using the manufacturing tools. Manufacturing steps can be ranked or otherwise compared by TMU. All production modes and recipes can be continually monitored using production data.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: August 6, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Karen Biagini, Bryant Stanford Mantiply, Ravichander Jayantha Rao, Gary Taan
  • Patent number: 10375095
    Abstract: A framework is provided for modeling the activity surrounding user credentials and/or machine level activity on a computer network using computer event logs by viewing the logs attributed to each user as a multivariate data stream. The methodology performs well in detecting compromised user credentials at a very low false positive rate. Such a methodology may detect both users of compromised credentials by external actors and otherwise authorized users who have begun engaging in malicious activity.
    Type: Grant
    Filed: November 18, 2016
    Date of Patent: August 6, 2019
    Assignees: Triad National Security, LLC, IP2IPO Innovations Limited
    Inventors: Melissa J. M. Turcotte, Nicholas A. Heard, Alexander D. Kent
  • Patent number: 10372473
    Abstract: Mechanisms are provided for virtualizing physical sensors and providing sensor data to a requestor using the virtualized physical sensors. The mechanisms obtain sensor data from a plurality of physical sensors and storing the sensor data in a virtual sensor storage system of the data processing system in at least one standardized format. A request from a requestor for a first type of sensor data is received which does not specify a particular physical sensor. A portion of the sensor data stored in the virtual sensor storage system is retrieved in response to receiving the request, the portion of sensor data corresponding to the type of sensor data requested in the request from the requestor. The retrieved portion of the sensor data is returned to the requestor in a format corresponding to a physical sensor configured to provide the requested type of sensor data.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: August 6, 2019
    Assignee: International Business Machines Corporation
    Inventors: Marion L. Blount, Metin Feridun, Suzanne K. McIntosh, Iqbal I. Mohomed, Michael E. Nidd, Axel Tanner, Bo Yang
  • Patent number: 10357915
    Abstract: A method of analyzing preforms for potential bursting during forming and filling by injecting an incompressible liquid to shape the successive heating preforms into containers and fill the containers. The method defines at least one stress parameter correlated to the internal stress of the thermoplastic material of the preform and defines a range of acceptable values for the stress parameter. The method includes analyzing each successive initial preform and each successive heated preform, determining a value of the stress parameter, comparing the determined value to a range of acceptable values, and emitting an output signal when the determined value is outside the acceptable range of values.
    Type: Grant
    Filed: June 18, 2015
    Date of Patent: July 23, 2019
    Inventors: Mikael Derrien, Pascal Haboury
  • Patent number: 10348760
    Abstract: Systems and methods are disclosed for providing distributed denial-of-service (DDoS) mitigation service. The systems and methods may receive a request to access a web server from a user host, generate an integrated user challenge page including a user challenge test and a web page image of the web server, and transmits the integrated user challenge page to the user host. The systems and methods may further receive an answer to the user challenge test from the user host, determine whether the answer to the user challenge test is correct or not. When the answer to the user challenge test is correct, the systems and methods may establish a connection between the user host and the web server.
    Type: Grant
    Filed: October 22, 2012
    Date of Patent: July 9, 2019
    Assignee: VERISIGN, INC.
    Inventors: Mark Teodoro, Sean Leach
  • Patent number: 10331510
    Abstract: In order to reduce computation time and cost involved with detecting and diagnosing a fault in a system, simplified representations of components of the system are used to estimate valid intervals for state variables at the components. Generic failure rules are configured to compare the estimated valid intervals to related intervals for the same state variables, from either observations or propagations, for overlap. Failure output vectors are generated based on the comparison, and the failure output vectors are compared to diagnostic matrices to determine a source of the fault.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: June 25, 2019
    Assignee: SIEMENS CORPORATION
    Inventors: Gerhard Zimmermann, Yan Lu, George Lo
  • Patent number: 10295991
    Abstract: A substrate processing apparatus includes a data collection controller and an operation part. The data collection controller is configured to hold monitoring item list information and component management information. Each of the monitoring item list information and the component management information holds; monitoring item information indicative of a monitoring item for monitoring a maintenance component selected as a monitoring target; setting information for setting a threshold value of the maintenance component; monitoring data of the maintenance component; and monitoring information including a number of times of resetting by which the maintenance component is initialized, wherein the component management information is configured to hold the monitoring information for each unit including the maintenance component according to the monitoring item. The operation part provides the data collection controller with the monitoring data from device data collected from the unit.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: May 21, 2019
    Assignee: KOKUSAI ELECTRIC CORPORATION
    Inventor: Akihiko Yoneda
  • Patent number: 10291638
    Abstract: A cloud security system and method implements cloud activity threat detection using analysis of cloud usage user behavior. In particular, the cloud security system and method implements threat detection for users, cloud service providers, or tenants (enterprises) of the cloud security system who are new or unknown to the cloud security system and therefore lacking sufficient cloud activity data to generate an accurate behavior model for effective threat detection. In accordance with embodiments of the present invention, the cloud security system and method performs user behavior analysis to generate generalized user behavior models for user groups, where each user group includes users with similar cloud usage behavior. The user behavior models of the user groups are assigned to users with sparse cloud activity data. In this manner, the cloud security system and method of the present invention ensures effective threat detection by using accurate and reliable user behavior models.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: May 14, 2019
    Assignee: Skyhigh Networks, LLC
    Inventors: Sandeep Chandana, Santosh Raghuram Kumar, Sekhar Sarukkai, Satyanarayana Vummidi, Madhavi Kavathekar, Vinay Gupta
  • Patent number: 10266860
    Abstract: An apparatus that produces a sugar liquid by a method including hydrolyzing cellulose includes a hydrolysis tank to which a recovered enzyme feed pipe and a fresh enzyme feed pipe are connected; a device for solid-liquid separation of a hydrolysate; a sugar liquid-retaining tank having a water supply pipe that washes an ultrafiltration membrane and/or removes recovered enzyme retained in a circulation pipe; and an ultrafiltration membrane device that separates enzyme and a sugar liquid.
    Type: Grant
    Filed: March 9, 2017
    Date of Patent: April 23, 2019
    Assignee: Toray Industries, Inc.
    Inventors: Hiroyuki Kurihara, Atsushi Minamino, Yuki Yamamoto, Katsushige Yamada
  • Patent number: 10262272
    Abstract: Technologies are described herein for active machine learning. An active machine learning method can include initiating active machine learning through an active machine learning system configured to train an auxiliary machine learning model to produce at least one new labeled observation, refining a capacity of a target machine learning model based on the active machine learning, and retraining the auxiliary machine learning model with the at least one new labeled observation subsequent to refining the capacity of the target machine learning model. Additionally, the target machine learning model is a limited-capacity machine learning model according to the description provided herein.
    Type: Grant
    Filed: December 7, 2014
    Date of Patent: April 16, 2019
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: David Maxwell Chickering, Christopher A. Meek, Patrice Y. Simard, Rishabh Krishnan Iyer
  • Patent number: 10262027
    Abstract: In a method, system, and computer-readable medium having instructions for executing a query in a database system, a query request is received with a query predicate to filter data returned in response to the query request and the query predicate has a formula, the query request is transformed to a transformed query request by preprocessing the formula in the query predicate, and the query request is optimized using the transformed query request.
    Type: Grant
    Filed: July 17, 2015
    Date of Patent: April 16, 2019
    Assignee: salesforce.com, inc.
    Inventors: Jesse Collins, Jaikumar Bathija
  • Patent number: 10262406
    Abstract: A simulator includes a measurement unit that performs image measurement of preliminarily obtained image data corresponding to processing performed using a visual sensor, an execution unit that executes a control operation for generating a control instruction directed to a processing device based on a measurement result obtained by the measurement unit and for generating a read instruction directed to the measurement unit for reading the image data, a storage unit that stores the image data read in response to the read instruction in a manner associated with information indicating a position or a displacement of a carrier serving as a reference for the image measurement performed in response to the read instruction, and a reproduction unit that reproduces a behavior of the created system based on time-series data for the control operation output from the execution unit and the information associated with the image data stored in the storage unit.
    Type: Grant
    Filed: November 3, 2016
    Date of Patent: April 16, 2019
    Assignee: OMRON Corporation
    Inventors: Yasunori Sakaguchi, Haruna Shimakawa, Katsushige Ohnuki, Ryo Ichimura
  • Patent number: 10223492
    Abstract: The process for design based assessment includes the following steps. First, the process defines multiple patterns of interest (POIs) utilizing design data of a device and then generates a design based classification database. Further, the process receives one or more inspection results. Then, the process compares the inspection results to each of the plurality of POIs in order to identify occurrences of the POIs in the inspection results. In turn, the process determines yield impact of each POI utilizing process yield data and monitors a frequency of occurrence of each of the POIs and the criticality of the POIs in order to identify process excursions of the device. Finally, the process determines a device risk level by calculating a normalized polygon frequency for the device utilizing a frequency of occurrence for each of the critical polygons and a criticality for each of the critical polygons.
    Type: Grant
    Filed: February 12, 2014
    Date of Patent: March 5, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Allen Park, Youseung Jin, Sungchan Cho, Barry Saville
  • Patent number: 10157072
    Abstract: A method for estimating power consumption by a target host involves estimating a per-workload in-scenario utilization function of time for each workload running on said host in said what-if scenario so as to yield per-workload in-scenario utilization functions of time. The utilization functions are aggregated to yield a target host utilization function of time. The target host utilization function of time is converted to a host power-consumption function of time.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: December 18, 2018
    Assignee: Hewlett Packard Enterprise Development LP
    Inventors: Phil Prasek, Alex Nazarov, Swayambhuba Kar
  • Patent number: 10152654
    Abstract: Methods and systems for creating an image-based measurement model based only on measured, image-based training data are presented. The trained, image-based measurement model is then used to calculate values of one or more parameters of interest directly from measured image data collected from other wafers. The image-based measurement models receive image data directly as input and provide values of parameters of interest as output. In some embodiments, the image-based measurement model enables the direct measurement of overlay error. In some embodiments, overlay error is determined from images of on-device structures. In some other embodiments, overlay error is determined from images of specialized target structures. In some embodiments, image data from multiple targets, image data collected by multiple metrologies, or both, is used for model building, training, and measurement. In some embodiments, an optimization algorithm automates the image-based measurement model building and training process.
    Type: Grant
    Filed: February 17, 2015
    Date of Patent: December 11, 2018
    Assignee: KLA-Tencor Corporation
    Inventor: Stilian Ivanov Pandev
  • Patent number: 10144183
    Abstract: Systems and methods are provided for verifying the placement of tows by a robot. One embodiment includes a robot that includes an end effector that lays up tows, actuators that reposition the end effector, a memory storing a Numerical Control (NC) program, and a robot controller that directs the actuators to reposition the end effector based on the NC program, and instructs the end effector to lay up tows based on the NC program. The system also includes a sensor system comprising an imaging device that acquires images of the tows as the tows are laid-up, a measuring device that generates input as tows are laid-up by the end effector, and a sensor controller that receives images from the imaging device and the input from the measuring device, and updates stored data to correlate the images with instructions in the NC program, based on the input.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: December 4, 2018
    Assignee: The Boeing Company
    Inventors: Anthony W Baker, Steven A Dorris, Christopher P Bellavia, Hugh L Taylor, Luke C Ingram, Kenny P Bowers
  • Patent number: 10148675
    Abstract: A computing resource service provider may provide customers with a block-level forensics service. Volume images of computing resource associated with customer may be generated and provided to the block-level forensics service. The block-level forensics service or component thereof may generate a volume based at least in part on the volume image and may perform forensics analysis of the volume. A result of the forensic analysis may be provided to the customer.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: December 4, 2018
    Assignee: Amazon Technologies, Inc.
    Inventors: Eric Jason Brandwine, Alexander Robin Gordon Lucas, Robert Eric Fitzgerald
  • Patent number: 10148489
    Abstract: A service impact event analyzer is used to evaluate service assurance risk in cloud SDN networks. Using data fusion, an alarm subset dataset is generated from a raw trap dataset. Service impact events are identified in the subset dataset. The service impact events are categorized into service impacted event categories, and a model is created for associating the event categories with process function classes. Time durations of the service impact events are computed using correlated secondary alarms from the alarm subset dataset. The service assurance risk is evaluated using the model and the time duration.
    Type: Grant
    Filed: September 1, 2015
    Date of Patent: December 4, 2018
    Assignee: AT&T INTELLECTUAL PROPERTY I, L.P.
    Inventors: Tsong-Ho Wu, Wen-Jui Li, Shyhyann Lee, Li-Chuan Sun
  • Patent number: 10135865
    Abstract: Embodiments can identify requests that may be tied to a DDOS attack. For example, the primary identifiers (e.g., a source address) of requests for a network resource (e.g., an entire website or a particular element of the website) can be tracked. In one embodiment, a statistical analysis of how often a particular source address (or other primary identifier) normally makes a request can be used to identify source addresses that make substantially more requests. A normal amount can correspond to an average number of request that a source address makes. According to some embodiments, a system can use statistical analysis methods on various request data in web server logs to identify potential attacks and send data concerned potential attacks to an HBA system for further analysis.
    Type: Grant
    Filed: February 19, 2018
    Date of Patent: November 20, 2018
    Assignee: Level 3 Communications, LLC
    Inventors: Robert Smith, Shawn Marck
  • Patent number: 10108214
    Abstract: A method of reducing power consumption by components of an automated plant during a production stoppage. Control apparatus transmits stoppage time data to the plant components via a data network to initiate the stoppage. Each automated plant component automatically changes to a respective given target state at a respective given stoppage time if the stoppage time data received by that plant component includes that stoppage time for that target state and if at least one other plant component is in a respective operating state expected for this target state. The invention sets a coordinated combination of consumption-minimized plant-component states. The control apparatus transmits respective component-specific stoppage times to the plant components in the stoppage time data, said stoppage time being different from at least one stoppage time transmitted to another plant component. As a result, the component states can be matched to one another.
    Type: Grant
    Filed: November 5, 2015
    Date of Patent: October 23, 2018
    Assignee: Siemens Aktiengesellschaft
    Inventors: Matthias Himmler, Jörn Peschke, Patrick Volkmann
  • Patent number: 10102615
    Abstract: Methods and system for detecting hotspots in semiconductor wafer are provided. At least one semiconductor wafer is inspected to detect a plurality of hotspots of each die in the semiconductor wafer, wherein each of the hotspots has defect coordinates in a layout of the die. The hotspots of the dies are stacked in the layout according to the defect coordinates of the hotspots. A common pattern is obtained according to the stacked hotspots corresponding to a location with specific coordinates in the layout. It is determined whether the common pattern is a known pattern having an individual identification (ID) code. A new ID code is assigned to the common pattern when the common pattern is an unknown pattern.
    Type: Grant
    Filed: December 14, 2016
    Date of Patent: October 16, 2018
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
    Inventors: Wen-Hao Cheng, Peng-Ren Chen, Chih-Chiang Tu
  • Patent number: 10096527
    Abstract: A system and method for performing corrective processing of a workpiece is described. The system and method includes receiving a first set of parametric data from a first source that diagnostically relates to at least a first portion of a microelectronic workpiece, and receiving a second set of parametric data from a second source different than the first source that diagnostically relates to at least a second portion of the microelectronic workpiece. Thereafter, a corrective process is generated, and a target region of the microelectronic workpiece is processed by applying the corrective process to the target region using a combination of the first set of parametric data and the second set of parametric data.
    Type: Grant
    Filed: August 19, 2016
    Date of Patent: October 9, 2018
    Assignee: TEL Epion Inc.
    Inventors: Joshua LaRose, Brian D. Pfeifer, Vincent Lagana-Gizzo, Noel Russell
  • Patent number: 10070532
    Abstract: Apparatus and methods are provided which enable a capacity to remotely enable research, development, and production tasks to be done at a point of use (POU) as well as permitting some design tasks to be done remotely with manufacturing employing, for example, additive manufacturing (AM), for printed circuit boards (PCB) as well as other electrical items. In particular, some embodiments are directed towards facilitating POU on-site manufacturing capacity with a remote or distributed requirements/design process.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: September 4, 2018
    Assignee: The United States of America, as represented by the Secretary of the Navy
    Inventor: Stephen J. Vetter
  • Patent number: 10048753
    Abstract: A number of illustrative variations may include a method of relative localization via the use of simultaneous location and mapping gear sets.
    Type: Grant
    Filed: October 4, 2017
    Date of Patent: August 14, 2018
    Inventor: Robert C. Brooks
  • Patent number: 10037238
    Abstract: An information handling system includes a remediation sever to receive an indication of an error condition at a data processing device via an Internet connection, the indication including an error code. The information handling system also includes a data storage device coupled to the remediation server, the data storage device to store a remediation database including error resolution procedures associated with error conditions. Each error condition is uniquely identified by an error code. An error code includes a concatenation of an alphanumeric string identifying a software application associated with the error condition, an alphanumeric string identifying an action to resolve the error condition, and an alphanumeric string identifying a software service corresponding to resolution of the error condition.
    Type: Grant
    Filed: February 10, 2016
    Date of Patent: July 31, 2018
    Assignee: DELL PRODUCTS, L.P.
    Inventor: Sathish Kumar Bikumala
  • Patent number: 10037023
    Abstract: Devices, systems, and methods for dynamic repair of bypassed vehicles are disclosed. Information regarding an abnormality (for example, an incorrectly installed joint) occurring in a vehicle being assembled on an assembly line can be captured and recorded in a database. Following a bypass command, the vehicle can be flagged and released to continue down the assembly line to be repaired at a later time. When a user is ready to repair the vehicle, repair instructions specific to the abnormality can be retrieved from a database and presented to the user, and the repair procedure can be monitored to ensure that the abnormality has been repaired correctly. The vehicle can be unflagged only if all abnormalities in the vehicle have been repaired. The vehicle can be prevented from exiting the last station in the assembly line if it remains flagged.
    Type: Grant
    Filed: April 8, 2015
    Date of Patent: July 31, 2018
    Assignee: Toyota Motor Engineering & Manufacturing North America, Inc.
    Inventor: Leontin Drasovean
  • Patent number: 10030965
    Abstract: Methods and systems for monitoring parameters characterizing a set of hot spot structures fabricated at different locations on a semiconductor wafer are presented herein. The hot spot structures are device structures that exhibit sensitivity to process variations and give rise to limitations on permissible process variations that must be enforced to prevent device failures and low yield. A trained hot spot measurement model is employed to receive measurement data generated by one or more metrology systems at one or more metrology targets and directly determine values of one or more hot spot parameters. The hot spot measurement model is trained to establish a functional relationship between one or more characteristics of a hot spot structure under consideration and corresponding measurement data associated with measurements of at least one metrology target on the same wafer. A fabrication process parameter is adjusted based on the value of a measured hot spot parameter.
    Type: Grant
    Filed: May 6, 2016
    Date of Patent: July 24, 2018
    Assignee: KLA-Tencor Corporation
    Inventors: Stilian Ivanov Pandev, Sanjay Kapasi, Mark D. Smith, Ady Levy
  • Patent number: 9969591
    Abstract: There is provided a printing apparatus for conveying an envelope set in a paper feed unit and performing printing on the envelope and a method of controlling the printing apparatus. The printing apparatus determines whether or not attaching of an attachment to the paper feed unit is necessary in accordance with the type of envelope to be used, and, if it is determined that attaching of the attachment is necessary, the printing apparatus displays a message prompting attaching of the attachment.
    Type: Grant
    Filed: June 17, 2015
    Date of Patent: May 15, 2018
    Assignee: Canon Kabushiki Kaisha
    Inventor: Shinichi Kanematsu
  • Patent number: 9946752
    Abstract: Techniques for implementing a low-latency query processor accommodating an arbitrary number of data rows with no column indexing. In an aspect, data is stored across a plurality of component databases, with no requirement to strictly allocate data to partitions based on row keys. A histogram table is provided to map object relationships identified in a user query to the component databases where relevant data is stored. A server processing the user query communicates with component databases via an intermediary module. The intermediary module may include intermediary nodes dynamically assigned to connect to the component databases to retrieve and process the queried data.
    Type: Grant
    Filed: April 27, 2015
    Date of Patent: April 17, 2018
    Assignee: MICROSOFT TECHNOLOGY LICENSING, LLC
    Inventors: Neil E. Lydick, Vijaykumar K. Aski
  • Patent number: 9927798
    Abstract: Integration of semiconductor tool maintenance operations on mobile devices to allow technicians to more accurately perform semiconductor tool maintenance and to allow more accurate analysis of data to improve maintenance procedures to be more repeatable, consistent, and efficient. Remote control of maintenance operations for the semiconductor tool via a portable electronic device decreases the time required to service semiconductor tools and thus increase throughput.
    Type: Grant
    Filed: October 6, 2015
    Date of Patent: March 27, 2018
    Assignee: LAM RESEARCH CORPORATION
    Inventors: Roger Patrick, Chung Ho Huang, Simon Gosselin, Vincent Wong, Ronald Ramnarine, Neal K. Newton, Mukesh Shah, Kerwin Hoversten, Robert Ahrens, Marco Mora
  • Patent number: 9904707
    Abstract: In one embodiment, a method includes receiving a request to execute a database statement in satisfaction of a time constraint. The method further includes determining a pattern of the database statement. Additionally, the method includes comparing the pattern to pattern metadata associated with cached samples of the distributed database. Also, the method includes, responsive to a determination that the comparing has resulted in one or more matches, selecting a target sample and causing the database statement to be executed on the target sample. The method further includes, responsive to a determination that the target sample resolves the database statement in satisfaction of the time constraint, returning a resulting dataset to a requestor. Moreover, the method includes, responsive to a determination that the target sample does not resolve the database statement in satisfaction of the time constraint, causing a new real-time sampling of the distributed database to be executed.
    Type: Grant
    Filed: March 30, 2015
    Date of Patent: February 27, 2018
    Assignee: Quest Software Inc.
    Inventors: Shree A. Dandekar, Mark William Davis
  • Patent number: 9900330
    Abstract: The disclosed computer-implemented method for identifying potentially risky data users within organizations may include (1) monitoring computing activity of a member of an organization with respect to the member's access to data related to the organization, (2) generating, based at least in part on the member's computing activity, a baseline representation of the member's access to the data, (3) detecting at least one attempt by the member to access at least a portion of the data, (4) determining that the member's attempt to access the portion of data represents an anomaly that is suspiciously inconsistent with the baseline representation, and then in response to determining that the member's attempt to access the portion of data represents the anomaly, (5) classifying the member as a potential risk to the security of the data. Various other methods, systems, and computer-readable media are also disclosed.
    Type: Grant
    Filed: November 13, 2015
    Date of Patent: February 20, 2018
    Assignee: Veritas Technologies LLC
    Inventors: Shailesh Dargude, Anand Athavale, Harshit Shah, Ketan Shah
  • Patent number: 9886012
    Abstract: A cloud human-machine interface (HMI) generation system converts an original HMI project to a web-compatible version of the HMI capable of storage and execution on a cloud platform or web server. The cloud HMI generation system parses HMI project files exported from the original HMI to identify graphical objects and their attributes, animations, data tags linked to the HMI, and other characteristics of the HMI. The system then generates scripts or function calls that reproduce the identified graphical objects and their associated animations, yielding a web-based HMI that emulates the original HMI project. The resulting cloud HMI can retrieve copies of the original industrial system data maintained on cloud-based storage, allowing the cloud HMI to display near real-time system data on a client device from any location.
    Type: Grant
    Filed: September 5, 2014
    Date of Patent: February 6, 2018
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Francisco P. Maturana, Juan L. Asenjo
  • Patent number: 9864961
    Abstract: A method and system for capturing, organizing, storing, and analyzing manufacturing process information, with storage and performance characteristics suitable for use in resource-constrained embedded devices. Process information is organized into extensible Channels, each of which captures information stored as extensible Events, each of which may include Metric, Category Value, Annotation, and System Fields. Shared Boundaries between Channels make it easier to organize, store, interrelate, analyze, and explore information. Channel Boundary Relationships (e.g., Coupling, Fragmenting, Projecting, and Aggregating) create shared Boundaries; and can create, or be combined to create, sets of Channels that share Boundaries (referred to as a Slice Set).
    Type: Grant
    Filed: May 12, 2014
    Date of Patent: January 9, 2018
    Assignee: Vorne Industries, Inc.
    Inventors: Ramon A. Vorne, Phillip Howell, Benjamin D. Saks, Chad E. Barth
  • Patent number: 9858138
    Abstract: A failure factor identification supporting apparatus includes a failure time point information obtaining unit (21) that obtains information regarding a failure occurrence time point at which a failure occurs in a field device (V1) located in a field; an event information obtaining unit (22) that obtains event information regarding, among one or more events that occur in the field, an event that occurs within a certain time range prior to the failure occurrence time point, and an event occurrence time point at which the event occurs; and a failure factor candidate output unit (23) that outputs the event information, obtained by the event information obtaining unit (22), as a failure factor candidate.
    Type: Grant
    Filed: March 16, 2016
    Date of Patent: January 2, 2018
    Assignee: AZBIL CORPORATION
    Inventors: Masato Tanaka, Fumiaki Yamasaki, Shinichi Koyama, Motomi Kohata
  • Patent number: 9842309
    Abstract: Disclosed are various embodiments for a storage unit defect analyzer that analyzes fulfillment center storage units that are designated as defective. A subset of defective storage units is identified by accessing defect data. Location data is then accessed, where the location data indicates a plurality of physical locations associated with the subset of defective storage units. A defect density map is generated according to the plurality of physical locations, the defect density map expressing a concentration of the subset of defective storage units within a fulfillment center. The defect density map is encoded for display in a user interface.
    Type: Grant
    Filed: September 25, 2013
    Date of Patent: December 12, 2017
    Assignee: Amazon Technologies, Inc.
    Inventors: Shuchi Gupta, Piyush Maheshwari
  • Patent number: 9821518
    Abstract: A platform assembly has a rigid support with an array of threaded passages extending therethrough; threaded posts are engaged in the threaded passages and extend above the rigid support by a distance adjusted by rotation of each threaded post in its associated threaded passage. Manually-adjusted dog point screws can provide the threaded posts, and self-locking nuts can provide the threaded passages. A platform of smooth, slightly flexible material extends over the threaded posts and has an array of mounting elements that magnetically attach to the threaded posts to hold the platform tightly against the end of each post. Adjusting the positions of the threaded posts serves to adjust the precise position and flatness of the platform surface relative to the rigid support, and with respect to a print head of a 3D printer in which the rigid support is incorporated.
    Type: Grant
    Filed: August 13, 2015
    Date of Patent: November 21, 2017
    Inventor: Daniel A. Bloom
  • Patent number: 9798853
    Abstract: An integrated device product having objects positioned in accordance with in-situ constraints. Said in-situ constraints comprise predetermined constraints and their local modifications. These local modifications, individually formulated for a specific pair of objects, account for on-the-spot conditions that influence the optimal positioning of the objects. The present invention improves the yield of integrated devices by adding local process modification distances to the predetermined constraints around processing hotspots thus adding extra safety margin to the device yield.
    Type: Grant
    Filed: August 30, 2016
    Date of Patent: October 24, 2017
    Assignee: IYM Technologies LLC
    Inventor: Qi-De Qian
  • Patent number: 9791849
    Abstract: A process for detecting foreign particle defects and scratch defects on semiconductor products including detecting foreign particle and scratch defects on the semiconductor products; placing the semiconductor products in a first wafer carrier and docking to a first load port of a semiconductor processing tool; opening a door of the first wafer carrier; transferring the semiconductor products from the first wafer carrier through the first load port to and through an interior of the semiconductor processing tool to a second load port of the semiconductor processing tool; transferring the semiconductor products from the second load port to a second wafer carrier; closing a door of the second wafer carrier and undocking from the second load port; and detecting foreign particle and scratch defects on the semiconductor products and comparing to the foreign particle defects on the semiconductor products prior to placing the semiconductor products in the first wafer carrier.
    Type: Grant
    Filed: May 26, 2015
    Date of Patent: October 17, 2017
    Assignee: GlobalFoundries, Inc.
    Inventors: David F. Cutilli, Matthew J. Hartnett, Keith A. Robishaw, Glenn M. Stefanski
  • Patent number: 9778207
    Abstract: Methods and systems for integrated multi-pass reticle inspection are provided. One method for inspecting a reticle includes acquiring at least first, second, and third images for the reticle. The first image is a substantially high resolution image of light transmitted by the reticle. The second image is a substantially high resolution image of light reflected from the reticle. The third image is an image of light transmitted by the reticle that is acquired with a substantially low numerical aperture. The method also includes detecting defects on the reticle using at least the first, second, and third images for the reticle in combination.
    Type: Grant
    Filed: May 14, 2014
    Date of Patent: October 3, 2017
    Assignee: KLA-Tencor Corp.
    Inventors: Weston L. Sousa, Yalin Xiong, Rui-Fang Shi
  • Patent number: 9778635
    Abstract: Executing an additive manufacturing job by a plurality of additive manufacturing printers, including: detecting service requirements for the additive manufacturing job; detecting service capabilities for the plurality of additive manufacturing printers; identifying, for each of a plurality of segments of the additive manufacturing job, one or more additive manufacturing printers capable of servicing the segment of the additive manufacturing job in dependence upon the service requirements for the additive manufacturing job and the service capabilities for the plurality of additive manufacturing printers; and assigning each segment of the additive manufacturing job to one of the additive manufacturing printers identified as being capable of servicing the segment of the additive manufacturing job, wherein two or more of the additive manufacturing printers are each assigned at least one distinct segment of the additive manufacturing job.
    Type: Grant
    Filed: January 20, 2015
    Date of Patent: October 3, 2017
    Assignee: Lenovo Enterprise Solutions (Singapore) Pte. Ltd.
    Inventors: Gary D. Cudak, Lydia M. Do, Christopher J. Hardee, Adam Roberts
  • Patent number: 9772295
    Abstract: A laying head for a fibre placement device, in particular for fibre placement according to the AFP method, includes a placing roller which is permeable to laser light, at least in part, a laser light feed unit which is arranged in an inner space of the placing roller and a sensor which is designed and arranged to receive laser light reflected from a component on which the placing roller places a fibre band.
    Type: Grant
    Filed: October 28, 2015
    Date of Patent: September 26, 2017
    Assignee: Airbus Defence and Space GmbH
    Inventor: Franz Engel
  • Patent number: 9733627
    Abstract: A system and method for performing management and diagnostic functions in a cloud computing system for advanced process control (APC). A cloud based APC management computer retrieves operating process data from an APC control computer and performs an iterative step test on the APC system. The iterative step test modifies at least one test parameter of the operating process data and identifies changes to a set of remaining parameters of the operating process data resulting from modification of the test parameter. The APC management computer determines at least one process variable from the iterative step test and generates at least one process model based on the process variable. The APC management computer transmits the process model to the APC control computer.
    Type: Grant
    Filed: August 13, 2014
    Date of Patent: August 15, 2017
    Assignee: Honeywell International Inc.
    Inventors: Gobinath Pandurangan, Kishen Manjunath, Sanjay Kantilal Dave