Defect Analysis Or Recognition Patents (Class 700/110)
  • Patent number: 11689549
    Abstract: Balancing the observed signals used to train network intrusion detection models allows for a more accurate allocation of computing resources to defend the network from malicious parties. The models are trained against live data defined within a rolling window and historic data to detect user-defined features in the data. Automated attacks ensure that various kinds of attacks are always present in the rolling training window. The set of models are constantly trained to determine which model to place into production, to alert analysts of intrusions, and/or to automatically deploy countermeasures. The models are continually updated as the features are redefined and as the data in the rolling window changes, and the content of the rolling window is balanced to provide sufficient data of each observed type by which to train the models. When balancing the dataset, low-population signals are overlaid onto high-population signals to balance their relative numbers.
    Type: Grant
    Filed: July 17, 2019
    Date of Patent: June 27, 2023
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: Pengcheng Luo, Reeves Hoppe Briggs, Naveed Ahmad
  • Patent number: 11688052
    Abstract: Methods and systems for providing weak pattern (or hotspot) detection and quantification are disclosed. A weak pattern detection and quantification system may include a wafer inspection tool configured to inspect a wafer and detect defects present on the wafer. The system may also include at least one processor in communication with the wafer inspection tool. The at least one processor may be configured to: perform pattern grouping on the detected defects based on design of the wafer; identify regions of interest based on the pattern grouping; identify weak patterns contained in the identified regions of interest, the weak patterns being patterns deviating from the design by an amount greater than a threshold; validate the weak patterns identified; and report the validated weak patterns or facilitate revision of the design of the wafer based on the validated weak patterns.
    Type: Grant
    Filed: August 10, 2020
    Date of Patent: June 27, 2023
    Assignee: KLA Corporation
    Inventors: Naoshin Haque, Allen Park, Ajay Gupta
  • Patent number: 11684987
    Abstract: A wire electric discharge machining apparatus is provided. The wire electric discharge machining apparatus includes an upper support that supports an upper guide unit that guides a wire electrode on an upper side. The upper support includes an arm having a lower end provided with the upper guide unit, an axis drive portion moving the arm in at least one axial direction and made of a material that has a larger coefficient of linear expansion than ceramics, and an adjustment block connecting the arm and the axis drive portion and made of ceramics. The adjustment block is fixed at a position where a displacement of the upper guide unit caused by expansion and contraction of the upper support is suppressed by a bimetal effect occurring on a fastening surface of the axis drive portion and the adjustment block.
    Type: Grant
    Filed: June 1, 2021
    Date of Patent: June 27, 2023
    Assignee: Sodick Co., Ltd.
    Inventors: Masashi Sakaguchi, Akio Hosaka
  • Patent number: 11675345
    Abstract: Data is received that is derived from each of a plurality of inspection camera modules forming part of a quality assurance inspection system. The data includes a feed of images of a plurality of objects passing in front of the respective inspection camera module. Thereafter, the received data is separately analyzed by each inspection camera module using at least one image analysis inspection tool. The results of the analyzing can be correlated for each inspection camera module on an object-by-object basis. The correlating can use timestamps for the images and/or detected unique identifiers within the images and can be performed by a cloud-based server and/or a local edge computer. Access to the correlated results can be provided to a consuming application or process.
    Type: Grant
    Filed: November 10, 2021
    Date of Patent: June 13, 2023
    Assignee: Elementary Robotics, Inc.
    Inventors: Kyle Bebak, Eduardo Mancera, Milind Karnik, Arye Barnehama, Daniel Pipe-Mazo
  • Patent number: 11660822
    Abstract: A slicer in a material drop ejecting three-dimensional (3D) object printer identifies the positions and local densities for a plurality of infill lines within a perimeter to be formed within a layer of an object to be formed by the printer. The local density of each infill line is filtered and a control law is applied to the filtered local density to identify an error in the local density compared to a target density. This process is performed iteratively until the error is within a predetermined tolerance range about the target local density. The error is used to generate machine ready instructions to operate the 3D object printer to achieve the target density for the infill lines.
    Type: Grant
    Filed: January 25, 2021
    Date of Patent: May 30, 2023
    Assignee: Xerox Corporation
    Inventors: Stuart A. Schweid, David A. Mantell, PriyaankaDevi Guggilapu, David G. Tilley, Christopher T. Chungbin, Walter Hsiao, Dinesh Krishna Kumar Jayabal, Daniel Cormier
  • Patent number: 11660734
    Abstract: The present invention relates to an operation parameter regulation unit (50) for use with a bolting system having a plurality of networked electrically powered torque tools (10, 11) and/or drive portions of torque tools (10, 11) for simultaneous tightening of industrial threaded fasteners (40), the operation parameter regulation unit (50) including: a processing unit (53); an output unit (51) connected and/or integrated with the processing unit (53); an input unit (52) connected and/or integrated with the processing unit (53); an activation unit (55) connected and/or integrated with the processing unit (53) for activating operation units of the plurality of networked electrically powered torque tools (10, 11) and/or drive portions of torque tools (10, 11); and a control unit (54) for controlling operation parameters (41) of each of the plurality of networked electrically powered torque tools (10, 11) and/or drive portions of torque tools (10, 11) to maintain a difference between the operation parameters (41)
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: May 30, 2023
    Assignee: HYTORC Division UNEX Corporation
    Inventor: Eric P. Junkers
  • Patent number: 11624731
    Abstract: A method for predicting a remaining life of a tool of a computer numerical control machine is provided. In the method, indirect measurement indicators of the tool are selected based on monitoring and analyzing a current state of the tool, a prediction model for the remaining life of the tool is established based on data de-noising, feature extraction and a multi-kernel W-LSSVM algorithm. Thereby, a method for predicting a remaining life of a tool of a computer numerical control machine is provided.
    Type: Grant
    Filed: May 15, 2020
    Date of Patent: April 11, 2023
    Inventors: Qingqing Huang, Zhen Kang, Yan Zhang, Shuaiyong Li, Jiajun Zhou
  • Patent number: 11609188
    Abstract: To efficiently search a processing condition of giving a desired target processing result, there is provided a processing condition determination system including a processing apparatus that processes a sample, a processing monitor system that monitors the state of the processing in the processing apparatus, and an analysis system that sets the processing condition of the processing apparatus of giving a target processing result, wherein the system includes a processing condition and result database that stores a set of an explanatory variable that is a processing condition under which the processing apparatus processes a sample and an objective variable that is the processing result obtained by the processing apparatus' processing the sample, and when the processing apparatus processes the sample under the processing condition set using the correlation model derived from the database and it is determined that a probability of failure occurrence becomes high, based on the monitor data of the processing monito
    Type: Grant
    Filed: March 23, 2021
    Date of Patent: March 21, 2023
    Assignee: HITACHI, LTD.
    Inventors: Hyakka Nakada, Takeshi Ohmori
  • Patent number: 11548227
    Abstract: Provided is a method for monitoring 3D printing equipped with a 3D printing slicer and a recursive loop structure. A 3D printing method according to an embodiment of the present invention sets up a slicing environment for 3D printing of a 3D model, generates a mechanical code by performing slicing according to the setup environment, monitors the status of the 3D printing according to the generated mechanical code, and, depending on the monitoring result, determines whether or not to re-perform the setup and subsequent steps. Accordingly, by semi- or fully automating the 3D printing engineering process, the time and effort for engineering performance involving human participation are reduced, and the human resource is concentrated on a more important area, such that the effects of enhancing the 3D printing output quality and assuring the quality can be expected.
    Type: Grant
    Filed: March 27, 2018
    Date of Patent: January 10, 2023
    Assignee: Korea Electronics Technology Institute
    Inventors: Hwa Seon Shin, Sung Hwan Chun, Hye In Lee
  • Patent number: 11545379
    Abstract: The present disclosure provides systems and methods for controlling a semiconductor manufacturing equipment. A control system includes a sensor unit capturing a set of data related to a gas pressure in the equipment, a sensor interface receiving the set of data and generating at least one input signal for a database server, and a control unit. The control unit includes a front end subsystem, a calculation subsystem, and a message and feedback subsystem. The front end subsystem performs a front end process to generate a data signal. The calculation subsystem performs an artificial intelligence analytical process to determine, according to the data signal, whether a malfunction related to the gas pressure has occurred and generate an output signal. The message and feedback subsystem generates an alert signal and a feedback signal according to the output signal and transmits the alert signal to a user.
    Type: Grant
    Filed: July 31, 2020
    Date of Patent: January 3, 2023
    Inventor: Sun-Fu Chou
  • Patent number: 11528080
    Abstract: [Problem] In an optical transmission system, a position and a cause of a failure are identified while avoiding tightness of processing on a network controller side. [Solution] An optical transmission system 1 includes a plurality of nodes 4i to 4k interconnected by an optical transmission line, a plurality of node controllers 3i to 3k that detect degradation of signal quality at the nodes 4i to 4k, respectively, and determine a degradation mode correlated with the signal quality, and a network controller 2 that identifies a node or a component in which failure has occurred based on a node for which the node controller 3i to 3k has detected degradation of the signal quality, the degradation mode, a network topology formed of the nodes, and an optical path set between the nodes.
    Type: Grant
    Filed: November 15, 2019
    Date of Patent: December 13, 2022
    Assignee: Nippon Telegraph and Telephone Corporation
    Inventors: Hiroki Kawahara, Toshiyuki Oka, Takeshi Seki, Toshihiko Seki
  • Patent number: 11520314
    Abstract: Disclosed is an interior tracking system for manufacturing control. The interior tracking system has multiple, fixedly installed transceivers for determining the position of multiple mobile units, the position being determined in particular by evaluating the propagation time of electromagnetic (radio) signals. The interior tracking system is used to assign one of the mobile units to one or more workpieces in an industrial manufacturing plant that processes steel and/or sheet metal, to determine the position of the assigned workpieces by localizing the assigned mobile unit using the interior tracking system and to integrate the interior tracking system into a manufacturing control system of the industrial manufacturing plant.
    Type: Grant
    Filed: April 18, 2019
    Date of Patent: December 6, 2022
    Assignee: TRUMPF Werkzeugmaschinen GmbH + Co. KG
    Inventors: Benjamin Schwarz, Jens Ottnad, Manuel Kiefer, Korbinian Weiss, Ulrich Schneider
  • Patent number: 11498223
    Abstract: A system for controlling interactions between a plurality of real and virtual robots, includes one or more real robots present in the real environment, one or more virtual robots present in a virtual environment corresponding to the real environment, and a processing device operable to control interactions between one or more of the real robots and one or more of the virtual robots, where the interactions between the real and virtual robots are dependent upon at least the positions of the one or more real robots in the real environment and the positions of the one or more virtual robots in the virtual environment.
    Type: Grant
    Filed: May 2, 2019
    Date of Patent: November 15, 2022
    Assignee: Sony Interactive Entertainment Inc.
    Inventor: Nigel John Williams
  • Patent number: 11442429
    Abstract: A system for detection of an anomaly in a discrete manufacturing process (DMP) with human-robot teams executing a task. Receive signals including robot, worker and DMP signals. Predict a sequence of events (SOEs) from DMP signals. Determine whether the predicted SOEs in the DMP signals is inconsistent with a behavior of operation of the DMP described in a DMP model, and if the predicted SOEs from DMP signals is inconsistent with the behavior, then an alarm is to be signaled. Input worker data into a Human Performance (HP) model, to obtain a state of the worker based on previously learned boundaries of human state. The state of the HW is then input into the HRI model and the DMP model to determine a classification of anomaly or no anomaly. Update a Human-Robot Interaction (HRI) model to obtain a control action of a robot or a type of an anomaly alarm.
    Type: Grant
    Filed: December 6, 2019
    Date of Patent: September 13, 2022
    Assignee: Mitsubishi Electric Research Laboratories, Inc.
    Inventors: Emil Laftchiev, Diego Romeres
  • Patent number: 11442438
    Abstract: A method and apparatus for performing automated supervision and inspection of an assembly process. The method is implemented using a computer system. Sensor data is generated at an assembly site using a sensor system positioned relative to the assembly site. A current stage of an assembly process for building an assembly at the assembly site is identified using the sensor data. A context for the current stage is identified. A quality report for the assembly is generated based on the sensor data and the context for the current stage.
    Type: Grant
    Filed: July 26, 2019
    Date of Patent: September 13, 2022
    Assignee: The Boeing Company
    Inventors: Huafeng Yu, Daniel S. ReMine, Tyler Charles Staudinger
  • Patent number: 11402827
    Abstract: The present disclosure provides a method for controlling a manufacturing process parameter, a manufacturing execution server, and an equipment interface server. The method includes: acquiring manufacturing process parameter information of an manufacturing equipment; and verifying the acquired manufacturing process parameter information according to reference ranges of manufacturing process parameter information of multiple manufacturing equipments which are registered in advance, and feeding back a verification result.
    Type: Grant
    Filed: April 17, 2019
    Date of Patent: August 2, 2022
    Inventors: Yong Zhu, Shoubing Sun, Shangyi Xu, Yang Zhang
  • Patent number: 11392110
    Abstract: An information management system includes: a storage section storing a data model created based on product manufacturing planning, the data model corresponding to an area where manufacturing achievement data from the manufacturing process is accumulated; an information collection section configured to collect various types of data forming the manufacturing achievement data from a data source involved in the manufacturing process; and a manufacturing management section configured to store the manufacturing achievement data in the associated data model. The manufacturing management section is configured to use the various types of data to create the manufacturing achievement data according to a data structure definition template for organizing the various types of data in association with a thing performed and a situation during the performance in the manufacturing process.
    Type: Grant
    Filed: September 29, 2017
    Date of Patent: July 19, 2022
    Inventors: Katsuhisa Chiba, Masanori Tajima
  • Patent number: 11385954
    Abstract: Technologies for enhancing work scheduling of a big data framework. The technologies can include generating, in a database, configurable namespaces to be used by a work scheduling enhancement application to group together tasks of one or more big data clusters. The namespaces can be hierarchical. The technologies can also include linking in the database, by the application, related tasks with respective namespaces to categorize and group together the related tasks. The technologies can also include configuring, by the application, a display scheme for displaying error handling and root cause analysis of tasks of the one or more big data clusters. The technologies can also include generating or rendering, by the application, a GUI having a navigable hierarchal view for displaying the namespaces. The generation or rendering of the GUI can be based partially on the display scheme.
    Type: Grant
    Filed: January 28, 2019
    Date of Patent: July 12, 2022
    Assignee: YAHOO ASSETS LLC
    Inventors: Edward Bortnikov, Dmitry Basin, Eran Meir
  • Patent number: 11360456
    Abstract: A method and apparatus for determining differences between an automated installation and a digital twin of the automated installation and to an automated installation that includes the apparatus, wherein a sensor unit is fastened to a process material and passes through an automated installation together with the process material where, during this process, the sensor unit continuously records at least one measurement variable, a temporal profile of the recorded measurement variable is compared with a temporal profile of a corresponding simulated measurement variable and if there is a difference between the temporal profiles, then the location in the automated installation at which the difference is present is identified.
    Type: Grant
    Filed: August 25, 2020
    Date of Patent: June 14, 2022
    Assignee: Siemens Aktiengesellschaft
    Inventors: Thomas Baudisch, Francesco Montrone, Jörn Peschke, Ulrich Rossgoderer, Maximilian Metzner
  • Patent number: 11356275
    Abstract: A method verifies an authenticity, integrity, and provenance of outputs from steps in a process flow. One or more processor(s) validate one or more inputs to each step in a process flow by verifying at least one of a hash and a digital signature of each of the one or more inputs. The processor(s) then generate digital signatures that cover outputs of each step and the one or more inputs to each step, such that the digital signatures result in a chain of digital signatures that are used to verify an authenticity, an integrity and a provenance of outputs of the one or more steps in the process flow.
    Type: Grant
    Filed: May 27, 2020
    Date of Patent: June 7, 2022
    Assignee: International Business Machines Corporation
    Inventors: Enriquillo Valdez, Richard H. Boivie, Venkata Sitaramagiridharganesh Ganapavarapu, Jinwook Jung, Gi-Joon Nam, Roman Vaculin, James Thomas Rayfield
  • Patent number: 11347959
    Abstract: The present invention provides a classification method for automatically identifying wafer spatial pattern distribution, comprising the following steps: performing statistical analysis to distribution of defects on a wafer, the defects being divided into random defects, repeated defects and cluster defects; performing denoising and signal enhancement to the cluster defects; performing feature extraction to the cluster defects after denoising and signal enhancement; and performing wafer spatial pattern distribution classification to the cluster defects after feature extraction. By performing statistical analysis and neural network training to a great amount of wafer defect distribution, the spatial patterns in defect distribution can be automatically identified, the automatic classification of wafer spatial patterns can be realized, the workload of engineers is effectively reduced and the tracing of the root cause of such spatial pattern is facilitated.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: May 31, 2022
    Assignee: Shanghai Huali Microelectronics Corporation
    Inventors: Junjun Zhuang, Xu Chen
  • Patent number: 11321658
    Abstract: Method of identifying a product which comprises cellulose, wherein in the method a data set is determined which is indicative for multiple constituents of the product or a preform of the product, and the data set which is correlated with the product or the preform is stored in a database.
    Type: Grant
    Filed: January 14, 2019
    Date of Patent: May 3, 2022
    Inventors: Christoph Klaus-Nietrost, Richard Herchl, Christian Weilach
  • Patent number: 11314172
    Abstract: A method for accelerating calibration of a fabrication process model, the method including performing one or more iterations of: defining one or more fabrication process model terms; receiving predetermined information related to the one or more fabrication process model terms; generating a fabrication process model based on the predetermined information, the fabrication process model configured to generate one or more predictions related to a metrology gauge; determining whether a prediction related to a dimension of a gauge is within a predetermined threshold of the gauge as measured on a post-fabrication process substrate; and responsive to the prediction not breaching the predetermined threshold, optimizing the one or more fabrication process terms such that the prediction related to the dimension of the gauge is within the predetermined threshold of the gauge as measured on the post-fabrication process substrate.
    Type: Grant
    Filed: March 7, 2019
    Date of Patent: April 26, 2022
    Assignee: ASML Netherlands B.V.
    Inventors: Hongfei Shi, Jinze Wang, Pengcheng Yang, Lei Wang, Mu Feng
  • Patent number: 11308403
    Abstract: Critical network assets of a private computer are automatically identified by training a machine learning model with histograms of features obtained by aggregating data of log entries. The model is deployed in a private computer network and retrained using training data set of the private computer network. Data from log entries of a target network asset are aggregated, numerically transformed, and converted into features histograms. The features histograms are concatenated into a single file, which is provided to the machine learning model for prediction. The machine learning model outputs a prediction score that gives an indication of whether or not the target network asset is critical.
    Type: Grant
    Filed: May 4, 2017
    Date of Patent: April 19, 2022
    Assignee: Trend Micro Incorporated
    Inventors: Ping-I Chou, Yen-Shuo Huang
  • Patent number: 11288639
    Abstract: An metal fabrication resource performance monitoring method includes: acquiring data representative of a plurality of parameters sampled during metal fabrication operations of a plurality of metal fabrication resources, the parameters comprising arc on time and wire deposition quantity; via at least one computer processor, analyzing a first subset of the acquired data and a second subset of the acquired data for the plurality of metal fabrication resources; via the at least one computer processor, populating a user viewable page with graphical indicia representative of at least the arc on time and the wire deposition quantity, the user viewable page facilitating a visual comparison of the analysis of the first subset of the acquired data and the analysis of the second subset of the acquired data; and transmitting the user viewable dashboard page to a user viewable display.
    Type: Grant
    Filed: February 10, 2020
    Date of Patent: March 29, 2022
    Assignee: Illinois Tool Works Inc.
    Inventors: Nathan John Lamers, Nathan Gerald Leiteritz, Knut Norman Froland, Todd Earl Holverson, Gregory D. Popp, Caleb Robert Krisher, Michael Anthony Gill
  • Patent number: 11263072
    Abstract: Aspects of recovery of an application from an error. An error notification is received from an agent associated with an application, the error notification being indicative of an error encountered during execution of the application. The error notification is compared with error patterns stored in a database to determine a matching error pattern. Further, a recovery action is ascertained and the recovery action is provided to the agent to recover the application from the error.
    Type: Grant
    Filed: May 7, 2018
    Date of Patent: March 1, 2022
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Navin Paul M., Piyush Kumar Jain, Dhananjaya C. K.
  • Patent number: 11244440
    Abstract: A method includes, for each data object of a plurality of data objects, performing a measurement on a plurality of instances of the data object to generate a plurality of measurement values for the data object, and generating a distribution of the measurement values for the data object. The method further includes generating an aggregate distribution based on each of the distributions of the measurement values generated for the data objects, and scoring a first data object of the plurality of data objects based on the distribution of the measurement values for the first data object and the aggregate distribution.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: February 8, 2022
    Assignee: Intel Corporation
    Inventors: Bikram Baidya, Allan Gu, Vivek K. Singh, Abde Ali Hunaid Kagalwalla
  • Patent number: 11213946
    Abstract: Mitigating the reality gap through optimization of one or more simulated hardware parameters for simulated hardware components of a simulated robot. Implementations generate and store real navigation data instances that are each based on a corresponding episode of locomotion of a real robot. A real navigation data instance can include a sequence of velocity control instances generated to control a real robot during a real episode of locomotion of the real robot, and one or more ground truth values, where each of the ground truth values is a measured value of a corresponding property of the real robot (e.g., pose). The velocity control instances can be applied to a simulated robot, and one or more losses can be generated based on comparing the ground truth value(s) to corresponding simulated value(s) generated from applying the velocity control instances to the simulated robot. The simulated hardware parameters and environmental parameters can be optimized based on the loss(es).
    Type: Grant
    Filed: December 27, 2018
    Date of Patent: January 4, 2022
    Inventors: Yunfei Bai, Elmar Mair, Yuchen Wu, Ian Wilkes, Max Moroz, Weidan Wu
  • Patent number: 11188062
    Abstract: A work management device manages a board work line having multiple board work machines for performing work on a board. The work management device includes a problem detection section configured to detect that a problem has occurred in any of the multiple board work machines; a handling method database configured to accumulate handling methods for problems; an updating section configured to update handling methods for problems at any time; and a work instruction section configured to extract and indicate to an operator a handling method for a problem from the handling method database when the problem detection section detects that the problem has occurred.
    Type: Grant
    Filed: February 6, 2017
    Date of Patent: November 30, 2021
    Inventors: Hitoshi Kobayashi, Junichi Kako, Shinichi Naka, Yusuke Kikuchi
  • Patent number: 11117360
    Abstract: A device and method for generating scan data and/or slice data for use in an additive manufacturing process, in which an energy beam is scanned across layers of flowable material to consolidate the material in a layer-by-layer manner to build a part. The device includes a display and a processor. The processor is arranged to determine scan data for slices and/or slices of the part to be built in the additive manufacturing process and cause the display to display scan data and/or slices that has been determined whilst determining scan data for other ones of the slices and/or other ones of the slices from the geometric data.
    Type: Grant
    Filed: June 3, 2016
    Date of Patent: September 14, 2021
    Assignee: RENISHAW PLC
    Inventors: Ramkumar Revanur, Michael Joseph McClelland
  • Patent number: 11115278
    Abstract: The present technology provides a system, method and computer-readable medium for configuration pattern recognition and inference, directed to a device with an existing configuration, through an extensible policy framework. The policy framework uses a mixture of python template logic and CLI micro-templates as a mask to infer the intent behind an existing device configuration in a bottom-up learning inference process. Unique values for device/network identifiers and addresses as well as other resources are extracted and accounted for. The consistency of devices within the fabric is checked based on the specific policies built into the extensible framework definition. Any inconsistencies found are flagged for user correction or automatically remedied by a network controller. This dynamic configuration pattern recognition ability allows a fabric to grow without being destroyed and re-created, thus new devices with existing configurations may be added and automatically configured to grow a Brownfield fabric.
    Type: Grant
    Filed: February 25, 2019
    Date of Patent: September 7, 2021
    Assignee: Cisco Technology, Inc.
    Inventors: Jason David Notari, Manish Chandra Agrawal, Liqin Dong, Lukas Krattiger, Patnala Debashis Rao
  • Patent number: 11107026
    Abstract: Systems and methods are provided for increasing employee productivity in a production process. One or more machines for accomplishing a production activity and in communication with a database which includes pay rates and predetermined thresholds for the production activity. Data acquiring devices associated with each machine measure production rates in substantially real time. A processor retrieves the pay rate and the production rate to determine a real-time-pay rate. A display provides a ranking and visualization reflecting each employee's real-time-pay and a graphic indicating whether each employee's real-time-pay rate exceeds one or more of the predetermined thresholds.
    Type: Grant
    Filed: June 26, 2019
    Date of Patent: August 31, 2021
    Inventor: Mark Lamoncha
  • Patent number: 11055840
    Abstract: To evaluate a semiconductor-fabrication process, a semiconductor wafer is obtained that includes die grouped into modulation sets. Each modulation set is fabricated using distinct process parameters. The wafer is optically inspected to identify defects. A nuisance filter is trained to classify the defects as DOI or nuisance defects. Based on results of the training, a first, preliminary process window for the wafer is determined and die structures having DOI are identified in a first group of modulation sets bordering the first process window. The trained nuisance filter is applied to the identified defects to determine a second, revised process window for the wafer. A third, further revised process window for the wafer is determined based on SEM images of specified care areas in one or more modulation sets within the second, revised process window. A report is generated that specifies the third process window.
    Type: Grant
    Filed: September 25, 2019
    Date of Patent: July 6, 2021
    Assignee: KLA Corporation
    Inventors: Ardis Liang, Martin Plihal, Saravanan Paramasivam, Niveditha Lakshmi Narasimhan, Sandeep Bhagwat
  • Patent number: 11020830
    Abstract: An assembly method is provided by orienting a cylinder-head at a first orientation. A first plurality of spring caps and a first plurality of retainer keys are installed into the cylinder-head in the first orientation by a first robot. A first plurality of valves is installed into the cylinder-head in the first orientation by a second robot, into engagement with the first plurality of retainer keys. An end effector is provided with an actuator supported upon an adapter plate. A shaft extends from the actuator with a mating surface to engage a spring cap. Porting is provided through the shaft to convey pressurized air upon a plurality of retainer keys within the spring cap. A plurality of gripper fingers extend from the distal end of the shaft to grip a valve spring while retaining a spring cap between the valve spring and the mating surface of the shaft.
    Type: Grant
    Filed: December 15, 2016
    Date of Patent: June 1, 2021
    Assignees: Ford Global Technologies, LLC, ABB Technology AG
    Inventors: Alexander Marrocco, Harry Kekedjian, Isaac Zolotarev, Arnold Bell, Michael Manuszak
  • Patent number: 11010886
    Abstract: Systems and methods for automatic correction of drift between inspection and design for massive pattern searching are disclosed herein. Defects are identified in a scan of a wafer. The defects are associated with tool coordinates. An SEM review tool captures centered images of the defects. The SEM review tool is aligned with the wafer using design polygons in an imported design file. Design coordinates are exported and used to define patterns of interest and identifying locations of those patterns of interest.
    Type: Grant
    Filed: May 12, 2017
    Date of Patent: May 18, 2021
    Assignee: KLA-Tencor Corporation
    Inventors: Chi-Yuan Tseng, Ming-Hsiang Hsueh
  • Patent number: 11010665
    Abstract: There are provided system and method of segmentation a fabrication process (FP) image obtained in a fabrication of a semiconductor specimen. The method comprises: upon obtaining a Deep Neural Network (DNN) trained to provide segmentation-related data, processing a fabrication process (FP) sample using the obtained trained DNN and, resulting from the processing, obtaining by the computer segments-related data characterizing the FP image to be segmented, the obtained segments-related data usable for automated examination of the semiconductor specimen. The DNN is trained using a segmentation training set comprising a plurality of first training samples and ground truth data associated therewith, each first training sample comprises a training image; FP sample comprises the FP image to be segmented.
    Type: Grant
    Filed: August 3, 2017
    Date of Patent: May 18, 2021
    Assignee: Applied Material Israel, Ltd.
    Inventors: Leonid Karlinsky, Boaz Cohen, Idan Kaizerman, Efrat Rosenman, Amit Batikoff, Daniel Ravid, Moshe Rosenweig
  • Patent number: 10990825
    Abstract: An image processing method, an electronic device and a computer readable storage medium are described. The image processing method may include: obtaining an image to be detected, and inputting the image to be detected to a neural network; detecting the image to be detected via the neural network to obtain confidence levels of image categories for a background image in the image and confidence levels of object categories for a foreground target in the image; determining an image category of the background image according to the confidence levels of the image categories for the background image and a confidence level threshold; and determining an object category of the foreground target according to the confidence levels of the object categories for the foreground target and the confidence level threshold.
    Type: Grant
    Filed: January 16, 2019
    Date of Patent: April 27, 2021
    Inventor: Yan Chen
  • Patent number: 10981315
    Abstract: A state determination device includes: a primary determination learning model that has learned an outline of a state of a manufacturing device based on a state variable acquired from a manufacturing operation of a product of the manufacturing device; and a secondary determination learning model that has learned a state of the manufacturing device based on a state variable acquired from a predetermined operation pattern set in advance and maintenance information. Then, a primary determination is made on the outline of the state of the manufacturing device using the primary determination learning model based on the state variable acquired from the manufacturing operation of the product, and further, a secondary determination is made on the state of the manufacturing device using the secondary determination learning model based on the state variable acquired from the predetermined operation pattern.
    Type: Grant
    Filed: October 17, 2018
    Date of Patent: April 20, 2021
    Inventors: Hiroyasu Asaoka, Atsushi Horiuchi, Kenjirou Shimizu
  • Patent number: 10984143
    Abstract: The purpose of the present invention is to provide a recipe creation device, with the goal of using past recipe data in order to highly efficiently create recipes. As an embodiment with which to achieve this goal, there is provided a recipe creation device comprising an arithmetic processing device that, on the basis of design data for a semiconductor element, establishes measurement conditions or inspection conditions by a semiconductor measurement device or a semiconductor inspection device, wherein the arithmetic processing device is configured to be able to access a database in which the measurement conditions or inspection conditions, and the pattern information of the semiconductor element, are stored in associated form, and the measurement conditions or inspection conditions are selected through a search using pattern information of the semiconductor element.
    Type: Grant
    Filed: January 23, 2015
    Date of Patent: April 20, 2021
    Assignee: Hitachi High-Tech Corporation
    Inventors: Hiromi Fujita, Toshikazu Kawahara, Yoshihiro Ota, Shigeki Sukegawa
  • Patent number: 10981586
    Abstract: A railway diagnostic system includes a plurality of field objects, a plurality of controllers associated with field objects and being structured to gather data from the field objects and to communicate the data gathered from the field objects, a diagnostic server structured to receive the data gathered from the field objects from the controller, to store the data gathered from the field objects in a database, and to provide access to the database, and a client structured to use the diagnostic server to access the database.
    Type: Grant
    Filed: September 6, 2019
    Date of Patent: April 20, 2021
    Inventors: Andrew John Martell, Jonathan R. Dylewski, Jian Sun
  • Patent number: 10972366
    Abstract: Techniques that facilitate orchestration engine blueprint aspects for hybrid cloud composition are provided. In one example, a system includes a blueprint component, a hybrid cloud composition component, and a learning component. The blueprint component determines one or more blueprint-level aspects for a blueprint associated with a cloud-based computing platform. The one or more blueprint-level aspects are indicative of encoded information for one or more features associated with one or more computing resources for the cloud-based computing platform. The hybrid cloud composition component determines a set of resource definitions for the cloud-based computing platform based on the one or more blueprint-level aspects. The learning component monitors the cloud-based computing platform based on the one or more blueprint-level aspects to learn one or more features associated with the cloud-based computing platform.
    Type: Grant
    Filed: December 14, 2017
    Date of Patent: April 6, 2021
    Inventors: Neeraj Asthana, Thomas E. Chefalas, Alexei Karve, Clifford A. Pickover
  • Patent number: 10970182
    Abstract: Embodiments are directed to a computer implemented method for generating a drift detector. The method includes generating, using a processor system, drift cases based at least in part on known drift set data of a computer system. The method further includes injecting, using the processor system, the drift cases into the computer system to generate a first data set. The method further includes applying, using the processor system, cleaning rules to the first data set to reduce a size of the first data set and generate a cleaned data set. The method further includes extracting one or more features of the cleaned data set. The method further includes normalizing the extracted one or more features of the cleaned data set. The method further includes training a machine learning system using the extracted and normalized one or more features of the cleaned data, wherein an output of the machine learning system comprises the drift detector.
    Type: Grant
    Filed: March 3, 2016
    Date of Patent: April 6, 2021
    Inventors: Girish B. Chafle, Peng Fei Chen, Fan Jing Meng, Hai Shan Wu, Jing Min Xu, Lin Yang
  • Patent number: 10963460
    Abstract: Integrated circuits and methods relating to hardware acceleration include independent, programmable, and parallel processing units (PU) custom-adapted to process a data stream and aggregate the results to respond to a query. In an illustrative example, a data stream from a database may be divided into data blocks and allocated to a corresponding PU. Each data block may be processed by one of the PUs to generate results according to a predetermined instruction set. A concatenate unit may merge and concatenate a result of each data block together to generate an output result for the query. In some embodiments, very large database SQL queries, for example, may be accelerated by hardware PU/concatenate engines implemented in fixed ASIC or reconfigurable FPGA hardware circuitry.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: March 30, 2021
    Assignee: XILINX, INC.
    Inventors: Hare K. Verma, Bing Tian
  • Patent number: 10962954
    Abstract: A manufacturing process system comprises any number of assembly stations and test stations, a model unit, and any number of final products is provided. Any of a sample test method and the statistical distribution monitoring method performed by the model unit is configured to monitor the model quality after it is deployed and reduce potential unnecessary costs, such as warranty claim costs as a result of sending bad units to the customers, and rework costs as a result of predicting a good part as bad and wasting additional testing efforts on the bad parts. Further, both methods are configured to maximize the probability of detecting hazardous issues, while having control of the false alarm rate.
    Type: Grant
    Filed: August 22, 2017
    Date of Patent: March 30, 2021
    Assignee: Robert Bosch GmbH
    Inventors: Ruobing Chen, Shan Kang, Rumi Ghosh, Soundar Srinivasan, Zubin Abraham
  • Patent number: 10954011
    Abstract: A diagnostic method for analysing the operation of at least part of a production line in the tobacco industry includes feeding through the line a probe having the shape of a smokers' article and provided with an electronic card configured to acquire one or more parameters; the method includes a step of activating the probe with the possibility of temporally synchronizing the data acquired by the probe with the data acquired by the line at the same time.
    Type: Grant
    Filed: April 19, 2017
    Date of Patent: March 23, 2021
    Assignee: G.D S.P.A.
    Inventors: Luca Vecchietti, Sergio Morelli, Franco Spisni, Eugenio Navacchia, Maria Eleonora Cesarini, Gaetano De Pietra, Luca Federici
  • Patent number: 10946588
    Abstract: A present disclosure relates to a system for automatic design and manufacturing of 3D printing units and 3D products. The system is configured to obtain specification of a target structure corresponding to a 3D product; automatically determine a design and a printing path of a 3D printing unit based on the specification of the target structure, wherein the 3D printing unit is a micronozzle unit configured to print the target structure of the 3D product; automatically determine a manufacturing procedure to print the 3D printing unit based on the specification of the target structure; and instruct a 3D printer to print the 3D printing unit according to the manufacturing procedure and the printing path of the 3D printing unit.
    Type: Grant
    Filed: March 3, 2017
    Date of Patent: March 16, 2021
    Assignee: President and Fellows of Harvard University
    Inventors: Jennifer A. Lewis, Mark Andrew Skylar-Scott, Jochen Mueller, David Kolesky
  • Patent number: 10929270
    Abstract: Methods and systems for controlled data extraction in a computer network, with: monitoring data from at least one program running on a node of the computer network, determination of at least one data portion from the monitored data, where the data portions are selected upon identification of at least one of: application and server events, code line execution, file access and data calls, moving of the determined at least one data portion to a data sink, analyzing of the data on the data sink to determine at least one segment for modification, and modifying the at least one segment.
    Type: Grant
    Filed: January 1, 2019
    Date of Patent: February 23, 2021
    Assignee: ROOKOUT LTD.
    Inventors: Or Weis, Liran Haimovitch
  • Patent number: 10923318
    Abstract: A focused ion beam (FIB) is used to mill beam spots into a substrate at a variety of ion beam column settings to form a set of training images that are used to train a convolutional neural network. After the neural network is trained, an ion beam can be adjusted by obtaining spot image which is processed with the neural network. The neural network can provide a magnitude and direction of defocus, aperture position, lens adjustments, or other ion beam or ion beam column settings. In some cases, adjustments are not made by the neural network, but serve to indicate that the ion beam and associated ion column continue to operate stably, and additional adjustment is not required.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: February 16, 2021
    Assignee: FEI Company
    Inventors: Galen Gledhill, Mostafa Maazouz, Gavin Mitchson
  • Patent number: 10909480
    Abstract: A method and system for capturing, organizing, storing, and analyzing manufacturing process information, with storage and performance characteristics suitable for use in resource-constrained embedded devices. Process information is organized into extensible Channels, each of which captures information stored as extensible Events, each of which may include Metric, Category Value, Annotation, and System Fields. Shared Boundaries between Channels make it easier to organize, store, interrelate, analyze, and explore information. Channel Boundary Relationships (e.g., Coupling, Fragmenting, Projecting, and Aggregating) create shared Boundaries; and can create, or be combined to create, sets of Channels that share Boundaries (referred to as a Slice Set).
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: February 2, 2021
    Assignee: Vorne Industries, Inc.
    Inventors: Ramon A. Vorne, Phillip Howell, Benjamin D. Saks, Chad E. Barth
  • Patent number: 10911474
    Abstract: A cloud security system and method implements cloud activity threat detection using analysis of cloud usage user behavior. In particular, the cloud security system and method implements threat detection for users, cloud service providers, or tenants (enterprises) of the cloud security system who are new or unknown to the cloud security system and therefore lacking sufficient cloud activity data to generate an accurate behavior model for effective threat detection. In accordance with embodiments of the present invention, the cloud security system and method performs user behavior analysis to generate generalized user behavior models for user groups, where each user group includes users with similar cloud usage behavior. The user behavior models of the user groups are assigned to users with sparse cloud activity data. In this manner, the cloud security system and method of the present invention ensures effective threat detection by using accurate and reliable user behavior models.
    Type: Grant
    Filed: May 13, 2019
    Date of Patent: February 2, 2021
    Assignee: Skyhigh Networks, LLC
    Inventors: Sandeep Chandana, Santosh Raghuram Kumar, Sekhar Sarukkai, Satyanarayana Vummidi, Madhavi Kavathekar, Vinay Gupta