Defect Analysis Or Recognition Patents (Class 700/110)
  • Patent number: 10776552
    Abstract: An integrated circuit design tool for modeling resistance of an interconnect specifies a structure of the interconnect in a data structure in memory in or accessible by the computer system using 3D coordinate system. For each of a plurality of volume elements in the specified structure, the tool specifies a location and one of first and second materials of the interconnect having specified resistivities, and for each volume element generates a model resistivity for the volume element as a function of resistivity of volume elements within a neighborhood of the volume element and a specified transition region length ?.
    Type: Grant
    Filed: November 27, 2017
    Date of Patent: September 15, 2020
    Assignee: Synopsys, Inc.
    Inventors: Victor Moroz, Ibrahim Avci, Shuqing Li, Philippe Roussel, Ivan Ciofi
  • Patent number: 10768226
    Abstract: According to an embodiment, a testing mechanism determines a status of circuits within a chip by analyzing fail signatures on a by-level basis to identify a high probability defect area within the chip. The testing mechanism further determines a whether functionally needed circuitry of the chip intersects with the high probability defect area within the chip and determines the status of the circuits in response to the determining of whether the functionally needed circuitry intersects with the high probability defect area.
    Type: Grant
    Filed: August 30, 2018
    Date of Patent: September 8, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Kirk D. Peterson, Alain G. Rwabukamba, Andrew A. Turner
  • Patent number: 10748655
    Abstract: A system controller configured to centrally control control target devices used in surgery includes a communicating device capable of communicating with a plurality of control target devices, an extraction condition memory capable of storing extraction conditions, and a processor including hardware. The processor detects an abnormal state of connected control target devices. The processor performs recording processing for recording operation information relating to operation on the control target devices as log data into a predetermined storage apparatus. When a device abnormality detecting section detects an abnormal state, the processor extracts relevant information related to the abnormal state from log data.
    Type: Grant
    Filed: March 14, 2019
    Date of Patent: August 18, 2020
    Assignee: OLYMPUS CORPORATION
    Inventor: Kuniaki Kami
  • Patent number: 10728265
    Abstract: Techniques are provided for cyber warning. One technique includes a cyber warning receiver (CWR). The CWR includes a bus sensing circuit to sense traffic on a communications bus over time, an anomaly detecting circuit to detect anomalous behavior in the sensed bus traffic, a data fusing circuit to fuse the detected anomalous behavior into groups having similar characteristics, a decision making circuit to decide if the fused anomalous behavior is normal or abnormal, and a behavior logging circuit to log the detected anomalous behavior on an electronic storage device. In one embodiment, the CWR further includes a behavior alerting circuit to alert an operator to the fused anomalous behavior identified as abnormal. In one embodiment, the communications bus is an embedded communications bus, such as a MIL-STD-1553 bus, and the CWR is a standalone device configured to connect to the MIL-STD-1553 bus as a bus monitor.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: July 28, 2020
    Assignee: BAE Systems Information and Electronic Systems Integration Inc.
    Inventors: Patrick M. Hayden, Jeong-O. Jeong, Vu T. Le, Christopher C. Rappa, Sumit Ray, Katherine D. Sobolewski, David K. Woolrich, Jr.
  • Patent number: 10713556
    Abstract: Processing raw data stored in an historian device for determining an amount of products passed through a process element in a process control environment is described. A count value is incremented by a counter at a rate at which products pass through the process element. The count value rolls over to zero when the count value reaches a rollover value R. An historian device periodically receives count value data points from the counter. A deadband value D is set in the historian device for distinguishing between rollovers, resets, and reversals. A client device queries the historian device for an amount of products passed through the process element for a timeframe. The historian device selects a set of count value data points from within the queried timeframe. The historian device determines, based on the selected data points and their quality, an amount of products passed through the process element.
    Type: Grant
    Filed: March 12, 2019
    Date of Patent: July 14, 2020
    Assignee: AVEVA SOFTWARE, LLC
    Inventors: Vinay T. Kamath, Yevgeny Naryzhny, Alexander Vasilyevich Bolotskikh, Abhijit Manushree, Elliott Middleton, Bala Kamesh Sista
  • Patent number: 10707107
    Abstract: Adaptive alignment methods and systems are disclosed. An adaptive alignment system may include a scanner configured to align a wafer and an analyzer in communication with the scanner. The analyzer may be configured to: recognize at least one defined analysis area; determine whether any perturbations exist within the analysis area; and in response to at least one perturbation determined to be within the analysis area, invoke a fall back alignment strategy or report the at least one perturbation to the scanner.
    Type: Grant
    Filed: September 9, 2016
    Date of Patent: July 7, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Brent A. Riggs, William Pierson
  • Patent number: 10691100
    Abstract: The present disclosure provides a method, devices, a numerical control machine, and a computer storage medium for detecting machine processing trajectory space. The method includes: obtaining data of a trajectory AB of a machine processing and spatial data of a specified space area; converting a function of the data of the trajectory AB into a univariate function P=f (u) with respect to a trajectory parameter u; determining a point set Ui of the trajectory AB on an inner side of each curved surface Si based on spatial data of the individual curved surfaces Si forming the specified space area and the function P=f(u); and determining a positional relationship between the trajectory AB and the specified space area based on the point sets Ui.
    Type: Grant
    Filed: October 22, 2015
    Date of Patent: June 23, 2020
    Assignee: SHENZHEN A&E INTELLIGENT TECHNOLOGY INSTITUTE CO., LTD.
    Inventor: Xiaoying Chen
  • Patent number: 10678232
    Abstract: A prognostic method and a prognostic apparatus for a processing apparatus are provided. In the steps of the prognostic method, multiple sensor data of a component of the processing apparatus and a heterogeneous data are obtained, multiple health indicators of the component are obtained by the multiple sensor data, a regressive characteristic function and an adjustment function are obtained according to the health indicators, the adjustment function corresponds to the heterogeneous data, a prediction function of health indicator is obtained according to the regressive characteristic function and the adjustment function, and a predictive value of health indicator is obtained according to the prediction function of health indicator to estimate a usage status of the component.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: June 9, 2020
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Po-Yu Huang, Chuang-Hua Chueh
  • Patent number: 10620619
    Abstract: A plant-monitoring system includes: at least three detection elements, the detection elements being at least one type of detection element for monitoring a subject being monitored; a detection network configured by disposing the at least three detection elements in a plant; a storage unit that receives detection data from each of the detection elements to record the detection data as recorded data; and a processing computing unit. The processing computing unit receives the detection data from each of the detection elements, determines presence or absence of a fault by comparing the detection data with the recorded data, and in a case where occurrence of a fault is recognized, identifies a place of occurrence of the fault based on the detection data, and transmits the result of the place of occurrence of the fault to a predetermined incident response team.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: April 14, 2020
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Wataru Matsubara, Naohiko Ishibashi, Ryo Kamito, Susumu Okino, Takeo Shinoda
  • Patent number: 10621669
    Abstract: Systems and methods for an interactive graphical user interface for depicting the status of a claim are provided. The system includes a database for storing claim data and a server in communication with the database. The stored claim data includes a claim workflow associated the claim. The workflow defines the processing steps associated with processing the claim. The server receives a user request to check the status of the claim. The server determines status data of the claim based on stored claim data and outputs the status data to a graphical user interface for depicting a graphical representation of the status data. The graphical representation includes a timeline corresponding to the workflow of the claim and a progress bar indicative of the status of the claim.
    Type: Grant
    Filed: June 16, 2017
    Date of Patent: April 14, 2020
    Assignee: Hartford Fire Insurance Company
    Inventors: Victoria F. Albert, Susmita Shukla
  • Patent number: 10598617
    Abstract: Information from metrology tools can be used during inspection or review with a scanning electron microscope. Metrology measurements of a wafer are interpolated and/or extrapolated over a field, which creates modified metrology data. The modified metrology data is associated with defect attributes from inspection measurements of a wafer. A wafer review sampling plan is generated based on the defect attributes and the modified metrology data. The wafer review sampling plan can be used during review of a wafer using the scanning electron microscope.
    Type: Grant
    Filed: August 8, 2017
    Date of Patent: March 24, 2020
    Assignee: KLA-Tencor Corporation
    Inventors: Kaushik Sah, Andrew James Cross, Antonio Mani
  • Patent number: 10599808
    Abstract: A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a failure of the circuit over a pre-determined time period. The method may further include obtaining a thermal map. The method may further include determining a first failure rate for the first wire segment of the circuit. The first failure rate may be a probability that the first wire segment fails in a predetermined amount of time. The method may further include determining a second failure rate for the second wire segment of the circuit. The method may further include generating a model of the circuit. The model of the circuit may describe the first and the second failure rate of the circuit.
    Type: Grant
    Filed: May 6, 2019
    Date of Patent: March 24, 2020
    Assignee: Oracle International Corporation
    Inventors: Govind Saraswat, Wai Chung William Au, Douglas Stanley, Anuj Trivedi
  • Patent number: 10591906
    Abstract: A system includes wireless access points operable to communicate with a communication network and electronic tracking devices that each include an electronic-ink display. The electronic tracking devices are operable to communicate wirelessly with the wireless access points. The system also includes manufacturing system operator computer systems operable to communicate with the communication network. The system further includes a server operable to execute instructions to update at least one entry in a manufacturing system database based on receiving an operation notification from one of the manufacturing system operator computer systems. The server can transmit a display update for the electronic-ink display of an identified electronic tracking device through at least one of the wireless access points based on determining that the operation notification includes a transition from a current manufacturing process step to a next manufacturing process step.
    Type: Grant
    Filed: March 14, 2018
    Date of Patent: March 17, 2020
    Assignee: MORRIS CONTROLS, INC.
    Inventor: Scott Morris
  • Patent number: 10584986
    Abstract: Embodiments of the present invention specify a group of sensors detecting normal operation and a group of sensors detecting abnormal operation from time-series data on the sensors without using threshold values that are based on the experience of users. One aspect of an embodiment is a detecting device for detecting changes in the output of a plurality of sensors, in which the detecting device includes: a first output acquiring unit for acquiring a first relevance matrix; a second output acquiring unit for acquiring a second relevance matrix; a change calculating unit for calculating a change matrix representing the degree of change between the first relevance matrix and the second relevance matrix; and a specifying unit for specifying a group of sensors showing a degree of change greater than the others in the change matrix. Other aspects of the present invention include a detecting method and a program.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: March 10, 2020
    Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Satoshi Hara, Tetsuro Morimura, Toshihiro Takahashi
  • Patent number: 10586322
    Abstract: A method for detecting coordinates includes detecting a first position in an inspection target placed on a placement surface of an inspection stage and a second position in the inspection target separated from the first position. A coordinate shift from the first position to the second position includes a first shift component in a first direction taken along the placement surface, and a second shift component in a second direction taken along the placement surface and crossing the first direction. The method further includes calculating a coordinate in the first direction of the second position using a first function, the first function including the first shift component and the second shift component as variables; and calculating a coordinate in the second direction of the second position using a second function, the second function including the first shift component and the second shift component as variables.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: March 10, 2020
    Assignee: Toshiba Memory Corporation
    Inventor: Masato Naka
  • Patent number: 10579046
    Abstract: A robot system is configured to fabricate three-dimensional (3D) objects using closed-loop, computer vision-based control. The robot system initiates fabrication based on a set of fabrication paths along which material is to be deposited. During deposition of material, the robot system captures video data and processes that data to determine the specific locations where the material is deposited. Based on these locations, the robot system adjusts future deposition locations to compensate for deviations from the fabrication paths. Additionally, because the robot system includes a 6-axis robotic arm, the robot system can deposit material at any locations, along any pathway, or across any surface. Accordingly, the robot system is capable of fabricating a 3D object with multiple non-parallel, non-horizontal, and/or non-planar layers.
    Type: Grant
    Filed: April 24, 2017
    Date of Patent: March 3, 2020
    Assignee: AUTODESK, INC.
    Inventors: Evan Atherton, David Thomasson, Maurice Ugo Conti, Heather Kerrick, Nicholas Cote
  • Patent number: 10579750
    Abstract: Disclosed herein are systems, devices, and methods related to assets and predictive models and corresponding workflows that are related to the operation of assets. In particular, examples involve assets configured to receive and locally execute predictive models, locally individualize predictive models, and/or locally execute workflows or portions thereof.
    Type: Grant
    Filed: June 17, 2016
    Date of Patent: March 3, 2020
    Assignee: Uptake Technologies, Inc.
    Inventors: Adam McElhinney, Tyler Roberts, Michael Horrell, Brad Nicholas
  • Patent number: 10551369
    Abstract: A method for a probabilistic detection of defects in ribbons of material laid on a fiber composite workpiece. The method includes detecting at least one surface profile of a workpiece having laid material ribbons and locating a surface profile entry in a database. In this case, the surface profile entry provides an assignment of the surface profile to a defect type and to a hit probability that the detected surface profile is based on a defect of the defect type.
    Type: Grant
    Filed: July 29, 2016
    Date of Patent: February 4, 2020
    Assignee: Airbus Defence and Space GmbH
    Inventor: Franz Engel
  • Patent number: 10545821
    Abstract: Examples disclosed herein relate to a fault-tolerant dot product engine. The fault-tolerant dot product engine has a crossbar array having a number l of row lines and a number n of column lines intersecting the row lines to form l×n memory locations, with each memory location having a programmable memristive element and defining a matrix value. A number l of digital-to-analog converters are coupled to the row lines of the crossbar array to receive an input signal and a number n of analog-to-digital converters are coupled to the column lines of the crossbar array to generate an output signal. The output signal is a dot product of the input signal and the matrix values in the crossbar array, wherein a number m<n of the n column lines in the crossbar array are programmed with matrix values used to detect errors in the output signal.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: January 28, 2020
    Assignee: Hewlett Packard Enterprise Development LP
    Inventors: Ron M. Roth, Richard H. Henze
  • Patent number: 10514321
    Abstract: Systems and methods for improving the uniformity of a tire based on estimated process harmonic magnitudes for one or more process effects are provided. Magnitudes of process harmonics associated with one or more candidate process effects can be determined from the observed magnitudes of one or more harmonics of measured uniformity parameters. The estimated process harmonic magnitude(s) can be determined without requiring phase angle or azimuth information associated with the observed magnitudes. The estimated process harmonic magnitude(s) can be determined by identifying a process harmonic magnitude pattern for identified candidate process effects. A model can be constructed correlating the candidate magnitudes specified by the process harmonic magnitude pattern with observed magnitudes of corresponding harmonics of a measured uniformity waveform. Regression or programming techniques can be used to estimate coefficients associated with candidate magnitude terms in the model.
    Type: Grant
    Filed: March 29, 2013
    Date of Patent: December 24, 2019
    Assignees: Compagnie Generale des Etablissements Michelin, Michelin Recherche et Technique, S.A.
    Inventor: William David Mawby
  • Patent number: 10512702
    Abstract: The present invention provides a breathing assistance apparatus that has a convenient and effective method of cleaning internal conduits inside the apparatus. The breathing assistance apparatus is preferably a gases supply and humidification device. The cleaning method is a method of disinfection that is automated so minimal training is required to disinfect in particular an internal elbow conduit within the device. It is therefore not necessary to dismantle the gases supply and humidification device, therefore, inadvertent damage to the internal parts of the device is avoided. The present invention also provides a method of disinfecting a heated breathing conduit and a patient interface.
    Type: Grant
    Filed: December 22, 2016
    Date of Patent: December 24, 2019
    Assignee: Fisher & Paykel Healthcare Limited
    Inventors: Kevin Peter O'Donnell, Matthew Jon Payton, Christopher Simon James Quill, Martin Paul Friederich Kramer, Peter Geoffrey Hawkins, Reena Daken
  • Patent number: 10496056
    Abstract: A measured value analysis apparatus includes a controller and a memory, in which the controller: selects one examination object item, which is an examination object, and a plurality of related items which are directly or indirectly related to the examination object item; creates a correlation model between measured values from past measured values of the examination object item and the plurality of related items; and calculates a predicted value of the examination object item by applying the measured values of the related items to the correlation model and calculates divergence between an actual measured value of the examination object item and the predicted value.
    Type: Grant
    Filed: September 22, 2016
    Date of Patent: December 3, 2019
    Assignees: IHI Corporation, DIESEL UNITED, LTD.
    Inventor: Takashi Fujii
  • Patent number: 10491779
    Abstract: An image processing apparatus includes: a display; a memory that stores multiple key frames of a video guide on how to recover from an operating error; an error sensor that detects the operating error; and a display processor that allows the display to display at least one of the multiple key frames as a still frame for a digest along with an operation button for video playback, when the error sensor detects the operating error, the multiple key frames being stored on the memory, and that further allows the display to play back the video guide by serially displaying the multiple key frames, when the operation button is pressed.
    Type: Grant
    Filed: July 3, 2017
    Date of Patent: November 26, 2019
    Assignee: Konica Minolta, Inc.
    Inventors: Kenichi Komaba, Shinichi Asai, Yu Sonoda
  • Patent number: 10471746
    Abstract: A printing apparatus includes: a conveyor which conveys a print medium along a conveyance path; a print head which execute printing at a first position on the conveyance path; a cutter which cuts the print medium at least partially at a second position on the downstream side from the first position in the conveyance path; and a processor. The processor acquires a specified length along the conveyance path, acquires a first margin length along a conveyance direction in a first margin part, acquires a separation distance along the conveyance path between the first position and a third position which includes the second position and which is located on the conveyance path and between the first position to the second position, and determines whether the separation distance is equal to or longer than a first total length which is the total of the specified length and the first margin length.
    Type: Grant
    Filed: September 25, 2017
    Date of Patent: November 12, 2019
    Assignee: Brother Kogyo Kabushiki Kaisha
    Inventor: Noriyuki Kawamata
  • Patent number: 10459434
    Abstract: There is described herein an inspection tool for use during the inspection of components as manufactured. The inspection tool allows the comparison of measurement data with nominal data and provides complementary information with regards to at least one feature of the component.
    Type: Grant
    Filed: September 21, 2015
    Date of Patent: October 29, 2019
    Assignees: BOMBARDIER INC., C SERIES AIRCRAFT LIMITED PARTNERSHIP
    Inventor: Laurent Regnault
  • Patent number: 10446422
    Abstract: A method is provided, the method including: repeatedly acquiring a state of one or more devices included in the semiconductor manufacturing apparatus; providing a first animation indicating an operation of the semiconductor manufacturing apparatus by displaying at least an image indicating the state of one or more devices on a display unit each time the state is acquired; storing, in a memory, the acquired state of one or more devices and a time related to the state; receiving an input for switching a display mode; and providing a second animation of the semiconductor manufacturing apparatus by displaying, one by one on the display unit, at least one or more images respectively indicating the state of one or more devices related to one or more times including a reference time stored in the memory, after receiving the input for switching a display mode.
    Type: Grant
    Filed: March 30, 2018
    Date of Patent: October 15, 2019
    Assignee: EBARA CORPORATION
    Inventors: Masayuki Fujiki, Hideharu Aoyama, Ryuya Koizumi
  • Patent number: 10430269
    Abstract: Methods and systems for performing root cause analysis for an assembly line including a plurality of nodes using path tracking. One method includes receiving tracking data identifying a subset of the plurality of nodes processing a product produced by the assembly line and receiving approval data associated with the assembly line identifying whether each product produced by the assembly line fails an approval metric. The method also includes enumerating a plurality of paths through the assembly line based on the tracking data and determining a failure rate for each of the plurality of paths based on the approval data. In addition, the method includes identifying a malfunctioning path included in the plurality of paths based on the failure rate for each of the plurality of paths, identifying a malfunctioning node based on the malfunctioning path, and performing an automatic action to address the malfunctioning node.
    Type: Grant
    Filed: January 17, 2017
    Date of Patent: October 1, 2019
    Assignee: Robert Bosch GmbH
    Inventors: Jeffrey Keating Thompson, Michael Frankmann, Goktug Tankut Cinar, Carlos Eduardo Cunha, Prasanth Lade
  • Patent number: 10423075
    Abstract: The present invention relates to methods and systems for designing gauge patterns that are extremely sensitive to parameter variation, and thus robust against random and repetitive measurement errors in calibration of a lithographic process utilized to image a target design having a plurality of features. The method may include identifying most sensitive line width/pitch combination with optimal assist feature placement which leads to most sensitive CD (or other lithography response parameter) changes against lithography process parameter variations, such as wavefront aberration parameter variation. The method may also include designing gauges which have more than one test patterns, such that a combined response of the gauge can be tailored to generate a certain response to wavefront-related or other lithographic process parameters. The sensitivity against parameter variation leads to robust performance against random measurement error and/or any other measurement error.
    Type: Grant
    Filed: December 18, 2014
    Date of Patent: September 24, 2019
    Assignee: ASML Netherlands B.V.
    Inventors: Hanying Feng, Yu Cao, Jun Ye, Youping Zhang
  • Patent number: 10416658
    Abstract: An operation management system according to the present invention stores manufacture facility information in which identification information capable of uniquely specifying a manufacture facility is associated with position information of the manufacture facility in a manufacture facility information storage unit, a management device acquires the manufacture facility information from the manufacture facility information storage unit, arranges the manufacture facility on an arrangement map based on the manufacture facility information, and conducts communication setting for acquiring operation information, and the management device acquires the operation information of the manufacture facility via communication based on the communication setting, and displays the acquired operation information on the arrangement map.
    Type: Grant
    Filed: June 17, 2016
    Date of Patent: September 17, 2019
    Assignee: FANUC CORPORATION
    Inventor: Arito Hashimoto
  • Patent number: 10406754
    Abstract: Apparatuses, systems and methods provide at least a controller for a print server which executes at least one additive manufacturing print process on an additive manufacturing printer. The disclosed embodiments may include a plurality of sensors capable of monitoring at least one of a build perimeter, a build height, and a build volume for an additive print build resultant from the additive manufacturing print; at least one processor associated with the print server and capable of receiving sensor data regarding the monitoring from the plurality of sensors, and comprising non-transitory computing code for applying to the sensor data a print process plan indicative of the additive print build; a comparator embedded in the non-transitory computing code for assessing a lack of compliance by the additive print build to the print process plan; and at least one modified output of the additive manufacturing print suitable to revise the compliance of the additive print build to the print process plan.
    Type: Grant
    Filed: October 3, 2017
    Date of Patent: September 10, 2019
    Assignee: JABIL INC.
    Inventors: William MacNeish, Erik Gjovik
  • Patent number: 10394231
    Abstract: A plant-monitoring system includes: at least three detection elements, the detection elements being at least one type of detection element for monitoring a subject being monitored; a detection network configured by disposing the at least three detection elements in a plant; a storage unit that receives detection data from each of the detection elements to record the detection data as recorded data; and a processing computing unit. The processing computing unit receives the detection data from each of the detection elements, determines presence or absence of a fault by comparing the detection data with the recorded data, and in a case where occurrence of a fault is recognized, identifies a place of occurrence of the fault based on the detection data, and transmits the result of the place of occurrence of the fault to a predetermined incident response team.
    Type: Grant
    Filed: December 9, 2016
    Date of Patent: August 27, 2019
    Assignee: MITSUBISHI HEAVY INDUSTRIES, LTD.
    Inventors: Wataru Matsubara, Naohiko Ishibashi, Ryo Kamito, Susumu Okino, Takeo Shinoda
  • Patent number: 10386818
    Abstract: Additive Manufacturing Quality Management (AMQM) systems and methods are provided, which enhance quality control across Additive Manufacturing (AM) supply chains from which AM components are obtained. In various embodiments, the AMQM system includes an AM machine utilized to produce AM components in accordance with AM design data. A first sensor is coupled to the AM machine and, during fabrication of AM components by the AM machine, captures sensor readings pertaining to the AM fabrication process. When executed by a processor, computer-executable code causes the AMQM system to: (i) compile part-specific sensor profiles from sensor readings captured by the first sensor during fabrication of the AM components, and (ii) generate user notifications indicating whether remedial action should be performed for any of the AM components based, at least in part, on conformance of the part-specific sensor profiles with a baseline sensor profile corresponding to the AM design data.
    Type: Grant
    Filed: June 9, 2017
    Date of Patent: August 20, 2019
    Assignee: HONEYWELL INTERNATIONAL INC.
    Inventors: Donald G Godfrey, Brian G Baughman, Soeren Wiener, Niranjan Kalyandurg
  • Patent number: 10377092
    Abstract: Systems and methods are provided for verifying the placement of tows by a robot. One embodiment includes a robot that includes an end effector that lays up tows, actuators that reposition the end effector, a memory storing a Numerical Control (NC) program, and a robot controller that directs the actuators to reposition the end effector based on the NC program, and instructs the end effector to lay up tows based on the NC program. The system also includes a sensor system comprising an imaging device that acquires images of the tows as the tows are laid-up, a measuring device that generates input as tows are laid-up by the end effector, and a sensor controller that receives images from the imaging device and the input from the measuring device, and updates stored data to correlate the images with instructions in the NC program, based on the input.
    Type: Grant
    Filed: November 8, 2018
    Date of Patent: August 13, 2019
    Assignee: The Boeing Company
    Inventors: Anthony W Baker, Steven A Dorris, Christopher P Bellavia, Hugh L Taylor, Luke C Ingram, Kenny P Bowers
  • Patent number: 10372114
    Abstract: A process control technique uses production data from multiple manufacturing tools and multiple inspection or metrology tools. Total measurement uncertainty (TMU) can be calculated on the production data, which can include measurements of one or more devices manufactured using the manufacturing tools. Manufacturing steps can be ranked or otherwise compared by TMU. All production modes and recipes can be continually monitored using production data.
    Type: Grant
    Filed: October 21, 2016
    Date of Patent: August 6, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Karen Biagini, Bryant Stanford Mantiply, Ravichander Jayantha Rao, Gary Taan
  • Patent number: 10375095
    Abstract: A framework is provided for modeling the activity surrounding user credentials and/or machine level activity on a computer network using computer event logs by viewing the logs attributed to each user as a multivariate data stream. The methodology performs well in detecting compromised user credentials at a very low false positive rate. Such a methodology may detect both users of compromised credentials by external actors and otherwise authorized users who have begun engaging in malicious activity.
    Type: Grant
    Filed: November 18, 2016
    Date of Patent: August 6, 2019
    Assignees: Triad National Security, LLC, IP2IPO Innovations Limited
    Inventors: Melissa J. M. Turcotte, Nicholas A. Heard, Alexander D. Kent
  • Patent number: 10372473
    Abstract: Mechanisms are provided for virtualizing physical sensors and providing sensor data to a requestor using the virtualized physical sensors. The mechanisms obtain sensor data from a plurality of physical sensors and storing the sensor data in a virtual sensor storage system of the data processing system in at least one standardized format. A request from a requestor for a first type of sensor data is received which does not specify a particular physical sensor. A portion of the sensor data stored in the virtual sensor storage system is retrieved in response to receiving the request, the portion of sensor data corresponding to the type of sensor data requested in the request from the requestor. The retrieved portion of the sensor data is returned to the requestor in a format corresponding to a physical sensor configured to provide the requested type of sensor data.
    Type: Grant
    Filed: April 4, 2016
    Date of Patent: August 6, 2019
    Assignee: International Business Machines Corporation
    Inventors: Marion L. Blount, Metin Feridun, Suzanne K. McIntosh, Iqbal I. Mohomed, Michael E. Nidd, Axel Tanner, Bo Yang
  • Patent number: 10357915
    Abstract: A method of analyzing preforms for potential bursting during forming and filling by injecting an incompressible liquid to shape the successive heating preforms into containers and fill the containers. The method defines at least one stress parameter correlated to the internal stress of the thermoplastic material of the preform and defines a range of acceptable values for the stress parameter. The method includes analyzing each successive initial preform and each successive heated preform, determining a value of the stress parameter, comparing the determined value to a range of acceptable values, and emitting an output signal when the determined value is outside the acceptable range of values.
    Type: Grant
    Filed: June 18, 2015
    Date of Patent: July 23, 2019
    Inventors: Mikael Derrien, Pascal Haboury
  • Patent number: 10348760
    Abstract: Systems and methods are disclosed for providing distributed denial-of-service (DDoS) mitigation service. The systems and methods may receive a request to access a web server from a user host, generate an integrated user challenge page including a user challenge test and a web page image of the web server, and transmits the integrated user challenge page to the user host. The systems and methods may further receive an answer to the user challenge test from the user host, determine whether the answer to the user challenge test is correct or not. When the answer to the user challenge test is correct, the systems and methods may establish a connection between the user host and the web server.
    Type: Grant
    Filed: October 22, 2012
    Date of Patent: July 9, 2019
    Assignee: VERISIGN, INC.
    Inventors: Mark Teodoro, Sean Leach
  • Patent number: 10331510
    Abstract: In order to reduce computation time and cost involved with detecting and diagnosing a fault in a system, simplified representations of components of the system are used to estimate valid intervals for state variables at the components. Generic failure rules are configured to compare the estimated valid intervals to related intervals for the same state variables, from either observations or propagations, for overlap. Failure output vectors are generated based on the comparison, and the failure output vectors are compared to diagnostic matrices to determine a source of the fault.
    Type: Grant
    Filed: May 23, 2012
    Date of Patent: June 25, 2019
    Assignee: SIEMENS CORPORATION
    Inventors: Gerhard Zimmermann, Yan Lu, George Lo
  • Patent number: 10295991
    Abstract: A substrate processing apparatus includes a data collection controller and an operation part. The data collection controller is configured to hold monitoring item list information and component management information. Each of the monitoring item list information and the component management information holds; monitoring item information indicative of a monitoring item for monitoring a maintenance component selected as a monitoring target; setting information for setting a threshold value of the maintenance component; monitoring data of the maintenance component; and monitoring information including a number of times of resetting by which the maintenance component is initialized, wherein the component management information is configured to hold the monitoring information for each unit including the maintenance component according to the monitoring item. The operation part provides the data collection controller with the monitoring data from device data collected from the unit.
    Type: Grant
    Filed: September 19, 2017
    Date of Patent: May 21, 2019
    Assignee: KOKUSAI ELECTRIC CORPORATION
    Inventor: Akihiko Yoneda
  • Patent number: 10291638
    Abstract: A cloud security system and method implements cloud activity threat detection using analysis of cloud usage user behavior. In particular, the cloud security system and method implements threat detection for users, cloud service providers, or tenants (enterprises) of the cloud security system who are new or unknown to the cloud security system and therefore lacking sufficient cloud activity data to generate an accurate behavior model for effective threat detection. In accordance with embodiments of the present invention, the cloud security system and method performs user behavior analysis to generate generalized user behavior models for user groups, where each user group includes users with similar cloud usage behavior. The user behavior models of the user groups are assigned to users with sparse cloud activity data. In this manner, the cloud security system and method of the present invention ensures effective threat detection by using accurate and reliable user behavior models.
    Type: Grant
    Filed: September 8, 2016
    Date of Patent: May 14, 2019
    Assignee: Skyhigh Networks, LLC
    Inventors: Sandeep Chandana, Santosh Raghuram Kumar, Sekhar Sarukkai, Satyanarayana Vummidi, Madhavi Kavathekar, Vinay Gupta
  • Patent number: 10266860
    Abstract: An apparatus that produces a sugar liquid by a method including hydrolyzing cellulose includes a hydrolysis tank to which a recovered enzyme feed pipe and a fresh enzyme feed pipe are connected; a device for solid-liquid separation of a hydrolysate; a sugar liquid-retaining tank having a water supply pipe that washes an ultrafiltration membrane and/or removes recovered enzyme retained in a circulation pipe; and an ultrafiltration membrane device that separates enzyme and a sugar liquid.
    Type: Grant
    Filed: March 9, 2017
    Date of Patent: April 23, 2019
    Assignee: Toray Industries, Inc.
    Inventors: Hiroyuki Kurihara, Atsushi Minamino, Yuki Yamamoto, Katsushige Yamada
  • Patent number: 10262272
    Abstract: Technologies are described herein for active machine learning. An active machine learning method can include initiating active machine learning through an active machine learning system configured to train an auxiliary machine learning model to produce at least one new labeled observation, refining a capacity of a target machine learning model based on the active machine learning, and retraining the auxiliary machine learning model with the at least one new labeled observation subsequent to refining the capacity of the target machine learning model. Additionally, the target machine learning model is a limited-capacity machine learning model according to the description provided herein.
    Type: Grant
    Filed: December 7, 2014
    Date of Patent: April 16, 2019
    Assignee: Microsoft Technology Licensing, LLC
    Inventors: David Maxwell Chickering, Christopher A. Meek, Patrice Y. Simard, Rishabh Krishnan Iyer
  • Patent number: 10262027
    Abstract: In a method, system, and computer-readable medium having instructions for executing a query in a database system, a query request is received with a query predicate to filter data returned in response to the query request and the query predicate has a formula, the query request is transformed to a transformed query request by preprocessing the formula in the query predicate, and the query request is optimized using the transformed query request.
    Type: Grant
    Filed: July 17, 2015
    Date of Patent: April 16, 2019
    Assignee: salesforce.com, inc.
    Inventors: Jesse Collins, Jaikumar Bathija
  • Patent number: 10262406
    Abstract: A simulator includes a measurement unit that performs image measurement of preliminarily obtained image data corresponding to processing performed using a visual sensor, an execution unit that executes a control operation for generating a control instruction directed to a processing device based on a measurement result obtained by the measurement unit and for generating a read instruction directed to the measurement unit for reading the image data, a storage unit that stores the image data read in response to the read instruction in a manner associated with information indicating a position or a displacement of a carrier serving as a reference for the image measurement performed in response to the read instruction, and a reproduction unit that reproduces a behavior of the created system based on time-series data for the control operation output from the execution unit and the information associated with the image data stored in the storage unit.
    Type: Grant
    Filed: November 3, 2016
    Date of Patent: April 16, 2019
    Assignee: OMRON Corporation
    Inventors: Yasunori Sakaguchi, Haruna Shimakawa, Katsushige Ohnuki, Ryo Ichimura
  • Patent number: 10223492
    Abstract: The process for design based assessment includes the following steps. First, the process defines multiple patterns of interest (POIs) utilizing design data of a device and then generates a design based classification database. Further, the process receives one or more inspection results. Then, the process compares the inspection results to each of the plurality of POIs in order to identify occurrences of the POIs in the inspection results. In turn, the process determines yield impact of each POI utilizing process yield data and monitors a frequency of occurrence of each of the POIs and the criticality of the POIs in order to identify process excursions of the device. Finally, the process determines a device risk level by calculating a normalized polygon frequency for the device utilizing a frequency of occurrence for each of the critical polygons and a criticality for each of the critical polygons.
    Type: Grant
    Filed: February 12, 2014
    Date of Patent: March 5, 2019
    Assignee: KLA-Tencor Corporation
    Inventors: Allen Park, Youseung Jin, Sungchan Cho, Barry Saville
  • Patent number: 10157072
    Abstract: A method for estimating power consumption by a target host involves estimating a per-workload in-scenario utilization function of time for each workload running on said host in said what-if scenario so as to yield per-workload in-scenario utilization functions of time. The utilization functions are aggregated to yield a target host utilization function of time. The target host utilization function of time is converted to a host power-consumption function of time.
    Type: Grant
    Filed: March 3, 2015
    Date of Patent: December 18, 2018
    Assignee: Hewlett Packard Enterprise Development LP
    Inventors: Phil Prasek, Alex Nazarov, Swayambhuba Kar
  • Patent number: 10152654
    Abstract: Methods and systems for creating an image-based measurement model based only on measured, image-based training data are presented. The trained, image-based measurement model is then used to calculate values of one or more parameters of interest directly from measured image data collected from other wafers. The image-based measurement models receive image data directly as input and provide values of parameters of interest as output. In some embodiments, the image-based measurement model enables the direct measurement of overlay error. In some embodiments, overlay error is determined from images of on-device structures. In some other embodiments, overlay error is determined from images of specialized target structures. In some embodiments, image data from multiple targets, image data collected by multiple metrologies, or both, is used for model building, training, and measurement. In some embodiments, an optimization algorithm automates the image-based measurement model building and training process.
    Type: Grant
    Filed: February 17, 2015
    Date of Patent: December 11, 2018
    Assignee: KLA-Tencor Corporation
    Inventor: Stilian Ivanov Pandev
  • Patent number: 10144183
    Abstract: Systems and methods are provided for verifying the placement of tows by a robot. One embodiment includes a robot that includes an end effector that lays up tows, actuators that reposition the end effector, a memory storing a Numerical Control (NC) program, and a robot controller that directs the actuators to reposition the end effector based on the NC program, and instructs the end effector to lay up tows based on the NC program. The system also includes a sensor system comprising an imaging device that acquires images of the tows as the tows are laid-up, a measuring device that generates input as tows are laid-up by the end effector, and a sensor controller that receives images from the imaging device and the input from the measuring device, and updates stored data to correlate the images with instructions in the NC program, based on the input.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: December 4, 2018
    Assignee: The Boeing Company
    Inventors: Anthony W Baker, Steven A Dorris, Christopher P Bellavia, Hugh L Taylor, Luke C Ingram, Kenny P Bowers
  • Patent number: 10148675
    Abstract: A computing resource service provider may provide customers with a block-level forensics service. Volume images of computing resource associated with customer may be generated and provided to the block-level forensics service. The block-level forensics service or component thereof may generate a volume based at least in part on the volume image and may perform forensics analysis of the volume. A result of the forensic analysis may be provided to the customer.
    Type: Grant
    Filed: March 30, 2016
    Date of Patent: December 4, 2018
    Assignee: Amazon Technologies, Inc.
    Inventors: Eric Jason Brandwine, Alexander Robin Gordon Lucas, Robert Eric Fitzgerald