Quality Control Patents (Class 700/109)
  • Patent number: 12240181
    Abstract: Deviations in a 3D printing process can be detected during printing via sensors or by user observation. A user can manipulate and evaluate any deviations from a 3D model via a simulation of the work-in-progress object via virtual reality. The user can also make changes to the model, resulting in the printer completing the same work-in-progress object based on the revised model.
    Type: Grant
    Filed: June 28, 2021
    Date of Patent: March 4, 2025
    Assignee: International Business Machines Corporation
    Inventors: Sathya Santhar, Samuel Mathew Jawaharlal, Balamurugaramanathan Sivaramalingam, Sarbajit K. Rakshit
  • Patent number: 12236280
    Abstract: An orchestration layer for execution user defined automation workflows. The orchestration layer may include multiple process instances that host user defined automation workflows that automate processes or tasks. To improve system performance and reduce operating costs, the user defined automation workflows are deployed to the orchestration layer in a standard format that standardizes the user defined workflow configurations. The orchestration layer may also dynamically scale the computational resources allocated to teach process instance based on the properties of each user defined automation workflow.
    Type: Grant
    Filed: April 6, 2021
    Date of Patent: February 25, 2025
    Assignee: Intuit Inc.
    Inventors: Siben Nayak, Govinda Sambamurthy, Nishant Sehgal, Anil Sharma, Srivatsan Vijayaraghavan, Suraj Menon, Shyamalendu Tripathy, Jatin Mahajan, Nivedita Nayak, Sachin Gupta
  • Patent number: 12226535
    Abstract: Disclosed are a microneedle patch including a first hydrogel layer containing a mussel adhesive protein and hyaluronic acid, and a second hydrogel layer containing silk fibroin, and a preparation method thereof. The microneedle patch according to the present disclosure has excellent tissue adhesion, biocompatibility, and biodegradability, and is used for transdermal drug delivery to promote wound regeneration.
    Type: Grant
    Filed: May 17, 2019
    Date of Patent: February 18, 2025
    Assignee: POSTECH ACADEMY-INDUSTRY FOUNDATION
    Inventors: Hyung Joon Cha, Eun Young Jeon, Jung Ho Lee, Geun Bae Lim
  • Patent number: 12174607
    Abstract: In a workpiece production method a plurality of nominally similar workpieces are produced in a production process on one production machine. The order or time of production of some of the workpieces on the production machine is recorded. Some of the workpieces recorded are measured at two or more inspection stations. Dimensions or points of one workpiece are measured at one of the inspection stations, and corresponding dimensions or points of another of the workpieces are measured at another of the inspection stations. The results of the measurements of corresponding dimensions or points made at the two or more inspection stations are analysed together, taking account of the order or time of production of the workpieces. An output signal is produced based on the analysing of the results together. The output signal indicates performance of the production machine or of one or more of the inspection stations.
    Type: Grant
    Filed: May 23, 2023
    Date of Patent: December 24, 2024
    Assignee: RENISHAW PLC
    Inventors: Kevyn Barry Jonas, Stephen Wisher-Davies
  • Patent number: 12169403
    Abstract: A method for monitoring the vitality of a number of participant devices of a distributed technical system, wherein each of the participant devices has a number of electronic components, comprises: continuously detecting a plurality of physical environmental and/or operating parameters in each of the participant devices and/or in each of the electronic components of the participant devices; storing for retrieval the plurality of physical environmental and/or operating parameters in a vitality data storage device; calculating for each of the electronic components, on the basis of the plurality of physical environmental and/or operating parameters, a number of statistical characteristics that form vitality parameters and that represent at least one of safety, reliability, or the availability of the electronic component; and initiating exception processing in response to a predefined or predefinable threshold value of a statistical characteristic being reached or exceeded.
    Type: Grant
    Filed: October 1, 2021
    Date of Patent: December 17, 2024
    Assignee: Pilz GmbH & Co. KG
    Inventor: Christoph Weishaar
  • Patent number: 12158404
    Abstract: A histology system includes a microtome configured to produce a tissue section from a tissue block, where the tissue section includes a tissue sample, a transfer system including a transfer medium to transfer the tissue section to a slide, and a vision system. The vision system includes an illumination system configured to illuminate the tissue section on the transfer medium and an imaging system configured to create imaging data of the tissue section on the transfer medium illuminated by the illumination system. The histology system further includes a processor to receive the imaging data and perform one or more quality control analysis based on the imaging data, where the one or more analysis includes a comparative analysis of the tissue section on the transfer medium with at least one of the tissue section on the tissue block or the tissue section on the slide.
    Type: Grant
    Filed: February 22, 2021
    Date of Patent: December 3, 2024
    Assignee: Clarapath, Inc.
    Inventors: Partha P. Mitra, Charles Cantor, Baris Yagci, David Kleinfeld, Cong Zhang
  • Patent number: 12140926
    Abstract: Aspects of the disclosed technology provide a computational model that utilizes machine learning for detecting errors during a manual assembly process and determining a sequence of steps to complete the manual assembly process in order to mitigate the detected errors. In some implementations, the disclosed technology evaluates a target object at a step of an assembly process where an error is detected to a nominal object to obtain a comparison. Based on this comparison, a sequence of steps for completion of the assembly process of the target object is obtained. The assembly instructions for creating the target object are adjusted based on this sequence of steps.
    Type: Grant
    Filed: July 17, 2023
    Date of Patent: November 12, 2024
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom
  • Patent number: 12138839
    Abstract: There is provided an injection molding machine management system including an injection molding machine configured to mold a molded article with injection molding, a peripheral device configured to perform a post-process of the injection molding, and a control device communicably coupled to the injection molding machine and the peripheral device. The injection molding machine management system includes a generating section configured to generate a common identifier for each of predetermined production units and transmit the common identifier to the peripheral device. Molding data concerning the injection molding and post-process data concerning the post-process are correlated with the common identifier.
    Type: Grant
    Filed: November 10, 2021
    Date of Patent: November 12, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Hiroki Minowa, Kazuhiko Tsuchimoto, Takuya Higuchi, Yuji Saito
  • Patent number: 12132729
    Abstract: A computer-implemented method is provided to automatically adjust a device setting of a plurality of networked devices. The method includes performing autonomously at a device of the plurality of networked devices, receiving a request to update a device setting to a new value, comparing a characteristic of the plurality of networked devices to a corresponding characteristic of the device, determining one or more similar devices of the plurality of devices that satisfy a similarity criteria based on a result of the comparison, and accessing the one or more similar devices to change the device setting of the one or more similar devices to the new value.
    Type: Grant
    Filed: September 29, 2020
    Date of Patent: October 29, 2024
    Assignee: Schneider Electric USA, Inc.
    Inventors: Kevin M. Jefferies, Matthew L. White, Richard K. Weiler, Alan E. Freeman
  • Patent number: 12117792
    Abstract: Systems and methods for automated workflow include assigning a set of first targets to an uncompiled first workflow. The uncompiled first workflow specifies a first set of process modules. Each such module is associated with a subset of unit operations. Each unit operation includes a time interval and specifies an instrument. For each target in the set of first targets, the uncompiled workflow is translated into an instance of a compiled first workflow that includes a linear temporal order of unit operations. This translating resolves a branch condition, nested condition, or loop condition of the uncompiled first workflow.
    Type: Grant
    Filed: November 3, 2023
    Date of Patent: October 15, 2024
    Assignee: LifeFoundry Inc.
    Inventors: Ran Chao, Jing Jiang, Shaoyu Meng
  • Patent number: 12111640
    Abstract: Computer systems support a production process with a first sub-process to process a chemical substance at a production site and with a second sub-process to analyze a physical sample of the chemical substance at a laboratory site. A process control system provides first type data (A) to identify physical samples, and a manufacturing system provides second type data (B) that are required to control a production process. Connector modules transmit the data (A, B) in a message to a laboratory system to obtain laboratory data, as an analysis result. The connector module that is associated with the laboratory system distributes the data according to the types. A control signal module derives a control signal for controlling the production process. This control signal closes a control loop for adjusting the first sub- process until the laboratory data shows compliance.
    Type: Grant
    Filed: February 18, 2020
    Date of Patent: October 8, 2024
    Assignee: BASF SE
    Inventors: Michael Pfaffmann, Henry Hoppe
  • Patent number: 12105741
    Abstract: Provided is a method of extracting a relational formula that relates two material property parameters from a textbook document using a computer and storing the extracted relational formula in a material property relationship database, which method enables search in consideration of a quantitative relationship between material properties. The information processing method according to the present invention comprises inputting a relational formula representing a relation between a pair of material property parameters in a material property relationship database storing pairs of mutually related material property parameters. Equation information representing a relational formula is extracted from read input data, and multiple variables constituting a relational formula and a relational formula specifying that relation are extracted from the equation information.
    Type: Grant
    Filed: February 9, 2021
    Date of Patent: October 1, 2024
    Assignee: NATIONAL INSTITUTE FOR MATERIALS SCIENCE
    Inventor: Michiko Yoshitake
  • Patent number: 12086050
    Abstract: An analysis system includes an analysis apparatus that analyzes a specimen managed in an analysis center and a server apparatus managed in a service center. A server apparatus stores a first reference specimen ID for identifying a first reference specimen and a first range based on a first reference value, in association with each other. The analysis apparatus analyzes the first reference specimen provided without notification of the first reference value and transmits to the server apparatus, the first reference specimen ID and an analytical value of the first reference specimen with which the first reference specimen ID is associated. When the server apparatus determines the received analytical value of the first reference specimen as not belonging to the first range stored in association with the received first reference specimen ID, the server apparatus provides an abnormality signal.
    Type: Grant
    Filed: June 21, 2021
    Date of Patent: September 10, 2024
    Assignee: SHIMADZU CORPORATION
    Inventors: Koki Yamamoto, Noriyuki Ojima
  • Patent number: 12079886
    Abstract: A method and system for dispatching a production order for a product within a distributed environment with several production lines LjSi distributed in one or several production sites Si. A production order for the product is received with a first list of required production parameters, with an ordered target value for each required production parameter. A nominal set of production lines LjSi is automatically determined that are capable of implementing the production of the product with respect to resource availability and sets are selected from a nominal set of production lines and from a production scenario. The system selects a first set, a second set and a third set of production lines from the nominal set and then automatically determines one or more optimal production lines for producing said product and then dispatches the production order to the optimal production line(s).
    Type: Grant
    Filed: March 31, 2022
    Date of Patent: September 3, 2024
    Assignee: Siemens Aktiengesellschaft
    Inventors: Giorgio Corsini, Andrea Loleo, Ernesto Montaldo, Ornella Tavani, Giovanni Venturi
  • Patent number: 12078982
    Abstract: A computer-implemented method for providing a trained function for performing a workpiece quality control includes receiving a plurality of training machining datasets, wherein different training high-frequency machining datasets are representative for the quality of different workpieces, transforming the plurality of training machining datasets into the time-frequency domain to generate a plurality of training time-frequency domain datasets, and training a function based on the plurality of training time-frequency domain datasets, wherein the function is based on an autoencoder. The autoencoder has input layers, output layers and a hidden layer. The plurality of training time-frequency domain datasets are provided to the input layers and the output layers during training, and a trained autoencoder function is outputted.
    Type: Grant
    Filed: February 17, 2021
    Date of Patent: September 3, 2024
    Assignee: Siemens Aktiengesellschaft
    Inventor: Adel Haghani
  • Patent number: 12072690
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Grant
    Filed: May 2, 2023
    Date of Patent: August 27, 2024
    Assignee: SYSMEX CORPORATION
    Inventor: Scott Lesher
  • Patent number: 12067858
    Abstract: A system may include a device that has one or more components that may perform one or more operations of an industrial automation system. The device may detect a change in an operation of the one or more components and generate a signal representative of the change. The system may also include one or more persistent display tags that may correspond to the one or more components. The one or more persistent display tags may receive the signal from the device and update a display in response to receiving the signal.
    Type: Grant
    Filed: March 10, 2022
    Date of Patent: August 20, 2024
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Corey Peterson, Alissa Shortreed
  • Patent number: 12057043
    Abstract: Provided are a display panel, a crack detection method, and a display apparatus. The display panel has a display area and a non-display area surrounding the display area. The display panel includes a crack detection line located in the non-display area. The crack detection line includes a main detection line and at least one auxiliary detection line. The auxiliary detection line includes a first end and a second end each being connected to the main detection line.
    Type: Grant
    Filed: April 19, 2023
    Date of Patent: August 6, 2024
    Assignee: WUHAN TIANMA MICRO-ELECTRONICS CO., LTD.
    Inventors: Chunhui Yang, Kang Yang
  • Patent number: 12020606
    Abstract: A display module includes a display panel and a detection circuit. The display panel has a display area and a bezel area located beside the display area. The display panel includes a first detection line disposed in the bezel area. The first detection line is coupled to at least one detection signal receiving terminal and at least one detection signal output terminal. The detection circuit is coupled to a detection signal input terminal and a first detection signal detecting terminal. The detection signal input terminal is coupled to the at least one detection signal receiving terminal, and the at least one detection signal output terminal is coupled to the first detection signal detecting terminal. The detection circuit is configured to: generate and transmit a detection signal to the first detection line; and receive the detection signal passing through the first detection line.
    Type: Grant
    Filed: November 9, 2021
    Date of Patent: June 25, 2024
    Assignees: CHENGDU BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., BOE TECHNOLOGY GROUP CO., LTD.
    Inventors: Zhongjie Wang, Lei Zhang, Guangran Guo
  • Patent number: 11989873
    Abstract: The inventive concepts provide a method of providing a stochastic prediction system. The method includes extracting contours of patterns corresponding to a first design layout from a plurality of scanning electron microscope (SEM) images, respectively, generating a first contour histogram image based on the contours, and training a stochastic prediction model by using the first contour histogram image as an output, and by using the first design layout and a first resist image, a first aerial image, a first slope map, a first density map, and/or a first photo map corresponding to the first design layout as inputs, in which the stochastic prediction model comprises a cycle generative adversarial network (GAN).
    Type: Grant
    Filed: October 7, 2021
    Date of Patent: May 21, 2024
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Wooyong Cho, Gun Huh
  • Patent number: 11960830
    Abstract: A method for production analysis includes: receiving production data at a processor from a plurality of tools spatially arranged within a manufacturing facility; creating a hierarchal topology of the data in the processor, wherein each level of the hierarchal topology is based on a different one of a plurality of static parameters that are selected from a list consisting of: a tool identifier, a batch identifier, and a spatial orientation; displaying, at a user interface implemented by the processor, a first analysis of a first level of the hierarchal topology, wherein the analysis contains parameters related to other levels of the hierarchal topology; receiving, via the user interface, a selection by a user of a first parameter displayed on the first analysis; and updating the user interface to display a second analysis of a second level of the hierarchal topology that is related to the first parameter.
    Type: Grant
    Filed: February 3, 2020
    Date of Patent: April 16, 2024
    Assignee: International Business Machines Corporation
    Inventors: Jonathan Fry, Cheng-Tin Luo, Cheng-Yi Lin, Dureseti Chidambarrao, Jang Sim
  • Patent number: 11959835
    Abstract: A system for optical interrogation of tissue samples, the system including: a microtome configured to section one or more tissue sections from a tissue block, the one or more tissue sections including one or more tissue samples; a transfer medium configured to gather the one or more tissue sections and to transfer the one or more tissue sections to one or more slides; and an optical interrogation system including an illumination system configured to illuminate the one or more tissue sections and an imaging system configured to perform an imaging analysis on the one or more tissue sections illuminated with the illumination system.
    Type: Grant
    Filed: October 22, 2021
    Date of Patent: April 16, 2024
    Assignee: Clarapath, Inc.
    Inventors: Partha P. Mitra, Charles R. Cantor, Baris Yagci, Steven Smith
  • Patent number: 11947338
    Abstract: Apparatuses and methods for dimensioning and modifying a part to be manufactured are provided. Part information for a part to be manufactured is received by a processor, where the part information includes a model and print of the part. Tolerance datum are extracted from the print and a manufacturability datum is determined as a function of the model and tolerance datum. Updated tolerance datum is generated and a manufacturability of the part is determined. A manufacturing quote and user feedback is provided.
    Type: Grant
    Filed: June 9, 2023
    Date of Patent: April 2, 2024
    Inventor: Shuji Usui
  • Patent number: 11940782
    Abstract: Provided are a product performance prediction modeling method and apparatus, a product performance prediction method, a product performance prediction system, a computer device, and a storage medium. The product performance prediction modeling method includes: acquiring first sample data, the first sample data including device outlier data generated in a process of manufacturing a product by a device; acquiring a production line configuration simulation parameter of a production line relating to a location of the device, and product information of the product manufactured by the production line; selecting a simulation model to perform simulation test on the performance of the product, to obtain product performance simulation data; and inputting the device outlier data, the production line configuration simulation parameter, the product information and the product performance simulation data into a machine learning model to perform machine learning training, to obtain a product performance prediction model.
    Type: Grant
    Filed: July 26, 2018
    Date of Patent: March 26, 2024
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Jing Wang, Hu Chen, Zhi Yong Peng
  • Patent number: 11933511
    Abstract: A testing platform tests an electrical and mechanical system such as an HVAC unit according to an algorithm that reduces the total testing time of the components of the system, while ensuring the safety of the system during system-wide testing. The platform uses constraints that are checked both before and during the testing to ensure that HVAC operating conditions are acceptable for starting and maintaining component tests. Preferably, the platform uses finite-state machines for each device to organize the component tests, allowing for monitoring of constraints and starting, pausing, and stopping component tests. Preferably, total test execution time is reduced by running component tests in parallel, running component tests based on loads of the components, or combinations of both.
    Type: Grant
    Filed: February 16, 2021
    Date of Patent: March 19, 2024
    Assignee: NEXTRACKER LLC
    Inventors: Bruce Christopher Wootton, Rory Joseph Timar, Colin Patrick Murphy, Francesco Borrelli, Allan Daly
  • Patent number: 11930599
    Abstract: A constitutive device quality determination server is communicably connected to an inspection device via the internet, the inspection device performing an inspection on a constitutive device configuring a board work machine by operating the constitutive device in accordance with to a type of the inspection, and includes an inspection data acquisition section that designates a predetermined type of the inspection for the inspection device and acquires inspection data obtained by the inspection by the inspection device, a determination section that determines quality of the constitutive device based on the acquired inspection data, and a transmission section that transmits a quality determination result determined by the determination section to a terminal device communicably connected over the internet.
    Type: Grant
    Filed: March 22, 2018
    Date of Patent: March 12, 2024
    Assignee: FUJI CORPORATION
    Inventors: Kazumi Hoshikawa, Hiroshi Murakami
  • Patent number: 11921789
    Abstract: An apparatus and method for training a search engine generates synthetic search arguments and target information that are provided to the search engine as training. A search argument simulator ingests product information and historical interaction data, determines relevant descriptors, creates compound descriptors, and creates candidate search arguments. A trainer checks the candidates against historical search arguments, identifies similar search arguments and determines likely search arguments that are used for training. An evaluator monitors search engine responses and triggers retraining of the search engine.
    Type: Grant
    Filed: September 19, 2019
    Date of Patent: March 5, 2024
    Assignee: MCMASTER-CARR SUPPLY COMPANY
    Inventors: Ben C. Callanta, Deric A. Bertrand, Gracelyn R. Newhouse, John N. Rosensweig, Bina M. Vasavda, Ross P. Kelly, Larry G. Kirby, Matthew T. Hayden, Emily R. Rapport
  • Patent number: 11880176
    Abstract: A system and method of simulating and optimizing industrial and other processes includes a computer that performs multivariate analysis of input variables and output variables to generate a data model of the operation of the process. For industrial applications, the input variables include process variables and the output variables include result variables from the operation of the industrial process. The data model determines contributions to changes in the output or result variables by the respective input or process variables and is provided to a predictive algorithm to identify parameter values for input or process variables expected to have a most significant impact on the output or result variables during performance of the process. The outputs of the predictive algorithm are parameter values that are provided as input or process variables to the industrial process for simulation or performance optimization or product recommendations/optimizations.
    Type: Grant
    Filed: July 28, 2022
    Date of Patent: January 23, 2024
    Assignee: 3M Innovative Properties Company
    Inventors: Maiken Givot, Mats E. Johansson, Lothar N. Tacke, Lars M. Wistrand, John N. Willcock
  • Patent number: 11828307
    Abstract: A method and a system are disclosed for detecting, isolating and estimating a degradation of a corresponding component of an actuator controlled by an actuator command signal, the method comprising obtaining a control signal of the actuator; obtaining a signal indicative of a displacement of the actuator; computing an envelope of admissible values for the displacement of the actuator; determining if the displacement of the actuator is outside the computed envelope and in the case where the displacement of the actuator is outside the computed enveloped computing an estimation of each parameter and state of the actuator; identifying at least one corresponding parameter responsible for causing the actuator displacement to be outside the computer envelope and providing an indication of the at least one corresponding parameter.
    Type: Grant
    Filed: January 7, 2020
    Date of Patent: November 28, 2023
    Assignee: THALES CANADA INC.
    Inventor: Fabien Castang
  • Patent number: 11829111
    Abstract: An intellectual quality management method is disclosed. A heatmap risk interface is created according to the required data and the parameter configuration which are calculated using a time dependent risk priority number (RPN) equation. An intellectual audit scheduling algorithm is defined via the heatmap risk interface to automatically generate at least one audit plan. An audit program corresponding to the audit plan is performed and a plurality of problem points are selected. Intellectual root cause category recommendation is performed to the questions points. intellectual corrective actions and preventive action recommendations are performed to the problem points according to the intellectual root cause category recommendation to obtain at least one optimum corrective action and at least one preventive action.
    Type: Grant
    Filed: August 12, 2021
    Date of Patent: November 28, 2023
    Assignee: Shenzhen Fullan Fugui Precision Industry Co., Ltd.
    Inventors: Yi-Hsiu Huang, Kuang-Hung Chiang, Ai-Jun Meng, Yu-Hsiang Tung, Min-Zhi Shen, Shyang-Yih Wang, Po-Chun Chang
  • Patent number: 11813800
    Abstract: A system and method for controlling the speed of both a continuous web and a bonding apparatus is provided in order to effectuate stronger bonds in the web. The bonding system includes a velocity changing device for increasing and decreasing a velocity of the web in a machine direction, an anvil and a corresponding ultrasonic horn that interact to form ultrasonic bonds on the web, and an anvil actuator configured to control a movement of the anvil. A control system is also included in the bonding system for controlling operation of the anvil actuator the velocity changing device, with the control system programmed to decrease a moving velocity of the web from a feed velocity to a bonding velocity as the web passes between the anvil and the ultrasonic horn and control movement of the anvil to synchronize the movement of the anvil with the moving velocity of the web.
    Type: Grant
    Filed: December 6, 2021
    Date of Patent: November 14, 2023
    Assignee: CURT G. JOA, INC.
    Inventors: David E. Schuette, Jeffrey W. Fritz, Justin M. Lafferty
  • Patent number: 11806877
    Abstract: Embodiments of present disclosure relate to adjusting a robot motion path. In the method for adjusting a robot motion path, a first processing procedure may be performed on a first workpiece to obtain a first product. Then, first process data may be obtained, where the first process data describes an attribute of the first processing procedure for obtaining the first product from the first workpiece. Next, based on the obtained first process data, a robot motion path of a second processing procedure that is to be performed on the first product by a robot may be adjusted. Further, embodiments of present disclosure provide apparatuses, systems, and computer readable media for adjusting a robot motion path.
    Type: Grant
    Filed: February 8, 2018
    Date of Patent: November 7, 2023
    Assignee: ABB Schweiz AG
    Inventors: Fangfang Zhao, Lei Mao, Shaojie Cheng
  • Patent number: 11797795
    Abstract: An intelligent speed regulation system of a connector production apparatus, including: a CCD detection system includes a CCD industrial camera and a CCD detection software module, wherein the CCD industrial camera is configured to shoot a connector plane picture; the CCD detection software module is configured to analyze and identify the connector plane picture, extract true position error value data and generate an error data table file; an intelligent speed regulation software unit configured to calculate an optimal operation speed value of the connector production apparatus according to the true position error value data of a connector; and a PLC apparatus configured to read the optimal operation speed value of the connector production apparatus, and control actions of mechanisms in the connector production apparatus to finish a speed regulation operation. The operation speed of the apparatus can be automatically adjusted according to quality of a connector product.
    Type: Grant
    Filed: August 26, 2022
    Date of Patent: October 24, 2023
    Assignee: SOOCHOW UNIVERSITY
    Inventors: Yihuai Wang, Lei Zhou, Wen Yu, Yuhua Zhang, Xin Liu
  • Patent number: 11789427
    Abstract: A method includes receiving one or more fingerprint dimensions to be used to generate a fingerprint. The method further includes receiving trace data associated with a manufacturing process. The method further includes applying the one or more fingerprint dimensions to the trace data to generate at least one feature. The method further includes generating the fingerprint based on the at least one feature. The method further includes causing, based on the fingerprint, performance of a corrective action associated with one or more manufacturing processes.
    Type: Grant
    Filed: October 26, 2021
    Date of Patent: October 17, 2023
    Assignee: Applied Materials, Inc.
    Inventors: James Robert Moyne, Jimmy Iskandar
  • Patent number: 11790255
    Abstract: Various systems and methods for modeling a manufacturing assembly line are disclosed herein. Some embodiments relate to operating a processor to receive cell data, extract feature data from the cell data, determine a plurality of faults, determine a priority level for each fault by applying the extracted feature data to a predictive model, determine at least one high priority fault, and generate at least one operator alert based on the at least one high priority fault.
    Type: Grant
    Filed: March 29, 2021
    Date of Patent: October 17, 2023
    Inventors: Nicholas Willison, Mehdi Sadeghzadeh, Masoud Kheradmandi, Bo Yuan Chang, Stephen Bacso, Yang Wang, Nick Foisy, Stanley Kleinikkink
  • Patent number: 11774937
    Abstract: A computer device comprises a logic system and a computer-memory system operatively coupled to the logic system. The computer-memory system holds instructions that, when executed by the logic system, cause the computer device to instantiate a node of a blockchain having verifiable provenance. The blockchain includes a requestor block configured to specify at least one requested feature of a requested product and an offerer block cryptographically linked to the requestor block. The offerer block includes data obtained by automated testing of an offered product, which reveals the level of compliance of the offered product with respect to the requested feature through product feature life cycle of validation, test, verification and acceptance.
    Type: Grant
    Filed: November 19, 2019
    Date of Patent: October 3, 2023
    Assignee: The Boeing Company
    Inventors: Robert M. Irwin, Kenneth Allen Hartsock
  • Patent number: 11764088
    Abstract: The subject of this invention is a method for testing the data and control interface of individual machines intended for interconnection in an inline system for solar cell production. Furthermore, an Interface-Tester suitable for executing the testing method is disclosed. The method for testing comprises the steps of feeding a dummy workpiece to the tested machine and connecting the interface tester to the standard interface of the machine. Consecutively the interface tester sends controlling signals to the machine and receives the signals from the tested machine. The received signals are compared to reference signals and evaluated. The interface tester comprises a standard interface for coupling the machines in an inline system for solar cell production. Furthermore, the interface tester is equipped with at least one CPU, a volatile and/or non-volatile memory, communication modules, couplers and connectors and at least one human-machine interface.
    Type: Grant
    Filed: March 4, 2020
    Date of Patent: September 19, 2023
    Assignees: CHINA TRIUMPH INTERNATIONAL ENGINEERING CO., LTD., CTF SOLAR GMBH
    Inventors: Shou Peng, Xinjian Yin, Ganhua Fu, Zhizhong Liao, Marcel Mischke, Michael Harr, Bastian Siepchen
  • Patent number: 11738476
    Abstract: The present invention relates to a magazine turret attachment for a portioning machine for dividing a strand-like product into individual portions and a portioning machine having such a magazine turret attachment. The magazine turret attachment includes a turret base rotatable about a rotation axis which has at least one chute extending through the turret base and the chute axis of which extends at least approximately parallel to the rotation axis of the turret base; and at least one first chute module which may be reversibly arranged on the turret base in the area of the first chute and which is provided with only one chute extending through said first chute module and the chute axis of which extends coaxially to the chute axis of the first chute of the turret base and the cross-section of which corresponds at least approximately to the cross-section of the at least one chute of the turret base in order to form a first reception chute for a strand-like product.
    Type: Grant
    Filed: December 18, 2019
    Date of Patent: August 29, 2023
    Assignee: Poly-clip System GmbH & Co. KG
    Inventor: Martin Bergmann
  • Patent number: 11740596
    Abstract: A field device, method, and non-transitory computer readable medium provide for cost of lost opportunity to operators in real-time using an advance process control. The field device includes a memory and a processor operably connected to the memory. The processor receives current values and average values for controlled variables and manipulated variables; determines costs of lost opportunity for each of controlled variable variance issues, limit issues, model quality issues, inferential quality issues, and variable model issues based on the current values and the average values of the controlled variables; and stores the costs of lost opportunity for the field device.
    Type: Grant
    Filed: March 25, 2021
    Date of Patent: August 29, 2023
    Assignee: HONEYWELL INTERNATIONAL INC.
    Inventors: Mandar Vartak, Christopher J. Webb, Michael Niemiec, Sriram Hallihole, Andrew John Trenchart, Sanjay Dave, Matthew G. Grizzle
  • Patent number: 11733659
    Abstract: An intellectual quality management method is disclosed. A heatmap risk interface is created according to the required data and the parameter configuration which are calculated using a time dependent risk priority number (RPN) equation. An intellectual audit scheduling algorithm is defined via the heatmap risk interface to automatically generate at least one audit plan. An audit program corresponding to the audit plan is performed and a plurality of problem points are selected. Intellectual root cause category recommendation is performed to the questions points. intellectual corrective actions and preventive action recommendations are performed to the problem points according to the intellectual root cause category recommendation to obtain at least one optimum corrective action and at least one preventive action.
    Type: Grant
    Filed: August 12, 2021
    Date of Patent: August 22, 2023
    Assignee: Shenzhen Fullan Fugui Precision Industry Co., Ltd.
    Inventors: Yi-Hsiu Huang, Kuang-Hung Chiang, Ai-Jun Meng, Yu-Hsiang Tung, Min-Zhi Shen, Shyang-Yih Wang, Po-Chun Chang
  • Patent number: 11718007
    Abstract: A state determination device is capable of assisting maintenance for various injection molding machines. The state determination device acquires data related to an injection molding machine, performs numeric conversion for extracting a feature in a temporal direction or an amplitude direction, with respect to time-series data of physical quantity in the acquired data, and performs machine learning using the data obtained through numeric conversion so as to generate a learning model.
    Type: Grant
    Filed: September 5, 2019
    Date of Patent: August 8, 2023
    Assignee: FANUC CORPORATION
    Inventors: Atsushi Horiuchi, Hiroyasu Asaoka, Kenjirou Shimizu
  • Patent number: 11693395
    Abstract: [Object] To appropriately produce a product generated by printing on a medium. [Solving Means] A production management system that manages production of a product generated by executing printing on a medium determines (S104, S114) a recommended condition of processing by an electronic device scheduled to be used for generation of a product, based on processing condition information indicating, for each step of generating the product, a relationship among quality of the product, a type and an installing place of the electronic device that performs at least one step of generating the product, and a recommended condition of processing by the electronic device, the target quality of the product, and the type and the installing place of the electronic device scheduled to be used for generating the product.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: July 4, 2023
    Assignee: MIMAKI ENGINEERING CO., LTD.
    Inventor: Yuhei Horiuchi
  • Patent number: 11687068
    Abstract: Conducting automatically a process failure mode and effect analysis, PFMEA, for a factory adapted to produce a product in a production process using a meta model, MM, stored or loaded in a data storage. The stored meta model, MM, comprises abstract factory model elements modeling an abstract factory, AF, including one or more service declarations modeling abstract services across different factories, wherein each service declaration comprises failure mode declarations for different failure modes.
    Type: Grant
    Filed: January 31, 2019
    Date of Patent: June 27, 2023
    Assignee: Siemens Aktiengesellschaft
    Inventors: Kai Höfig, Daniel Ratiu, Stefan Rothbauer
  • Patent number: 11681280
    Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.
    Type: Grant
    Filed: December 11, 2019
    Date of Patent: June 20, 2023
    Assignee: Andritz Inc.
    Inventors: Neeraj Nagpal, Peter Antensteiner
  • Patent number: 11675330
    Abstract: Aspects of the disclosed technology provide an Artificial Intelligence Process Control (AIPC) for automatically detecting errors in a manufacturing workflow of an assembly line process, and performing error mitigation through the update of instructions or guidance given to assembly operators at various stations. In some implementations, the disclosed technology utilizes one or more machine-learning models to perform error detection and/or propagate instructions/assembly modifications necessary to rectify detected errors or to improve the product of manufacture.
    Type: Grant
    Filed: October 25, 2021
    Date of Patent: June 13, 2023
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Matthew C. Putman, Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom
  • Patent number: 11673518
    Abstract: An engine harness for guiding a plurality of cables adjacent an internal combustion engine operatively connected to an electrical system of a vehicle by said plurality of cables along a cable path between the internal combustion engine and the electrical system, said engine harness substantially manufactured of a polymer foam thereby providing a protective sleeve for the plurality of cables, said engine harness further provided with at least one mount for mounting to the internal combustion engine; wherein the at least one mount comprises a bracket section embedded in the polymer foam of the engine harness and having at least two flanges extending from an outer surface of the engine harness to an interior of the engine harness, and a plug section, having a plug element extending outward from the outer surface of the engine harness along a centerline normal to the cable path, wherein said at least two flanges are arranged for centering the plurality of cables with the cable path in the engine harness; and wher
    Type: Grant
    Filed: March 28, 2022
    Date of Patent: June 13, 2023
    Assignee: DAF Trucks N.V.
    Inventor: Joe Antony
  • Patent number: 11675341
    Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.
    Type: Grant
    Filed: August 13, 2020
    Date of Patent: June 13, 2023
    Assignee: SYSMEX CORPORATION
    Inventor: Scott Lesher
  • Patent number: 11663292
    Abstract: An analytics engine is provided for industrial automation applications. The engine may be modular, and may be instantiated upon receipt of a data structure, such as containing annotated data from or relating to a monitored and/or controlled machine or process. The module may be data-driven so that it is instantiated only as needed, upon receipt of the input data structure. The module then carries out analysis on the data, and outputs a data structure that can be used for further analysis, or directly by other modules for modeling, classification, optimization and/or control.
    Type: Grant
    Filed: August 31, 2021
    Date of Patent: May 30, 2023
    Assignee: Rockwell Automation Technologies, Inc.
    Inventors: Bijan Sayyarrodsar, Alexander B. Smith, Kadir Liano
  • Patent number: 11662666
    Abstract: A method for controlling a lithographic apparatus configured to pattern an exposure field on a substrate including at least a sub-field, the method including: obtaining an initial spatial profile associated with a spatial variation of a performance parameter associated with a layer on the substrate across at least the sub-field of the exposure field; and decomposing the initial spatial profile into at least a first component spatial profile for controlling a lithographic apparatus at a first spatial scale and a second component spatial profile for controlling the lithographic apparatus at a second spatial scale associated with a size of the sub-field, wherein the decomposing includes co-optimizing the first and second component spatial profiles based on correcting the spatial variation of the performance parameter across the sub-field.
    Type: Grant
    Filed: March 5, 2020
    Date of Patent: May 30, 2023
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Rowin Meijerink, Putra Saputra, Pieter Gerardus Jacobus Smorenberg, Theo Wilhelmus Maria Thijssen, Khalid Elbattay, Ma Su Su Hlaing, Paul Derwin, Bo Zhong, Masaya Komatsu
  • Patent number: 11645639
    Abstract: In some embodiments, systems and methods are provided to monitor and adjust perpetual inventory (PI). Some embodiments comprise multiple point of sale (POS) systems; an inventory system and a perpetual inventory (PI) engine control circuit that receives inventory information and is configured to identify the occurrence of a plurality of different events each associated with a different product at a shopping facility and corresponding to a potential inconsistency in a determined inventory count; and for each of the events: identify a first set of inventory evaluation rules; apply the first set of inventory evaluation rules to determine a type of inventory count error; determine an inventory adjustment action to be implemented based on the first product and the determined error type; and cause the inventory adjustment action to be implemented in substantially real-time to adjust the determined inventory count of the first product at the first shopping facility.
    Type: Grant
    Filed: June 16, 2021
    Date of Patent: May 9, 2023
    Assignee: Walmart Apollo, LLC
    Inventors: Cristy C. Brooks, Benjamin D. Enssle, David B. Brightwell, Daniel R. Shields, Greg A. Bryan, Matthew A. Jones