Quality Control Patents (Class 700/109)
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Patent number: 11930599Abstract: A constitutive device quality determination server is communicably connected to an inspection device via the internet, the inspection device performing an inspection on a constitutive device configuring a board work machine by operating the constitutive device in accordance with to a type of the inspection, and includes an inspection data acquisition section that designates a predetermined type of the inspection for the inspection device and acquires inspection data obtained by the inspection by the inspection device, a determination section that determines quality of the constitutive device based on the acquired inspection data, and a transmission section that transmits a quality determination result determined by the determination section to a terminal device communicably connected over the internet.Type: GrantFiled: March 22, 2018Date of Patent: March 12, 2024Assignee: FUJI CORPORATIONInventors: Kazumi Hoshikawa, Hiroshi Murakami
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Search engine training apparatus and method and search engine trained using the apparatus and method
Patent number: 11921789Abstract: An apparatus and method for training a search engine generates synthetic search arguments and target information that are provided to the search engine as training. A search argument simulator ingests product information and historical interaction data, determines relevant descriptors, creates compound descriptors, and creates candidate search arguments. A trainer checks the candidates against historical search arguments, identifies similar search arguments and determines likely search arguments that are used for training. An evaluator monitors search engine responses and triggers retraining of the search engine.Type: GrantFiled: September 19, 2019Date of Patent: March 5, 2024Assignee: MCMASTER-CARR SUPPLY COMPANYInventors: Ben C. Callanta, Deric A. Bertrand, Gracelyn R. Newhouse, John N. Rosensweig, Bina M. Vasavda, Ross P. Kelly, Larry G. Kirby, Matthew T. Hayden, Emily R. Rapport -
Patent number: 11880176Abstract: A system and method of simulating and optimizing industrial and other processes includes a computer that performs multivariate analysis of input variables and output variables to generate a data model of the operation of the process. For industrial applications, the input variables include process variables and the output variables include result variables from the operation of the industrial process. The data model determines contributions to changes in the output or result variables by the respective input or process variables and is provided to a predictive algorithm to identify parameter values for input or process variables expected to have a most significant impact on the output or result variables during performance of the process. The outputs of the predictive algorithm are parameter values that are provided as input or process variables to the industrial process for simulation or performance optimization or product recommendations/optimizations.Type: GrantFiled: July 28, 2022Date of Patent: January 23, 2024Assignee: 3M Innovative Properties CompanyInventors: Maiken Givot, Mats E. Johansson, Lothar N. Tacke, Lars M. Wistrand, John N. Willcock
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Patent number: 11829111Abstract: An intellectual quality management method is disclosed. A heatmap risk interface is created according to the required data and the parameter configuration which are calculated using a time dependent risk priority number (RPN) equation. An intellectual audit scheduling algorithm is defined via the heatmap risk interface to automatically generate at least one audit plan. An audit program corresponding to the audit plan is performed and a plurality of problem points are selected. Intellectual root cause category recommendation is performed to the questions points. intellectual corrective actions and preventive action recommendations are performed to the problem points according to the intellectual root cause category recommendation to obtain at least one optimum corrective action and at least one preventive action.Type: GrantFiled: August 12, 2021Date of Patent: November 28, 2023Assignee: Shenzhen Fullan Fugui Precision Industry Co., Ltd.Inventors: Yi-Hsiu Huang, Kuang-Hung Chiang, Ai-Jun Meng, Yu-Hsiang Tung, Min-Zhi Shen, Shyang-Yih Wang, Po-Chun Chang
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Patent number: 11828307Abstract: A method and a system are disclosed for detecting, isolating and estimating a degradation of a corresponding component of an actuator controlled by an actuator command signal, the method comprising obtaining a control signal of the actuator; obtaining a signal indicative of a displacement of the actuator; computing an envelope of admissible values for the displacement of the actuator; determining if the displacement of the actuator is outside the computed envelope and in the case where the displacement of the actuator is outside the computed enveloped computing an estimation of each parameter and state of the actuator; identifying at least one corresponding parameter responsible for causing the actuator displacement to be outside the computer envelope and providing an indication of the at least one corresponding parameter.Type: GrantFiled: January 7, 2020Date of Patent: November 28, 2023Assignee: THALES CANADA INC.Inventor: Fabien Castang
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Patent number: 11813800Abstract: A system and method for controlling the speed of both a continuous web and a bonding apparatus is provided in order to effectuate stronger bonds in the web. The bonding system includes a velocity changing device for increasing and decreasing a velocity of the web in a machine direction, an anvil and a corresponding ultrasonic horn that interact to form ultrasonic bonds on the web, and an anvil actuator configured to control a movement of the anvil. A control system is also included in the bonding system for controlling operation of the anvil actuator the velocity changing device, with the control system programmed to decrease a moving velocity of the web from a feed velocity to a bonding velocity as the web passes between the anvil and the ultrasonic horn and control movement of the anvil to synchronize the movement of the anvil with the moving velocity of the web.Type: GrantFiled: December 6, 2021Date of Patent: November 14, 2023Assignee: CURT G. JOA, INC.Inventors: David E. Schuette, Jeffrey W. Fritz, Justin M. Lafferty
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Patent number: 11806877Abstract: Embodiments of present disclosure relate to adjusting a robot motion path. In the method for adjusting a robot motion path, a first processing procedure may be performed on a first workpiece to obtain a first product. Then, first process data may be obtained, where the first process data describes an attribute of the first processing procedure for obtaining the first product from the first workpiece. Next, based on the obtained first process data, a robot motion path of a second processing procedure that is to be performed on the first product by a robot may be adjusted. Further, embodiments of present disclosure provide apparatuses, systems, and computer readable media for adjusting a robot motion path.Type: GrantFiled: February 8, 2018Date of Patent: November 7, 2023Assignee: ABB Schweiz AGInventors: Fangfang Zhao, Lei Mao, Shaojie Cheng
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Patent number: 11797795Abstract: An intelligent speed regulation system of a connector production apparatus, including: a CCD detection system includes a CCD industrial camera and a CCD detection software module, wherein the CCD industrial camera is configured to shoot a connector plane picture; the CCD detection software module is configured to analyze and identify the connector plane picture, extract true position error value data and generate an error data table file; an intelligent speed regulation software unit configured to calculate an optimal operation speed value of the connector production apparatus according to the true position error value data of a connector; and a PLC apparatus configured to read the optimal operation speed value of the connector production apparatus, and control actions of mechanisms in the connector production apparatus to finish a speed regulation operation. The operation speed of the apparatus can be automatically adjusted according to quality of a connector product.Type: GrantFiled: August 26, 2022Date of Patent: October 24, 2023Assignee: SOOCHOW UNIVERSITYInventors: Yihuai Wang, Lei Zhou, Wen Yu, Yuhua Zhang, Xin Liu
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Patent number: 11789427Abstract: A method includes receiving one or more fingerprint dimensions to be used to generate a fingerprint. The method further includes receiving trace data associated with a manufacturing process. The method further includes applying the one or more fingerprint dimensions to the trace data to generate at least one feature. The method further includes generating the fingerprint based on the at least one feature. The method further includes causing, based on the fingerprint, performance of a corrective action associated with one or more manufacturing processes.Type: GrantFiled: October 26, 2021Date of Patent: October 17, 2023Assignee: Applied Materials, Inc.Inventors: James Robert Moyne, Jimmy Iskandar
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Patent number: 11790255Abstract: Various systems and methods for modeling a manufacturing assembly line are disclosed herein. Some embodiments relate to operating a processor to receive cell data, extract feature data from the cell data, determine a plurality of faults, determine a priority level for each fault by applying the extracted feature data to a predictive model, determine at least one high priority fault, and generate at least one operator alert based on the at least one high priority fault.Type: GrantFiled: March 29, 2021Date of Patent: October 17, 2023Inventors: Nicholas Willison, Mehdi Sadeghzadeh, Masoud Kheradmandi, Bo Yuan Chang, Stephen Bacso, Yang Wang, Nick Foisy, Stanley Kleinikkink
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Patent number: 11774937Abstract: A computer device comprises a logic system and a computer-memory system operatively coupled to the logic system. The computer-memory system holds instructions that, when executed by the logic system, cause the computer device to instantiate a node of a blockchain having verifiable provenance. The blockchain includes a requestor block configured to specify at least one requested feature of a requested product and an offerer block cryptographically linked to the requestor block. The offerer block includes data obtained by automated testing of an offered product, which reveals the level of compliance of the offered product with respect to the requested feature through product feature life cycle of validation, test, verification and acceptance.Type: GrantFiled: November 19, 2019Date of Patent: October 3, 2023Assignee: The Boeing CompanyInventors: Robert M. Irwin, Kenneth Allen Hartsock
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Patent number: 11764088Abstract: The subject of this invention is a method for testing the data and control interface of individual machines intended for interconnection in an inline system for solar cell production. Furthermore, an Interface-Tester suitable for executing the testing method is disclosed. The method for testing comprises the steps of feeding a dummy workpiece to the tested machine and connecting the interface tester to the standard interface of the machine. Consecutively the interface tester sends controlling signals to the machine and receives the signals from the tested machine. The received signals are compared to reference signals and evaluated. The interface tester comprises a standard interface for coupling the machines in an inline system for solar cell production. Furthermore, the interface tester is equipped with at least one CPU, a volatile and/or non-volatile memory, communication modules, couplers and connectors and at least one human-machine interface.Type: GrantFiled: March 4, 2020Date of Patent: September 19, 2023Assignees: CHINA TRIUMPH INTERNATIONAL ENGINEERING CO., LTD., CTF SOLAR GMBHInventors: Shou Peng, Xinjian Yin, Ganhua Fu, Zhizhong Liao, Marcel Mischke, Michael Harr, Bastian Siepchen
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Patent number: 11738476Abstract: The present invention relates to a magazine turret attachment for a portioning machine for dividing a strand-like product into individual portions and a portioning machine having such a magazine turret attachment. The magazine turret attachment includes a turret base rotatable about a rotation axis which has at least one chute extending through the turret base and the chute axis of which extends at least approximately parallel to the rotation axis of the turret base; and at least one first chute module which may be reversibly arranged on the turret base in the area of the first chute and which is provided with only one chute extending through said first chute module and the chute axis of which extends coaxially to the chute axis of the first chute of the turret base and the cross-section of which corresponds at least approximately to the cross-section of the at least one chute of the turret base in order to form a first reception chute for a strand-like product.Type: GrantFiled: December 18, 2019Date of Patent: August 29, 2023Assignee: Poly-clip System GmbH & Co. KGInventor: Martin Bergmann
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Patent number: 11740596Abstract: A field device, method, and non-transitory computer readable medium provide for cost of lost opportunity to operators in real-time using an advance process control. The field device includes a memory and a processor operably connected to the memory. The processor receives current values and average values for controlled variables and manipulated variables; determines costs of lost opportunity for each of controlled variable variance issues, limit issues, model quality issues, inferential quality issues, and variable model issues based on the current values and the average values of the controlled variables; and stores the costs of lost opportunity for the field device.Type: GrantFiled: March 25, 2021Date of Patent: August 29, 2023Assignee: HONEYWELL INTERNATIONAL INC.Inventors: Mandar Vartak, Christopher J. Webb, Michael Niemiec, Sriram Hallihole, Andrew John Trenchart, Sanjay Dave, Matthew G. Grizzle
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Patent number: 11733659Abstract: An intellectual quality management method is disclosed. A heatmap risk interface is created according to the required data and the parameter configuration which are calculated using a time dependent risk priority number (RPN) equation. An intellectual audit scheduling algorithm is defined via the heatmap risk interface to automatically generate at least one audit plan. An audit program corresponding to the audit plan is performed and a plurality of problem points are selected. Intellectual root cause category recommendation is performed to the questions points. intellectual corrective actions and preventive action recommendations are performed to the problem points according to the intellectual root cause category recommendation to obtain at least one optimum corrective action and at least one preventive action.Type: GrantFiled: August 12, 2021Date of Patent: August 22, 2023Assignee: Shenzhen Fullan Fugui Precision Industry Co., Ltd.Inventors: Yi-Hsiu Huang, Kuang-Hung Chiang, Ai-Jun Meng, Yu-Hsiang Tung, Min-Zhi Shen, Shyang-Yih Wang, Po-Chun Chang
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Patent number: 11718007Abstract: A state determination device is capable of assisting maintenance for various injection molding machines. The state determination device acquires data related to an injection molding machine, performs numeric conversion for extracting a feature in a temporal direction or an amplitude direction, with respect to time-series data of physical quantity in the acquired data, and performs machine learning using the data obtained through numeric conversion so as to generate a learning model.Type: GrantFiled: September 5, 2019Date of Patent: August 8, 2023Assignee: FANUC CORPORATIONInventors: Atsushi Horiuchi, Hiroyasu Asaoka, Kenjirou Shimizu
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Patent number: 11693395Abstract: [Object] To appropriately produce a product generated by printing on a medium. [Solving Means] A production management system that manages production of a product generated by executing printing on a medium determines (S104, S114) a recommended condition of processing by an electronic device scheduled to be used for generation of a product, based on processing condition information indicating, for each step of generating the product, a relationship among quality of the product, a type and an installing place of the electronic device that performs at least one step of generating the product, and a recommended condition of processing by the electronic device, the target quality of the product, and the type and the installing place of the electronic device scheduled to be used for generating the product.Type: GrantFiled: November 21, 2019Date of Patent: July 4, 2023Assignee: MIMAKI ENGINEERING CO., LTD.Inventor: Yuhei Horiuchi
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Patent number: 11687068Abstract: Conducting automatically a process failure mode and effect analysis, PFMEA, for a factory adapted to produce a product in a production process using a meta model, MM, stored or loaded in a data storage. The stored meta model, MM, comprises abstract factory model elements modeling an abstract factory, AF, including one or more service declarations modeling abstract services across different factories, wherein each service declaration comprises failure mode declarations for different failure modes.Type: GrantFiled: January 31, 2019Date of Patent: June 27, 2023Assignee: Siemens AktiengesellschaftInventors: Kai Höfig, Daniel Ratiu, Stefan Rothbauer
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Patent number: 11681280Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing material processing. In one aspect, a method includes collecting, from a set of sensors, a set of current manufacturing conditions. Based on the set of current manufacturing conditions collected from the sensors, a set of current qualities of a material currently being processed by manufacturing equipment is determined. A baseline production measure for processing the material according to the set of current qualities is obtained. A candidate set of manufacturing conditions that provide an improved production measure relative to the baseline production measure is determined. A set of candidate qualities for the material produced under the candidate set of manufacturing conditions is determined. A visualization that presents both of the set of candidate qualities of the material and the set of current qualities of the material currently being processed is generated.Type: GrantFiled: December 11, 2019Date of Patent: June 20, 2023Assignee: Andritz Inc.Inventors: Neeraj Nagpal, Peter Antensteiner
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Patent number: 11673518Abstract: An engine harness for guiding a plurality of cables adjacent an internal combustion engine operatively connected to an electrical system of a vehicle by said plurality of cables along a cable path between the internal combustion engine and the electrical system, said engine harness substantially manufactured of a polymer foam thereby providing a protective sleeve for the plurality of cables, said engine harness further provided with at least one mount for mounting to the internal combustion engine; wherein the at least one mount comprises a bracket section embedded in the polymer foam of the engine harness and having at least two flanges extending from an outer surface of the engine harness to an interior of the engine harness, and a plug section, having a plug element extending outward from the outer surface of the engine harness along a centerline normal to the cable path, wherein said at least two flanges are arranged for centering the plurality of cables with the cable path in the engine harness; and wherType: GrantFiled: March 28, 2022Date of Patent: June 13, 2023Assignee: DAF Trucks N.V.Inventor: Joe Antony
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Patent number: 11675341Abstract: A method for performing quality control on a diagnostic analyzer includes receiving control measurement values from each of a plurality of diagnostic analyzers. A quality control measurement value is received from a target diagnostic analyzer. The quality control measurement value is compared with statistical criteria associated with the plurality of quality control measurement values received from the plurality of diagnostic analyzers. A comparison result is communicated to a user interface associated with the target diagnostic analyzer.Type: GrantFiled: August 13, 2020Date of Patent: June 13, 2023Assignee: SYSMEX CORPORATIONInventor: Scott Lesher
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Patent number: 11675330Abstract: Aspects of the disclosed technology provide an Artificial Intelligence Process Control (AIPC) for automatically detecting errors in a manufacturing workflow of an assembly line process, and performing error mitigation through the update of instructions or guidance given to assembly operators at various stations. In some implementations, the disclosed technology utilizes one or more machine-learning models to perform error detection and/or propagate instructions/assembly modifications necessary to rectify detected errors or to improve the product of manufacture.Type: GrantFiled: October 25, 2021Date of Patent: June 13, 2023Assignee: Nanotronics Imaging, Inc.Inventors: Matthew C. Putman, Vadim Pinskiy, Eun-Sol Kim, Andrew Sundstrom
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Patent number: 11662666Abstract: A method for controlling a lithographic apparatus configured to pattern an exposure field on a substrate including at least a sub-field, the method including: obtaining an initial spatial profile associated with a spatial variation of a performance parameter associated with a layer on the substrate across at least the sub-field of the exposure field; and decomposing the initial spatial profile into at least a first component spatial profile for controlling a lithographic apparatus at a first spatial scale and a second component spatial profile for controlling the lithographic apparatus at a second spatial scale associated with a size of the sub-field, wherein the decomposing includes co-optimizing the first and second component spatial profiles based on correcting the spatial variation of the performance parameter across the sub-field.Type: GrantFiled: March 5, 2020Date of Patent: May 30, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Rowin Meijerink, Putra Saputra, Pieter Gerardus Jacobus Smorenberg, Theo Wilhelmus Maria Thijssen, Khalid Elbattay, Ma Su Su Hlaing, Paul Derwin, Bo Zhong, Masaya Komatsu
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Patent number: 11663292Abstract: An analytics engine is provided for industrial automation applications. The engine may be modular, and may be instantiated upon receipt of a data structure, such as containing annotated data from or relating to a monitored and/or controlled machine or process. The module may be data-driven so that it is instantiated only as needed, upon receipt of the input data structure. The module then carries out analysis on the data, and outputs a data structure that can be used for further analysis, or directly by other modules for modeling, classification, optimization and/or control.Type: GrantFiled: August 31, 2021Date of Patent: May 30, 2023Assignee: Rockwell Automation Technologies, Inc.Inventors: Bijan Sayyarrodsar, Alexander B. Smith, Kadir Liano
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Patent number: 11645639Abstract: In some embodiments, systems and methods are provided to monitor and adjust perpetual inventory (PI). Some embodiments comprise multiple point of sale (POS) systems; an inventory system and a perpetual inventory (PI) engine control circuit that receives inventory information and is configured to identify the occurrence of a plurality of different events each associated with a different product at a shopping facility and corresponding to a potential inconsistency in a determined inventory count; and for each of the events: identify a first set of inventory evaluation rules; apply the first set of inventory evaluation rules to determine a type of inventory count error; determine an inventory adjustment action to be implemented based on the first product and the determined error type; and cause the inventory adjustment action to be implemented in substantially real-time to adjust the determined inventory count of the first product at the first shopping facility.Type: GrantFiled: June 16, 2021Date of Patent: May 9, 2023Assignee: Walmart Apollo, LLCInventors: Cristy C. Brooks, Benjamin D. Enssle, David B. Brightwell, Daniel R. Shields, Greg A. Bryan, Matthew A. Jones
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Patent number: 11630450Abstract: A quality control device that controls quality of a product manufactured through a plurality of processes, includes a prediction model generation unit that generates a prediction model to predict quality of a product with respect to unknown process data by performing learning using known process data obtained from the plurality of processes and a measured value of quality of the product with respect to the known process data as learning data; a quality prediction unit that derives a predictive value of quality of each of a plurality of products, which are manufactured after the prediction model is generated, on the basis of the prediction model using process data of the plurality of products as input data; and an inspection target decision unit that decides the product for which the predictive value having the smallest margin with respect to a preset standard is obtained as an inspection target, among the plurality of predictive values of quality obtained by the quality prediction unit.Type: GrantFiled: December 9, 2020Date of Patent: April 18, 2023Assignee: FUJIFILM CORPORATIONInventors: Yu Tokuno, Shinichi Sugawara
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Patent number: 11625147Abstract: A system and method for displaying a combination of automation data collected from one or more assets and analog data collected from a system or element related to the assets can be simultaneously displayed on the display screen in a plurality of concurrently displayed cycle displays. In response to a user input to the display screen, the data display is dynamically manipulated to display varying numbers of operating cycles of the assets and the associated analog data collected in real time with the performance of the operating cycles, such that patterns and/or correlations between the analog data and automation data over a displayed timeline can be viewed and analyzed. The automation data is visually differentiated to indicate a condition state of the operating cycle and assets in real time.Type: GrantFiled: November 18, 2020Date of Patent: April 11, 2023Assignee: BEET, Inc.Inventor: Brock Matthew Coffee
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Patent number: 11599690Abstract: A computing device includes a processor and a storage device. A wafer asset modeling module is stored in the storage device and is executed by the processor to configure the computing device to perform acts identifying and clustering a plurality of assets based on static properties of a wafer asset using a first module of the wafer asset modeling module. The clustered plurality of assets is determined based on dynamic properties of the wafer asset using a second module of the wafer asset modeling module. Event prediction is performed by converting a numeric data of the clustered plurality of assets to a natural language processing (NLP) domain by a third module of the wafer asset modeling module. One or more sequence-to-sequence methods are performed to predict a malfunction of a component of the wafer asset and/or an event based on past patterns. Prediction information is stored in the storage device.Type: GrantFiled: July 20, 2020Date of Patent: March 7, 2023Assignee: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Elham Khabiri, Anuradha Bhamidipaty, Robert Jeffrey Baseman, Chandrasekhara K. Reddy, Srideepika Jayaraman
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Patent number: 11592807Abstract: A manufacturing defect factor searching method includes: classifying manufacturing monitoring data into a set of non-defective products having an inspection result indicating a non-defective product and a set of defective products having the inspection result indicating a defective product, in accordance with a correspondence relationship between the manufacturing monitoring data and product inspection data indicating the inspection result of the product manufactured in the manufacturing line, the manufacturing monitoring data being collected from a manufacturing line of a product and being multivariate; estimating, for each item of the manufacturing monitoring data, a mixture distribution function approximating to a statistical distribution of each of the set of non-defective products and the set of defective products; resolving the mixture distribution function into components; and generating a list of items including a resolved component having a correlation with a manufacturing quality defect from among iType: GrantFiled: April 1, 2021Date of Patent: February 28, 2023Assignee: Hitachi, Ltd.Inventor: Kenji Tamaki
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Patent number: 11586184Abstract: A system and a method for managing a buffer system contain compartments for stocking contents needed for a production of products. The method includes: a) a determination from an initial configuration of the buffer system and a stack of orders of a production cycle and a configuration of the buffer system enabling an execution of the production cycle. The determination is completed by carrying out a virtual filling of the compartments with content required by the orders; b) providing instructions controlling content filling/emptying actions to a transport system for filling and/or emptying compartments; c) triggering an execution of the production cycle by the production equipment while recording usage of buffer system content; and d) updating the stack of orders after the end of the execution of the production cycle by removing from the stack of orders all orders which have been fully executed during the execution of the production cycle.Type: GrantFiled: March 16, 2020Date of Patent: February 21, 2023Assignee: Siemens AktiengesellschaftInventors: Ernesto Montaldo, Jens Schnittger, Giovanni Venturi
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Patent number: 11574828Abstract: A substrate processing apparatus that accommodates a substrate holder in which a substrate is placed in a processing container and forms a film onto the substrate, includes: a film thickness meter that measures a thickness of the film formed on the substrate; a state analysis unit that analyzes variation of the film thickness from a measurement result output from the film thickness meter at a plurality of measurement points where the film thickness on the substrate is measured; a singular point detection unit that, based on the analysis result, detects a measurement point where a difference from an adjacent measurement point deviates from a predetermined condition, as a singular point; and a singular point correction unit that corrects a measurement result of the singular point so that the difference of the film thickness between the singular point and the adjacent measurement point is within a predetermined condition.Type: GrantFiled: July 10, 2020Date of Patent: February 7, 2023Assignee: TOKYO ELECTRON LIMITEDInventor: Youngtai Kang
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Patent number: 11556555Abstract: The disclosed embodiments relate to a system that automatically selects a prognostic-surveillance technique to analyze a set of time-series signals. During operation, the system receives the set of time-series signals obtained from sensors in a monitored system. Next, the system determines whether the set of time-series signals is univariate or multivariate. When the set of time-series signals is multivariate, the system determines if there exist cross-correlations among signals in the set of time-series signals. If so, the system performs subsequent prognostic-surveillance operations by analyzing the cross-correlations. Otherwise, if the set of time-series signals is univariate, the system performs subsequent prognostic-surveillance operations by analyzing serial correlations for the univariate time-series signal.Type: GrantFiled: October 27, 2020Date of Patent: January 17, 2023Assignee: Oracle International CorporationInventors: Kenny C. Gross, Aakash K. Chotrani, Beiwen Guo, Guang C. Wang, Alan P. Wood, Matthew T. Gerdes
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Patent number: 11543811Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.Type: GrantFiled: January 5, 2018Date of Patent: January 3, 2023Assignee: Etegent Technologies Ltd.Inventors: Joseph M. Kesler, Thomas D. Sharp, Uriah M. Ligget, Brian Bahr, Chris M. Hodapp, Gary E. Coyan
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Patent number: 11521140Abstract: A work object processing apparatus includes: a message thread processing unit configured to be displayed through a chat room of an Internet messenger associated with a message thread, to receive a work object including a work producer, a work processor, and work contents, and to process a work object operation on the message thread; and a work object processing unit configured to process a work object state of the work object changed, from among a plurality of work object states of the work object included in a work processing diagram, based on a work interaction between the work producer and the work processor.Type: GrantFiled: October 30, 2020Date of Patent: December 6, 2022Assignees: DELTA PDS CO., LTD.Inventors: Hyun Kyu Choi, Dong Kyu Choi, Jae Ho Choi
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Patent number: 11480941Abstract: To provide an analysis device, an analysis method, and an analysis program capable of analyzing a machining state while associating machine data output during operation of a machine tool and measured data containing the size of an actual machined part measured by a measuring machine with each other. An analysis device comprises: a collection unit that collects an aggregate of machine data output during operation of a machine tool and an aggregate of measured data containing measurement points where the size of a machined part machined by the machine tool has been measured by a measuring instrument; and a feature extraction unit that selects machine data corresponding to an arbitrary measurement point, in the aggregate of the measured data from the aggregate of the machine data, and extracts the selected machine data as a feature at the arbitrary measurement point.Type: GrantFiled: April 29, 2019Date of Patent: October 25, 2022Assignee: FANUC CORPORATIONInventors: Masao Kamiguchi, Noboru Kurokami, Shinichi Ogawa, Yuuya Miyahara, Yasushi Okajima
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Patent number: 11474513Abstract: A method for visualizing process data in which a process control system controls and monitors an industrial technology plant, wherein the process control system automatically triggers a process alarm if the process data fulfills a trigger condition such a corresponding alarm message is transferred to an alarm system for output to an operator, triggered process data alarms are archived as a history, such that by selecting a process data item and specify a display period by the operator the alarm system simultaneously requests the history of the selected process data item process alarms assigned to a process object for the display period, where the alarm system outputs a time sequence of the process data item as a graphic and presents process data points in the graphic in an encoding that specifies for each process data point the highest priority with which process alarms have occurred during the acquisition period.Type: GrantFiled: January 29, 2020Date of Patent: October 18, 2022Assignee: SIEMENS AKTIENGESELLSCHAFTInventor: Benjamin Lutz
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Patent number: 11436770Abstract: A motion analysis device, a motion analysis method and a computer-readable recording medium in which browsability is not likely to decrease even when motion data becomes longer are provided. A motion analysis device includes an acquisition part that acquires time-series data relating to an operation performed by an operator, an analysis part that analyzes the time-series data and generates motion data indicating a type of an elemental motion and an execution time of the elemental motion from a start to an end thereof, and a display control part that performs control to display objects indicating types and execution times of a plurality of elemental motions on a display part side by side in a time-series order of the time-series data, wherein the objects have a constant width in a direction in which the objects are lined up in a time-series order and indicate the execution times according to heights.Type: GrantFiled: October 14, 2020Date of Patent: September 6, 2022Assignee: OMRON CorporationInventor: Masashi Miyazaki
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Patent number: 11421901Abstract: First and second IAQ sensors are located within a building and are configured to measure first and second IAQ parameters, respectively, the first and second IAQ parameter being the same one of: relative humidity; amount of particulate; amount of volatile organic compounds; and amount of carbon dioxide. A mitigation device is separate from an HVAC system and includes a control module configured to turn the mitigation device on and off based on the first IAQ parameter, the second IAQ parameter, and whether the HVAC system is on or off. A mitigation module is configured to selectively turn the HVAC system on and off based on the second IAQ parameter, the first IAQ parameter, and whether the HVAC system is on or off.Type: GrantFiled: April 19, 2019Date of Patent: August 23, 2022Assignee: Emerson Climate Technologies, Inc.Inventors: Stuart K. Morgan, Hung M. Pham, Brian R. Butler
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Patent number: 11416981Abstract: A method for detecting damage and determining a type of damage and a degree or severity of damage to a component of a transmission. The method includes providing a first image of a portion of the component in a reference state and detecting a further image of the portion of the component after intended use. The further image of the portion of the component is detected in an installed state of the component. The method further includes determining, by comparing the further image with the first image, that the component is damaged, determining, by matching the further image against data of a damage database, a type of damage, and outputting the determined type of damage and a degree or severity of damage. The first image, the further image, and the data of the damage database are photographs.Type: GrantFiled: November 20, 2018Date of Patent: August 16, 2022Assignee: ZF FRIEDRICHSHAFEN AGInventors: Daniel Wolf, Johannes Schaefer, Jochen Abhau
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Patent number: 11346655Abstract: An apparatus for measuring a thread includes a holder for detachably holding a tube having a thread formed at an end of the tube. A first optical measuring section having an optical sensor is attached to a manipulator in order to move the measuring section relative to the tube. The optical measuring section is adjustably tiltable about a first adjusting axis relative to a thread axis of the thread. A second optical measuring section having a second optical sensor is arranged at the manipulator, wherein the optical measuring sections collectively form a measuring channel to provide simultaneous measurement of opposite sides of the thread of the tube.Type: GrantFiled: June 2, 2017Date of Patent: May 31, 2022Assignee: SMS GROUP GMBHInventors: Martin Sauerland, Frank d'Hone
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Patent number: 11341441Abstract: The application discloses an automatic product dispatching device in case of a site abnormality in a queue time section loop, which includes a risk level definition module and a risk control logic module for product dispatching in case of the site abnormality; the risk level definition module divides risks into a plurality of levels, defines a corresponding site risk level at each site, divides a queue time section loop from a current site to an abnormal site of products into a current queue time section, a middle queue time section and an abnormal queue time section, and respectively defines section risk level; the risk control logic module forms a current product dispatching result according to a logic relationship among the section risk levels. The application further discloses an automatic product dispatching method in case of a site abnormality in a queue time section loop.Type: GrantFiled: January 6, 2021Date of Patent: May 24, 2022Assignee: Shanghai Huali Integrated Circuit CorporationInventors: Xiaolin Cui, Qiuchen Xu, Jing Zhou, Sainan Zhang, Xiaoping Zheng, Ran Huang
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Patent number: 11334052Abstract: A worker guidance system for guiding a worker when carrying out a process using a process system. The process system includes at least one process device having process device capabilities, the process including at least one work step, including a control unit and a communication device. The control unit is designed to activate the communication device based on process data to communicate to the worker the work step to be carried out. The control unit is provided with the process device capabilities as process device capability data, the process data including the process device capability data.Type: GrantFiled: February 4, 2019Date of Patent: May 17, 2022Assignee: Robert Bosch GmbHInventors: Michael Schoeffler, Sven Dose
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Patent number: 11294357Abstract: Methods aim to reduce and/or eliminate the need for shims in manufacturing assemblies, such as in manufacturing of aircraft wings. Exemplary methods include predicting a set of predicted manufacturing dimensions within a range of predetermined allowances for a first part, manufacturing the first part, scanning the first part to determine a set of actual manufacturing dimensions for the first part, and at least beginning manufacturing a second part before the scanning the first part is completed. The second part may be manufactured based on the set of predicted manufacturing dimensions for the first part. Once the scan of the first part is completed, the set of predicted manufacturing dimensions may be compared to a set of actual manufacturing dimensions to check for any non-compliant deviances between the predicted and actual manufacturing dimensions. Repairs and local re-scans may be performed in the areas of the non-compliant deviances, which may streamline manufacturing.Type: GrantFiled: May 7, 2020Date of Patent: April 5, 2022Assignee: The Boeing CompanyInventor: Clifford D. Borowicz
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Patent number: 11281834Abstract: Approaches for protection of HLL simulation models in a circuit design having unprotected high-level language (HLL) program code and first metadata of a shared library of executable simulation models that are based on sensitive HLL simulation models. A design tool determines a first storage location of the shared library based on the first metadata and compiles the unprotected HLL program code into an executable object. The design tool links the executable object with the library of executable simulation models from the first storage location and then simulates the circuit design by executing the executable object and loading the executable simulation models in response to initiation by the executable object.Type: GrantFiled: August 5, 2019Date of Patent: March 22, 2022Assignee: XILINX, INC.Inventors: Rajvinder S. Klair, Alec J. Wong, Sahil Goyal, Amit Kasat, Brian Cotter, Herve Alexanian
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Patent number: 11237544Abstract: An information processing device includes: a recording means storing model data that reproduces a change of a workpiece, the model data being constructed, as an effect of process treatment, from differential data between initial state data and end state data of the workpiece, the end state data representing state of the workpiece to which the process treatment is applied under a predetermined process condition; an input receiving means for receiving an input of the initial state data and target end state data of the workpiece; a predicting means for predicting the end state data from the received initial state data, by using the model data and a combination of multiple model data in the recording means; and a determining means for determining a process condition of process treatment to be applied to the workpiece, based on a proximity between the predicted end state data and the target end state data.Type: GrantFiled: January 28, 2019Date of Patent: February 1, 2022Assignee: Tokyo Electron LimitedInventors: Hironori Moki, Takahiko Kato
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Patent number: 11226128Abstract: A condition identification module is configured to, based on output from the at least one of a microphone and a camera, indicate an occurrence of a user having a physical condition. A correlation module is configured to, based on the occurrence of the user having the physical condition and at least one of a temperature of air, a relative humidity of air, an amount of particulate of at least a predetermined size present in air, an amount of VOCs present in air, and an amount of carbon dioxide present in air, selectively identify the presence of a correlation between the occurrence of the user having the physical condition and the at least one of the temperature, the RH, the amount of particulate, the amount of VOCs, and the amount of carbon dioxide.Type: GrantFiled: April 19, 2019Date of Patent: January 18, 2022Assignee: Emerson Climate Technologies, Inc.Inventors: Stuart K. Morgan, Hung M. Pham, Brian R. Butler
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Patent number: 11183047Abstract: Embodiments of the present invention describe identifying and containing contaminants using, IoT devices. Embodiments describe, identifying objects and user activity in a designated area through a plurality of internet of things (IoT) devices and a plurality of IoT sensors, determining a contamination risk in the designated area, and generating an augmented reality contamination path for the contamination risk based on the identified objects and user activity in the designated area. Additionally, embodiments describe, displaying an augmented reality contamination path to a user on an augmented reality device, and activating an IoT containment device to contain the contamination risk.Type: GrantFiled: November 18, 2019Date of Patent: November 23, 2021Assignee: International Business Machines CorporationInventors: Mark Turano, Robert Huntington Grant, Sarbajit K. Rakshit, Zachary A. Silverstein
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Patent number: 11170073Abstract: The invention relates to statistical processing of multi-dimensional samples according to a step-wise sequence of iterative tolerance limit definitions using rank statistics. The processing is performed in the context of defining tolerance limits for a population that are compared to multiple process limits or acceptance criteria, with the requirement that a specified fraction of the population be confirmed to fall within the stated acceptance criteria. The symmetry (or asymmetry) may be allocated and controlled by selecting the frequency of occurrence of a specific figure of merit, and its order or position, in the sequential embedding processing sequence.Type: GrantFiled: June 22, 2018Date of Patent: November 9, 2021Assignee: Westinghouse Electric Company LLCInventors: Michael A. Shockling, Brian P. Ising, Kevin J. Barber, Scott E. Sidener
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Patent number: 11117303Abstract: Techniques are directed to melt spinning, drawing, crimping and winding multiple threads. The threads are spun from a plurality of spinnerets of a spinning device and are drawn as a thread group by a drawing device and are subsequently fed for crimping next to one another to a plurality of texturing units. In order to obtain identical treatment of all threads within the thread group, the threads are guided individually with a plurality of wraps next to one another on a godet unit and, after running off from the godet unit, are guided in a straight thread run parallel next to one another into the texturing units. To this end, adjacent texturing units of the crimping device form a treatment spacing between themselves which is such that, in the case of being guided individually with a plurality of wraps on the godet unit, the threads can be guided in parallel in a straight thread run.Type: GrantFiled: March 3, 2015Date of Patent: September 14, 2021Assignee: Oerlikon Textile GmbH & Co. KGInventors: Mathias Stündl, Stefan Kalies, Marco Kaulitzki, Jan Westphal
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Patent number: 11088039Abstract: Implementations described herein generally relate to improving silicon wafer manufacturing. In one implementation, a method includes receiving information describing a defect. The method further includes identifying a critical area of a silicon wafer and determining the probability of the defect occurring in the critical area. The method further includes determining, based on the probability, the likelihood of an open or a short occurring as a result of the defect occurring in the critical area. The method further includes providing, based on the likelihood, predictive information to a manufacturing system. In some embodiments, corrective action may be taken based on the predictive information in order to improve silicon wafer manufacturing.Type: GrantFiled: October 3, 2018Date of Patent: August 10, 2021Assignee: Applied Materials, Inc.Inventors: Raman K. Nurani, Anantha R. Sethuraman, Koushik Ragavan, Karanpreet Aujla