Performance Monitoring Patents (Class 700/174)
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Publication number: 20090198366Abstract: A method and a device for operating a machine tool are disclosed, wherein a machining operation of the machine tool is controlled by a parts program by storing a simulated configuration of the machine tool in the parts program, determining an actual configuration of the machine tool, comparing the actual configuration with the simulated configuration of the machine tool stored in the parts program, and generating a warning message if the actual configuration is not in conformance with the simulated configuration. This prevents errors in the machining process resulting from a discrepancy between the configuration of the machine tool used in the simulation of the parts program and the configuration of the actual machine tool during the actual machining operation.Type: ApplicationFiled: November 10, 2008Publication date: August 6, 2009Applicant: Siemens AktiengesellschaftInventor: ROLAND SCHNEIDER
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Patent number: 7571022Abstract: A method for monitoring health of a machine tool includes operating the machine tool outside an operation cycle to effect movement of a portion of the machine tool. Data from signals output from a sensor and from a controller attached to the machine tool are used to define at least one movement-specific data profile for the movement of the portion of the machine tool. An algorithm is then applied to at least a portion of the at least one movement-specific data profile to generate at least one movement-specific data point. This facilitates generation of at least one movement-specific trend line, which can be used to analysis the health of the machine tool.Type: GrantFiled: August 2, 2005Date of Patent: August 4, 2009Assignee: Ford Motor CompanyInventors: Chandra Jalluri, Prashanth Magadi, Ingrid Kaufman
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Patent number: 7567853Abstract: With this invention, expert knowledge from machine manufacturers is applied quickly at any time to a machine via the Internet, by providing a main computer (host) for the production and provision of machine-related data and/or services and a machine-side working computer (client), which is connected to the main computer via a data communication link and by means of which (client) machine state data can be acquired in real time and transmitted to the main computer, and by means of which machine-related data and/or services generated by the main computer as a function of such machine state data can be received by means of an analysis and evaluation unit.Type: GrantFiled: October 23, 2006Date of Patent: July 28, 2009Assignee: Siemens AktiengesellschaftInventors: Volker Kreidler, Knut Lagies, Wolfgang Mutscheller
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Patent number: 7561940Abstract: A method for predictive maintenance of a cutting unit of an automatic machine; the method determining, with a given frequency, the value of a characteristic quantity of the cutting unit related to contact between a cutting member and a counter-member; determining a curve for extrapolating the time pattern of the characteristic quantity value, and programming maintenance work on the cutting unit when the curve is outside a given acceptance range.Type: GrantFiled: November 23, 2004Date of Patent: July 14, 2009Assignee: G.D. Societa' per AzioniInventor: Francesco Nicastro
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Patent number: 7551974Abstract: Plural combined processing machines perform various processes to workpieces W. The combined processing machines are arranged in a processing line according to a volume of products of the workpieces, operating time of the combined processing machines and a tact time to complete processing one of the workpieces. Each combined processing machine is determined to share one or more processes according to the volume of the products, the operating time and the tact time. The workpieces are transferred among the combined processing machines to be processed.Type: GrantFiled: September 15, 2006Date of Patent: June 23, 2009Assignee: JTEKT CorporationInventor: Yoshio Wakazono
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Patent number: 7536237Abstract: A system and method are provided for real-time measurement of tool forces. A relationship between a sensor characteristic and tool forces is determined by directly measuring tool forces for a standard tool, work piece, and part program. The sensor characteristic for a CNC machine at the user facility is then measured for the standard tool, work piece, and part program, providing a relationship between the sensor characteristic at the user facility and tool forces. If the sensor is not conveniently attached to the work piece or the part program is not sufficiently robust in cutting conditions, the work piece and part program are replaced by a sacrificial work piece and sacrificial part program. The sacrificial work piece and sacrificial part program are selected to accommodate the sensors and to provide sufficient robustness in cutting conditions to accurately determine the process model parameters for the sacrificial work piece.Type: GrantFiled: July 12, 2006Date of Patent: May 19, 2009Inventor: Donald M. Esterling
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Publication number: 20090093905Abstract: A numerical controller controlling a 5-axis machine tool compensates setting error that arises when a workpiece is set on the table. Error in the three linear axes and the two rotation axes are compensated using preset error amounts to keep the calculated tool position and tool direction in a command coordinate system. If a trigonometric function used for error compensation has a plurality of solution sets, the solution set closest to the tool direction in the command coordinate system is selected from the plurality of solution sets and used as the positions of the two rotation axes compensated in the above error compensation.Type: ApplicationFiled: August 15, 2008Publication date: April 9, 2009Applicant: FANUC LTDInventors: Toshiaki Otsuki, Soichiro Ide, Takafumi Sasaki
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Publication number: 20090082899Abstract: A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.Type: ApplicationFiled: September 20, 2007Publication date: March 26, 2009Applicant: General Electric CompanyInventors: Xiaoming Du, Kevin George Harding, Steven Robert Hayashi, Jianming Zheng, Tian Chen, Howard Paul Weaver, Yong Yang, Guofei Hu, James Allen Baird, JR.
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Patent number: 7502663Abstract: A method for determining a deviation of at least one regulating variable on chip removal machines with a mechanical drive for a tool and/or a workpiece, regulated by a control system, wherein the regulation comprises a plurality of values of at least three spatial axes for the control system and for the drive, and the values have a functional relation with the axes. A protocol is prepared from a plurality of control system actual values detected by measuring devices and/or selected drive actual values and a control system nominal value and/or a drive nominal value is calculated at least in relation to an axis, and a control system differential value and/or a drive differential value is calculated at least in relation to the axis. A chip removal machine which implements such a method is disclosed.Type: GrantFiled: April 20, 2005Date of Patent: March 10, 2009Assignee: Schneider GmbH & Co. KGInventors: Christoph Weber, Gunter Schneider
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Patent number: 7502662Abstract: A motion control system comprising a machine platform, at least one event destination, and an event handler. The machine platform carries out automated tasks and generates events. The event handler is configurable to receive at least one event from the machine platform and send the at least one event to the at least one event destination.Type: GrantFiled: March 26, 2007Date of Patent: March 10, 2009Assignee: Roy-G-Biv CorporationInventors: David W. Brown, Skylar Stein
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Patent number: 7487370Abstract: According to the present invention, there is provided a semiconductor device including a power supply circuit which receives an external power supply voltage supplied, and outputs an internal power supply voltage not higher than the external power supply voltage; a system module which receives the internal power supply voltage, and performs a predetermined operation; and a performance monitor circuit which measures a processing speed of said system module when the internal power supply voltage is applied, and, on the basis of the processing speed, outputs a first control signal which requests to set the external power supply voltage at a first level, and a second control signal which requests said power supply circuit to set the internal power supply voltage at a second level. The power supply circuit outputs the internal power supply voltage having the second level on the basis of the second control signal applied thereto.Type: GrantFiled: September 1, 2005Date of Patent: February 3, 2009Assignee: Kabushiki Kaisha ToshibaInventors: Shinichiro Shiratake, Yukihito Oowaki, Hiroyuki Hara, Tetsuya Fujita, Fumitoshi Hatori, Masataka Matsui
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Patent number: 7477960Abstract: A method for implementing FDC in an APC system including receiving an FDC model from memory; providing the FDC model to a process model calculation engine; computing a vector of predicted dependent process parameters using the process model calculation engine; receiving a process recipe comprising a set of recipe parameters, providing the process recipe to a process module; executing the process recipe to produce a vector of measured dependent process parameters; calculating a difference between the vector of predicted dependent process parameters and the vector of measured dependent process parameters; comparing the difference to a threshold value; and declaring a fault condition when the difference is greater than the threshold value.Type: GrantFiled: February 16, 2005Date of Patent: January 13, 2009Assignee: Tokyo Electron LimitedInventors: James E. Willis, Merritt Funk, Kevin Lally, Kevin Pinto, Masayuki Tomoyasu, Raymond Peterson, Radha Sundararajan
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Patent number: 7475262Abstract: Some embodiments provide determination of a processor performance characteristic associated with a first workload, and determination of a processor performance state for the first workload based on the performance characteristic. Further aspects may include determination of a second processor performance characteristic associated with a second workload, determination of a second processor performance state for the second workload based on the performance characteristic, determination of a similarity between the first performance characteristics and the second performance characteristics, determination of a cluster comprising the first workload and the second workload, and association of a third processor performance state with the cluster, wherein the third processor performance state is identical to the first processor performance state and to the second processor performance state.Type: GrantFiled: June 29, 2005Date of Patent: January 6, 2009Assignee: Intel CorporationInventors: Rajesh Banginwar, Eugene Gorbatov
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Patent number: 7469164Abstract: Various embodiments include a method for providing instructions to a process tool. The method includes emitting an incident light beam at a substrate, receiving a reflected light beam from the substrate and determining a spectrum of the reflected light beam. The method further includes determining a first property of a first layer of the substrate and a second property of a second layer of the substrate, based on the spectrum determination. The method further includes comparing the first property of the first layer to a first reference property and comparing the second property of the second layer to a second reference property. The method further includes determining the instructions based on the first property comparison and the second property comparison; and providing the instructions to the process tool.Type: GrantFiled: March 12, 2007Date of Patent: December 23, 2008Assignee: Nanometrics IncorporatedInventor: Ofer Du-Nour
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Patent number: 7463945Abstract: An electronic fingerprint measures a state of a machine and/or process. A controller controls movements of at least one component of the machine and a fingerprint device selects, for measurement, certain movements of the machine for generating an electronic fingerprint that that is representative of a condition of the machine tool or process.Type: GrantFiled: August 22, 2003Date of Patent: December 9, 2008Assignee: Siemens AktiengesellschaftInventors: Martin Kiesel, Wolfgang Mutscheller
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Patent number: 7440814Abstract: A method for auto-calibration of at least one tool (36) in a single point turning machine (10) used for manufacturing in particular ophthalmic lenses (L) is proposed, in which a test piece of special, predetermined geometry is cut with the tool and then probed to obtain probe data. The method subsequently uses the probe data to mathematically and deterministically identify the necessary tool/machine calibration corrections in two directions (X, Y) and three directions (X, Y, Z), respectively, of the machine. Finally these corrections can be applied numerically to all controllable and/or adjustable axes (B, F1, X, Y) of the machine in order to achieve a (global) tool/machine calibration applicable to all work pieces within the machines operating range. As a result two-dimensional (2D) tool/machine calibration and three-dimensional (3D) tool/machine calibration, respectively, can be performed in a reliable and economic manner.Type: GrantFiled: May 1, 2006Date of Patent: October 21, 2008Assignee: Satisloh GmbHInventors: Edward McPherson, Marc Savoie
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Patent number: 7437204Abstract: An aspect of the present invention includes a method and device for listening to communications between processes and tools, recording report and report trigger definitions, matching reports from tools with the recorded definitions, and translating messages into a context-insensitive format. Other aspects of the present invention include dynamically enhancing tool status reports, migrating processes form tool control hosts to distributed processors, and screening requests for tool status information from hosts and distributed processors. More detailed descriptions of aspects of the present invention are described in the claims, specification and drawings.Type: GrantFiled: November 30, 2006Date of Patent: October 14, 2008Assignee: MKS Instruments, Inc.Inventors: Uzi Lev-Ami, Yossef Llan Reich
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Publication number: 20080201009Abstract: A method, system and computer program product for determining matching of a tool set in a production process are disclosed. According to an embodiment, a method for determining matching of a tool set in a production process comprises: selecting a measurement step within the production process, a subset of tools of the tool set being used in the measurement step; collecting production data for each tool of the subset, the production data being related to a process feeder tool; generating a weighted average of the production data for each tool of the subset; and analyzing weighted averages of all tools of the subset using a matching standard to determine matching of the subset.Type: ApplicationFiled: February 15, 2007Publication date: August 21, 2008Applicant: International Business Machines CorporationInventors: Andrew C. Brendler, William K. Hoffman, Roger M. Young, Lin Zhou
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Publication number: 20080195244Abstract: An apparatus for detecting manufacturing parameters of a machine tool is provided, which comprises at least a sensing and transmitting module, and a receiving module. The sensing and transmitting module has a sensor and a wireless transmitting module. The sensor generates a sensing signal with respect to processing parameter of the machine tool. The wireless transmitting module converts the sensing signal into a wireless signal and transmits the wireless signal to the receiving module. Then the wireless signal is decoded and sent to a processing unit for compensating the machine tool. In the present invention, it is not necessary to consider wiring arrangement so that the sensors can be disposed at positions that are close to the mechanism whose operating status could affect the machining process and the compensation, generated according to the foregoing sensing data, for machine tool will be more effective to improve the machining accuracy.Type: ApplicationFiled: July 24, 2007Publication date: August 14, 2008Inventors: Shin-Hung Jou, Yung-Feng Nien, Jan-Hao Chen
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Patent number: 7409760Abstract: A riveting system is operable to join two or more workplaces with a rivet. In another aspect of the present invention, a self-piercing rivet is employed. Still another aspect of the present invention employs an electronic control unit and one or more sensors to determine a riveting characteristic and/or an actuator characteristic.Type: GrantFiled: May 22, 2001Date of Patent: August 12, 2008Assignee: Newfrey LLCInventors: Dieter Mauer, Hermann Roeser, Reinhold Opper, Andreas Wojcik, Christian Schoenig
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Patent number: 7409261Abstract: A data management and networking system and method are provided for automatically retrieving and storing data from a machine tool for distribution to a remote terminal over a network. Raw data related to a machine operation parameter, such as vibrations, are collected. This data is associated with machining operation data, such as the particular cutting tool being used, or the particular feature being cut by the cutting tool. An algorithm is applied to the raw data to generate a parametric representation of the data, thereby significantly reducing the size of the data. At least some data related to non-machining time is separated out, further reducing the size of the data. The associated data is sent to a network server for storage, where it may be accessed by one or more remote terminals.Type: GrantFiled: October 25, 2004Date of Patent: August 5, 2008Assignee: Ford Motor CompanyInventors: Chandra Jalluri, Prashanth Magadi, Moe Lefrancois
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Patent number: 7400935Abstract: A system and method for implementing an indirect controller for a plant. A plant can be provided with both a direct controller and an indirect controller with a system model or a committee of system models. When the system model has sufficient integrity to satisfy the plant requirements, i.e., when the system model has been sufficiently trained, the indirect controller with the system model is automatically enabled to replace the direct controller. When the performance falls, the direct controller can automatically assume operation of the plant, preferably maintaining operation in a control region suitable for generating additional training data for the system model. Alternatively, the system model incorporates a committee of models. Various types of sources for errors in the committee of models can be detected and used to implement strategies to improve the quality of the committee.Type: GrantFiled: January 12, 2007Date of Patent: July 15, 2008Assignee: NeuCo, Inc.Inventors: Wesley Curt Lefebvre, Daniel W. Kohn
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Patent number: 7395122Abstract: Content is generated on a host system based on real-time data from a controlled process collected over an internet from a customer's client machine tool control system. The real-time data is captured from the client machine tool by downloading software that manipulates controller functionality to perform a data capture trace predefined events and triggers. The captured data is retrieved by the host, which may generate content based on the data, or provide selective, authorized access to the data by others.Type: GrantFiled: September 12, 2001Date of Patent: July 1, 2008Assignee: Siemens AktiengesellschaftInventors: Volker Kreidler, Knut Lagies, Wolfgang Mutscheller, Michael Kaever, Stephan Greff, Rainer Dirnfeldner
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Patent number: 7383097Abstract: A method for managing machine tool data includes operating the machine tool to perform at least a portion of an operation cycle which includes a non-machining operation. Data is processed from signals output from at least one sensor and from a controller to define a non-machining operation-specific data profile for the non-machining operation. An algorithm is applied to the non-machining operation-specific data profile to generate a non-machining operation-specific data point, which facilitates generation of a non-machining operation-specific trend line used to help determine the health of the machine tool.Type: GrantFiled: August 1, 2005Date of Patent: June 3, 2008Assignee: Ford Motor CompanyInventors: Chandra Jalluri, Prashanth Magadi, Ingrid Kaufman
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Publication number: 20080103625Abstract: A numerical controller with a machining resume function, in which time necessary to resume machining is reduced without increasing memory capacity. A program portion such as a subprogram to be skipped, which is not required to execute for restoring an internal status of the numerical controller at the time point of machining suspension is registered by number or the like. When the internal stare is restored, only if the read-out block is not the program portion to be skipped, execution is carried out without operating a machine, and the internal status including a coordinate position of the machine and the like is updated and stored. A pointer indicating a block position is also updated. If it is determined that the pointer becomes equal to a pointer value at the time point of machining suspension, and that the suspended block is reached, the internal status such as interpolation information which is stored at the machining suspension is restored, and the machining is resumed.Type: ApplicationFiled: October 29, 2007Publication date: May 1, 2008Applicant: FANUC LTDInventors: Takeshi Mochida, Keiichiro Miyajima, Kohji Fujiwara
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Patent number: 7359763Abstract: A cutting tool adjustment method includes lowering a cutting tool on a transparent Mylar to produce an indentation before an actual scribing operation; picking up the image of the indentation; using a numerical analysis method and a set formula to automatically calculate a correction angle and position so as to adjust the angle and position of the cutting tool subject to the calculation result; and repeating the calculation and adjustment procedures, if necessary.Type: GrantFiled: December 14, 2004Date of Patent: April 15, 2008Assignee: Industrial Technology Research InstituteInventors: Kuei-Jung Chen, Sin-Len Tan, Chih-Yi Lai, Meng-Chun Chen
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Patent number: 7343353Abstract: A method and system for determining which machine tools to turn off during slow periods to achieve maximum cost savings with minimum cycle time increase. It uses a product demand forecast and a simplified approach to the X-factor theory to provide an objective, analytical model showing the cost savings of potentially turning off different quantities and types of machine tools versus the resulting impact on increased cycle time. This model, which can be visually plotted into a graph, can aid management decision as to the optimum machine tools to turn off while fine-tuning the marginal machine choices can keep cycle time under a predetermined acceptable maximum.Type: GrantFiled: August 2, 2002Date of Patent: March 11, 2008Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.Inventors: Kan Wu, Shu-Chuan Tu, Chang-Jang Lou
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Patent number: 7340318Abstract: A method includes providing a process controller for controlling a process tool. The process tool is controlled in accordance with a process parameter. Measurements associated with the processing parameter for a plurality of runs of the process tool are accessed. A performance measure for the process controller is generated based on the process parameter and the measurements. A system includes a process tool, a process controller, and a performance monitor. The process controller is configured to control the process tool in accordance with a process parameter. The performance monitor is configured to retrieve measurements associated with the processing parameter for a plurality of runs of the process tool and generate a performance measure for the process controller based on the measured processing parameters.Type: GrantFiled: December 20, 2002Date of Patent: March 4, 2008Assignee: Advanced Micro Devices, Inc.Inventors: Gregory A. Cherry, Ernest D. Adams, III
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Patent number: 7337033Abstract: A tool with one or more chambers in a manufacturing system is identified as performing at or below an acceptable level by the following steps. Store process data from tools for each one of a plurality of individual processes for a processed object in a process database. Store tool performance data for each individual process for a processed object in a yield database. Develop statistics for similar tool sets associating data with each of the similar tool units. Generate yield numbers for each group of the similar tool units based upon the statistics. Identify poorly/well performing tool units by using the yield numbers.Type: GrantFiled: July 28, 2006Date of Patent: February 26, 2008Assignee: International Business Machines CorporationInventors: Viorel Ontalus, Jeong Woo Nam, Yunsheng Song
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Patent number: 7334145Abstract: A processor-based system accessing a performance profile for a program executing on a predetermined data set, executing the program on the predetermined data set, and governing processor speed in a predictive manner based at least in part on the performance profile.Type: GrantFiled: June 7, 2004Date of Patent: February 19, 2008Assignee: Intel CorporationInventor: Steven L. Grobman
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Patent number: 7310566Abstract: A quality control method for two-dimensional matrix codes on metallic workpieces, the codes being in the form of stamped marking dots is disclosed. The stamping process for the marking dots is carried out by a marking tool (17) with the aid of predetermined digital positional data. The corresponding image data is then recorded for analysis by an image processing device (22), exclusively at the locations that have been predetermined by the positional data, or additional image data that has been previously generated is also used for the analysis, to establish whether a correct marking dot with the required quality characteristics is present.Type: GrantFiled: November 6, 2003Date of Patent: December 18, 2007Assignee: Borries Markier-Systeme GmbHInventor: Konrad Frƶhlich
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Patent number: 7295887Abstract: Machines existing in a plant are classified under a multilevel hierarchy and are displayed on a screen. A summary of a diagnosis result of one or more nondisplayed machines which is not displayed on the screen and is classified to a level lower than that of the machines displayed on the screen. Therefore, the diagnosis result of the nondisplayed machines can also be seen on the screen and oversights of machine management can be prevented.Type: GrantFiled: February 17, 2005Date of Patent: November 13, 2007Assignee: Yokogawa Electric CorporationInventors: Kohei Matsumoto, Hideki Ozawa, Mikako Yoda
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Patent number: 7289873Abstract: The present invention relates to a sensor system for a cutting machine tool (300) with an energy supply unit (101), which inductively provides energy for the supply of at least one sensor arrangement (110) of the cutting machine tool (300) out of a magnetic alternating field (B), at least one sensor arrangement which measures a force, appearing within the cutting machine tool (300) and/or a torque and/or the body sound within the cutting machine tool, and a data transmitting unit (120), which wirelessly transmits data, which relate to a value, which is measured by the at least one sensor arrangement (110) of the cutting machine tool (300).Type: GrantFiled: October 18, 2005Date of Patent: October 30, 2007Assignee: Artis GRS. fur angewandte Messtechnik mbHInventors: Volker Redecker, Dirk Lange, Jan-Wilm Brinkhaus
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Patent number: 7289862Abstract: A number of methods to support process quality and maintenance during control of an industrial process such as welding are provided. The methods provide, among other things: automatic process limit programming based on runtime data; user-initiated process limit programming based on upcoming data; correlate equipment deterioration based on capability measurement; correlate tip dressers/formers to new; detect electrical deterioration; integrate process data with programmed data for a visual aid; and quantify process variation in welding tools (pareto of stddev of the c-factor).Type: GrantFiled: December 30, 2004Date of Patent: October 30, 2007Inventor: David R. Britton
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Patent number: 7286895Abstract: A safety device for a machine has a first machine part for carrying out a working movement towards a second machine part. It also has at least a first and a second optical barrier moving along with the first machine part during the working movement. The first optical barrier runs ahead of the first machine part by a first distance, and the second optical barrier is arranged at a second distance from the first optical barrier. A control unit is designed to stop the working movement of the first machine part when the first optical barrier is interrupted. A test unit allows to test whether the second optical barrier has been interrupted once the first machine part has been stopped. A blocking unit serves for blocking the working movement as a function of the test result from the test unit. Using this safety device it is possible to determine an overtravel of the first machine part in a simple and reliable manner.Type: GrantFiled: November 18, 2005Date of Patent: October 23, 2007Assignee: Pilz GmbH & Co. KGInventor: Martin Krieg
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Patent number: 7280887Abstract: An outsourcing service center (7) discloses information obtained through outsourcing services for a first sheet metal processing factory (3) to promote sales. A first ordering customer (5) requests a first sheet metal processing factory (3) to make an estimate for manufacturing a product. The first sheet metal processing factory (3) requests an outsourcing center (7) to perform the work of making the estimate. The outsourcing center (7) logs in to a computer (9) of the first sheet metal processing factory via a computer (15) of the outsourcing center, and, by remote control, works together with the first sheet metal processing factory to perform outsourcing services such as making an estimate and creating NC process data. The processes of these remotely performed services are stored in memory constituting know-how and are then disclosed on a Web page. In this way, examples of previous work successes are introduced and thereby used for promoting CAD/CAM software used in the work processes.Type: GrantFiled: July 30, 2002Date of Patent: October 9, 2007Assignee: Amada Company, LimitedInventors: Koichi Tsuchida, Yoshiyuki Matsui
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Patent number: 7272463Abstract: A method of determining a tool geometry and tool orientation for any prescribed path along a workpiece of a cutting tool is described. A parameter set is provided, where parameters of the parameter set include tool geometry and tool orientation relative to a surface of the workpiece. Values of the parameters in the parameter set are determined such that no local interference or global interference occurs, where local interference occurs when a portion of the tool immediately adjacent a cutting edge of the tool contacts a sidewall of a groove already cut by the cutting edge, and global interference occurs when a portion of the tool away from the cutting edge contacts a sidewall of a groove already cut by the cutting edge.Type: GrantFiled: May 24, 2005Date of Patent: September 18, 2007Assignee: General Electric CompanyInventors: Erwin Wenti Liang, Vinod Padmanabhan Kumar
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Patent number: 7251543Abstract: Interference checking device including: a modeling database that stores data for three-dimensional modeling of tools, workpieces, and machine-tool constituting structures; an interference data memory for storing interference data defining inter-component interference relationships among the tool, the workpiece, and the structures; and an interference checking processor that, based on structure movement commands sent from a program analyzer for the machine tool, and on data stored in the modeling database and interference data memory, determines whether the tool, the workpiece, and the structures will interfere with each other. Movement commands in a block at least one block succeeding the block being executed in order to control the drive mechanisms that move the structures are sent from the program analyzer to the interference checking processor.Type: GrantFiled: June 16, 2005Date of Patent: July 31, 2007Assignee: Mori Seiki, Co., Ltd.Inventor: Takayuki Nakamura
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Patent number: 7245982Abstract: A system and a process are disclosed, that are automated and integrated with numerically controlled systems, for measuring, compensating and testing numerically controlled machine tool heads (1) and/or tables. The system comprises: at least one support base (11) equipped with a plurality of distance sensors (14); at least one device (16) of the gage tool type composed of an elongated cylinder (17) that is equipped at one of its ends with connection means (18) for the heads (1) and is equipped at another opposite end with a ball (20), wherein the ball (20) is placed next to the sensors (14) so that they are able, always and in any position, to measure the distance that separates them from the ball (20) and determine thereby the position in the Cartesian space.Type: GrantFiled: September 19, 2003Date of Patent: July 17, 2007Assignee: FIDIA S.p.A.Inventor: Giuseppe Morfino
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Patent number: 7245983Abstract: A method corrects thermal displacement of a machine tool having a rotational spindle. The method includes detecting a rotation speed of the spindle. A thermal displacement amount of the spindle in the current cycle of execution of a program is estimated by using an arithmetic expression that is based at least on the spindle rotation speed and a thermal displacement amount that has been estimated in the preceding cycle of execution of the program. The estimated thermal displacement amount in the current cycle is used as a correction amount for canceling the thermal displacement of the spindle. Therefore, thermal displacement of a machine tool is corrected with no complicated processes when a spindle rotation speed changes.Type: GrantFiled: October 20, 2005Date of Patent: July 17, 2007Assignee: Yamazaki Mazak CorporationInventors: Yasuhiko Suzuki, Makoto Tanahashi
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Patent number: 7228197Abstract: A spindle device for driving a production machine includes a first sensor for detecting a first physical variable of the spindle device, and at least a second sensor for detecting a second physical variable of the spindle device. In this way, it becomes possible to determine the oscillation amplitude of the rotor of a spindle and a temperature profile of a rolling bearing. Monitoring maximum values allows identification of a crash event, whereas the temperature profile allows conclusions as to a need for maintenance. Signal evaluation can take place centrally at the spindle manufacturer's end, thereby allowing needed maintenance works to be planned long term and effectively.Type: GrantFiled: October 19, 2004Date of Patent: June 5, 2007Assignee: Siemens AktiengesellschaftInventor: Rudolf Walter
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Patent number: 7221988Abstract: A process control system uses an asset utilization expert to collect data or information pertaining to the assets of a process plant from various sources or functional areas of the plant including, for example, the process control functional areas, the maintenance functional areas and the business systems functional areas. This data and information is manipulated in a coordinated manner by tools, such as optimization and modeling tools and is redistributed to other areas or tools where it is used to perform overall better or more optimal control, maintenance and business activities. Information or data may be collected by maintenance functions pertaining to the health, variability, performance or utilization of a device, loop, unit, etc. and this information may then be sent to and displayed to a process operator or maintenance person to inform that person of a current or future problem.Type: GrantFiled: September 20, 2004Date of Patent: May 22, 2007Assignee: Rosemount, Inc.Inventors: Evren Eryurek, Trevor D. Schleiss
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Patent number: 7221995Abstract: The invention relates to a method for centering a log for veneer peeling in a lathe. In the method the log is first centered in the centering arrangement of the lathe equipment using centering alignment data based on the contour of the log. On the basis of the thus determined centering data, a computer simulation of peeling is carried out and the results thereof are displayed. The operator performs an alternative centering based on visual evaluation of the log end and, using this centering data, another computer simulation of log peeling is carried out. The peeling outcomes are displayed as an image. The peeling outcomes of all simulations are compared with each other and the centering of actual peeling operation is performed using the centering data giving the optimum yield of peeling.Type: GrantFiled: November 19, 2004Date of Patent: May 22, 2007Inventor: Mika Hyysti
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Patent number: 7221987Abstract: Analyzing an event chronology record to permit identification of periods of a production sequence that correspond to a high probability of failure. Systems and methods include receiving an event chronology for a particular machine in the production sequence and for a particular time interval. A reliability analysis system accesses process flow information to determine whether a particular event in the event chronology is related to a subsequent adverse event within a predefined event window.Type: GrantFiled: June 15, 2004Date of Patent: May 22, 2007Assignee: Kimberly-Clark Worldwide, Inc.Inventors: Thomas Arthur Bett, Tanakon Ungpiyakul, Walter Caswell Reade, Michelle ReneƩ Irwin, Jeremy Brian Cannady, Babe Bedenbaugh
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Patent number: 7218989Abstract: The control section can determine, on the basis of a detection signal from a detection device, whether operation of an element corresponding to the detection device has completed. The display device can display step sequence data and a three-dimensional model of a machine tool operated through simulation. When the abnormality detection section detects an abnormality of the machine tool, the control section extracts, from a ladder circuit corresponding to a step in which an abnormality has been detected, an element to be operated in response to completion of operation of a preceding element in the ladder circuit, or an element not having completed its operation. The control section then specifies a detection device corresponding to the extracted element or a moving part corresponding to the detection device, and displays the element or the moving part in the displayed three-dimensional model in a distinguishable manner.Type: GrantFiled: September 23, 2005Date of Patent: May 15, 2007Assignee: JTEKT CorporationInventors: Yasuharu Mukai, Yoshiji Yamamoto, Yasunori Ban, Toshio Aono, Shigeo Ohishi
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Patent number: 7219253Abstract: A simple and accurate processor derating method includes: sampling a real-time counter/clock too obtain an initial time value T1; resetting an Icnt Counter; incrementing the Icnt Counter to reflect the processing of each instruction; comparing the count in the Icnt Counter to a predetermined count IcntMax and if the count in the Icnt Counter is at least IcntMax, then sampling the RTC to obtain a second time T2. T1 is then subtracted from T2 to obtain a time difference DT which is multiplied by ((1?1/DF)?1) to obtain a Degradation Delay DD period, DF being a constant having a value which is the desired submodel performance with respect to full performance. The Degradation Delay is instituted, the RTC is sampled from time to time to obtain a test third time T3. When a test T3 minus T2 is not less than DD, then T1 is set to T3. Then, the procedure is repeated for a next group of instructions.Type: GrantFiled: April 30, 2004Date of Patent: May 15, 2007Assignee: Bull HN Information Systems Inc.Inventor: Stefan R. Bohult
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Patent number: 7209799Abstract: A multistage machining process includes a plurality of stations. Workpiece feature quality is predicted based on decomposition of the machining process into sources of variation, reticulation of the machining process into machining stations and error models that account for significant contributions to feature quality including from categorical sources of variation.Type: GrantFiled: April 14, 2005Date of Patent: April 24, 2007Assignee: GM Global Technology Operations, Inc.Inventors: John S. Agapiou, Eric A. Steinhilper, Jeffrey M. Alden, Aloysius Anagonye, Pulak Bandyopadhyay, Fangming Gu, Patrick M. Hilber
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Patent number: 7194328Abstract: A method includes storing data associated with a plurality of reticles. Reticle history information is received. The reticle history information is linked to a selected reticle. The linked reticle history information is stored. A reticle information system includes a reticle database and a loader. The reticle database is operable to store data associated with a plurality of reticles. The loader is operable to receive reticle history information, link the reticle history information to a selected reticle, and store the linked reticle history information in the reticle database.Type: GrantFiled: April 4, 2006Date of Patent: March 20, 2007Assignee: Advanced Micro Devices, Inc.Inventors: Andrew Haskins, Chunliang Xia
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Patent number: 7194320Abstract: A system and method for implementing an indirect controller for a plant. A plant can be provided with both a direct controller and an indirect controller with a system model or a committee of system models. When the system model has sufficient integrity to satisfy the plant requirements, i.e., when the system model has been sufficiently trained, the indirect controller with the system model is automatically enabled to replace the direct controller. When the performance falls, the direct controller can automatically assume operation of the plant, preferably maintaining operation in a control region suitable for generating additional training data for the system model. Alternatively, the system model incorporates a committee of models. Various types of sources for errors in the committee of models can be detected and used to implement strategies to improve the quality of the committee.Type: GrantFiled: June 5, 2003Date of Patent: March 20, 2007Assignee: NeuCo, Inc.Inventors: Wesley Curt Lefebvre, Daniel W. Kohn
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Patent number: 7171336Abstract: A method for operating a measuring instrument is capable of performing multiple diagnostic functions. For this, a process control is provided for the execution of the diagnostic functions in a manner whereby the normal measuring operation of the measuring instrument is interrupted, a first diagnostic function is performed during that interruption, the normal measuring operation is resumed after completion of the first diagnostic function, the normal measuring operation is again interrupted, and during that later interruption of the normal measuring operation a second diagnostic function is performed. In this fashion, even numerous diagnostic functions can be easily and efficiently integrated into the operation of a measuring instrument such as a magnetoinductive flowmeter.Type: GrantFiled: November 29, 2004Date of Patent: January 30, 2007Assignee: Krohne A.G.Inventor: Helmut Brockhaus