Condition Of Tool Or Workpiece (e.g., Tolerance, Tool Wear) Patents (Class 700/175)
  • Patent number: 8195324
    Abstract: A probe polishing method is provided for polishing probes by brining a polishing member into slide-contact with probes through a mounting table having thereon the polishing member transferred from a first receiving part. The probe polishing method includes transferring the polishing member from the first receiving part to the mounting table; detecting a presence of foreign materials on a top surface of the polishing member mounted on the mounting table; transferring the polishing member from the mounting table to a second receiving part when the foreign materials are detected on the top surface of the polishing member; removing the foreign materials from the polishing member in the second receiving part; and transferring the polishing member from which the foreign materials are removed from the second receiving part to the first receiving part.
    Type: Grant
    Filed: August 21, 2009
    Date of Patent: June 5, 2012
    Assignee: Tokyo Electron Limited
    Inventors: Hideaki Tanaka, Satoshi Sano
  • Patent number: 8190285
    Abstract: A substrate having a plurality of zones is polished and spectra are measured. For each zone, a first linear function fits a sequence of index values associated with reference spectra that best match the measured spectra. A projected time at which a reference zone will reach the target index value is determined based on the first linear function, and for at least one adjustable zone, a polishing parameter adjustment is calculated such that the adjustable zone has closer to the target index at the projected time than without such adjustment. The adjustment is calculated based on a feedback error calculated for a previous substrate. The feedback error for a subsequent substrate is calculated based on a second linear function that fits a sequence of index values associated with reference spectra that best match spectra measured after the polishing parameter is adjusted.
    Type: Grant
    Filed: May 17, 2010
    Date of Patent: May 29, 2012
    Assignee: Applied Materials, Inc.
    Inventors: Jun Qian, Charles C. Garretson, Sivakumar Dhandapani, Jeffrey Drue David, Harry Q Lee
  • Patent number: 8180476
    Abstract: The present invention provides a machining state checking apparatus and method for checking whether a workpiece mounted on a machine tool and a workpiece fixture are shifted. A machining state checking apparatus has an actual CCD camera for imaging a workpiece fixed on a machine tool and a workpiece fixture and generating actual two-dimensional image data thereof, a virtual image generating section for generating virtual two-dimensional image data of the workpiece and workpiece fixture based on data on three-dimensional models of the workpiece and workpiece fixture, a comparing section for comparing the actual two-dimensional image data and virtual two-dimensional image data generated by the actual CCD camera and the virtual image generating section, respectively, and determining whether they match each other by comparing the portions corresponding to the workpiece and workpiece fixture in the actual two-dimensional image and the virtual two-dimensional images of the workpiece and workpiece fixture.
    Type: Grant
    Filed: September 3, 2009
    Date of Patent: May 15, 2012
    Assignee: Mori Seiki Co., Ltd.
    Inventors: Masahiko Mori, Xiaodong Tian, Bingyan Zhao, Makoto Fujishima, Zhe Jin
  • Patent number: 8180477
    Abstract: A machining status monitoring apparatus is provided on a machine tool, and has an actual CCD camera for imaging the tool and the workpiece and generating actual two-dimensional image data thereof, a virtual image generating section having a virtual CCD camera corresponding to the actual CCD camera, in which the tool and workpiece of three-dimensional model are imaged by the virtual CCD camera and virtual two-dimensional image data thereof are generated, and a display control section for receiving from a control device of the machine tool, information relating to the coolant supply state and checking whether coolant is being supplied to the contact portion of the tool and the workpiece, and displaying on a display device actual two-dimensional image data when coolant is not being supplied and displaying on the display device virtual two-dimensional image data when coolant is being supplied.
    Type: Grant
    Filed: September 4, 2009
    Date of Patent: May 15, 2012
    Assignee: Mori Seiki Co., Ltd.
    Inventors: Masahiko Mori, Xiaodong Tian, Bingyan Zhao, Makoto Fujishima, Zhe Jin
  • Patent number: 8180479
    Abstract: The feed rate of an ultrasonic knife used to cut composite material is optimized using adaptive control. One or more parameters such as ultrasonic power or side load on the knife is sensed and used to generate feedback control signals. The feedback control signals are used to optimize the commanded feedrate of the knife.
    Type: Grant
    Filed: February 5, 2008
    Date of Patent: May 15, 2012
    Assignee: The Boeing Company
    Inventors: Liangji Xu, Stephen Halladin, Robert A. Kramp, Jr.
  • Patent number: 8175743
    Abstract: A measurement system that includes an industrial machine and an interferometer can detect when abnormality has occurred in measurement targeted at a reflector attached to a movable body, for example, in a case where the movable body has moved too close to the interferometer. A judging section of the interferometer judges that there is abnormality in measurement targeted at the reflector on the basis of a received-light signal. Upon such an abnormality judgment, a stop command outputting section of the interferometer outputs a stop command to the industrial machine. A stopping section of the industrial machine stops the driving operation of a moving mechanism upon receiving an input of the stop command, thereby stopping the movement of the movable body. The measurement system makes it possible to prevent the industrial machine, which includes the movable body and the moving mechanism, from colliding with the interferometer.
    Type: Grant
    Filed: February 17, 2010
    Date of Patent: May 8, 2012
    Assignee: Mitutoyo Corporation
    Inventor: Masayuki Nara
  • Patent number: 8140178
    Abstract: In a simultaneous multi-axis measuring machine tool system including linear drive axes and rotation axes to measure a surface shape of an object to be measured by using an on-board measuring device having a probe mounted, at one end thereof, with a spherical contactor, a numerical controller controls driving of the linear drive axes and the rotation axes so that a central axis of the probe is always oriented in a direction perpendicular to the surface of the object to be measured and that the spherical contactor of the probe comes in contact with and follows a surface of the object to be measured.
    Type: Grant
    Filed: June 4, 2009
    Date of Patent: March 20, 2012
    Assignee: Fanuc Ltd
    Inventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
  • Patent number: 8112172
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Grant
    Filed: April 29, 2009
    Date of Patent: February 7, 2012
    Assignee: General Electric Company
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 8103376
    Abstract: The present invention provides a system and method for the on-machine 2-D contour measurement, employing the contour measurement, coordinate system transformation, error identification, and image matching theory in image processing field to develop the on-machine measurement of X-Y-plan manufacturing error of a micro device manufactured by a high-precision micro-device machine tool, contour error, and trace error.
    Type: Grant
    Filed: September 5, 2008
    Date of Patent: January 24, 2012
    Assignee: Chung Yuan Christian University
    Inventors: Shih-Ming Wang, Han-Jen Yu
  • Patent number: 8078320
    Abstract: A method of adjusting operating parameters of a robot to move an effector tool along a given path in an optimum cycle time including a step of modifying operating parameter values to cause the cycle time to approach a optimal value wherein the parameters are modified so as to approach an extremum of a compromise function including at least first and second terms, the first term being a function of a cycle time and the second term being a function of at least one of temperature and degree of wear of an actuator.
    Type: Grant
    Filed: April 27, 2007
    Date of Patent: December 13, 2011
    Assignee: Staubli Faverges
    Inventors: Lüc Joly, Matthieu Guilbert, Pierre-Brice Wieber
  • Patent number: 8068922
    Abstract: In a method for operating a field device working according to the block model for a distributed automation system, which exchanges data via a fieldbus, a first function block application serving for process control is provided, which makes available to other system participants process data via a first virtual field device object. In addition, a second function block application is provided, which serves for plant monitoring and which makes available to other system participants plant monitoring data via a second virtual field device object, wherein the first and second function block applications are executed according to different schedules.
    Type: Grant
    Filed: December 6, 2007
    Date of Patent: November 29, 2011
    Assignee: Endress + Hauser Process Solutions AG
    Inventor: Eugenio Ferreira Da Silva Neto
  • Patent number: 8065031
    Abstract: Change in a torque waveform is monitored while removing continuously-varied periodic noise in real time, and the change in the torque waveform caused purely by the wafer state is detected by separating noise components while removing the noise not caused by the wafer state such as drift noise caused by dressing conditions and the polishing pad state, thereby reliably detecting a polishing end point with high precision when polishing is finished. A polishing end point detection device utilizing torque change for analyzing periodic components in data by subjecting Fourier transformation to the measured data, and calculating moving average processing time for removing periodic noise components based on the analyzed periodic components, and correcting the waveform by performing averaging process based on the moving average processing time calculated in real time for the data, and detecting the polishing end point of a predetermined film based on a change in the corrected torque waveform.
    Type: Grant
    Filed: September 10, 2007
    Date of Patent: November 22, 2011
    Assignee: Tokyo Seimitsu Co., Ltd
    Inventors: Takashi Fujita, Satoshi Hasegawa, Shinji Osada, Soushi Yamada, Takuji Atarashi
  • Patent number: 8055374
    Abstract: A machining quality judging method for a wafer grinding machine and wafer grinding machine are disclosed. The thickness of a wafer 2 is acquired from the feed amount of a grinding unit 3 while at the same time actually measuring the thickness of the wafer 2 appropriately. The wafer grinding machine includes a machining quality judging unit 20 for comparing the thickness of the wafer 2 based on the feed amount of the grinding unit 3 with the actually measured thickness of the wafer 2 and judges the machining quality of the ground surface of the wafer 2. Upon judgment of a machining failure, a command is issued to stop the back surface grinding operation.
    Type: Grant
    Filed: February 12, 2009
    Date of Patent: November 8, 2011
    Assignee: Tokyo Seimitsu Co., Ltd.
    Inventor: Motoi Nedu
  • Patent number: 8036769
    Abstract: A method for compensating positional and/or shape deviations in NC-controlled cutting production machines. The method including the steps of securing a new workpiece, processing the workpiece using nominal data of the NC program, acquiring set deviation, optimizing the NC program using the acquired data and repeating the above steps until at least one of required positional and shape tolerances are achieved.
    Type: Grant
    Filed: February 16, 2011
    Date of Patent: October 11, 2011
    Assignee: MTU Aero Engines GmbH
    Inventor: Arndt Glasser
  • Patent number: 8014892
    Abstract: A method for compensating for at least one of positional deviations and shape deviations in NC-controlled cutting production machines where the method includes the steps of securing a new workpiece, processing the workpiece using the nominal data of the NC program, acquiring the set deviation data, optimizing the NC program using the acquired data and repeating these steps until at least one of required positional and shape tolerances have been achieved.
    Type: Grant
    Filed: October 17, 2006
    Date of Patent: September 6, 2011
    Assignee: MTU Aero Engines GmbH
    Inventor: Arndt Glässer
  • Patent number: 8001824
    Abstract: A bending apparatus for bending a work using a punch mounted onto an upper table and a die mounted onto a lower table by operation of a ram consisting of the upper table or the lower table includes: a machining information determining means for determining bending sequences, tools, tool layouts, and work positions, based on product information; a tool management database for accumulating numbers of uses of each tool that actually bent the work along with operation of the ram, based on the determined work positions, tools and tool layouts; a number of uses of tool detecting means for detecting number of uses of each mounted tool, referring to the tool management database; and a displaying means for displaying number of uses of relevant predetermined tool, when the detected number of uses of each tool becomes equal or approximate to a durable number of uses, or when a display command signal from a worker side is input.
    Type: Grant
    Filed: June 9, 2006
    Date of Patent: August 23, 2011
    Assignee: Amada Co., Ltd.
    Inventors: Ichio Akami, Taketoshi Umemoto, Fujihiko Futami, Masaaki Sato
  • Patent number: 7983789
    Abstract: An apparatus and associated method for collecting debris from a tool, wherein programming instructions are stored in memory and executed by a machine tool controller, and wherein the controller is responsive to an intermittent debris collect signal in altering an operative path of the tool in order to engage the tool with a debris collecting device.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: July 19, 2011
    Assignee: Seagate Technology LLC
    Inventors: Joseph Charles Lutz, YongLing Yu, VigneswaraRao Subramaniam, HwaLiang Ng, George P. Thomas
  • Patent number: 7983868
    Abstract: Measurement data collected within a measurement frame of reference is fitted to geometric tolerance zones having regard for the uncertainties of the measurement. Geometric freedoms for fitting the measurement data are exploited to fit uncertainty zones associated with the measurement data within the tolerance zones. Typically, the measurement data is multidimensional and the uncertainty zones have different sizes.
    Type: Grant
    Filed: June 13, 2008
    Date of Patent: July 19, 2011
    Assignee: Quality Vision International, Inc.
    Inventor: Kostadin Doytchinov
  • Publication number: 20110118865
    Abstract: A method of determining conditions for machining a part so as to avoid vibration appearing during the machining. A machining stage is simulated by provisionally setting parameters of a function for modulating cutting speed, by deducing a corresponding surface state, by modifying parameters iteratively with the machining stage being simulated each time until the surface state reaches an acceptable value, and by performing the machining stage by causing the cutting speed to vary in application of the corresponding modulation function.
    Type: Application
    Filed: July 24, 2009
    Publication date: May 19, 2011
    Applicant: SNECMA
    Inventors: Gerard Maurice Henri Coffignal, Philippe Lorong, Alexis Perez-Duarte
  • Patent number: 7937164
    Abstract: Methods and systems to detect abnormal operations in a process of a process plant include collecting on-line process data. The collected on-line process data is generated from a plurality of dependent and independent process variables of the process, such as a coker heater. A plurality of multivariate statistical models of the operation of the process are generated using corresponding sets of the process data. Each model is a measure of the operation of the process when the process is on-line at different times, and at least one model is a measure of the operation of the process when the process is on-line and operating normally. The models are executed to generate outputs corresponding to loading value metrics of a corresponding dependent process variable, and the loading value metrics are utilized to detect abnormal operations of the process.
    Type: Grant
    Filed: September 28, 2007
    Date of Patent: May 3, 2011
    Assignee: Fisher-Rosemount Systems, Inc.
    Inventors: Nikola Samardzija, Ahmad A. Hamad
  • Patent number: 7933680
    Abstract: Manufacturing system (100) comprises only a few essential components, including: the workpiece(s) (110); the fixtures, or workpiece holding means, (120); the centrifuge (130), including a base (140) and axle (150); the release system (160), preferably a laser source; the containment structure (170); the accretion system, including an accretion substrate (180); and the control system. In operation, the release system directs a focused beam (190) of energy or solid particles to the surface of the workpiece to weaken the bonds of the surface material, and in cooperation with the centrifugal force, induced by the radial motion of the centrifuge, to break the surface material bonds and eject material into a particle path (200) which is directed to the accretion substrate.
    Type: Grant
    Filed: July 19, 2006
    Date of Patent: April 26, 2011
    Inventor: Thomas C. Hansen
  • Patent number: 7899573
    Abstract: A system and method for inspecting a machined surface. The method includes acquiring optical information of the machined surface from a predefined orientation. Further, the method includes comparing one or more parameters of the optical information with a corresponding one or more reference parameters. Furthermore, the method includes assessing a quality of the machined surface based on the comparison.
    Type: Grant
    Filed: June 16, 2008
    Date of Patent: March 1, 2011
    Assignee: GM Global Technology Operations LLC
    Inventors: John S. Agapiou, Phillip K Steinacker
  • Patent number: 7869896
    Abstract: A tangential grinding resistance measuring method includes obtaining an abrasive grain section area which is at a predetermined infeed depth from the highest top surface of abrasive grains on a grinding wheel; calculating the tangent of a half vertex angle of a conical model for cutting edges of the abrasive grains which model takes the abrasive grain section area as its bottom surface and the predetermined depth as its height; setting grinding parameters; and calculating a tangential grinding resistance from the grinding parameters and the tangent.
    Type: Grant
    Filed: August 13, 2007
    Date of Patent: January 11, 2011
    Assignee: JTEKT Corporation
    Inventors: Yasuhira Yamada, Hiroshi Morita
  • Patent number: 7860601
    Abstract: A system and method are disclosed for quickly characterizing the profile of a surface of a processed workpiece using a non-contact scanner, such as a laser scanner, in preparation for subsequent machining. The method determines the location of a plurality of features of a processed workpiece on a machine tool, and includes steps of reading a first list of approximate feature locations, defining a scan path based on the first list, scanning a profile of the workpiece along the scan path and calculating an actual location of each feature of the plurality of features based on the profile. The system and method are well suited to determine the location of features such as holes in welder header boxes.
    Type: Grant
    Filed: December 13, 2007
    Date of Patent: December 28, 2010
    Assignee: Quickmill, Inc.
    Inventors: David C. Piggott, Andy Chik Hung Wong
  • Patent number: 7854575
    Abstract: A reference block 30 attached to a housing 20a is moved together with a main spindle 20 to a measurement start position A1, and the reference block 30 is so moved in a Z-axis direction as to across air injected from an air injection nozzle 25, so that a thermal displacement of the main spindle 20 is calculated based on change in pressure measured in the movement. The outer circumference of a tool mounted on the main spindle 20 is brought close to a leading end face of the air injection nozzle 25, and the air is injected to the outer circumference of the tool while rotating the tool at a predetermined position, and the air pressure is measured so that the rotational deflection of the tool is calculated based on the change in the measured pressure.
    Type: Grant
    Filed: April 30, 2007
    Date of Patent: December 21, 2010
    Assignee: Komatsu NTC Ltd.
    Inventors: Teruhiro Nishizaki, Yoshiharu Oyabe, Shiro Murai
  • Patent number: 7853350
    Abstract: An apparatus for detecting manufacturing parameters of a machine tool is provided, which comprises at least a sensing and transmitting module, and a receiving module. The sensing and transmitting module has a sensor and a wireless transmitting module. The sensor generates a sensing signal with respect to processing parameter of the machine tool. The wireless transmitting module converts the sensing signal into a wireless signal and transmits the wireless signal to the receiving module. Then the wireless signal is decoded and sent to a processing unit for compensating the machine tool. In the present invention, it is not necessary to consider wiring arrangement so that the sensors can be disposed at positions that are close to the mechanism whose operating status could affect the machining process and the compensation, generated according to the foregoing sensing data, for machine tool will be more effective to improve the machining accuracy.
    Type: Grant
    Filed: July 24, 2007
    Date of Patent: December 14, 2010
    Assignee: Industrial Technology Research Institute
    Inventors: Shin-Hung Jou, Yung-Feng Nien, Jan-Hao Chen
  • Patent number: 7848844
    Abstract: A grinding method wherein the correlation between the amount of inertial grinding occurring in performing spark-out by a grinding unit and the maximum load current in a motor of the grinding unit is grasped, and a correction value for the amount of inertial grinding corresponding to the maximum load current is preliminarily obtained. When the wafer thickness measured by a thickness measuring gauge has reached the sum of a desired value and the correction value (=the amount of inertial grinding) corresponding to the maximum load current, the spark-out is started. Accordingly, the wafer thickness becomes the desired value after the inertial grinding in performing the spark-out.
    Type: Grant
    Filed: April 8, 2008
    Date of Patent: December 7, 2010
    Assignee: Disco Corporation
    Inventor: Seiji Nemoto
  • Patent number: 7848843
    Abstract: In a two-step processing mode in which a cup for attaching a lens to a chuck axis is changed from a large diameter cup to a small diameter cup on the way of processing, a roughing path data computing unit for computing first roughing path data larger than the target lens shape data by a predetermined finishing margin, and second roughing path data having a radius vector larger by at least ?a than at least radius vector data of the large diameter cup; and a processing controller for roughing the peripheral edge of the lens based on the second roughing path data in response to a processing start signal, thereafter stopping the processing and further resuming the processing. The processing controller performs, when a processing resuming signal is inputted, processing control of either roughing and finishing, or finishing without roughing.
    Type: Grant
    Filed: March 18, 2008
    Date of Patent: December 7, 2010
    Assignee: Nidek Co., Ltd.
    Inventor: Ryoji Shibata
  • Patent number: 7840305
    Abstract: The disclosure relates to abrasive articles useful in chemical-mechanical polishing (CMP), the articles including a substrate with opposite major surfaces, an abrasive material overlaying at least a portion of at least one of the major surfaces, and at least one of a radio frequency identification (RFID) tag, a RFID tag reader, or a sensor for providing CMP information to a transmitter positioned near the substrate, the transmitter positioned near the substrate and adapted to wirelessly receive CMP information and wirelessly transmit the CMP information to a remote receiver. The disclosure also relates to a CMP pad conditioner for wirelessly communicating CMP information to a remote receiver, a CMP process monitoring system for wirelessly communicating CMP information to a remote receiver, and a method for conditioning a CMP pad using a CMP process monitoring system for wireless communicating CMP information to a remote receiver.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: November 23, 2010
    Assignee: 3M Innovative Properties Company
    Inventors: Andrew H. Behr, Brian D. Goers, Vincent J. Laraia, Gary M. Palmgren, Daniel B. Pendergrass, Jr.
  • Publication number: 20100280649
    Abstract: A method for extracting gash parameters of a cutting tool, comprises positioning the cutting tool on a moveable stage, scanning two or more gash sections of the cutting tool to generate two or more gash section scanning point clouds, indexing multiple points of the gash section scanning point clouds, detecting multiple gash features using the indexed gash section scanning point clouds, projecting multiple point clouds of the gash features of the indexed gash section scanning point clouds to form one or more projected gash feature point clouds, identifying one or more types of the one or more projected gash feature point clouds, segmenting the one or more projected gash feature point clouds based on the type identification, and extracting one or more gash parameters based on the segmentation of the one or more projected gash feature point clouds. A system for extracting the parameters is also presented.
    Type: Application
    Filed: April 29, 2009
    Publication date: November 4, 2010
    Applicant: GENERAL ELECTRIC COMPANY
    Inventors: Tian Chen, Kevin George Harding, Steven Robert Hayashi, Xiaoming Du, Howard Paul Weaver, James Allen Baird, Xinjue Zou, Kevin William Meyer
  • Patent number: 7797975
    Abstract: An element (10) for use in a tooling system which comprises a plurality of elements arranged in an array, the elements of the array being movable between a closed position in which the elements contact one another and are secured in position, and an open position in which the elements of the array are spaced apart and are capable of vertical movement relative to one another is characterized in that the element comprises tagging means (8) providing the element with a unique identifier. The tagging means preferably comprises a radio frequency identification (RFID) tag.
    Type: Grant
    Filed: December 22, 2005
    Date of Patent: September 21, 2010
    Assignee: Surface Generation Ltd
    Inventor: Ben John Halford
  • Patent number: 7783433
    Abstract: A system, method and computer program product is provided for automated defect detection of corrosion or cracks using synthetic aperture focusing technique (SAFT) processed Lamb wave images. The method comprises processing the first image using a synthetic aperture focusing technique (SAFT) to enhance a resolution and a signal to noise ratio of a first extracted ultrasonic image, applying a systemic background noise suppression algorithm to the first extracted ultrasonic image to render a second extracted ultrasonic image having reduced noise, and applying a deconvolution linear filtering process to the second extracted ultrasonic image to render a third extracted ultrasonic image.
    Type: Grant
    Filed: July 21, 2007
    Date of Patent: August 24, 2010
    Assignee: Honeywell International Inc.
    Inventors: Grant A. Gordon, Radek Hedl
  • Patent number: 7778725
    Abstract: After a thermal displacement correcting program has started, a temperature is measured with a temperature sensor in S1, then when a rotational speed of a spindle is changed during the measurement (S2), a counter starts (S3). Then in S4, from a preset relationship between the rotational speed of the spindle and a setting-equivalent heat value, a correction factor that is a difference in setting-equivalent heat value between before and after the change in rotational speed of the spindle is calculated. Subsequently, in S5, a temperature-equivalent heat value is calculated, and then in S6, a compensation amount is calculated from the correction factor and a time elapsed after the change in rotational speed of the spindle. In S7, an equivalent heat value for compensating a dead time is obtained based on the sum of them S8, an estimated calculation for thermal displacement conversion is performed, and a correction process by an NC unit is performed in S9.
    Type: Grant
    Filed: January 18, 2008
    Date of Patent: August 17, 2010
    Assignee: Okuma Corporation
    Inventor: Harumitsu Senda
  • Patent number: 7778724
    Abstract: A device for estimating machining dimensions of a machine tool which employs tool members each being rotatably driven by a driving unit includes: a vibration sensor; a characteristics extracting unit for extracting amounts of characteristics from an output of the vibration sensor; a neural network for classifying the amounts of characteristics into categories; and a conversion unit. Amounts of characteristics of generated output by racing the tool member are used for training the neural network, and inputted again to the trained competitive learning neural network to excite neurons so that the relationships between Euclidean distances and machining dimensions of workpieces are registered in the conversion unit.
    Type: Grant
    Filed: September 24, 2007
    Date of Patent: August 17, 2010
    Assignee: Panasonic Electric Works Co., Ltd.
    Inventor: Kazutaka Ikeda
  • Patent number: 7774086
    Abstract: A computer program product that determines a polishing endpoint includes obtaining spectra from different zones on a substrate during different times in a polishing sequence, matches the spectra with indexes in a library and uses the indexes to determining a polishing rate for each of the different zones from the indexes. An adjusted polishing rate can be determined for one of the zones, which causes the substrate to have a desired profile when the polishing end time is reached.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: August 10, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Jeffrey Drue David, Dominic J. Benvegnu, Harry Q. Lee, Boguslaw A. Swedek, Lakshmanan Karuppiah
  • Patent number: 7769483
    Abstract: A detection signal representing changes of an object observed can be easily transmitted to any desirable site, without performing complex adjustment to use the signal. An AE sensor is provided on an appropriate part of the circumferential surface of a rotating-side chuck which holds a workpiece. A signal-transmitting unit is provided in a space made in the rotating-side chuck. A signal-receiving unit is mounted on an appropriate part of a main section on which the rotating-side chuck is provided. The signal-transmitting unit transmits by radio a detection signal generated by the AE sensor. The signal-receiving unit receives and demodulates the detection signal, generating a signal that will be processed in signal processing.
    Type: Grant
    Filed: August 16, 2006
    Date of Patent: August 3, 2010
    Assignee: Bosch Corporation
    Inventors: Osamu Kubota, Takayuki Yui, Hideo Hurukawa, Haruhiko Ueno
  • Patent number: 7751991
    Abstract: The invention relates to a system for determining the wear state of a machine tool. It has a machine tool with a controller, a production control computer and the tool database via a respective data connection. A simulation computer, by way of a simulation process, while taking into account actual machine, production and tool data of the machine tool, is provided for determining data describing the wear state of the machine tool and for feeding said data to a display unit or a further process via a data connection.
    Type: Grant
    Filed: December 28, 2006
    Date of Patent: July 6, 2010
    Assignee: Siemens Aktiengesellschaft
    Inventors: Matthias Diezel, Carsten Hamm, Marc Holz, David Koch
  • Patent number: 7747341
    Abstract: Producing a three-dimensional multi-material component whereby successive layers of at least one material are printed by a drop ink-jet-type printer including cutting a representation of the multi-material component into remarkable objects; cutting the representation of the component into print layers, as a function of the remarkable objects; for each print layer, establishing a plurality of discrete spatial print path trajectories; for each print layer and for each discrete spatial trajectory, establishing an assembly of printing parameters which are dependent on the nature of the deposited materials and the deposition conditions thereof; and establishing a rule for the spatial and temporal sequencing of the print path of the print layers and of the discrete spatial trajectories as a function of the objects, the relative three-dimensional arrangement thereof and the characteristics of the printing device.
    Type: Grant
    Filed: August 17, 2004
    Date of Patent: June 29, 2010
    Assignee: Centre National de la Recherche Scientifique (C.N.R.S.)
    Inventors: Martine Dubois, Rémi Noguera, Thierry Chartier, Maksoud Oudjedi
  • Patent number: 7729796
    Abstract: The invention concerns an industrial robot (4) comprising a machining tool (2) attached to one hand (3) of the robot, designed to perform a hydraulic-driven movement relative to the hand (3) and connected therefor to a hydraulic unit (10). The hydraulic unit (10) is placed directly on a mobile part of the robot, in particular directly on the robot hand (3). Therefore there is no more need for hydraulic supply lines along the arm of the robot. Further, when the robot hand (3) changes tool, no separation of hydraulic lines is required. The machining tool (2) is in particular a device for placing blind rivets, thereby enabling an entirely automated process for placing blind rivets.
    Type: Grant
    Filed: May 21, 2007
    Date of Patent: June 1, 2010
    Assignee: Richard Bergner Verbindungstechnik GmbH & Co. KG
    Inventors: Gerd Hartrampf, Christian Böhner, Klaus Dehlke
  • Patent number: 7710287
    Abstract: A sensor system for a machine tool with at least one sensor with at least one measurement instrument, which measures a physical quantity occurring within the machine tool, which is related to a machining process performed by the machine tool; with a first energy supply for supply of the at least one measurement instrument of the sensor, wherein the first energy supply receives electric energy from a surrounding electromagnetic field in a wireless way; and with a second energy supply for supplying the at least one measurement instrument of the sensor, wherein the second energy supply comprises at least one battery.
    Type: Grant
    Filed: July 3, 2007
    Date of Patent: May 4, 2010
    Assignee: Artis Gesellschaft fur Angewandte Messtechnik mbH
    Inventors: Dirk Lange, Volker Redecker
  • Patent number: 7707009
    Abstract: A method and system for automatically calculating and generating performance analysis charts, including a reliability curve. The method and system are used to selectively convert performance records data from a database into graphs and charts reflective of a performance analysis. A tool and method is provided for predicting the effective life or run time of a component, such as a drill bit, based on calculated reliabilities for similar components.
    Type: Grant
    Filed: October 23, 2007
    Date of Patent: April 27, 2010
    Assignee: Smith International, Inc.
    Inventor: Stephen C. Steinke
  • Patent number: 7684891
    Abstract: The present invention provides a system and method for tool use management wherein a CNC machine retains information identifying the tools associated with the machine as well as their current locations (if any), and executes an algorithm for determining the source tools needed by a part program and matching the source tools with the available tools.
    Type: Grant
    Filed: August 6, 2007
    Date of Patent: March 23, 2010
    Assignee: Hurco Companies, Inc.
    Inventors: Stefan Okrongli, Robert J. Gorgol, Jr., Aleksandr Shkiler, Gerald Traicoff, Kishore Lankalapalli
  • Publication number: 20100063617
    Abstract: The present invention provides a machining state checking apparatus and method for checking whether a workpiece mounted on a machine tool and a workpiece fixture are shifted. A machining state checking apparatus has an actual CCD camera for imaging a workpiece fixed on a machine tool and a workpiece fixture and generating actual two-dimensional image data thereof, a virtual image generating section for generating virtual two-dimensional image data of the workpiece and workpiece fixture based on data on three-dimensional models of the workpiece and workpiece fixture, a comparing section for comparing the actual two-dimensional image data and virtual two-dimensional image data generated by the actual CCD camera and the virtual image generating section, respectively, and determining whether they match each other by comparing the portions corresponding to the workpiece and workpiece fixture in the actual two-dimensional image and the virtual two-dimensional images of the workpiece and workpiece fixture.
    Type: Application
    Filed: September 3, 2009
    Publication date: March 11, 2010
    Applicant: MORI SEIKI CO., LTD
    Inventors: Masahiko Mori, Xiaodong Tian, Bingyan Zhao, Makoto Fujishima, Zhe Jin
  • Publication number: 20100063608
    Abstract: A method of controlling a machine tool and other controlled devices, as well as a programmable numerical control (PNC) system, are disclosed. In at least one embodiment, the method of controlling includes receiving a first part program at a programmable logic controller (PLC), and storing the first part program in a string array library of a memory portion of the PLC. The method further includes communicating information between the PLC and an operator interface regarding the first part program, and providing a first signal from the PLC to a first port so as to cause the first machine tool to be operated in accordance with the first part program. Also, in at least some embodiments, the PNC system allows for control of multiple machine tools and/or other controlled devices, by way of one or more part programs, and/or for editing of a part program while that program is being executed.
    Type: Application
    Filed: September 11, 2008
    Publication date: March 11, 2010
    Inventor: John W. Miller
  • Patent number: 7664565
    Abstract: The invention is a method of creating greater accuracies for wear compensation of a finishing tool during the finishing of workpieces, in which a reference surface is ablated by initially traversing the finishing tool over the reference surface and determining the actual wear of the finishing tool as a result of this initial feed motion of the finishing tool controlled by an NC feed program of an NC machine. The actual measured wear of the finishing tool as a result of the initial traversing feed motion over the reference surface is compared to a known empirical wear trend line for the workpiece and the feed motion of the NC feed program for the next workpiece is recalculated as a function of the comparative actual wear of the finish tool with respect to the known empirical wear trend line.
    Type: Grant
    Filed: March 20, 2007
    Date of Patent: February 16, 2010
    Assignee: Thielenhaus Microfinish Corp.
    Inventor: Oliver Stammen
  • Patent number: 7657342
    Abstract: A computer program product that determines a polishing endpoint includes obtaining spectra from different zones on a substrate during different times in a polishing sequence, matches the spectra with indexes in a library and uses the indexes to determining a polishing rate for each of the different zones from the indexes. An adjusted polishing rate can be determined for one of the zones, which causes the substrate to have a desired profile when the polishing end time is reached.
    Type: Grant
    Filed: August 4, 2008
    Date of Patent: February 2, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Jeffrey Drue David, Dominic J. Benvegnu, Harry Q. Lee, Boguslaw A. Swedek, Lakshmanan Karuppiah
  • Publication number: 20100023156
    Abstract: A system for remotely monitoring one or more machine tool systems is disclosed. The system may monitor a plurality of machine tool systems which are associated with different customers and at a plurality of facilities. A remote user may access information regarding the machine tool system through a user interface and specific that notifications be sent upon the occurrence of various conditions. A system for updating software of a machine tool system is also disclosed.
    Type: Application
    Filed: July 23, 2008
    Publication date: January 28, 2010
    Inventors: Matthew David Trepina, Elias G. Pavlakos, Gregory S. Volovic, John Christopher Allen
  • Publication number: 20100010662
    Abstract: A stable rotation speed is acquired by finely changing a rotation speed of a rotary shaft 3 based on an expected stable rotation speed, and calculating an amount of change of a k? number, and the like. Therefore, a more accurate rotation speed can be acquired, and “chatter vibration” generated during machining can be suppressed more effectively than a conventional method. As a result, a quality of a workpiece surface can be improved, and a tool wear and the like can be suppressed.
    Type: Application
    Filed: June 29, 2009
    Publication date: January 14, 2010
    Applicant: Okuma Corporation
    Inventor: Hiroshi INAGAKI
  • Patent number: 7637702
    Abstract: There is provided a drilling method capable of improving machining accuracy of a printed board drilling apparatus as a whole by decreasing dispersion of the machining accuracy even if it is a multi-spindle printed board drilling apparatus. A misalignment of an axial center of a drill with respect to a designed axial center in X and Y directions is detected in advance per a certain number of revolutions of each spindle that rotates the drill. Holes of two or more types of diameter are made on a printed board by making holes of at least one diameter, e.g., an exposure master hole, per each spindle and by making holes of all other diameters almost simultaneously by all of the spindles.
    Type: Grant
    Filed: July 20, 2006
    Date of Patent: December 29, 2009
    Assignee: Hitachi Via Mechanics, Ltd.
    Inventors: Takao Furukawa, Hiroshi Kawasaki, Toshiyuki Iwata, Katsuhiro Nagasawa, Takahiko Yamashita
  • Publication number: 20090312863
    Abstract: A system and method for inspecting a machined surface. The method includes acquiring optical information of the machined surface from a predefined orientation. Further, the method includes comparing one or more parameters of the optical information with a corresponding one or more reference parameters. Furthermore, the method includes assessing a quality of the machined surface based on the comparison.
    Type: Application
    Filed: June 16, 2008
    Publication date: December 17, 2009
    Applicant: GM GLOBAL TECHNOLOGY OPERATIONS, INC.
    Inventors: John S. Agapiou, Phillip K. Steinacker