Including Program Set Up Patents (Class 702/123)
  • Patent number: 6678669
    Abstract: Methods are provided for developing medical diagnostic tests using decision-support systems, such as neural networks. Patient data or information, typically patient history or clinical data, are analyzed by the decision-support systems to identify important or relevant variables and decision-support systems are trained on the patient data. Patient data are augmented by biochemical test data, or results, where available, to refine performance. The resulting decision-support systems are employed to evaluate specific observation values and test results, to guide the development of biochemical or other diagnostic tests, too assess a course of treatment, to identify new diagnostic tests and disease markers, to identify useful therapies, and to provide the decision-support functionality for the test.
    Type: Grant
    Filed: August 14, 1997
    Date of Patent: January 13, 2004
    Assignee: Adeza Biomedical Corporation
    Inventors: Jerome Lapointe, Duane DeSieno
  • Patent number: 6662132
    Abstract: A noise analyzing method analyzes a crosstalk noise based on circuit data in which buses having the same signal transmitting direction and buses having opposite signal transmitting directions are distinguished from each other, by analyzing the crosstalk noise only for the same signal transmitting direction with respect to the buses having the same signal transmitting direction.
    Type: Grant
    Filed: December 11, 2000
    Date of Patent: December 9, 2003
    Assignee: Fujitsu Limited
    Inventors: Yasuhiro Yamashita, Shogo Fujimori, Ryoji Yamada, Kazuhiko Tokuda, Makoto Suwada, Masaki Tosaka, Jiro Yoneda, Yoshiyuki Iwakura, Kazunari Gotou
  • Publication number: 20030225540
    Abstract: Each type of peripheral device has a unique identification, and if this unique identification is not present in software that is being transferred to the peripheral device for installation on the peripheral device, the peripheral device rejects the software being transferred to it.
    Type: Application
    Filed: May 31, 2002
    Publication date: December 4, 2003
    Inventors: Travis D. Minke, Bryan A. White
  • Patent number: 6654701
    Abstract: An embodiment of the invention provides a mechanism for measuring the performance characteristics of data sent across any communication path configured to carry data between two or more computational devices (e.g., local area networks, wide area network, virtual private networks, wireless networks, or any other type of interconnect mechanism). In a test environment, processing speed is a critical part of producing test equipment that can process network protocol data in real-time. Embodiments of the invention provide network test equipment with a methodology for performing enough lookup processing operations to keep up with the real time frame rates of a gigabit Ethernet network. This is accomplished in accordance with one embodiment of the invention by improving the performance of the connection lookup processor in test devices.
    Type: Grant
    Filed: August 30, 2001
    Date of Patent: November 25, 2003
    Assignee: Spirent Communications
    Inventor: Tom Hatley
  • Patent number: 6651023
    Abstract: A semiconductor test apparatus includes an analog-to-digital converter for converting into a digital signal an analog output from a circuit under test; a test-apparatus-ADC-control-signal generation circuit for generating a control signal for the analog-to-digital converter in accordance with an activation signal entered from the outside; a measured data memory for storing, as measured data for each conversion, a signal output from the analog-to-digital converter; an address counter for generating an address signal for the measured data memory; a DAC counter for generating data to be input to the circuit under test; and a data write control circuit which produces, in response to a flag signal output from the analog-to-digital converter and representing that conversion is being performed, an update signal for the address counter, a memory write signal for the measured data memory, and an update signal for the DAC counter.
    Type: Grant
    Filed: August 13, 2001
    Date of Patent: November 18, 2003
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Ryoden Semiconductor System Engineering Corporation
    Inventors: Hisaya Mori, Shinji Yamada, Teruhiko Funakura
  • Publication number: 20030182075
    Abstract: A test executive system for controlling a test upon a device under test that is distinct and separate from said test executive system. The test executive system provides interactive dialog boxes in the following manner. A signal that an event in a testing procedure occurs is received. A file storing testing information is retrieved responsive to the signal. The testing information includes directions for the user to perform an action required to continue the test. The test executive system includes a web browser and the test information may comprise a web page. The testing information is displayed along with at least one input option. An input is then received from the user. The input is then processed responsive to receiving said input.
    Type: Application
    Filed: March 20, 2002
    Publication date: September 25, 2003
    Inventors: Christopher K. Sutton, Richard Mills
  • Patent number: 6615153
    Abstract: A method for managing and using a test system is proposed, which is applied to the test system comprising a test server and a test workstation, and allows a user to perform a test and obtain a test report according to the user's right for accessing the test server and an actual operating state of the test workstation. The users are assigned to different test groups set up in the test server. The test workstation activates a start-up window for the user to input data thereto and transmits the data to the test server. The test server then processes the transmitted data and produces the corresponding test report according to the right of the user and the right of the test group which the user belongs to for accessing the test server.
    Type: Grant
    Filed: June 14, 2001
    Date of Patent: September 2, 2003
    Assignee: Inventec Corporation
    Inventors: Yi Bo Liu, Tong S. Chen, Kuang Shin Lin
  • Patent number: 6611947
    Abstract: This invention determines whether two logic level circuit models have equivalent functionality. The method allows difficult portions of the equivalent functionality check to be partitioned and concurrently solved in a distributed computing environment. This permits the user to use, in a scalable fashion, additional computing resources to rapidly solve difficult equivalent functionality checks. The method allows difficult checks to be solved using (1) a divide-and-conquer approach, (2) by a competitive approach in which many independent attempts are made to solve the same check, or (3) by allocating more resources to solve the difficult check.
    Type: Grant
    Filed: August 23, 2000
    Date of Patent: August 26, 2003
    Assignee: Jasper Design Automation, Inc.
    Inventors: Joseph E. Higgins, Vigyan Singhal, Adnan Aziz
  • Patent number: 6606566
    Abstract: The present invention relates to a computer program product or code in memory for detecting and transmitting sensory data from a portable field device 10 to a processor 12 via a computer network 10 for analytic purposes. The product includes a code directed to capturing analyte data pertaining to an unknown analyte using a field device 10. The product further includes a code directed to encoding the captured analyte data and transmitting the encoded analyte data via a computer network 18 to a processor 12 for analysis. The product also includes a code directed to performing an analysis of the captured analyte data at a remote location by the processor 12 using data of known analytes retrieved from an electronic library 14. This code and others can be used with the present invention to perform the functionality described herein as well as others.
    Type: Grant
    Filed: October 31, 2000
    Date of Patent: August 12, 2003
    Inventor: Steven A. Sunshine
  • Patent number: 6594610
    Abstract: A new testing method uses a field programmable gate array to emulate faults, instead of using a separate computer to simulate faults. In one embodiment, a few (e.g., two or three) known good FPGAs are selected. A fault is introduced into the design of a FPGA configuration. The configuration is loaded into the FPGAs. A test vector is applied and the result is evaluated. If the result is different from that of a fault-free configuration, the fault is caught. One application of this method is to evaluate fault coverage. A fault model that can be used in the present invention is disclosed.
    Type: Grant
    Filed: May 11, 2001
    Date of Patent: July 15, 2003
    Assignee: Xilinx, Inc.
    Inventors: Shahin Toutounchi, Anthony P. Calderone, Zhi-Min Ling, Robert D. Patrie, Eric J. Thorne, Robert W. Wells
  • Patent number: 6594612
    Abstract: A digitizer for use in a measurement system. The digitizer acquires data from an external source, and includes a static random access memory (SRAM) which stores a scan list comprising entries specifying digitizer operations such as switch time, settle time, measure time, looping, and mathematical operation specifications such as scaling, adding, and averaging specifications. The looping specification may include instructions to repeatedly execute one or more entries in the scan list. The digitizer includes a programmable logic element (e.g. an FPGA) coupled to the SRAM which accesses and executes the scan list to acquire analog signals from the source. The digitizer may include an analog-to-digital converter to convert the analog signals to digital signals, as well as a multiplexer to read the analog signals from multiple channels, a signal conditioner to modify the analog signals from the multiplexer, and an amplifier to amplify the analog signals from the signal conditioner.
    Type: Grant
    Filed: December 11, 2000
    Date of Patent: July 15, 2003
    Assignee: National Instruments Corporation
    Inventor: Andrew Moch
  • Publication number: 20030125898
    Abstract: An electronic instrument includes instrument hardware, core software, and the ability to support custom data processing libraries, separate from the core software. The instrument hardware acquires unprocessed measured data. The core software includes standard measurement objects and standard algorithms. The standard measurement objects produce analysis results of the unprocessed measured data. The standard algorithms are used by the standard measurement objects to aid in production of analysis results of the unprocessed measured data. Custom libraries as supported by the core software include custom measurement objects and custom algorithms. The custom measurement objects produce analysis results of the unprocessed measured data. The custom algorithms are used by the custom measurement objects to aid in production of analysis results of the unprocessed measured data.
    Type: Application
    Filed: August 31, 2001
    Publication date: July 3, 2003
    Inventor: Donald Wilson Stark
  • Patent number: 6581021
    Abstract: A method for downloading and managing a test tool of a test system is proposed, which is applied to the test system having a test service server and a tested machine. A test tool required for performing a test for the tested machine is available as being downloaded from the test service server through a network, which connects the tested machine and the test service server, so as to examine if the tested machine works properly. As such, the test service server acts as a reservoir for the test tools and is used to activate start-up for the test, allowing the tested machine to be initiated with test conditions and user conditions for using the test tool being inputted to the test tool.
    Type: Grant
    Filed: June 15, 2001
    Date of Patent: June 17, 2003
    Assignee: Inventec Corporation
    Inventors: Yi Bo Liu, Tong S. Chen, Kuang Shin Lin
  • Patent number: 6581020
    Abstract: A system for managing and reporting laboratory data wherein the data is obtained at remote data-taking stations, transferred instantaneously by wireless communication to a main data-storing/manipulating station for recording therein without being recorded at the remote data-taking stations, and reported only from the data-storing/manipulating.
    Type: Grant
    Filed: October 10, 2000
    Date of Patent: June 17, 2003
    Assignee: VelQuest Corporation
    Inventors: William Buote, Kenneth N. Rapp, Burleigh M. Hutchins
  • Patent number: 6577981
    Abstract: A test executive program which provides greatly improved configurability and modularity, thus simplifying the creation, modification and execution of test sequences. The test executive program includes process models for improved flexibility, modularity and configurability. Process models provide a modular and configurable entity for encapsulating operations and functionality associated with a class of test sequences. The process model thus encapsulates a “testing process” for a plurality of test sequences. The process model enables the user to write different test sequences without repeating standard testing operations in each sequence. The test executive program also includes step types for improved configurability. A step type is a modular, identifiable unit configured by the user which defines common properties and/or operations associated with a plurality of steps.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: June 10, 2003
    Assignee: National Instruments Corporation
    Inventors: James Grey, Erik Crank
  • Publication number: 20030097551
    Abstract: A system and method for deploying a hardware configuration with a computer program. The program may perform an instrumentation, measurement/control, industrial automation, or machine vision function, or other type of function utilizing hardware devices, and the behavior of the program may depend on various aspects of the hardware configuration of the computer system. An installation bundle that includes configuration information related to the hardware devices with which the program interacts may be automatically created and used to deploy the program on a new computer system. The installation bundle may include program instructions operable to install the program on the new computer system and automatically modify the hardware configuration of the new computer system so that the program will execute correctly.
    Type: Application
    Filed: November 16, 2001
    Publication date: May 22, 2003
    Inventors: David W. Fuller, John David Stanhope, Joseph Albert Savage, Gregory Clark Richardson
  • Publication number: 20030097233
    Abstract: An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.
    Type: Application
    Filed: November 19, 2001
    Publication date: May 22, 2003
    Inventors: Christopher K. Sutton, William R. Pritchard, Kirsten C. Carlson, James Martin
  • Patent number: 6564162
    Abstract: The operating-point differentiated test results are obtained by running a code sequence on the device at a first operating point to generate predicted results and then running the same code sequence on the device at a second operating point defined by changing an electrical parameter of the first operating point to generate actual results. Any differences that might exist between the predicted and actual results are due to the changed operating point of the device.
    Type: Grant
    Filed: April 3, 2000
    Date of Patent: May 13, 2003
    Assignee: Hewlett-Packard Company
    Inventor: Keith Hall Erskine
  • Patent number: 6560557
    Abstract: A system and method are described for providing remote demonstration and control of a test and measurement device. The system provides for user to request active instrument panel pages for a test and measurement device from a server. The server includes logic that emulates a test and measurement device instrument panel and provides constant update of the instrument panel page data regarding the remote control of the test and measurement device. The server in the correct message format provides the request for updated status data from a remote controlled instrument, for the selected remotely controlled test and measurement device. The server issues the received remote control requests to the remote controlled instrument. The remote controlled instrument provides data and reacts to commands received. The instrument, upon receiving a command or request for instrument state data, transmits said instrument state data to the server for further transmission to the client user interface for further display to a user.
    Type: Grant
    Filed: September 15, 1999
    Date of Patent: May 6, 2003
    Assignee: Agilent Technologies, Inc.
    Inventors: Lyle Carnahan, Marc Raymond Geoffroy, Eric Dodge Littlefield, Charles Lewis Wardin
  • Patent number: 6560554
    Abstract: A method of automatic testing of systems, such as DWDM systems with an OSA, has manufacturer's specifications loaded into the test equipment for a plurality of systems. A user selects one of the systems from a menu, and the test equipment from the manufacturer's specification for the selected system automatically acquires data and makes measurements on the data. The results of the data are summarized in a report which indicates an overall system status, indicating where and why the system failed if any of the measurements indicates the system is out of the manufacturer's specifications. The measurements are kept so that they may be used to determine drift when the system is tested the next time.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: May 6, 2003
    Assignee: Tektronix, Inc.
    Inventor: Duwayne R. Anderson
  • Publication number: 20030050763
    Abstract: A referential and relational database software comprising (a) programmable access for inputation of laboratory operating procedures; (b) communication between said software and testing instrumentation, said software extracting information from said instrumentation; (c) automatic population of designated database fields from said information; (d) manual population of designated database fields; and (e) review of information.
    Type: Application
    Filed: August 30, 2002
    Publication date: March 13, 2003
    Inventors: Michael Arrit, John Hammack, Kenneth Meadows, Rita Riddle
  • Publication number: 20030040881
    Abstract: System and method for measurement, DAQ, and control operations. A measurement module includes measurement circuitry for performing signal conditioning and/or signal conversion, and interface circuitry which provides an interface for the measurement circuitry. A carrier unit couples to the interface circuitry of the module. A computer system couples to the carrier unit and stores one or more hardware configuration programs. The interface circuitry communicates an interface protocol describing the interface, e.g., to the carrier unit or the computer system. The computer system provides a hardware configuration program in response to the communicated interface protocol, and programs one or more programmable hardware elements on the carrier unit with the hardware configuration program. After being configured, the programmable hardware elements interface with the measurement module in accordance with the communicated interface protocol.
    Type: Application
    Filed: July 12, 2002
    Publication date: February 27, 2003
    Inventors: Perry Steger, Garritt W. Foote, David Potter, James J. Truchard, Hugo A. Andrade, Joseph E. Peck, Brian Keith Odom
  • Publication number: 20030036873
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Application
    Filed: March 19, 2002
    Publication date: February 20, 2003
    Inventors: Brian Sierer, Ganesh Ranganathan, John Pasquarette, David W. Fuller, Joseph E. Peck, Matthew Novacek, Hugo A. Andrade
  • Publication number: 20030036874
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Application
    Filed: March 19, 2002
    Publication date: February 20, 2003
    Inventors: David W. Fuller, Michael L. Santori, Brian Sierer, Ganesh Ranganathan, John Pasquarette
  • Publication number: 20030036872
    Abstract: An electronic instrument includes instrument hardware. A data acquisition engine schedules time sharing of the instrument hardware. Channel objects act each as a client of the data acquisition engine. The channel objects each included a channel buffer that contains data obtained from the instrument hardware. Measurement objects are each a client of one of the plurality of channel objects. Each measurement object processes data obtained from a channel buffer of a channel object to which the measurement object is a client. Display window objects are each a client of at least one of the plurality of measurement objects, each display window object displaying data processed by any measurement object to which the display window object is a client. Memory within the electronic instrument is allocated among object types to accommodate a user specified mix of object types.
    Type: Application
    Filed: March 14, 2001
    Publication date: February 20, 2003
    Inventor: Donald Wilson Stark
  • Patent number: 6512988
    Abstract: A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP) and at least two format dependent portions (FDPs) that are specific to the particular format to be tested. The FIP is configured to be compatible with each of the format dependent portions so that any of the format dependent portions can utilize the FIP to perform testing tasks. When a first format test request is received, the FIP activates the virtual instruments associated with the first format. Then, when a second format test request is received, the FIP de-activates the virtual instruments associated with the first format and activates the virtual instruments associated with the second format.
    Type: Grant
    Filed: May 25, 2000
    Date of Patent: January 28, 2003
    Assignee: Agilent Technologies, Inc.
    Inventor: Kerwin D Kanago
  • Patent number: 6510987
    Abstract: A computer system is used for monitoring that each of a plurality of operators assigned to work during a predetermined work shift has checked into a production area and has measured the ESD (electro static discharge) from the body of the operator at an ESD (electro static discharge) measuring unit. A database stores data regarding a plurality of operators working in the production area, and the computer system includes a data processor for generating a list of operators assigned to work during a predetermined work shift from data stored in the database. A respective badge identification of each operator who checks into the production area is stored in a first working file, and a respective badge identification of each operator who measures a respective amount of ESD (electro static discharge) from the body of the operator is stored in a second working file, of the data storage unit of the computer system.
    Type: Grant
    Filed: August 7, 2000
    Date of Patent: January 28, 2003
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Anuchit Hengriprasopchoke, Kamphon Suewonsuwan
  • Patent number: 6512989
    Abstract: An automated test system that has analog and digital resources for testing mixed signal ICs. A control pattern is provided that is used by the automated test system to simultaneously control both the digital resources and the analog resources. The control pattern is comprised of a sequentially executed two-dimensional array with columns corresponding to analog and digital resources. The automated test system uses the control pattern to control both the analog and digital resources.
    Type: Grant
    Filed: March 26, 1999
    Date of Patent: January 28, 2003
    Assignee: LTX Corporation
    Inventors: Mark Deome, Donald V. Organ
  • Publication number: 20030018446
    Abstract: A system and method for performing a measurement task. A node is displayed in a graphical program, and configured to receive a measurement task specification (MTS). The node may be coupled to an MTS node, or to a configuration node which constructs the MTS at run time. When the program executes, the node receives the MTS, invokes an expert system to analyze the MTS, optionally validate the MTS, generates a run-time specification for the task. The node them invokes a run-time builder to analyze the run-time specification and generate a run-time based on the run-time specification, where the run-time is executable to perform the measurement task. The node may be a read node, a write node, or a start node connected to a read or write node. Additional operations may be performed prior to or during the first iteration, and/or during or after the last iteration, of the task.
    Type: Application
    Filed: July 12, 2002
    Publication date: January 23, 2003
    Applicant: National Instruments Corporation
    Inventors: Thomas A. Makowski, Geoffrey Schmit
  • Patent number: 6507801
    Abstract: The present invention relates to a semiconductor device testing system having an advanced testing capability for performing tests on a semiconductor device. A system frame includes both normal and high-speed testing formatters, and a test head is arranged in electrical communication with the system frame. Normal PIN drivers are included to operate the testing system at a first frequency to transmit the signals required to perform tests at a normal speed. High-speed PIN drivers are also included to operate the testing system at a second frequency, higher than the first frequency, to transmit the signals required to perform tests at a higher speed. In this manner, the testing system of this invention is able-to achieve superior testing performance while reducing the overall system production cost.
    Type: Grant
    Filed: October 25, 2000
    Date of Patent: January 14, 2003
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Se-Jang Oh, Ki-Sang Kang, Jeong-Ho Bang
  • Publication number: 20030004673
    Abstract: System and method for programmatically determining routing with signal modifications in a measurement system to perform a measurement task. Information is received specifying a route from a source terminal to a destination terminal in the measurement system, including signal modification requirements and a graph of possible routes in the measurement system. A current signal modification of the route is determined and used with the signal modification requirements to determine desired changes in the signal modification of the route. The legs of the route are walked in the graph, and one or more legs are replaced with respective alternative legs, each of which includes at least a portion of the desired changes in the signal modification, thereby generating a modified route which satisfies the signal modification requirements for the route, where the modified route is usable to route signals in performing the measurement task. The modified route is then stored.
    Type: Application
    Filed: June 18, 2002
    Publication date: January 2, 2003
    Inventor: Robert W. Thurman
  • Publication number: 20030004674
    Abstract: System and method for managing routing resources for a measurement task. The system includes a computer and one or more measurement devices. The legs of a route for routing signals in performing the measurement task are created by, for each respective leg: determining if a routing resource for the respective leg is not currently used in an existing route. If not, then the resource is configured with a desired configuration of the respective leg, and a resource reservation indicated, e.g., by incrementing a resource usage count. If the resource is currently used, the desired configuration is compared with the resource's current configuration. If the current configuration conforms to the desired configuration, a resource reservation is indicated, otherwise, an error message indicating that the leg failed is returned, and optionally, an alternative leg for the route is created which includes a different resource than the respective leg. The route is stored.
    Type: Application
    Filed: August 30, 2002
    Publication date: January 2, 2003
    Applicant: National Instruments Corporation
    Inventors: Robert W. Thurman, Jeff A. Carbonell
  • Publication number: 20030004675
    Abstract: System and method for programmatically determining routing with signal modifications in a measurement system to perform a measurement task. Information is received specifying a route from a source terminal to a destination terminal in the measurement system, including signal modification requirements and a graph of possible routes in the measurement system. A current signal modification of the route is determined and used with the signal modification requirements to determine desired changes in the signal modification of the route. The legs of the route are walked in the graph, and one or more legs are replaced with respective alternative legs, each of which includes at least a portion of the desired changes in the signal modification, thereby generating a modified route which satisfies the signal modification requirements for the route, where the modified route is usable to route signals in performing the measurement task. The modified route is then stored.
    Type: Application
    Filed: August 30, 2002
    Publication date: January 2, 2003
    Applicant: National Instruments Corporation
    Inventors: Robert W. Thurman, Jeff A. Carbonell
  • Publication number: 20030004672
    Abstract: Computer-implemented system and method for presenting routing information in a measurement system. A meta-routing tool receives user input specifying a device, then retrieves a topography description for the device indicating connectivity between a plurality of components in the device, e.g., from memory or from a server coupled to the computer via a network. The tool then determines routability information for the device based on the topography description, e.g., by walking the topography, and displays the routability information, which is then useable to determine routing for the measurement system. The routability information includes possible routes through the device, and may also indicate potential side effects for one or more of the routes, e.g., sub-systems used by the routes. The tool may receive user input indicating one of the possible routes, and display a component-wise path used by the indicated route, as well as any sub-systems used by the indicated route.
    Type: Application
    Filed: June 18, 2002
    Publication date: January 2, 2003
    Applicant: National Instruments Corporation
    Inventor: Robert W. Thurman
  • Publication number: 20030004670
    Abstract: System and method for creating measurement applications. The system includes a measurement task specifier for generating a measurement task specification (MTS) for a measurement task in response to user input; an expert system for analyzing and validating the generated MTS, and generating a run-time specification (RTS) for the measurement task; a run-time builder for analyzing the RTS, configuring one or more measurement devices according to the RTS, and generating a run-time which is executable to perform the measurement task. The system includes a storage system for storing the generated MTS, the generated RTS, and configuration information for one or more measurement devices. The expert system includes one or more measurement experts which analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences.
    Type: Application
    Filed: November 13, 2001
    Publication date: January 2, 2003
    Inventors: Geoffrey Schmit, Brent Schwan, Jonathan Brumley, Thomas A. Makowski, Christopher T. Bartz
  • Publication number: 20030005154
    Abstract: System and method for managing routing resources for a measurement task. The system includes a computer and one or more measurement devices. The legs of a route for routing signals in performing the measurement task are created by, for each respective leg: determining if a routing resource for the respective leg is not currently used in an existing route. If not, then the resource is configured with a desired configuration of the respective leg, and a resource reservation indicated, e.g., by incrementing a resource usage count. If the resource is currently used, the desired configuration is compared with the resource's current configuration. If the current configuration conforms to the desired configuration, a resource reservation is indicated, otherwise, an error message indicating that the leg failed is returned, and optionally, an alternative leg for the route is created which includes a different resource than the respective leg. The route is stored.
    Type: Application
    Filed: June 18, 2002
    Publication date: January 2, 2003
    Inventor: Robert W. Thurman
  • Publication number: 20030004671
    Abstract: A remote debugging apparatus that uses a development terminal coupled to an evaluation board with a plurality of processing modules including a processor in a master-slave configuration, includes: a setting module for pre-setting a breakpoint in a program executed in the evaluation board; and a registering module for registering a procedure in a database provided either on the evaluation board or on the development terminal. The procedure is performed for a memory on the evaluation board when the breakpoint is hit. The apparatus further includes; an execution-commencing module for starting the program in the evaluation board; and an execution-controlling module for referencing the database in response to a hit on the breakpoint, and controlling the processing module of the evaluation board to execute a procedure required to be done on the memory of the evaluation board.
    Type: Application
    Filed: May 28, 2002
    Publication date: January 2, 2003
    Applicant: Mitsubishi Denki Kabushiki Kaisha
    Inventor: Isao Minematsu
  • Patent number: 6502051
    Abstract: Testing of an electronic system is optimized by using a single set of sub-tests and varying the testing sequence to produce tests tailored for different purposes such as screening and diagnostic testing. For example, a programmable test sequencer in the electronic system responds to a test selection variable by using a first sequence of the sub-tests to optimize the testing process for screening and a second sequence of the sub-tests to optimize the testing process for diagnostic testing. In the diagnostic mode, the sub-tests are run so that each sub-test builds upon the previous sub-tests and uses previously-tested hardware to verify additional hardware. In the screening mode, the sub-tests are the same, but the execution order of the sub-tests is reversed so that more complex hardware is tested first as a screening mechanism.
    Type: Grant
    Filed: March 16, 2000
    Date of Patent: December 31, 2002
    Assignee: Sun Microsystems, Inc.
    Inventor: Joseph P. Coyle
  • Publication number: 20020193961
    Abstract: An on-board self test system for an electrical power monitoring device includes a test signal circuit in an electronic circuit of the monitoring device, and responsive to a programmable test input signal for producing an analog signal simulating an electrical power waveform, and a programmable memory in an electronic circuit of the monitoring device and operatively coupled with the test signal circuit for storing and reproducing upon command, one or more of the programmable test input signals.
    Type: Application
    Filed: September 20, 2001
    Publication date: December 19, 2002
    Inventor: Ronald J. Bilas
  • Patent number: 6490538
    Abstract: With the proposed invention a method for configuring a measuring arrangement for physical, more particularly thermal conditions over a section to be measured is indicated, comprising at least one locally distributed sensor. The measuring arrangement consists of programmable modules with the minimum characteristics of acquire, edit, save, represent and signal measurement data of at least one distributed sensor. The method according to the invention consists in the fact that zone-specific data of the section to be measured are assigned to zone-specific measured quantities, and that these data are combined into data groups, and that the modules are configured with parameter sets with which editing steps of the individual modules are functionally assigned to one another. One parameter set preferably includes at least sensor-specific parameters; measuring instrument-specific parameters; organization of data and programs; organization of hardware modules; representation of the data and communication parameters.
    Type: Grant
    Filed: February 17, 2000
    Date of Patent: December 3, 2002
    Assignee: LIOS Technology GmbH
    Inventors: Ulrich Glombitzs, Dino Simonits
  • Patent number: 6487522
    Abstract: A computer system includes a processor; a hard drive connected to the processor and having an image applied thereto, the image including device drivers and executable applications; an installation file stored on the hard drive and executable by the processor, the installation file including a first instruction associated with a first executable application; and a data file stored on the hard drive; wherein upon execution of the first instruction by the processor, a determination is made whether the data file includes a valid section corresponding to the first executable application and including a list of hardware devices that are compatible with the first executable application.
    Type: Grant
    Filed: November 1, 2000
    Date of Patent: November 26, 2002
    Assignee: Dell Products, L.P.
    Inventors: T. Gavin Smith, Gaston M. Barajas
  • Patent number: 6487514
    Abstract: A method and system for programmed interaction with integrated circuits (ICs) are disclosed in various embodiments. The system allows a hard-coded program that is suitable for a family of ICs having certain characteristics in common to be dynamically adapted for use with specific ICs within the family. To test a specific IC within a family, the register characteristics and one or more program operations that are particular to the specific are obtained. During execution, the hard-coded program is adapted to interact with the specific IC using the register characteristics and the one or more program operations of the specific IC.
    Type: Grant
    Filed: December 22, 1999
    Date of Patent: November 26, 2002
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Ho Wai Wong-Lam, Mark Douglas Naley
  • Patent number: 6477484
    Abstract: A method for determining the utilization of a computing apparatus is described, especially for the determination of the utilization of a microcomputer having a real-time operating system. In the method, an idle program (2) is always then called up when no other programs are processed by the control apparatus. According to the invention, the number (ZMESS) of the call-ups of the idle program (2) or the total duration of the idle program (2) is determined. This number (ZMESS) is evaluated after a pregiven reference time span (TMAX) is exceeded. The number (ZMESS) of call-ups of the idle program (2) can be applied as a measure for the utilization of the computing apparatus.
    Type: Grant
    Filed: June 23, 2000
    Date of Patent: November 5, 2002
    Assignee: Robert Bosch GmbH
    Inventor: Marcel Hachmeister
  • Patent number: 6473707
    Abstract: Abstract A test executive program which provides greatly improved configurability and modularity, thus simplifying the creation, modification and execution of test sequences. The test executive program includes process models for improved flexibility, modularity and configurability. Process models provide a modular and configurable entity for encapsulating operations and functionality associated with a class of test sequences. The process model thus encapsulates a “testing process” for a plurality of test sequences. The process model enables the user to write different test sequences without repeating standard testing operations in each sequence. The test executive program also includes step types for improved configurability. A step type is a modular, identifiable unit configured by the user which defines common properties and/or operations associated with a plurality of steps.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: October 29, 2002
    Assignee: National Instruments Corporation
    Inventor: James Grey
  • Patent number: 6456949
    Abstract: A mesh processor divides a target device into a plurality of patches. A mutual impedance calculator computes a mutual impedance between the patches based on previously computed analytic solutions of a quadruple integration under the condition that the patches are rectangular in shape and are parallel or perpendicular to each other. Finally, an electromagnetic field intensity calculator calculates electromagnetic field intensity based on the computed mutual impedance.
    Type: Grant
    Filed: July 11, 2000
    Date of Patent: September 24, 2002
    Assignee: Fujitsu Limited
    Inventors: Takashi Yamagajo, Kenji Nagase, Shinichi Ohtsu, Makoto Mukai
  • Publication number: 20020124042
    Abstract: A system and method for synchronizing execution of multiple processes or threads executing to perform tests of one or more units under test. A test executive software application may enable a user to create a test sequence to test a unit under test, wherein the test sequence comprises a plurality of steps. In one embodiment, one or more synchronization steps may be included in the test sequence, in response to user input requesting inclusion of the synchronization steps. Each synchronization step may be configured to perform a synchronization operation, in response to user input specifying the synchronization operation. There may be multiple synchronization step types available for inclusion in a test sequence, wherein each synchronization step type corresponds to a particular type of synchronization object, such as a mutex synchronization object, a semaphore synchronization object, a queue synchronization object, etc.
    Type: Application
    Filed: March 2, 2001
    Publication date: September 5, 2002
    Inventors: Douglas Melamed, James Grey
  • Patent number: 6434499
    Abstract: The present invention provides a portable on-site tester to test a disc drive at a location remote from the disc drive manufacturer. The tester supports multiple disc drive interfaces by supporting multiple drive initiator cards, one of which is selected for use at a time. A tester which controls operation of the tester is attached to a local computer via a tester interface. The proper drive initiator card is selected for connection to the tester interface such that the drive initiator card supports the disc drive interface format of the disc drive to be tested. The tester may be configured to support different disc drive interfaces by connection of various drive initiator cards to the tester. The drive initiator cards are mounted to one or more drive initiator card supports, which are oriented in the tester such that the selected drive initiator card is electrically connected to the tester.
    Type: Grant
    Filed: October 8, 1999
    Date of Patent: August 13, 2002
    Assignee: Seagate Technology LLC
    Inventors: Scott D. Ulrich, Cary D. Johnson, Morse Magnuson, Peter A. Sherrard
  • Patent number: 6434503
    Abstract: A method for providing specific test programs from a production test program for testing semiconductor devices, in accordance with the present invention, includes providing a semiconductor device to be tested by a tester and initiating a production test program. The production test program includes a plurality of program files and test code sequences. The production test program is held at a test which is to be extracted, and register information and settings are extracted from the tester for the test to be extracted. The register information and settings are stored in a storage file, and the storage file is assembled and translated to provide an executable test program for an extracted test for testing the semiconductor device or other semiconductor devices.
    Type: Grant
    Filed: December 30, 1999
    Date of Patent: August 13, 2002
    Assignee: Infineon Technologies Richmond, LP
    Inventor: Michael Bernhard Sommer
  • Publication number: 20020091496
    Abstract: A method for automatically developing a testing program of a tester is provided. The method includes steps of establishing an intellectual property, integrating the intellectual property with a product target specification, an error code list and a program transfer rule check, and automatically developing a prototype of the testing program. The intellectual property includes a tester library, a tester resource installation configuration and a testing strategy.
    Type: Application
    Filed: April 30, 2001
    Publication date: July 11, 2002
    Inventors: Yi-Jen Cheng, Deng-Kai Yang
  • Patent number: 6418392
    Abstract: A system and method for controlling an instrumentation system, wherein the present invention includes an improved instrument driver software architecture. The instrument driver software architecture of the present invention provides a number of features, including improved simulation features. The system may comprise a computer system comprising a CPU and memory. The memory of the computer system may store a user application, a class driver, and a class simulation driver. The user application is operable to perform an application using an instrument, wherein the instrument is of a first class. The class driver is operable to receive calls from the user application, wherein the class driver is common to a plurality of instruments of the first class. The class driver may then call a class simulation driver, wherein the class simulation driver is operable to simulate operation of the instrument.
    Type: Grant
    Filed: October 24, 2000
    Date of Patent: July 9, 2002
    Assignee: National Instruments Corporation
    Inventors: Scott Rust, Jon Bellin, James Grey