Including Program Set Up Patents (Class 702/123)
  • Patent number: 6889172
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Grant
    Filed: March 19, 2002
    Date of Patent: May 3, 2005
    Assignee: National Instruments Corporation
    Inventors: Brian Sierer, Ganesh Ranganathan, John Pasquarette, David W Fuller, III, Joseph E. Peck, Matthew Novacek, Hugo A. Andrade
  • Patent number: 6889157
    Abstract: A method of installing and configuring a test suite for a unit under test in an automated assembly process uses an identifier of the unit under test to retrieve the test files and other files for the installation and configuration. The identifier may be a serial number. The method uses the identifier to call up a Bill of Materials. From the Bill of Materials, test files and other files are generated.
    Type: Grant
    Filed: March 25, 2002
    Date of Patent: May 3, 2005
    Assignee: Gateway, Inc.
    Inventors: Shad L. Mutchler, Dennis K. Paulsen, Christopher M. Langdon
  • Patent number: 6889160
    Abstract: To facilitate the testing of a testee network service such as a web service made available on the Internet, various embodiments of a network service test system are provided. In one embodiment, a testee network service is tested using a network service test environment. The network service test environment surrounds the testee network service. The network service test environment comprises at least one mock client that is in data communication with and interacts with the testee network service. The network service test environment also includes at least one mock support network service in data communication with the testee network service. The at least one mock support network service simulates a performance of an actual support network service while a data communication link exists between the actual support network service and the testee network service.
    Type: Grant
    Filed: May 30, 2003
    Date of Patent: May 3, 2005
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Mark L. Sabiers, David Christopher Davidson, Jay D. Knitter, Donna J. Grush, Terry M. Martin, Blaine R. Southam
  • Patent number: 6879926
    Abstract: System and method for creating measurement applications. The system includes a measurement task specifier for generating a measurement task specification (MTS) for a measurement task in response to user input; an expert system for analyzing and validating the generated MTS, and generating a run-time specification (RTS) for the measurement task; a run-time builder for analyzing the RTS, configuring one or more measurement devices according to the RTS, and generating a run-time which is executable to perform the measurement task. The system includes a storage system for storing the generated MTS, the generated RTS, and configuration information for one or more measurement devices. The expert system includes one or more measurement experts which analyze all or part of the MTS and populate complete or partial RTSs. The partial RTSs are iteratively populated by other experts to form complete RTSs. Competing RTSs may be assessed and a final RTS selected based upon user preferences.
    Type: Grant
    Filed: November 13, 2001
    Date of Patent: April 12, 2005
    Assignee: National Instruments Corporation
    Inventors: Geoffrey Schmit, Brent Schwan, Jonathan Brumley, Thomas A. Makowski, Christopher T. Bartz
  • Patent number: 6879925
    Abstract: Estimation related to void formation and breakage/failure is performed through numerical simulation using dominant parameters of EM damage in a metal interconnect. The metal interconnect is divided into elements. Current density and temperature distribution is obtained using numerical analysis. Atomic flux divergence AFDgen of each element and the distribution thereof is calculated by using material property constants determined through acceleration testing. The reduction of volume per one calculation step in the simulation is found by multiplying the volume of each element, the length of time corresponding to one calculation step, and the atomic volume corresponding to the calculated AFDgen. Based on the reduced amount of volume, the thickness of each element decreases. The elements having a decrease in thickness show the fact that voids have formed.
    Type: Grant
    Filed: July 28, 1999
    Date of Patent: April 12, 2005
    Assignee: Japan Science and Technology Corporation
    Inventor: Kazuhiko Sasagawa
  • Patent number: 6879927
    Abstract: A method of verifying test data for testing an integrated circuit device having multiple device time domains includes selecting a virtual tester time domain and, if the cycle duration of the virtual tester time domain is equal to the cycle duration of one of the multiple device time domains, translating the test data for each device time domain other than that one time domain to the virtual tester time domain and otherwise translating the test data for each device time domain to the virtual tester time domain. The translated test data is then applied to a device logic simulator that simulates integrated circuit device.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: April 12, 2005
    Assignee: Credence Systems Corporation
    Inventor: Ziyang Lu
  • Patent number: 6876934
    Abstract: A method for evaluating the upper bound fault coverage of an integrated circuit (IC) or a portion thereof from register transfer level (RTL) description is provided. The method requires the analysis of a circuit described in RTL consisting of primary input and output pins as well as devices connected to each other and/or to the primary pins to determine the controllability and observability of each pin of the circuit to ‘stuck at zero’ and ‘stuck at one’ conditions. The upper bound fault coverage is then determined based on the ratio between the number of pins that are both controllable and observable and twice the number of pins in the circuit. The method does not require a dynamic simulation for its fault coverage assessment and hence is advantageous over other methods consuming significant time and resources.
    Type: Grant
    Filed: August 14, 2002
    Date of Patent: April 5, 2005
    Assignee: Atrenta Inc.
    Inventor: Ralph Marlett
  • Patent number: 6873928
    Abstract: System and method for programmatically determining routing with signal modifications in a measurement system to perform a measurement task. Information is received specifying a route from a source terminal to a destination terminal in the measurement system, including signal modification requirements and a graph of possible routes in the measurement system. A current signal modification of the route is determined and used with the signal modification requirements to determine desired changes in the signal modification of the route. The legs of the route are walked in the graph, and one or more legs are replaced with respective alternative legs, each of which includes at least a portion of the desired changes in the signal modification, thereby generating a modified route which satisfies the signal modification requirements for the route, where the modified route is usable to route signals in performing the measurement task. The modified route is then stored.
    Type: Grant
    Filed: August 30, 2002
    Date of Patent: March 29, 2005
    Assignee: National Instruments Corporation
    Inventors: Robert W. Thurman, Jeff A. Carbonell
  • Patent number: 6868513
    Abstract: A method, system and software for automatically generating a test environment for testing a plurality of devices (DUTs) under test in a test system. The multiple devices are tested by mapping the plurality of DUTs into pins of the tester system to create pin data; inputting into a test program generator pattern data, generic test program rules and the pin data; generating a multi-DUT test program and multi-DUT pattern data; and controlling the test system through the test program. The resulting fail data is then logged to each DUT.
    Type: Grant
    Filed: October 26, 2000
    Date of Patent: March 15, 2005
    Assignee: International Business Machines Corporation
    Inventors: Sally S. Botala, Dale B. Grosch, Donald L. LaCroix, Douglas E. Sprague, Randolph P. Steel, Anthony K. Stevens
  • Patent number: 6865504
    Abstract: A reconfigurable cable/pod unit replaces the cable/pod unit coupling an emulation unit and a target processor. The reconfigurable cable/pod unit includes the discrete logic elements, a programmable unit and interface logic. The programmable unit and the interface unit permit the pod unit to assign conductors to the coupled cable. The interface unit includes storage and other logic elements that compensate for the differences in clock speeds and in rates of data exchange between the emulation unit and the target processor. No changes are necessary in the emulation unit to use the reconfigurable cable/pod unit. The reconfigurable cable pod unit permits, by changing the programming in the programmable unit, to operate in selectable modes, to provide a selectable interface to the target processor, to implement changes and upgrades in the testing procedures, and to test different types of target processors.
    Type: Grant
    Filed: August 5, 2002
    Date of Patent: March 8, 2005
    Assignee: Texas Instruments Incorporated
    Inventors: Lee A. Larson, Gary L. Swoboda, Roland R. Hoar, Douglas E. Deao
  • Patent number: 6862555
    Abstract: The invention provides an enhanced system and method for dynamically generating an accurate preventative maintenance (“PM”) schedule for use in an automated facility. The system has a at least one piece of automated equipment, wherein the at least one piece of automated equipment has a plurality of associated parts; a tool performance tracking system (“TP2”) in operative communication with the at least one piece of automated equipment to monitor and to analyze data retrieved from the at least one piece of automated equipment; a PM task database for storing a plurality of PM defined tasks; and a PM system, the PM system in operative communication with the TP2 and in further operative communication with the PM task database, wherein the PM system generates a PM schedule for performing PM on the plurality of associated parts.
    Type: Grant
    Filed: November 27, 2002
    Date of Patent: March 1, 2005
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd
    Inventors: Lin Chien Yu, Lui-Li Wen
  • Patent number: 6859760
    Abstract: A method and apparatus are described for remote semiconductor microscopy whereby video signals are broadcast from one or more microscopes to remote viewers. A live video signal is broadcast from the microscope over a network to remote personal computers located in the offices of process engineers. The office-based process engineers are provided real-time, or substantially real-time, views of a wafer, including peripheral views of the wafer outside cell array boundaries. The process engineer, in his office, can direct a technician, operating the microscope in the clean room complex, to display a desired cell region-of-interest with the microscope. As a result, the process engineers can more efficiently collaborate to solve process problems or even develop new process techniques.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: February 22, 2005
    Assignee: Micron Technology, Inc.
    Inventor: Michael J. Dorough
  • Patent number: 6847916
    Abstract: A system and method for monitoring, diagnosing and/or testing a control network using portable, wireless equipment includes computerized display device connected to a wireless intermediary device for allowing a wireless connection to be made to a control network. The computerized diagnostic device may be embodied as a personal digital assistant (PDA) having a graphical screen display, on which may be displayed the network nodes and connections of the control network presented against a backdrop of a transit vehicle or other facility shown in three-dimensional, rotatable images. The wireless equipment may allow the operator to force individual system components to output states, and provide for real time monitoring. The portable, wireless equipment is programmed with information pertaining to the connections and locations of the components in the control network, thereby simplifying diagnosis or testing by the operator.
    Type: Grant
    Filed: June 12, 2000
    Date of Patent: January 25, 2005
    Assignee: I/O Controls Corporation
    Inventor: Jeffrey Ying
  • Patent number: 6845344
    Abstract: A method for measuring mass storage system performance in which the mass storage system has a plurality of disk drive storage elements controlled by a disk drive controller, the controller typically having a cache memory, and the controller receiving commands and data from and returning at least data to a plurality of host computers, provides the flexibility of issuing commands to the controller in a variety of different configurations from a plurality of hosts in a time synchronized and organized fashion. Some significant data reduction techniques control and organize the data for later analysis according to the invention. Time delays and different configurations of both host and storage elements can be effected easily using a novel graphical user interface.
    Type: Grant
    Filed: August 18, 2000
    Date of Patent: January 18, 2005
    Assignee: EMC Corporation
    Inventors: Maureen A. Lally, Kenneth R. Goguen, Peter C. Lauterbach
  • Patent number: 6845345
    Abstract: A system for analyzing diagnostic information associated with a spin track is provided. The system includes one or more analysis systems that collect diagnostic information from one or more spin tracks. The system further includes one or more maintenance systems that schedule routine and/or special maintenance based on analysis of the diagnostic information. An alternative aspect of the system further includes one or more control information systems that generate of feedback control information employed in adapting the processes performed by the spin track.
    Type: Grant
    Filed: February 6, 2001
    Date of Patent: January 18, 2005
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Bhanwar Singh, Michael K. Templeton, Ramkumar Subramanian
  • Patent number: 6844506
    Abstract: A measuring apparatus, for instance an analytical balance, can set parameter values for performing specific measuring tasks and/or for effecting communication with an operating person. Sets of such parameter values are stored as profiles. The measuring apparatus is equipped with a recognition device, for recognizing an operating person and activating a stored profile assigned to that person.
    Type: Grant
    Filed: February 11, 2003
    Date of Patent: January 18, 2005
    Assignee: Mettler-Toledo GmbH
    Inventors: Reto Nüesch, Matthias Gietenbruch
  • Patent number: 6838982
    Abstract: A vehicle display system comprises a plurality of display units and a controller unit. Each display unit has a receiver for receiving measured data indicating a state of the vehicle, and a driver controller for controlling an indicator driver according to the measured data. The controller unit has a transmitter for transmitting the measured data to the plurality of display units and a transmitter controller for controlling the transmission. Each display unit further comprises a generator for generating response data indicating a state of the indicator driver and a transmitter for transmitting the response data to the controller unit. The controller unit further comprises a receiver for receiving each response data and a comparator for comparing each response data with the measured data to judge whether each indicator driver is controllable or not. Further, the transmitter controller controls according to a judged result.
    Type: Grant
    Filed: May 13, 2003
    Date of Patent: January 4, 2005
    Assignee: Yazaki Corporation
    Inventors: Kazuaki Kondo, Toshitaka Takeguchi, Shozo Ashizawa
  • Patent number: 6839649
    Abstract: A method and system for programmically communicating with a hardware device under test enables a user to develop flexible and customizable test and simulation programs for hardware devices connected to an industry standard bus. Input test commands are interpreted via a project specific support code component written in a scripting language such as Tcl. An extended scripting language tool provides communications capabilities to the industry standard bus and therefore enables test commands to be transmitted over the industry standard bus subsequent to the communications capabilities being provided to the industry standard bus via the extended scripting language tool. The hardware device is then driven based on the project specific test commands interpreted through the extended scripting language tool and transmitted over the industry standard bus.
    Type: Grant
    Filed: July 19, 2002
    Date of Patent: January 4, 2005
    Assignee: Honeywell International Inc.
    Inventor: Thomas R. Kreider
  • Patent number: 6839650
    Abstract: An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a test class, a measurement class, a datapoint class, a parameter class, a DUT class, a test system class, a specification class, a run procedure class, a result class, a plug-in class, an exec class, a model class, a device class, a test system device class, a user menu item class, an application class, and a state class. These classes are implemented in a hierarchical structure in which a datapoint is a subset of a measurement, a measurement is a configuration for a test, a test is a group of measurements that share the same test algorithm, and a procedure is an ordered list of tests to be run, and includes a list of measurements and datapoints.
    Type: Grant
    Filed: November 19, 2001
    Date of Patent: January 4, 2005
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher K Sutton, William R Pritchard, Kirsten C Carlson, James Martin
  • Patent number: 6826512
    Abstract: In one embodiment, when a problem with a consumer electronic device owned by a user is identified, a diagnostic procedure is provided to control the diagnosis of the potentially faulty consumer electronic device by a testing consumer electronic device. The testing consumer electronic device is a local device owned by the user that is operable to diagnose problems associated with the potentially faulty consumer electronic device. In one embodiment, the testing consumer electronic device and the potentially faulty consumer electronic device are part of a home network enabling their communication during the diagnosis. In another embodiment, the testing consumer electronic device and the potentially faulty consumer electronic device can communicate only during the diagnosis using a special purpose connectivity means. In yet another embodiment, the testing consumer device and the potentially faulty consumer electronic device can communicate using their user interfaces.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: November 30, 2004
    Assignees: Sony Corporation, Sony Electronics Inc.
    Inventors: Joseph Dara-Abrams, Klaus Hofrichter, Ravi Gauba, David G. Gaxiola, Jun Ouyang
  • Patent number: 6826505
    Abstract: A system and method of testing a bank of modems. A test bed includes a RAS concentrator, wherein the RAS concentrator includes means for spoofing operation of a plurality of analog modems. The RAS concentrator is connected to a communication server having one or more concentrators or a bank of modems. Software is executed in the test bed to establish a plurality of simultaneously connections between the RAS concentrator and the bank of modems.
    Type: Grant
    Filed: July 28, 2000
    Date of Patent: November 30, 2004
    Assignee: Digi International, Inc.
    Inventor: Andrew Warner
  • Patent number: 6820027
    Abstract: A method of testing an electrical device to determine a range of combinations of values of N variable operating parameters for which the device functions properly is described. In one embodiment, The method comprises defining a plot region comprising a plurality of operating points each corresponding to a particular combination of values of the N variable operating parameters, selecting an operating point within the plot region, testing the device using the combination of values of the N variable operating parameters corresponding to the selected operating point, and if the device functions in a first manner at the selected operating point, adding all operating points of the plot region having a first relationship with respect to the selected operating point to a list of operating points to be tested.
    Type: Grant
    Filed: November 1, 2002
    Date of Patent: November 16, 2004
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: Christopher Todd Weller
  • Patent number: 6820034
    Abstract: A method and apparatus for statistical compilation is presented. The statistical compilation circuit includes a multi-bank memory that stores a plurality of statistics, where a statistic component portion for each statistic is stored in each of the plurality of banks in the multi-bank memory. An arbitration block is operably coupled to receive at least one statistical update stream. Each statistical update stream includes a plurality of statistical updates, where each statistical update includes a statistic identifier and an update operand. The arbitration block schedules received statistical updates to produce a scheduled update stream. A control block operably coupled to the arbitration block and the multi-bank memory executes the updates included in the scheduled update stream. The control block retrieves the current value of one of the statistic component portions from one of the memory banks and combines the current value with the update operand of a corresponding statistical update.
    Type: Grant
    Filed: July 22, 2002
    Date of Patent: November 16, 2004
    Assignee: Alcatel Canada Inc.
    Inventors: Gordon G. G. Hanes, Martin Darwin, Mainz Tong
  • Patent number: 6816814
    Abstract: The present invention includes a method and apparatus for decomposing and verifying configurable hardware. In one embodiment, the method includes automatically decomposing a hardware system into a set of one or more units, creating a test-bench for each of the set of units, and verifying each of the set of units before verifying the hardware system design.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: November 9, 2004
    Assignee: Sonics, Inc.
    Inventors: Jeffrey Allen Ebert, Ravi Venugopalan, Scott Carlton Evans
  • Patent number: 6809522
    Abstract: The present invention is a system for automatically testing and providing notification of an efficacy failure of an electrostatic discharge (ESD) device or devices. The system includes testing circuitry for testing the efficacy of one or more ESD devices, a memory for storing ESD device testing protocol, ESD device test results, employee identification information, e-mail messaging software, and interface connection software, an internet interface, and a processor for controlling the testing circuitry in accordance with the executed process steps of the ESD device testing protocol and for controlling the storing of the ESD device test results in memory, wherein the processor automatically provides email notification of efficacy failure of an ESD device by collecting and formatting an ESD device test result into an e-mail message using the stored e-mail messaging software and forwarding the e-mail through the internet interface using the internet connection software.
    Type: Grant
    Filed: June 20, 2002
    Date of Patent: October 26, 2004
    Assignee: Semtronics
    Inventor: Hoa Nguyen
  • Patent number: 6807506
    Abstract: A test executive system for controlling a test upon a device under test that is distinct and separate from said test executive system. The test executive system provides interactive dialog boxes in the following manner. A signal that an event in a testing procedure occurs is received. A file storing testing information is retrieved responsive to the signal. The testing information includes directions for the user to perform an action required to continue the test. The test executive system includes a web browser and the test information may comprise a web page. The testing information is displayed along with at least one input option. An input is then received from the user. The input is then processed responsive to receiving said input.
    Type: Grant
    Filed: March 20, 2002
    Date of Patent: October 19, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Christopher K Sutton, Richard Mills
  • Patent number: 6804709
    Abstract: A system and method for testing the implementation of a remote access protocol in network servers and/or clients goes through test cases with different server-client configuration combinations in an automated and distributed process. The testing system includes at least one test controller, a client pool, a server pool, and a database that maintains the test cases to be tested. Servers and clients participating in the distributed testing are registered with the test controller, which matches a server with a client based on their configuration capabilities and/or other factors. Test cases selected from the database are then assigned to the server-client pair for execution. For each assigned test case, the client assumes the client configuration of that case and calls the server to establish a connection under the remote access protocol, and the server assumes the server configuration test results for the executed test cases are stored for monitoring and generating reports.
    Type: Grant
    Filed: February 20, 2001
    Date of Patent: October 12, 2004
    Assignee: Microsoft Corporation
    Inventors: Samir B. Manjure, Anthony M. Leibovitz, Rajesh R. Peddibhotla
  • Patent number: 6795790
    Abstract: A method and apparatus for creating sets of parameters values for scenarios for testing a computing arrangement. In a first phase of parameter optimization, each parameter value is adjusted one at a time, and a measured performance characteristic controls when to stop considering alternative values for the parameter. When the performance characteristic satisfies selected criteria relative to the target data set, another parameter value is selected for adjustment. Each parameter is assigned to a group as a function of the level of change of the performance characteristic from one value of the parameter to another. In a second phase of parameter optimization, each parameter value is adjusted in order of parameters in groups that exhibit greater levels of change of the performance characteristic to parameters in groups that exhibit lesser levels of change of the performance characteristic.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: September 21, 2004
    Assignee: Unisys Corporation
    Inventors: Michelle J. Lang, William Judge Yohn
  • Patent number: 6785638
    Abstract: The present invention relates to a method and system for efficiently determining grating profiles using dynamic learning in a library generation process. The present invention also relates to a method and system for searching and matching trial grating profiles to determine shape, profile, and spectrum data information associated with an actual grating profile.
    Type: Grant
    Filed: August 6, 2001
    Date of Patent: August 31, 2004
    Assignee: Timbre Technologies, Inc.
    Inventors: Xinhui Niu, Nickhil Jakatdar
  • Patent number: 6772083
    Abstract: Methods and apparatus, including computer program products, providing a test configuration having an associated test script and one or more associated data containers. Each data container defines a set of parameters and one or more sets of variants, each set of variants specifying a value for each of the parameters in the set of parameters. Each data container is reusable with multiple test configurations. The test script has a set of test parameters and the test configuration further has a set of test parameter variants, each of the test parameter variants being a set of values for respective test parameters in the set of test parameters. The test parameter variants include one or more references for obtaining data values from one or more of the associated data containers.
    Type: Grant
    Filed: September 3, 2002
    Date of Patent: August 3, 2004
    Assignee: SAP Aktiengesellschaft
    Inventors: Horst Müller, Jan Olsen, Thomas Lendroth, Marc Webster, Nils Kirstaedter, Jens Fichtner, Michael Schaffrath
  • Publication number: 20040138847
    Abstract: Methods and systems of testing an operating system are described. The operating system is invoked to create a process, the process having a first thread. A test function is repetitively executed in a first thread of the process. These steps are repeated to create processes and to execute the test function in parallel and repetitively in the first thread of the created processes until a given condition is satisfied. For example, the given condition can be a condition in which the operating system resources are exhausted.
    Type: Application
    Filed: July 23, 2003
    Publication date: July 15, 2004
    Inventors: Pierre Lebee, Ivan Boule, Sebastien Laborie, Aurelien Jacquiot
  • Patent number: 6745146
    Abstract: An automated test system for testing a device under test includes a storage device, an input device, a processor, and a test apparatus. The storage device is operable to store a plurality of sets of test parameters, and is further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters. The input device is operable to obtain input from an operator defining a first product model identifier from the plurality of product model identifiers. The processor is coupled to the input device and the storage device and is operable to receive the input from the input device and retrieve the set of test parameters associated with the first product model identifier from the storage device based on the input. The processor is further operable to generate a control signal that includes the retrieved set of test parameters.
    Type: Grant
    Filed: October 30, 1998
    Date of Patent: June 1, 2004
    Assignee: Avaya Technology Corp.
    Inventors: Edwin Zane Brown, Roger Alan Merriman, Steven Todd Brandenburg
  • Patent number: 6741951
    Abstract: A method for analyzing a system for safety to personnel or other systems is disclosed comprising: identifying at least one operating parameter of a first subcomponent of said product; identifying an inherent hazard of said first subcomponents based on an analysis of the at least one operating parameter; identifying features of the structure or operation of the subcomponent corresponding to the inherent hazard; identifying modifications or controls for the identified features which would mitigate the inherent hazard; prioritizing the identified features with respect to the effect that each of said features has on safety of the product; and determining whether an unsafe condition could result from the inherent hazard.
    Type: Grant
    Filed: August 2, 2002
    Date of Patent: May 25, 2004
    Assignee: General Electric Company
    Inventors: Kenneth Neil Whaling, Eric Stephen Kaufman, William Michael Starr
  • Publication number: 20040093180
    Abstract: System and method for performing a multiple tests on each of one or more units, where each of the tests requires a respective resource of a plurality of resources. A first test is performed on a unit using a first resource. During performance of the first test, a search is made for a second test, requiring a second resource, where the second resource is not currently being used. If the second test is found, the second test is performed on the unit, or a second unit, using the second resource, substantially concurrently with at least a portion of the first test being performed on the unit. Performing a test includes locking the respective resource to exclude use by other tests, including acquiring the resource, and unlocking the resource upon completion of the test, including releasing the resource for use in performing the respective test on another of the units.
    Type: Application
    Filed: November 7, 2002
    Publication date: May 13, 2004
    Inventors: James A. Grey, Daniel Elizalde
  • Patent number: 6735543
    Abstract: An inter-chip line transmission circuit in a transmitting chip and complementary receiving circuit in a receiving chip provide the capability to characterize the inter-chip interface by separately generating identical pseudo-random test data at both chips, comparing the data, and recording errors. Preferably, one or both chips can be tuned on an individual line basis to reduce errors by altering threshold detection voltage, signal delay, and/or driver power. The receiver circuit preferably contains counters for counting test cycles and errors, which can be masked for any particular line or type of error. A tunable and characterizable interface in accordance with the preferred embodiment thus supports the accurate determination of low error rates on an individual line basis for various tuning parameter settings.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: May 11, 2004
    Assignee: International Business Machines Corporation
    Inventors: Steven Michael Douskey, Daniel Mark Dreps, Frank David Ferraiolo, Curtis Walter Preuss, Robert James Reese, Paul William Rudrud, James Donald Ryan, Robert Russell Williams
  • Patent number: 6728655
    Abstract: An electronic instrument includes instrument hardware, core software, and the ability to support custom data processing libraries, separate from the core software. The instrument hardware acquires unprocessed measured data. The core software includes standard measurement objects and standard algorithms. The standard measurement objects produce analysis results of the unprocessed measured data. The standard algorithms are used by the standard measurement objects to aid in production of analysis results of the unprocessed measured data. Custom libraries as supported by the core software include custom measurement objects and custom algorithms. The custom measurement objects produce analysis results of the unprocessed measured data. The custom algorithms are used by the custom measurement objects to aid in production of analysis results of the unprocessed measured data.
    Type: Grant
    Filed: August 31, 2001
    Date of Patent: April 27, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Donald Wilson Stark
  • Patent number: 6728654
    Abstract: A random number indexing method and apparatus includes an index array 302 that uniquely identifies each pseudo-random number in a sequence of numbers generated by a pseudo-random number generator 202. A computer program 102 provides a seed value to the pseudo-random number generator and populates the index array. The computer program uses the identifying indicia in the index array to call for and receive pseudo-random numbers.
    Type: Grant
    Filed: September 28, 2001
    Date of Patent: April 27, 2004
    Assignee: Intrinsity, Inc.
    Inventor: Fritz A. Boehm
  • Patent number: 6721676
    Abstract: A process of converting simulation data to test data used for testing an integrated circuit includes the steps of detecting a transition of state of the simulation data, extracting an event from the simulation data in response to the transition, and creating the test data in response to the event.
    Type: Grant
    Filed: April 22, 1999
    Date of Patent: April 13, 2004
    Assignee: Fujitsu Limited
    Inventor: Takefumi Ueda
  • Patent number: 6714992
    Abstract: The present disclosed system is directed toward a communication and management system that dynamically targets network devices for content deployment, such as application programs, device drivers, configuration files, and registry subhives. Moreover, the present system targets users of network devices for promotions, such as advertisements offered by Internet e-commerce sites. Promotions are generally icons or graphic images with links to host web servers overlaying a video display, but also includes audio and video clips or data streams. Network devices and their users are targeted through user profiles. User profiles are created when network devices register with the system server and are continually updated with information provided by user activity and event logs that are periodically uploaded from each device.
    Type: Grant
    Filed: March 6, 2000
    Date of Patent: March 30, 2004
    Assignee: Navic Systems, Inc.
    Inventors: Chaitanya Kanojia, Lee Kamenstky, Peter Hall, Ian Copeman
  • Patent number: 6711506
    Abstract: A plurality of system checks on a turbine component inspection system are monitored, and an end user interface element to cause an inspection of a turbine component to commence is enabled only upon determining based on the monitored system checks that the inspection system is in a predetermined state of readiness, thereby ensuring each turbine component inspected is stimulated with thermal stimulus having the same characteristics. Further, a binary passed or failed indicator is displayed to unequivocally inform the operator whether a turbine component being inspected passed or failed the inspection. In a preferred embodiment, thermal images of a turbine component's response to applied thermal stimulus, as well as status of automatically launched quantitatively analyses on the turbine component's response to the applied thermal stimulus are also displayed.
    Type: Grant
    Filed: November 21, 2001
    Date of Patent: March 23, 2004
    Assignee: Computerized Thermal Imaging, Inc.
    Inventors: Maurice J. Bales, Brian A. Dalio, David G. Johnsen
  • Patent number: 6708139
    Abstract: A method and apparatus are provided for determining quality metrics associated with a test pattern used to test an integrated circuit (IC). The delays associated with (1) a longest sensitizable path through the IC that includes the delay fault and (2) an actual path exercised by the test pattern through the IC that includes the delay fault are determined. A difference between the delays is then obtained. The difference is then combined with a difference between a speed at which the test is performed and a design specification operating speed of the IC for the actual path. The sum represents the first quality metric associated with the test pattern for a given fault site. The ratio of the delays of the actual path to the longest sensitizable path represents the second quality metric associated with the test pattern for a given fault site.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: March 16, 2004
    Assignee: Agilent Technologies, Inc.
    Inventors: Jeff Rearick, Manish Sharma
  • Patent number: 6704678
    Abstract: Each type of peripheral device has a unique identification, and if this unique identification is not present in software that is being transferred to the peripheral device for installation on the peripheral device, the peripheral device rejects the software being transferred to it.
    Type: Grant
    Filed: May 31, 2002
    Date of Patent: March 9, 2004
    Assignee: Avaya Technology Corp.
    Inventors: Travis D. Minke, Bryan A. White
  • Patent number: 6704676
    Abstract: An operating property of the integrated circuit, such as its speed class, value is determined during testing. In order to identify the integrated circuit with a value for its operating property, there are provided at least two registers whose outputs are logically combined bit by bit via OR gates. The registers are preferably programmable with fuses. In a first test run, the first register is programmed with the ascertained value of the operating property, and the second register is correspondingly programmed in a second test run. The logic combination enables the less significant value of the operating property to predominate. The storage of this value on the integrated circuit itself simplifies the later identification on the housing of the integrated circuit.
    Type: Grant
    Filed: January 22, 2002
    Date of Patent: March 9, 2004
    Assignee: Infineon Technologies AG
    Inventor: Sven Boldt
  • Publication number: 20040044494
    Abstract: Methods and apparatus, including computer program products, providing a test configuration having an associated test script and one or more associated data containers. Each data container defines a set of parameters and one or more sets of variants, each set of variants specifying a value for each of the parameters in the set of parameters. Each data container is reusable with multiple test configurations. The test script has a set of test parameters and the test configuration further has a set of test parameter variants, each of the test parameter variants being a set of values for respective test parameters in the set of test parameters. The test parameter variants include one or more references for obtaining data values from one or more of the associated data containers.
    Type: Application
    Filed: September 3, 2002
    Publication date: March 4, 2004
    Inventors: Horst Muller, Jan Olsen, Thomas Lendroth, Marc Webster, Nils Kirstaedter, Jens Fichtner, Michael Schaffrath
  • Patent number: 6697750
    Abstract: A method and apparatus for performing parallel asynchronous testing of a plurality of optical modules utilizes state machines that may be implemented in a common controller. Desired optical tests are selected by an operator. The invention determines if a testing process or instrument required for the selected optical tests is available. A COM port may also be locked for each of the selected optical tests from among a plurality of COM ports to prevent interference between different tests. By reserving resources such as COM ports and testing instruments in this fashion the invention may asynchronously initiate execution of the selected optical tests. If a resource such as a COM port, testing process or instrument is not currently available, the test is place in COM port and testing queues to await availability of that resource. Once a test is completed, the resource is unlocked so that one of the state machines may asynchronously initiate another test.
    Type: Grant
    Filed: January 11, 2001
    Date of Patent: February 24, 2004
    Assignee: Ciena Corporation
    Inventors: Bryan Coin, Michael J. Ransford, David A. Schwarten, Chao Jiang, Iqbal M. Dar, Andrei Csipkes
  • Patent number: 6697754
    Abstract: An apparatus and method for providing an end-user operator with the ability to assign temporary control of a set of one or more operator-specified instrument control operations to one, single-action switch on a signal measurement system front panel. The assigned instrument control operations are preferably represented by text strings in a macro text file that is developed and modified with the use of a text editor integrated into or operatively coupled with the signal measurement system.
    Type: Grant
    Filed: August 9, 2000
    Date of Patent: February 24, 2004
    Assignee: Agilent Technologies, Inc.
    Inventor: Jay A. Alexander
  • Publication number: 20040024558
    Abstract: A reconfigurable cable/pod unit is adapted to replace the cable/pod unit coupling an emulation unit and a target processor. The original cable/pod unit includes discrete logic elements in the pod unit that provides an interface for exchanging JTAG and related timing and control signals between the emulation unit and the target processor. The reconfigurable cable/pod unit includes the discrete logic elements, a programmable unit and interface logic. The programmable unit and the interface unit permit the pod unit to assign the conductors of the coupled cable. The interface unit includes storage and other logic elements that compensate for differences in clock speeds and in rates of data exchange between the emulation unit and the target processor. No changes are necessary in the emulation unit to use the reconfigurable cable/pod unit.
    Type: Application
    Filed: August 5, 2002
    Publication date: February 5, 2004
    Inventors: Lee A. Larson, Gary L. Swoboda, Roland R. Hoar, Douglas E. Deao
  • Patent number: 6687639
    Abstract: An electrical connection test is conducted within a practical response time every time a harness-forming wire is connected on a compact assembling board. Multiplexing communication controllers adopting a perfect time-division multiplexing communication method according to which tokens are given to units by a time-division technique based on timing bit sets issued at specified intervals from any of the units and node addresses are provided. Every time a harness-forming wire is connected, an electrical connection of a network of a wiring harness including this harness-forming wire is tested. In this electrical connection test, whether the network is satisfactory is determined up to a last stage every time the harness-forming wire is connected in the production process of the wiring harness being tested.
    Type: Grant
    Filed: May 30, 2002
    Date of Patent: February 3, 2004
    Assignee: Sumitomo Wiring Systems, Ltd.
    Inventors: Yoshikazu Taniguchi, Setsurou Mori
  • Patent number: 6687649
    Abstract: A system, method and computer program for facilitating the operation of a control system utilizing one or more input devices is disclosed. The control system provides the ability to monitor and modify operating parameters of the input devices. A function integrated within a software code is to be executed by the control system. The function is responsive to the input device. The input device includes at least one condition comprising a state wherein all of the conditions must be met prior to the execution of the function. A display of an unmet condition is exhibited to operator personnel of the control system during the execution of any function having an unmet condition prohibiting the execution of the function. The operator personnel is capable of overriding the unmet condition by selecting the state of the condition that allows the condition to be met, thus allowing the function to be executed. A maintenance log contains a record of the conditions that were bypassed or overridden.
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: February 3, 2004
    Assignee: Schneider Automation Inc.
    Inventors: John Ditter, Scott Walczak
  • Publication number: 20040015317
    Abstract: Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted to and from a target device through a data connection. In one embodiment, the method generally includes creating one or more test threads. The method further includes, for each test thread, generating a data load on the data connection by repetitively writing test data patterns to the target device and reading data patterns from the target device using a synchronous I/O dispatch method, measuring data throughput to and from the target device while generating the data load, comparing the data patterns read from the target device to the test data patterns to detect data corruptions. The method may further include generating debug information if a data corruption is detected by one of the test threads.
    Type: Application
    Filed: July 22, 2002
    Publication date: January 22, 2004
    Applicant: Finisar Corporation
    Inventors: Steve Klotz, Michael D. Connell, Mark J. Lanteigne