Including Program Set Up Patents (Class 702/123)
  • Patent number: 7640132
    Abstract: A recording medium recording thereon a program for a test apparatus including test modules that test devices under test is provided. The program includes: a common function provision program which is executed on a controller for controlling the test apparatus and provides a function common to each type of the test modules; and a plug-in processing program which is executed on the controller and plugs-in an individual function provision program for providing a function appropriate for the type of each of the test modules.
    Type: Grant
    Filed: April 23, 2007
    Date of Patent: December 29, 2009
    Assignee: Advantest Corporation
    Inventors: Tetsu Katagiri, Takehisa Suzuki
  • Publication number: 20090299681
    Abstract: Methods and systems for generating information to be used for selecting values for parameter(s) of a detection algorithm are provided. One method includes without user intervention performing a scan of an area of a wafer using an inspection system and default values for parameter(s) of a detection algorithm to detect defects on the wafer. The method also includes selecting a portion of the defects from results of the scan based on a predetermined maximum number of total defects to be used for selecting values for the parameter(s) of the detection algorithm. The method further includes storing information, which includes values for the parameter(s) of the detection algorithm determined for the defects in the portion. The information can be used to select the values for the parameter(s) of the detection algorithm to be used for the inspection recipe without performing an additional scan of the wafer subsequent to the scan.
    Type: Application
    Filed: May 29, 2008
    Publication date: December 3, 2009
    Inventors: Hong Chen, Michael J. Van Riet, Chien-Huei (Adam) Chen, Jason Z. Lin, Chris Maher, Michal Kowalski, Barry Becker, Stephanie Chen, Subramanian Balakrishnan, Suryanarayana Tummala
  • Publication number: 20090281759
    Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to a first trigger element of the test and measurement apparatus and loading a second trigger configuration to a second trigger element of the test and measurement apparatus so that these trigger elements operate substantially simultaneously. It is then determined whether the input signal generates a trigger in accordance with the one or more trigger configurations.
    Type: Application
    Filed: July 29, 2008
    Publication date: November 12, 2009
    Applicant: LeCroy Corporation
    Inventors: Anthony Cake, Peter Pupalaikis, David Graef, William Driver, Michael Hertz, Laxmikant Joshi
  • Publication number: 20090281758
    Abstract: A method and apparatus for determining a trigger in a test and measurement apparatus are provided. The method comprises the steps of loading a first trigger configuration to the test and measurement apparatus and determining for a first predetermined time whether an input signal generates a trigger. Thereafter, a second trigger configuration is loaded to the test and measurement apparatus upon the conclusion of the first predetermined time and for a second predetermined time it is determined whether the input signal generates a trigger.
    Type: Application
    Filed: May 8, 2008
    Publication date: November 12, 2009
    Applicant: LeCroy Corporation
    Inventors: Anthony Cake, Peter J. Pupalaikis, David Graef, William Driver, Michael Hertz
  • Patent number: 7596800
    Abstract: A system for validating two-way continuity of a customer premises equipment (CPE) unit in a hybrid fiber coax (HFC) cable network. A two-way client uses a two-way query interface to acquire information indicative of the two-way operational status of a subscriber CPE units from a two-way validation server and to display the information graphically.
    Type: Grant
    Filed: August 31, 2005
    Date of Patent: September 29, 2009
    Assignee: Time Warner Cable, Inc.
    Inventors: Todd P. Bowen, William H. Berger
  • Patent number: 7584076
    Abstract: The present invention relates to a method for communication of multiple sensor nodes in a sensor network having a receiving node, particularly a sensor node of the sensor network, a receiving node prompting other sensor nodes to transmit sensor data to the receiving node by transmitting at least one synchronization telegram, for which the receiving node switches to receive for a time period, in particular for a CAP phase, in order to receive telegrams from at least one other sensor node, the time period being subdivided into multiple time intervals, the probability that a sensor node transmits a telegram in a specific time interval being a function of at least one predefinable parameter.
    Type: Grant
    Filed: October 26, 2006
    Date of Patent: September 1, 2009
    Assignee: ista International GmbH
    Inventors: Manfred Gronauer, Bert Bley
  • Publication number: 20090217251
    Abstract: Computer-readable code stored on computer-readable media includes code to allocate at least one data structure in computer memory. The at least one data structure has a plurality of message parameter fields, and each of the message parameter fields has a deterministic position within the at least one data structure. The computer-readable code also includes code to navigate to different ones of the message parameter fields by interpreting non-compiled instructions. The instructions have a form that specifies a position of a particular message parameter field within the at least one data structure, and a number of bits in the particular message parameter field. The position of the particular message parameter field is specified in terms of a number of data offsets in the at least one data structure. The computer-readable code also includes code to configure a communications test-set following navigation to at least one of the message parameter fields.
    Type: Application
    Filed: February 27, 2008
    Publication date: August 27, 2009
    Inventor: David Connolly
  • Publication number: 20090210826
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Application
    Filed: April 21, 2009
    Publication date: August 20, 2009
    Inventors: Brian Sierer, Ganesh Ranganathan, John Pasquarette, David W. Fuller, III, Joseph E. Peck, Matthew Novacek, Hugo A. Andrade
  • Patent number: 7565272
    Abstract: Techniques are disclosed for integrating complexity analysis with procedure authoring (design and/or documentation). By way of example, a technique for authoring a procedure associated with a computing system operation based on a complexity analysis associated with the operation and the computing system implementing the operation comprises the following steps/operations. A procedure associated with a computing system operation is generated, wherein the generated procedure represents a new procedure or an edited existing procedure. A structured representation of the generated procedure is extracted from the generated procedure. The structured representation of the generated procedure is analyzed to produce complexity analysis results, wherein at least a portion of the complexity analysis results are fed back to a procedure author for use in selectively altering the generated procedure.
    Type: Grant
    Filed: December 13, 2005
    Date of Patent: July 21, 2009
    Assignee: International Business Machines Corporation
    Inventors: Aaron B. Brown, Joseph Y. Kim
  • Patent number: 7561983
    Abstract: A technique for improving ion implantation based on ion beam angle-related information is disclosed. In one particular exemplary embodiment, the technique may be realized as a method for improving ion implantation. The method may comprise obtaining angle-related information associated with an ion beam. The method may also comprise calculating, based on the angle-related information, an ion beam angle distribution over a wafer for one or more potential scanning modes. The method may further comprise selecting a desired scanning mode from the one or more potential scanning modes based on an evaluation of performance metric caused by the ion beam angle distribution.
    Type: Grant
    Filed: September 29, 2006
    Date of Patent: July 14, 2009
    Assignee: Varian Semiconductor Equipment Associates, Inc.
    Inventors: Atul Gupta, Jonathan Gerald England
  • Patent number: 7558694
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Grant
    Filed: November 1, 2004
    Date of Patent: July 7, 2009
    Assignee: National Instruments Corporation
    Inventors: David W. Fuller, III, Michael L. Santori, Brian Sierer, Ganesh Ranganathan, John Pasquarette
  • Patent number: 7555412
    Abstract: Techniques for collecting and displaying sensor data captured by a spatially representative sample of sensors requested in a search query are described. The sensors are represented in an index structure (e.g., a data tree). In response to a query, the index structure is leveraged to identify a subset of sensors that exhibits a similar spatial distribution to the original full set of sensors. Sensor data is then collected from the subset of sensors by probing the sensors or retrieving recently cached data located by the index and returned to satisfy the query. In this manner, the number of sensors to be probed is reduced, thereby reducing latency involved with polling a large number of sensors and making the search process more efficient.
    Type: Grant
    Filed: February 9, 2007
    Date of Patent: June 30, 2009
    Assignee: Microsoft Corporation
    Inventors: Suman K. Nath, Yanif Ahmad
  • Patent number: 7536269
    Abstract: A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or configuration information which are usable to configure the user's measurement system hardware (and/or software) to perform the desired task. Additionally, if the user does not have the hardware required to perform the task, the required hardware may be sent to the user, along with programs and/or configuration information. The hardware may be reconfigurable hardware, such as an FPGA or a processor/memory based device. In one embodiment, the required hardware may be pre-configured to perform the task before being sent to the user. In another embodiment, the system and method may provide a graphical program in response to receiving the user's task specification, where the graphical program may be usable by the measurement system to perform the task.
    Type: Grant
    Filed: November 1, 2004
    Date of Patent: May 19, 2009
    Assignee: National Instruments Corporation
    Inventors: Brian Sierer, Ganesh Ranganathan, John Pasquarette, David W Fuller, III, Joseph E. Peck, Matthew Novacek, Hugo A. Andrade
  • Publication number: 20090119055
    Abstract: The present invention provides a method of optimizing an automated test system during a problem determination phase of said test system in a distributed environment with a plurality of local and remote computers, said test system comprising at least a first test suite, said method comprising the steps of: receiving at least said first test suite by a centralized execution controller, said at least first test suite comprising at least a first and second test fragment; receiving at least one breakpoint description comprising a condition for pausing at least said first test suite by said centralized execution controller; sending at least said first test fragment and an execution command of at least said first test fragment from said centralized execution controller to said distributed environment; receiving a event definition and a hierarchy of event definitions describing said executed command by said execution controller; comparing said at least one breakpoint description with the received event definition by
    Type: Application
    Filed: October 30, 2008
    Publication date: May 7, 2009
    Applicant: International Business Machines Corporation
    Inventor: Grzegorz Glowaty
  • Patent number: 7529977
    Abstract: Automated extensible user interface testing supports testing of a user interface of a program. Test data is accessed, the test data including multiple test steps. Each test step describes at least a part of a test to be performed on the user interface. For each of the multiple test steps, one or more application program interface (API) methods to invoke to carry out the part of the test is determined. This determination is based at least in part on the test data and on an identification from the API of methods supported by the API. Each of the one or more API methods is then invoked to carry out the part of the test. Verification can be performed to ensure, for example, that specified files were created, or registry values were changed, or user interface elements appear and exist.
    Type: Grant
    Filed: May 31, 2006
    Date of Patent: May 5, 2009
    Assignee: Microsoft Corporation
    Inventors: Ganesh Sankarakumar Parvathy, Dipti A Patil, Jin Yu
  • Patent number: 7529643
    Abstract: Status estimation is determined for an entity having a plurality of components. An original disjunction of diagnostic expressions indicating at least one of a fault-free or at least one fault mode for at least one of the components is determined, which is then investigated against a set of diagnostic test results, and expressions that do not imply the test result are discarded. Further, for each statement in the test result, a joint diagnostic expression is generated representing a conjunction of the statement and the currently investigated diagnostic expression. Joint diagnostic expressions that imply one of the original diagnosis expressions are discarded. Otherwise, they are added to an updated disjunction of diagnostic expressions. All remaining diagnostic expressions in the temporary disjunction of diagnostic expressions are then added to the updated disjunction of diagnostic expressions, and a status report is produced.
    Type: Grant
    Filed: June 19, 2007
    Date of Patent: May 5, 2009
    Assignee: Scania CV AB
    Inventor: Mattias Nyberg
  • Publication number: 20090112505
    Abstract: A method for providing a user with test and measurement guidance includes collecting an inventory of available test instruments, providing data for a device under test, providing a test specification, and generating a set of tests to be performed on the device under test utilizing the inventory, data, and test specification.
    Type: Application
    Filed: October 25, 2007
    Publication date: April 30, 2009
    Inventors: Glenn R. Engel, Glen L. Purdy, JR., Jefferson B. Burch
  • Publication number: 20090099805
    Abstract: A semiconductor wafer inspection device is provided which identifies an operator when an operation is performed and checks if the requested operation is permitted. In the device that has already performed an operator authentication, the operator identification is further carried out when a particular operation is requested. If the operation requested is a permitted one, it is executed even if requested by an operator different from the one previously authenticated. The history of operations and the change history of in-device data are recorded and displayed. Performing the operator authentication only when necessary can prevent illicit access to the in-device information without degrading the operability.
    Type: Application
    Filed: September 23, 2008
    Publication date: April 16, 2009
    Inventor: Yuko TOYOSHIMA
  • Patent number: 7519497
    Abstract: A trace test and debug system for a target processor generates a program counter trace stream, a timing trace stream and a data trace stream. The target processor has three states, a program code execution state, an interrupt service routine code execution state, and a state where code execution is halted. The trace streams can be controlled so that the timing trace stream can be generated or excluded during the code execution halts. Similarly, when the timing trace stream is enabled for the interrupt service routine(s), the program counter and data trace streams can be selectively generated or excluded. The contents of the pipeline flattener can be held or flushed code execution halt depending on whether the pipeline is unprotected or protected. When the contents of the pipeline flattener are held during a code halt, the program counter trace stream and data trace stream is halted even if the timing trace stream remains active.
    Type: Grant
    Filed: December 5, 2003
    Date of Patent: April 14, 2009
    Assignee: Texas Instruments Incorporated
    Inventor: Gary L. Swoboda
  • Patent number: 7516028
    Abstract: A test and measurement instrument includes a memory configured to store a digitized signal, a display configured to display the digitized signal, a mark interface configured to generate a mark creation signal, a processor coupled to the memory, the display, and the mark interface. The processor is configured to identify a feature of the digitized signal and create a mark indicating the feature and the digitized signal in response to the mark creation signal.
    Type: Grant
    Filed: August 2, 2006
    Date of Patent: April 7, 2009
    Assignee: Tektronix, Inc.
    Inventors: Keith D. Rule, Lance H. Forsberg, Robert L. Beasley, Steven C. Herring, Kenneth P. Dobyns, Scott R. Ketterer
  • Patent number: 7516048
    Abstract: Calculating, detecting, observing, and validating operating characteristics, conditions, and metrics, especially quality of service metrics, of a system. The quality of service metrics are reported and utilized to manage the service. The various elements of the system for generating the quality of service metrics are integrated, with the same or substantially the same schema and metadata in the databases management systems of the externalized metric configuration data database, and the raw transaction data database. There is extensive code reuse, with the various engines, as the standard requirements methodology engine and thee standardized extensible calculation engine utilizing the same classes or objects, and as appropriate, the same function calls, interfaces, api's, and the like.
    Type: Grant
    Filed: June 30, 2006
    Date of Patent: April 7, 2009
    Assignee: International Business Machines Corporation
    Inventors: Bogdan Grigoriu, Linwood Earl Loving, Donald Eugene Schaefer, Wayne A. Scott
  • Publication number: 20090089005
    Abstract: Autonomous or machine generation of test specifications can be achieved by capturing the measured test data of a device and then using the captured test data to build a test specification, such as a limit line, for subsequent testing of similar devices. The generated test specification is typically adapted for use with respect to limited resources, such as through use of a piece-wise linear configuration. In an embodiment, the number of piece-wise linear portions of the generated test specification is minimized or otherwise optimized. In embodiments, the generated test specification is adjusted to accommodate expected measurement variation, such as thermal noise, device process variation, random jitter, etc., and, if desired, adjusted to allow for changes in test accuracy of subsequent tests. In one embodiment, one or more test measurement inaccuracies are eliminated in the construction of the limit line.
    Type: Application
    Filed: September 28, 2007
    Publication date: April 2, 2009
    Inventors: Geoff Hopcraft, Joseph M. Gorin
  • Publication number: 20090089004
    Abstract: A time-learning test system for running a test program on a device under test (DUT) is disclosed. A command is sent from a controller to an instrument. A preset wait period is observed in the test program. A response time of the instrument to the command is determined. The preset wait period is adjusted based on the response time.
    Type: Application
    Filed: September 27, 2007
    Publication date: April 2, 2009
    Inventors: Dietrich Werner Vook, Douglas M. Baney
  • Patent number: 7502708
    Abstract: A test apparatus that tests a device under test is provided. The test apparatus includes: a control processor that executes a test program to test the device under test; a test unit connected to the device under test that tests the device under test according to an instruction by the control processor; and a relay section connected to the control processor and the test unit that relays a control instruction transmitted from the control processor to the test unit. The relay section includes: a buffer section that buffers the control instruction to be written to the address assigned from the control processor to the test unit; a timing storage section that stores a timing at which the control instruction received from the control processor should be transmitted to the test unit; and a buffer control unit that transmits the control instruction buffered in the buffer section to the test unit in response to that the timing stored in the timing storage section comes.
    Type: Grant
    Filed: October 12, 2006
    Date of Patent: March 10, 2009
    Assignee: Advantest Corporation
    Inventor: Norio Kumaki
  • Patent number: 7502716
    Abstract: Problem diagnostics may be obtained from components that log messages using a unique component identifier which is provided within each message so as to enable routing of callbacks to the component that originated the message. Similarly, problem diagnostics may be obtained from components that generate alerts, where the alerts contain the unique identifier of the component that generated the alert. Each component supports a diagnostic provider interface comprising operations which may be dynamically invoked, for example to solicit information from the component such as its configuration data, its state information, to execute self-diagnostic tests, and so forth. In addition or instead, operations may be provided that can be invoked to cause the component to alter its configuration data (such as notifying the component to change its level of message logging) or its behavior.
    Type: Grant
    Filed: April 10, 2006
    Date of Patent: March 10, 2009
    Assignee: International Business Machines Corporation
    Inventors: Donald A. Bourne, Michael J. Casile, Hany A. Salem, Leigh A. Williamson
  • Patent number: 7499824
    Abstract: System and method for using a graphical user interface (GUI) to generate a measurement task specification (MTS) for performing a measurement task. The measurement task includes measurement and/or signal generation. A measurement task specifier presents a GUI which guides a user in specifying the measurement task. The GUI presents a plurality of GUI elements, e.g., panels, for specifying a plurality of parameters for the measurement task, including measurement type, devices, channels, timing, and/or triggering. The GUI receives user input indicating values for the parameters, and may provide default values for at least some of the parameters. The GUI stores the parameter values in a memory, analyzes the parameter values, and generates the MTS in response to the analyzing. The MTS is then useable to produce a program which implements the measurement task. The specifier may programmatically generate the program, e.g., a graphical program, which is executable to perform the task.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: March 3, 2009
    Assignee: National Instruments Corporation
    Inventors: Brian Johnson, John Breyer, Joseph Albert Savage
  • Patent number: 7496658
    Abstract: Disclosed are systems and methods for testing a network service. In one embodiment, a system and a method pertain to intercepting a message sent by a network service under test and directed another network service, determining whether the message should be redirected to a mock network service that emulates operation of the other network service, and redirecting the message to the mock network service if it is determined that the message should be so redirected.
    Type: Grant
    Filed: July 8, 2003
    Date of Patent: February 24, 2009
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Blaine R. Southam, David Christopher Davidson, Donna J. Grush
  • Publication number: 20090043527
    Abstract: Various computer-implemented methods, carrier media, and systems for generating a metrology sampling plan are provided. One computer-implemented method for generating a metrology sampling plan includes identifying one or more individual defects that have one or more attributes that are abnormal from one or more attributes of a population of defects in which the individual defects are included. The population of defects is located in a predetermined pattern on a wafer. The method also includes generating the metrology sampling plan based on results of the identifying step such that one or more areas on the wafer in which the one or more identified individual defects are located are sampled during metrology.
    Type: Application
    Filed: August 10, 2007
    Publication date: February 12, 2009
    Inventors: Allen Park, Ellis Chang
  • Patent number: 7483817
    Abstract: A connection characteristics determination unit determines whether connection mechanisms provided in a data processing system have differences in connection characteristics in terms of hardware implementation or not. If there is no difference in the connection characteristics of the connection mechanisms, a first load test execution unit determines, for all processors, a load test combination program of a test program and a load program having a load effect, and allocates them to the processors so as to execute a load test. If there is a difference in the connection characteristics of the connection mechanisms, a second load test execution unit determines, for each of a plurality of processor groups sorted in accordance with the difference of the connection characteristics, a load test combination program of a test program and a load program having a load effect, and allocates them to a plurality of processors so as to execute a load test.
    Type: Grant
    Filed: September 7, 2006
    Date of Patent: January 27, 2009
    Assignee: Fujitsu Limited
    Inventor: Masaru Mishuku
  • Publication number: 20090018793
    Abstract: A system and method for reducing device test time are disclosed herein. A method for reducing device test time includes applying a linear program solver to select a first set of tests for testing a device from a second set of tests for testing the device. The first set of tests is selected to reduce the time required to test the device while allowing no more than a predetermined number of devices tested to pass the first set of tests and fail the second set of tests.
    Type: Application
    Filed: July 2, 2008
    Publication date: January 15, 2009
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Charlotte SAKAROVITCH, Marielle PERRIN, Laurent ZENOUDA
  • Patent number: 7478004
    Abstract: A method for testing a connection between an audio receiving device and a motherboard is disclosed. The method includes the steps of: preparing a data storage medium containing an original audio data file; playing the data storage medium on an audio playing device with audio signals generated thereof, the audio playing device being connected to the audio receiving device; receiving the audio signals by the audio receiving device; transmitting the audio signals to the motherboard via the connection between the audio receiving device and the motherboard; outputting the audio signals from an output port; receiving the audio signals by an input port; recording the audio signals as a recorded audio data file; comparing the two audio data file; and reporting a test result indicating that the connection is in good condition if the two audio data files are identical.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: January 13, 2009
    Assignees: Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Hoi Chan, Qing-Long Chai, De-Hua Dang, Hong-Bo Zhao, Li-Chuan Qiu
  • Patent number: 7478000
    Abstract: A method to create an instance of a defect-based production and testing process analysis machine (DPTPAM) provides continual process improvement based on foundational questions and classified defect data. The method includes the following steps: obtaining domain specific questions; developing a domain specific classification scheme that supports the answering of the foundational and domain specific questions; determining a method of using the domain specific classification scheme to answer both the foundational and domain specific questions; and creating a domain specific DPTPAM instance embodying the domain specific classification scheme and the method of answering the foundational and domain specific questions. The method can be implemented with a machine and a computer readable medium comprising logic for performing the method.
    Type: Grant
    Filed: October 10, 2007
    Date of Patent: January 13, 2009
    Assignee: International Business Machines Corporation
    Inventors: Theresa C. Kratschmer, Peter Kenneth Malkin, Pradmanabhan Santhanam
  • Patent number: 7467066
    Abstract: A system, method, and computer program product for benchmarking a stream processing system are disclosed. The method comprises generating a plurality of correlated test streams. A semantically related data set is embedded within each of the test streams in the plurality of correlated test streams. The plurality of correlated test streams is provided to at least one stream processing system. A summary is generated for each of the semantically related embedded data sets. A common identifier, which is transparent to the system being tested, is embedded within each stream in the plurality of correlated test streams. The common identifier is extracted from the output data set generated by the stream processing system. At least one of the stored copies of the summaries and the common identifier are compared to an output data set including a set of zero or more correlation results generated by the stream processing system.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: December 16, 2008
    Assignee: International Business Machines Corporation
    Inventors: Kay S. Anderson, Joseph P. Bigus, Eric Bouillet, Parijat Dube, Zhen Liu, Dimitrios Pendarakis
  • Publication number: 20080281548
    Abstract: There is provided a method for establishing a parameters setup for inspecting a plurality of articles by an automatic inspection system. The method includes inspecting a first article by the inspection system, applying an automatic defects detection method according to a given set of inspection parameters, receiving an initial map of defects and sorting uncovered defects into defect types according to a predetermined set of defect types. While sorting defects, if new defects not recognized by the inspection system are detected, adding the new defects to the initial map to be sorted and automatically setting the inspection parameters by means of applying computational dedicated algorithms, using a heuristic approach, to form a modified parameters setup. The modified parameters setup is then used for obtaining a modified map of detected defects, and the modified parameters setup for inspecting other of the plurality of articles.
    Type: Application
    Filed: August 27, 2006
    Publication date: November 13, 2008
    Applicant: CAMTEK LTD
    Inventors: Doran Algranati, Oren Tropp, Roman Kagan
  • Patent number: 7451051
    Abstract: A method to create an instance of a defect-based production and testing process analysis machine (DPTPAM) provides continual process improvement based on foundational questions and classified defect data. The method includes the following steps: obtaining domain specific questions; developing a domain specific classification scheme that supports the answering of the foundational and domain specific questions; determining a method of using the domain specific classification scheme to answer both the foundational and domain specific questions; and creating a domain specific DPTPAM instance embodying the domain specific classification scheme and the method of answering the foundational and domain specific questions. The method can be implemented with a machine and a computer readable medium comprising logic for performing the method.
    Type: Grant
    Filed: April 3, 2006
    Date of Patent: November 11, 2008
    Assignee: International Business Machines Corporation
    Inventors: Theresa Kratschmer, Peter Kenneth Malkin, Padmanabhan Santhanam
  • Patent number: 7444258
    Abstract: Embodiments herein present a method for automated simulation testbench generation for serializer/deserializer datapath systems. The method provides a database of transactors for generating and checking data within the datapath system, wherein the transactors are adaptable to arbitrary configurations of the datapath system. The database is provided with a single set of transactors per core. Next, the method automatically selects one set of transactors from the database for inclusion into the simulation testbenches. Following this, the method maps the first datapath and the second datapath through the datapath system by interconnecting the selected set of the transactors with the datapath system. The method further comprises setting control pins on the cores to facilitate propagation of the data through the cores of the datapath system. Subsequently, the control pins are traced to input ports and control registers.
    Type: Grant
    Filed: December 5, 2005
    Date of Patent: October 28, 2008
    Assignee: International Business Machines Corporation
    Inventors: Francis A. Kampf, Jeanne Trinko-Mechler, David R. Stauffer
  • Patent number: 7444259
    Abstract: An apparatus includes a parser, a semantic checker, a data manager and an equation processor. The parser receives a first equation for manipulating data acquired by an instrument and detects an operand in the first equation, the instrument having a set of data acquisition capabilities. The semantic checker recognizes that the first operand refers to first data that can be acquired by the instrument using a first capability from the set of data acquisition capabilities. The data manager configures the instrument automatically to acquire the first data using the first capability after recognizing that the first operand corresponds to the first data. The equation processor computes a result of the first equation using the acquired first data.
    Type: Grant
    Filed: October 18, 2006
    Date of Patent: October 28, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Donald W. Stark
  • Publication number: 20080262769
    Abstract: A method includes receiving a first set of parameters associated with a particular die. A health metric for a particular die is determined using a multivariate analysis of the first set of parameters. The health metric incorporates at least one performance metric. At least one of a market segment designator or a testing plan associated with the particular die is determined based on the health metric.
    Type: Application
    Filed: April 23, 2007
    Publication date: October 23, 2008
    Inventors: DANIEL KADOSH, Gregory A. Cherry, Carl L. Bowen, Luis De La Fuente, Rajesh Vijayaraghavan
  • Patent number: 7440867
    Abstract: An exemplary method for measuring workpieces is disclosed. The method includes the steps of: measuring a workpiece; recording the measuring procedures of the workpiece; generating procedure codes according to the measuring procedures; storing the procedure codes in a program file; generating a measuring program by compiling the procedure codes and saving corresponding procedure commands of the compiled program file in a measuring program command package; and measuring a same type of workpieces by executing the procedure commands of the measuring program command package. By utilizing the present invention, the same type of workpieces can be measured automatically, measuring time can be reduced, and measuring efficiency can be enhanced.
    Type: Grant
    Filed: August 10, 2006
    Date of Patent: October 21, 2008
    Assignees: Hong Fu Jin Precision Industry (Shen Zhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.
    Inventors: Chih-Kuang Chang, Hua-Wei Yang, Li Jiang
  • Publication number: 20080234968
    Abstract: When an acquisition and reporting control unit 66 of a measurement data processing unit 65 in a development support device sends a sensor measurement start request to a cellular phone device for development in response to a collection operation start command from an application under development 62, accompanied by a collection condition, an acquisition and reporting control unit of a measurement data processing unit in the cellular phone device for development starts measurement operation by a sensor. As a result, measurement operation by the sensor starts, and the measured raw data is continuously sent to the development support device. Those which match the collection condition, among the measurement data items corresponding to the data thus generated by measurement, are collected by a data collection unit 67.
    Type: Application
    Filed: January 17, 2008
    Publication date: September 25, 2008
    Applicant: VODAFONE K.K.
    Inventors: Daisuke Tsujino, Yasuhiro Nishide, Jun Yamazaki, Hirohisa Kusuda
  • Patent number: 7421632
    Abstract: Methods and circuits for efficient configuration an error data crossover configuration circuit of an integrated circuit tester allows simultaneous DUT channel configuration for multiple identical DUTs for an error data control circuit.
    Type: Grant
    Filed: May 31, 2006
    Date of Patent: September 2, 2008
    Assignee: Verigy (Singapore) Pte. Ltd.
    Inventors: Stephen D. Jordan, Joel Buck-Gengler
  • Publication number: 20080189069
    Abstract: A comprehensive network-based workflow management system for directing closed-loop tasks for businesses and organizations includes: a network based portal linked to a plurality of web-pages for the purpose of interfacing with a client, at least one business module component, a provider-side server, a plurality of Instructions for the purpose of directing pre-determined tasks, a notification alert system for notifying the client to perform a specific task at a pre-determined time, a system for receiving data inputs from a client through a second communication device, a Measurements System for tracking data inputs, and a provider-side database for the purpose of storing system information
    Type: Application
    Filed: January 18, 2007
    Publication date: August 7, 2008
    Inventor: James Hans Beck
  • Patent number: 7404122
    Abstract: A circuit and method for efficiently configuring an ACAM Select RAM for an ACAM circuit of a tester that tests multiple devices under test (DUTs).
    Type: Grant
    Filed: May 31, 2006
    Date of Patent: July 22, 2008
    Assignee: Agilent Technologies, Inc.
    Inventor: Alan Starr Krech
  • Patent number: 7395170
    Abstract: A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying statistical outliers in test data for components.
    Type: Grant
    Filed: April 2, 2004
    Date of Patent: July 1, 2008
    Assignee: Test Advantage, Inc.
    Inventors: Michael J. Scott, Jacky Gorin, Paul Buxton, Eric Paul Tabor
  • Patent number: 7392149
    Abstract: A computer implemented method of automatic software testing. Status information of a software test running on a test system is stored to a common information point. The common information point is typically on a computer system independent from a computer system running the software test. An operating system on the test system is reinitialized. The operating system may be changed. The common information point is queried to determine the status information and the software test is resumed. The testing may be resumed at a point immediately after a last completed test operation.
    Type: Grant
    Filed: October 14, 2003
    Date of Patent: June 24, 2008
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventor: Carlos A. Bonilla
  • Patent number: 7392148
    Abstract: A test system for a heterogeneous multipath network. A tester system evaluates a plurality of status indicators from a plurality of types of test components in a network. Based on the status indicators of at least one of the test components, the tester system selects a first test to be performed. After executing the first test, the tester system selects a second test to be performed based on the status indicators of at least one of the test components and a result of the first test.
    Type: Grant
    Filed: November 2, 2006
    Date of Patent: June 24, 2008
    Assignee: International Business Machines Corporation
    Inventors: Robert Beverly Basham, Richard Earl Jones
  • Publication number: 20080125985
    Abstract: First hardware is for executing first software in response to macros that describe integrated circuitry, and for generating a set of constants in response to the execution of the first software. Second hardware is for receiving the set of constants from the first hardware, and for executing second software in response to the macros and the set of constants, and for estimating a power consumption of the integrated circuitry in response to the execution of the second software.
    Type: Application
    Filed: September 8, 2006
    Publication date: May 29, 2008
    Inventors: Rajat Chaudhry, Tilman Gloekler, Daniel L. Stasiak, Todd Swanson
  • Patent number: 7373263
    Abstract: A logic analyzer that performs analog-type measurements on digital data includes circuitry in its acquisition system that is programmable to search through acquired data to detect analog-type signal characteristics. In a first embodiment, the logic analyzer includes a graphical user interface employing a drag-and-drop operation to apply one or more selected analog-type measurements to selected portions of the digital data record. In a second embodiment, a user may designate a particular waveform or data listing by means of a mouse-click. Each of the choices of analog-type measurements can be represented by an icon, or text, or both icon and text.
    Type: Grant
    Filed: May 16, 2006
    Date of Patent: May 13, 2008
    Assignee: Tektronix, Inx.
    Inventors: Robert C. Cohn, Susan C. Adam, Mark A. Briscoe, Andrew Loofburrow, Eric E. Thums
  • Patent number: 7369957
    Abstract: A method and system for generating test pulses to test electronic elements are disclosed. After determining a transmission clock, which is smaller than a test clock, and a serial of predetermined pulses, the serial of data bits corresponding to the serial of predetermined pulses can be generated. Then the serial of data bits can be transformed into a serial data stream for transmission. By transmitting the serial data stream according to the transmission clock, the serial of predetermined pulses corresponding to the test clock can be generated.
    Type: Grant
    Filed: February 20, 2007
    Date of Patent: May 6, 2008
    Assignee: King Yuan Electronics Co., Ltd.
    Inventors: Shih-Bou Chang, Diann-Fang Lin
  • Patent number: 7366630
    Abstract: The installation of an electrical cable in a building and its subsequent testing are managed by first creating a computer database indicating the type of cable, the location where the cable is to be installed, the performance standard it should meet when installed in that location, and a test regimen to verify compliance with the performance standard. The database is then transferred into a hand held portable test instrument which is placed at the building site and connected to the cable to be tested.
    Type: Grant
    Filed: August 30, 2005
    Date of Patent: April 29, 2008
    Assignee: JDS Uniphase Corporation
    Inventors: Ronald J. Vogel, Lee A. Watkins