By Probe (e.g., Contact) Patents (Class 702/168)
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Patent number: 8200042Abstract: An endoscope apparatus includes an electronic endoscope that picks up a measurement object and produces a picked-up-image signal; an image-processing unit that produces a image signal based on the picked-up-image signal; and an measurement processing unit that undertakes measurement processing to the measurement object based on the image signal. The measurement processing unit includes: a reference point-designating unit that designates two reference points on the measurement object; an approximate-outline—calculating unit that calculates an approximate outline by approximating the outline of the measurement object based on the reference points; and a loss-composing points-calculating unit that calculates loss-composing points that constitute a loss outline formed on the measurement object based on the reference points and the approximate outline. This enables loss size measurement upon designating two reference points, thereby reducing complex operations and improving operability.Type: GrantFiled: January 29, 2008Date of Patent: June 12, 2012Assignee: Olympus CorporationInventors: Takahiro Doi, Fumio Hori
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Patent number: 8171130Abstract: Improved problem diagnosis techniques for use in accordance with computing systems, e.g., distributed computing systems, are disclosed. In one aspect of the invention, a technique for diagnosing a problem associated with a computing system comprises the following steps/operations. One or more probes are executed in accordance with at least a portion of a previously selected probe schedule. When a result of one or more of the probes of the previously selected probe schedule indicates, at least, a potential problem associated with the computing system, one or more probes which optimize at least one criterion are selected in real-time. The one or more selected probes are executed so as to diagnose the potential problem.Type: GrantFiled: May 5, 2008Date of Patent: May 1, 2012Assignee: International Business Machines CorporationInventors: Mark A. Brodie, Genady Grabarnik, Sheng Ma, Natalia V. Odintsova, Irina Rish
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Patent number: 8109007Abstract: A method for sensing an object profile shape involves relatively sweeping (whisking or translating) in angular or translational increments an elongated whisker element having a deflectable cantilever region and an object so that the cantilever region bends as a result of sliding along an object periphery. The moment (torque) at a base region of the whisker element as a result of the bending is determined. The method then iteratively determines successive contact point locations on the object periphery based on small successive increments in angle or position of the whisker element and the sensed moment (torque).Type: GrantFiled: June 1, 2009Date of Patent: February 7, 2012Assignee: Northwestern UniversityInventors: Joseph H. Solomon, Mitra J. Hartmann, Christopher L. Schroeder
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Patent number: 8107554Abstract: A system and a method for the transmission of signals representative of an event include a first low frequency clock and a low frequency counter for generating a first delay, and a second high frequency clock and a high frequency counter for generating a second delay. The system further includes a transmitter for transmitting the representative signals after a delay from the event made up by the sum of the first and the second delay. The second delay can be generated also by an analog device including for example a capacitor, and devices for charging the capacitor up to the reaching of a preset voltage at its ends. A wireless transmission system according to the invention is utilized in a checking system with a contact detecting probe, for transmitting a signal representative of contact with the piece to be checked.Type: GrantFiled: January 16, 2007Date of Patent: January 31, 2012Assignee: Marposs Societa' per AzioniInventors: Andrea Ferrari, Roberto Padovani
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Patent number: 8091244Abstract: The present invention relates to an ophthalmic holding mechanism for holding an eyeglass frame. The holding mechanism includes a base, a clamping mechanism configured for releaseably securing a lens mount of an eyeglass frame, and an actuator operatively associated with the clamping mechanism for causing linear and rotational movement thereof. The clamping mechanism is moveably coupled to the base for linear and rotational movement about an axis of rotation relative to the base, wherein the clamping mechanism is rotatable about first and second spaced pivot points. The present invention also relates to a method of tracing a lens mount of an eyeglass frame.Type: GrantFiled: January 25, 2011Date of Patent: January 10, 2012Assignee: National Optronics, Inc.Inventors: Daniel E. Andrews, David W. Gerding, Kurt W. Schaeffer
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Patent number: 8082120Abstract: A method and hand-held scanning apparatus for three-dimensional scanning of an object is described. The hand-held self-referenced scanning apparatus has a light source for illuminating retro-reflective markers, the retro-reflective markers being provided at fixed positions on or around the object, a photogrammetric high-resolution camera, a pattern projector for providing a projected pattern on a surface of the object; at least a pair of basic cameras, the basic camera cooperating with light sources, the projected pattern and at least a portion of the retro-reflective markers being apparent on the 2D images, a frame for holding all components in position within the hand-held apparatus, the frame having a handle, the frame allowing support and free movement of the scanning apparatus by a user.Type: GrantFiled: December 2, 2009Date of Patent: December 20, 2011Assignee: Creaform Inc.Inventors: Éric St-Pierre, Pierre-Luc Gagné, Antoine Thomas Caron, Nicolas Beaupré, Dragan Tubic, Patrick Hébert
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Publication number: 20110288819Abstract: A method of identifying characteristics of a target, marking object comprising the steps of: providing a subject, marked article having a surface having markings caused by a marking surface of the target, marking object; obtaining a 3D dataset corresponding to a 3D virtual model of the surface of the subject, marked article by means of a sensor; extracting from dataset by means of a surface segmentation analysis data indicative of a class of the target, marking object and storing said data in the database; extracting from the dataset by means of a surface wavelet filtering operation data corresponding to one or more individual characteristics of the target, marking object and storing said data in the database.Type: ApplicationFiled: July 1, 2009Publication date: November 24, 2011Applicant: University of HuddersfieldInventors: Philip Harrison, Liam Blunt
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Patent number: 8036768Abstract: Systems and methods for constructing custom orthotics are described. Several embodiments of the system use sensor pads to obtain both static and dynamic three dimensional information concerning the shape or topography of the bottom surface of a patient's foot. The information is analyzed to obtain information useful in constructing a custom orthotic from a selection of basic orthotic shells. Once constructed, the orthotic can modify a patient's gait. One embodiment of the present invention includes a user terminal including a sensor pad connected to a computer, a server configured to analyze three dimensional information acquired by the sensor pad, a manufacturing terminal configured to display the results of the server's analysis of the three dimensional information and a network that connects the user terminal to the server and the server to the manufacturing terminal.Type: GrantFiled: October 23, 2007Date of Patent: October 11, 2011Inventor: Craig E. Lowe
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Patent number: 8036769Abstract: A method for compensating positional and/or shape deviations in NC-controlled cutting production machines. The method including the steps of securing a new workpiece, processing the workpiece using nominal data of the NC program, acquiring set deviation, optimizing the NC program using the acquired data and repeating the above steps until at least one of required positional and shape tolerances are achieved.Type: GrantFiled: February 16, 2011Date of Patent: October 11, 2011Assignee: MTU Aero Engines GmbHInventor: Arndt Glasser
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Patent number: 8032321Abstract: A biosensor system determines the presence and/or concentration of an analyte in a sample using one or more calibrated correlation equations. The analysis may be electrochemical, optical, or a combination thereof. The biosensor system may be implemented using a measurement device and a sensor strip. The measurement device applies test signals to a multi-layered encoding area of the sensor strip. Calibration information is determined from the patterns generated by the interaction of the test signals with the multi-layered encoding area.Type: GrantFiled: July 15, 2008Date of Patent: October 4, 2011Assignee: Bayer Healthcare LLCInventor: Weiping Zhong
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Patent number: 8032311Abstract: A method for characterizing a desired property of a fluid downhole is described. In some non-limiting examples, the method comprises receiving an input signal representing sound speed of a fluid downhole, processing the input signal using a correlation equation expressing the desired property in terms of at least sound speed to produce an output signal representing the desired property, and outputting the output signal. In some examples, the correlation equation is derived through a chemometric analysis of a training data set, the training data set comprises a plurality of input values and a plurality of output values derived from said input values, between the desired fluid property and the first measured property, and the output values are calculated from the input values using a series of correlation equations. In at least one example, the desired property is gas oil ratio. In another example, the desired property is gas brine ratio.Type: GrantFiled: May 22, 2008Date of Patent: October 4, 2011Assignee: Baker Hughes IncorporatedInventor: Rocco DiFoggio
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Patent number: 8014892Abstract: A method for compensating for at least one of positional deviations and shape deviations in NC-controlled cutting production machines where the method includes the steps of securing a new workpiece, processing the workpiece using the nominal data of the NC program, acquiring the set deviation data, optimizing the NC program using the acquired data and repeating these steps until at least one of required positional and shape tolerances have been achieved.Type: GrantFiled: October 17, 2006Date of Patent: September 6, 2011Assignee: MTU Aero Engines GmbHInventor: Arndt Glässer
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Patent number: 7992314Abstract: An elevation measuring device comprises a measuring column at which a vertically movable measuring slide is supported, so it can be moved by hand and also by a drive motor through a clutch device. The measuring slide supports a scan head, which imparts a constant measuring force onto the measuring location at the work piece, which is generated by the drive motor and the clutch device. A measuring system detects the elevation coordinate of the scan head and hands said elevation coordinate to a control device for further processing and evaluation. The control device comprises logic for automating the measuring process. This logic automatically detects a positioning of the scan head in a certain direction, which is manually performed by the operator, subsequently controls the drive motor in a suitable manner in order to cause a scanning of the work piece and determines the measurement values.Type: GrantFiled: November 17, 2008Date of Patent: August 9, 2011Assignee: Carl Mahr Holding GmbHInventors: Peter Strack, Jens Stockburger, Zoran Ostric
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Patent number: 7941286Abstract: Systems and techniques for varying a scan rate in a measurement instrument. The techniques may be used in scanning probe instruments, including atomic force microscopes (AFMs) and other scanning probe microscopes, as well as profilometers and confocal optical microscopes. This allows the selective imaging of particular regions of a sample surface for accurate measurement of critical dimensions within a relatively small data acquisition time.Type: GrantFiled: November 28, 2006Date of Patent: May 10, 2011Assignee: Asylum Research CorporationInventors: Roger B. Proksch, Roger C. Callahan
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Patent number: 7918033Abstract: A coordinate measuring machine has a probe head, a calibrating body and an apparatus for recording and correcting measured values obtained by the probe head. A mechanical flexibility at predetermined points on the surface of the calibrating body is determined. The mechanical flexibility is stored in the apparatus in the form of a data record. The calibrating body is scanned point by point by means of the probe head in order to obtain the measured values. Thereafter, the probe head is calibrated by correcting the measured values using the data record. A similar approach can also be used on workpieces having a known mechanical flexibility.Type: GrantFiled: April 16, 2010Date of Patent: April 5, 2011Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Tobias Held
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Patent number: 7918036Abstract: In a surface shape measurement device that measures the surface shape of a sample (W1, W2) by moving a probe (16, 26) in a sliding fashion along the surface of the sample (W1, W2) and thereby detecting the amount of displacement of the probe (16, 26) caused by irregularities on the surface, an initial amount of displacement is detected which is the amount of displacement of the probe (16, 26) when the probe is first placed in contact with a measurement start point on the surface of the sample (W1, W2), and the amount of displacement of the probe (16, 26), detected as it is moved in a sliding fashion along the surface, is compared with the initial amount of displacement to determine whether the probe (16, 26) has reached a measurement end point.Type: GrantFiled: May 21, 2008Date of Patent: April 5, 2011Assignee: Tokyo Seimitsu Co., Ltd.Inventor: Yasunari Ishikawa
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Publication number: 20110066400Abstract: A 3D measuring apparatus includes a probe that has a spherical gauge head for measuring a measured object; a motion mechanism that holds and moves the probe; and a motion controller that controls the motion mechanism. The controller includes a contact point obtainer that obtains a contact point location of a surface of the measured object and the gauge head based on a central location of the gauge head; a radius of the gauge head; and a swing amount of the gauge head. The controller also includes a motion commander that calculates a location command value causing the motion mechanism to move the probe, based on the contact point location obtained by the contact point obtainer.Type: ApplicationFiled: September 9, 2010Publication date: March 17, 2011Applicant: MITUTOYO CORPORATIONInventors: Takashi NODA, Kenji UEDA
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Publication number: 20110029289Abstract: The subject matter disclosed provides a tactile sensing device comprising an end effector and a control unit. The control unit is capable of receiving tactile information from the at least one end effector. With the foregoing disclosure, it is capable of identifying and relatively quickly mapping the shape and location of unknown surfaces.Type: ApplicationFiled: July 31, 2009Publication date: February 3, 2011Inventors: Julio Guerrero, Steve Dubowsky, Francesco Mazzini, Dan Kettler
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Publication number: 20100299104Abstract: Form measuring instrument includes: first measuring means which moves contact piece from first position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain first profile; second placing means which rotates workpiece about first axis by 90 degrees to place workpiece at second position from first position; second measuring means which moves contact piece from second position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain second profile; extremum position calculating means which fits circles to first and second profiles and calculate positions, in direction parallel with second axis, of first and second extremums indicating circles' extremums; and moving means which moves workpiece in direction parallel with second axis and direction parallel with third axis such that positions, in direction parallel with second axis, of first and second extremums become 0.Type: ApplicationFiled: April 26, 2010Publication date: November 25, 2010Applicant: MITUTOYO CORPORATIONInventors: Toshiyuki Tamai, Tomonori Goto
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Publication number: 20100292956Abstract: A probe for measuring the dimensions of objects on a coordinate positioning machine such as a machine tool has a workpiece-contacting stylus. This is suspended via a sensor mechanism, including strain gauges which provide an output when the stylus contacts a workpiece. A processor processes the strain gauge outputs to produce a trigger signal. It does so in accordance with an algorithm or equation or look-up table which ensures equal sensitivity in all possible directions of approach to the workpiece in the three dimensions X, Y, Z.Type: ApplicationFiled: July 21, 2010Publication date: November 18, 2010Applicant: RENISHAW PLCInventors: Tim Prestidge, Jonathan Paul Fuge
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Patent number: 7809523Abstract: A method and apparatus for measuring a surface using a surface sensing device mounted on a scanning head on a member of a coordinate positioning apparatus. The coordinate positioning apparatus may be operated to produce relative movement between the scanning head and the surface profile and the scanning head includes a drive for producing rotational movement of the surface sensing probe about one or more axis. A desired measurement profile on the surface which the surface sensing device will track and the desired motion of the orientation of the surface sensing device as the surface' sensing device follows the measurement profile are defined. This data is used to derive the required path of the relative motion between the member of the coordinate positioning apparatus and the surface, such that the surface sensing device prescribes a trajectory along the measurement profile.Type: GrantFiled: March 23, 2007Date of Patent: October 5, 2010Assignee: Renishaw PLCInventors: Stephan Paul Hunter, Geoffrey McFarland, Kevyn Barry Jonas, Khaled Mamour
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Publication number: 20100250175Abstract: The present system, method, article of manufacture, software, and apparatus is an “intelligent” probe system and components thereof and may openly encompass, in at least an embodiment, an embedded IC chip located in an interchangeable probe(s) which offers repeatable, fast, easy, and error free probe swapping on a CCM.Type: ApplicationFiled: June 11, 2010Publication date: September 30, 2010Applicant: FARO TECHNOLOGIES, INC.Inventors: Clark H. Briggs, Keith George Macfarlane, Frederick John York, Marc Barber
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Publication number: 20100217561Abstract: A metrological instrument determines a surface profile or form of a surface (61) of a workpiece (60) by effecting relative movement between a probe (11, 12) and the surface (61) so that the probe follows and is displaced by changes in the surface topography. A measure of the displacement of the probe as it follows the surface is obtained by a displacement provider which may be an interferometric gauge (35). Instead of making a measurement along a single measurement path over the surface (61), respective measurements are made on sections (61d and 61e or 61g and 61h) of that measurement path to obtain corresponding measurement data sets and these measurement data sets are independently positioned or aligned to a reference data set. The reference data set may be obtained by a measurement made on another section (61c) of the measurement path (61), on another measurement path (61f) over another surface (62a and 62b) of the component or on another measurement path over a surface on which the component is located.Type: ApplicationFiled: January 25, 2006Publication date: August 26, 2010Applicant: TAYLOR HOBSON LIMITEDInventor: Michael Mills
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Patent number: 7783445Abstract: A method for planning the trajectory of an apparatus, such as an articulating probe head, mounted on a coordinate positioning apparatus, such as a CMM. It is determined whether for a given trajectory, the angular velocity or acceleration of the apparatus about a rotational axis of the apparatus will exceed a predetermined threshold. If so, parameters are adjusted so that the angular velocity or acceleration do not exceed the threshold.Type: GrantFiled: April 12, 2006Date of Patent: August 24, 2010Assignee: Renishaw PLCInventors: Ian William McLean, Geoffrey McFarland, David Sven Wallace
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Publication number: 20100198543Abstract: A device, a method and a guiding device for setting out contours, points or works, comprising a computer-controlled measuring device provided with a movable measuring probe and a portable base unit provided with a rotatably supported elongate arm. The measuring probe is connected to the measuring device by means of a cord or a wire via the elongate arm, and the measuring device is provided with sensors for measuring a length or a change in the length of the cord or the wire and rotation of the arm in at least one degree of freedom for providing position data of the measuring probe. A guiding device communicatively connected to the measuring device is designed for providing guidance for positioning the measuring probe for the purpose of reducing a difference between a measured position of the measuring probe and a desired position of the measuring probe in accordance with a contour, point or work to be set out.Type: ApplicationFiled: February 5, 2010Publication date: August 5, 2010Applicant: Holding Prodim Systems B.V.Inventor: Dick TEUNE
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Patent number: 7769560Abstract: In profiling control of a contact type probe in which a contact point is moved along a surface of an object to be measured, while being in contact with the object by a constant measurement force F, a contact determination level is provided for detecting a predetermined force smaller than a target measurement force is applied to the contact point, contact determination is performed at the time when force applied to the contact point reaches the contact determination level during approach, and the contact point is shifted from position control to force control for bringing the contact point into contact with the object by the target measurement force. Thereby contact trace is prevented from occurring on the object to be measured without reducing approach speed as much as possible and lowering measurement efficiency.Type: GrantFiled: January 30, 2008Date of Patent: August 3, 2010Assignee: Mitutoyo CorporationInventors: Shiro Igasaki, Masaoki Yamagata
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Patent number: 7734445Abstract: A device measures a measurement object surface shape, and includes a base to which the measurement object is secured; a slide movable in at least three different directions and secured to the base; a probe holding unit mounted to the slide; and a contact probe resiliently supported by the holding unit so as to be movable with respect to the holding unit. Additional features include a unit measuring the position and posture of the probe with respect to the holding unit; a unit calculating a contact-force vector, which the probe receives from the measurement object, from a measurement result of the measuring unit; and a controlling unit moving the probe along the surface of the measurement object. The controlling unit also controls a position of the holding unit so that a magnitude of the contact-force vector comes closer to a control target value thereof in accordance with the magnitude of the contact-force vector.Type: GrantFiled: July 11, 2008Date of Patent: June 8, 2010Assignee: Canon Kabushiki KaishaInventor: Mahito Negishi
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Patent number: 7725290Abstract: An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.Type: GrantFiled: December 28, 2007Date of Patent: May 25, 2010Assignees: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Hon Hai Precision Industry Co., Ltd.Inventors: Qing Liu, Jun-Qi Li, Takeo Nakagawa
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Patent number: 7684956Abstract: A method of extracting the shape of a probe tip of a probe-based instrument from data obtained by the instrument is provided. The method employs algorithms based on the principle that no reconstructed image points can physically occupy the same region as the tip during imaging. Sequential translates of the tip shape or volume sweep out an area or volume that is an “exclusion zone” similar to morphological erosion. The embodiments of the alternative method use either the region defined by the tip boundary or simply the tip boundary.Type: GrantFiled: November 28, 2006Date of Patent: March 23, 2010Assignee: Veeco Instruments, Inc.Inventors: Gregory A. Dahlen, William Foreman
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Patent number: 7665219Abstract: A measurement probe (12, 110, 250), such as a touch trigger or analogue probe, is described that comprises a deflectable stylus portion (14) and a wireless communications unit (18) for transmitting stylus deflection data to a remote probe interface (20, 104, 254). The wireless communications unit (18) is arranged to transmit digital data packets comprising stylus deflection data and a probe identity code. The wireless communications unit (18) allows said probe identity code to be set by a user. The measurement probe (12, 110, 250) may communicate with an associated probe interface (20, 104, 254) over a radio frequency (RF) spread spectrum link (106).Type: GrantFiled: September 24, 2006Date of Patent: February 23, 2010Assignee: Renishaw PLCInventors: John Styles, Martin Adrian Woollett, Tim Prestidge
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Publication number: 20100011600Abstract: A method and apparatus for measuring a surface using a surface sensing device mounted on a scanning head on a member of a coordinate positioning apparatus. The coordinate positioning apparatus may be operated to produce relative movement between the scanning head and the surface profile and the scanning head includes a drive for producing rotational movement of the surface sensing probe about one or more axis. The coordinate positioning apparatus is driven to provide relative movement between the member and the surface profile in a circular path and the probe head is driven to move the surface sensing device about said one or more axes, such that the surface sensing device maintains a nominally constant lead angle. The motion of the coordinate positioning apparatus and probe head is synchronous.Type: ApplicationFiled: March 23, 2007Publication date: January 21, 2010Applicant: RENISHAW PLCInventors: Stephen Paul Hunter, Geoffrey McFarland, Kevyn Barry Jonas, Khaled Mamour
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Patent number: 7643963Abstract: An apparatus for measuring surface texture causes a probe to trace a surface of a workpiece to detect contact between a tip provided on the tip of the probe and the surface of the workpiece and measures surface texture of the workpiece. The apparatus for measuring surface texture includes: a path division unit dividing a path along which the tip is moved into a plurality of sections between the starting point and the ending point of the path; a moving velocity calculation unit calculating a moving velocity of the tip in sequence from the starting point to the ending point for each of the plurality of sections, based on the path information for each of the plurality of sections; and a stylus movement control unit moving the tip in a section for which a moving velocity has been calculated at the moving velocity calculation unit.Type: GrantFiled: March 26, 2008Date of Patent: January 5, 2010Assignee: Mitutoyo CorporationInventors: Takashi Noda, Hiromi Deguchi, Naoya Kikuchi
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Patent number: 7643950Abstract: A system and method is disclosed for minimizing power consumption of a sensor unit that is capable of detecting an object. Main circuitry operates the sensor unit in a high power mode of operation when the sensor unit detects an object. Low power control circuitry operates the sensor unit in a low power mode of operation when the sensor unit does not detect an object within a pre-determined period of time. The low power control circuitry also comprises a counter to periodically determine when to restore the sensor unit to a high power mode of operation. One advantageous embodiment of the sensor unit is a fingerprint sensor unit for detecting a finger to obtain fingerprint information.Type: GrantFiled: December 1, 2005Date of Patent: January 5, 2010Assignees: National Semiconductor Corporation, Validity Sensors, Inc.Inventors: Lawrence Getzin, Richard B. Nelson, Jaswinder S. Jandu, Richard Alexander Erhart
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Patent number: 7640137Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.Type: GrantFiled: January 30, 2007Date of Patent: December 29, 2009Assignee: Hitachi, LtdInventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
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Patent number: 7636646Abstract: A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.Type: GrantFiled: May 16, 2008Date of Patent: December 22, 2009Assignee: Mitutoyo CorporationInventor: Tsukasa Kojima
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Publication number: 20090307916Abstract: A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.Type: ApplicationFiled: April 19, 2006Publication date: December 17, 2009Applicant: RENISHAW PLCInventors: Ian William McLean, Nicholas John Weston, Martin Simon Rees, Leo Christopher Somerville
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Publication number: 20090299692Abstract: A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle ? of the stylus displacement vector D that is caused by a frictional force between a stylus 32 and the measuring surface 5a during scanning of the measuring surface 5a by the stylus 32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus 32 relative to the probe 5. Movement of an XY-stage 7 is controlled so that the probe 6 moves in accordance with the moving vector M.Type: ApplicationFiled: June 2, 2009Publication date: December 3, 2009Inventors: Keiichi YOSHIZUMI, Masateru Doi, Takayuki Kurata
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Publication number: 20090292503Abstract: A machine tool is fitted with a position detector for detecting a position of a moving axis of the machine tool and an on-machine measuring device for measurement on the machine tool. An axial position detection signal output from the position detector and a measurement signal output from the on-machine measuring device are received through interfaces by a numerical controller that controls the machine tool. These interfaces are designed so that the numerical controller receives the axial position detection signal and the measurement signal with the same timing.Type: ApplicationFiled: March 26, 2009Publication date: November 26, 2009Applicant: FANUC LTDInventors: Yonpyo Hon, Kenzo Ebihara, Akira Yamamoto, Masayuki Hamura
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Patent number: 7617068Abstract: A method for determining a mobility of foot comprising: measuring at least a portion of a shape of the foot under a first weight load; measuring the at least the portion of the shape of the foot under a second weight load; and comparing the measurement under the first weight load to the measurement under the second weight load, thereby determining a mobility of at least the portion of the foot.Type: GrantFiled: October 20, 2006Date of Patent: November 10, 2009Assignee: Amfit, Inc.Inventors: Tony Tadin, Arjen Sundman
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Method and machine for determining a space coordinate of a measurement point on a measurement object
Patent number: 7599813Abstract: For determining a space coordinate of a measurement point on a measuring object, the measurement point is approached with a probe head arranged on a displacement mechanism having at least two supports movable parallel to one another. Each support is moved by its own drive. The space coordinate of the measurement point is determined as a function of the respective displacement position of the supports. The two drives are controlled by a common regulator.Type: GrantFiled: July 10, 2007Date of Patent: October 6, 2009Assignee: Carl Zeiss Industrielle Messtechnik GmbHInventor: Guenter Grupp -
Patent number: 7542872Abstract: A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of the reference point of the contact as pseudo-measurement points when the contact touches the object at a plurality of locations. A normal vector generator estimates a surface or line along the pseudo-measurement points from the pseudo-measurement points to calculate normal vectors extending from the pseudo-measurement points to the surface or line. A contact model locator locates contact models which specify the surface form of the contact so as to coincide the pseudo-measurement points with reference points of the contact models and so as to coincide attitudes of the contact on measurement with attitudes of the contact models. A measurement point calculator calculates cross points as measurement points, at which the normal vectors cross the surfaces of the located contact models.Type: GrantFiled: February 2, 2007Date of Patent: June 2, 2009Assignee: Mitutoyo CorporationInventors: Soichi Kadowaki, Tsukasa Kojima, Tomonori Goto
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Patent number: 7542871Abstract: A hand held non-destructive testing device has a frame which supports an NDI sensor and incorporates means for translation across a surface to be inspected with position registration and resilient means for maintaining the sensor and the translation means in intimate contact with the surface. An ergonomic handle is mounted to the frame for manually controlled translation of the frame incorporates a plurality of control means for control of the sensor in scanning of the surface under inspection.Type: GrantFiled: October 31, 2005Date of Patent: June 2, 2009Assignee: The Boeing CompanyInventors: Raymond D. Rempt, Daniel J. Wright
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Patent number: 7519502Abstract: In one general aspect, a method of processing surface profile measurements includes obtaining a calibration image, the calibration image including one or more surface profile measurements at one or more discrete points on a surface, performing calibration processing on the surface profile measurements, performing data processing on the surface profile measurements, and providing data output based upon the calibration processing and the data processing.Type: GrantFiled: March 14, 2007Date of Patent: April 14, 2009Assignee: The United States of America as represented by the Secretary of the NavyInventors: Jason Bradley Carneal, Paisan Atsavapranee, Jerry Wei-Jen Shan
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Publication number: 20090055118Abstract: A method for planning the trajectory of an apparatus, such as an articulating probe head, mounted on a coordinate positioning apparatus, such as a CMM. It is determined whether for a given trajectory, the angular velocity or acceleration of the apparatus about a rotational axis of the apparatus will exceed a predetermined threshold. If so, parameters are adjusted so that the angular velocity or acceleration do not exceed the threshold.Type: ApplicationFiled: April 12, 2006Publication date: February 26, 2009Applicant: RENISHAW PLCInventors: Ian William McLean, Geoffrey McFarland, David Sven Wallace
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Publication number: 20090048799Abstract: A roundness measuring device obtains an eccentric position of a measured object with respect to a rotation axis in measuring roundness of the measured object by rotating and driving the measured object. The roundness measuring device includes: a measurement acquisition unit obtaining, as measurements, rotation angles of the measured object and distances from the rotation axis to a surface of the measured object, the distance corresponding to the rotating angle; and an eccentricity calculation unit setting a circular correction circle with its center position provided as variable parameters, calculating the center position of the correction circle that minimizes sum of squares of distances between each of the measurements and the correction circle, in a direction from each of the measurements toward the center position of the correction circle, and determining the center position of the correction circle as the eccentric position.Type: ApplicationFiled: May 14, 2008Publication date: February 19, 2009Applicant: MITUTOYO CORPORATIONInventors: Soichi Kadowaki, Tsukasa Kojima
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Publication number: 20090037140Abstract: An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object.Type: ApplicationFiled: December 28, 2007Publication date: February 5, 2009Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Qing Liu, Jun-Qi Li, Takeo Nakagawa
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Publication number: 20090037141Abstract: An exemplary measuring device (100) for measuring aspects of objects includes a first contour measuring probe (10), a second contour measuring probe (20) and a processor (30). The first contour measuring probe (10) has a first tip extension (16) and a first displacement sensor (19). The first tip extension (16) is slidable in a first direction. The first displacement sensor (19) is used to sense a displacement of the first tip extension (16). The second contour measuring probe (20) has a second tip extension (26) and a second displacement sensor. The second tip extension (26) is slidable in the first direction. The second displacement sensor is used to sense a displacement of the second tip extension (26). The processor (30) is electrically connected to the first displacement sensor (19) and the second displacement sensor respectively.Type: ApplicationFiled: December 28, 2007Publication date: February 5, 2009Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: QING LIU, JUN-QI LI
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Publication number: 20090030650Abstract: An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.Type: ApplicationFiled: December 28, 2007Publication date: January 29, 2009Applicants: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., HON HAI PRECISION INDUSTRY CO., LTD.Inventors: Qing Liu, Jun-Qi Li, Takeo Nakagawa
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Publication number: 20090024355Abstract: A device measures a measurement object surface shape, and includes a base to which the measurement object is secured; a slide movable in at least three different directions and secured to the base; a probe holding unit mounted to the slide; and a contact probe resiliently supported by the holding unit so as to be movable with respect to the holding unit. Additional features include a unit measuring the position and posture of the probe with respect to the holding unit; a unit calculating a contact-force vector, which the probe receives from the measurement object, from a measurement result of the measuring unit; and a controlling unit moving the probe along the surface of the measurement object. The controlling unit also controls a position of the holding unit so that a magnitude of the contact-force vector comes closer to a control target value thereof in accordance with the magnitude of the contact-force vector.Type: ApplicationFiled: July 11, 2008Publication date: January 22, 2009Applicant: CANON KABUSHIKI KAISHAInventor: Mahito Negishi
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Patent number: 7478298Abstract: A test system for testing a backplane comprising an adapter assembly and a generic boundary-scan test unit. The adapter assembly includes an application-specific mating connector to communicatively couple the adapter assembly to an application-specific port of a backplane and an adapter generic connector. The generic boundary-scan test unit includes a test card generic connector to communicatively couple the generic boundary-scan test unit to the adapter generic connector of the adapter assembly and boundary-scan functionality to transmit at least one output test signal. The backplane is tested by communicating the output test signal from the generic boundary-scan test unit to the application-specific mating connector for testing the backplane and communicating at least one input test signal received from the backplane via the application-specific mating connector to the boundary-scan functionality of the generic boundary-scan test unit.Type: GrantFiled: January 26, 2006Date of Patent: January 13, 2009Assignee: Honeywell International Inc.Inventors: Douglas S. Jaworski, Daniel W. Snider