Abstract: A work piece 1 mounted on a movable table 22 is rotated while adjusting cutting depths of a grinding wheel 23 by means of feed motor so as to perform cylindrical grinding. During the cylindrical grinding, a thermocouple 42 is pushed to and caused to contact the rotating cylindrical grinding surface 1a of the work piece 1 at a constant pressure and thermoelectromotive force generated by the thermocouple 42 is measured. Surface roughness data corresponding to the measured thermoelectromotive force are obtained on the basis of the thermoelectromotive data obtained by the measurement and correlation between thermoelectromotive force and surface roughness concerning a known standard surface previously obtained and memorized. The surface roughness data are output and displayed on a display section. Therefore, an in-process measurement of surface state of the work piece 1 can be performed, while the machining such as cylindrical grinding is being carried out.

Abstract: A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another.

Abstract: An image display method for displaying a surface shape by measuring the surface shape of an object surface of a work piece to be measured with a contact probe placed on a machine and displaying the surface shape of said object surface on a screen based on measured shape data of the object surface, the method having: measuring a multiplicity of measuring positions on the object surface to be measured with the probe while relatively moving the probe on the object surface in order to obtain continuous shape data of the object surface; and displaying the surface shape of the object surface in real time based on the continuous shape data.

Abstract: A method to determine the shape data of a complex curve surface using reference templates from a copy of the workpiece before it was used and the undamaged portion of the used workpiece so that the damaged portion of the workpiece can be reconstructed. The reference template is scanned in layers, including the portion corresponding to that which has been damaged in the workpiece, as well as adjacent undamaged portions of the used workpiece. Offsets of the reference template and workpiece are generated, based on corresponding portions of the reference template and the used workpiece. A new set of offsets of the damaged portion of the workpiece is then calculated. This calculated set of offsets is then used to calculate further profiles until a complete profile of the damaged portion has been predicted.

Abstract: An embodiment of a read mechanism used in a contact atomic resolution storage system, has a cantilever disposed with a medium which is movable relative to the cantilever. The cantilever has a probe which extends from the cantilever and which contacts a surface of the medium. A pod is formed on a side of the cantilever facing the medium and extends toward the media. A sensor element is formed on the pod so as to juxtapose the medium.

Abstract: A surface profile measuring instrument has a means for measuring the profile of a surface and a means for storing measurements produced by the means for measuring the profile of a surface. The instrument may have a tip physically coupled to a sensor. The instrument may also have means for processing the measurements and/or for analysing the measurements. The instrument may be connected to an external device such as a printer and/or to a display unit.

Abstract: In profiling control of a contact type probe in which a contact point is moved along a surface of an object to be measured, while being in contact with the object by a constant measurement force F, a contact determination level is provided for detecting a predetermined force smaller than a target measurement force is applied to the contact point, contact determination is performed at the time when force applied to the contact point reaches the contact determination level during approach, and the contact point is shifted from position control to force control for bringing the contact point into contact with the object by the target measurement force. Thereby contact trace is prevented from occurring on the object to be measured without reducing approach speed as much as possible and lowering measurement efficiency.

Abstract: A system for performing dimension checkings of mechanical pieces is provided including a contact detecting probe with wireless transmission, for example through a single radiofrequency two-way communication link, to and from a base station connected to an interface unit. The probe includes a logic unit and a memory unit in which reside the values of some operation parameters, for example the transmission frequency and/or the activation mode of the probe. The values of the operation parameters can be modified in a programming phase, according to a method that foresees the wireless transmission of control signals from a manually operated control device—to the probe, for updating of the values among the selectable values of a sequence residing in the probe, and the acquisition of the current value.

Abstract: Improved problem diagnosis techniques for use in accordance with computing systems, e.g., distributed computing systems, are disclosed. In one aspect of the invention, a technique for diagnosing a problem associated with a computing system comprises the following steps/operations. One or more probes are executed in accordance with at least a portion of a previously selected probe schedule. When a result of one or more of the probes of the previously selected probe schedule indicates, at least, a potential problem associated with the computing system, one or more probes which optimize at least one criterion are selected in real-time. The one or more selected probes are executed so as to diagnose the potential problem.

Abstract: An All-in-one Digital Cantilever Controller applicable to all SFM systems is disclosed that can perform many relevant experiments for cantilever control in Scanned Force Microscopy. It is comparable in speed to analog components, especially when performing experiments that must resolve the smallest possible frequency shift. It is compact in the sense that one optimized digital implementation replaces analog components associated with cantilever signal processing and control. It has minimal thermal drift, at least an order of magnitude less than analog components. It has a number of meaningful tuning parameters available, as well as a user-friendly graphical interface (GUI) for adjusting those tuning parameters and performing different types of experiments. The disclosed invention also provides an optimal strategy for maximizing algorithm execution speed, while maintaining desired algorithm accuracy.

Abstract: A measuring system includes a coordinate measuring machine for driving a scanning probe and a host computer. The host computer includes a compensation table (53) and a profile analysis unit (54). The compensation table stores, as compensation data, compensation coefficients to correct counter values of a probe counter (415), and compensation radiuses “r” to the workpiece surface concerning central coordinate values of a contact portion, for respective contact directions. The profile analysis unit has a contact direction calculation unit (542), a compensation data selection unit (543), a compensation calculation unit (544). The contact direction calculation unit calculates the contact direction along which the scanning probe comes into contact with a workpiece W, and the compensation data selection unit selects compensation data set up in the compensation table based on thus calculated contact direction.

Abstract: A three-dimensional (3D) collision detection method for a measuring machine comprises the steps of: receiving parameters of a to-be-measured workpiece and a moveable arm; simulating a to-be-measured workpiece 3D-model in accordance with the parameters of the to-be-measured workpiece, and a moveable arm 3D-model in accordance with the parameters of the moveable arm; combining the to-be-measured workpiece 3D-model with the moveable arm 3D-model to form a 3D collision model; generating a measuring path of the moveable arm by calculating positional coordinates of the moveable arm according to the 3D collision model; detecting whether the moveable arm collides with the to-be-measured workpiece according to the measuring path; and outputting collision results that include the collision coordinates and the measuring path. A related system is also disclosed.

Abstract: A surface texture measuring instrument is provided that is capable of performing a correction operation depending on the rotation angle position of a detector even when the detector is rotated for measurement.

Abstract: A three-dimensional shape measuring method and a measuring apparatus thereof that allow the operation of a robot to be readily taught and set in a short time when a three-dimensional measuring device mounted on the robot is caused to move along the surface of a work, thereby measuring the shape of the work. A block data representative of measurement operation that causes the three-dimensional measuring device, which is a laser scanner, to move along the surface of the work is set and recorded. Then longitudinally copying (Step S2) and laterally copying (Step S3) block data is longitudinally and laterally copied after entering the size and basic shape type of the work. Then the shape of the work is measured on the basis of the copied block data.

Abstract: A computer-implemented method for verifying geometries of airfoils includes the steps of providing a part having an airfoil having an intended positional geometry and an intended feature geometry; measuring a first set of points of a primary datum system; determining an actual positional geometry of the airfoil based on the primary datum system measurements; calculating a first deviation between the intended positional geometry and the actual positional geometry of the airfoil; measuring a plurality of sets of points of at least one secondary datum system; determining an actual feature geometry of the airfoil based on the at least one secondary datum system measurement; calculating a second deviation between the intended feature geometry and the actual feature geometry of the airfoil; and performing a verification of the intended positional geometry and the intended feature geometry of the airfoil based upon the first deviation and the second deviation.

Abstract: A method of measuring an object on a coordinate positioning apparatus. A first object is placed on a coordinate positioning apparatus and measured with a workpiece contacting probe to create measurement data. The measurement data is collected at multiple stylus deflections or probe forces. For a plurality of points on the surface of the first object, the measurement data is extrapolated to that corresponding to zero stylus deflection or zero probe force. An error function or map is created from the measurement data and the extrapolated data. Subsequent objects are then measured using a known stylus deflection or known probe force and the error function or map is used to apply an error correction to these measurements.

Abstract: A theoretical expression of a workpiece (W) the curved surface of which is measured by a measuring probe (110) equipped with a stylus (111) is specified, a measuring area where the measurement is executed on the measuring surface of the workpiece (W) is determined, and the axis angles of the stylus (111) are determined based on the coordinate values and the normal vector of a representative point determined in the measuring area.

Abstract: A computer-based method for generating a scanning program for a stand-alone measuring equipment is provided. The method includes the steps of: receiving parameters, the parameters including output types of probing points; calculating a probing point coordinate multidimensional array; creating probing features; generating 3D program of each probing feature, and forming a control file by assimilating all 3D programs; and transferring the control file to a computer in the measuring equipment and executing the control file by utilizing measuring software in the computer to measure a workpiece. A related system is also provided.

Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.

Abstract: Methods and systems for controlling motion of and tracking a mechanically unattached magnetic probe are disclosed. One system for controlling motion of mechanically unattached magnetic probe may include a magnetic coil and pole assembly. The magnetic coil and pole assembly includes at least one pole carrier. The pole carrier includes a light transmissive substrate and a plurality of magnetic poles being patterned on the substrate for applying force to a mechanically unattached magnetic probe. A magnetic drive core provides a return path for magnetic flux flowing between the poles. A plurality of magnetic coils are wound around the magnetic drive core for conducting current and applying magnetic force to the probe through the pole pieces. A computer maintains the position of the probe within a volume defined by an optical tracking system by moving the probe and the system under test.

Abstract: Methods and systems for controlling motion of and tracking a mechanically unattached magnetic probe are disclosed. One system for controlling motion of mechanically unattached magnetic probe may include a magnetic coil and pole assembly. The magnetic coil and pole assembly includes at least one pole carrier. The pole carrier includes a light transmissive substrate and a plurality of magnetic poles being patterned on the substrate for applying force to a mechanically unattached magnetic probe. A magnetic drive core provides a return path for magnetic flux flowing between the poles. A plurality of magnetic coils are wound around the magnetic drive core for conducting current and applying magnetic force to the probe through the pole pieces. A computer maintains the position of the probe within a volume defined by an optical tracking system by moving the probe and the system under test.

Abstract: A computer-implemented method of generating an inspection program for a computer-controlled coordinate measuring probe comprises the steps of: (a) receiving nominal geometry data for a component, (b) receiving inspection requirement data specifying one or more selected shape characteristics of the component, (c) determining from the nominal geometry data and the inspection requirement data an inspection path for a computer-controlled coordinate measuring probe, the inspection path enabling the measuring probe to measure actual component coordinates associated with the selected shape characteristics, and (d) generating an inspection program for moving the computer-controlled coordinate measuring probe along the inspection path.

Abstract: A method of extracting the shape of a probe tip of a probe-based instrument from data obtained by the instrument is provided. The method employs algorithms based on the principle that no reconstructed image points can physically occupy the same region as the tip during imaging. Sequential translates of the tip shape or volume sweep out an area or volume that is an “exclusion zone” similar to morphological erosion. The embodiments of the alternative method use either the region defined by the tip boundary or simply the tip boundary.

Abstract: A digital measuring head in a measuring apparatus measures a work by making a contact element abut to the work. The digital measuring head includes an arm supported rotatably around a support point arranged on a base; a finger having the contact element at a tip end and mounted to a tip end portion of the arm; and a scale and a read head, one of which is provided at a rear end portion of the arm and the other of which is arranged on the base. Displacement of the contact element which contacts with the work is measured with the scale and the read head. Thereby, the measuring head can perform measurement in a wide range and becomes excellent in the actuation property and the temperature property, and masters for calibration of an indicated dimension are only used at an initial adjustment time.

Abstract: Systems and methods that improve process control in semiconductor manufacturing are disclosed. According to an aspect of the invention, conditions in a cluster tool environment and/or a wafer therein can be monitored in-situ via, for example, a scatterometry system, to determine whether parameters associated with wafer production are within control limits. A cluster tool environment can include, for example, a lithography track, a stepper, a plasma etcher, a cleaning tool, a chemical bath, etc. If an out-of-control condition is detected, either associated with a tool in the cluster tool environment or with the wafer itself, compensatory measures can be taken to correct the out-of-control condition. The invention can further employ feedback/feed-forward loop(s) to facilitate compensatory action in order to improve process control.

Abstract: A measurement support apparatus comprises a shape definition data input section, a contour shape generator, a measurement part program input section, an analyzer, a synthesizer, and a display unit. The shape definition data input section is used for entering shape definition data for an object to be measured. The contour shape generates a contour shape based on the shape definition data. The measurement part program input section is used for entering a measurement part program. The analyzer analyzes the measurement part program and outputs the analysis results. The synthesizer synthesizes the analysis results with the contour shape. The display unit displays the synthesis image.

Abstract: Plug and socket devices for measuring and diagnostic purposes are known in the art. The substantial disadvantage of said plug and socket devices is that they only furnish mechanical and electrical connections. For diagnostic purposes, an additional socket for connecting the corresponding diagnostic device must therefore be provided. According to the invention, in order to provide for automatic diagnosis when the plug and socket device is connected, the latter has insulation piercing connectors, screw terminals or spring terminals for connecting at least one cable. A printed circuit board, on which a diagnostic and evaluation circuit is located is provided in the housing of the plug and socket device, at least one switchable terminating resistor is provided and the plug and socket device has a display device that is connected to the diagnostic and evaluation circuit for automatic continuous display of evaluation results.

Abstract: A digitizing system and rotary table for determining the three dimensional geometry of an object is described. An apparatus includes at least one sensor that detects information describing the three-dimensional geometry of the object and provides the information to a host computer. A rotary table includes a base and a turntable rotatable about an axis positioned perpendicularly to the turntable surface. The turntable and object on its surface rotate about the axis, during or between the sensor detecting the information describing the three-dimensional geometry of the object. A turntable sensor coupled to the base measures the rotation of the turntable, where the turntable sensor outputs turntable data indicative of the rotation to the host computer.

Abstract: A surface scan measuring instrument is provided with: a scanning probe (2) that has a probe sensor (24) for detecting a relative position of a measurement point and a workpiece and scans a workpiece surface; a drive mechanism (12) for moving the scanning probe (2); a joystick (32) for inputting an instruction of a direction and a size with a manual operation; a moving vector commander (43) that generates a moving vector having the direction and the size instructed by the joystick (32); an retraction vector commander (51) that automatically generates a retraction vector for commanding a movement in a retraction direction based on a value detected by the probe sensor (24); a scanning vector commander (44) that generates a scanning vector by combining the moving vector and the retraction vector; and a drive control circuit (45) for controlling a drive of the drive mechanism (12) according to the scanning vector.

Abstract: A method for analyzing waviness of a surface. The method includes measuring a height of the surface, producing a set of data points indicative of a waviness profile, selecting a subset of the set of data points, calculating a waviness height of the subset, repeating the selecting, determining, and calculating steps for additional subsets until all members of the set of data points have been selected, and selecting a maximum waviness height value from the waviness heights calculated for each subset. The height of the surface may be measured over a distance longer than the length over which waviness assessment is required.

Abstract: Systems and methods for measuring a contour match between adjacent components are disclosed. In one embodiment, at least two pressure sensors are located between adjacent components. Each pressure sensor is adapted to obtain a pressure measurement at a location a predetermined distance away from the other pressure sensors, and to output a pressure measurement for each sensor location. An output device is adapted to receive the pressure measurements from at least two pressure sensors and display the pressure measurements. In one aspect, the pressure sensors include flexible thin film pressure sensors. In accordance with other aspects of the invention, a method is provided for measuring a contour match between two interfacing components including measuring at least one pressure applied to at least one sensor between the interfacing components.

Abstract: A method and system for measuring thread products and determining product conformance to predefined specifications are provided. The measuring system includes a measuring device electrically coupled to a computer-based component. The measuring device senses width information of a thread product and senses rotational and length information relative to the sensed width information. The computer-based component receives the sensed information, compares the sensed information to previously-defined quality specification information for the product, and determines if the product is within an uncertainty limit of the specification information based on the comparison.

Abstract: A system for preventing tampering with recorded accumulated running distance data is provided which comprises a first memory, a tampering prevention control unit, and a third memory. The tampering prevention control unit is configured to output an error message if the vehicle serial number data stored in the second memory unit is not equal to the vehicle serial number data stored in the first memory unit and in the third memory unit. The tampering prevention control unit is configured to determine whether the accumulated running distance data stored in the second memory unit is equal to the accumulated running distance data stored in the first memory unit, and if not, the tampering prevention control unit stores the accumulated running distance data stored in the second memory unit to the first memory unit.

Abstract: The present invention relates to a method for measuring the shape of a foot by means of comparing the shape of the foot with the shape of the reference foot. This is done by fitting a reference shoe to the foot, locating the area wherein the foot and the reference shoe do not coincide, selecting appropriate filler units for the located area and attaching the filler unit to a corresponding area of a shoe last and reforming the shape of the reference shoe by fitting the reference shoe to the shoe last. This is repeated until the reference shoe and the foot fit together.

Abstract: A motion capture system includes a motion capture detecting device with sensor coils that are sequentially selected by a control section. Signals are communicated between respective input coils of input elements of an input device and the sensor coils by electromagnetic coupling. The signals received by each of the selected coils are detected by a detecting section. Three-dimensional coordinates and directions of each of the input elements are calculated by a control section so that the input elements become continuous, based on the detected signals by the detecting section.

Abstract: A method and a system is for evaluating the transmitted signals of a probe system, which has a probe element that is deflectable out of a rest position and which generates transmitted signals, which include a switch-on signal during a deflection of the probe element out of its rest position and which, together with interference signals, are transmitted to a receiving unit, in which the received signals made up of the transmitted signals and the interference signals, are compared to a reference signal. In this context, the reference signal is formed by interlinking information signals generated from the received signals, and the interference signals, and/or the received signals are differentiated by time, prior to the comparison with the reference signal.

Abstract: An apparatus and method of measuring an article is provided. The method includes providing an article having a feature to be measured, the article having a surface; measuring the surface of the article with a measuring instrument to obtain article surface data; and analyzing the article surface feature data such that data on the feature to be measured is developed. Measuring the surface of the article can include scanning the measuring instrument over the article surface. Analyzing the article surface feature data can include associating portions of the article surface data with individual features thereby producing associated feature surface data; and analyzing the associated feature surface data. The measuring instrument can be, for example, a contact measuring instrument or an interference measuring instrument. A computer storage medium having instructions stored therein for causing a computer to perform the method described above is also provided.

Abstract: A lapping plate topography system includes a measuring apparatus for measuring the surface of a lapping plate, and an analysis apparatus for analyzing and presenting the data resulting from such measurements. The measurement apparatus has a non-contacting capacitive probe for measuring a height of the surface of the lapping plate, a rotary arm assembly for moving the probe in an arc over the surface of the lapping plate, and a spindle assembly for rotating the lapping plate about its center. The computer-based analysis apparatus is operable to input from the measurement apparatus the measured height at a plurality of data points on the surface of the lapping plate, calculate Fourier transform harmonic coefficients based on the plurality of measured heights, calculate surface ripple coefficients based on the calculated Fourier transform harmonic coefficients, and output the calculated surface ripple coefficients to an appropriate display device.

Abstract: A monitoring system such as a septic tank monitoring system for distinguishing between and identifying the location of a sedimentary layer, a scum layer, and any intervening liquid zone in a septic tank with an elongate sensing probe for being disposed in the septic tank, a plurality of sensors disposed along the sensing probe, and a remote monitor operably associated with the plurality of sensors, such as thermistors, for providing a remote indication to a septic tank operator of the location of the sedimentary layer, the scum layer, and any intervening liquid zone in the septic tank based on the signals from the plurality of sensors so that a septic tank operator can monitor the contents and condition of the septic tank without a need for excavating and physically inspecting the septic tank.

Abstract: A method for verifying the accuracy of a CNC machine or a CMM. The methodology segregates the measured error into an assignable cause portion and a common cause (or random error) portion. The methodology may be employed to affect the calibration of the machine tool to factor out the mean value of the assignable cause portion. Inherent in this methodology is the ability to diagnose mechanical problems with the CNC machine or CMM that affects the repeatability and accuracy of such machine tools; identify degradation in the performance of such machine tools that is indicative of mechanical failure; and improve the accuracy and repeatability of such machine tools in certain situations.

Abstract: A surface scan measuring instrument is provided with: a scanning probe (2) that has a probe sensor (24) for detecting a relative position of a measurement point and a workpiece and scans a workpiece surface; a drive mechanism (12) for moving the scanning probe (2); a joystick (32) for inputting an instruction of a direction and a size with a manual operation; a moving vector commander (43) that generates a moving vector having the direction and the size instructed by the joystick (32); an retraction vector commander (51) that automatically generates a retraction vector for commanding a movement in a retraction direction based on a value detected by the probe sensor (24); a scanning vector commander (44) that generates a scanning vector by combining the moving vector and the retraction vector; and a drive control circuit (45) for controlling a drive of the drive mechanism (12) according to the scanning vector.

Abstract: An improved method is provided for performing nanomanipulations using an atomic force microscope. The method includes: performing a nanomanipulation operation on a sample surface using an atomic force microscope; determining force data for forces that are being applied to the tip of the cantilever during the nanomanipulation operation, where the force data is derived along at least two perpendicularly arranged axis; and updating a model which represents the topography of the sample surface using the force data.

Abstract: A method of measuring an artefact 5 using a machine 2 on which a measuring probe 6 is mounted. The probe is brought into contact with the artefact and movement continued for a limited distance to deflect the stylus 7. The machine and probe outputs are recorded whilst the probe is free and when the stylus is deflected. A model of the probe and CMM outputs during both contact and non-contact between the probe and artefact is fitted to the data to allow the contact position when the stylus contacts the artefact with zero force to be determined. The probe outputs may be fitted to the model individually to determine a single contact position. By using data during movement of the probe towards and away from the artefact, errors due to time delays may be corrected.

Abstract: A method of extracting the shape of a probe tip of a probe-based instrument from data obtained by the instrument is provided. The method generates an image using the data wherein the data is indicative of a characteristic of a surface of a sample. The method then calculates a slope of the image at a particular region and determines, using the slope, a probe contact point between the tip and the sample at that region. In addition, the method further includes the steps of translating the image point based on the probe contact point and repeating the above steps for at least two points in the image data so as to generate a corrected image plot.

Abstract: The number and weight of wires interconnecting a host and/or controller with a precision measurement assembly is reduced using a common or shared bus. The bus may be entirely electrical or may include optical fibers to reduce EMI susceptibillty. A custom bus or a known serial network bus such as CAN or SIRCOS may be used.

Abstract: A method and apparatus for measuring three-dimensional (3-D) coordinates. A 3-D object can be digitized into a mesh representation manipulable by a computer system by tracing a stylus of a probe apparatus over surfaces of the object. The probe apparatus includes an arm having a series of linkages and joints. The arm can be assembled by placing the joints of the arm in joint fixtures a desired distance and angle apart and bonding the joints to a linkage. The probe apparatus is calibrated by placing the tip of the stylus at an arbitrary point in a work volume and varying the stylus' orientation to find error values and determine calibration parameters. The sensors of the probe apparatus are zeroed by placing the probe apparatus in the only possible home position and assigning assumed starting angles to the sensors. A rotary table can be used to support the object being digitized, where the rotation of the rotary table and object during digitization is sensed and included in coordinate calculations.

Abstract: The applied method is implemented in AFM[-microscopy] to get space distributions of surface properties and layers, placed on it. This method includes successive reading in predetermined points of the surface under control of force curve and subsequent constructions of images of appropriate distributions of parameters extracted from these force curves. The peculiarity of the method is that reading of force curve is carried out by noting of values of cantilever's deviation force and/or coordinate of its fixed end and/or derivatives from cantilever's deviation force of coordinate of its fixed end at least in points of control of force curve.

Abstract: A pipeline surveying system including a pipeline pig can accurately provide a pipeline profile after correlation with a previously determined GPS survey. An inertial measurement unit located in the pig determines a pipeline profile as it travels through the pipeline and correlates the measured profile with the GPS survey.

Abstract: A stylus having a curvature radius of 1 mm or less is attached to the extremity of a probe. When the profile of an object is measured with high precision by causing the stylus to follow a measurement surface of the object, a reference ball for calibration is first measured, thereby surface profiling the object. From the measurement data, a contact position where the stylus contacts with the object is determined. A positional error caused by a curvature radius of the stylus is corrected by using an angle of inclination of the measurement surface in that contact position. The amount of profile error in the contact position is extracted by using the profile error data pertaining to the stylus determined by measurement of the reference ball. The amount of profile error is added to the measurement data, thereby correcting the profile error caused by the curvature radius of the stylus.

Abstract: A method of routing a probe of a digitizing system on the surface of a model object for the purpose of copying that model object as a part are disclosed. When a tolerance number is given, model surface data can be collected so that the geometrical difference between the model and the part is within the given tolerance for all touchable points on the model surface.