Abstract: The disclosure describes techniques for detecting network measurement inaccuracies through the detection of sender delays or packet drops. For example, a sender device of a test packet may determine whether the sender device is experiencing any issues in sending the test packet to a receiver device and notify a controller of the issues such that the controller may generate an indication that one or more Key Performance Indicator (KPI) measurements based on the test packets from the sender device are inaccurate and/or untrustworthy, remove the inaccurate KPI measurements, and/or adjust the inaccurate KPI measurements.

Abstract: An apparatus comprises a plurality of redundant processing units to perform data processing redundantly in lockstep; common mode fault detection circuitry to detect an event indicative of a potential common mode fault affecting each of the plurality of redundant processing units; a memory shared between the plurality of redundant processing units; and memory checking circuitry to perform a memory scanning operation to scan at least part of the memory for errors; in which the memory checking circuitry performs the memory scanning operation in response to a common mode fault signal generated by the common mode fault detection circuitry indicating that the event indicative of a potential common mode fault has been detected.

Abstract: The disclosure describes techniques for detecting network measurement inaccuracies through the detection of sender delays or packet drops. For example, a sender device of a test packet may determine whether the sender device is experiencing any issues in sending the test packet to a receiver device and notify a controller of the issues such that the controller may generate an indication that one or more Key Performance Indicator (KPI) measurements based on the test packets from the sender device are inaccurate and/or untrustworthy, remove the inaccurate KPI measurements, and/or adjust the inaccurate KPI measurements.

Abstract: A method for generating and using a statistical mix of network traffic to test a network device is provided. The method includes steps performed in a network equipment test device. The steps include generating test packets to be transmitted to a device under test. The steps further include using a random number generator to generate first values that statistically vary according to a first probability density function (PDF). The steps further include precalculating and storing in memory, a plurality of second values that statistically vary according to a second probability density function different from the first probability density function. The method further includes using the first values to access the memory and select from the second values. The steps further include using the selected second values to statistically vary an aspect of the test packets. The steps further include transmitting the test packets to the device under test.

Abstract: System and method are disclosed to detect potential failures in a network-on-chip (NoC) before the potential failures happen. The system tests connectivity from a master to all slaves by sending scrub transactions to test all paths. The scrub transactions are identified using a scrub bit. The scrub transactions are generated at a master scrubbing block/unit and terminated at a slave scrubbing block/unit. The slave scrubbing block sends scrub responses to the scrub transactions along the response path. The scrub responses to the scrub transactions are generated at the slave scrubbing block and terminated at the master scrubbing block. This allows detection of potential failures, which are reported to a system monitor. If a potential failure is detected, the system transitions to a fail-safe mode before the failure occurs.

Abstract: A method of operating a semiconductor memory device can include receiving data, from a memory controller, at an Error Correction Code (ECC) engine included in the semiconductor memory device, the data including at least one predetermined error. Predetermined parity can be received at the ECC engine, where the predetermined parity is configured to correspond to the data without the at least one predetermined error. A determination can be made whether a number of errors in the data is correctable by the ECC engine using the data including the at least one predetermined error and the predetermined parity.

Abstract: A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.

Abstract: A circuit-cycle fault reproduction system includes a hardware processor configured to execute at least one computing cycle corresponding to a given number instructions. A cycle tracking unit is configured to identify at least one test cycle included in a range of computing cycles starting from at a start cycle and completing at an end cycle. A fail cycle detection unit is in signal communication with the cycle tracking unit. The fail cycle detection unit is configured to identify a failed cycle among the plurality of test cycles based on a cycle difference between the starting cycle and the ending cycle, and to actively modify the range of computing cycles based on a comparison between the cycle difference and a cycle difference threshold value.

Abstract: Error detection circuitry is configured to receive raw read data from a memory, perform error detection in accordance with a single-bit error correction and double-bit error detection (SECDEC) error-correction code (ECC) on the raw read data, and provide a single bit correction indicator in response to performing the SECDEC ECC on the raw read data. Error correction circuitry is configured to provide corrected read data corresponding to the raw read data based at least on the single bit correction indicator. ECC checking circuitry is configured to generate a wrong operation indicator based at least on a parity of the raw read data, a parity of the corrected read data, and the single bit correction indicator, wherein the ECC checking circuitry is configured to assert the wrong operation indicator when at least one of the error detection circuitry or the error correction circuitry is not operating correctly.

Abstract: An electronic device includes a syndrome decoder, an error insertion control circuit, and a failure detection circuit. The syndrome decoder generates an error insertion code from a write syndrome generated based on a write pulse. The error insertion control circuit inserts an error into an internal codeword according to the error insertion code based on a read pulse. The failure detection circuit compares the write syndrome with a read syndrome generated from the internal codeword to generate a failure detection signal.

Abstract: A network interface device, said network interface device has a data transmission path configured to receive data for transmission. The data for transmission is to be sent over a network by the network interface device. A monitor is configured to monitor the data transmission path to determine if an underrun condition is associated with the data transmission path. If so, an indication is included in the transmitted data packet.

Abstract: According to one method for debugging test traffic generation, the method occurs at a test system implemented using at least one processor and at least one memory. The method includes generating test traffic, wherein generating the test traffic includes receiving routing information from a system under test (SUT) via at least one routing protocol, determining traffic header data using the routing information, and storing resolution processing path information indicating how the traffic header data was determined; and displaying, using a display, test traffic data, wherein displaying the test traffic data includes displaying at least some of the resolution processing path information for at least some of the traffic header data.

Abstract: To provide a microcontroller that suppresses increase of power consumption during debugging, a microcontroller according to the present invention includes a first signal processing circuit, a second signal processing circuit that performs signal processing in the same manner as the first signal processing circuit, a comparing circuit that compares a processing result of the first signal processing circuit and a processing result of the second signal processing circuit with each other, and outputs an error signal when an error is detected, a suppressing signal input unit that receives a suppressing signal for suppressing an operation of the second signal processing circuit and an operation of the comparing circuit, a suppressing circuit that receives the suppressing signal from the suppressing signal input unit and suppresses the operation of the second signal processing circuit and the operation of the comparing circuit, and a pseudo error signal output circuit that outputs a pseudo error signal in place of t

Abstract: Apparatus comprises memory circuitry having a plurality of addressable memory entries storing respective data items and associated error protection codes; memory error protection circuitry to generate the error protection code for a data item stored to the memory circuitry, the error protection code for a given data item stored to the memory circuitry depending upon at least the given data item and a memory address defining a memory entry to which the given data item is stored, and to perform a check operation to check for consistency between a retrieved data item, the memory address defining a memory entry from which the given data item is retrieved and the error protection code associated with the retrieved data item; memory built-in self-test circuitry to test the memory and memory error protection circuitry; and access circuitry to provide an indirect access path between the memory built-in self-test circuitry a memory which accesses the memory circuitry via the memory error protection circuitry and a dir

Abstract: A TTCN-based test system for testing test-cases is provided. The test system includes a test executable which includes a compiled TTCN code. A simulated device under test (DUT) includes a pre-recorded log-file which describes at least partially the behavior of the simulated DUT. A test runtime interface is provided between the test executable and the simulated DUT. A test computer (PC) is configured to perform the testing by executing the compiled TTCN code and by exchanging via the test runtime interface protocol messages with the simulated DUT during the execution of the compiled TTCN code. A TTCN-based test method for testing test-cases and a non-transitory computer-readable recording medium is also provided.

Abstract: A method of operating a semiconductor memory device can include receiving data, from a memory controller, at an Error Correction Code (ECC) engine included in the semiconductor memory device, the data including at least one predetermined error. Predetermined parity can be received at the ECC engine, where the predetermined parity is configured to correspond to the data without the at least one predetermined error. A determination can be made whether a number of errors in the data is correctable by the ECC engine using the data including the at least one predetermined error and the predetermined parity.

Abstract: A sine to square wave converter circuit receives a sine wave signal and supplies a first square wave signal having a first frequency. A 2× clock multiplier circuit multiplies the first square wave signal and supplies a second square wave signal with a second frequency that is twice the first frequency. A first storage element that is clocked by the second square wave signal stores a delayed version of the first square wave signal and supplies an even-odd signal. A second storage element that is clocked by the second square wave signal receives the even-odd signal and supplies an odd-even signal. A duty cycle correction circuit adjusts the threshold of the sine to square wave converter based on a difference in duty pulse widths between the even-odd signal and the odd-even signal.

Abstract: Systems and methods disclosed herein provide for improved testing of memory error correction code (“ECC”) logic with memory built-in self-test (“MBIST”). Embodiments provide for a masking element to inject one or more faults into the ECC logic during at least one of a manufacturing test (“MFGT”) and a power-on-self-test (“POST”), wherein, based on the injected faults, it can be determined if the ECC logic contains any errors.

Abstract: A semiconductor device includes a read data generation circuit and a syndrome generation circuit. The read data generation circuit generates first read data from first output data and a first output parity which are generated during a first read operation. In addition, the read data generation circuit generates second read data from second output data and a second output parity which are generated during a second read operation. The syndrome generation circuit generates a syndrome signal from the first read data and the second read data. The syndrome generation circuit generates the syndrome signal so that column vectors of a first half matrix corresponding to the first read data are symmetric to column vectors of a second half matrix corresponding to the second read data.

Abstract: Techniques and systems for beacon triggered code redemption are disclosed. Such a technique can include causing a mobile device to listen for beacon messages broadcast by a beacon device over a short-range communication link; receiving a beacon message from the beacon device; and exchanging information with a content provider to retrieve a redemption code associated with the beacon message. A beacon message can include a beacon identifier and an activity parameter specifying a code redemption action. The beacon identifier can be associated with an event that will occur, is occurring, or has occurred in the vicinity of the beacon device. The technique can further include displaying on a screen of the mobile device, a notification in regard to redeeming the redemption code configured for redeeming content associated with the event.

Abstract: A method and system for improving an operation of an automated IT system is provided. The method includes identifying pre-tested software applications associated with requirements of processes executed by a hardware device with respect to an IT system. A list of available software applications associated with required features is generated and each feature is defined such that the currently available software applications are configured to provide and execute the required features. Evaluation code is executed and a resulting a list of validated software applications is generated. A list of short listed software applications and identification software code enabling an automated encoder learning process are generated. A software operational solution is identified and modification code is generated and executed resulting in improved operation of the validated software applications and the hardware device.

Abstract: Data memory protection is provided for a signal processing system such as a radar system in which the data memory is protected with a common set of parity bits rather than requiring a set of parity bits for each memory word as in Error Correction Coded (ECC) memories. The common set of parity bits may be updated as memory words in the data memory are accessed as part of signal processing of one or more digital signals. The memory protection ensures that in the absence of memory errors the common parity bits are zero at the end of processing the digital signals as long as each word in the data memory that is used for storing the signal processing data is written and read an equal number of times.

Abstract: Error correction code (ECC) hardware includes write generation (Gen) ECC logic and a check ECC block coupled to an ECC output of a memory circuit with read Gen ECC logic coupled to an XOR circuit that outputs a syndrome signal to a syndrome decode block coupled to a single bit error correction block. A first MUX receives the write data is in series with an input to the write Gen ECC logic or a second MUX receives the read data from the memory circuit in series with an input of the read Gen ECC logic A cross-coupling connector couples the read data from the memory circuit to a second input of the first MUX or for coupling the write data to a second input of the second MUX. An ECC bit comparator compares an output of the write Gen ECC logic to the read Gen ECC logic output.

Abstract: A memory device is configured to provide internal or on-die ECC (error checking and correction or error correction coding). In such a system, the code matrix can be managed as four quadrants of (N/4) bits, with two adjacent quadrants in an (N/2)-bit segment or portion. The N codes of the matrix correspond to the N bits of a data word to be protected by the ECC. The code matrix includes M codes corresponding to the M ECC check bits. The memory device includes internal ECC circuitry to perform ECC in the DRAM device with the ECC bits and code matrix in response to a request to access the data word. The codes in a quadrant steer an aliased bit to a quadrant other than an adjacent quadrant.

Abstract: A solid state comprising: memory cells programmable with threshold voltages, each one associated with a respective bit pattern and variable over the memory cells thereby defining a respective threshold voltage distribution. Each pair of adjacent bit patterns can be discriminated by a respective first reference voltage between the threshold voltages associated with the pair of adjacent bit patterns, and a controller for storing LLR tables; for each bit pattern combination comprising first, second and third bit patterns respectively associated with the first reference voltage, a second reference voltage higher than the first reference voltage, and a third reference voltage lower than the first reference voltage, each LLR table has an error information when that bit pattern combination is associated with respective threshold voltages that, based on the threshold voltage distributions, are inconsistent with each other, or a LLR value otherwise.

Abstract: A microcontroller includes a data memory configured to store test signal data. The microcontroller further includes a signal generator configured to process the test signal data in order to provide at least one test signal. The microcontroller also includes a circuit under test configured to process the test signal. The test signal data includes at least one pattern snippet and an associated pattern descriptor. The pattern snippet includes data concerning a content of a part of the test signal. The associated pattern descriptor includes data concerning a pattern formed by the pattern snippet within the test signal.

Abstract: An example method of reproducing a test case in a continuous integration environment includes detecting a test failure in a continuous integration environment. The continuous integration environment includes a plurality of stages for running a test on an application. The method also includes in response to detecting the failure, generating a snapshot while the test is running. The snapshot specifies a stage of the plurality of stages and a state of the application at which the failure occurred. The method further includes uploading the snapshot to a repository. At a later point in time, the snapshot may be restored to a computing device.

Abstract: Techniques facilitating determination and correction of physical circuit event related errors of a hardware design are provided. A system can comprise a memory that stores computer executable components and a processor that executes computer executable components stored in the memory. The computer executable components can comprise a simulation component that injects a fault into a latch and a combination of logic of an emulated hardware design. The fault can be a biased fault injection that can mimic an error caused by a physical circuit event error vulnerability. The computer executable components can also comprise an observation component that determines one or more paths of the emulated hardware design that are vulnerable to physical circuit event related errors based on the biased fault injection.

Abstract: Apparatuses and methods for parity generations in error-correcting code (ECC) memory to reduce chip areas and test time in imaging system are disclosed herein. Memory tests are needed to catch hard failures and soft errors. Random and nondestructive errors are soft errors and are undesirable. Soft errors can be detected and corrected by the disclosed ECC which is based on Hamming code. Before data are written into memory, the first parity generator based on the disclosed ECC generates the first parity by calculating the data. The first parity and data are stored into the ECC memory as a composite word. When the previously stored word is fetched from the ECC memory, the second parity generator based on the disclosed ECC is used to generate the second parity. A comparison between the first and second parity leads to a disclosed error mask, which is used to correct a single bit error if the error only happens to a single bit of the fetched data.

Abstract: A memory system having an error correction codes (ECC) self-checking function is disclosed. The memory system includes: an ECC encoder, used to convert input information bits into a codeword; a memory, coupled to the ECC encoder, the memory being used to store the codeword; and an ECC decoder, coupled to the memory and the ECC encoder, the ECC decoder being used to generate a syndrome of the codeword; wherein when the memory system is operated in an on-line self-checking mode and the codeword is fed into the memory from the ECC encoder, the codeword is as well fed into the ECC decoder from the ECC encoder to generate the syndrome.

Abstract: A sensor system is configured to communicate at least partially protected sensor data over a communication interface. The sensor system includes a sensor element and a communication interface communicatively coupled to the sensor element. The sensor element is configured to provide sensor data in the digital domain. The communication interface is configured to generate a data package for transmission over the communication interface from the sensor data. The data package includes a data grouping comprising one or more nibbles related to the sensor data. The data package further includes a nibble indicia based on at least a portion of selected nibbles within the data grouping.

Abstract: Embodiments are generally directed to validation of memory on-die error correction code. An embodiment of a memory device includes one or more memory arrays for the storage of data; control logic to control operation of the memory device; and ECC (error correction code) logic, including ECC correction logic to correct data and ECC generation logic to generate ECC code bits and store the ECC bits in the one or more memory arrays. In a validation mode to validate operation of the ECC logic, the control logic is to allow generation of ECC code bits for a first test value and disable generation of ECC code bits for a second test value.

Abstract: According to one embodiment, a controller groups a plurality of memory cells in each of the pages into a plurality of groups. The plurality of groups includes a first group and a second group. In a case of reading data from a first page, The controller performs first reading. The first reading includes reading data from the first page by using a first operation parameter for the first group. The controller performs second reading. The second reading includes reading data from the first page by using a second operation parameter for the second group. The controller merges first read data and second read data, and return the merged data as read data read from the first page. The first read data is acquired by the first reading. The second read data is acquired by the second reading.

Abstract: Exemplary systems, methods and computer-accessible mediums for encrypting at least one integrated circuit (IC) can include determining, using an interference graph, at least one location for a proposed insertion of at least one gate in or at the at least one IC, and inserting the gate(s) into the IC(s) at the location(s). The interference graph can be constructed based at least in part on an effect of the location(s) on at least one further location of the IC(s).

Abstract: Hashing complexity is reduced by exploiting a hashing matrix structure that permits a corresponding hashing function to be implemented such that an output vector of bits is produced in response to an input vector of bits without combining every bit in the input vector with every bit in any row of the hashing matrix.

Abstract: The present invention relates to an apparatus for computing an error rate comprising: a first circuit interface being connected to a first sub-circuit receiving data and computing output data through a predetermined computation process; a second circuit interface and being connected to a first test circuit receiving the same data, which is inputted to the first sub-circuit, and computing output data through the predetermined computation process; an error injecting part injecting an error to the first test circuit; an error detecting part comparing output data of the first sub-circuit to output data of the first test circuit; and an error rate computing part computing input node error probability of the first sub-circuit by statistic processing of the compared result. The apparatus and method for computing error rate of the present invention is able to shorten the time required to obtain error probability, compared to the direct simulation of the full circuit.

Abstract: Methods and systems for operating a packet switch that communicates packets with error indication, including the steps of: receiving a packet comprising an error detection field; utilizing the error detection field to identify an error in the packet; marking the occurrence of the error in an error propagation field in the packet; updating the value of the error detection field; and forwarding the modified packet, with the updated value of the error detection field and the error propagation field, according to information carried in the packet.

Abstract: A system implementing an MBIST device is disclosed. The system includes an ECC-protected memory and the MBIST device for self-test of the memory. The MBIST device includes a first access port communicatively connected to the memory via a first path, the first path excluding the ECC logic associated with the embedded memory, and a second access port communicatively connected to the memory via a second path, the second path including the ECC logic associated with the memory. The device is configured to test the memory, in a first mode of operation, via the first path and, in a second mode of operation, via the second path. One advantage of such system includes re-using, with little additional die area, of MBIST logic already required for manufacturing test of the product (first mode of operation) for system or application level tests that may be carried out by customers (second mode of operation).

Abstract: A determination is made regarding whether a firewall will block a network packet. The network packet indicates a set of one or more characteristics. A test packet is generated that indicates the set of characteristics. The test packet is sent to the firewall without using a network. A test result is received from the firewall. The test result is stored.

Abstract: A data storage device includes a nonvolatile memory and a controller having a decoder. The nonvolatile memory is operatively coupled to the controller. The nonvolatile memory is configured to store a set of bits. The decoder is configured to receive the set of bits from the memory. The decoder is further configured to perform a decoding operation using the set of bits based on a parity check matrix. The parity check matrix includes a block row. The block row has a first non-zero sub-matrix and a second non-zero sub-matrix that is separated from the first non-zero sub-matrix within the block row by at least a threshold number of null sub-matrices of the block row.

Abstract: It divides the network communication protocol for the communication between automobile into a software protocol layer (L1), a signal protocol layer and a physical protocol layer wherein the software protocol layer is used for checking coding and decoding the data required to be sent and received by a system, and the signal protocol layer is used for performing combined coding of data package signals and basic light signal on data packages produced by the software protocol layer according to the protocol agreement, and the physical protocol layer is used for converting digital signals and light signals mutually. A device comprises a light receiving apparatus arranged at the head of the automobile and a light emitting device, which collects the operating status information of automobile, performs information exchange with surrounding automobiles through digital information, arranged at the tail of the automobile.

Abstract: Enrolling a device identity is disclosed. A determination is made as to whether one or more areas of a storage device has a sufficient number of faults. If an insufficient number of faults is present, additional faults are generated. Verifying a device identity is also disclosed. A fingerprint based on the presence of one or more permanent faults in a storage device is received. The received fingerprint is compared with one or more stored fingerprints to determine an identity of the device.

Abstract: The present disclosure describes a novel method and apparatus of using the JTAG TAP's TMS and TCK terminals as a general purpose serial Input/Output (I/O) bus. According to the present disclosure, the TAP's TMS terminal is used as a clock signal and the TCK terminal is used as a bidirectional data signal to allow serial communication to occur between; (1) an IC and an external controller, (2) between a first and second IC, or (3) between a first and second core circuit within an IC.

Abstract: Systems, methods, devices, circuits for data processing, and more particularly to data processing including operational marginalization capability. In one case a data processing system is disclosed that includes a loop detector circuit and a sample based noise injection circuit. The loop detector circuit applies a loop detection algorithm to a data input to yield a loop detected output, and the sample based noise injection circuit generates a noise component based at least in part on the loop detected output.

Abstract: A method, non-transitory computer readable medium, and apparatus for performing fault injection and verification on an integrated circuit are disclosed. For example, the method generates a mask file for one or more modules of a hierarchical design, wherein the mask file identifies one or more essential bits, receives a selection of one of the one or more modules as a selected module for the fault injection and the verification to be applied, performs the fault injection on at least one essential bit of the selected module based upon the mask file for the selected module, and performs the verification on the selected module.

Abstract: A system for injecting I/O faults into a closed system, for example, the injection of link level I/O faults, involves the use of a simulated computing environment. In an embodiment, the system provides for fault injection using an emulated IBM System z environment and including the use of FICON and/or other suitable communication channel protocols. The emulated System z environment may include a simulated z/OS and/or emulated System z hardware and software components.

Abstract: A method of performing a dynamic built-in self-test (BIST). The method includes performing a first test of a circuit on a semiconductor chip. The first test includes a first switch factor. The circuit during the first test is monitored with one or more sensors. A first sensor value of one or more sensors monitoring the circuit is determined. It is also determined whether the first sensor value is within a range of a programmable constant. A second switch factor is determined in response to determining that the first sensor value outside the range of the programmable constant.

Abstract: A pseudo-error generating device of an embodiment includes error injection information including a header section and a data section, a storage section configured to store the error injection information, and at least one error injecting circuit, connected to a test target circuit through a predetermined path, configured to inject a pseudo-error to the predetermined path. The header section includes a port specifying one of the at least one error injecting circuit, and an address specifying the data section. The data section includes an injection condition and error injection data for injecting the pseudo-error. The error injecting circuit injects the pseudo-error to the predetermined path based on the injection condition and the error injection data.

Abstract: The present inventions are related to systems and methods for validating retry features in LDPC decoders and in systems incorporating LDPC decoders. For example, a data processing circuit is disclosed that includes a low density parity check decoder and is operable to correct errors in a data set. The data processing circuit includes at least one retry feature operable to assist in correcting the errors that are not corrected without the at least one retry feature. A retry validation circuit in the data processing circuit is operable to inject errors in the data set to trigger the at least one retry feature.

Abstract: A storage system includes a channel detector, an LDPC decoder, and an erasure block. The channel detector is configured to receive data corresponding to data read from a storage and output an LLR signal. The LDPC decoder is configured to receive the LLR signal and output a feedback signal to the channel detector. The erasure block is configured to erase at a portion of at least one of the LLR signal and the feedback signal. A method for testing includes generating an error rate function corresponding to an erasure pattern. The function is a function of a number of LDPC iterations. The method includes determining testing parameters at least in part based on the error rate function, wherein the testing parameters comprise a testing number of LDPC iterations, a passing error rate, and the erasure pattern. The method includes testing storage devices using the testing parameters.