Pulse Or Data Error Handling Patents (Class 714/699)
- Programmable logic array (PLA) testing (Class 714/725)
- Scan path testing (e.g., level sensitive scan design (LSSD)) (Class 714/726)
- Signature analysis (Class 714/732)
- Built-in testing circuit (BILBO) (Class 714/733)
- Structural (in-circuit test) (Class 714/734)
- Device response compared to input pattern (Class 714/735)
- Device response compared to expected fault-free response (Class 714/736)
- Device response compared to fault dictionary/truth table (Class 714/737)
- Including test pattern generator (Class 714/738)
- Determination of marginal operation limits (Class 714/745)