Abstract: A dictionary-based scan chain fault detector includes a dictionary with fault signatures computed for scan cells in the scan chain. Entries in the fault dictionary are compared with failures in the failure log to identify a faulty scan cell. In one embodiment a single fault in a scan chain is identified. In another embodiment, a last fault and a first fault in a scan chain are identified.

Abstract: A vehicle has at least one movement system which can influence the movement of the vehicle and which can operate in a normal mode or in at least one emergency mode. An availability coordinator is coupled to each movement system. A control system controls an autonomous driving process. The availability coordinator is coupled to the control system and is designed such that said coordinator monitors the availability of each movement system. The availability coordinator specifies whether each movement system is to operate in the normal mode or in one of the emergency modes dependent on at least one of the availabilities; and activates or deactivates the control system dependent on at least one of the availabilities.

Abstract: A loading apparatus for loading a printed circuit board (PCB) stack including one or more PCB layers and transferring the PCB stack to an inspection probe includes a movable support unit, a guide unit and a cover. The guide unit is provided on the support unit and defines a depression portion in which the PCB stack is mounted. The cover is configured to cover the depression portion of the guide unit when closed, where the cover has multiple protrusions extending from a lower surface, which press the PCB stack into the depression portion when the cover is closed.

Abstract: System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent clock data patterns are driven on one or more of remaining data paths of the plurality of data paths, wherein the coherent clock data patterns are in coherence with a low speed base clock. The first high speed data path is sampled by the coherent clock data patterns to generate a sampled first high speed data path, which is then tested at a speed of the low speed base clock.

Abstract: A method and circuits for implementing multiple input signature register (MISR) compression for test time reduction, and a design structure on which the subject circuits reside are provided. The MISR compression circuit includes a first MISR, a second MISR provided with the first MISR, and a compressor to compress MISR data positioned in one of between the first MISR and second MISR and after the second MISR.

Abstract: A system and a method for diagnosis flow for a read-only memory (ROM) includes determining whether a window of the ROM is faulty, based on a pre-computed signature and a computed signature corresponding to the window. Based on the determination, the size of the window is reduced to form at least two reduced windows. It is further ascertained whether the at least two reduced windows are faulty based on pre-computed signatures corresponding to the at least two reduced windows and computed signatures corresponding to the at least two reduced windows.

Abstract: The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.

Abstract: Systems and methods gather data for debugging a circuit-under-test. The system includes a trigger-and-capture circuit, a data compressor, a direct memory access controller, and a memory controller. The trigger-and-capture circuit is coupled to the circuit-under-test for receiving signals from the circuit-under-test. The trigger-and-capture circuit is configured to assert a trigger signal when the signals match a trigger condition. The data compressor is configured to loss-lessly compress the signals into compressed data. The direct memory access controller is configured to generate write and read requests. The write requests write the compressed data to a memory integrated circuit die, and the read requests read the compressed data from the memory integrated circuit die. The memory controller is configured to perform the write and read requests.

Abstract: A system for providing a test result from an integrated circuit to a status analyzer. A deserializer is configured to deserialize, into data frames, messages received from the integrated circuit. The messages include the test result and are received from the integrated circuit in a serial data format. A frame sync module is configured to synchronize the data frames, output the synchronized data frames, and generate a clock signal. A gateway module is configured to receive the synchronized data frames from the frame sync module in accordance with the clock signal, convert signal levels and signal timings associated with the synchronized data frames from a first format used by the frame sync module to a second format used by the status analyzer, and provide the synchronized data frames to the status analyzer in accordance with the signal levels and the signal timings in the second format used by the status analyzer.

Abstract: A semiconductor memory apparatus includes a test circuit configured to receive a plurality of sequentially-changing test input patterns, compress the received test input patterns at each clock signal, and output the compressed patterns as variable test data.

Abstract: A test pattern is sequentially selected from an original test pattern sequence constituted by a plurality of test patterns including a don't care bit. Power consumption in each of regions obtained by substantially equally dividing a layout region of a semiconductor integrated circuit in a case where a don't care value is specified in the selected test pattern and this selected test pattern is applied to the semiconductor integrated circuit is estimated. A searching is conducted for a don't care value of the selected test pattern which minimizes a variation in power consumption among the regions by repeatedly changing the don't care value and repeatedly estimating power consumption in the regions. A new test pattern sequence constituted by a plurality of test patterns including no don't care bit is generated by defining the don't care value obtained by the searching as a don't care value of the selected test pattern.

Abstract: Roughly described, a scan-based test architecture is optimized in dependence upon the circuit design under consideration. In one embodiment, a plurality of candidate test designs are developed. For each, a plurality of test vectors are generated in dependence upon the circuit design and the candidate test design, preferably using the same ATPG algorithm that will be used downstream to generate the final test vectors for the production integrated circuit device. A test protocol quality measure such as fault coverage is determined for each of the candidate test designs, and one of the candidate test designs is selected for implementation in an integrated circuit device in dependence upon a comparison of such test protocol quality measures. Preferably, only a sampling of the full set of test vectors that ATPG could generate, is used to determine the number of potential faults that would be found by each particular candidate test design.

Abstract: Disclosed herein are exemplary embodiments of a so-called “X-press” test response compactor. Certain embodiments of the disclosed compactor comprise an overdrive section and scan chain selection logic. Certain embodiments of the disclosed technology offer compaction ratios on the order of 1000×. Exemplary embodiments of the disclosed compactor can maintain about the same coverage and about the same diagnostic resolution as that of conventional scan-based test scenarios. Some embodiments of a scan chain selection scheme can significantly reduce or entirely eliminate unknown states occurring in test responses that enter the compactor. Also disclosed herein are embodiments of on-chip comparator circuits and methods for generating control circuitry for masking selection circuits.

Abstract: Methods and apparatuses are described for decompressing and routing test data. Some embodiments feature an integrated circuit (IC) that includes two or more shift registers configured to shift in the test data. Each of the two or more shift registers can include two or more sequential elements configured such that a scan chain in the set of scan chains receives inputs from at most one sequential element in each of the two or more shift registers. At least one shift register in the two or more shift registers can be configured as a circular shift register. The IC can also include a logic network coupled between the two or more shift registers and the set of scan chains such that the set of scan chains receives the decompressed test data from the two or more shift registers via the logic network.

Abstract: A method, system and product for explaining illegal combinations in combinatorial models. The method comprising obtaining a combinatorial model and an illegal combination that is excluded from the model by one or more restrictions, utilizing a Satisfiability solver on a satisfiability formula that encodes the legal test space and that assigns values to attributes as defined by the illegal combination, whereby the satisfiability solver provides an indication of unsatisfiability of the satisfiability formula and an UNSAT core comprising a subset of clauses defined by the satisfiability formula which are unsatisfiable; and identifying the one or more restrictions by mapping the clauses of the UNSAT core with clauses encoding the set of restrictions.

Abstract: In an illustrative embodiment, an apparatus, computer-readable media, or method may be configured to suggest determine relationships. Interaction with a block diagram model may include receiving a first portion of a block diagram model. The block diagram model may include a plurality of blocks. Each of the plurality of blocks may represent a set of dynamic equations. The interacting may be performed using the computer. Relationships between a plurality of a synthesized input, a synthesized output, a synthesized state, or a synthesized derivative, may be determined. A determination may be performed for the first portion of the block diagram model. The determining may include determining a block Jacobian pattern of relationships between two or more of an input, an output, a state, or a derivative of a first block of the plurality of blocks in the graphical model.

Abstract: A storage apparatus for controlling a storage unit includes a cache memory for temporarily storing data to be stored in the storage unit, and a processor for executing a process including receiving unit data which is divided from data to be migrated, calculating first checksum data from the received unit data, storing the unit data and the first checksum data to the cache memory, reading out the stored unit data and the first checksum data from the cache memory, calculating second checksum data from the read out unit data, storing the unit data to the storage unit, and determining whether data migration has been performed properly by comparing the first checksum data to the second checksum data.

Abstract: Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pieces of setting data designating one or more output terminals among the plurality of output terminals; a detecting section that detects whether a value of an output signal from an output terminal designated by one of the pieces of setting data matches an expected value; and a selecting section that selects different pieces of setting data in the storage section when at least two detection commands, which change execution sequencing of the test command sequence according to the detection results of the detecting section, are executed, and supplies the selected pieces of setting data to the detecting section.

Abstract: A data access request is received specifying a data block stored in a stripe of a parity group that includes a plurality of data storage devices to store data blocks and a parity storage device to store parity information for the data. The stripe includes a data block from each of the plurality of data storage devices and the stripe includes a parity block from the parity storage device. An error is detected in the data block specified by the data access request. The error is identified as a lost write error for the data block or a lost write error for the parity block. Identifying the error includes comparing a first storage device signature stored in a metadata field associated with the data block to a second storage device signature stored in a label block identifying a data storage device where the data block is stored.

Abstract: A device for testing a circuit includes a syndrome determiner, a test sequence provider and an evaluation circuit. The syndrome determiner determines an error syndrome bit sequence (s(v?)) based on a coded binary word (v?). The error syndrome bit sequence (s(v?)) indicates whether the coded binary word (v?) is a code word of an error correction code (C) used for coding the coded binary word (v?). The test sequence provider provides a test bit sequence (Ti) of the circuit that is different than the error syndrome bit sequence (s(v?)), if the error syndrome bit sequence (s(v?)) indicates that the coded binary word (v?) is a code word of the error correction code (C). The evaluation circuit detects an erroneous processing of the test bit sequence (Ti) by the circuit based on a test output signal (R(Ti)?)—caused by the test bit sequence (Ti)—of the circuit.

Abstract: Method for encoding information in a flash memory block which combines an independent encoding of each page with a block-level code across multiple pages. The method includes two independent error correction codes, one in horizontal direction and one in vertical direction, with horizontal direction error correction decoding; and vertical direction erasure correction decoding.

Abstract: A computing device to determine whether to update using a computer file by generating a file signature for that computer file based on its file header information and comparing the file signature to a collection of file signatures for updates already applied for matches.

Abstract: A method for detecting unstable signatures when testing a VLSI chip that includes adding to an LFSR one or more save and restore registers for storing an initial seed consisting of 0s and 1s; loading the initial seed into the LFSR and one or more save and restore registers; initializing a MISR and running test loops. Upon reaching a predetermined number of test loops, moving a signature of the MISR to a shadow register; then, performing a signature stability test by loading the initial seed to the LFSR; executing the predetermined number of BIST test loops, and comparing a resulting MISR signature for differences versus a previous signature stored in a MISR save and restore register, wherein unloading is performed by way of serial MISR unloads and single bit XORs.

Abstract: Disclosed is a power isolation and backup system. When a power fail condition is detected, temporary storage is flushed to an SDRAM. After the flush, interfaces are halted, and power is removed from most of the chip except the SDRAM subsystem. The SDRAM subsystem copies data from an SDRAM to a flash memory. On the way, the data may be encrypted, and/or a data integrity signature calculated. If an error is detected, a data integrity signature may be corrupted. A completion signature may be written. To restore data, the SDRAM subsystem copies data from the flash memory to the SDRAM. On the way, the data being restored may be decrypted, and/or a data integrity signature and completion signature checked.

Abstract: A method includes reading, through a processor of a computing device communicatively coupled to a memory, a design of an electronic circuit as part of verification thereof. The method also includes extracting, through the processor, a set of optimized instructions of a test algorithm involved in the verification such that the set of optimized instructions covers a maximum portion of logic functionalities associated with the design of the electronic circuit. Further, the method includes executing, through the processor, the test algorithm solely relevant to the optimized set of instructions to reduce a verification time of the design of the electronic circuit.

Abstract: A program (MC), which can be executed by a programmable circuit, is protected in the following manner. An instruction block (IB) is provided on the basis of at least a portion (MC-P) of the program. A protective code (DS) is generated that has a predefined relationship with the instruction block (IB). The instruction block (IB) is analyzed (ANL) so as to identify free ranges (FI) within the instruction block that are neutral with respect to an execution of the instruction block. The free ranges comprise at least one of the following types: bit ranges and value ranges. The free ranges that have been identified are used for embedding (SEB) the protective code (DS) within the instruction block (IB).

Abstract: A system and methods for reasonable formal verification provides a user with coverage information that is used for verification signoff. The coverage is calculated based on formal analysis techniques and is provided to the user in terms of design-centric metrics rather than formal-centric metrics. Design-centric metrics include the likes of a number of reads from or writes to memories and a number of bit changes for counters, among many others. Accordingly, a setup for failure (SFF) function and a trigger the failure (TTF) function take place. During SFF formal analysis is applied in an attempt to reach a set of states close enough to suspected failure states. During TTF formal analysis is applied, starting from the SFF states, to search for a state violating a predetermined property. If results are inconclusive the user is provided with a design-centric coverage metric that can be used in signoff.

Abstract: The self-healing system comprises a self-healing processor and an error mitigation system. The self-healing processor includes a code block associated with the operation of a portion of digital logic. The self-healing processor also includes a dynamic signature analysis circuit. The processor executes the code block. The dynamic signature analysis circuit creates a dynamic signature representing the operation of the portion of digital logic associated with the code block. The error mitigation system receives the dynamic signature from the dynamic signature analysis circuit. The error mitigation system compares the dynamic signature to a static signature to determine if the signatures match. If the signatures do not match, then the digital logic associated with the code block has an error. The error mitigation system retries execution of the code block. The error mitigation system stores log information describing the above events.

Abstract: Methods and structure for correlating multiple sets of test output signals in time are provided. The structure includes an integrated circuit comprising a block of circuitry that generates internal operational signals. The circuit also comprises a test multiplexer (MUX) hierarchy that selects subsets of the internal signals and applies the subsets to a testing element. A clock generator generates a clock signal for the selected signals. A test logic timer receives the clock signal and increments a counter value, and applies the counter value to the testing element. An event detector resets the counter value upon detection of an event, such that a first subset of the internal signals acquired from the test MUX hierarchy acquired responsive to detection of a first instance of the event may be correlated in time with a second subset of the internal signals acquired responsive to detection of a second instance of the event.

Abstract: Media monitoring using multiple types of signatures is disclosed. An example media monitoring method disclosed herein comprises processing signatures of a first type to monitor media presented by a media device until a first one of the signatures of the first type is determined to match a reference signature of the first type, the reference signature of the first type being associated with first reference media, and processing signatures of a second type to monitor the media presented by the media device after the first one of the signatures of the first type is determined to match the reference signature of the first type and until a number of signatures of the second type is determined not to match corresponding reference signatures of the second type, the reference signatures of the second type being associated with the first reference media.

Abstract: A method and structure tests a system on a chip (SoC) or other integrated circuit having multiple cores for chip characterization to produce a partial good status. A Self Evaluation Engine (SEE) on each core creates a quality metric or partial good value for the core. The SEE executes one or more tests to create a characterization signature for the core. The SEE then compares the characterization signature of a core with a characterization signature of neighboring cores to determine the partial good value for the core. The SEE may output a result to create a full characterization map for detailed diagnostics or a partial good map with values for all cores to produce a partial good status for the entire SoC.

Abstract: A method and structure tests a system on a chip (SoC) or other integrated circuit having multiple cores for chip characterization to produce a partial good status. A Self Evaluation Engine (SEE) on each core creates a quality metric or partial good value for the core. The SEE executes one or more tests to create a characterization signature for the core. The SEE then compares the characterization signature of a core with a characterization signature of neighboring cores to determine the partial good value for the core. The SEE may output a result to create a full characterization map for detailed diagnostics or a partial good map with values for all cores to produce a partial good status for the entire SoC.

Abstract: Built-in self-test techniques for integrated circuits that address the issue of unknown states. Some implementations use a specialized scan chain selector coupled to a time compactor. The presence of the specialized scan chain selector increases the efficiency in masking X states. Also disclosed are: (1) an architecture of a selector that works with multiple scan chains and time compactors, (2) a method for determining and encoding per cycle scan chain selection masks used subsequently to suppress X states, and (3) a method to handle an over-masking phenomenon.

Abstract: Aspects of the invention relate to techniques for fault diagnosis based on circuit design partitioning. According to various implementations of the invention, a circuit design of a failing die is first partitioned into a plurality of sub-circuits. The sub-circuits may be formed based on fan-in cones of observation points. Shared gate ratios may be used as a metric for adding fan-in cones of observation points into a sub-circuit. Based on test patterns and the sub-circuits, sub-circuit test patterns are determined. Fault diagnosis is then performed on the sub-circuits. The sub-circuit fault diagnosis comprises extracting sub-circuit failure information from the failure information for the failing die. The sub-circuit fault diagnosis may employ fault-free values for boundary gates in the sub-circuits.

Abstract: A semiconductor device comprises processing logic arranged to execute program instructions. The semiconductor device further comprises signature generation logic arranged to receive at least one value from at least one internal location of the semiconductor device, and to generate a current signature value, based on the at least one received value. Validation logic is arranged to validate the current signature value generated by the signature generation logic. The processing logic is further arranged, upon execution of a signature validation instruction, to enable the validation of the current signature value provided by the validation logic.

Abstract: Scan testing and scan compression are key to realizing cost reduction and shipped quality. New defect types in ever more complex designs require increased compression. However, increased density of unknown (X) values reduces effective compression. A scan compression method can achieve very high compression and full coverage for any density of unknown values. The described techniques can be fully integrated in the design-for-test (DFT) and automatic test pattern generation (ATPG) flows. Results from using these techniques on industrial designs demonstrate consistent and predictable advantages over other methods.

Abstract: A system for programming a phase change material-content addressable memory (PCM-CAM). The system includes a receiving unit for receiving a word to be written in the PCM-CAM. The word includes low bits represented by a low resistance state in the PCM-CAM and high bits represented by a high resistance state in the PCM-CAM. The system includes a writing unit configured to repeatedly write the low bits in memory cells of the PCM-CAM until the resistance of the memory cells are below a threshold value, and to write high bits in memory cells of the PCM-CAM only once.

Abstract: System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent clock data patterns are driven on one or more of remaining data paths of the plurality of data paths, wherein the coherent clock data patterns are in coherence with a low speed base clock. The first high speed data path is sampled by the coherent clock data patterns to generate a sampled first high speed data path, which is then tested at a speed of the low speed base clock.

Abstract: A method for detecting unstable signatures when testing a VLSI chip that includes adding to an LFSR one or more save and restore registers for storing an initial seed consisting of 0s and 1s; loading the initial seed into the one or more save and restoring LFSR registers upon reaching a predetermined number of test loops; performing a signature stability test by loading said initial seed to said LFSR, executing the predetermined number of BIST test loops, and comparing the resulting MISR signature for differences versus a previous signature stored in a MISR save and restore register.

Abstract: A dictionary-based scan chain fault detector includes a dictionary with fault signatures computed for scan cells in the scan chain. Entries in the fault dictionary are compared with failures in the failure log to identify a faulty scan cell. In one embodiment a single fault in a scan chain is identified. In another embodiment, a last fault and a first fault in a scan chain are identified.

Abstract: Integrated circuits with error detection circuitry are provided. Integrated circuits may include memory cells organized into frames. The error detection circuitry may compress each frame to scan for soft errors. The error detection circuitry may include multiple input shift registers (MISRs), a data register, and a signature comparator. The data frames may be read, compressed, and shifted into the MISRs in parallel. After all the data frames have been read, the MISRs may provide a scanned MISR signature at their outputs. Computer-aided design (CAD) tools may be used to calculate a precomputed MISR signature. The precomputed MISR signature may be loaded into the data register. The signature comparator compares the scanned MISR signature with the precomputed MISR signature. If the signatures match, then the device is free of soft errors. If the signatures do not match, then at least one soft error exists.

Abstract: A storage server stores data in a stripe of a parity group that includes a plurality of data storage devices to store data and a parity storage device to store parity information. The stripe includes a data block from each of the data storage devices and a parity block from the parity storage device. The storage server receives a data access request specifying a data block in the stripe, and a lost write detection module detects an error in the data block. The lost write detection module compares a first storage device signature stored in a metadata field associated with the data block to a second storage device signature stored in a global field of the data storage device containing the data block. If the first storage device signature matches the second storage device signature, the lost write detection module compares a consistency point count stored in the metadata field to a reconstructed consistency point count.

Abstract: Roughly described, a scan-based test architecture is optimized in dependence upon the circuit design under consideration. In one embodiment, a plurality of candidate test designs are developed. For each, a plurality of test vectors are generated in dependence upon the circuit design and the candidate test design, preferably using the same ATPG algorithm that will be used downstream to generate the final test vectors for the production integrated circuit device. A test protocol quality measure such as fault coverage is determined for each of the candidate test designs, and one of the candidate test designs is selected for implementation in an integrated circuit device in dependence upon a comparison of such test protocol quality measures. Preferably, only a sampling of the full set of test vectors that ATPG could generate, is used to determine the number of potential faults that would be found by each particular candidate test design.

Abstract: The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.

Abstract: A method for programming a Phase Change Material-Content Addressable Memory (PCM-CAM). The method includes receiving a word to be written in a PCM-CAM. The word includes low bits represented by a low resistance state in the PCM-CAM and high bits represented by a high resistance state in the PCM-CAM. The method further includes repeatedly writing the low bits in memory cells of the PCM-CAM until the resistance of the memory cells are below a threshold value, and writing the high bits in memory cells of the PCM-CAM only once.

Abstract: Embodiments provide systems, devices, methods, and machine-readable medium for automated debugging of a design under test in a verification environment as part of electronic design automation. Embodiments may automatically identify inputs that are relevant to a bug for a device under test. A failing test run may be taken and rerun several times with small changes in the inputs. If the test is passing, the mutated inputs may be important to reproduce the bug and may be marked as “suspicious”. The result of this process may be a list of suspicious inputs and a shorter and simpler test that still fails. The shorter test may be rerun and fields of the inputs recorded. New tests may be created with mutated fields. Mutated fields that result in passing tests may be considered suspicious fields. Suspicious inputs and fields may be presented to a user as part of an electronic design process.

Abstract: A method of test path selection and test program generation for performance testing integrated circuits. The method includes identifying clock domains having multiple data paths of an integrated circuit design having multiple clock domains; selecting, from the data paths, critical paths for each clock domain of the multiple clock domains; using a computer, for each clock domain of the multiple clock domain, selecting the sensitizable paths of the critical paths; for each clock domain of the multiple clock domain, selecting test paths from the sensitizable critical paths; and using a computer, creating a test program to performance test the test paths.

Abstract: Writing data in a distributed database having a plurality of nodes is disclosed. Writing includes receiving a write request at a node, wherein the write request is associated with one or more operations to define an atomic transaction and performing the atomic transaction based on the request. The atomic transaction includes writing to a first version of the database in the node and writing to an entity representative of a state of the first version of the database.

Abstract: The disclosure describes novel methods and apparatuses for controlling a device's TCA circuit when the device exists in a JTAG daisy-chain arrangement with other devices. The methods and apparatuses allow the TCA test pattern set used during device manufacturing to be reused when the device is placed in a JTAG daisy-chain arrangement with other devices, such as in a customers system using the device. Additional embodiments are also provided and described in the disclosure.

Abstract: Additional circuitry is included in an input cell design structure for an integrated circuit to detect and report transitions on an input that was expected to be stable, and to store that event for later analysis. Two or more modified input cells may have their error indications daisy-chained together to minimize additional routing. The storage elements may be included in a scan chain to allow for isolation of which input had the unexpected transition.