Abstract: Systems, devices and methods for high-speed I/O margin testing can screen high volumes of pre-production and production parts and identify cases where the electrical characteristics have changed enough to impact operation. The margin tester disclosed is lower cost, easier to use and faster than traditional BERT and scopes and can operate on the full multi-lane I/O links in their standard operating states with full loading and cross-talk. The margin tester assesses the electrical receiver margin of an operation multi-lane high speed I/O link with a device under test simultaneously in either or both directions. In a technology-specific form, an embodiment of the margin tester can be implemented as an add-in card margin tester to test motherboard slots of a mother board under test, or as a as a motherboard with slots to test add-in cards.

Abstract: Technology is disclosed herein for semi receiver side write training in a non-volatile memory system. The transmitting device has delay taps that control the delay between a data strobe signal and data signals sent on the communication bus. The delay taps on the transmitting device are more precise that can typically be fabricated on the receiving device (e.g., NAND memory die). However, the receiving device performs the comparisons between test data and expected data, which alleviates the need to read back the test data. After the different delays have been tested, the receiving device informs the transmitting device of the shortest and longest delays for which data was validly received. The transmitting device then sets the delay taps based on this information. Moreover, the write training can be performed in parallel on many receiving devices, which is very efficient.

Abstract: A system and method for using a programmable macro built-in self-test (BIST) to test an integrated circuit. The method includes receiving, by a built-in self-test (BIST) controller of an integrated circuit (IC) device from a testing equipment, a test vector of a first type for testing a first region of the IC device. The method includes identifying, based on the test vector of the first type, a first BIST engine of a plurality of BIST engines associated with the first region of the IC device. The method includes generating, based on the test vector of the first type, a first command of the second type. The method includes configuring, based on the first command of the second type, the first BIST engine of the plurality of BIST engines to cause the first BIST engine to perform a first set of tests on the first region of the IC device.

Abstract: An apparatus includes a radio frequency (RF) receiver to receive packets. The RF receiver includes first and second synchronization field detectors (SFDs). The first and second SFDs detect synchronization headers generated using first and second physical layer (PHY) modes, respectively.

Abstract: A computer-implemented method, computer system, and computer program product for a container deployment simulation. The method may include performing a container deployment simulation. The method may include detecting a container deployment simulation error. In response to detecting the container deployment simulation error, the method may include providing one or more recommendations to a user. In response to receiving an acceptance of the recommendation from the user, the method may include implementing the recommendation. In response to receiving a rejection of the recommendation from the user, the method may include receiving a user recommendation. The method may include implementing the user recommendation and performing the container deployment simulation. The one or more recommendations may have a weight value. The weight value of the one or more recommendations may be increased when the user accepts the one or more recommendations or reduced when the user rejects the one or more recommendations.

Abstract: According to various embodiments, an electronic circuit includes a plurality of clock generators wherein each clock generator is configured to store a counter value, to receive a reference clock, to change the counter value in accordance with the reference clock and to generate at least one clock signal based on the counter value. The circuit also includes a comparator configured to receive, for each of at least two of the plurality of clock generators, the counter value and compare the received counter values and an error handling circuit configured to initiate an error handling based on the result of the comparison.

Abstract: Aspects of the disclosure are directed to clock management. In accordance with one aspect, a clock management apparatus for built-in self-test (BIST) circuitry includes a plurality of local clock controllers; a plurality of clock generators coupled to the plurality of local clock controllers; a master clock controller coupled to the plurality of clock generators; an X-tolerant logical built-in self test (XLBIST) circuit coupled to the master clock controller; and a test access port (TAP) coupled to the XLBIST circuit.

Abstract: An optical disc device includes a first error correction coding circuit that codes the recording data according to a first error correction coding format, a second error correction coding circuit that codes the recording data according to a second error correction coding format, and a recorder that converts the recording data into a recording signal and records it on an optical disc. The second error correction coding format is different in an arrangement of the recording data from the first error correction coding format. The second error correction coding format is configured to generate a second parity code with a higher degree of redundancy. The recorder records the recording data coded by the first error correction coding circuit and only the second parity code in the recording data coded by the second error correction coding circuit.

Abstract: In one embodiment, a chip comprising a circuit, the circuit comprising a plurality of components, wherein the circuit is adapted to perform a function that is dependent on timing behavior of the circuit, and wherein a geometry of a layout of the circuit is substantially the same as another geometry of another layout of another circuit adapted to perform another function that is dependent on different timing behavior.

Abstract: Disclosed is a variable coding method for realizing chip reuse, comprising the following steps: using at least two identical integrated circuit chips, wherein each integrated circuit chip executes different control logic truth tables according to different gating signals; introducing at least one logical control signal as a gating signal; and controlling the logical control signal, so that each integrated circuit chip respectively executes a corresponding control logic truth table. Also disclosed is a communication terminal using the variable coding method for realizing chip reuse. Two or more completely identical integrated circuit chips can be used to realize different logical control functions, thereby simplifying the type of a chip for realizing a system function, and greatly reducing the development costs of an integrated circuit system and the management complexity of a mass production supply chain.

Abstract: A clock pattern generating method of a semiconductor memory device is provided. The method includes generating the same clock pattern through a plurality of detection clock output pins when an output selection control signal is in a first state and generating clock patterns different from each other through the plurality of detection clock output pins when the output selection control signal is in a second state different from the first state.

Abstract: In a general aspect, a tracer is configured to instrument an application by injecting at least one interrupt instruction at a function entry point in a memory image of the application such that executable code of the application is not modified. The tracer is configured to collect information relating to execution of the application when the inserted at least one interrupt instruction is triggered during runtime of the application including tracing at least one operating system function used by the application at the function entry point. The tracer is configured to create an application signature based on the collected information. The application signature provides information about at least one system object accessed by the at least one operating system function.

Abstract: A method of testing a data transmission and reception system comprises sending a test signal from a transmitter (14) of the system to a receiver (12) of the system, and analyzing the received signal. A duty cycle relationship is varied between the test signal and the timing signal used by the receiver of the system, and the effect of the duty cycle variation is analyzed. Varying the duty cycle relationship provides duty cycle distortion (DCD), and this can be considered as a form of embedded jitter insertion. This type of jitter can be measured relatively easily.

Abstract: In certain embodiments, an integrated circuit has scan-test circuitry that performs scan testing on circuitry under scan test (CUST) within the IC, where the scan-test circuitry is susceptible to a defect. In order to enable the defect to be corrected after it occurs, the scan-test circuitry includes a set of programmable circuitry connected to provide a signal to other circuitry (e.g., a scan chain) within the scan-test circuitry, where the set of programmable circuitry includes one or more configurable memory cells connected to control the programming of the set of programmable circuitry. The memory cell(s) can be configured to program the set of programmable circuitry to enable the scan testing to be performed without modification. The memory cell(s) can also be configured to program the set of programmable circuitry to modify the scan testing to correct the defect in the scan-test circuitry.

Abstract: A semiconductor device may include a first pad suitable for inputting a dock, a plurality of second pads suitable for inputting data through a plurality of first data paths, a third pad suitable for inputting a first strobe signal through a first strobe signal path, a data latch unit suitable for latching the data inputted through the first data paths in response to the first strobe signal inputted through the first strobe signal path, and a calibration control unit suitable for calibrating delay values of the plurality of first data paths and the first strobe signal path in a first calibration mode such that a plurality of first test signals passing through the respective first data paths and a second test signal passing through the first strobe path are in phase with the clock inputted from the first pad.

Abstract: The present subject matter relates a testing system for an application. The system includes a test data generation module to generate test data for a program code. The test data generation module in turn includes a relational expression creation module that determines a relational expression corresponding to a set of parameters of the program code based on a rule indicating a format of a valid test data for the parameters. A boundary recognition module identifies a set of boundary values of the parameters based on the relational expression. Further, a solver module then generates valid test data and invalid test data for the parameters based on the boundary values.

Abstract: The present disclosure generally provides for a method of prioritizing clock domains for testing an integrated circuit (IC) design. The method can include: assigning each of a plurality of multi-tested clock domains (MTCDs) and a plurality of test experiments (TEs) to one of a plurality of speed priority groups (SPGs), wherein the assigning includes: creating a new SPG having a priority value of n+1, wherein n represents the number of previously created SPGs; assigning a first MTCD corresponding to at least two of the plurality of TEs, the first MTCD not being previously assigned to an SPG, to the new SPG; and assigning each TE corresponding to the first MTCD, each of the assigned TEs not being previously assigned to an SPG, to the new SPG; and performing each of the plurality of TEs on the IC design in order from lowest priority value to highest priority value.

Abstract: A transmitting device includes a parallel data generation unit and a transmitting unit. The parallel data generation unit generates first serial data and second serial data from a data packet, converts the first serial data and second serial data respectively into first parallel data and second parallel data, transmits the first parallel data and second parallel data respectively through first and second parallel transmission paths, and performs the transmission of the first parallel data and the transmission of the second parallel data in parallel. The transmitting unit receives the first parallel data and second parallel data respectively through the first and second parallel transmission paths, re-converts the first parallel data and second parallel data respectively into the first serial data and second serial data, and transmits the first serial data and second serial data to a receiving device respectively through first and second serial transmission paths.

Abstract: A test technique that may be implemented in an automated test system for testing semiconductor devices. The test technique may enable the fast detection of a signal transition, such as an edge, within a waveform and the timing of that event. Circuitry within a digital instrument that can be quickly and flexibly programmed may, at least in part, implement the test technique. That circuitry may be simply programmed with testing parameters, such that application of the technique may lead to faster test development and faster times. In operation, that circuitry receives parameters specifying parameters of a window over a waveform in which samples of the waveform will be taken to detect the signal transition. The circuitry may convert these parameters into control signals for other components in the test system, such as an edge generator or pin electronics, to take a programmed number of samples at desired times.

Abstract: In operation, a transmitting device selects a synchronization pattern associated with the desired timeslot that is at least mutually exclusive from synchronization patterns associated with other timeslots on the same frequency in the system. Once selected, the transmitting device transmits a burst embedding the synchronization pattern that was selected, where appropriate. If the receiving device detects the synchronization pattern, it immediately synchronizes with the timeslot with confidence that it is synchronizing to the desired timeslot by using sets of synchronization patterns associated with the desired timeslot that are at least mutually exclusive from synchronization patterns associated with the other timeslots on the same frequency.

Abstract: A panel driving circuit that produces a panel test pattern and a method of testing a panel are provided. The driving circuit includes a pattern generation unit and a selection unit. The pattern generation unit responds to a system clock and produces pattern test data and pattern test signals. The selection unit responds to a test signal and selects and outputs either (a) the pattern test data and the pattern test signals that are outputted from the pattern generation unit, or (b) the pattern test data and pattern test signals that are directly applied from the outside. The driving circuit and the method of the panel test generates the panel test data, the horizontal synchronizing signal, the vertical synchronizing signal, and the data activating signal within the driving circuit using a system clock so that the testing of the panel can be carried out without using a separate test device.

Abstract: A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.

Abstract: According to one embodiment, two memory systems each including a memory and a controller are connected via a communication line. The controller includes a testing unit that performs a self-test process on the memory, a communication unit that communicates with the counterpart controller, and a status output unit. The communication unit performs a startup synchronization process which is performed before the self-test process and a termination synchronization process which is performed after the self-test process. The testing unit obtains a comprehensive test result from the test results of the two memory systems, and the status output unit of one memory system outputs the comprehensive test result.

Abstract: A parallel test device and method are disclosed, which relates to a technology for performing a multi-bit parallel test by compressing data. The parallel test device includes: a pad unit through which data input/output (I/O) operations are achieved; a plurality of input buffers configured to activate write data received from the pad unit in response to a buffer enable signal, and output the write data to a global input/output (GIO) line; a plurality of output drivers configured to activate read data received from the global I/O (GIO) line in response to a strobe delay signal, and output the read data to the pad unit; and a test controller configured to activate the buffer enable signal and the strobe delay signal during a test mode in a manner that the read data received from the plurality of output drivers is applied to the plurality of input buffers such that the read data is operated as the write data.

Abstract: An integrated circuit is configured to receive a test clock input and includes circuitry configured to generate test clocks from the test clock input, and test circuitry configured to use the test clocks in a test mode.

Abstract: A method that dynamically adjusts link control parameters of a communications network. The communications network includes a transmitter coupled through a first data link to a receiver. The transmitter and receiver each have at least one associated link control parameter that affects the operation of that component. According to one method, data signals are transmitted over the first data link and the transmitted data signals are captured. The values of the captured data signals are compared to expected values for those signals, and the values of the link control parameters are adjusted to successfully capture the transmitted digital signals.

Abstract: A method and system for providing on-product clocks for domains compatible with compression is disclosed. According to one embodiment, a base signal received from automated test equipment has a frequency for testing a plurality of clock domains and programming instruction for first and second clock domains of a plurality of clock domains. First and second clock signals are generated from the base clock signal based on the programming instruction. A first delay for the first clock signal and a second delay for the second clock signal are determined from the programming instruction. A test sequence is provided to test a first clock domain and a second clock domain. The test sequence comprises the first clock signal delayed by the first delay and the second clock signal delayed by the second delay. The first clock drives the first clock domain and the second clock derives the second clock domain.

Abstract: Techniques and mechanisms for evaluating I/O buffer circuits. In an embodiment, test rounds are performed for a device including the I/O buffer circuits, each of the test rounds comprising a respective loop-back test for each of the I/O buffer circuits. Each of the test rounds corresponds to a different respective delay between a transmit clock signal and a receive clock signal. In another embodiment, a first test round indicates a failure condition for at least one I/O buffer circuit and a second test round indicates the failure condition for each of the I/O buffer circuits. Evaluation of the I/O buffer circuits determines whether the device satisfies a test condition, where the determining is based on a difference between the delay corresponding to the first test round and the delay corresponding to the second test round.

Abstract: Provided is an apparatus configured for testing a logic device. The apparatus includes a testing mechanism configured to output test patterns representative of logical structures within the logic device and a testable logic device having (i) input ports coupled to output ports of the automated testing mechanism and (ii) output ports coupled to input ports of the automated testing mechanism. The apparatus also includes a fusing mechanism configured to compensate for defects within the logic device responsive to a segregation of the type of defects identified.

Abstract: A transmitting device includes a parallel data generation unit and a transmitting unit. The parallel data generation unit generates first serial data and second serial data from a data packet, converts the first serial data and second serial data respectively into first parallel data and second parallel data, transmits the first parallel data and second parallel data respectively through first and second parallel transmission paths, and performs the transmission of the first parallel data and the transmission of the second parallel data in parallel. The transmitting unit receives the first parallel data and second parallel data respectively through the first and second parallel transmission paths, re-converts the first parallel data and second parallel data respectively into the first serial data and second serial data, and transmits the first serial data and second serial data to a receiving device respectively through first and second serial transmission paths.

Abstract: Methods and structure for correlating multiple sets of test output signals in time are provided. The structure includes an integrated circuit comprising a block of circuitry that generates internal operational signals. The circuit also comprises a test multiplexer (MUX) hierarchy that selects subsets of the internal signals and applies the subsets to a testing element. A clock generator generates a clock signal for the selected signals. A test logic timer receives the clock signal and increments a counter value, and applies the counter value to the testing element. An event detector resets the counter value upon detection of an event, such that a first subset of the internal signals acquired from the test MUX hierarchy acquired responsive to detection of a first instance of the event may be correlated in time with a second subset of the internal signals acquired responsive to detection of a second instance of the event.

Abstract: Provided is a test apparatus comprising a plurality of pattern output sections. In a high-speed mode, each pattern output section outputs, as pattern data corresponding to at least one of a plurality of partial periods, the pattern data corresponding to an input pattern input to the pattern output section and the pattern data corresponding to input patterns input to other pattern output sections.

Abstract: A high speed test circuit receives a tester clock from a tester and it conducts a test on a circuit under test. The high speed test circuit generates a high frequency clock according to the tester clock, so it is capable of operating in two frequencies. The high speed test circuit tests the circuit under test according to the high frequency clock, and it performs a low speed operation according to a low frequency clock, which is for example the tester clock.

Abstract: A network switch includes first and second clock-and-data-recovery (CDR) circuits, a cross-bar switch to couple the first and second CDR circuits, and a first test pattern generation circuit electrically coupled with the first CDR circuit. The first test pattern generation circuit is configured to generate a test pattern and transmit the test pattern from the first CDR circuit to the second CDR circuit via the cross-bar switch. The network switch also includes a first test pattern checking circuit, electrically coupled with the second CDR circuit, to verify the test pattern received at the second CDR circuit.

Abstract: Methods and structure for correlating internal operational signals routed via different paths of a test signal selection hierarchy. The structure includes a functional block of circuitry operable to generate internal operational signals and clock signals. The integrated circuit also comprises a test signal selection hierarchy operable to receive the internal operational signals and the clock signals and to selectively route the internal operational signals and the clock signals. Further, structure includes a control unit operable to receive the clock signals from the test signal selection hierarchy, to determine a delay between received clock signals routed via different signaling pathways of the test signal selection hierarchy. The control unit is further operable to program a delay line based upon the delay between the clock signals and based upon internal operational signals correlated with the clock signals.

Abstract: A semiconductor memory device includes a plurality of detecting code generators configured to generate a plurality of detecting codes to detect errors in a plurality of data items, respectively, a plurality of first correcting code generators configured to generate a plurality of first correcting codes to correct errors in a plurality of first data blocks, respectively, each of the first data blocks containing one of the data items and a corresponding detecting code, a second correcting code generators configured to generate a second correcting code to correct errors in a second data block, the second data block containing the first data blocks, and a semiconductor memory configured to nonvolatilely store the second data block, the first correcting codes, and the second correcting code.

Abstract: A test apparatus that tests a device under test exchanging a data signal and a clock signal, the test apparatus comprising a test signal supplying section that supplies the device under test with a data signal and a clock signal, as a test signal; a data acquiring section that acquires the data signal output by the device under test, at a timing corresponding to the clock signal output by the device under test; a judging section that judges pass/fail of the device under test based on a comparison result of a comparison between the data signal acquired by the data acquiring section and an expected value; and an adjusting section that, when performing an adjustment, adjusts a delay amount of the clock signal used to generate the timing at which the data signal is acquired.

Abstract: A device for increasing chip testing efficiency includes a pattern generator, a reading unit, a logic operation circuit, and a judgment unit. The pattern generator is used for writing a logic voltage to each bank of a memory chip. The reading unit is used for reading logic voltages stored in all memory cells of each bank. The logic operation circuit is used for executing a first logic operation on the logic voltages stored in all memory cells of each bank to generate a plurality of first logic operation results corresponding to each bank, and executing a second logic operation on the plurality of first logic operation results to generate a second logic operation result corresponding to the memory chip. The judgment unit determines whether the memory chip passes the test according to the second logic operation result.

Abstract: A test apparatus that tests a device under test, including (i) a master domain that includes a master period signal generating section, which generates a master period signal, where the master domain operates based on the master period signal and (ii) a slave domain that includes a slave period signal generating section, which generates a slave period signal, where the slave domain operates based on the slave period signal. The master period signal generating section receives a control signal and resumes generation of the master period signal, which is on hold, and the slave period signal generating section receives the control signal, initializes phase data of the slave period signal, and resumes generation of the slave period signal, which is on hold.

Abstract: System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent clock data patterns are driven on one or more of remaining data paths of the plurality of data paths, wherein the coherent clock data patterns are in coherence with a low speed base clock. The first high speed data path is sampled by the coherent clock data patterns to generate a sampled first high speed data path, which is then tested at a speed of the low speed base clock.

Abstract: Aspects of the disclosure provide an apparatus for enabling common time-stamping. The apparatus includes a first subsystem having a first timer and a second subsystem having a second timer of a same frequency as the first timer. The first subsystem is configured to time-stamp first events based on the first timer. The second subsystem is configured to time-stamp second events based on the second timer. The apparatus further includes a synchronization module configured to take a first snapshot of the first timer and take a second snapshot of the second timer. Then, based on a difference between the first snapshot and the second snapshot, the first events and the second events are commonly time-stamped.

Abstract: In a first embodiment of the present invention, a method for error-correcting in a parallel interconnect transmitting device is provided, the method comprising: detecting a frame transition in a transmission from the transmitting device to a parallel interconnect receiving device; tracking time between the frame transition and a transition of a response signal corresponding to the frame transition received from the receiving device; detecting an error in the transmission; and restarting a portion of the transmission in response to the error, wherein the size of the portion of the transmission to restart is based upon the tracked time between the frame transition and the transition of a response signal corresponding to the frame transition.

Abstract: A memory controller receives data and phase-providing signals from a memory device. The phase-providing signal is not a clock signal, but is used by the memory controller to phase align a local data-sampling signal with the incoming data. The memory controller samples the data signal with the data-sampling signal. The memory controller can perform maintenance operations to update the phase relationship between the phase-providing and data-sampling signals.

Abstract: A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal.

Abstract: An integrated circuit tester is described that utilizes methods of programming parallel coupled Algorithmic Pattern Generators (APGs) to generate test vector sequences and part commands with sub-instruction repeats. This enables simpler test programming and ease of test conversion to new part speed grades, steppings, or part designs. In one embodiment, a sub-instruction repeat is utilized to enable adjustment of the timing of test vector sequences and part commands sent to an integrated circuit device under test (DUT) so that the test can be adjusted for new part speed grades and/or steppings. In another embodiment, a sub-instruction repeats are utilized to enable adjustment of the timing of a memory device inputs, memory commands and test vector sequences so that the test can be adjusted for new memory device speed grades.

Abstract: A power gating device may include a control unit that generates a first interrupt signal based on a mode change signal when a mode of a system is changed from a normal operation mode to a stand-by mode, and generates a second interrupt signal based on the mode change signal when the mode is changed from the stand-by mode to the normal operation mode, a memory unit that stores data of a function block based on the first interrupt signal, and restores the stored data to the function block based on the second interrupt signal, and a power source unit that provides a normal operation power to the function block and the memory unit based on a power down signal in the normal operation mode, and provides a stand-by power to the memory unit based on the power down signal in the stand-by mode.

Abstract: In general, according to one embodiment, a semiconductor circuit test method is disclosed. The method can generate a basic format of a test pattern and store the basic format in a test device. The basic format includes at least one parameter and a test program for testing a test target semiconductor circuit. The method can set a predetermined value for the parameter to generate the test pattern including the test program and the parameter set to the predetermined value and supply the test pattern to the test target semiconductor circuit. The method can have store the test program in a first address of a storing module in the test target semiconductor circuit and store the parameter set to the predetermined value in a second address of the storing module. In addition, the method can execute the test program stored in the first address while referring to the parameter stored in the second address.

Abstract: A method and system for correcting timing errors due to thermal changes within a portable computing device are disclosed. The system and method may include calculating an estimate of frequency for a first clock compared to a second clock. The first clock may comprise a crystal oscillator while the second clock comprises a system clock. Next, a sleep state may be calculated for a hardware device, such as radio access technology (“RAT”) module, based on the estimate of frequency for the first clock. An error in the frequency of the first clock that may occur during the sleep state of the hardware device may be calculated. Subsequently, a magnitude of time that corresponds to an actual length of the sleep state relative to the second clock may be calculated so that an internal clock of the hardware devices may be synchronized with the second clock.

Abstract: A test device for a system-on-chip includes a sequential logic circuit and a test circuit. The sequential logic circuit generates a test input signal by converting a serial input signal into a parallel format in response to a serial clock signal and a serial enable signal and generates a serial output signal by converting a test output signal into a serial format in response to the serial clock signal and the serial enable signal. The test circuit includes at least one delay unit that is separated from a logic circuit performing original functions of the system-on-chip, performs a delay test on the at least one delay unit using the test input signal in response to a system clock signal and a test enable signal, and provides the test output signal to the sequential logic circuit, where the test output signal representing a result of the delay test.

Abstract: Embodiments provide systems, devices, methods, and machine-readable medium for automated debugging of a design under test in a verification environment as part of electronic design automation. Embodiments may automatically identify inputs that are relevant to a bug for a device under test. A failing test run may be taken and rerun several times with small changes in the inputs. If the test is passing, the mutated inputs may be important to reproduce the bug and may be marked as “suspicious”. The result of this process may be a list of suspicious inputs and a shorter and simpler test that still fails. The shorter test may be rerun and fields of the inputs recorded. New tests may be created with mutated fields. Mutated fields that result in passing tests may be considered suspicious fields. Suspicious inputs and fields may be presented to a user as part of an electronic design process.