Abstract: A tester for testing a semiconductor device is disclosed. In accordance with the tester, a data is fetched using a data strobe signal transmitted from a DUT, thereby increasing an accuracy of the fetched data, securing a window for fetching a last portion of the data using a data strobe enable signal and efficiently compensating for a round trip delay of an expected data without using the deskew component.

Abstract: A method is disclosed for the automated synthesis of phase shifters. Phase shifters comprise circuits used to remove effects of structural dependencies featured by pseudo-random test pattern generators driving parallel scan chains. Using a concept of duality, the method relates the logical states of linear feedback shift registers (LFSRs) and circuits spacing their inputs to each of the output channels. The method generates a phase shifter network balancing the loads of successive stages of LFSRs and satisfying criteria of reduced linear dependency, channel separation and circuit complexity.