Surface And Cutting Edge Testing Patents (Class 73/104)
  • Patent number: 10869715
    Abstract: Methods and devices are described for the design and manufacturing of a knife with a robust double bevel cutting edge profile for use in surgical procedures. The double bevel cutting edge profile may be defined by a combination of a cutting edge angle and a radius of the cutting edge tip. In some embodiments, the cutting edge profile may be defined by a combination of a web thickness profile and a radius of the cutting edge tip. Numerical ranges are identified for each of the various geometric parameters which may define a cutting edge that provides sufficient knife sharpness over many cutting repetitions. In some embodiments a medical device, which implements a knife with a cutting edge, for use in surgical procedures is described.
    Type: Grant
    Filed: December 9, 2014
    Date of Patent: December 22, 2020
    Assignee: Covidien LP
    Inventors: Stephen J. Stamm, Kim V. Brandt
  • Patent number: 10788431
    Abstract: A test panel assembly is configured to be used with multiple tests for a single component. The test panel assembly may include a main body, a first test section formed on the main body, and a second test section formed on the main body. The first test section is configured for a first test, and the second test section is configured for a second test that differs from the first test.
    Type: Grant
    Filed: May 27, 2015
    Date of Patent: September 29, 2020
    Assignee: Illinois Tool Works Inc.
    Inventors: David Geis, Kenneth Boden
  • Patent number: 10751895
    Abstract: An apparatus for testing a razor blade comprises a base, a material support table, a material sample, a transport carriage, a blade retention assembly, and a razor blade. The material support table is supported by the base. The transport carriage is movably coupled with the base and is movable with respect to the material support table between a start position and an end position. The blade retention assembly is movably coupled with the transport carriage and is movable with respect to the material support table between a blade-engaged position and a blade disengaged position. The blade retention assembly is movable together with the transport carriage between the start position and the end position. The blade is releasably attached to the blade retention assembly. The razor blade contacts the material sample when the blade retention assembly is in the blade-engaged position. Methods are also provided.
    Type: Grant
    Filed: May 14, 2018
    Date of Patent: August 25, 2020
    Assignee: The Gillette Company LLC
    Inventors: Neville Sonnenberg, Peter Bradley
  • Patent number: 10731705
    Abstract: A detecting apparatus for detecting displacement of a bearing unit sandwiched between a spindle extending in an axial direction and a spindle seat is provided. The detecting apparatus includes a detector unit and a control unit. The detector unit includes a pair of sensing devices with each sensing device including a sensor that abuts against an end surface of an outer ring of the bearing unit and outputting, based on a sensing of the sensor thereof, a detected signal associated with a displacement of the end surface in the axial direction. The control unit is configured to determine whether the bearing unit is abnormal based on the detected signals.
    Type: Grant
    Filed: April 4, 2018
    Date of Patent: August 4, 2020
    Assignee: BUFFALO MACHINERY COMPANY LIMITED
    Inventor: Paul Chang
  • Patent number: 10688616
    Abstract: A cutting apparatus having a cutting blade for cutting a workpiece held on a chuck table is disclosed. The cutting apparatus includes an elastic wave detecting sensor for detecting an elastic wave due to the rotation of the cutting blade, a reference data storing section configured to store reference data as a set of reference processing elastic wave data and reference idling elastic wave data, a threshold value storing section, a ratio calculating section, and a determining section.
    Type: Grant
    Filed: April 18, 2018
    Date of Patent: June 23, 2020
    Assignee: DISCO CORPORATION
    Inventors: Takahiko Tsuno, Saki Miyakawa, Tomoaki Sugiyama
  • Patent number: 10677700
    Abstract: A method for testing cutting performance of a diamond saw blade, relating to a technical field of diamond tool test, is provided, which solves problems of inaccuracy and non-uniformity existing in conventional methods for testing cutting performance of a diamond tool. The method includes steps of: (1) obtaining a set load parameter value, particularly including steps of: controlling a feed amount of the diamond saw blade; finding out a load value K corresponding to a maximum feed amount of the diamond saw blade on a cutting object; and setting M=0.70K-0.85K, wherein M is the set load parameter value; and (2) during cutting, controlling a cutting load value of the diamond saw blade to be 0.90M-1.1M through a servo system. Therefore, uniform three cutting elements of machine and tool, object, and feed thrust are realized, and the performance of the diamond tool is automatically and accurately measured.
    Type: Grant
    Filed: April 26, 2017
    Date of Patent: June 9, 2020
    Assignee: CHENGDU HUIFENG NEW MATERIAL TECHNOLOGY CO., LTD
    Inventors: Ding Yin, Hehui Guo, Hui Zou
  • Patent number: 10551288
    Abstract: A rotary blade sharpness tester is provided. The rotary blade sharpness tester comprises a rotary blade holder, supporting means for supporting a cuttable material, a moving mechanism to cause relative movement between the blade holder and the supporting means, and hence the cuttable material when supported on the supporting means, an activation means to activate a rotary blade held in the rotary blade holder and cause rotation of the blade before the blade comes into contact with the cuttable material. During the relative movement between the blade holder and supporting means the rotary blade movably contacts the material. The sharpness tester further comprises force measuring means operable in use to measure the force of the rotary blade on the cuttable material.
    Type: Grant
    Filed: November 18, 2015
    Date of Patent: February 4, 2020
    Assignee: Anago Limited
    Inventors: Peter Dowd, Stefan Van Woerden
  • Patent number: 10345800
    Abstract: Monitoring of a machine is performed by an acoustic monitor which acquires, through an acoustic sensor, acoustic signals from a vicinity of a machine, while the machine is operative. A processor calculates a frequency spectrum of a segment of the acquired acoustic signals, determines boundaries of a frequency band to be analyzed and extracts, from the calculated frequency spectrum, a base frequency window in the determined boundaries, and one or more harmonics windows of harmonics of the determined boundaries. For each of the base and harmonic windows a weight based on a distribution of values of frequencies in the windows is determined and a parameter of operation of the machine is calculated as a function of a weighted sum of the base and harmonic windows. The operation of the machine is evaluated responsive to the calculated parameter.
    Type: Grant
    Filed: December 19, 2016
    Date of Patent: July 9, 2019
    Assignee: 3D SIGNALS LTD.
    Inventors: Yair Lavi, Amit Ashkenazi, Ofer Affias, Amnon Shenfeld
  • Patent number: 10318675
    Abstract: An apparatus is provided for implementation of a post-processing system for providing post-processing analysis of a numerical model. The post-processing system may render a numerical model that represents a structural product by a mesh of elements. A dynamically adjustable user-defined string across the mesh is generated and a set of intermediate points that coincide with intersection of the string and edges of at least some of the elements of the mesh is created. An interpolated dataset, for which a plot is subsequently generated, is calculated from the nodal dataset and at least some nodal points. In response to adjustment of the string, a corresponding adjusted string is generated, a new set of intermediate points is created, and an interpolated dataset with which the new set of intermediate points is associated is calculated.
    Type: Grant
    Filed: July 13, 2015
    Date of Patent: June 11, 2019
    Assignee: The Boeing Company
    Inventor: Michael Charles Elford
  • Patent number: 10206339
    Abstract: The present invention concerns a method for the indication of the sharpness of the teeth at a harvesting head at a forestry machine, an arrangement for the execution of the method, and a forestry machine for the use of the arrangement during execution of the method.
    Type: Grant
    Filed: December 20, 2013
    Date of Patent: February 19, 2019
    Assignee: Komatsu Forest AB
    Inventors: William Schierschmidt, Peter Assarsson
  • Patent number: 9981675
    Abstract: An inspection system for use with a vehicle includes a database containing vehicle route data and at least one location of a route to be inspected. The database may be accessed by vehicles with on-board inspection systems so that they may inspect the location of route to be inspected.
    Type: Grant
    Filed: August 18, 2016
    Date of Patent: May 29, 2018
    Assignee: General Electric Company
    Inventors: Jared Klineman Cooper, Nicholas David Nagrodsky
  • Patent number: 9962843
    Abstract: A method and apparatus for measuring the cutting force on a single fiber. The method includes the steps of: providing a blade having an edge; providing a fiber mount for holding the single fiber; providing at least one sensor connected to the fiber mount; providing a fiber sleeve to contain a fiber within the fiber mount to simulate the location of the hair within the hair follicle; moving the blade toward the fiber and cutting the fiber; and measuring the cutting force on the fiber with the at least one sensor.
    Type: Grant
    Filed: May 30, 2017
    Date of Patent: May 8, 2018
    Assignee: The Gillette Company LLC
    Inventors: Matthias Gester, Anthony William Shorey
  • Patent number: 9891033
    Abstract: A tilt angle adjuster includes a base plate attached to a Z slider; a hanging plate attached to a measuring device main body; a thin coupling plate supporting the hanging plate such that the hanging plate is suspended on a first surface side of the base plate; biasers biasing the hanging plate so as to impart a rotational force in a first direction to the hanging plate; and a micrometer head provided so as to push the hanging plate one of directly and indirectly toward a second direction opposite the direction of the rotational force imparted by the biasers.
    Type: Grant
    Filed: March 29, 2016
    Date of Patent: February 13, 2018
    Assignee: MITUTOYO CORPORATION
    Inventors: Youhei Onodera, Nobuyuki Hama
  • Patent number: 9786404
    Abstract: There is provided a metal foil suitable for an electrode substrate for an electronic element, which makes it possible to suppress oxidation of the ultra-smooth surface and also prevent roll scratches when wound in a roll. The metal foil of the present invention is made of copper or copper alloy. The front surface of the metal foil has an ultra-smooth surface profile having an arithmetic mean roughness Ra of 30 nm or less as determined in accordance with JIS B 0601-2001. The back surface of the metal has a concave-dominant surface profile having a Pv/Pp ratio of 1.5 or more, the Pv/Pp ratio being a ratio of a maximum profile valley depth Pv to a maximum profile peak height Pp of a profile curve as determined in a rectangular area of 181 ?m by 136 ?m in accordance with JIS B 0601-2001.
    Type: Grant
    Filed: April 24, 2013
    Date of Patent: October 10, 2017
    Assignee: Mitsui Mining & Smelting Co., Ltd.
    Inventors: Yoshinori Matsuura, Nozomu Kitajima, Toshimi Nakamura, Masaharu Myoi
  • Patent number: 9558778
    Abstract: A lubricant compound is contained in a lubrication layer of a magnetic disk in which at least a magnetic layer, a protective layer, and a lubrication layer are sequentially provided on a substrate, and the lubricant compound contains a component A represented by Chemical formula 1 and a component B represented by Chemical formula 2: wherein X in Chemical formula 1 represents OH wherein X in Chemical formula 2 represents OCH2CH(OH)CH2OH, and the lubricant compound further contains a component C made of a specific compound having a phosphezene ring in the structure thereof.
    Type: Grant
    Filed: March 27, 2010
    Date of Patent: January 31, 2017
    Assignee: WD Media (Singapore) Pte. Ltd.
    Inventors: Kota Suzuki, Koichi Shimokawa, Katsushi Hamakubo, Kae Itoh
  • Patent number: 9528915
    Abstract: An metallographic system comprising a programmable controller, a robotic arm, a specimen clamping or holding device, a sectioning saw, a mounting station, a polishing station, a specimen preparation station, and an analyzer for examining the specimen.
    Type: Grant
    Filed: November 11, 2013
    Date of Patent: December 27, 2016
    Assignee: UES, INC.
    Inventors: Umesha P. S. Adiga, Daylond J. Hooper, Nina Joshi, Daniel S. Banks, Murali K. Gorantla
  • Patent number: 9527185
    Abstract: A test gauge for determining whether a tool holder assembly that utilizes a retention knob is properly assembled. The test gauge is mounted on a tool holder before the installation of a retention knob. Measurement devices, such as dial indicators, determine whether a “wobble” exists between the test gauge and the tapered surface of the tool holder and also provide a distance measurement between the test gauge and a reference surface on the tool holder. After installation of the retention knob, the test gauge is again placed on the tool holder in the same relative position and the distance between the test gauge and the reference surface is again observed. Any change in the distance measurement is an indication that the installation of the retention knob produced a distortion in the tool holder tapered surface which, if not corrected, can produce wear in the tool holder, the spindle and/or the cutting tool.
    Type: Grant
    Filed: December 1, 2015
    Date of Patent: December 27, 2016
    Inventor: John Wayne Stoneback
  • Patent number: 9476908
    Abstract: An object is mounted on a surface of a sample carrier. Properties of the surface of the object are measured and/or modified by means of a plurality of independently movable heads, each comprising a microscopic probe. The heads being located between the surface of a reference grid plate and the surface of the sample carrier. Head specific target locations are selected for the heads. Each head is moved over the surface of the reference grid plate, to the target location of the head. During movement a position of the head is determined from markings on the reference grid plate sensed by sensor in the head. When the sensor has indicated that the head is at the target location selected for the head a force between the head and the reference grid plate is switched to seat and/or clamp the head on the reference grid plate.
    Type: Grant
    Filed: June 27, 2013
    Date of Patent: October 25, 2016
    Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    Inventors: Rens Van Den Braber, Teunis Cornelis Van Den Dool, Hamed Sadeghian Marnani, Niek Rijnveld
  • Patent number: 9393663
    Abstract: Measuring device, in particular for in-process measurement of test pieces during a machining operation on a machine tool, in particular a grinding machine, has a measuring head which is movable relative to a base body of the measuring device between a neutral position and a measuring position in which the measuring head is in measuring contact with the test piece. At least one angle sensor is associated with the measuring head for detecting the angular position of the measuring head, in particular changes in the angular position of the measuring head relative to the test piece, during a measuring operation.
    Type: Grant
    Filed: August 22, 2011
    Date of Patent: July 19, 2016
    Assignee: HOMMEL-ETAMIC GmbH
    Inventor: Raimund Volk
  • Patent number: 9322631
    Abstract: A method of calibrating a surface measurement instrument includes rotating a work piece having an undulating surface on a turntable of a metrological apparatus; measuring the surface of the work piece at a plurality of rotational positions; analyzing the results of the measurement to determine parameters describing an error causing characteristic of the metrological apparatus; and using the determined parameters to correct measurement data for the error causing characteristic of the metrological apparatus.
    Type: Grant
    Filed: March 1, 2011
    Date of Patent: April 26, 2016
    Assignee: Taylor Hobson Limited
    Inventor: Paul J. Scott
  • Patent number: 9278378
    Abstract: Method and system for x-ray detection of flaws in containers or their contents wherein containers are conveyed on a circular path around a central axis upon which an x-ray source is situated below the plane of the base of the containers. The x-ray source emits x-ray radiation obliquely upwards through the containers to a plurality of imaging x-ray detectors. Analysis of the images provided by these x-ray detectors determines the presence of a flaw in a container or its contents and is used to command a rejection mechanism to reject the container in question.
    Type: Grant
    Filed: June 13, 2012
    Date of Patent: March 8, 2016
    Assignee: WILCO AG
    Inventor: Martin Lehmann
  • Patent number: 9261438
    Abstract: A method of preparing a sample for matrix assisted laser desorption ionization mass spectrometry imaging analysis by a two-step process. Firstly, a MALDI matrix is dusted on to the sample followed by a spray of a suitable solvent onto the dusted sample. The present method has been successfully applied to the detection and mapping of several analyte classes in latent fingermarks. Using the present two-step method, fingermark enhancement, recovery and analysis from different substrate surfaces is now possible enabling visual and chemical information to be obtained simultaneously via remote testing.
    Type: Grant
    Filed: March 1, 2012
    Date of Patent: February 16, 2016
    Assignee: SHEFFIELD HALLAM UNIVERSITY
    Inventors: Leesa Susanne Ferguson, Rosalind Wolstenholme, Simona Francese
  • Patent number: 9255858
    Abstract: A method for measuring the cutting force on a fiber. The method includes the steps of: providing a blade having an edge; providing a fiber mount for holding the fiber; providing at least one sensor connected to the fiber mount; moving the blade toward the fiber and cutting the fiber; and measuring the cutting force on the fiber with the at least one sensor.
    Type: Grant
    Filed: February 15, 2011
    Date of Patent: February 9, 2016
    Assignee: The Gillette Company
    Inventors: Mark David Vallon, Matthias Gester
  • Patent number: 9234904
    Abstract: An apparatus comprises an inspection vehicle, a sensor system, a positioning system, a controller, and a support system. The inspection vehicle is configured to move on a surface of an object. The sensor system is associated with the inspection vehicle and is configured to generate information about the object when the inspection vehicle is on the surface of the object. The positioning system is configured to determine a location of the inspection vehicle on the object. The controller is configured to control movement of the inspection vehicle using the positioning system and control operation of the sensor system. The support system is connected to the inspection vehicle and is configured to support the inspection vehicle in response to an undesired release of the inspection vehicle from the surface of the object.
    Type: Grant
    Filed: January 8, 2014
    Date of Patent: January 12, 2016
    Assignee: THE BOEING COMPANY
    Inventors: James J. Troy, Gary Ernest Georgeson, Karl Edward Nelson, Scott Wesley Lea
  • Patent number: 9170084
    Abstract: A surface texture measuring method includes: moving a stylus toward an origin point; and, when the stylus reaches the origin point, braking the stylus to be stopped after overrunning the origin point waiting for a measurement start command (approach section setting operation); bringing the stopped stylus into contact with a target portion of the workpiece (workpiece setting operation); moving the stopped stylus in a measurement direction reverse to the overrunning (approach operation); and, when the stylus passes the origin point in the approach operation, continuing the movement of the stylus while acquiring data detected by the detector (measurement operation).
    Type: Grant
    Filed: February 28, 2013
    Date of Patent: October 27, 2015
    Assignee: MITUTOYO CORPORATION
    Inventors: Hiroomi Honda, Shingo Kuroki
  • Patent number: 9151589
    Abstract: A surface texture measurement device capable of resolving errors for each entire display range, a controller for the surface texture measurement device, and a method for controlling the surface texture measurement device that includes selecting any one of the display ranges as a reference range and defining a calibration measurement value for each display range; sequentially inputting the calibration measurement values in place of the measurement values to the range amplifier corresponding to the reference range to obtain a reference display value rDATAi; inputting the calibration measurement values to the range amplifiers corresponding to each display range, then obtaining an AD-converted value ADi and a display value DATAi; computing a gain error rate ki=rDATAi/DATAi, a display resolution DIVi=DATAi/ADi, and a corrected display resolution cDIVi=DIVi×ki; and displaying the corrected display value cDIVi=DIVi×ki.
    Type: Grant
    Filed: March 1, 2013
    Date of Patent: October 6, 2015
    Assignee: MITUTOYO CORPORATION
    Inventors: Toshihiro Kanematsu, Hiroomi Honda
  • Patent number: 9085456
    Abstract: An embodiment is a method for forming a microelectromechanical system (MEMS) device. The method comprises forming a MEMS structure over a first substrate, wherein the MEMS structures comprises a movable element; forming a bonding structure over the first substrate; and forming a support structure over the first substrate, wherein the support structure protrudes from the bonding structure. The method further comprises bonding the MEMS structure to a second substrate; and forming a through substrate via (TSV) on a backside of the second substrate, wherein the overlying TSV is aligned with the bonding structure and the support structure.
    Type: Grant
    Filed: May 14, 2012
    Date of Patent: July 21, 2015
    Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
    Inventors: Yi Heng Tsai, Kuei-Sung Chang, Hung-Chia Tsai
  • Patent number: 9016113
    Abstract: A testing device and method for testing scissors are disclosed. The testing device includes a mount device. The mount device includes a first mount feature for mounting a first grip end of the scissors thereon and a second mount feature movable with respect to the first mount feature for mounting a second grip end of the scissors thereon. The testing device additionally includes a feed device positioned to provide a test media between a first blade and a second blade of the scissors. The testing device further includes a position sensor associated with the mount device for measuring movement of the second grip end, and a load sensor associated with the mount device for measuring a load required for the scissors to cut the test media.
    Type: Grant
    Filed: January 16, 2013
    Date of Patent: April 28, 2015
    Assignee: Wolff Industries, Inc.
    Inventors: Walker Newell, David Scott Vogel
  • Patent number: 9016104
    Abstract: A process for producing a reference body (10) provided with a slot (17) as a test crack for the nondestructive testing of materials can be used flexibly and includes the following steps: a) a reference body (10) and a mask (11) provided with a slot pattern (12) are provided; b) the mask (11) is applied to the reference body (10); c) material is removed from the reference body (10) through the mask (11) with an abrasive water jet (16); and d) the mask (11) is taken off the reference body (10).
    Type: Grant
    Filed: April 6, 2010
    Date of Patent: April 28, 2015
    Assignee: Alstom Technology Ltd.
    Inventors: Roland Richard Moser, Philipp Roth
  • Patent number: 8991246
    Abstract: A gear measuring method allows multi-point continuous measurement using a touch probe and is capable of reducing measuring time compared with known methods. For example, a base action for moving a sensing element of a touch probe along an ideal tooth form line of a workpiece (gear; W) or a tooth form line determined by calculation by controlling the movement of the sensing element and the rotation of the workpiece (W) and, in addition, an oscillation action for receiving first signals (ON signals or OFF signals) from the touch probe by bringing the sensing element into contact with the tooth surface of the workpiece during the base action and subsequently for receiving second signals (OFF signals or ON signals) from the touch probe by moving the touch probe in a direction along which the sensing element is separated from the tooth surface of the workpiece are continuously performed.
    Type: Grant
    Filed: September 15, 2010
    Date of Patent: March 31, 2015
    Assignee: Mitsubishi Heavy Industries, Ltd.
    Inventors: Yoko Hirono, Takahide Tokawa, Naohiro Otsuki, Yoshihiro Nose
  • Patent number: 8978261
    Abstract: A measurement system has a surface sensing device mounted on an articulating probe head, which in turn is mounted on a coordinate positioning apparatus. The surface sensing device is moved relative to a surface by driving at least one of the coordinate positioning apparatus and probe head in at least one axis to scan the surface. The surface sensing device measures its distance from the surface and the probe head is driven to rotate the surface sensing device about at least one axis in order to control the relative position of the surface sensing device from the surface to within a predetermined range in real time.
    Type: Grant
    Filed: July 21, 2011
    Date of Patent: March 17, 2015
    Assignee: Renishaw PLC
    Inventors: Geoffrey McFarland, Kenneth Cheng Hoe Nai, Nicholas John Weston, Ian William McLean
  • Patent number: 8969088
    Abstract: A substrate mimicking intercellular lipids in stratum corneum consisting of a substrate and a lipid membrane formed on the substrate, wherein the lipid membrane is formed from ceramide, palmitic acid and cholesterol, and the ceramide, palmitic acid and cholesterol are present at a mass ratio of 20-70%:10-60%:20-40% (ceramide:palmitic acid:cholesterol).
    Type: Grant
    Filed: September 1, 2009
    Date of Patent: March 3, 2015
    Assignee: Shiseido Company, Ltd.
    Inventors: Takuya Saiwaki, Takashi Oka, Yuichiro Mori, Toyoko Imae, Xiaojuan Wang, Masaki Ujihara
  • Publication number: 20150047423
    Abstract: An edge sharpness measurement apparatus includes a clamp for securing a test medium against a frictional member, and an engagement mechanism for a normal force, such that the normal force directs the test medium against the frictional member with a force based on operational conditions of the test medium. A further engagement mechanism is for a tangential force, in which the engagement mechanism is adapted to increase the tangential force to identify a tangential force sufficient to dispose the frictional member across the test medium. A pivot defines an angle of application of the tangential force relative to the normal force, such that disposing the frictional member across the test medium defines a point of overcoming frictional forces between the test medium and the frictional member. A measurement device, such as a gauge or range on a spring, measures the tangential force sufficient to dispose the frictional member.
    Type: Application
    Filed: July 25, 2014
    Publication date: February 19, 2015
    Inventors: Christopher Brown, Jocelyn Close, Jason Hopkins, Michael Dragonas, Frank Bruton
  • Patent number: 8951652
    Abstract: A substrate for a magnetic recording medium having a disc shape with a central hole is provided in which the surface roughness of the principal surface of the substrate is 1 angstrom or less in terms of root mean square roughness (Rq) when a space period (L) of an undulation in the circumferential direction is in the range 10 to 1,000 ?m, and in which when a component in the vertical axis direction of a line segment Z connecting a point A with the space period (L) of 10 ?m and a point B with the space period (L) of 1,000 ?m in a curve S marked on a double logarithmic graph which is obtained by analyzing the surface roughness using a spectrum and in which the horizontal axis is set to the space period (L) (?m) and the vertical axis is set to the power spectrum density (PSD) (k·angstrom2·?m) (where k is a constant) is defined as H and a displacement at which the component in the vertical axis direction of the curve S is the maximum with respect to the line segment Z is defined as ?H, a value (P) expressed by (?
    Type: Grant
    Filed: November 28, 2012
    Date of Patent: February 10, 2015
    Assignee: Showa Denko K.K.
    Inventors: Koji Yukimatsu, Yukihisa Matsumura, Yoshihito Sueoka, Junichi Kishimoto
  • Patent number: 8915117
    Abstract: Intrinsically calibrating friction mensuration device has a drive unit with controllable motive member, configured to receive a controllable propulsion force, and to apply tractive force to a test piece on a surface. A force engine couples to the motive member, and applies the controllable propulsion force. The device includes a controller imposing a propulsion control signal actuating the force engine to produce the propulsion force. A force sensor is between the drive unit and the test piece, producing a force signal responsive to a sensed force between the drive unit and the test piece. The drive unit can self-propelled or stationary. A method includes applying an increasing tractive force to a test piece at rest; measuring the tractive force; identifying the maximum tractive force applied at incipient motion; identifying the transition between the resting test piece and incipient motion; determining the SCOF; continuing motion; and determining the DCOF.
    Type: Grant
    Filed: January 8, 2014
    Date of Patent: December 23, 2014
    Inventor: Fred M. Johnson
  • Patent number: 8915124
    Abstract: A surface texture measuring apparatus includes a stylus displacement detector having a measurement arm which is able to swing, a pair of styli provided at a tip of the measurement arm, and a detection unit configured to detect swing amounts of the measurement arm, a stage configured to mount the subject of measurement thereon, and a relative movement mechanism configured to cause a relative movement between the detector and the stage. The apparatus includes a posture switching mechanism configured to switch a posture of the measurement arm between a posture in which the measurement arm is urged in one swing direction and a posture in which the measurement arm is urged in the other swing direction, and a speed control mechanism configured to control a switching speed of posture switching of the measurement arm to a preset speed when the posture of the measurement arm is switched by the posture switching mechanism.
    Type: Grant
    Filed: February 21, 2012
    Date of Patent: December 23, 2014
    Assignee: Mitutoyo Corporation
    Inventor: Tatsuki Nakayama
  • Patent number: 8845555
    Abstract: The present invention provides a sensor system for measuring an elastic modulus and a shear modulus and a method for using the sensor system to evaluate a tissue by determining the presence of and/or characterizing abnormal growths. The method involves applying a set of forces of different magnitudes to one or more locations of tissue, detecting the corresponding displacements due to said applied forces, determining the forces acting on those locations of tissue which are a combination of forces from the applied voltages and the countering forces from tissue deformation, obtaining the elastic modulus and/or shear modulus for a plurality of locations, and determining abnormal growth invasiveness, malignancy or the presence of a tumor from said elastic and/or shear moduli.
    Type: Grant
    Filed: September 19, 2013
    Date of Patent: September 30, 2014
    Assignees: Drexel University, Philadelphia Health & Education Corporation
    Inventors: Wan Y. Shih, Wei-Heng Shih, Hakki Yegingil, Ari D. Brooks
  • Publication number: 20140238119
    Abstract: A method for obtaining an edge prep profile of a cutting tool with a point sensor. The method includes: (a) scanning edge points of the cutting tool, including a target edge point on a target edge, with the point sensor, by rotating the cutting tool around its axis, to generate a first point cloud; (b) repositioning the point sensor and cutting tool relative to each other based on the location and orientation information of the target edge point, such that the sensor focus is at a region of interest containing the target edge point; and (c) scanning the region of interest using the point sensor to generate a second point cloud. The first point cloud includes location and orientation information of the target edge point. The second point cloud includes information for edge profile analysis.
    Type: Application
    Filed: August 29, 2012
    Publication date: August 28, 2014
    Inventors: Xiaoming Du, Kevin George Harding, Howard Paul Weaver, James Allen Baird, Kevin William Meyer, Jiajun Gu
  • Patent number: 8766219
    Abstract: A method of operating a particle beam microscopy. A particle beam is scanned across a scanning region of a surface of the object. Particles are detected by a detector system for a plurality of impingement locations of the primary beam within the scanning region. A detector system generates detector signals which represent for each of the impingement locations an intensity of the detected particles. Material data of the interaction regions are calculated depending on the detector signals and depending on topography data, which represent a topography of the object surface in the scanning region.
    Type: Grant
    Filed: September 10, 2013
    Date of Patent: July 1, 2014
    Assignee: Carl Zeiss Microscopy GmbH
    Inventors: Michel Aliman, Jaroslaw Paluszynski, Wolfgang Berger
  • Patent number: 8726409
    Abstract: A method for operating a scanning probe microscope at elevated scan frequencies has a characterization stage of sweeping a plurality of excitation frequencies of the vertical displacement of the scanning element; measuring the value attained by the reading parameter at the excitation frequencies; and identifying plateau regions of the response spectrum of the reading parameter. The reading parameter variation is limited within a predetermined range over a predefined frequency interval, thereby defining corresponding fast scanning frequency windows in which the microscope assembly is sufficiently stable to yield a lateral resolution comparable to the one obtained during slow measurements. The measurement stage includes driving the scanning element along at least a scanning trajectory over the surface of the specimen at a frequency selected among the frequencies included in a fast scanning frequency window.
    Type: Grant
    Filed: September 12, 2011
    Date of Patent: May 13, 2014
    Assignee: Consiglio Nazionale Delle Ricerche
    Inventors: Friedrich Esch, Carlo Dri, Giovanni Comelli, Cristina Africh, Alessio Spessot
  • Publication number: 20140123740
    Abstract: Provided are a device and a method which determine a threshold value for detecting abnormality in a working path in which the cutting condition changes momentarily to thereby enable abnormality determination. Cutting force that becomes an abnormality determination value and threshold value information are previously calculated by cutting simulation, and a threshold value with which a comparison is to be made is determined from the position coordinates of a working machine which have been acquired during cutting and the measurement result of cutting force to thereby enable abnormality determination.
    Type: Application
    Filed: May 7, 2012
    Publication date: May 8, 2014
    Applicant: Hitachi, Ltd.
    Inventors: Takehisa Yoshikawa, Hideaki Onozuka, Nobuaki Nakasu
  • Patent number: 8713998
    Abstract: An apparatus comprises an inspection vehicle, a sensor system, a positioning system, a controller, and a support system. The inspection vehicle is configured to move on a surface of an object. The sensor system is associated with the inspection vehicle and is configured to generate information about the object when the inspection vehicle is on the surface of the object. The positioning system is configured to determine a location of the inspection vehicle on the object. The controller is configured to control movement of the inspection vehicle using the positioning system and control operation of the sensor system. The support system is connected to the inspection vehicle and is configured to support the inspection vehicle in response to an undesired release of the inspection vehicle from the surface of the object.
    Type: Grant
    Filed: June 14, 2011
    Date of Patent: May 6, 2014
    Assignee: The Boeing Company
    Inventors: James J. Troy, Gary Ernest Georgeson, Karl Edward Nelson, Scott Wesley Lea
  • Patent number: 8695398
    Abstract: Intrinsically calibrating friction mensuration device has a drive unit with controllable motive member, configured to receive a controllable propulsion force, and to apply tractive force to a test piece on a surface. A force engine couples to the motive member, and applies the controllable propulsion force. The device includes a controller imposing a propulsion control signal actuating the force engine to produce the propulsion force. A force sensor is between the drive unit and the test piece, producing a force signal responsive to a sensed force between the drive unit and the test piece. The drive unit can self-propelled or stationary. A method includes applying an increasing tractive force to a test piece at rest; measuring the tractive force; identifying the maximum tractive force applied at incipient motion; identifying the transition between the resting test piece and incipient motion; determining the SCOF; continue motion and determine the DCOF.
    Type: Grant
    Filed: March 25, 2011
    Date of Patent: April 15, 2014
    Inventor: Fred M. Johnson
  • Publication number: 20140090455
    Abstract: A method and system is provided to detect deformations on a sheet metal panel. The method includes swiping the sheet metal panel's surface through a screening material to screen the deformations present on the sheet metal panel's surface, thereby establishing screened deformations. Further, rubbing an area around the screened deformations through a stone material determines the size of the screened deformations. Finally, measuring the size of screened deformations according to a measuring rule establishes a nature of the screened deformation.
    Type: Application
    Filed: September 28, 2012
    Publication date: April 3, 2014
    Applicant: FORD GLOBAL TECHNOLOGIES, LLC
    Inventors: Carlos Gonzalez Valencia, Ana Belen Flex Villalba
  • Patent number: 8686358
    Abstract: Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided method enables sub-microsecond time-resolved measurement of transient, or time-varying, forces acting on a cantilever.
    Type: Grant
    Filed: September 14, 2011
    Date of Patent: April 1, 2014
    Assignee: University of Washington through its Center for Commercialization
    Inventors: David Ginger, Rajiv Giridharagopal, David Moore, Glennis Rayermann, Obadiah Reid
  • Patent number: 8650939
    Abstract: A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center position calculating unit that, when the image probe enters position data of at least three points on a circular contour of a circular concave portion or a circular convex portion of an object, approximates the entered position data to a circle to obtain a center position of the circle; and a stylus setting unit that, after calculating the center position, operates the relative movement mechanism to position the stylus of the contact-type detector at the center position.
    Type: Grant
    Filed: October 8, 2010
    Date of Patent: February 18, 2014
    Assignee: Mitutoyo Corporation
    Inventors: Sadayuki Matsumiya, Yoshiyuki Omori, Sadaharu Arita, Kotaro Hirano, Yasushi Fukumoto, Koichi Komatsu, Fumihiro Takemura
  • Patent number: 8596116
    Abstract: Systems and methods are disclosed that provide improved non-destructive testing of pavements and in particular non-destructive testing of pavements using rolling wheel deflectometer systems having more than four sensors. The additional sensors more accurately detect pavement deflections under load by compensating for the influence the load deflection basin can have on sensors beyond those at the wheel load. The sensors should be spaced with equal distances from the rolling weight and can have a distance between adjacent sensors that is greater than the equivalent thickness of the pavement being measured.
    Type: Grant
    Filed: October 18, 2010
    Date of Patent: December 3, 2013
    Assignee: Dynatest International A/S
    Inventor: Per Ullidtz
  • Patent number: 8573035
    Abstract: The invention relates to a method for measuring and/or testing a geometric design parameter, particularly waviness, of a planar textile (10), comprising the steps: disposing the planar textile (10) in an intermediate space (26) between a support (20) and a flexible film (22), applying a differential pressure (?p) between the intermediate space (26) and the environment, so that the film (22) adapts to the planar textile (10), and capturing a surface profile (32) of the film (22).
    Type: Grant
    Filed: September 30, 2009
    Date of Patent: November 5, 2013
    Assignee: Airbus Operations GmbH
    Inventors: Julian Kuntz, Jan Wessels, Frederik Lehners
  • Patent number: 8562546
    Abstract: The present invention provides a sensor system for measuring an elastic modulus and a shear modulus and a method for using the sensor system to evaluate a tissue by determining the presence of and/or characterizing abnormal growths. The method involves applying a set of forces of different magnitudes to one or more locations of tissue, detecting the corresponding displacements due to said applied forces, determining the forces acting on those locations of tissue which are a combination of forces from the applied voltages and the countering forces from tissue deformation, obtaining the elastic modulus and/or shear modulus for a plurality of locations, and determining abnormal growth invasiveness, malignancy or the presence of a tumor from said elastic and/or shear moduli.
    Type: Grant
    Filed: May 15, 2009
    Date of Patent: October 22, 2013
    Assignee: Drexel University
    Inventors: Wan Y. Shih, Wei-Heng Shih, Hakki Yegingil, Ari D. Brooks
  • Patent number: 8544317
    Abstract: A method and apparatus provide for simultaneously moving multiple semiconductor wafers in opposite directions while simultaneously performing processing operations on each of the wafers. The semiconductor wafers are orientated in coplanar fashion and are disposed on stages that simultaneously translate in opposite directions to produce a net system momentum of zero. The die of the respective semiconductor wafers are processed in the same spatial sequence with respect to a global alignment feature of the semiconductor wafer. A balance mass is not needed to counteract the motion of a stage because the opposite motions of the respective stages cancel each other.
    Type: Grant
    Filed: October 9, 2009
    Date of Patent: October 1, 2013
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Yu-Fu Lin, Yung-Cheng Chen, Heng-Jen Lee, Chin-Hsiang Lin