Abstract: A method and an apparatus for detecting relative changes in the surface energy of a test surface by adhering a tacky sampling surface to the test surface and removing the tacky sampling surface from the test surface while measuring the force and speed of removal. The measured force and speed of removal is used to compute a relative surface energy, which is compared to a standard value for that surface. This technique has utility for monitoring the cleanliness of surfaces in printing, adhesive and paint application, display and semiconductor fabrication, and generally test surfaces requiring cleanliness and which cannot readily be transported to or configured for an existing surface analysis technique.

Abstract: A surface capacity parameter is determined for a surface of an article having irregularities therein that can be characterized by peaks and valleys relative to a reference point. Initially, an area of interest on the surface of the article and a lateral resolution of that area of interest are determined. An apparatus generates a visual representation of the area of interest on the surface of the article. A deflection contact part factor for the article is calculated, and a bearing ratio curve level is determined based upon the calculated deflection contact part factor and the magnitude of the height or distance between the tallest peak and the lowest valley on the surface of the article. The volume of the material comprising the peaks in the surface of the article and the volume of the space in the surface of the article that is available for the retention of a fluid, such as a lubricant, are determined.

Abstract: A method and system of evaluating a turbine component comprises obtaining data relating to respective surface conditions at a plurality of different surface locations of the turbine component and calculating the total profile efficiency loss for the turbine component based on the data. Calculating the total profile efficiency of the turbine component may include calculating the local profile efficiency loss percentage for each of the surface conditions at the different surface locations (and/or sub-areas of the different surface locations) and calculating an average of the local profile efficiency loss percentages, each of the local efficiency loss percentages being weighted by respective predetermined weight factors. The turbine component may be a nozzle or a bucket and each of the turbine component's surface locations may be an admission suction surface, an admission pressure surface, a discharge suction surface or a discharge pressure surface.

Abstract: A method and apparatus is provided for making impressions of edges and profiling the edges using a profiling machine. The apparatus allows the impressionable material used for forming the impression to be held in a fixed position while the impression of the edge is formed, and then allows the impression to be withdrawn in a manner that leaves the impression substantially unchanged and substantially true to the profile of the edge. The apparatus also comprises fittings to make the apparatus compatible with a profiling machine and allows the impression to be positioned in the profiling machine in substantially the same orientation every time an impression is taken.

Abstract: A surface analyzing system including in one system both an integrating optical instrument, such as a scatterometer, and individual-feature-measuring instrument, such as a scanning probe microscope or a beam imaging system, for example, a scanning electron microscope. In a preferred embodiment, the two instruments are capable of characterizing a wafer held on a common stage. The stage may be movable a predetermined displacement to allow the same area of the wafer to be characterized by a scatterometer at one position of the stage and to be characterized by the scanning probe microscope or beam imaging system. The scatterometer can rapidly measure wafers to indicate whether a problem exists, and the scanning probe microscope can perform detailed measurements on wafers flagged by the scatterometer.

Abstract: Apparatus and a method for locating edges of a part for acceptance testing of the part. A white light source (12) illuminates the part which is mounted on a support (14) and rotated relative to the light source. Light reflected by the part creates an outline of the part along the edge thereof. The part is viewed by a camera (16) to obtain an image of the part including its edge. A processor (18) analyzes the image to locate the edge of the part in three dimensional space. Analysis of the image includes determining the number of pixels comprising the viewed image, at the edge thereof, as the part is rotated relative to the light source. The part has more than one edge, and each edge is located using the method. The locations of the edges of the part are now used in a co-ordinate system to locate other surface features of the part.

Abstract: A wire joint detecting apparatus is provided for use with a wire connecting apparatus. A detecting apparatus includes a detector disposed for sliding contact with a running wire. The detector is mounted for pivotal movement in response to cross-sectional dimensional changes of the wire. The apparatus also includes a detection switch for detecting pivotal movement of the detector. The pivotal movement of the detector is indicative of a cross-sectional dimensional change of the wire that indicates the presence of a joint.

Abstract: A device for detecting a running surface for a vehicle, comprising a plurality of sensors (c1 to c8) designed to be oriented towards the running surface to detect modifications thereof, data processing means for processing data derived from the sensors, wherein the sensors are relatively arranged so as to associate at least part of the points of aim on the ground (v1 to v8) in pairs (p1 to p4), the two points of aim on ground the ground being spaced apart by a first specific distance, and the transverse distances separating two adjacent pairs (p1 to p4) of points of aim on the ground increase towards a longitudinal axis along a direction substantially perpendicular to said axis.

Abstract: An apparatus and method for detecting characteristics of a microelectronic substrate. The microelectronic substrate can have a first surface with first topographical features, such as roughness elements, and a second surface facing opposite from the first surface and having second topographical features, such as protruding conductive structures. In one embodiment, the apparatus can include a support member configured to carry the microelectronic substrate with a first portion of the first surface exposed and a second portion of the second surface exposed. The apparatus can further include a topographical feature detector positioned proximate to support member and aligned with the first portion of the first surface of the microelectronic substrate to detect characteristics, such as a roughness, of the first surface while the microelectronic substrate is carried by the support member.

Abstract: In the roughness measuring apparatus, a parameter to be evaluated and its maximum value are set by using a keyboard. If there is an evaluated area with a roughness over the maximum value among the roughness values which have been computed, a roughness is computed by using only measurement data of an evaluated area with a roughness value which is the same or under the maximum value, and a roughness is computed by using only measurement data of an evaluated area with a roughness value over the maximum value.

Abstract: A micro-object having a desired sharp point or edge may be optically tested during fabrication. This is accomplished by applying a known force to the workpiece against an optically opaque layer disposed on a transparent substrate, passing light down the workpiece toward the opaque layer, and determining whether the shaped portion of the workpiece has sufficiently penetrated the opaque layer so that light passed through the workpiece can be detected on the remote side of the transparent substrate. If the light is not detected, the shaped portion of the workpiece is considered to be insufficiently sharp, and the workpiece can be subjected to further shaping operations. In another arrangement, after the force is applied to cause penetration of the opaque layer by the shaped portion of the workpiece, the substrate and the workpiece are moved laterally with respect to one another so as to form a scratch on the opaque layer.

Abstract: Cantilever for a scanning probe microscope (SPM) including a substrate having a tip, a piezoactuator on the substrate movable in response to an external electric signal, and a sensor formed around the piezoactuator so as not to overlap with the piezoactuator, thereby minimizing inner couplings.

Abstract: A stylus structure (40) integrally incorporating a stylus (2), a vibrator (4), a detector (6), a first secondary magnetic circuit (12) and a second primary magnetic circuit (21), and a stylus support (30) integrally incorporating a first primary magnetic circuit (11) and a second secondary magnetic circuit (22) are mutually fittable, thereby achieving signal transmission by the respective magnetic circuits using no electrical contact.

Abstract: A tunnel effect nanodetector. A gold plated sensor pin is single crystal silicon. A gold plated sensor membrane is polycrystalline silicon over a pin. Through holes are in the membrane and gold. Corrugations are along membrane boundaries. The nanodetector includes a unit for maintenance of gap between the pin and membrane. The unit includes a deflection electrode and tunnel current limiter. Gold on the membrane is connected to an input voltage. Gold on the pin is connected to a tunnel current amplifier and tunnel current limiter, the output of which is connected to the deflection electrode. The capacitance measuring unit is connected to the deflection electrode and gold on the membrane. The tunnel current amplifier and capacitance measuring unit are connected to an A/D converter. The sensor, gap maintenance unit, tunnel current amplifier, capacitance measuring unit and A/D converter are a monolithic integrated circuit. The nanodetector electronics are polycrystalline silicon.

Abstract: Methods and systems for controlling motion of and optically tracking a mechanically unattached probe (202) in three-dimensions are disclosed. A mechanically unattached magnetic probe (202) is placed in the system under test. The position of the probe is optically tracked in three dimensions by sensing light scattered by the probe and direct light from a light source. Magnetic poles (200) positioned about the probe are selectively magnetized to control motion of the probe in three dimensions by minimizing error between a sensed position and a desired position. In one implementation, the coil currents are time division multiplexed such that the average force on the probe produces motion in a desired direction.

Abstract: An alarm system for a casting mold is provided, which includes an alarm electrically connected to the casting mold; and at least one sensing unit electrically connected to the alarm, and spaced apart by a predetermined gap from a cast to be drawn from the casting mold. During a drawing process, if the cast is formed with failure in appearance such as deformation, burr edges or uneven thickness, the cast drawn out of the casting mold would come into contact with the sensing unit and thereby induce the alarm to generate an alarm signal to notify an operator who may immediately solve any operational problems.

Abstract: An apparatus for cutting a liquid crystal display panel includes a cutting wheel having a spindle shape substantially corresponding to two conical shapes being attached to each other at circular bottom surfaces, a cutting blade along a central portion of the cutting wheel, a holder to which the cutting wheel is mounted, and a support part at the holder, the support part fixing and supporting the cutting wheel.

Abstract: A scanning unit for moving an object to be moved along at least one axis, which comprises a first actuator for moving the object along a first axis, the first actuator having a pair of end portions, and the object being attached to one of the end portions, the first actuator being held at a position in the vicinity of the center in dimension or the center of gravity thereof.

Abstract: Devices are presented which allow determination of unknown surface properties through the creation of a channel capillary, comprised in part of the subject surface or surfaces, and measurement of the capillary pressure created by a test fluid within the resultant channel. In various embodiments of the invention, a channel is created in a reference material which is bonded, through some mechanism, to the test surface in order to create a narrow capillary channel. In other embodiments of the invention, the capillary channel is created with test surfaces on either side of standoff strips which space the surfaces a precise distance from one another. Methods are presented for using these capillaries through immersion, along their length, in a bath of test fluid, such that the resultant fluid level provides a measure of capillary pressure.

Abstract: A conductive probe for a scanning type microscope that captures the substance information of the surface of a specimen by the tip end of a conductive nanotube probe needle fastened to a cantilever, in which the conductive probe is constructed from a conductive film formed on the surface of the cantilever, a conductive nonatube with its base end portion being fixed in contact which the surface of a predetermined of the cantilever, and a conductive deposit which fastens the conductive nanotube by covering from the base end portion of the nonatube to a part of the conductive film. The conductive nonatube and the conductive film are electrically connected to each other by the conductive deposit.

Abstract: An apparatus and a method testing liquid crystal display panel which are able to test whether or not burr remains on longer sides and on shorter sides of a unit liquid crystal display panel using first to fourth testing bars in a touch method, and able to measure a distance between the longer sides and a distance between the shorter sides of the unit liquid crystal display panel.

Abstract: An apparatus and method for detecting characteristics of a microelectronic substrate. The microelectronic substrate can have a first surface with first topographical features, such as roughness elements, and a second surface facing opposite from the first surface and having second topographical features, such as protruding conductive structures. In one embodiment, the apparatus can include a support member configured to carry the microelectronic substrate with a first portion of the first surface exposed and a second portion of the second surface exposed. The apparatus can further include a topographical feature detector positioned proximate to support member and aligned with the first portion of the first surface of the microelectronic substrate to detect characteristics, such as a roughness, of the first surface while the microelectronic substrate is carried by the support member.

Abstract: A method of making a probe having a cantilever and a tip include providing a substrate having a surface and forming a tip extending substantially orthogonally from the surface. The method includes depositing an etch stop layer on the substrate, whereby the etch stop layer protects the tip during process. A silicon nitride layer is then deposited on the etch stop layer. An etch operation is used to release the cantilever and expose the etch stop layer protecting the tip. Preferably, the tip is silicon and the cantilever supporting the tip, preferably via the etch stop layer, is silicon nitride. A probe for a surface analysis instrument made according to the method includes a tip and a silicon nitride cantilever having a thickness defined during the deposition process.

Abstract: An apparatus for inspecting rubbing inferiority of an alignment film of a liquid crystal display device by spraying moisture particles, the apparatus including a moisture storing unit for storing moisture, and a moisture particle generating unit for pelletizing moisture ejected from the moisture storing unit and spraying on a substrate.

Abstract: An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, a guide mechanism for supporting and guiding the measuring probe in an axial direction of the measuring probe, a tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle with respect to a horizontal direction so that the measuring probe contacts the surface of the object to be measured with a predetermined contact force, and a drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.

Abstract: The present invention is directed to a system for detecting leaks in weather-proof enclosures, such as buildings or automobile bodies, including small leaks that are active only when the automobile is driven at high speed in rain or snow. An applicator includes a chamber in between a pressurized water inlet and a discharge nozzle. A user points the nozzle at a suspected leak area in the enclosure and turns on the water supply to create a water stream through the applicator. As the stream passes through the chamber, fluorescent dye is drawn or displaced from a dye reservoir and mixed with the water. A mixture of fluorescent dye and water is thereby sprayed onto the suspected leak area through the nozzle. The interior of the enclosure is inspected with an inspection lamp to determine if the suspected leak area includes a leak.

Abstract: In advance to measuring texture of the workpiece by a surface texture measuring machine (1), a workpiece orientation adjustment stage (10) is manually moved by the surface texture measuring machine (1) in accordance with calculated orientation correction amount of the workpiece, thus adjusting orientation of the workpiece. Since it is only necessary for an operator to operate respective adjustment means until reaching a displayed correction amount, operation thereof can be facilitated and orientation thereof can be highly accurately adjusted without impairing operability.

Abstract: A method and an apparatus for detecting relative changes in the surface energy of a test surface by adhering a tacky sampling surface to the test surface and removing the tacky sampling surface from the test surface while measuring the force and speed of removal. The measured force and speed of removal is used to compute a relative surface energy, which is compared to a standard value for that surface. This technique has utility for monitoring the cleanliness of surfaces in printing, adhesive and paint application, display and semiconductor fabrication, and generally test surfaces requiring cleanliness and which cannot readily be transported to or configured for an existing surface analysis technique.

Abstract: A measurement device, i.e. a metrology tool, and a vehicle are combined to provide a mobile metrology in a fabrication facility. Peripheral equipment such as a device transfer unit, for, e.g., FOUPs in semiconductor manufacturing, an electronic control system with, e.g., a PC, monitor, and keyboard and optionally a vacuum pump is also provided in module frames of the vehicle. The measurement configuration particularly reduces bottleneck situations in equipment qualifying of processing tools during fast ramp-up phases of, e.g., semiconductor manufacturing facilities, thereby saving costs. The construction is based on PGVs or AGVs and allows a fast operation directly at the location of a processing tool. With the possible exception of power supply or operator control, the measurement configuration can operate fully autonomously.

Abstract: A touch sensor 10 having a stylus 12 with a tip 12A making contact with a test piece W has an operational control structure including an oscillator 3 which oscillates the stylus 12 in the axial direction; a detecting circuit 4 which detects changes of oscillation of the stylus 12; an adjustor unit 5 which removes noise added to an output signal from the detecting circuit 4; a fine motion mechanism controller 6 which controls the operation of a fine motion mechanism 21 in such a manner that the change of the quantity of state of the detection signal is maintained constant; and a PZT driver 7 which operates the fine motion mechanism 21. The measuring force during surface configuration measurement can be adjusted by adjusting an alternating signal to be applied to the touch sensor or by reducing the noise added to the detection signal without making modifications to a shape or structure of the touch sensor.

Abstract: Reconstituting the profile of a pavement consists of moving three contactless distance-measuring sensors over a pavement, the sensors being equidistant and in horizontal alignment in the direction of motion. The sensors deliver signals representative of their respective heights above the pavement. Measuring the distance traveled by the sensors, and measuring twice the height measured by the middle sensor from the sum of the heights of the two end sensors. The apparatus has a horizontal beam fitted with three sensors, a device for measuring the distance traveled, and a computer, the assembly being mounted on a load-carrying chassis or vehicle.

Abstract: A modified atomic force microscope (AFM) is used to perform contact resistance and/or current-dependent stiction measurements for conductive thin films at controlled values of applied force. The measurements are preferably performed under conditions approximating the operation of the thin films as electrodes in microswitch array fingerprint sensors. A first, planar thin film is contacted with a second, curved thin film deposited over a round ball having a diameter of a few microns to a few tens of microns. The second film is preferably a coating deposited over the ball and over the arm controlling the ball motion. The coating deposited over the arm provides an electrically conductive path to the contact surface of the ball.

Abstract: A device implements a method of determining a cut resistance of a sample. The device includes a blade wherein the blade and the sample are relatively movable and a first apparatus that transfers energy to at least one of the sample and the blade to cause relative movement thereof in a direction parallel to a surface of the sample such that the blade contacts and cuts the sample until the imparted energy is expended and relative movement is terminated. A second apparatus measures a parameter of the relative movement to obtain an indication of the cut resistance of the sample.

Abstract: A device for detecting a running surface for a vehicle, comprising a plurality of sensors (c1 to c8) designed to be oriented towards the running surface to detect modifications thereof, data processing means for processing data derived from the sensors, wherein the sensors are relatively arranged so as to associate at least part of the points of aim on the ground (v1 to v8) in pairs (p1 to p4), the two points of aim on the ground being spaced apart by a first specific distance, and the transverse distances separating two adjacent pairs (p1 to p4) of points of aim on the ground increase towards a longitudinal axis along a direction substantially perpendicular to said axis.

Abstract: The object of the present invention is to provide a road surface roughness measuring apparatus for measuring the coefficient of dynamic friction and the roughness of the road surface in each direction at a same section where the coefficient of dynamic friction is measured, said apparatus divides the measuring circle on the road surface into a plurality of sections, on which measuring circle the rotary type unit for measuring the coefficient of dynamic friction measures the coefficient of dynamic friction.

Abstract: A touch sensor 10 having a stylus 12 with a tip 12A making contact with a test piece W has an operational control structure including an oscillator 3 which oscillates the stylus 12 in the axial direction; a detecting circuit 4 which detects changes of oscillation of the stylus 12; an adjustor unit 5 which removes noise added to an output signal from the detecting circuit 4; a fine motion mechanism controller 6 which controls the operation of a fine motion mechanism 21 in such a manner that the change of the quantity of state of the detection signal is maintained constant; and a PZT driver 7 which operates the fine motion mechanism 21. The measuring force during surface configuration measurement can be adjusted by adjusting an alternating signal to be applied to the touch sensor or by reducing the noise added to the detection signal without making modifications to a shape or structure of the touch sensor.

Abstract: A method of adjusting the relative attitude of a work in a surface texture measuring instrument for measuring the work having a feature region includes a measurement step of performing measurement of the feature region along an X-axis direction after positioning a detector in a Y-axis direction and the X-axis direction, a determination step of repeating the measurement which is performed while changing the position in the X-axis direction, and a step of adjusting the attitude of the work on the basis of the amount of relative attitude correction. Therefore, the direction of the feature region in the work is adjusted so as to be parallel to the Y axis.

Abstract: A system and a method for measuring and determining flatness of a strip (1) of rolled material. Said system is comprising a measuring roll (2) having a cylindrical central structure (41) having a number of measuring devices for force/pressure registration. Said devices is generating measurement output signals (Upi) depending on the contact between the strip and the measuring roll (2), wherein said measurement output signal (Upi) comprises a force component signal (UFi). Said system also comprises a Flatness Determination Unit (56), said unit being arranged for calculating the flatness (&Dgr;&sgr;1) of the strip based exclusively on signals derived from measurement output signal (Upi) values generated by said measuring devices and information about the values of the width and thickness of the strip (1). The system is continuously determining the Wrap Angle (&agr;) from at least one measurement output signal (Upi) and automatically compensating for a changing Wrap Angle (&agr;).

Abstract: A method of inspecting the surface finish of a component comprising providing an original surface to be inspected. A release agent is applied onto the original surface and an epoxy mixture is applied over the release agent. The epoxy mixture is allowed to harden into a replicated surface. Once the epoxy mixture has hardened, the replicated surface is removed and a metallic coating is applied thereon. The coated replicated surface is then ready for inspection.

Abstract: An apparatus for measuring a surface profile of an object to be measured includes a measuring probe positioned to contact the surface of the object to be measured, guide mechanism for supporting and guiding the measuring probe in an axis direction of the measuring probe, tilt angle adjustment mechanism for tilting the guide mechanism at a predetermined tilt angle to a horizontal direction so that the measuring probe contact the surface of the object to be measured with a predetermined contact force, and drive mechanism for relatively driving at least one of the measuring probe and the object to scan the surface of the object to be measured with the measuring probe. The contact force is derived from a tilt direction component of the gravity of the measuring probe generated when the measuring probe is tilted.

Abstract: The present invention 10 discloses a cleaning device having a base portion 14 with a peel and stick adhesive 20 underside and a clear permeable topside 22 having a color reactive substance 24 contained therein wherein the base portion 14 further includes a malleable flap 12 disposed thereon. The present invention is to be placed in areas to be cleaned such as floors, walls, counters and the like for the purpose of monitoring the efficiency of the people that will be doing the cleaning. The peel and stick adhesive base 20 will maintain the cleaning detector 10 in place and the user will put the malleable flap 12 into a substantially perpendicular position relative to the base portion 14. The malleable flap 12 will be deformed away from the substantially perpendicular position if the area proximal to the present invention 10 has been properly swept, mopped, dusted, etc.

Abstract: A measuring system has a freely movable measuring instrument and a computer for processing the measured data. Two measuring devices are in the measuring instrument, each with two acceleration sensors. Two of the sensor each in a common plane and the two measuring planes are at right angles to one another. A measuring wheel is in the measuring instrument for acquiring the length of the displacement path of the measuring instrument. The measuring instrument acquires the shape and length of a surface line of a body and its representation in two spatial planes with a measuring range from 0 to 360° in one plane. Input elements and a display arrangement on the measuring instrument serve to simplify the measuring process and permit direct control and monitoring of the measuring process.

Abstract: A method and apparatus are provided for the analysis of buried layers of an analyte material by: a) removing surface layers of said analyte material with an atomic force microscopy (AFM) stylus to expose a buried layer; and b) analyzing a buried layer, preferably for molecular structure. An apparatus is provided which encompasses both AFM and one or more additional surface analytical apparati within a controlled atmosphere under coordinated computer control.

Abstract: A test piece made of a material equal to the material of the workpiece is formed in a size that permits the test piece to be housed in an adsorption tube container mounted to a mass analyzing apparatus of a gas chromatograph. The test piece is left to stand for a predetermined time in a measuring site of the atmosphere within a cleansing chamber and, then, recovered. The recovered test piece is introduced into a mass analyzing apparatus of a gas chromatograph (GC-MS apparatus) for measurement of the material of the contaminant and the mass of the contaminant, thereby evaluating the degree of contamination of the measured point.

Abstract: The invention relates to a measuring sensor (1) for measuring positive and negative elongations on cylindrical or profiled bodies (6). The measuring sensor (1) consists of more than two parts and is essentially annular and has at least one tensioning element (7, 15). Two segments (2, 3) that can be tensioned are provided with a recess on the longitudinal center on the internal contour (22), the recess being disposed opposite the direction of tensioning (S) and accommodating a protruding elastic element (8) with a measuring element (10). The recesses can be pressed non-positively onto the surface of the body (6). The segments (2, 3) of the multi-part measuring sensor (1) that are diagonally opposite can be tensioned with their both ends by means of exchangeable and/or adjustable lateral guide members (4, 5, 26, 38) for the body to be measured (6).

Abstract: Disclosed is a method for testing the smoothness of a disc surface. A glide test is performed by first lowering the glide head until contact between the glide head and the disc surface occurs. The point of contact establishes a base line indicating the location of the disc surface. Once a base line is established, the glide head can be controlled so that it flies at the desired glide height above the disc surface. By first establishing the base line, the glide head can be flown with greatly increased precision at the desired glide height based on known relationships between glide height and various parameters, including spindle speed, various electrical parameters, or crown shape.

Abstract: An investigation device includes a time of flight mass spectrometer with an entrance opening, and an electrically conductive tip on a cantilever which is movable from a first position near a sample on a sample holder to a second position near the entrance opening. A sample particle is obtained with the tip being in the first position from the sample. The tip, with the particle, is moved into the second position where the particle can be accelerated towards the entrance opening. The particle is analyzable by the time of flight mass spectrometer.

Abstract: The present invention 10 discloses a cleaning device having a base portion 14 with a peel and stick adhesive 20 underside and a clear permeable topside 22 having a color reactive substance 24 contained therein wherein the base portion 14 further includes a malleable flap 12 disposed thereon. The present invention is to be placed in areas to be cleaned such as floors, walls, counters and the like for the purpose of monitoring the efficiency of the people that will be doing the cleaning. The peel and stick adhesive base 20 will maintain the cleaning detector 10 in place and the user will put the malleable flap 12 into a substantially perpendicular position relative to the base portion 14. The malleable flap 12 will be deformed away from the substantially perpendicular position if the area proximal to the present invention 10 has been properly swept, mopped, dusted, etc.

Abstract: There has been a demand for a holder for properly holding a throw-away tip with an abrasion sensor. The holder (1) has a tip mounting portion (4) provided in an end portion thereof and formed with a pocket (5). A pair of probe insertion holes (19) are formed in a bottom face (6) of the pocket (5). The probe insertion holes (19) are provided adjacent a front face (40A) of the tip mounting portion (4). Probes (41) are fixed in a probe fixture (44) which is fitted in the probe insertion holes (19). The holder makes the probes (41) less liable to suffer from stresses during a cutting process, and ensures proper electrical connection between the probes (41) and the abrasion sensor of the throw-away tip (2). (FIG. 1).

Abstract: The fusion-welded nanotube surface signal probe of the present invention is constructed from a nanotube, a holder which holds the nanotube, a fusion-welded part fastening a base end portion of the nanotube to a surface of the holder by fusion-welding, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. This fusion-welded nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope), other SPM (Scanning Probe icroscope) and so on.