Abstract: The invention comprises an extended input system by which additional component supply stations are located out of reach of the pick and place heads of a machine for handling surface mountable components and are selectively addressable by a supply shuttle which fetches individual components and delivers each component selectively to a test pocket or a utility pocket of a transfer assembly, from which the components are retrievable by a pick and place head of the onserter. In a preferred embodiment, the transfer assembly provides a second shuttle on which the utility and test pockets are mounted for movement back and forth between the supply shuttle unload station to a pick-up station of the head, and the component testing occurs during transit of the transfer shuttle.

Abstract: Three sets of product pick-up elements each pick up products in a linear array, the three arrays being parallel. One set places products from a vibratory feeder to a buffer array, a second set places product into a measuring station from the buffer and the third set places products onto a packaging tape from the measuring station. Faulty products are individually discharged from the third set. A process is disclosed for filling the intervening empty slots in the tape due to the selective discharge of the faulty products.

Abstract: An apparatus and a method for sorting parts to be tested. A first head selects a part and places the part in a testing location. A second head positions the part in a testing location where the part is tested to determine whether it conforms to certain criteria. The second head then places the tested part in a first storage location if the part conforms to the criteria, or in a second storage location if the part does not conform to the criteria.

Abstract: Fixed terminals and movable terminals are arranged on both sides of a turn table, which is provided along its circumferential direction with a plurality of holding holes for receiving chip electronic components so that both end portions thereof project from the holding holes. The movable terminals are provided by parts of a printed circuit board or elastically flexible plate members such as plate springs, and they are elastically brought into contact with electrodes which are formed on first end surfaces of the chip electronic components. Due to such elastic contact of the movable terminals, electrodes formed on the other end surfaces of the chip electronic components are pressed into contact with the fixed terminals.

Abstract: A station for testing electrical devices under elevated and depressed temperature conditions, said devices being transported through and tested in the station while held in coordinated planar sets. The planarly arranged sets of devices are sequentially placed upon a platen movable along three mutually orthogonal axes. A test head has a plurality of electrical device contactors in planar arrangement corresponding to the arrangement of the devices sets. At least one axis along which the platen moves is orthogonal to a general plane of the contactors for establishing parallel contact between the devices and the contactors. During testing each of the leads of the devices resting upon the platen are electrically contacted by a contactor. The leads of the full set of electrical devices can be contacted simultaneously, or the leads can be contacted in subsets depending upon the capacity of the test head.

Abstract: An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.

Abstract: In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts.

Abstract: A switch track mechanism for selectively directing electronic components from a single trackway to one of a plurality of discharge or accumulator stations comprising a first fixed track sections adjacent the trackway, a second fixed track section adjacent to and downstream of the first fixed track section, movable first and second track members operatively associated with the first and second fixed track sections and each operable between first and second limit positions. The second movable track member has a plurality of track sectors disposed in an array, a plurality of accumulator stations downstream of the second track member corresponding in number to the number of track sectors, a cartridge for electronic components is mounted at each accumulator station. The movable track sections have actuable between limit positions whereby electronic components may be directed from the single trackway to a select one of the accumulator stations.

Abstract: In an apparatus for mounting electronic parts onto a printed board, each of suction heads mounted on a peripheral portion of an intermittently rotatable index table attracts by suction a corresponding one of the electronic parts at a part attracting position. With rotation of the index table, the suction head holding the attracted electronic part is transferred to a part mounting position, where the electronic part is mounted onto the printed board. At least two positioners are arranged along the path of the transferred suction head for adjusting the part attracted on the suction head to its correct position and direction. The positioners are arranged respectively on both sides divided by a line extending from the attracting position to the mounting position. The positioners adjust respective kinds of electronic parts which are different from each other in configuration and size.

Abstract: Apparatus and method are disclosed for handling a flexible disk for testing. The apparatus includes guide rails for initially positioning a disk for test. The apparatus also includes a variable speed motor for rotating the disk at a preselected rotation speed. The disk is rotated by clamping the disk betwen a motor driven rotating spindle and a retractable collet. The collet passes through an aperture in the disk to center and position the disk. Testing is accomplished by a test head assembly which is moved by a voice coil actuator. Positioning of the test head assembly is controlled by a light detector and ground glass scale coupled to the actuator and to the test head assembly.

Abstract: A method and apparatus for configuring, automating and controlling the various operations performed on different products, e.g. the testing and/or repair of printed circuit boards, is presented. The apparatus includes one or more work stations and conveyor units to transport products and other components required to perform the operations on such products between such stations. The products are mounted in standardized carriers which facilitate intermixing different sizes and shapes of products without requiring adjustment to the conveyor units. The other components are adapted to also be transportable by the same conveyor units. The apparatus further includes buffering stages associated with each station for temporarily storing products and other components, and a distributed control system to facilitate the parallel processing of different types of products in accordance with a dynamic priority rating system and a preemptive scheduling technique.

Abstract: A method and apparatus for configuring, automating and controlling the testing and/or repair of printed circuit boards is presented. The apparatus includes one or more test and/or repair stations and conveyor units to transport PCB's and other components required to test and/or repair such printed circuit boards between such stations. The printed circuit boards are mounted in standardized carriers which facilitate intermixing different sizes and shapes of boards without requiring adjustment of the conveyor units. The other components such as the fixture assemblies required to electrically access the printed circuit boards are adapted to also be transportable by the same conveyor units.

Abstract: An automatic disk testing apparatus and method for testing flexible disks is disclosed. The apparatus includes a gravity feed disk hopper and vacuum disk plate which sequentially present a series of disks for test. Each disk drops by gravity from the vacuum disk plate to a test position including a drive mechanism. The drive mechanism rotates the disk, in its disk jacket, at a predetermined rotational speed for testing. Each disk is tested and the test results are stored in memory. After testing, the disk is automatically sorted and moved to an output location based on the test results. The sorting is accomplished by dropping the tested disk into a motor driven shuttle which conveys the disk to the proper output location and drops the disk at that location.

Abstract: An automatic disk positioning apparatus and method for its use in handling of flexible disks in an automatic testing apparatus is disclosed. The apparatus includes a gravity feed disk hopper and vacuum disk plate which sequentially present a series of disks for test. Each disk drops by gravity from the vacuum disk plate to a test position including a drive mechanism. The drive mechanism rotates the disk, in its disk jacket, at a predetermined rotational speed for testing. Each disk is tested and the test results are stored in memory. After testing the disk is automatically sorted and stored in an output container based on the test results. The sorting is accomplished by dropping the tested disk into a motor driven shuttle which conveys the disk to the proper output container and drops the disk into that container.

Abstract: An apparatus for supplying electronic parts of having a polarity has a first rotating member which has a parts receiving hole for receiving electronic parts one by one supplied from a parts receiving hole so as to detect the polarity of the electronic part accommodated in the parts receiving hole, a second rotating member having a through hole is inserted, and apparatus for preventing the electronic part from passing through the through hole in the midst thereof due to signals generated in a detector including the electrodes, whereby the electronic part is delivered directly, when the electronic part pases through the through hole, and delivered after the second rotating member is rotated to a predetermined position, when the electronic part is prevented from passing through the through hole, so that the electronic part having polarity can be delivered in the order of a predetermined polarity sense.

Abstract: The invention of the present document is an improved disc singulator (10) for use in singulating and delivering to a test site (12) an integrated circuit device (14) to be tested by a tester mechanism. The singulator (10) includes structure to positively hold the device (14) within slots (64) formed in the periphery (52) of the disc (10) as it is rotated. A main body portion (16) of the device (14) is, thereby, held so that a plane defined by the main body (16) is oriented generally orthogonal to a plane defined by the disc (10). Additionally, the device (14) is held at an appropriate radial location with respect to the disc (14) so that, as the disc (10) rotates the device (14) carried thereby through a slit (40) in a printed circuit board (36) at the test site (12), contacts (26) of the device (14) will engage corresponding probes (38) at the test site (12).

Abstract: The device for separation of electrical components includes a slide track which runs obliquely downwards and is adjusted to correspond to the width of the components. A frame, intended for testing the components, is provided in the center area of the track. Above the slide track, there are a total of four levers engaging in the slide track or influencing the components in the slide track, which levers are arranged proximate one another at a distance that is approximately equal to or slightly greater than the length of the components with respect to the direction the components slide. The individual levers are activated via one single cam drive with four cams, whereby the cams are arranged so that both the first two levers and the last two levers are activated alternatingly in order to facilitate a step by step forwarding of the component resting below or against them.

Abstract: There is provided, a method and apparatus for determining if the lengths of all of the leads on all four sides of a PLCC packaged devices are within a selected tolerance of each other. To do so a relatively smooth surface across which the device is to be advanced is provided with that surface having a plurality of fingers affixed thereto. Each finger protrudes from the surface by an amount equivalent to the selected tolerance, with the plurality of fingers being in number at least equivalent to the number of leads on the longest side of the device to be tested. In addition, the surface is supported at a selected angle to horizontal. As the device is advanced across the surface in the direction of, and across the space spanned by, the fingers, the devices having all of its leads within the selected tolerance are differentiated from those devices that do not have all of their leads within the selected tolerance.

Abstract: Sorting apparatus for electrical components includes:(a) an electrical test station,(b) a transport forming pockets for receiving electrical components and for sequentially lifting the received components to the test station,(c) test circuitry including relatively movable contacts, at the test station, for electrically testing the components in the pockets, sequentially,(d) and the tested components then being discharged form the pockets in accordance with their testing.A novel rotary transport is also provided, with an annular, frusto-conical guide slot for a swingable contact, to successively engage the components.

Abstract: An accumulating and transfer unit for handling electronic devices such as integrated circuits (ICs), especially surface mounted devices (SMDs). The unit includes guideways mounted circumferentially around a central shaft between two end plates and is inclined from the horizontal to utilize gravity, in cooperation with the levitation provided by a continuous or pulsed stream of air, to move the parts longitudinally in a column from the raised end of the unit to the lower end. In one embodiment, the guideways consist of a generally U-shaped track mounted on a track support and secured with a locking plate. A pair of longitudinally extending spaced apart walls on the bottom of each track act in cooperation with the track support and the locking plate to form a channel that directs the pulsed air from a supply tube at one end of the channel to a series of spaced apart apertures formed in the bottom wall of the track disposed so that the air acts through the apertures on the ICs held in the track.

Abstract: To reduce manual work by an operator filling and unloading a device for testing and sorting electronic components it is suggested that a cassette carriage carrier (8) with a cassette carriage (10) displaceable therein, be placed in front of the input magazine (2). The cassette carriage (10) carries a cassette (11), on which a large number of magazine rods (12) are arranged side by side. The magazine rods (12) are displaceable and arranged on a plane which extends perpendicularly to the plane of the magazine channels of the input magazine (2) of the device (1). In the same way there can be provision for a cassette carriage carrier (8a) with a cassette (10a) and a cassette (11a) as well as the magazine rods (12a) attached to it in connection with the output magazine (6) of the device (1).

Abstract: An integrated circuit handler provides very high throughput rates and very low manual labor requirements. A sleeve handler portion provides nearly all of the sleeve handling needs of the handler, receiving periodic inputs of a plurality of sleeves, orienting and unloading the sleeves, reloading the sleeves and binning the sleeves according to output category. Once out of the sleeves, the integrated circuits are handled, in turn, by an input buffer, a transport mechanism which presents the integrated circuits to a workstation, a sort mechanism and an output buffer/sleeve loader mechanism. The particular embodiment disclosed in detail comprises a handler optimized for handling SOIC devices. No gravity-driven mechanisms are used in the handler. Throughput rates up to 60,000 parts per hour and more are possible.

Abstract: An equipment (10) designed to engage and stop each of a plurality of items (16) passing down a track (12). The equipment (10) includes a mount (28) which carries a plurality of stops (30). The stops (30) are disposed such that, when the mount (28) which is spaced laterally from the track (12) is moved toward the track (12), stops (30) will successively obstruct the track (12) in sequence, consecutively in a direction upwardly along an axis along which the stops (30) are spaced.

Abstract: Magazines, each loaded in series with IC elements to be tested, are stacked and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism onto a magazine receiver, and the magazines on the magazine receiver are simultaneously but intermittently fed by intermittent stepping means in the direction of their arrangement. The outermost one of the magazines on the magazine receiver is loaded at an IC element receiving position. The IC elements from the magazine are supplied to a testing station, wherein they are tested, and the tested IC elements are sorted in a sorting station according to their test results and respectively then loaded into IC element receiving magazines in an accumulating station. The accumulating station has an IC receiving magazine stocker room in which IC element receiving magazines are stacked, and an empty magazine stocker room in which empty magazines are stacked.

Abstract: In a production system for performing predetermined processes on products which each have a memory incorporated therein, information necessary for those processes is sequentially written by an external computer in the memory incorporated in each product, and such information is read out from the memory and used by the production system to carry out the respective processes on the products in a low cost and efficient way.

Abstract: A turning device for electrical axial components which utilizes a transport element (8) that is mounted on a machine support (9) to rotate about a shaft (10). Mounted on the transport element (8) are a plurality of receivers (11, 11') for holding the electrical axial component (2). Each receivers (11, 11') is rotatable about a shaft (14, 14'). Each receivers (11, 11') has a pair of magnets (17, 17') arranged about shaft (14, 14'). The transport element (8) has a magnet arrangement therein which is also oriented about the shaft (14, 14'). Machine support (9) has a rolling surface (24) for rotating receivers (11, 11') about shaft (14, 14'), rolling surface 24 being movable between a rest position and an operating position.

Abstract: An electronic part insertion apparatus which includes an inclined portion inclined by a predetermined inclination angle and having at least one inclined surface on which electronic parts having leads slide to descend under their own weight. An intermittent feeding mechanism is arranged in the middle of the inclined portion to feed intermittently the electronic parts, and a positioning mechanism is provided at a lower portion of the inclined portion to stop and position the electronic parts on the inclined surface. A hand portion is arranged to be pivotable to hold the positioned electronic part at a first position and to insert the held electronic part into a printed circuit board at a second position.

Abstract: An apparatus for testing and sorting electronic components comprises a testing device (4), an output magazine (3) having several parallel receiving ducts (34) for receiving tested components (8) and a component conveyor device (7) including a carriage (36) arranged between the testing device (4) and the output magazine (3) to move transversely to the receiving ducts (34) along a support rod (37) and an eccentric rod (38). The carriage is so engaged with the eccentric rod (38) that when the eccentric rod (38) is rotated at any position of the carriage (36) along the receiving ducts (34) the carriage swivels about the support rod (37) from a stop position to a release position to release a component (8) carried thereby to the adjacent receiving duct (34).

Abstract: Magazines, each loaded in series with IC elements to be tested, are stacked and such stacked magazines are arranged in columns. The lowermost magazines of the stacked magazines of the respective columns are simultaneously brought down by a takeout mechanism onto a magazine receiver, and the magazines on the magazine receiver are simultaneously but intermittently fed by intermittent stepping means in the direction of their arrangement. The outermost one of the magazines on the magzine receiver is loaded at an IC element receiving position. The IC elements from the magazine are supplied to a testing station, wherein they are tested, and the tested IC elements are sorted in a sorting station according to their test results and respectively then loaded into IC element receiving magazines in an accumulating station. The accumulating station has an IC receiving magazine stocker room in which IC element receiving magazines are stacked, and an empty magazine stocker room in which empty magazines are stacked.

Abstract: In the case of an apparatus for testing and sorting oblong, electronic components, more particularly integrated chips, the components, which have been supplied in a row, are separated by means of a separating arrangement. The separating arrangement consists of a belt conveyer, which is arranged above a slideway for the components which have been supplied and which takes hold of the components which have been supplied and pushes them forward on the slideway. A control signal, which is emitted by a detecting arrangement which is arranged after the separating arrangement, is used for the purpose of stopping the belt conveyer so that the component, which has just been delivered by the belt conveyer, can, in the first instance, be tested. After testing has taken place, the belt conveyer is set in operation again.

Abstract: In a device for conveying components contained in an input magazine, particularly integrated chips, to an output magazine (3), which is connected to the input magazine by means of a testing device, individual component receiving portions (34) of the output magazine (3) are provided with storage and indicating devices (52), each of which store and indicate information corresponding to a component testing and measuring class. The components are supplied to the receiving portions (34) of the output magazine (3), on the basis of the data stored in the individual storage and indicating devices (52), so that a component determined by the testing device as belonging to a certain component test and measuring class is conveyed to the receiving portions (34) associated with this class, and in the absence of such a receiving portion is conveyed to a receiving portion which is still free, which is then marked as belonging to the test and measuring class in question.

Abstract: An IC element supplied to a testing station is guided by a rail and a guide member to move by its own weight. At least one of the rail and guide member has built therein plate-shaped ceramic heater or plate-shaped silicone rubber heater. The guide member urges the IC element against the rail to heat the IC element. An auxiliary stopper is provided opposite but aslant to the IC element sliding surface of the rail. The IC element moving on the rail is yieldingly urged by the auxiliary stopper against the sliding surface of the rail, braked and engages an engaging piece at the lower end of the auxiliary stopper. The IC element is disengaged from the engaging piece to slightly move and stopped by a main stopper, where the IC element is tested. A plurality of such testing passages are provided, and IC elements simultaneously tested in the testing passage are fed to discharge rails respectively corresponding thereto.

Abstract: A method and system to produce card modules by assembling and soldering components on a printed circuit board, characterized by retrieving specific printed circuit board-type from a printed circuit board storage having several types in response to a command signal, reading an identification code on the printed circuit board to obtain information concerning the board and then in response to this information, conveying the circuit board through selective processing stations for assembling components on the circuit board, through-stations for soldering the components on the circuit board to form an electronic card module and then through-stations for testing the card module in response to information obtained during reading. The testing station can also include one or more stations for performing the steps of fault-locating and for repairing located faults as necessary.

Abstract: In apparatus for disposing DIP leads in a predetermined and preselected condition of straightness and orientation, a trackway for operatively supporting and moving DIPs therealong from a loading station to a discharge station, a forming station positioned along the trackway subsequent to said entrance station. The forming station includes laterally spaced rotatable forming rollers on opposite sides of the trackway, anvils confronting the inner faces of the leads between the forming rollers and anvils. The rollers and anvil having cooperating confronting surfaces adapted to engage the DIP leads adjacent the shoulder to the outer terminal ends, the forming rollers cooperatively associated with the anvils and spaced therefrom to define a nip gap. DIPs are moved through the nip gap whereby DIP leads are contacted to align them in predetermined orientation and at a predetermined angle relative to the body portion.

Abstract: In accordance with a broad aspect of the invention, a system is presented for parametrically and functionally testing integrated circuit devices in parallel. At least one integrated circuit device receiving channel is provided for defining a plurality of integrated circuit device test stations therealong, and means are provided for delivering parametric and functional test signals at least functionally in parallel to each of the integrated circuit device test stations. Means are provided at each test station for selectively engaging the integrated circuit devices to apply the parametric and functional test signals to the integrated circuit device at that station, and to selectively isolate the device from the test signals. Means are provided for receiving an output from each test location in response to the test signals, and means for determining from the output the parameters of each tested integrated circuit device.

Abstract: A testing mechanism is disclosed for incorporation with the gripping fingers of a robot arm, to enable the real time testing of a device under test after it is picked up by the grippers. The robot arm has opposed fingers mounted thereon for transverse clamping of the sides of the device under test, which can be a semiconductor module. Mounted to the robot arm is a test head which can be brought into electrical contact with the pins of the device under test when the device has been picked up by the arm. Test signals supplied through the test head will conduct real time testing of the device while it is being transported by the robot arm from the pick-up point to one of several destination receptacles. The identity of the destination receptacle into which the tested device will be deposited, will depend upon the results of the real time test being carried out while the device is being transported.

Abstract: Integrated Circuit ("IC") handling and contact system including adjustable stacked vertical input tracks, a single moving oscillating singulatory mechanism, a contactor assembly including configurations for leaded and leadless chip carriers and pin grid arrays, a monodirectional sorter, and adjustable output tracks. The input tracks and output tracks are adjustable for width and thickness of the IC packages. The contactor assembly includes preloaded contacts for proper penetration and wiping action for each device, pad, or pin, and provides cantileaver and torsional positioning with respect to each pin of the IC packages. The system includes an environmental chamber with the electromechanical components located in a second chamber to one side thereof and coupled by actuating shafts to the environmental chamber. The output module includes a last bin grouping for ICs which fail testing.

Abstract: There is disclosed herein an apparatus for unloading IC packages from sockets on a burn-in board according to predetermined performance grades. The IC packages are displaced from the sockets by inserting tools through passageways extending through the burn-in board and socket to contact the underside of the IC package and push the IC package from its socket. Sorting is accomplished by collecting the displaced IC packages of a particular grade and storing them separate from all other IC packages.

Abstract: A verifier for a chip type component placement mechanisms which has an air track conveying the component from a supply source to a placement head. The verifier is positioned in the air track and stops the chip for testing to determine whether the proper chip is presented and whether the chip is the proper electrical value. If the chip is acceptable, it is sent on down the track to the placement head, and if unacceptable, it is rejected from the system.

Abstract: An inverting apparatus for reorienting electrically asymmetrical axial lead electronic devices in a testing and sorting machine has a wheel rotatably mounted in a magnetic output bin of the tester/sorter. The bin has sets of permanent magnets mounted in its side walls that create two oppositely directed magnetic fields that define upper and lower regions of the output bin. The axis of rotation of the wheel is generally aligned with the magnetic fields across the bin. The wheel carries a set of holder assemblies each mounted for free rotation on its outer circumference. Each holder assembly carries a bar magnet that aligns the holder assembly, and a device carried in the holder assembly, with the prevailing magnetic field. As the wheel rotates the holder assemblies and the devices they carry are transported from the magnetic field in the upper region to the oppositely directed field in the lower region. The bar magnet rotates the holder assembly and the device 180.degree.

Abstract: Electrical components of various sizes and shapes are appropriately accommodated and positioned at a gauging station, at which lead straightening and testing of electrical functioning of each component is performed. An alternate embodiment provides for distinguishing between acceptable and unacceptable components by differentiating between component lead tips and a contrasting background, through use of an optical scanner.

Abstract: A machine adapted to receive in a continuous order the finished manufactured parts for inspection as to completeness and operativeness, for rejection of part failures, and sorting by proper orientation the accepted, tested, finished work pieces.

Abstract: A system for sensing the size of electronic components processed within a machine for placing components on a media such as a printed circuit board. The size of a component is determined at a sensing station and the component is thereafter precisely positioned according to its size relative to a placement head. The placement head picks up the thus positioned component and places the component on the media.

Abstract: A machine for automatically placing chips or similar micro-electronic components on a substrate carried on an X-Y type table, the machine having means to supply components, means to convey the components, means to transfer the components from the supply source to the conveyor, the conveyor transporting the components to a placement head located above the substrate to place the component on the substrate. The machine can also include a station for applying an adhesive or similar means on the substrate to adhere the component on the substrate.

Abstract: A tester/sorter for performing electrical tests on axial lead devices such as diodes at a very high throughput rate carries the devices on the periphery of a rotating wheel. A contactor assembly periodically makes electrical connection with one or more of the axial lead devices. A flying arm assembly mounts the contactor assembly so that it travels through a closed loop path of motion with respect to the wheel. In a first path portion, mechanical controls acting on the flying arm assembly lower the contactor assembly into electrical contact with the leads of the device. Once in electrical connection, there is no relative motion between the contactor assembly and the leads. After the test is completed, the mechanical controls lift the contactor assembly away from the leads and return it to its starting position. This travel is substantially free of mechanical impacts that could produce vibrations and thereby degrade the accuracy of the testing.

Abstract: A handler (10) for feeding integrated circuit chip carriers (42) into a test site (14) of the handler (10) is the subject matter of this patent application. Inventive features include apparatus whereby carriers (42) are pushed laterally from a bottom end (62) of a magazine track (26) into a conveyor station (58). A pusher bar (64) can include a ramp surface (128) to raise carriers (42) above the particular carrier (42) being moved into the conveyor station (58). Further, the inventive features include structure for remotely sensing the presence of a carrier (42) at the bottom end (62) of a track (26). A rotary shuttle (148) can be incorporated for transporting carriers (42), after they have been tested, to the output section (158) of the handler (10).

Abstract: The method of sorting semiconductor devices includes the steps of feeding semiconductor devices into a contact mechanism and simultaneously connecting the contact elements of the contact mechanism to the leads of one semiconductor device, measuring the parameters of this semiconductor device while disconnecting the contact elements of the contact mechanism from the leads of another semiconductor device and delivering the latter. The apparatus for sorting semiconductor devices includes a device for loading the semiconductor devices, a contact mechanism underlying the loading device, coupled to the unit for measuring the electric parameters of the semiconductor devices and comprising contact elements mounted for timed motion, a conveying mechanism underlying the contact mechanism, the latter being associated with a drive and having two slots.

Abstract: An automatic handling and testing machine for radial lead electronic devices such as transistors has a probe assembly that includes drive components powered by a rotating drive shaft that develop a cycled, closed loop movement of a platform and one or more contactor assemblies mounted on the platform. A base member supports a set of rotary cams detachably connected to the drive shaft, a four arm linkage that follows the cams, and the platform pivotally supported on the linkage. The contactor assemblies are adjustable with respect to the leads in all three directions and are structured for rapid and convenient attachment to the platform. The base member, cams, linkages, and platform form an integral, self-contained unit that is replaceably secured to the machine housing, preferably by a single screw. A linear shuttle carries the devices in horizontal steps through a series of test stations each associated with one of the contactor assemblies.

Abstract: A component sorting apparatus (110), (210) having a shuttle carrier (142), (278) on which are provided a pair of shuttle rails (116), (118) and (216), (218) spaced from one another in fixed relation a distance determined by the spacing between any two contiguous paths (122), (222) of an output tray (120), (220) associated with the shuttle carriage. By this arrangement, each of the rails of the shuttle (114), (214) need travel only one half of the width of the associated output tray; a distance corresponding to roughly one half of the number of outputs, depending on whether there are even or odd number of same. It is proposed to employ either a slide-crank mechanism (164), (166), (170) or a capstan/encoder drive system (306) for reciprocating the dual shuttle (114), (214), largely depending on the number of output paths provided in the apparatus.

Abstract: A contactor assembly including two pairs of electrical contactor carrying heads respectively disposed on opposite sides of a track for transporting packaged electronic devices having laterally extending connector legs or pads. One of the heads of each pair includes a stop projection. Electrical actuators and associated mechanical linkages are provided for sequentially moving the heads of each pair toward each other in steps from maximally separated positions to intermediately separated positions wherein the stop projections intrude into the path taken by devices moving along the track and thereby define a device test location, and then to minimally separated positions wherein the contactors of each head engage the connector legs or pads of a packaged device disposed in the test location.