Abstract: The present invention provides a method and apparatus for providing video output phase control in a decoder. In particular, the present invention provides a decoder that precisely aligns output of video display data with a time stamp associated with the video display data and thereby allows for efficient usage of compressed video buffer memory in the decoder. In one embodiment, the decoder includes a video output processor for displaying video data and a timer connected to the video output processor for providing video output phase control. A method is also provided for providing video output phase control in the decoder.

Abstract: A method is described which forms an MOS transistor having a narrow diffusion region that is smaller than the diffusion region defined using photoresist in a conventional CMOS processing. In one embodiment, LOCOS can be used to form isolation (e.g., shallow trench) between active devices. A polysilicon layer is then deposited and doped either n+ or p+ selectively. The polysilicon layer is then patterned. Next, a dielectric layer and a refractory layer are deposited over he patterned polysilicon layer. Next, a contact hole with a high aspect ratio is defined in the oxide where the transistor will be formed. Angled implant of lightly-doped drain (LDD) regions or graft source/drain regions are formed on two opposite sides of the contact hole. The refractory metal layer is then removed. Spacers are then formed on opposite sidewall of the contact hole. A gate oxide layer is either thermally grown or deposited in the contact, before or after spacer formation.

Abstract: A current source for providing matched currents at low and variable bias voltages. The current source includes a first circuit, a second circuit, and a biasing circuit. The first circuit provides a first current. The first circuit includes a first transistor with a control terminal, a first terminal, and second terminal. A second circuit provides an output current to an output node. The second circuit includes a second transistor with a control terminal, a first terminal, and second terminal. The biasing circuit includes a third transistor with a control terminal, a first terminal, and second terminal. The biasing circuit also includes a fourth transistor with a control terminal, a first terminal, and second terminal. The biasing circuit provides a voltage at the first terminal of the third transistor and a voltage at the control terminal of the second transistor so that a voltage at the first terminal of the second transistor and a voltage at the second terminal of the first transistor match.

Abstract: A method provides estimations of physical interconnect process parameter values in a process for manufacturing integrated circuits. The method includes fabricating test structures each providing a value of a measurable quantity corresponding to a value within a range of values of the physical interconnect process parameters. In some embodiments, the measured value is used to derive the values of the physical interconnect process parameters, either by a numerical method using a field solver, or by a closed-form solution. The values of physical interconnect process parameters involving physical dimensions are also obtained by measuring photomicrographs obtained using a scanning electron microscope from cross sections of test structures. In some embodiments, a family of test structures corresponding to a range of conductor widths and a range of spacings between conductors are measured.

Abstract: A voltage control circuit that programs or erases memory cells comprises an internal voltage value store, a register device selectively coupled to an external voltage value source or the internal voltage value store to receive a voltage value, a voltage output circuit coupled to the register device to receive the voltage value and to output a corresponding voltage to the memory cells, and a verify circuit determining the time to successfully program or erase the memory cells. The register device allows the memory cells to be programmed or erased with voltage values designated by the external voltage value source to determine programming and erasing characteristics of the memory cells. Voltage values producing acceptable programming and erasing characteristics are saved in the internal voltage value store.

Abstract: An input/output circuit in an In-system programmable (ISP) logic device allows an output signal from a boundary scan register to be provided as output during programming operations of said ISP logic device. Thus, the ISP logic circuit can provide valid data output to other circuits interfaced to the ISP logic circuit during programming of the ISP logic device, thereby obviating a need to reset the system after reprogramming of the ISP logic device.

Abstract: An improved vertical diffusion furnace for semiconductor manufacturing processes is provided. Temperature and flow rate management enables more uniform temperature distribution across the wafer during ramp up and ramp down, thereby preventing wafer warp.

Abstract: An improved programmable logic device that generates output signals skewed in time includes a set of I/O cells and first and second logic circuits. Each logic circuit generates a logic output signal on a respective output line coupled to at least one of the I/O cells. A first delay element coupled to the output line of the first logic circuit is programmably operable to delay the output signal of the first logic circuit relative to the output signal of the second logic circuit in response to a first delay control signal. A second delay element coupled to the output line of the second logic circuit is programmably operable to delay the output signal of the second logic circuit relative to the output signal of the first logic circuit in response to a second delay control signal. Control circuitry generates the first and second delay control signals so as to prevent simultaneous switching of the logic output signals of the first and second logic circuits.

Abstract: A programming control circuit programs a memory cell in accordance to a programming signal value that can be varied by a test equipment. The programming control circuit comprises a signal storage device, a signal output circuit, and a verification circuit. The signal storage device stores the programming signal value. The test equipment can be coupled to the signal storage device to write the programming signal value into the signal storage device. The signal output circuit is coupled to the signal storage device to receive the programming signal value. The signal output circuit converts the programming signal value into a programming signal and outputs the programming signal to the memory cell. The verification circuit determines whether the memory cell is successfully programmed. If the memory cell is not successfully programmed, the programming control circuit increases the programming signal value.

Abstract: A method and apparatus for tailoring the appearance of a graphical user interface, specifically an internet web browser. A host server receives a request over the internet or an intranet for a web page. The host server provides the necessary data and executable files for the user's personal computer. A computer program executed on a personal computer alters the appearance of a user's graphical web browser by accessing data files. The appearance of a web browser can be tailored using an editor program to provide data files used to tailor the appearance of a web browser.

Abstract: A method provides estimations of physical interconnect process parameter values in a process for manufacturing integrated circuits. The method includes fabricating test structures each providing a value of a measurable quantity corresponding to a value within a range of values of the physical interconnect process parameters. In some embodiments, the measured value is used to derive the values of the physical interconnect process parameters, either by a numerical method using a field solver, or by a closed-form solution. The values of physical interconnect process parameters involving physical dimensions are also obtained by measuring photomicrographs obtained using a scanning electron microscope from cross sections of test structures. In some embodiments, a family of test structures corresponding to a range of conductor widths and a range of spacings between conductors are measured.

Abstract: An assembly process provides a chip scale package (CSP) which characteristically includes (i) a perforated substrate in which vias can be embedded, (ii) a solder mask on which the integrated circuit die can be attached, and (iii) efficient use of the surface area for electrically routing signals from the integrated circuit die to the external terminals attached to the perforated substrate. The resulting package is highly compact and therefore has a foot print minimally larger than the surface area of the integrated circuit chip. Consequently, the costs of substrate and capsulation materials are minimized. The assembly process allows very high volume production because a large number of integrated circuits can be made on a single unit of the substrate, and singulation is performed in the assembly process at a stage much later than the corresponding stage in a conventional process.

Abstract: An adder tree is partitioned into two parts. One multiplexer provides a first bit group to the first part of the tree. A second multiplexer provides a second bit group to the second part of the tree. The two multiplexers provide the same bits groups to the respective parts in response to a first instruction, and provide different bit groups in response to a second instruction. Therefore, the first instruction allows for the single multiplication of the number represented by the first bit group by another number provided to collectively represented to both parts of the tree. The second instruction causes the multiplication of the first bit group by the third bit group in the first part of the adder tree, and causes another multiplication of the second bit group by the fourth bit group in the second part of the adder tree.

Abstract: A method for design optimization using logical and physical information is provided. In one embodiment, a method for design optimization using logical and physical information, includes receiving a behavioral description of an integrated circuit or a portion of an integrated circuit, optimizing placement of circuit elements in accordance with a first cost function, and optimizing logic of the circuit elements in accordance with a second cost function, in which the optimizing placement of the circuit elements and the optimizing logic of the circuit elements are performed concurrently. The method can further include optimizing routing in accordance with a third cost function, in which the optimizing routing, the optimizing placement of the circuit elements, and the optimizing logic of the circuit elements are performed concurrently.

Abstract: A method of manufacturing an accumulation mode n-channel Silicon On Insulator (SOI) transistor includes forming an intrinsic silicon body region implanted with two deep Boron and one shallow Phosphorous implants; forming source/drain regions each implanted with Arsenic; and forming p-type regions adjacent each of the source and drain regions and disposed along the transistor channel. The SOI transistor has a higher transconductance than known SOI devices.

Abstract: The present invention provides an audio signal processor and method of operation thereof that enables efficient digital signal processing. Fast multiply-accumulate (MAC) and vector processing capabilities are implemented in a RISC architecture giving the high speed capabilities of a digital signal processing system the speed and efficiency of a RISC processor.

Abstract: An output buffer circuit includes multiple programmable boost drive stages which allow selection of one of several drive strengths to accommodate a range of output load conditions, thereby achieving low noise and low power dissipation. In one embodiment, one or more of the boost circuits turn on after the primary driver circuit is turned on, and turn off before the primary circuit is turned off, thereby achieving soft turn-on and turn-off.

Abstract: The present invention provides a centralized amplifier-accelerator a tri-state bus. The centralized amplifier-accelerator utilizes the module drivers as pre-drivers to the amplifier-accelerator. The centralized amplifier-accelerator is located physically in the center of the chip. This central amplifier-accelerator consists of a highly sensitive input sense circuit which detects voltage transition at very near the N-channel threshold for rising transitions and at very near the P-channel threshold for falling transitions. Once the sense circuit threshold is met, the output driver is triggered to drive the bus.

Abstract: Polystringers that cause NAND-type memory core cells to malfunction are covered by ONO fence material. ONO fence is removed so that polystringers may then be removed more readily. A SiON layer, tungsten silicide layer, second polysilicon layer, ONO dielectric, and first polysilicon layer are successively removed from between NAND-type flash memory core cells leaving ONO fence that shields some first polysilicon layer material from removal. The device is next exposed to an hydrogen-fluoride solution to remove oxide-based materials, particularly ONO fence. Thereafter, the polystringers are exposed and may thus be removed more readily.

Abstract: A wireless data network provides message control center broadcasting over a paging channel covering a wide service area and base stations distributed in said wide service area providing two-way communication over a local channel in local service areas within said wide service area. The wireless data network provides asymmetrical data transmission rates between the base station and subscriber wireless data terminals. In addition, the base stations and wireless data terminals can each transmit at different data rates according to desired range and to minimize probability of collision. In one embodiment, a registration procedure is provided to establish continuous communication between a wireless data terminal and a base station in the local channel.