Abstract: A phase detector circuit generates a phase comparison signal based on a phase difference between first and second periodic signals during a test mode. Phases of the first and the second periodic signals do not change in response to variations in a signal generated by the phase detector circuit during the test mode. A lock generation circuit generates an output signal based on the phase comparison signal that indicates if the first and the second periodic signals are within a lock window of the lock generation circuit. The lock window of the lock generation circuit changes in response to a variation in a control signal.

Abstract: A dynamic phase alignment circuit includes a phase generator circuit having delay-locked loop circuits that generate periodic output signals. Each of the delay-locked loop circuits generates one of the periodic output signals in response to at least two periodic input signals. A multiplexer circuit selects a selected periodic signal from among the periodic input signals and the periodic output signals based on select signals. A phase detection circuit compares a phase of the selected periodic signal to a data signal to generate a phase detection signal. A control logic circuit generates the select signals. The control logic circuit adjusts the select signals based on changes in the phase detection signal to cause the multiplexer circuit to adjust the phase of the selected periodic signal.

Abstract: A circuit can include a module having signal pads that are configurable to route signals between the circuit and at least one external device. The module can also have unused pads that are interleaved between the signal pads. A circuit can include a module having signal pads that are configurable to route varying signals between the circuit and at least one external device. The module can also have voltage pads that are configurable to route substantially constant voltages between at least one external device and the circuit. The signal pads can be interleaved between the voltage pads. A module with one or more of these features can achieve ideal performance in both wire bond and flip chip packages with the flexibility of setting a different input/output utilization percentage within the module.

Abstract: A feedback loop circuit includes a phase detector and delay circuits. The phase detector generates an output signal based on a delayed periodic signal. The delay circuits are coupled in a delay chain that delays the delayed periodic signal. Each of the delay circuits comprises variable delay blocks and fixed delay blocks that are coupled to form at least two delay paths for an input signal through the delay circuit to generate a delayed output signal. Delays of the variable delay blocks in the delay circuits vary based on the output signal of the phase detector. Each of the delay circuits reroutes the input signal through a different one of the delay paths to generate the delayed output signal based on the output signal of the phase detector during operation of the feedback loop circuit. Each of the variable delay blocks and the fixed delay blocks is inverting.

Abstract: The circuit, typically a delay-locked loop, comprises a phase detector, a first counter, a second counter, and a comparator. The phase detector compares a phase of a first clock signal with a phase of a second clock signal. The first counter generates first count signals and adjusts the first count signals when the phase detector indicates that the phases of the first and the second clock signals are out of alignment. The second counter generates second count signals. The first comparator generates a first comparison signal in response to a comparison between the first count signals and the second count signals. The second clock signal is generated in response to the first comparison signal.

Abstract: A circuit includes a phase detection circuit and a phase change circuit. The phase detection circuit compares a phase of a first periodic signal to an input signal to generate a gain signal. The phase change circuit provides phase shifts to the first periodic signal in first and second directions when the gain signal has a first value. The phase change circuit increases phase shifts provided to the first periodic signal in the first direction in response to the gain signal changing from the first value to a second value. The phase change circuit provides phase shifts to the first periodic signal in the second direction when the gain signal has the second value that are smaller than the phase shifts provided to the first periodic signal in the first direction when the gain signal has the second value.

Abstract: A data storage device has a data storage medium. A data storage capacity of the data storage device is divided into slices. Each slice has a set of sectors. Data storage device firmware is configured to store copies of a system image in the slices on the data storage device. Each of the slices stores a different copy of the system image.

Abstract: An oscillator circuit includes differential variable delay circuits coupled together to form a ring oscillator. Each of the differential variable delay circuits has first and second inputs and first, second, third, and fourth transistors. A constant supply voltage is provided to sources of the first and the second transistors in each of the differential variable delay circuits. A variable supply voltage is provided to sources of the third and the fourth transistors in each of the differential variable delay circuits. Gates of the first and the third transistors are coupled to the first input. Gates of the second and the fourth transistors are coupled to the second input. The oscillator circuit generates a periodic output signal having a frequency that varies based on changes in the variable supply voltage.

Abstract: Techniques are provided that generate bit reliabilities for a detected sequence. A detector generates the detected sequence. According to one embodiment, a post-processor finds a first set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the first bit value, finds a second set of combinations of one or more error events in the detected sequence satisfying a complete set or a subset of error correction constraints corresponding to the second bit value, selects a first most likely combination of one or more events of the first set and a second most likely combination of one or more events of the second set, and generates a bit reliability based on the first and the second most likely values.

Abstract: A circuit includes a receiver channel and a built-in self-test circuit. The receiver channel has a serializer and a deserializer. The built-in self-test circuit generates test signals that are transmitted in parallel to the serializer during a test of the receiver channel. The serializer converts the test signals into serial test signals. The deserializer converts the serial test signals into parallel test signals that are transmitted to the built-in self-test circuit.

Abstract: A detector generates a detected sequence, and a post processor generates probability values that indicate the likelihood of a plurality of error events in the detected sequence. The post processor partitions the values into first and second subsets. The post processor selects a first most likely value from the first subset of the values and a second most likely value from the second subset of the values. The post processor generates a bit reliability based on the first and the second most likely values.

Abstract: A data storage device comprises virtual storage devices that are each assigned to a subset of data sectors in a non-volatile memory of the data storage device. The data storage device receives configuration metadata for configuring each of the virtual storage devices from a host operating system. The configuration metadata is received in a standard format that is file system independent. The configuration metadata comprises a range of logical block addresses and a virtual storage device number assigned to each of the virtual storage devices. Each of the virtual storage device numbers is a unique identifier used by the data storage device to differentiate between the virtual storage devices. The data storage device uses the virtual storage device numbers and logical block addresses to identify data sectors in the virtual storage devices that are accessible by virtual machine operating systems.

Abstract: A level shifter circuit includes an input circuit, an inverter, a pull-up circuit, and a pull-down circuit. The input circuit generates a pull-up signal in response to an input signal using charge from a supply voltage. The inverter inverts the input signal to generate a pull-down signal. The inverter comprises complementary transistors that receive charge from the supply voltage. The pull-up circuit pulls a level shifted output signal of the level shifter circuit to the supply voltage in response to the pull-up signal. The pull-down circuit pulls the level shifted output signal to a low voltage in response to the pull-down signal.

Abstract: A hard disk drive is provided for enhancing random number generation. In particular embodiments, the hard disk drive includes a storage subsystem and a controller. The controller generates a random number based on information associated with the storage subsystem. The controller transmits the random number to a host system.

Abstract: Techniques for optimizing hard disk drive performance. According to one embodiment, a storage system includes a storage unit that stores data and a controller. The controller receives an idle mode indication and performs at least one operation based on the idle mode indication. According to another embodiment, a host system includes a processor and a scheduler that is operative to issues commands. The processor computes the idle mode indication, and the processor sends the idle mode indication to the storage system.

Abstract: Techniques are provided for calibrating on-chip termination impedances on integrated circuits. An on-chip termination (OCT) calibration circuit generates calibration codes that selectively control the conductive states of a set of transistors coupled in parallel. The OCT calibration circuit selects a calibration code that causes the impedance of the transistors to be near a matching impedance. The selected calibration code controls an on-chip termination impedance at a pin. According to some embodiments, the OCT calibration circuit compares a signal from the transistors to two or more reference signals to improve the tolerance range of the calibrated on-chip termination impedance. According to other embodiments, the OCT calibration circuit selects a calibration code based on a signal from the transistors after an extra transistor is turned on by a control signal. The control signal is not used to control the on-chip termination impedance.

Abstract: Techniques are provided for controlling on-chip termination (OCT) impedance using OCT calibration blocks that serially transmit OCT control signals to input/output (IO) blocks. The OCT control signals are serially transmitted through a shared conductor. An OCT calibration block can transmit OCT control signals to one or multiple IO blocks. The IO blocks can be programmed to select OCT control signals from one of the calibration blocks. Enable signals enable one or more of the IO blocks to receive the selected OCT control signals. The OCT control signals are used to control the on-chip termination impedance at one or more IO buffers.

Abstract: An analog device under test circuit and a built-in test circuit for testing an AC transfer characteristic of the analog device under test are fabricated on an integrated circuit. The built-in test circuit includes an amplitude detector that detects the amplitude of the output signal of the analog device under test. The test time is reduced by sampling in real-time the DC value corresponding to the amplitude of the analog device under test. An additional reduction in the test time is achieved by using comparators with upper and lower limit reference signals and a pass-fail logic test.

Abstract: A phase interpolator circuit can include first and second transistors coupled to form a differential pair, first and second load circuits, a first switch circuit coupled between the first transistor and the first load circuit, a second switch circuit coupled between the second transistor and the second load circuit, a current source circuit, and a third switch circuit coupled between the differential pair and the current source circuit. A phase interpolator circuit can include three differential pairs of transistors. Six periodic input signals having six different phases are concurrently provided to control inputs of transistors in the three differential pairs of transistors. The phase interpolator circuit generates a selected phase in an output signal in response to four of the periodic input signals.

Abstract: A level shifter circuit includes first and second transistors coupled in series and third and fourth transistors coupled in series. The fourth transistor is coupled to a first node between the first and the second transistors. The level shifter circuit also includes fifth and sixth transistors coupled in series and seventh and eighth transistors coupled in series. The eighth transistor is coupled to a second node between the fifth and the sixth transistors. The second and the eighth transistors receive a first input signal at control inputs. The fourth and the sixth transistors receive a second input signal at control inputs. The second input signal is inverted relative to the first input signal.