Abstract: A wireless power transmitting apparatus transmits an electric power signal comprising any one from among an electric field, a magnetic field, and an electromagnetic field to a wireless power receiving apparatus. A reflector coil is arranged at a distance from a radiation coil. A driving power supply supplies a driving current to the radiation coil. A first phase control circuit controls the phase of the current that flows through the reflector coil so as to stabilize, to a predetermined value, the phase difference between the current that flows through the reflector coil and the current that flows through the radiation coil.

Abstract: To electrically connect a device under test mounted on a device holder and a socket of a test apparatus with accuracy. Provided is a device holder that retains a device, the device holder including: an inner unit that mounts the device; and an outer unit that retains the inner unit such that the inner unit is relatively movable, wherein the inner unit switches whether to lock the outer unit relative to the inner unit or to release the lock. Also, the inner unit and the outer unit of the device holder are provided.

Abstract: A current measurement circuit converts a current signal IIN into a voltage signal VOUT. The current signal IIN is transmitted via a signal line. A shield line is arranged in the vicinity of at least a part of the signal line. A non-inverting amplifier includes an operational amplifier, and the current signal IIN is input to its non-inverting input terminal. The output signal of the non-inverting amplifier is input to its inverting input terminal as a feedback signal. An inverting amplifier amplifies the output signal of the non-inverting amplifier with inversion so as to generate a voltage signal VOUT. An impedance circuit includes a feedback resistor RF between the output terminal of the inverting amplifier and the non-inverting input terminal of the operational amplifier. A guard amplifier receives the electric potential at the inverting input terminal of the operational amplifier, and applies the electric potential to the shield line.

Abstract: An authentication terminal comprising an authentication apparatus authenticating an authentication subject, an artifact operating in accordance with an input signal and a signal processing section is provided. When an authentication result in the authentication apparatus is passed, the signal processing section inputs an input signal without including information of the authentication subject in the artifact and outputs an output signal in accordance with an operation result of the artifact as the authentication result.

Abstract: An authentication system comprising an authentication terminal and an authentication server is provided. The authentication terminal comprises an authentication apparatus authenticating an authentication subject, an artifact operating in accordance with an input signal and a signal processing section inputting an input signal without including information of the authentication subject designated by the authentication server in the artifact and outputting an output signal in accordance with an operation result of the artifact as an authentication result when the authentication result in the authentication apparatus is passed. The authentication server authenticates the authentication subject based on the output signal.

Abstract: A first switch is arranged between one end of a reception antenna and one end of a load. A second switch is arranged between the aforementioned one end of the reception antenna and the other end thereof. A switch control circuit controls switching on and off the first switch and the second switch. The switch control circuit is structured to change the ratio of the on time of the first switch with respect to the period of an electric power signal.

Abstract: An automated test equipment includes a test processor configured to provide a signal to a device under test on the basis of a sequence of instructions defining an evaluation of test vectors. The test processor is configured to map a test vector onto a set of signal states or signal transitions. Furthermore, the test processor is configured to variably select a number of signal states or signal transitions provided in the signal based on a current test vector in dependence on a current instruction.

Abstract: Complex and fine patterns may be formed by an exposure apparatus that decreases movement error of a stage including a beam generating section that generates a charged particle beam, a stage section that has a sample mounted thereon and moves the sample relative to the beam generating section, a detecting section that detects a position of the stage section, a predicting section that generates a predicted drive amount obtained by predicting a drive amount of the stage section based on a detected position of the stage section, and an irradiation control section that performs irradiation control for irradiating the sample with the charged particle beam, based on the predicted drive amount.

Abstract: A light measurement apparatus includes a master laser, a slave laser, an illumination light pulse, and a signal-under-measurement generator. The master laser generates as an output a master laser light pulse, and the slave laser generates as an output a slave laser light pulse having a repetition frequency or a phase different from that of the master laser light pulse. The illumination light pulse generator receives the master laser light pulse and generates as an output an illumination light pulse, and the signal-under-measurement generator, at a point in time when receiving a light pulse under measurement obtained by illuminating the object under measurement with the illumination light pulse and further the slave laser light pulse, generates as an output a signal under measurement according to a power of the light pulse under measurement. The apparatus corrects an error in a measurement of the signal under measurement.

Abstract: An apparatus for wireless testing, wherein the apparatus includes a test interface, a test generator, a test module, and an analysis module. The test interface is coupled to an electronic device and is configured to transmit data to the electronic device and to receive data from the electronic device. The test generator drives the electronic device through the test interface to vary the beam direction. The test module determines a plurality of transmit values of a transmit parameter based on the test signal wirelessly received from the electronic device using at least one static antenna for receiving the test signal. Each transmit value of the transmit parameter is associated with a different beam direction. The analysis module provides an assessment of the plurality of transmit paths of the electronic device based on the plurality of transmit values.

Abstract: Embodiments of the present invention utilize a dual buffer size threshold system for raising interrupts that allows DUT testing systems to perform real-time buffer memory allocation procedures in an on demand basis. Using dual interrupt threshold systems in the manner described by embodiments of the present invention, DUT testing systems can reduce the need to decide on a single buffer size threshold when testing a set of DUTs that separately provide different amounts of fail data relative to each other. As such, embodiments of the present invention can minimize the overhead processing spent on interrupt handling while also reducing the amount wait time needed for the data processing module to process fail data for each DUT. Thus, embodiments of the present invention can increase the use of tester resources more efficiently while decrease the amount of time a tester system spends collecting and/or analyzing fail data for a set of DUTs during a testing session.

Abstract: A method for testing a device under test (DUT) is disclosed. The method comprises communicating signals wirelessly from a first plurality of patch antennae disposed on a top surface of the DUT to a second plurality of patch antennae disposed on a printed circuited within a handler device, wherein the handler device is operable to place the DUT in a socket of a tester system, and wherein the tester system comprises the handler device and a test fixture. The method further comprises communicating the signals captured by the second plurality of patch antennae using microstrip transmission lines to a patch antenna on the printed circuit board, wherein a first waveguide is mounted to the patch antenna using a first waveguide flange, and wherein the first waveguide flange is coupled to a first end of the first waveguide.

Abstract: The invention relates to a charged particle beam exposure apparatus configured to expose cut patterns or via patterns on a substrate having a plurality of line patterns 81a arranged on an upper surface of the substrate at a constant pitch by irradiating the substrate with a plurality of charged particle beams B1 to Bn while moving a one-dimensional array beam A1 in an X direction parallel to the line patterns 81a, the one-dimensional array beam A1 being a beam in which the charged particle beams B1 to Bn are arranged in an Y direction orthogonal to the line patterns 81a.

Abstract: A test carrier includes a base member on which a first electronic device under test is able to be temporarily mounted, and a second electronic device which is configured to be used to test the first electronic device. The second electronic device is mounted on the base member, and the second electronic device is able to be electrically connected to the first electronic device.

Abstract: To measure the content percentage of fat in a liver without increasing hardware size, provided is a measurement apparatus that supplies an ultrasonic signal to a body part and receives a response signal that has passed through an inner portion of the body part, the measurement apparatus including an ultrasonic signal generating section that generates the ultrasonic signal according to a control signal; a loop control section that supplies the control signal to the ultrasonic signal generating section in response to receiving the response signal that has passed through the body part; and a frequency measuring section that measures a repeating frequency of the control signal repeatedly supplied by the loop control section.

Abstract: A method for testing using an automated test equipment is presented. The method comprises transmitting instructions for performing an automated test from a system controller to a tester processor, wherein the instructions comprise parameters for a descriptor module. The method also comprises programming a reconfigurable circuit for implementing the descriptor module onto an instantiated FPGA block coupled to the tester processor. Further, the method comprises interpreting the parameters from the descriptor module using the reconfigurable circuit, wherein the parameters control execution of a plurality of test operations on a DUT coupled to the instantiated FPGA block. Additionally, the method comprises constructing at least one packet in accordance with the parameters, wherein each one of the at least one packet comprises a command for executing a test operation on the DUT. Finally, the method comprises performing a handshake with the DUT to route the at least one packet to the DUT.

Abstract: In a testing device, a method for implementing automatic RF port testing. The method includes attaching a device under test having a plurality of RF pins to a load board, dynamically tuning a plurality of RF ports of the load board to the plurality of RF pins, and automatically matching the plurality of RF ports to the plurality of RF pins with respect to impedance. The method further includes implementing an RF port testing process on the device under test.

Abstract: The invention provides an exposure apparatus (100) including a formation module (122) which forms charged particle beams with different irradiation positions on a specimen.

Abstract: Provided is a test apparatus including an optical test signal generating section that generates an optical test signal; an optical signal supplying section that supplies the optical test signal to a device under test that is a testing target among a plurality of the devices under test; a first optical switch section that selects, from among optical signals output by the plurality of devices under test, the optical signal output by the device under test that is the testing target; and an optical signal receiving section that receives the selected optical signal.

Abstract: Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.