Abstract: The present disclosure relates to a system and method for debugging in fault simulation associated with an electronic design. Embodiments may include receiving, using at least one processor, an electronic design and performing concurrent fault simulation on a fault to be analyzed associated with the electronic circuit design, wherein the fault has a fault propagation path associated therewith. Embodiments may also include identifying a trace of one or more signals of interest that are in the fault propagation path and generating a faulty database and a good database associated with the one or more signals of interest that are in the fault propagation path. Embodiments may further include identifying one or more differences between the faulty database and the good database.

Abstract: The present embodiments are generally directed to analyzing clock jitter. Jitter affects the clock delay of the circuit and the time the clock is available at sync points, so it is important to calculate its impact correctly to take appropriate margin during timing analysis. Jitter could be due to various reasons—one of them is due to IR Impact on the Clock Tree. IR drop variations between the two consecutive cycles can effectively reduce the available clock period for data to be correctly captured.

Abstract: Aspects of the present disclosure address improved systems and methods for buffer insertion in an integrated circuit (IC) design using a cost function that accounts for edge spacing and stack via constraints associated with cells in the IC design. An integrated circuit (IC) design comprising a routing topology for a net is accessed. A set of candidate insertion locations along the routing topology are identified. A set of buffering candidates is generated based on the candidate insertion locations. A buffering candidate comprises a cell inserted at a candidate insertion location along the routing topology. A cost associated with the buffering candidate is determined based on a number of potential edge spacing conflicts and a number of stack vias associated with the cell. A buffering solution for the net is selected from the buffering candidate based on the cost associated with the buffering candidate.

Abstract: Aspects of the present disclosure address systems and methods for fixing clock tree design constraint violations. An initial clock tree is generated. The generating of the initial clock tree comprises routing a clock net using an initial value for a parameter that controls a priority ratio between total route length and a maximum source-to-sink route length in each net of the clock tree. A violation to a clock tree design constraint is detected in the clock net in the clock tree, and based on detecting the violation, a rerouting candidate is generated by rerouting the clock net using an adjusted value for the parameter. A target clock tree is selected based on a comparison of timing characteristics of the rerouting candidate with the clock tree design constraint.

Abstract: Embodiments disclosed herein describe systems, methods, and products for aligning wires in an integrated circuit (IC) design. An illustrative computer may identity multiple references in a first set of wires and multiple targets in a second set of wires in the IC design. The computer may determine reference target pairs from the multiple references and multiple targets. The computer may calculate a path difference for each of the reference target pairs and align the corresponding wires based upon the path difference while obeying minimum spacing rules. The computer may also allow a circuit designer to modify or override the computer selected references, targets, or reference target pairs. Embodiments disclosed herein therefore mitigate the alignment problems of shorting and incorrect spacing.

Abstract: The present disclosure relates to a method for electronic design verification. Embodiments may include receiving, using a processor, an electronic design and providing at least a portion of the electronic design to a machine learning engine. Embodiments may further include automatically determining, based upon, at least in part, an output of the machine learning engine whether or not the at least a portion of the electronic design is amenable to formal verification.

Abstract: Methods and design system for generating 2-dimensional distribution architecture for testing integrated circuit design that utilizes double grid to minimize interdependencies between grid cells and the associated functional logic to facilitate the a physically efficient scan of integrated circuit designs, that simultaneously minimizes required test application time (“TAT”), test data volume, tester memory and cost associated with design for test (“DFT”), while also retaining test coverage. An additional grid parallel to a 2-dimensional XOR grid may be implemented that improves the quality of test coverage by optimally adding additional data inputs which decreases correlations between grid cells. A column spreader may feed data into column wires and row spreader may feed data into column wires. The double grid allows data to be fed into two wires, row and column, respectively, which provides twice as much stimulus data in each direction, without significantly increasing the wiring used to build the grid.

Abstract: In some examples, a time-based equalizer can be configured to receive an input signal from a channel. The input signal can be distorted by previously received input signals transmitted over the channel. The time-based equalizer can be configured to compensate for distortions in the input signal caused by at least one previously received input signal to provide an ISI compensated input signal. The time-based equalizer can be configured to compensate for the distortions by edge time shifting respective edges of the input signal in time over a time interval for detecting the input signal to new edge time locations based on a feedback signal and edge movement signals. The feedback signal can be generated based on at least one previously received input signal.

Abstract: A multi-controller memory system includes a flexible channel memory controller coupled to at least first and second physical interfaces. The second physical interface is also coupled to an auxiliary memory controller. The physical interfaces may be coupled to separate memory modules. In a single-channel control mode, the memory controllers respectively control the memory modules coupled to the first and second physical interface. In a multi-channel control mode, the flexible channel memory controller controls both memory modules while the auxiliary memory controller is inactive. In a single-channel control mode, the memory controllers coordinate restricted memory control commands which access a resource shared by both modules, by one controller transmitting a request signal for the resource to the other controller, awaiting an acknowledgment signal from the other controller, and maintaining transmission of the request signal until the use of the resource is completed.

Abstract: Embodiments may include receiving an unplaced layout associated with an electronic circuit design and one or more grouping requirements. Embodiments may further include identifying instances that need to be placed at the unplaced layout and areas of the unplaced layout configured to receive the instances. Embodiments may also analyzing one or more instances that need to be placed at the unplaced layout and the one or more areas of the unplaced layout configured to receive the one or more instances. Embodiments may further include determining a location and an orientation for each of the one or more instances based upon, at least in part, the analyzing. Embodiments may also include generating a placed layout based upon, at least in part, the determined location and orientation for each of the one or more instances. Embodiments may further include during the generation of the placed layout, routing the placed layout.

Abstract: The present embodiments relate generally to data communications, and more particularly to systems including high-speed serializer-deserializer circuits having TCOILs. One or more embodiments are directed to a four-terminal TCOIL structure that consumes the same amount of area on a chip as a traditional three-terminal structure, while providing more bandwidth and less reflection and group delay variation.

Abstract: Aspects of the present disclosure address improved systems and methods for rebuffering an integrated circuit (IC) design using a unified improvement scoring algorithm. A plurality of rebuffering candidates are generated based on an initial buffer tree in an integrated circuit (IC) design. A rebuffering candidate in the plurality of rebuffering candidates comprises a modified buffer tree based on the initial buffer tree. A buffering cost of each rebuffering candidate is determined. A reference buffer tree is selected from among the rebuffering candidates based on the buffering cost of each rebuffering candidate. An improvement score of each rebuffering candidate is determined based on the buffering cost of each rebuffering candidate relative to the reference buffer tree. A new buffer tree is selected from among the plurality of rebuffering candidates to replace the initial buffer tree based on the improvement score of each rebuffering candidate.

Abstract: Aspects of the present disclosure address improved systems and methods for runtime efficient circuit placement location selection as described herein. An example embodiment includes identifying, for each route of the one or more routes that interconnect the terminals of a circuit design with the one or more pins of a first circuit element, a corresponding set of movement positions along said each route to generate a set of movement configurations for the first circuit element. The set of movement configurations is analyzed to generate a plurality of location clusters from the set of movement configurations, and for each location cluster of the plurality of location clusters, identifying one or more selected movement configurations within said each cluster. The one or more selected movement configurations for said each cluster to select an updated movement configuration.

Abstract: Various embodiments provide for analyzing (e.g., debugging) waveform data generated for a simulated circuit design, which can be used as part of electronic design automation (EDA). For example, where a user modifies a circuit design in a manner that impacts a next simulation run performed on the circuit design, various embodiments perform the next simulation run only on one or more portions of the circuit design affected by the user's modifications, while the results/simulated values for the rest of the circuit design are kept or reused.

Abstract: Various embodiments provide for generating a routing structure for a clock network based on edge interaction detection, which can facilitate detection/consideration of overuse of routing resources to a balanced routing structure and which may be part of electronic design automation (EDA) of a circuit design. For example, some embodiments use an edge intersection check to detect overuse of routing resources within the routing structure for a clock network.

Abstract: Embodiments described herein provide a new layout editor tool allowing designers to concurrently edit various aspects of an electronic circuit layout, even at disparate hierarchical levels of the design. The new layout editor tool enables multiple electronic circuit designers to concurrently edit a layout a different hierarchical levels, by logically establishing editable child sub cell-level partitions within a parent layout-level partition, each of which representing various components of the same electronic circuit layout.

Abstract: The present embodiments relate to electrostatic discharge (ESD) simulation of integrated circuit designs. A netlist of the circuit design can be modified to include ESD protection devices and only essential non-ESD devices. The essential non-ESD devices can be determined based on whether a non-ESD device satisfies one or more of two conditions: (i) a least resistance path (LRP) value of at least one terminal of the non-ESD device from any port of the set of ports is less than a first threshold value or (ii) an effective resistance value between at least one terminal of the non-ESD device from any port of the set of ports is less than a second threshold value. The essential non-ESD devices are included in a reduced netlist in addition to the ESD protection devices. The ESD simulation is carried out on the reduced netlist, thereby reducing simulation time.

Abstract: The present embodiments relate to static timing analysis (STA) of circuits. The STA can include determining graph based analysis (GBA) delays of timing paths within the circuit. Path based analysis (PBA) delays of a subset of timing paths can be determined to generate circuit stage credit values for circuit stages in the circuit. The circuit stage credit values can be used to adjust GBA delays of the timing paths. Prediction functions can be utilized to predict or estimate PBA delays of timing paths thereby avoiding the determination of actual PBA delays of the timing paths.

Abstract: An approach is described for determining waiver applicability conditions and applying the conditions to multiple errors or warnings in physical verification tools. According to some embodiments, the approach includes identification of a waiver of an error or warning, registration of one or more condition sets for waiver of an error or warning, waiver of multiple errors or warnings that match the registered one or more condition sets, and further comprise any or all of the following: receiving or retrieving a circuit design, analyzing the circuit design to identify errors and warnings, and displaying identified errors and warnings where errors and warnings matching a registered condition set are waived. This approach provides for a 1-to-many relationship between identification of a waiver and application of waivers.

Abstract: A method for receiving a circuit layout including modules in a hierarchical structure. The method includes selecting a module in the hierarchical structure, identifying multiple toggling netlists in the module during multiple clock cycles, grouping the toggling netlists into clusters based on a toggle weight factor, and finding an average toggle weight factor for each cluster. The method includes generating instrument logic to determine a power consumption of the circuit layout based on a number of toggling netlists in each cluster for each clock cycle, and on the average toggle weight factor for each cluster, merging, with a compiler tool, the instrument logic with the circuit layout into an executable file for an emulator tool. The method includes evaluating the power consumption of the circuit layout with the emulator tool; and modifying the circuit layout when the power consumption of the circuit layout exceeds a pre-selected threshold.