Abstract: A method and a system to pre-scan a file, analyze data and create the Condensed Macro Library (CML) file. The method used is to find macros or cells of certain classes that are defined by rules. After a suitable macro or cell is identified, a parser scans the macro or cell pins and finds pins which have ports with the shapes defined on the specific layers defined by the rules and user data. Further processing is then performed based on a set of rules and the pin data to generate a CML file that contains relevant information regarding relevant pins.

Abstract: Disclosed are method(s), system(s), and article(s) of manufacture for implementing a layout of an electronic circuit using one or more constraint checking windows. The method identifies some constraints on multiple-patterning lithography and multiple constraint checking windows for the layout. The method determines one or more metrics for a constraint checking window or for a layout and assigns one or more shapes in the one or more constraint checking windows to their respective mask designs based on the one or more metrics. The method traverses through the one or more constraint checking windows until all shapes in the layout are assigned to their respective mask designs. The method may also determine a processing order for the one or more constraint checking windows based on the distribution of a type of shapes in the layout.

Abstract: In one embodiment of the invention, a multi-CCC current source model is disclosed to perform statistical timing analysis of an integrated circuit design. The multi-CCC current source model includes a voltage waveform transfer function, a voltage dependent current source, and an output capacitor. The voltage waveform transfer function receives an input voltage waveform and transforms it into an intermediate voltage waveform. The voltage dependent current source generates an output current in response to the intermediate voltage waveform. The output capacitor is coupled in parallel to the voltage dependent current source to generate an output voltage waveform for computation of a timing delay.

Abstract: A method, system, and computer program product are disclosed for using pattern-dependent models at early stages of the design process. This addresses the key disadvantage of prior approaches which are restricted to using such models later in the design process for IC designs that are nearly complete. Pattern-dependent manufacturing effects are extracted from early stage designs and using the extracted pattern-dependent effects to efficiently and effectively design the integrated circuit. One or more contexts are built around one or more units of the design, with examples of units being a block or cell. The units are then used in the context to generate pattern-dependent data as a basis for one or more pattern-dependent models.

Abstract: Disclosed are methods, systems, and articles of manufacture for processing a electronic design, which use a computer system to identify an operation associated with a task to be performed on the electronic design, to generate a hierarchical output for multiple shapes for performing the task based at least in part on performing an operation associated with the task, and to display or to store the hierarchical output. The task comprises a dummy fill insertion task or a design verification task in some embodiments. The methods or the systems may further determine or identify an inverse transform and apply the inverse transform to a shape before adding the shape to the hierarchical output. In some embodiments, there exists no duplication among the shapes in the hierarchical output, or only shapes derived from original shapes that belong to the first instance of a cellview master are added to the hierarchical output.

Abstract: A method and system for auto-routing wiring within a PCB. In some embodiment, a first broad region within a first layer and a counterpart first broad region within a second layer are defined. The counterpart regions define a first broad via location. In some embodiments, the first and second broad via locations of the first and second layers can then be subdivided into a plurality of triangular regions. The triangular regions on the first and second layers can then be compared to more accurately locate an appropriate via location.

Abstract: Some embodiments of the invention provide a method for performing thermal analysis of an integrated circuit (“IC”) design layout that includes numerous circuit modules. The method divides the IC design layout into a set of elements, where at least one element includes several wires. The method computes a set of conductivity groups of values for the set of elements. The method identifies a temperature distribution for the IC design layout based on the set of conductivity groups of values. In some embodiments, each of these elements corresponds to a particular portion of a particular layer of the IC design layout. Each element includes several nodes. Each conductivity group of values is defined by entry values. Each entry value describes how heat flow at a particular node of the element is affected by a temperature change at another particular node of the element.

Abstract: The present invention allows a verification environment to be used to control and coordinate interaction with a design running on an accelerator or emulator without significant speed penalty. For example, an interface capable of communicating with test software running on an embedded processor is used to control and monitor the flow of data into the external interface of the design. Thus, a connection is made between the verification environment and the design under test running on the accelerator/emulator via a connection formed directly between the verification environment and embedded software running on the emulator for simulation and monitoring purpose at a very low frequency so that high-speed acceleration may still be achieved.

Abstract: Disclosed are methods, systems, and structures for implementing an improved approach for simulating mixed-signal electronic designs. An improved approach for providing seamless interaction between analog and digital blocks during simulation, even if the digital blocks include complex types or models.

Abstract: In one embodiment of the invention, a method is disclosed to generate a clock output signal with selected phase. The method includes selecting a phase delay for the clock output signal; charging a capacitor with a first weighted current during a first phase input clock, charging the capacitor with a second weighted current during a portion of a second phase input clock, and determining if a voltage across the capacitor is greater than or equal to a threshold voltage to generate a first edge of the clock output signal with the selected phase delay. The first weighted current may have a weighting of N out of M to charge the capacitor with a predetermined rate of change in voltage in response to the selected phase delay. The second weighted current may have a weighting of M out of M to charge the capacitor with a constant rate of change.

Abstract: In one embodiment of the invention, a method includes reading an automatically generated timing budgeting file, including timing budget information for a plurality of partitions of an integrated circuit design; graphically displaying a time budgeting debug window on a display device; and graphically displaying a timing budget analyzer window on the display device in response to selection of a selected signal path in a path list window pane. The timing budget analyzer window graphically displays timing budgets and timing delays of a selected path for visual comparison. The time budgeting debug window includes a button with a path category menu to display one or more signal paths meeting a selected path category, and a path list window pane to display a list of one or more signal paths through one or more ports of the plurality of partitions in response to the selected path category in the path category menu.

Abstract: An improved approach is described for allowing designers to identify and utilize suitable IP for an electronic design. An architecture is provided that includes an IP portal and/or chip estimator to identify suitable IP from a catalog of IP, which is integrated with a hosted design environment to use and test that IP for the user's specific electronic design. An authorization mechanism may be used to control access to the IP from the IP catalog. This approach greatly enhances the probability that IP suppliers will be successfully connected with the target consumers of those IP blocks.

Abstract: A model library contains one or more storable models of a physical system each constructed by numerically solving relationships between a characteristic of the physical system given a set of model parameters. Such a model may be retrieved from the library according to values assigned to the model parameters and used to determine a corresponding characteristic of the physical system without repeating the numerical solution method originally used to create the model. Instead, a mapping may be applied to the storable model to seamlessly obtain the characteristic upon request.

Abstract: A system and method for securely and automatically moving a resource, such as a server, between secure network environments include a secure auto-migration control program. The secure auto-migration program may automatically reconfigure a computing resource used in a first secure network environment to be used in a second secure network environment and logically move the computer resource from the first secure network environment to the second secure network environment.

Abstract: Techniques that can improve the efficiency of routing where connections are subject to elongation constraints. The design can be optimized by estimating elongation needed to meet constraints after an initial routing solution has been generated, but before elongation is actually applied to detailed paths. Paths can be re-routed at this earlier stage if it is determined that too much elongation, or too much elongation in crowded areas, will need to be added after the detail routing stage.

Abstract: Techniques are presented for improving parametric yield. As part of an automatic sizing process for a circuit, one set of techniques receives a target value for a performance goal and then optimizes, with respect to the number of standard deviations, the distance by which the mean value of a distribution of the performance goal differs from the target value. In a second set of techniques, as part of an automatic sizing process during a circuit design process, the operation of the circuit is simulated to determine the distribution of a performance goal for a first design point. It is then determined whether a second design point is sufficiently close to the first design point and, if so, the simulation for the first design point is used for evaluating the second design point in an optimization process.

Abstract: A method for identifying an anomaly in an electronic system includes receiving, from a computer-readable storage medium, a plurality of entries from a successful simulation test of the electronic system, each of the plurality of entries including information about simulation time. The method also includes, with one or more computer processors, determining time sequence relationship between pairs of entries selected from the plurality of entries and identifying allowable sequences of entries using information related to the first plurality of entries and the time sequence relationship. The method includes receiving a second plurality of entries from a failed simulation test of the electronic system, each of the second plurality of entries including information about simulation time. The method includes analyzing the second plurality of entries and identifying one or more anomalies in the electronic system based on the analysis of the failed simulation test.

Abstract: A method for detecting program code errors including searching for lines of command codes in the program code. A line of command code includes command codes and indices. The lines of command codes are organized as paragraphs. At least one of the lines of commands codes in each paragraph is different from the other lines of commands codes in the paragraph. The method further including separating the command codes from the indices for the lines of command codes, wherein the indices are a matrix of indices, and each row of indices in the matrix of indices includes the sets of indices for each of the lines of command codes from one of the paragraphs; determining each set of vertical indices in the matrix of indices that does not match a known series; and reporting to a user computer each set of vertical indices that does not match the known series.

Abstract: A method of specifying system level constraints for connecting an interface of an electronic device between first and second fabrics includes specifying one or more first condition relating to a placement of the interface, specifying one or more second condition relating to a connection of a net in the interface between the first and second fabrics, generating one or more first equation expressing the first condition as a function of the location of the connectors, generating one or more second equation expressing the second condition as a function of the location of connectors, generating one or more third equation expressing an optimality criterion for the interface, and outputting the one or more first equation, the one or more second equation and the one or more third equation to a data file in a computer readable format.

Abstract: A method for automatically generating and prioritizing several design solutions that resolve a double patterning (DP) loop violation in an IC design layout. The method of some embodiments receives a DP loop violation marker and identifies pairs of edges of shapes that form a double patterning loop based on the DP loop violation marker. For each pair of edges that violates the design rule, the method generates one or more design solutions. Each design solution moves a single edge or both edges to resolve the violation. The method of some embodiments computes the cost of applying each design solution to the IC design layout and prioritizes the generated solutions for all the identified pairs of edges based on the computed cost for each solution. The method in some embodiments then selects a solution from the prioritized solutions and applies the selected solution to the design layout.