Abstract: A apparatus and method for correcting a process critical layout includes characterizing the influence of individual ones of a set of worst case process variations on a simulated nano-circuit layout design and then correcting layout geometries in the simulated nano-circuit layout based on such characterizations.

Abstract: Systems and methods for generating an image are provided. These systems and methods include generating multiple light beams from a light source by controlling at least one parameter of the light source to be different among each of the multiple light beams. The systems and methods further include forming multiple light patterns of circuit structures that are separated in frequency by directing each of the light beams at a mask of circuit features. The systems and methods, when used in lithography for example, further include directing each of the light patterns toward a silicon substrate. The silicon substrate includes a silicon wafer having a surface at least partially covered with at least one of a photoresist material and a reversible contrast enhancement material (R-CEM).

Abstract: An invention is provided for wear leveling in a non-volatile memory system utilizing relative wear counters to indicate relative levels of wear for each memory block in a non-volatile memory system. Whenever a memory block is erased, the associated relative wear counter is incremented. Then, when any relative wear counter reaches a predetermined limit, the value of the lowest relative wear counter is subtracted from each relative wear counter. Thus, each relative wear counter indicates a relative wear level of the associated memory block relative to other memory blocks. In this manner, the relative wear levels are maintained while reducing the amount of memory needed to for each relative wear counter.

Abstract: A method is provided to evaluate substrate noise propagation in an integrated circuit design, the method comprising: providing a tile definition that specifies an electrical model associated with instances of the tile; mapping a plurality of respective tile instances to respective locations of the substrate; obtaining respective waveforms indicative of digital switching induced power grid fluctuations associated with the respective identified contacts; and associating a voltage with a selected tile instance of the tile grid that is indicative of substrate noise injection due to waveforms associated with contacts encompassed by the selected tile instance.

Abstract: A method is provided to evaluate whether one or more test patterns is power safe for use during manufacturing testing of an integrated circuit that includes a nonuniform power grid and that includes a scan chain, the method comprising: assigning respective toggle count thresholds for respective power grid regions of the non-uniform power grid; and determining whether respective numbers of toggles by scan elements of the scan chain within one or more respective power grid regions meet respective toggle count thresholds for the one or more respective regions during at least one scan-shift cycle in the course of scan-in of a test pattern to the scan chain.

Abstract: An automated system and method for determining flip chip connections involves generating a first projection that includes representations of bumps arranged over a core of the flip chip and generating a second projection that includes representations of I/O pads arranged around the core. The first projection is generated by drawing a line through each bump between a location of the flip chip and an outer portion of the flip chip and marking a location where the line terminates at the outer portion with a representation of the bump. The outer portion of the flip chip is traversed, and the first projection is generated based on the order in which bump representations are encountered. The second projection is generated by drawing a line through each I/O pad between a location of the flip chip and an outer portion of the flip chip and marking a location where the line terminates at the outer portion with a representation of the I/O pad.

Abstract: A combined language-compiler that provides for the efficient compilation process of hybrid computer code written using a plurality of computer languages by splitting the hybrid code in such a way that each code statement is optimally independently compliable. The designer specifies both computation and communication between different hybrid code modules.

Abstract: The present invention provides a system and method for resolving a test generation problem involving constraint resolution problems where a verification environment includes constraints that are suitable for resolution using one type of solver for a first domain and other constraints that are suitable for resolution using a different solver in a second domain. The invention further comprises variables and, in instances where at least one variable is in each of the first and second domains, using these solvers to restrict the set of permissible values of variables to be consistent in multiple domains, preferably in all relevant domains. A constraint resolution problem is divided into clusters of constraints connected within a domain, and connected clusters of clusters that are connected through shared variables that are subject to constraints in more than one cluster.

Abstract: A system and method of managing external content that is used within a software product or software development process is disclosed. In some approaches, the system and method manages and tracks the use of external content, as well an approval process for determining whether the external content is to be used or incorporated. The system and method manages and tracks compliance with terms and restrictions of the external content.

Abstract: A method and system for resolving circuit and network parameters. A circuit evaluation system includes a plurality of nodes and a plurality of resolution devices. Each node is connected to a resolution device via a bi-directional connection, and at least one node is configured to receive data from an input. Each enabling element is associated with a resolution device. Enabling elements that are associated with resolution devices that are connected to nodes that are configured to receive input data are activated, thereby enabling certain resolution devices. The enabled resolution devices are executed using data in the nodes that are connected to the enabled resolution devices. Iterations of executing resolution devices are performed until stable node values are determined.

Abstract: An improved method and system for performing extraction on an integrated circuit design is disclosed. Extraction can be performed at granularities much smaller than the entire IC design, in which a halo is used to identify a geometric volume surrounding an object of interest to identify neighboring objects and generate an electrical model. The extraction approach can be taken for Islands, Nets, as well as other granularities within the design. Re-extraction of a design can occur at granularities smaller than a net. Some approaches utilize Island-stitching to replace an island within a net. An approach is also described for improving cross-references for cross-coupled objects.

Abstract: Features are provided for graphically representing constraints on design objects in an Electronic Design Automation tool. A particular constraint on one or more circuit objects is displayed as a highlighted region that extends to each visible circuit object to which the constraint applies. Attributes of the highlighted region, such as density and thickness, may proportionally represent attributes of the constraint, such as a strength or distance specified by the constraint. The highlighted region is superimposed on or around circuit objects. The highlighted region may be a halo, which is a partially transparent region filled with a color. Multiple regions that represent the same type of constraint or relationship are connected by line segments, providing the ability to visualize groups of constrained objects, including groups that span levels of a hierarchical design. Intersecting highlighted regions are blended together using techniques such as alpha blending.

Abstract: Disclosed is a method, system, and article of manufacture for a one-pass approach for implementing metal-fill for an integrated circuit. Also disclosed is a method, system, and article of manufacture for implementing metal-fill that is coupled to a tie-off connection. An approach that is disclosed comprises a method, system, and article of manufacture for implementing metal-fill having an elongated shape that corresponds to the length of whitespace. Also disclosed is the aspect of implementing metal-fill that matches the routing direction. Yet another disclosure is an implementation of a place & route tool incorporating an integrated metal-fill mechanism.

Abstract: A methodology is provided to perform noise analysis in the implementation stage of the design of an integrated circuit, and based upon analysis results, a floorplan may be adjusted or guard rings may be inserted to reduce the impact of digital switching noise upon noise sensitive circuits.

Abstract: For increasing user control and insight into preparing a mixed-signal semiconductor design specification for simulation, there are provided methods responsive to commands that provide control over resolution of disciplines and partitioning of the design into analog and digital portions. In some aspects, the methods provide block-based assignment of disciplines, as well as design partitioning. In other aspects, the methods provide for resolving a discipline to apply in a block from among multiple possible disciplines. In some aspects, error flagging may be available for detecting disciplines different from what provided for assignment in a block. Assignments may be indicated based on instance, cell, terminal, or library names and may be specified with wild cards. In still other aspects, the methods may be embodied by instructions on computer readable media, and in systems comprising general and special purpose computer hardware that may communicate with various storage facilities and over various networks.

Abstract: Some embodiments provide a method and system for identifying error markers for patterns within a design layout that do not meet the manufacturing constraints. Some embodiments extend a region from the error marked region to extract a pattern for decomposition analysis. Some embodiments compare the extracted pattern to known patterns stored in a library, which also stores at least one previously computed decomposition solution for each known pattern. For an extracted pattern existing within the library, some embodiments retrieve the previously computed decomposition solution from the library. For an extracted pattern that does not exist within the library, some embodiments use one or more simulations to determine a decomposition solution for the extracted pattern. The resulting decomposition solution replaces the extracted pattern within the design layout producing a variant of the original layout that contains the decomposed solution for the pattern.

Abstract: Disclosed is a method, system, and computer program product for implementing model-based floorplanning, layout, placement, and routing. Models are used to guide the placement and routing of polygons on the IC layout based upon predictions of manufacturing variations.

Abstract: Methods, software, and systems implementing software provide for accepting a user's selection of a database object defining layout being displayed. The database objects can include objects defining paths and path segments. Automatic layout tools may be used in creating at least some of the objects. The user's selection begins a recursive process of automatically selecting additional database objects based on criteria designed to create an uninterrupted spine from database objects on a single interconnect layer, of the same width, and collectively arranged such that the spine has a first end and a second end, and can be traced from the first end to the second end without backtracking.

Abstract: A method, system, and computer program product are disclosed for performing RC extraction. The present approach can consider multiple types of manufacturing processes, and allows location-based prediction data to be used in the context of net-based analysis. RC extraction can be more accurately performed based upon net-specific top and bottom adjustments to thickness prediction that are location-based. The net-based prediction data can be used for other purposes as well, such as to perform electrical hotspot analysis, to visually display physical properties of the nets, or allow queries for other data analysis purposes.

Abstract: Techniques are provided to allow users of Electronic Design Automation (EDA) tools to define constraint template types for efficiently associating constraints with design objects to specify design intent. Processes for creating and validating the constraints are provided by user-defined plug-ins, thereby allowing users to annotate circuit designs with constraints for proprietary layout and fabrication processes without exposing the constraints to tool vendors or competitors. The constraints are re-created from the template types whenever the circuit design is loaded into the EDA tool, so that the constraints are based upon the latest version of the template type. The constraints are also re-created when validation fails. Constraint groups are reusable in different designs, technology nodes, and processes because they automatically expand to provide the specific constraints to achieve a goal.