Abstract: A focused multi-planar image acquisition in real time even while a test object is moving, is achieved with a system and a method for a focused multi-planar image acquisition in a prober. When a surface of a test object is positioned laterally in relation to tips of separated probe needles, a microscope is focused on the surface of the test object at a first time and on a plane of the probe needles at a second time. The objective lens is provided with a microscope objective lens focusing system, which can focus the objective lens, independently of a vertical adjustment drive of the microscope, on the surface of the test object in a first focal plane and in a second focal plane, which is on a level with the probe needle tips.

Abstract: A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test substrate and a second support surface, which is laterally offset to the first support surface, for supporting a calibration substrate. The calibration substrate has planar calibration standards for calibration of a measuring unit of a prober, and dielectric material or air situated below the calibration substrate at least in the area of the calibration standard. In order to be able to take the actual thermal conditions on the test substrate and in particular also on known and unknown calibration standards and thus the thermal influence on the electrical behavior of the calibration standard used into consideration, the second support surface is equipped for temperature control of the calibration substrate.

Abstract: A calibration structure for probing devices.

Abstract: An arrangement is provided for testing DUTs with a chuck that has a support surface for supporting of a DUT as well as for supplying the support surface with a defined potential, or for connecting the DUT. The arrangement further includes a positioning device for positioning the chuck as well as an electromagnetic shielding housing enclosing at least the chuck. Inside the housing and adjacent to the chuck, a signal preamplifier is arranged whose signal port facing the chuck is electrically connected with the support surface, wherein the signal preamplifier is moveable together with the chuck by the positioning device in a way that it holds its position constant relative to the chuck during positioning. The signal preamplifier is connected to a measurement unit outside of the housing via a measurement cable.

Abstract: A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.

Abstract: A multi-use snow tool is described, which includes a snow fluke and a snow picket that may be combined to function as a snow shovel, or may be used independent of each other as climbing anchors. As one example, the multi-use snow tool includes a snow fluke including a blade body having a base end and a nose end opposite the base end; a snow picket having an elongate shaft including at least a first flange; and a lip assembly located at the base end of the blade body and cooperating with the blade body to define at least a first channel that is adapted to mate with the first flange to detachably couple the snow picket to the snow fluke.

Abstract: A chuck for supporting and retaining a test substrate includes a device for supporting and retaining a calibration substrate. The chuck comprises a first support surface for supporting a test substrate and a second support surface, which is laterally offset to the first support surface, for supporting a calibration substrate The calibration substrate has planar calibration standards for calibration of a measuring unit of a prober, and dielectric material or air situated below the calibration substrate at least in the area of the calibration standard. In order to be able to take the actual thermal conditions on the test substrate and in particular also on known and unknown calibration standards and thus the thermal influence on the electrical behavior of the calibration standard used into consideration, the second support surface is equipped for temperature control of the calibration substrate.

Abstract: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.

Abstract: A hyperspectral sensor or imager comprising a laser for illuminating a scene and a detector for detecting light emitted by the laser and transmitted through the scene, wherein the laser is a chirped laser arranged to output multiple pulses having different wavelength ranges, the multiple pulses being used to form an extended continuous spectrum for illuminating the scene.

Abstract: A chuck for a probe station.

Abstract: A testing system that includes an plural imaging devices capturing plural video sequences from a single optical path and concurrently displaying the video sequences for effectively positioning a probe for testing a semiconductor wafer.

Abstract: A prober for testing devices in a repeat structure on a substrate is provided with a probe holder plate, probe holders mounted on the plate, and a test probe associated with each holder. Each test probe is displaceable via a manipulator connected to a probe holder, and a substrate carrier fixedly supports the substrate. Testing of devices, which are situated in a repeat structure on a substrate, in sequence without a substrate movement and avoiding individual manipulation of the test probes in relation to the contact islands on the devices, is achieved in that the probe holders are fastened on a shared probe holder plate and the probe holder plate is moved in relation to the test substrate.

Abstract: The current invention is directed towards a device that useful for studying cell migration. It is preferred that the device is configured to study stem cell, particularly hematopoetic stem/precursor cell homing. The device allows for detailed analysis of the various phases of the multiphase homing process. There are also provided herein, novel methods of using the device, including, but not limited to, dissection of the homing process under microenvironmental conditions mimicking healthy conditions, diseased conditions, inflammatory conditions, drug treatment conditions and experimental conditions.

Abstract: An individual transportation system (10) includes a track system (12), including a primary track section (14), a switching track section (16) and loading/unloading section (18). The transportation system (10) additionally includes a plurality of carriages (20) supported by the track system (12), and a plurality of underslung passenger vehicles (22) each matably engageable with one of the carriages, and adapted to hold at least one passenger therein. The transportation system (10) further includes a storage facility (24) for storing the vehicles (22) when they are disengaged from the carriage, whereby a carriage and vehicle combination traveling on the primary track can be switched between primary track section (14) via an associated switching track section (16), and can be switched to the loading/unloading track (18), wherein the vehicle may be disengaged from carriage (20) and stored in the storage facility (24).

Abstract: A fork positioner, usable alternatively either as an attachment to an existing load-lifting carriage with forks, or as part of the original equipment of a load-lifting carriage, has a pair of elongate hydraulic piston and cylinder assemblies mountable in an interconnected parallel relationship between an upper transverse fork-supporting member and a lower transverse member of the carriage. Each of a pair of fork-positioning guide members has a fork-engagement surface movable by a respective piston and cylinder assembly and connectable thereto so that the fork-engaging surfaces face substantially perpendicularly away from an imaginary plane containing the respective longitudinal axes of the piston and cylinder assemblies. An exemplary carriage mounting the fork positioner is also disclosed.

Abstract: A spout, particularly for flexible fluid reservoirs having opposing film panels, which minimizes stresses and abrasion resulting from manufacture and/or use of such reservoirs as well as enhances the strength of the weld/bond between the films and the spout. Spouts according to the invention include a generally cylindrical neck portion and a pair of opposed, generally triangular portions extending laterally there from that form a spout-film interface. This interface may be smooth and/or define depressions or holes to increase bond integrity. Spout embodiments of the invention also may include at least one, and preferably four, stress delocalizing feature(s) (“SDF”) to disperse material stress from edges of the spout-film interface that might form during use of the spout. Exemplary SDFs include flexible appendages, preferably at the apex of the triangular portions or at neck portions that form a portion of the spout-weld interfaces, which depend beyond the spout weld interface and into the reservoir.

Abstract: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.

Abstract: An apparatus and method for making a compliant interconnect assembly adapted to electrically couple a first circuit member to a second circuit member. The first dielectric layer has a first major surface and a plurality of through openings. A plurality of electrical traces are positioned against the first major surface of the first dielectric layer. The electric traces include a plurality of conductive compliant members having first distal ends aligned with a plurality of the openings in the first dielectric layer. The first distal ends are adapted to electrically couple with the first circuit member. The second dielectric layer has a first major surface positioned against the electric traces and the first major surface of the first dielectric layer. The second dielectric layer has a plurality of through openings through which the electric traces electrically couple with the second circuit member.

Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Abstract: A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.