Abstract: Enhanced presentation techniques for modeling a connectivity universe associated with a particular user or device are provided. Example embodiments provide a WorldView Display System (a “WVDS”), which automatically organizes a user's online relationships with entities, such as devices, data collections, services, and people, and provides a user interface for accessing and interacting with these entities. The WVDS automatically determines the universe of objects that the user has relationships with, automatically groups objects having similar measures of access proximity, displays a multi-dimensional representation of these groups of objects on a display device, and provides a uniform user interface for initiating an interaction with any represented object. This abstract is provided to comply with rules requiring an abstract, and it is submitted with the intention that it will not be used to interpret or limit the scope or meaning of the claims.

Abstract: A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lines to contacts on the central region. Each contact comprises a rigid beam and a bump located in off-centered location on the beam, which bump includes a contacting portion. After initial touchdown of these contacting portions, further over-travel of the pads causes each beam to independently tilt locally so that different portions of each beam move different distances relative to the support thus driving each contact into lateral scrubbing movement across the pad thereby clearing away oxide buildup. The elastomeric member backed by the incompressible support ensures sufficient scrub pressure and reliable tilt recovery of each contact without mechanical straining of the beam.

Abstract: In a membrane probing apparatus, the impedance of the interface between coaxial cables connected to the test instrumentation and the membrane supported co-planar waveguide that conductively connects to the probe's contacts is optimized by eliminating a ground plane in the interface board.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract: A wafer probe comprises a contact conductively interconnected with the wall of a waveguide channel and supported by a substrate that projects from an end of a waveguide channel.

Abstract: Cellular matrices generally having a plurality of generally identical cells (open-ended geometric prisms) arranged to form a repeating geometric form, and characterized by radiant and/or convection barriers at each cell to mitigate undesired thermal transmission in a plurality of directions there through. Barriers of various embodiments include non-film sheet material, such as non-woven (e.g., spun) or batting-type sheet material as well as a foam sheet material, which may be substituted for some or all of the film material otherwise comprising the matrix, and/or integration of a thermally reflective film or coating into the matrix and/or enveloping panels of an inflatable body to provide enhanced thermal radiation mitigation means.

Abstract: A socket assembly includes a housing with a plurality of through openings that extend between opposite surfaces of the housing. First and second plurality of contact members are positioned in a plurality of the through openings. The contact members each include major beams and minor beams with proximal ends attached to a center portion, and distal ends extending away from the center portion. The major beams preferably have a length greater than the minor beams. When the first circuit member is engaged with the socket assembly the ball grid array displaces the distal ends of the major beams to create a plurality of first and second forces. The first plurality of forces generally oppose the second plurality of forces. The first and second plurality of forces also generate an engagement force that biases the first circuit member toward the housing. The minor beams on the first and second plurality of contact members do not contribute to the engagement force.

Abstract: A platform panel or module is provided to construct a surface for a deck, floor, wall, ceiling, or roof. The panel or module comprises a decorative top layer integral with or joined to a structural, composite molded platform. Each platform panel or module has two complementary module-coupling sides that take advantage of the full width of each joist that supports the platform. Also, male and female connecting members are disposed along the module-coupling sides that enable one platform panel or module to be efficiently and positively interlocked with an adjacent panel or module. Each panel or module can be fastened on one side to a single joist while being secured on its opposite side to an adjoining panel or module. The panels or modules are also designed to cover over an entire joist substructure, including the beginning-of-sequence and end-of-sequence joists.

Abstract: A method of forming a container includes providing a mold including at least one bulbous protrusion. The mold is closed to form a mold cavity corresponding to the shape of the container, with the bulbous protrusion being positioned in the mold cavity. Material is injected into the mold cavity to form the container, and the material envelopes the bulbous protrusion to create an undercut slot. The container is removed from the mold and the bulbous protrusion is withdrawn from the slot.

Abstract: Flexible, re-sealable containers and systems for retaining solids, liquids, gasses or combinations thereof.

Abstract: A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a depression can be readily made therein. A dielectric (insulative) layer, that is preferably patterned, is supported by the substrate. A conductive material is located within the depressions and then preferably lapped to remove excess from the top surface of the dielectric layer and to provide a flat overall surface. A trace is patterned on the dielectric layer and the conductive material. A polyimide layer is then preferably patterned over the entire surface. The substrate is then removed by any suitable process.

Abstract: A probe measurement system comprises a probe with a linear array of probe tips enabling a single probe to be used when probing a test structure with a differential signal

Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.

Abstract: A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.

Abstract: A test structure including a differential gain cell and a differential signal probe include compensation for the Miller effect reducing the frequency dependent variability of the input impedance of the test structure.

Abstract: A waste cart includes a container having a wall, with a pocket formed in an outer surface of the wall that creates a first sidewall facing a second sidewall, with an opening formed in both sidewalls. A grab bar has a free-sliding end and a retention end. The free-sliding end is inserted through the opening in the first sidewall, and the retention end is inserted through the opening in the second sidewall. The retention end includes a retainer for securing the grab bar with respect to the second sidewall. In the current embodiment, the grab bar includes a snap element near the retention end and a flange portion between the snap element and the free-sliding end. When the grab bar is installed, a portion of the second sidewall is positioned between the snap element and the flange portion.

Abstract: A device for rapidly changing objectives with threaded fastening on an optical instrument comprises an instrument adaptor which has, at one end, an external thread corresponding to the external thread of the objective, and, at the other end, a bayonet mount for fixably holding a bayonet base, and an objective adaptor which has, at one end, a bayonet base which can be connected to the bayonet mount of the instrument adaptor, and, at the other end, an internal thread corresponding to the internal thread of the optical instrument.

Abstract: Enhanced presentation techniques for modeling a connectivity universe associated with a particular user or device are provided. Example embodiments provide a WorldView Display System (a “WVDS”), which automatically organizes a user's online relationships with entities, such as devices, data collections, services, and people, and provides a user interface for accessing and interacting with these entities. The WVDS automatically determines the universe of objects that the user has relationships with, automatically groups objects having similar measures of access proximity, displays a multi-dimensional representation of these groups of objects on a display device, and provides a uniform user interface for initiating an interaction with any represented object. This abstract is provided to comply with rules requiring an abstract, and it is submitted with the intention that it will not be used to interpret or limit the scope or meaning of the claims.

Abstract: The present invention relates to a method of assembling a probe for testing of integrated circuits or other microelectronic devices.