Abstract: A method for sequential equivalence checking (SEC) of two representations of an electronic design may include using a processor, automatically selecting a plurality of cutpoints in the two representations of the electronic design; using a processor, automatically executing a prove-from strategy on the plurality of cut point pairs to identify a failed cut point pair in the two electronic designs; and using the processor, automatically extending a trace corresponding to the identified failed cut point pair to identify a deeper failed cut point pair or a failed output pair in the two electronic designs.

Abstract: An approach is described for a method, system, and product for detection of contours for data pads of a device having a free form contour, clustering integrated circuit pads and data pads, performing any angle routing based on a contour angle, and performing resistance balancing. For example, data pads of a display device having one or more curved contours (e.g. data pads arranged on an arc) are identified. Corresponding data pads and integrated circuit pads are then grouped together for routing interconnections and subsequently routed using any angle routing instead of merely routing interconnections with turns having 90-degree or 45-degree angles. Finally, the routed interconnects may be further refined/modified to balance resistances of the interconnections.

Abstract: Embodiments disclosed are directed to systems and methods for modifying an electronic circuit design. According to embodiments, the method includes generating a circuit element of an electronic circuit layout on a graphical user interface, and generating an array group including a plurality of circuit elements. Each cell of the array group includes the same circuit element, and the array group is generated such that a change in at least one attribute of the array group is applied to each circuit element of the plurality of circuit elements.

Abstract: Disclosed are methods, systems, and articles of manufacture for characterizing electromigration effects in an electronic design. These techniques determine an electrical characteristic at a port of a portion of an electronic design and select a number of frequencies in the frequency domain for the electrical characteristic. Multiple electric currents through a circuit component in the portion may be determined at least by performing a number of analyses for the number of frequencies. An electromigration effect may be characterized for the circuit component by using at least the multiple electric currents.

Abstract: The present disclosure relates to a computer-implemented method for electronic design is provided. Embodiments may include receiving, using at least one processor, an electronic design and determining an objective function associated with the electronic design. Embodiments may further include optimizing the objective function using Bayesian optimization and generating a best hyper-parameter setting based upon, at least in part, the Bayesian optimization.

Abstract: The present embodiments relate to static timing analysis (STA) of circuits. The STA can be carried out concurrently for multiple-mode-multiple-corners (MMMC) for circuits including combinational loops. The STA includes determining hard breaking points in the loop associated with each single-mode-single-corner (SMSC) view. The STA also includes merging constraints of all SMSC views to generate a merged set of constraints. The STA includes running MMMC STA for the circuit based on the merged set of constraints. The STA also includes determining a soft breaking point for the loop in the MMMC view for timing propagation and settling. The STA maintains consistency of breaking points across SMSC and MMMC views.

Abstract: For a division of a dividend by a constant divider, a circuit architecture may calculate partial remainders. The circuit architecture may implement a tree structure to generate intermediate signals of partial remainders and combine adjacent intermediate signals to generate other partial remainders downstream. The circuit architecture may generate a quotient based on the partial remainders. The circuit architecture may also implement bit shifting and zero-padding on left side of the dividend to generate bit-level partial remainders. Furthermore, the circuit architecture may enable a fast round-to-zero division of signed integers by flipping the input bits of a negative integer and output bits of the corresponding quotient and performing only one increment operation, either before the division or after the division. In addition, the circuit architecture may also perform a division of a dividend in a carry-save form.

Abstract: Disclosed are methods, systems, and articles of manufacture for characterizing an electronic design with a schematic driven extracted view. These techniques identify a schematic of an electronic design, wherein the schematic exists in one or more design fabrics. These techniques further determine an extracted model for characterizing a behavior of the electronic design based at least in part upon the schematic, determine a hierarchical level in a design fabric of the one or more design fabrics of the schematic, and characterize the electronic design with at least an extracted view.

Abstract: A method for providing, based on an emulation schedule, a reset message to multiple circuits is provided. The reset message associates a reset signal with a selected clock cycle for each circuit, in the emulation schedule. The method includes determining a mask for each of the circuits based on the emulation schedule, providing a clock signal to the circuits, the clock signal comprising the selected clock cycle for each circuit, and tuning the reset signal relative to the clock signal based on a center of the selected clock cycle for each circuit. The method also includes providing the reset signal to the circuits and asserting the reset signal in the circuits based on the mask. A system and a non-transitory, machine-readable medium storing instructions to perform the above method are also provided.

Abstract: Various embodiments provide for routing a network of a circuit design based on at least one of a placement blockage or a layer-assigned network of a circuit design. For instance, some embodiments route a network of a circuit design (e.g., clock net, date net) by generating a congestion map based on modeling layer-assigned networks, considering (e.g., accounting for) routing congestion based on a placement blockage of the circuit design, or some combination of both.

Abstract: Embodiments include herein are directed towards a method for use in an electronic design environment is provided. Embodiments may include receiving, using at least one processor, an electronic design schematic and splitting, using the at least one processor, the electronic design schematic into a plurality of subcircuits. Embodiments may further include independently simulating each of the plurality of subcircuits to generate simulation results and analyzing the simulation results to determine over-stress associated with the plurality of subcircuits.

Abstract: Embodiments included herein are directed towards method for electronic design. Embodiments may include receiving, using at least one processor, a placed layout and one or more electronic design simulation datasets including current information associated with at least one pin. Embodiments may further include estimating a width to support the current information associated with the at least one pin and updating a pin size associated with the at least one pin based upon, at least in part, the estimated width. Embodiments may also include identifying at least one pin that is above a predetermined threshold and splitting the at least one pin that is above the predetermined threshold into a plurality of pins. Embodiments may further include generating one or more width-spacing-pattern tracks for one or more internal nets based upon, at least in part, the updated pin size.

Abstract: Some embodiments perform, in a multi-layer neural network in a computing device, optimization of the multi-layer neural network, for example by making a convolutional change with a first plurality of convolutional filters, or by making a connection change of a first plurality of convolutional filters. In other embodiments, electronic design automation (EDA) systems, methods, and computer-readable media are presented for adding such a multi-layer neural network into an integrated circuit (IC) design.

Abstract: An emulation system may include an emulator. The emulator may include at least one chip and at least one FPGA. The chip may be associated with the FPGA. The FPGA may operate as a coprocessor to implement in-system scan test of the chip. In a scan mode of the in-system scan test, the coprocessor may transmit one or more in-system test instructions to the chip through its existing connections with the chip. The coprocessor may capture test response data from the chip in response to the one or more in-system test instructions through its existing connections with the chip. In an offline mode, the coprocessor may compare the test response data with expected response data to determine if the chips are functioning correctly.

Abstract: According to certain aspects, the present embodiments include techniques for performing a single timing analysis run for a plurality of views representing different modes and/or corners. An embodiment analyzes and maintains relevant timing information that is different for different views, but otherwise maintains the same information for all views. This allows each individual view in a single run to be analyzed in the same manner as separate runs for each separate view, thereby ensuring the same QoR. These and other embodiments provide substantial savings in runtime and memory consumption over other approaches.

Abstract: The present embodiments relate generally to workload management and more particularly to a hybrid cloud workload management system and methodology which can effectively manage the execution of tasks of the same workload on both private and public clouds. In embodiments, user tasks are seamlessly and transparently executed on a public cloud if the private cloud does not have the necessary resources available. These and other embodiments automatically detect data dependencies of user tasks and build lists of data attributes of user tasks, which are used to populate and synchronize data needed for tasks before they are executed on the public cloud. Additional or alternative embodiments include the ability to intelligently scale the compute resources in the public cloud so that appropriate number of hosts with the resources needed by the user tasks are dynamically created and also properly purged upon user task completion.

Abstract: An emulation system may have a built-in self-test circuit to generate one or more built-in self-test instructions. The one or more built-in self-test instructions may be pseudorandom. The one or more built-in self-test instructions may cause one or more emulation processors of the emulation system to generate one or more deterministic outputs. A testing processor of the emulation system may compare the one or more deterministic outputs to detect a faulty emulation processor, a faulty emulation processor cluster, or a faulty emulation chip of the emulation system.

Abstract: A set of encoders within a transmitter (TX) physical layer (PHY) encode incoming data using a predefined encoder scheme by translating multiple data segments into a set of balanced bit sequences. Each data segment comprises a first number of bits and each balanced bit sequence comprises a second number of bits. A data striping component distributes the set of balanced bit sequences to a set of serializers by routing bits from particular bit positions in each balanced bit sequence to a corresponding serializer. The set of serializers generates serialized data based on the set of balanced bit sequences.

Abstract: Devices, methods, computer readable media, and other embodiments are described for automated formal analysis and verification of a circuit design. One embodiment involves accessing a circuit design and a set of default verification targets for the circuit design. A plurality of partitions for the circuit design are then automatically generated, and a first partition is analyzed to generate a first set of verification targets for the first partition based on the set of default verification targets and a set of partition and schedule values for the first partition. A first formal verification analysis is performed on the first partition, the first set of verification targets, and the set of partition and schedule values, and a formal verification output is generated based on the first formal verification analysis. Various embodiments can additionally involve stagnation analysis and additional automation to customize the analysis for each partition.

Abstract: Electronic design automation systems, methods, and media are presented for cell cloning during circuit design. In one embodiment, for a circuit design comprising a plurality of flip-flop elements having clock inputs provided by a routing tree, a delay is identified for each flip-flop element. The flip-flop elements are clustered by delay to generate at least two clusters of flip-flop elements. Elements within the clusters are then grouped by physical characteristics to generate delay groups of flip-flop elements. An updated routing tree is then generated for the circuit design using the first delay group and the second delay group.