Abstract: A sensor system includes a microelectromechanical systems (MEMS) sensor, control circuit, signal evaluation circuitry, a digital to analog converter, signal filters, an amplifier, demodulation circuitry and memory. The system is configured to generate high and low-frequency signals, combine them, and provide the combined input signal to a MEMS sensor. The MEMS sensor is configured to provide a modulated output signal that is a function of the combined signal. The system is configured to demodulate and filter the modulated output signal, compare the demodulated, filtered signal with the input signal to determine amplitude and phase differences, and determine, based on the amplitude and phase differences, various parameters of the MEMS sensor. A method for determining MEMS sensor parameters is also provided.

Abstract: An angular rate sensor includes a substrate, a drive mass flexibly coupled to the substrate, and a sense mass suspended above the substrate and flexibly coupled to the drive mass via flexible support elements. An electrode structure is mechanically coupled to, but electrically isolated from, the drive mass and is spaced apart from the substrate so that it is not in contact with the substrate. The electrode structure is configured to produce a signal that indicates movement of the sense mass relative to the electrode when the sensor is subjected to angular velocity. When the angular rate sensor experiences quadrature error, the drive mass, the sense mass, and the electrode structure move together relative to the sense axis. Since the sense mass and the electrode structure move together in response to quadrature error, there is little relative motion between the sense mass and the electrode structure so that quadrature error is largely eliminated.

Abstract: A digital front end channelization device for one or more carrier signals comprises a per carrier section and a composite section. The composite section may include signal processing units, each of which may include an inverse Fourier transform unit for transforming a composite carrier signal into a time domain signal, a sample detection and selection unit for detecting and selecting a peak of the time domain signal, a clipping unit for clipping the time domain composite carrier signal to produce an error signal, a Fourier transform unit, for transforming the error signal into a frequency domain error signal, a frequency shaping unit for frequency shaping the frequency domain error signal, a summation unit for subtracting the frequency shaped frequency domain error signal from the composite carrier signal, and a phase selection unit for phase adjustment of the resulting signal.

Abstract: A technique for frame synchronization in a communication system includes performing symbol correlation on received signal samples. A determination is made as to whether a magnitude of the symbol correlation is greater than a first threshold. In response to the magnitude of the symbol correlation being greater than the first threshold, an indication is provided that the received symbol is a valid symbol (e.g., a SYNCP symbol or SYNCM symbol). In response to the magnitude of the symbol correlation being less than the first threshold, an indication is provided that the received symbol is an indeterminate symbol (e.g., an invalid symbol or a SYNCM/2 symbol).

Abstract: There is provided a network node of a wireless communication network, such as a UMTS network. The network node is arranged to perform a method of detecting Signal Discontinuous Transmission on a channel in the wireless communication network. The method comprises the receiving of a signal on the channel and the processing of a current slot of the signal, the current slot comprising a number of pilot bits and non-pilot bits. A bit error rate, a signal to noise ratio and an amplitude modulus is calculated using the pilot bits and non-pilot bits. A decision is made about whether the signal indicates a discontinuous transmission on the channel using the signal to noise ratio, the bit error rate and the amplitude modulus.

Abstract: A method for repairing a memory includes executing an Error Correction Code (ECC) for a page of the memory. The page includes a plurality of bits having an inherent number of failed bits equal to or greater than zero. The ECC is configured to correct a correctable number of failed bits from the plurality of bits. A location of a failure prone bit in the page is determined from a cache in response to the correctable number of failed bits being less than the inherent number of failed bits. A state of the failure prone bit is changed to a new state in response to determining the location of the failure prone bit. The ECC is executed in response to the state of the failure prone bit being changed to the new state.

Abstract: An integrated circuit includes a plurality of I/O cells, each including a portion of the first power bus, a portion of the second power bus, and an I/O pad coupled between the portions of the first and second power buses. A first set of the plurality of I/O cells is arranged along a die edge of the integrated circuit. A second set of the plurality of I/O cells is arranged along the die edge between the first set and the die edge. For each I/O cell in the first set, the portion of the first power bus is physically connected to the portion of the first power bus of an abutting I/O cell of the second set at a boundary between the I/O cell of the first set and the abutting I/O cell of the second set. The integrated circuit includes an ESD clamp and a trigger circuit.

Abstract: A method of enabling an executed control flow path through computer program code to be determined. The method comprising modelling cumulative instruction counts for control flow paths through the computer program code, and inserting at least one probe within the computer program code to enable a cumulative instruction count value for at least one control flow path of the computer program code to be accessed.

Abstract: A current-to-voltage converter receives a current which varies with temperature according to a selected one of two or more temperature coefficient factors and converts it to a temperature-dependent voltage to be used as a control signal to a varactor in a voltage controlled oscillator, VCO, to compensate for temperature-induced frequency drift in the VCO. A feedback arrangement with hysteresis is provided for controlling the selection of the temperature coefficient factor and operates by comparing the temperature-dependent voltage with a reference voltage. The reference voltage may be pre-set and equivalent to a known operating temperature. A switching signal is generated when Vout approaches the reference voltage and in response a control module generates a selection signal for selecting a different temperature coefficient factor.

Abstract: An integrated circuit includes a non-volatile memory module that can censor access to various memory regions based upon a censorship criteria. Information used to implement the censorship criteria is stored at a non-volatile memory location. A one-time programmable non-volatile memory location stores a value representing permanent censorship key. If the permanent censorship key is in an erased state, one or more resources are allowed to modify the non-volatile memory location and disable censorship. If the permanent censorship key has one or more programmed bits, no resource is allowed to modify the non-volatile memory location and disable censorship.

Abstract: There is provided a method for controlling fetch-ahead of Fetch Sets into a decoupling First In First Out (FIFO) buffer of a Variable Length Execution Set (VLES) processor architecture, wherein a Fetch Set comprises at least a portion of a VLES group available for dispatch to processing resources within the VLES processor architecture, comprising, for each cycle, determining a number of VLES groups available for dispatch from previously pre-fetched Fetch Sets, and only requesting a fetch-ahead of a next Fetch Set in the next cycle if one of a select set of criteria related to the number of VLES groups available for dispatch is true.

Abstract: A data processing system includes a boot read only memory (ROM) configured to store boot code; one time programmable (OTP) storage circuitry configured to store patch instructions; a random access memory (RAM); and a processor coupled to the boot ROM, the OTP storage circuitry, and the RAM. The processor is configured to: in response to a reset of the data processing system, copy one or more patch instructions from the OTP storage circuitry into the RAM, and during execution of the boot code, execute a patch instruction from the RAM in place of a boot instruction of the boot code.

Abstract: An integrated electronic package includes an integrated circuit (IC) die and conductive discrete components. Electrical interconnects are formed directly between bond pads on an active side of the IC die and contacts on the conductive discrete components without an intervening lead frame. The IC die, conductive discrete components and electrical interconnects are embedded in an encapsulation material. Contact surfaces of at least some of the conductive discrete components are exposed from the encapsulation material and can be attached to a printed circuit board in order to mount the integrated electronic package to the printed circuit board.

Abstract: Methods for the fabrication of a Microelectromechanical Systems (“MEMS”) devices are provided, as are MEMS devices. In one embodiment, the MEMS device fabrication method includes forming at least one via opening extending into a substrate wafer, depositing a body of electrically-conductive material over the substrate wafer and into the via opening to produce a via, bonding the substrate wafer to a transducer wafer having an electrically-conductive transducer layer, and forming an electrical connection between the via and the electrically-conductive transducer layer. The substrate wafer is thinned to reveal the via through a bottom surface of the substrate wafer, and a backside conductor is produced over a bottom surface of the substrate wafer electrically coupled to the via.

Abstract: The present invention pertains to a linear power regulator device, comprising an internal pass device, a driver device having a driver output arranged to drive the internal pass device via the driver output, wherein the linear power regulator device comprises an external connection connectable or connected to an external pass device; and wherein the driver device is arranged to drive an external pass device via the driver output and the external connection. The invention also pertains to a corresponding electronic device.

Abstract: A power management controller (PMC) for resetting various voltage domains of an integrated circuit (IC) generates and transmits first and second voltage domain input signals to first and second voltage domains, respectively, and generates corresponding reset signals for resetting the first and second voltage domains. The PMC generates a first master reset signal indicative of resetting the first and second voltage domains when the first and second voltage domains are booting. The PMC generates a second master reset signal indicative of resetting the first and second voltage domains when the IC is in a functional mode. The PMC determines whether the first and second voltage domains are non-functional and if at least one is non-functional, then the PMC masks a respective one of the first and second reset signals.

Abstract: A data processing system having an analog-to-digital converter (ADC) and method for testing the ADC are provided. The data processing system also comprises a digital-to-analog converter (DAC) and test logic. The DAC has a first voltage range, an input for receiving a test code, and an output. The ADC has a second voltage range larger than the first voltage range, an input coupled to the output of the DAC, and an output for providing a series of output codes over the second voltage range. The test logic is coupled to the ADC and is for controlling testing of the ADC using the DAC. A plurality of series of test codes are provided to the DAC for testing portions of the second voltage range output from the ADC. A beginning series of test codes is for testing a beginning portion of the second voltage range and subsequent series of test codes are for testing subsequent portions of the second voltage range.

Abstract: A method for performing foreign object detection in an inductive wireless power transfer system is disclosed. In the embodiment, the method involves obtaining measurements from a base station of a wireless power transfer system during charging and determining transmitter energy loss in a power transmitter, Ptxloss, using the obtained measurements, wherein the transmitter energy loss, Ptxloss, is a function of at least Vcap and PTx, wherein Vcap is proportional to the voltage amplitude across the capacitor of an LC tank circuit in a power transmitter and PTx is the total power supplied to the power transmitter. The method also involves detecting the presence of a foreign object in response to the estimated transmitter energy loss.

Abstract: A scannable flip-flop circuit and method for low power scan operation are provided. The scannable flip-flop includes a flip-flop for receiving an input signal, and for generating a flip-flop output signal. The scannable flip-flop also includes a voltage selection circuit coupled to the flip-flop. The voltage selection circuit supplies a first voltage to the flip-flop during a first state of a voltage selection signal, and supplies a second voltage to the flip-flop during a second state of the voltage selection signal. A series of scannable flip-flops may be arranged in a scan chain for testing during a scan test mode.

Abstract: An integrated circuit includes an input/output “I/O” cell arranged to drive an output signal and an activity analysis unit arranged to generate an activity factor based on the output signal. The activity factor represents a switching activity intensity of the I/O cell. The switching activity intensity is associated with an ageing effect of the I/O cell. The circuit further includes a calibration unit arranged to generate a switching pattern signal based on the generated activity factor and an I/O calibration cell arranged to be driven by the switching pattern signal, wherein the switching pattern signal emulates the ageing effect of the I/O cell.