Abstract: An assembly is made of an integrated circuit chip and a plate. At least one channel is arranged between the chip and the plate. The channel is delimited by metal sidewalls at least partially extending from one surface of the chip to an opposite surface of the plate. The assembly is encapsulated in a body that includes an opening extending to reach the channel. The plate may be one of an interposer, an integrated circuit chip, a support of surface-mount type, or a metal plate.
Type:
Grant
Filed:
September 17, 2015
Date of Patent:
March 7, 2017
Assignees:
STMicroelectronics (Crolles 2) SAS, SOCPRA Sciences et Génie S.E.C.
Inventors:
Louis-Michel Collin, Luc Guy Frechette, Sandrine Lhostis
Abstract: An integrated circuit includes an active zone lying above a semiconductor substrate. A cavity borders the active zone and extends, in an insulating zone, as far as into the vicinity of a semiconductor region. An insulating multilayer is provided and an electrically conductive contact extends within the insulating multilayer to emerging onto the active zone and into the cavity. The insulating multilayer includes a first insulating layer covering the active zone outside the contact and lining the walls of the cavity. An additional insulating layer covers the portion of the first insulating layer lining the walls of the cavity. The contact reaches the additional insulating layer in the cavity. An insulating region lies on top of the first insulating layer and the additional insulating layer made from insulating material around the contact.
Abstract: An image sensor cell formed inside and on top of a substrate of a first conductivity type, including: a read region of the second conductivity type; and, adjacent to the read region, a storage region of the first conductivity type topped with a first insulated gate electrode. The first electrode is arranged to receive, in a first operating mode, a first voltage causing the inversion of the conductivity type of the storage region, so that the storage region behaves as an extension of the read region, and, in a second operating mode, a second voltage causing no inversion of the storage region.
Abstract: A method for capillary self-assembly of a plate and a carrier, including: forming an etching mask on a region of a substrate; reactive-ion etching the substrate, the etching using a series of cycles each including isotropic etching followed by surface passivation, wherein a duration of the isotropic etching for each cycle increases from one cycle to another, a ratio between durations of the passivation and etching of each cycle is lower than a ratio for carrying out a vertical anisotropic etching to form a carrier having an upper surface defined by the region and side walls defining an acute angle with the upper surface; removing the etching mask; placing a droplet on the upper surface of the carrier; and placing the plate on the droplet.
Type:
Grant
Filed:
July 8, 2014
Date of Patent:
March 7, 2017
Assignees:
Commissariat à l'énergie atomique et aux énergies alternatives, STMicroelectronics (Crolles 2) SAS
Inventors:
Sebastien Mermoz, Lea Di Cioccio, Thomas Magis, Loic Sanchez
Abstract: An integrated circuit includes an active device for confinement of a light flux that is formed in a semiconducting substrate. A confinement rib is separated from two doped zones by two trenches. Each doped zone includes a contacting zone on an upper face. Each trench widens from a bottom wall towards the upper face of the corresponding doped zone. The widening trenches present a sidewall having a tiered profile between the trench and the doped zone. An opposite sidewall presents a straight profile.
Abstract: A production of contact zones for a transistor device including the steps of: a) forming at least one layer made of a compound based on semiconductor and metal on one or more first semiconductor region(s) of a first N-type transistor and on one or more second semiconductor region(s) of a second P-type transistor resting on a same substrate, the first regions being based on a III-V type material whereas the second semiconductor regions are based on another material different from the III-V material, the semiconductor of the compound being an N-type dopant of the III-V material, b) carrying out at least one thermal annealing so as to form on the first semiconductor regions first contact zones and on the second semiconductor regions second contact zones based on a semiconductor and metal compound while increasing the N-doping of the III-V material.
Type:
Application
Filed:
August 11, 2016
Publication date:
March 2, 2017
Applicants:
Commissariat a L'Energie Atomique et aux Energies Alternatives, STMicroelectronics (Crolles 2) SAS
Inventors:
Philippe RODRIGUEZ, Elodie GHEGIN, Fabrice NEMOUCHI
Abstract: A transformer of the balanced-unbalanced type includes a primary inductive circuit and a secondary inductive circuit housed inside an additional inductive winding connected in parallel to the terminals of the secondary circuit and inductively coupled with the primary circuit and the secondary circuit.
Type:
Grant
Filed:
July 25, 2012
Date of Patent:
February 14, 2017
Assignees:
STMICROELECTRONICS (CROLLES 2) SAS, STMICROELECTRONICS SA
Abstract: An image sensor device may include an array of image sensing pixels arranged in rows and columns. Each image sensing pixel may include an image sensing photodiode, a first source follower transistor coupled to the image sensing photodiode, and a switch coupled to the image sensing photodiode. Each image sensor device may include a second source follower transistor coupled to the switch, and a row selection transistor coupled to the first and second source follower transistors.
Type:
Grant
Filed:
December 31, 2014
Date of Patent:
February 14, 2017
Assignee:
STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
François Roy, Frédéric Lalanne, Pierre Emmanuel Marie Malinge
Abstract: A planar layer of a selected material is formed on a surface of a wafer exhibiting recesses. The formation process including the steps of: a) depositing a first layer of the selected material on the surface; b) performing a chemical mechanical polishing of the first layer; c) depositing a second layer of the selected material on the first layer; and d) performing a chemical mechanical polishing of the second layer.
Type:
Application
Filed:
August 1, 2016
Publication date:
February 9, 2017
Applicants:
STMicroelectronics (Crolles 2) SAS, Commissariat A L'Energie Atomique et aux Energies Alternatives
Inventors:
Francois Guyader, Emmanuel Gourvest, Patrick Gros D'aillon
Abstract: The electrode for a structure of Metal-Insulator-Metal type is formed by a stack successively comprising a gold layer, a barrier layer made from electrically conducting oxide and a platinum layer. The electrically conducting oxide is advantageously a noble metal oxide, and preferentially ruthenium oxide. The electrode is arranged on a substrate. The gold layer of the electrode is separated from the substrate by an adhesion layer made from titanium dioxide. The electrode is used to fabricate a capacitor of Metal-Insulator-Metal type.
Type:
Application
Filed:
July 27, 2016
Publication date:
February 2, 2017
Applicants:
COMMISSARIAT À L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, STMICROELECTRONICS (CROLLES 2) SAS
Abstract: An arrayed waveguide grating multiplexer/demultiplexer includes an array of optical waveguides ordered in sequence from a shortest waveguide up to a longest waveguide, and identical phase shifters configured to be controlled by a same control signal. Each phase shifter increases/decreases an optical path of an optical waveguide by the same quantity based on the control signal.
Type:
Grant
Filed:
March 30, 2015
Date of Patent:
January 31, 2017
Assignees:
STMICROELECTRONICS S.R.L., STMICROELECTRONICS (CROLLES 2) SAS
Abstract: The invention concerns a method of forming a semiconductor layer having uniaxial stress including: forming, in a semiconductor structure having a stressed semiconductor layer, one or more first isolation trenches in a first direction for delimiting a first dimension of at least one transistor to be formed in said semiconductor structure; forming, in the semiconductor structure, one or more second isolation trenches in a second direction for delimiting a second dimension of the at least one transistor, the first and second isolation trenches being at least partially filled with an insulating material; and before or after the formation of the second isolation trenches, decreasing the viscosity of the insulating material in the first isolation trenches by implanting atoms of a first material into the first isolation trenches, wherein atoms of the first material are not implanted into the second isolation trenches.
Type:
Grant
Filed:
October 28, 2014
Date of Patent:
January 10, 2017
Assignees:
STMICROELECTRONICS SA, STMICROELECTRONICS (CROLLES 2) SAS, STMICROELECTRONICS, INC.
Inventors:
Denis Rideau, Elise Baylac, Emmanuel Josse, Pierre Morin, Olivier Nier
Abstract: The production of spacers at flanks of a transistor gate, including a step of forming a dielectric layer covering the gate and a peripheral region of a layer of semiconductor material surrounding the gate, including forming a superficial layer covering the gate and the peripheral region; partially removing the superficial layer configured so as to completely remove the superficial layer at the peripheral region while preserving a residual part of the superficial layer at the flanks; and selective etching of the dielectric layer vis-à-vis the material of the residual part of the superficial layer and vis-à-vis the semiconductor material.
Type:
Grant
Filed:
September 16, 2015
Date of Patent:
January 10, 2017
Assignees:
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES, STMICROELECTRONICS SA, STMICROELECTRONICS (Crolles 2) SAS
Inventors:
Christian Arvet, Sebastien Barnola, Sebastien Lagrasta, Nicolas Posseme
Abstract: An integrated circuit die includes a substrate having a first layer of semiconductor material, a layer of dielectric material on the first layer of semiconductor material, and a second layer of semiconductor material on the layer of dielectric material. An extended channel region of a transistor is positioned in the second layer of semiconductor material, interacting with a top surface, side surfaces, and potentially portions of a bottom surface of the second layer of semiconductor material. A gate dielectric is positioned on a top surface and on the exposed side surface of the second layer of semiconductor material. A gate electrode is positioned on the top surface and the exposed side surface of the second layer of semiconductor material.
Type:
Grant
Filed:
November 16, 2015
Date of Patent:
January 10, 2017
Assignees:
STMicroelectronics, Inc., STMicroelectronics (Crolles 2) SAS
Abstract: An integrated modulator of the Mach-Zehnder type includes two optical arms containing waveguides with PN junctions and biasing circuits for reverse biasing the PN junctions in response to a control signal. The two optical arms are situated within a semiconductor substrate of a first element that also has an interconnection region. The biasing circuits are situated, in part, within a substrate of a second element that also contains an interconnection region. The first and second elements are rigidly attached to each other via their respective interconnection regions.
Type:
Application
Filed:
March 14, 2016
Publication date:
January 5, 2017
Applicants:
STMicroelectronics (Crolles 2) SAS, STMicroelectronics SA
Inventors:
Jean-Francois Carpentier, Patrick LeMaitre, Denis Pache
Abstract: A proximity sensor includes a radiation source configured to emit a primary radiation beam and a primary detector configured to pick up a reflected primary radiation beam. The radiation source is further configured to emit stray radiation. The sensor further includes a reference detector arranged to receive the stray radiation. The stray radiation may, for example, be emitted from either a side of the radiation source or a bottom of the radiation source.
Abstract: An IC image sensor device may include image sensing IC pixels arranged in an array, and pixel line pairs coupled to the image sensing IC pixels. The IC image sensor device may include circuitry coupled to the pixel line pairs and configured to operate the array in a global shutter mode. Each pair of the pixel line pairs may include a pair of spaced electrical conductors having a twist.
Type:
Grant
Filed:
December 30, 2014
Date of Patent:
December 27, 2016
Assignees:
STMICROELECTRONICS (GRENOBLE 2) SAS, STMICROELECTRONICS (CROLLES 2) SAS
Abstract: A memory device may include an access transistor, and a memory cell configured to store an item of information. The memory cell may include first and second electrodes configured to have different optoelectronic states corresponding respectively to two values of the item of information, and to switch between the different optoelectronic states based upon a control signal external to the memory cell, the different optoelectronic states being naturally stable in an absence of the control signal. The memory cell may also include a solid electrolyte between the first and second electrodes.
Abstract: An assembly converting thermal energy into electrical energy including: at least one temperature sensitive bimetallic strip arranged in a space delimited by a hot source and a cold source facing each other, the bimetallic strip extending along a longitudinal axis; at least one suspended element fixed in movement to the sensitive element and extending laterally from the sensitive element and including a free end; and at least one piezoelectric element suspended from a part fixed relative to the sensitive element and vibrated by the suspended element such that it is vibrated when the bimetallic strip changes configuration and the suspended element comes into contact with the piezoelectric element, the piezoelectric element being located outside the space defined between the bimetallic strip and the hot source and outside the space between the bimetallic strip and the cold source.
Type:
Grant
Filed:
July 9, 2012
Date of Patent:
December 27, 2016
Assignees:
Commissariat a l'energie atomique et aux energies alternatives, STMICROELECTRONICS (CROLLES 2) SAS
Inventors:
Guillaume Savelli, Philippe Coronel, Stéphane Monfray, Thomas Skotnicki
Abstract: A MOS transistor includes a semiconductor layer resting on an insulator and having a substantially planar upper surface. The semiconductor layer extends down to a first depth in the channel region, and down to a second depth, greater than the first depth, in the source and drain regions. In the channel region, the semiconductor layer is formed from a portion of an upper semiconductor layer of a silicon on insulator substrate. In the source and drain regions, the semiconductor layer is formed by epitaxially grown semiconductor material.